CY7C1041D
4-Mbit (256 K × 16) Static RAM
4-Mbit (256 K × 16) Static RAM
specified on the address pins (A0 through A17). If Byte High
Enable (BHE) is LOW, then data from I/O pins (I/O8 through
I/O15) is written into the location specified on the address pins
(A0 through A17).
Features
■
Pin-and function-compatible with CY7C1041B
■
High speed
❐ tAA = 10 ns
■
Low active power
❐ ICC = 90 mA at 10 ns (Industrial)
■
Low CMOS standby power
❐ ISB2 = 10 mA
■
2.0 V data retention
■
Automatic power-down when deselected
■
TTL-compatible inputs and outputs
■
Easy memory expansion with CE and OE features
■
Available in Pb-free 44-pin (400-Mil) Molded SOJ and 44-pin
TSOP II packages
Reading from the device is accomplished by taking Chip Enable
(CE) and Output Enable (OE) LOW while forcing the Write
Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then data
from the memory location specified by the address pins will
appear on I/O0 to I/O7. If Byte High Enable (BHE) is LOW, then
data from memory will appear on I/O8 to I/O15. See the truth table
at the back of this data sheet for a complete description of read
and write modes.
The input/output pins (I/O0 through I/O15) are placed in a
high-impedance state when the device is deselected (CE HIGH),
the outputs are disabled (OE HIGH), the BHE and BLE are
disabled (BHE, BLE HIGH), or during a write operation (CE LOW,
and WE LOW).
Functional Description
The CY7C1041D [1] is a high-performance CMOS static RAM
organized as 256K words by 16 bits. Writing to the device is
accomplished by taking Chip Enable (CE) and Write Enable
(WE) inputs LOW. If Byte Low Enable (BLE) is LOW, then data
from I/O pins (I/O0 through I/O7), is written into the location
The CY7C1041D is available in a standard 44-pin 400-mil-wide
body width SOJ and 44-pin TSOP II package with center power
and ground (revolutionary) pinout.
The CY7C1041D is suitable for interfacing with processors that
have TTL I/P levels. It is not suitable for processors that require
CMOS I/P levels. Please see Electrical Characteristics on page
4 for more details and suggested alternatives.
For a complete list of related documentation, click here.
Logic Block Diagram
256K x 16
SENSE AMPS
A0
A1
A2
A3
A4
A5
A6
A7
A8
ROW DECODER
INPUT BUFFER
I/O0–I/O7
I/O8–I/O15
A9
A10
A 11
A 12
A 13
A14
A15
A16
A17
COLUMN
DECODER
BHE
WE
CE
OE
BLE
Note
1. For guidelines on SRAM system design, please refer to the “System Design Guidelines” Cypress application note, available on the internet at www.cypress.com.
Cypress Semiconductor Corporation
Document Number: 38-05472 Rev. *I
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised November 24, 2014
CY7C1041D
Contents
Pin Configuration ............................................................. 3
Selection Guide ................................................................ 3
Maximum Ratings ............................................................. 4
Operating Range ............................................................... 4
Electrical Characteristics ................................................. 4
Capacitance ...................................................................... 5
Thermal Resistance .......................................................... 5
AC Test Loads and Waveforms ....................................... 5
Data Retention Characteristics ....................................... 6
Data Retention Waveform ................................................ 6
Switching Characteristics ................................................ 7
Switching Waveforms ...................................................... 8
Truth Table ...................................................................... 11
Document Number: 38-05472 Rev. *I
Ordering Information ...................................................... 11
Ordering Code Definitions ......................................... 11
Package Diagrams .......................................................... 12
Acronyms ........................................................................ 13
Document Conventions ................................................. 13
Units of Measure ....................................................... 13
Document History Page ................................................. 14
Sales, Solutions, and Legal Information ...................... 16
Worldwide Sales and Design Support ....................... 16
Products .................................................................... 16
PSoC® Solutions ...................................................... 16
Cypress Developer Community ................................. 16
Technical Support ..................................................... 16
Page 2 of 16
CY7C1041D
Pin Configuration
Figure 1. 44-pin SOJ / TSOP II pinout (Top View)
A0
A1
A2
A3
A4
CE
I/O0
I/O1
I/O2
I/O3
VCC
VSS
I/O4
I/O5
I/O6
I/O7
WE
A5
A6
A7
A8
A9
1
44
2
3
43
42
4
41
40
39
38
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A17
A16
A15
OE
BHE
BLE
I/O15
I/O14
I/O13
I/O12
VSS
VCC
I/O11
I/O10
I/O9
I/O8
NC
A14
A13
A12
A11
A10
Selection Guide
-10 (Industrial)
-12 (Automotive) [2]
