CL9P5LQ

CL9P5LQ Epoxy-encapsulated Photoconductors (Replaces the CL9P5L) ® Clairex November, 2003  Technologies, Inc. Pattern shown is typical and may vary from part to part. ALL DIMENSIONS ARE IN INCHES features • thicker ceramic substrate • low cost epoxy encapsulation absolute maximum ratings (TA = 25°C unless otherwise stated) storage and operating temperature …………………………………….-50°C to +75°C lead soldering temperature(1)……………………………………………………….260°C power dissipation at 25°C air temperature……………………………………….50mW 1. 2. 0.06” (1.5mm) from the case for 5 seconds maximum. The CL9P5LQ has a 0.079” thick substrate and 1.0” minimum length leads. The CL9P5L had a 0.055” thick substrate and 1.4” minimum length leads. description The CL9P5LQ consists of CdS base material deposited on a ceramic substrate and epoxy encapsulated. The CL9P5LQ is electrically equivalent to, and replaces, the CL9P5L and CL905L. For applications assistance, call Clairex. ` notes: electrical characteristics (TA = 25°C unless otherwise noted) Part Number CL9P5LQ Material Type CdS,CdSe RON(1)(2) Ω(typ) 10K ROFF(3) Ω (min.) 670K Vmeas(4) Volts 10 V(max) Volts 100 notes: 1. On-resistance (RON) is measured at 2 ft-c after light stabilization at 30 ft-c for 16 hours minimum just prior to test. 2. 3. 4. RON tolerance is ±33% at 2 ft-c. Light source for all RON measurements is an unfiltered tungsten source operating at a color temperature of 2854K. Off-resistance (ROFF) is measured under dark conditions, 5 seconds after RON test. A dark condition is reached when the value of ROFF can not be increased by further irradiation shielding. Measurement voltage (Vmeas) is the steady-state bias applied to the device for measurement of RON and ROFF. Clairex reserves the right to make changes at any time to improve design and to provide the best possible product. Revised 3/15/06 Clairex Technologies, Inc. Phone: 972-265-4900 1301 East Plano Parkway Fax: 972-265-4949 Plano, Texas 75074-8524 www.clairex.com