Maximum Access Time
10
12
ns
Maximum Operating Current
90
95
mA
Maximum CMOS Standby Current
10
15
mA
Description
Unit
Note
2. Automotive product information is Preliminary.
Document Number: 38-05472 Rev. *I
Page 3 of 16
CY7C1041D
Current into Outputs (LOW) ........................................ 20 mA
Maximum Ratings
Exceeding maximum ratings may shorten the useful life of the
device. User guidelines are not tested.
Storage Temperature ............................... –65 qC to +150 qC
Ambient Temperature with
Power Applied ......................................... –55 qC to +125 qC
Supply Voltage on
VCC to Relative GND [3] ...............................–0.5 V to +6.0 V
DC Voltage Applied to Outputs
in High Z State [3] ................................. –0.5 V to VCC +0.5 V
DC Input Voltage [3] ............................. –0.5 V to VCC +0.5 V
Static Discharge Voltage
(per MIL-STD-883, Method 3015) .......................... >2001 V
Latch-up Current ..................................................... >200 mA
Operating Range
Ambient
Temperature
VCC
Speed
Industrial
–40 qC to +85 qC
5 V r 0.5
10 ns
Automotive
–40 qC to +125 qC
5 V r 0.5
12 ns
Range
Electrical Characteristics
Over the Operating Range
Parameter
VOH
Description
Output HIGH Voltage
VOL
Output LOW Voltage
VIH
Input HIGH Voltage
Test Conditions
VCC = Min
IOH = –4.0 mA
-10 (Industrial) -12 (Automotive)
Min
Max
Min
Max
2.4
–
2.4
–
–
3.4
V
[4]
VCC = Max
IOH = –0.1mA
–
VCC = Min
IOL = 8.0 mA
–
0.4
–
0.4
V
2.0
VCC + 0.5
2.0
VCC + 0.5
V
–0.5
0.8
–0.5
0.8
V
[3]
3.4
[4]
Unit
VIL
Input LOW Voltage
IIX
Input Leakage Current
GND < VI < VCC
–1
+1
–1
+1
PA
IOZ
Output Leakage Current
GND < VOUT < VCC,
Output Disabled
–1
+1
–1
+1
PA
ICC
VCC Operating Supply Current
VCC = Max,
f = fMAX = 1/tRC
100 MHz
–
90
–
–
mA
83 MHz
–
80
–
95
mA
66 MHz
–
70
–
85
mA
40 MHz
–
60
–
75
mA
ISB1
Automatic CE Power-Down
Current – TTL Inputs
Max VCC, CE > VIH,
VIN > VIH or VIN < VIL, f = fMAX
–
20
–
25
mA
ISB2
Automatic CE Power-Down
Current – CMOS Inputs
Max VCC, CE > VCC – 0.3 V,
VIN > VCC – 0.3 V or VIN < 0.3 V, f = 0
–
10
–
15
mA
Notes
3. VIL (Min) = –2.0 V and VIH(max) = VCC + 2 V for pulse durations of less than 20 ns.
4. Please note that the maximum VOH limit does not exceed minimum CMOS VIH of 3.5 V. If you are interfacing this SRAM with 5V legacy processors that require a
minimum VIH of 3.5 V, please refer to Application Note AN6081 for technical details and options you may consider.
Document Number: 38-05472 Rev. *I
Page 4 of 16
CY7C1041D
Capacitance
Parameter [5]
Description
CIN
Input capacitance
COUT
I/O capacitance
Test Conditions
TA = 25 qC, f = 1 MHz, VCC = 5.0 V
Max
Unit
8
pF
8
pF
Thermal Resistance
Parameter [5]
Description
4JA
Thermal resistance
(junction to ambient)
4JC
Thermal resistance
(junction to case)
44-pin SOJ
Package
Test Conditions
Still Air, soldered on a 3 × 4.5 inch,
four-layer printed circuit board
44-pin TSOP II Unit
Package
57.91
50.66
qC/W
36.73
17.17
qC/W
AC Test Loads and Waveforms
Figure 2. AC Test Loads and Waveforms [6]
10 ns device
Z = 50:
OUTPUT
ALL INPUT PULSES
3.0 V
50 :
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
90%
30 pF*
GND
1.5 V
90%
10%
10%
d3 ns
(a)
(b)
d 3 ns
High-Z Characteristics:
R1 481:
5V
OUTPUT
THÉVENIN EQUIVALENT
167:
1.73 V
OUTPUT
Equivalent to:
R2
255:
5 pF
INCLUDING
JIG AND
SCOPE
(c)
Notes
5. Tested initially and after any design or process changes that may affect these parameters.
6. AC characteristics (except High-Z) are tested using the load conditions shown in Figure 2 (a). High-Z characteristics are tested for all speeds using the test load
shown in Figure 2 (c)
Document Number: 38-05472 Rev. *I
Page 5 of 16
CY7C1041D
Data Retention Characteristics
Over the Operating Range
Parameter
Conditions[7]
Description
Min
Max
Unit
2.0
–
V
VDR
VCC for Data Retention
ICCDR
Data Retention Current
VCC = VDR = 2.0 V,
Industrial
–
10
mA
ICCDR
Data Retention Current
CE > VCC – 0.3 V,
VIN > VCC – 0.3 V or VIN < 0.3 V
Automotive
–
15
mA
tCDR[8]
Chip Deselect to Data Retention
Time
0
–
ns
tR[9]
Operation Recovery Time
tRC
–
ns
Data Retention Waveform
Figure 3. Data Retention Waveform
DATA RETENTION MODE
VCC
4.5 V
VDR > 2 V
tCDR
4.5 V
tR
CE
Notes
7. No input may exceed VCC + 0.5 V.
8. Tested initially and after any design or process changes that may affect these parameters.
9. Full device operation requires linear VCC ramp from VDR to VCC(Min) > 50 Ps or stable at VCC(Min) > 50 Ps.
Document Number: 38-05472 Rev. *I
Page 6 of 16
CY7C1041D
Switching Characteristics
Over the Operating Range
Parameter [11]
Description
-10 (Industrial)
-12 (Automotive)
Min
Max
Min
Max
Unit
Read Cycle
tpower
VCC(typical) to the First Access[12]
100
–
100
–
Ps
tRC
Read Cycle Time
10
–
12
–
ns
tAA
Address to Data Valid
–
10
–
12
ns
tOHA
Data Hold from Address Change
3
–
3
–
ns
tACE
CE LOW to Data Valid
–
10
–
12
ns
tDOE
OE LOW to Data Valid
–
5
–
6
ns
tLZOE
OE LOW to Low Z
0
–
0
–
ns
–
5
–
6
ns
3
–
3
–
ns
Z[13, 14]
tHZOE
OE HIGH to High
tLZCE
CE LOW to Low Z[14]
[13, 14]
tHZCE
CE HIGH to High Z
–
5
–
6
ns
tPU
CE LOW to Power-Up
0
–
0
–
ns
tPD
CE HIGH to Power-Down
–
10
–
12
ns
tDBE
Byte Enable to Data Valid
–
5
–
6
ns
tLZBE
Byte Enable to Low Z
0
–
0
–
ns
Byte Disable to High Z
–
5
–
6
ns
tHZBE
Write Cycle
[15, 16]
tWC
Write Cycle Time
10
–
12
–
ns
tSCE
CE LOW to Write End
7
–
10
–
ns
tAW
Address Set-Up to Write End
7
–
10
–
ns
tHA
Address Hold from Write End
0
–
0
–
ns
tSA
Address Set-Up to Write Start
0
–
0
–
ns
tPWE
WE Pulse Width
7
–
10
–
ns
tSD
Data Set-Up to Write End
6
–
7
–
ns
tHD
Data Hold from Write End
0
–
0
–
ns
tLZWE
WE HIGH to Low Z[14]
3
–
3
–
ns
–
5
–
6
ns
7
–
10
–
ns
Z[13, 14]
tHZWE
WE LOW to High
tBW
Byte Enable to End of Write
Notes
10. AC characteristics (except High-Z) are tested using the load conditions shown in Figure 2 (a). High-Z characteristics are tested for all speeds using the test load
shown in Figure 2 (c)
11. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V, and output loading of the specified IOL/IOH
and 30-pF load capacitance.
12. tPOWER gives the minimum amount of time that the power supply should be at typical VCC values until the first memory access can be performed.
13. tHZOE, tHZCE, tHZBE, and tHZWE are specified with a load capacitance of 5 pF as in part (c) of Figure 2. Transition is measured when the outputs enter a high impedance state.
14. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, tHZBE is less than tLZBE, and tHZWE is less than tLZWE for any given device.
15. The internal Write time of the memory is defined by the overlap of CE LOW, and WE LOW. CE and WE must be LOW to initiate a Write, and the transition of either
of these signals can terminate the Write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the Write.
16. The minimum Write cycle time for Write Cycle No. 4 (WE Controlled, OE LOW) is the sum of tHZWE and tSD.
Document Number: 38-05472 Rev. *I
Page 7 of 16
CY7C1041D
Switching Waveforms
Figure 4. Read Cycle No. 1 [17, 18]
tRC
ADDRESS
tOHA
DATA OUT
tAA
PREVIOUS DATA VALID
DATA VALID
Figure 5. Read Cycle No. 2 (OE Controlled) [19, 20]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
BHE, BLE
tLZOE
tHZCE
tDBE
tLZBE
DATA OUT
HIGH IMPEDANCE
tLZCE
VCC
SUPPLY
CURRENT
tHZBE
DATA VALID
HIGH
IMPEDANCE
tPD
tPU
50%
ICC
50%
ISB
Notes
17. No input may exceed VCC + 0.5 V.
18. Device is continuously selected. OE, CE, BHE, and/or BHE = VIL.
19. WE is HIGH for read cycle.
20. Address valid prior to or coincident with CE transition LOW.
Document Number: 38-05472 Rev. *I
Page 8 of 16
CY7C1041D
Switching Waveforms(continued)
Figure 6. Write Cycle No. 1 (CE Controlled) [21, 22]
tWC
ADDRESS
CE
tSA
tSCE
tAW
tHA
tPWE
WE
tBW
BHE, BLE
tSD
tHD
DATAI/O
Figure 7. Write Cycle No. 2 (BLE or BHE Controlled)
tWC
ADDRESS
BHE, BLE
tSA
tBW
tAW
tHA
tPWE
WE
tSCE
CE
tSD
tHD
DATAI/O
Notes
21. Data I/O is high impedance if OE or BHE and/or BLE= VIH.
22. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.
Document Number: 38-05472 Rev. *I
Page 9 of 16
CY7C1041D
Switching Waveforms(continued)
Figure 8. Write Cycle No. 3 (WE Controlled, OE HIGH During Write) [23, 24]
tWC
ADDRESS
tSCE
CE
tAW
tHA
tSA
tPWE
WE
OE
BHE, BLE
t
SD
DATA I/O
NOTE 25
tHD
DATAIN VALID
t
HZOE
Figure 9. Write Cycle No. 4 (WE Controlled, OE LOW) [26]
tWC
BHE, BLE
ADDRESS
tSCE
CE
tAW
tHA
tSA
tPWE
WE
tBW
BHE, BLE
tHZWE
DATA I/O
tSD
tHD
NOTE 25
tLZWE
Notes
23. Address valid prior to or coincident with CE transition LOW.
24. Data I/O is high impedance if OE or BHE and/or BLE= VIH.
25. During this period the I/Os are in the output state and input signals should not be applied.
26. The minimum Write cycle time for Write Cycle No. 4 (WE Controlled, OE LOW) is the sum of tHZWE and tSD.
Document Number: 38-05472 Rev. *I
Page 10 of 16
CY7C1041D
Truth Table
I/O0–I/O7
I/O8–I/O15
Mode
Power
CE
OE
WE
BLE
BHE
H
X
X
X
X
High Z
High Z
Power Down
Standby (ISB)
L
L
H
L
L
Data Out
Data Out
Read All bits
Active (ICC)
L
L
H
L
H
Data Out
High Z
Read Lower bits only
Active (ICC)
L
L
H
H
L
High Z
Data Out
Read Upper bits only
Active (ICC)
L
X
L
L
L
Data In
Data In
Write All bits
Active (ICC)
L
X
L
L
H
Data In
High Z
Write Lower bits only
Active (ICC)
L
X
L
H
L
High Z
Data In
Write Upper bits only
Active (ICC)
L
H
H
X
X
High Z
High Z
Selected, Outputs Disabled
Active (ICC)
Ordering Information
Table 1 lists the CY7C1041D key package features and ordering codes. The table contains only the parts that are currently available.
If you do not see what you are looking for, contact your local sales representative. For more information, visit the Cypress website at
www.cypress.com and refer to the product summary page at http://www.cypress.com/products.
Table 1. Key Features and Ordering Information
Speed
(ns)
10
Package
Diagram
Ordering Code
Package Type
CY7C1041D-10VXI
51-85082 44-pin SOJ (400 Mils) Pb-free
CY7C1041D-10ZSXI
51-85087 44-pin TSOP (Type II) Pb-free
Operating
Range
Industrial
Ordering Code Definitions
CY 7 C 1 04 1
D - 10
XX
X
I
Temperature Range:
I = Industrial
Pb-free
Package Type: XX = V or ZS
V = 44-pin SOJ
ZS = 44-pin TSOP Type II
Speed: 10 ns
Process Technology: D = C9, 90 nm Technology
Data width: 1 = × 16-bits
Density: 04 = 4-Mbit density
Family Code: 1 = Fast Asynchronous SRAM family
Technology Code: C = CMOS
Marketing Code: 7 = SRAM
Company ID: CY = Cypress
Document Number: 38-05472 Rev. *I
Page 11 of 16
CY7C1041D
Package Diagrams
Figure 10. 44-pin SOJ (400 Mils) V44.4 Package Outline, 51-85082
51-85082 *E
Figure 11. 44-pin TSOP Z44-II Package Outline, 51-85087
51-85087 *E
Document Number: 38-05472 Rev. *I
Page 12 of 16
CY7C1041D
Acronyms
Acronym
Document Conventions
Description
Units of Measure
CE
Chip Enable
CMOS
Complementary Metal Oxide Semiconductor
°C
degree Celsius
I/O
Input/Output
MHz
megahertz
OE
Output Enable
μA
microampere
SRAM
Static Random Access Memory
mA
milliampere
SOJ
Small Outline J-Lead
mV
millivolt
TSOP
Thin Small Outline Package
mW
milliwatt
VFBGA
Very Fine-Pitch Ball Grid Array
ns
nanosecond
pF
picofarad
V
volt
W
watt
Document Number: 38-05472 Rev. *I
Symbol
Unit of Measure
Page 13 of 16
CY7C1041D
Document History Page
Document Title: CY7C1041D, 4-Mbit (256 K × 16) Static RAM
Document Number: 38-05472
Revision
ECN
Orig. of
Change
Submission
Date
**
201560
SWI
See ECN
Advance Datasheet for C9 IPP
*A
233729
RKF
See ECN
1.AC, DC parameters are modified as per EROS (Spec #01-2165)
2.Pb-free offering in the ‘ordering information’
*B
351117
PCI
See ECN
Changed from Advance to Preliminary
Removed 17 and 20 ns Speed bin
Added footnote # 4
Redefined ICC values for Com’l and Ind’l temperature ranges
ICC (Com’l): Changed from 67 and 54 mA to 75 and 70 mA for 12 and 15 ns
speed bins respectively
ICC (Ind’l): Changed from 80, 67 and 54 mA to 90, 85 and 80 mA for 10, 12 and
15 ns speed bins respectively
Changed footnote # 10 on tR
Changed tSCE from 8 to 7 ns for 10 ns speed bin
Added Static Discharge Voltage and latch-up current spec
Added VIH(max) spec in footnote # 2
Changed reference voltage level for measurement of Hi-Z parameters from
r500 mV to r200 mV
Added Write Cycle (WE Controlled, OE HIGH During Write) Timing Diagram
Changed part names from Z to ZS in the Ordering Information Table
Removed L-Version
Added 10 ns parts in the Ordering Information Table
Added Lead-Free Ordering Information
Shaded Ordering Information Table
*C
446328
NXR
See ECN
Converted Preliminary to Final
Removed -15 speed bin
Removed Commercial Operating Range product information
Added Automotive Operating Range product information
Changed Maximum Rating for supply voltage from 7 V to 6 V
Updated Thermal Resistance table
Changed tHZWE from 6 ns to 5 ns
Updated footnote #8 on High-Z parameter measurement
Updated the Ordering Information and replaced Package Name column with
Package Diagram in the Ordering Information table
*D
2897049
VKN
03/22/10
Removed inactive parts from the ordering information table.
*E
3109184
AJU
12/13/2010 Added Ordering Code Definitions.
*F
3236731
PRAS
04/21/2011 Template updates.
Added acronyms and units tables.
*G
4040855
MEMJ
06/27/2013 Updated Functional Description.
Updated Electrical Characteristics:
Added one more Test Condition “VCC = Max, IOH = –0.1mA” for VOH parameter
and added maximum value corresponding to that Test Condition.
Added Note 4 and referred the same note in maximum value for VOH parameter
corresponding to Test Condition “VCC = Max, IOH = –0.1mA”.
Updated Package Diagrams:
spec 51-85082 – Changed revision from *C to *E.
spec 51-85087 – Changed revision from *C to *E.
Updated in new template.
Document Number: 38-05472 Rev. *I
Description of Change
Page 14 of 16
CY7C1041D
Document History Page(continued)
Document Title: CY7C1041D, 4-Mbit (256 K × 16) Static RAM
Document Number: 38-05472
Revision
ECN
Orig. of
Change
*H
4390998
MEMJ
05/27/2014 Updated Switching Characteristics:
Updated Note 16 (Replaced “Write Cycle No. 3” with “Write Cycle No. 4”).
Updated Switching Waveforms:
Added Note 26 and referred the same note in Figure 9.
Completing Sunset Review.
*I
4578500
MEMJ
11/24/2014 Added related documentation hyperlink in page 1.
Document Number: 38-05472 Rev. *I
Submission
Date
Description of Change
Page 15 of 16
CY7C1041D
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© Cypress Semiconductor Corporation, 2004-2014. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 38-05472 Rev. *I
Revised November 24, 2014
All products and company names mentioned in this document may be the trademarks of their respective holders.
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