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CY7C1079DV33-12BAXIT

CY7C1079DV33-12BAXIT

  • 厂商:

    CYPRESS(赛普拉斯)

  • 封装:

    TFBGA48

  • 描述:

    IC SRAM 32MBIT PARALLEL 48FBGA

  • 数据手册
  • 价格&库存
CY7C1079DV33-12BAXIT 数据手册
Please note that Cypress is an Infineon Technologies Company. The document following this cover page is marked as “Cypress” document as this is the company that originally developed the product. Please note that Infineon will continue to offer the product to new and existing customers as part of the Infineon product portfolio. Continuity of document content The fact that Infineon offers the following product as part of the Infineon product portfolio does not lead to any changes to this document. Future revisions will occur when appropriate, and any changes will be set out on the document history page. Continuity of ordering part numbers Infineon continues to support existing part numbers. Please continue to use the ordering part numbers listed in the datasheet for ordering. www.infineon.com CY7C1079DV33 32-Mbit (4 M × 8) Static RAM 32-Mbit (4 M × 8) Static RAM Features ■ High Speed ❐ tAA = 12 ns ■ Low Active Power ❐ ICC = 250 mA at 12 ns ■ Low CMOS Standby Power ❐ ISB2 = 50 mA Functional Description The CY7C1079DV33 is a high performance CMOS Static RAM organized as 4,194,304 words by 8 bits. To write to the device, take Chip Enable (CE [1]) and Write Enable (WE) input LOW. Data on the eight I/O pins (I/O0 through I/O7) is then written into the location specified on the address pins (A0 through A21). ■ Operating Voltages of 3.3 ± 0.3 V ■ 2.0 V Data Retention ■ Automatic Power Down when Deselected ■ TTL Compatible Inputs and Outputs ■ Available in Pb-free 48-ball FBGA Package To read from the device, take Chip Enable (CE [1]) LOW and Output Enable (OE) LOW while forcing the Write Enable (WE) HIGH. Under these conditions, the contents of the memory location specified by the address pins appear on the I/O pins. See Truth Table (Single Chip Enable) on page 10 for a complete description of Read and Write modes. The input and output pins (I/O0 through I/O7) are placed in a high impedance state when the device is deselected (CE [1] HIGH), the outputs are disabled (OE HIGH), or during a write operation (CE [1] LOW and WE LOW). The CY7C1079DV33 is available in a 48-ball FBGA package. For a complete list of related documentation, click here. Logic Block Diagram 4M x 8 ARRAY SENSE AMPS A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 ROW DECODER INPUT BUFFER IO0 – IO7 WE COLUMN DECODER OE A10 A11 A 12 A 13 A 14 A15 A16 A17 A18 A19 A20 A21 CE [1] Note 1. BGA packaged device is offered in single CE and dual CE options. In this data sheet, for a dual CE device, CE refers to the internal logical combination of CE1 and CE2 such that when CE1 is LOW and CE2 is HIGH, CE is LOW. For all other cases CE is HIGH. Cypress Semiconductor Corporation Document Number: 001-50282 Rev. *F • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised November 28, 2014 CY7C1079DV33 Contents Selection Guide ................................................................ 3 Pin Configuration ............................................................. 3 Maximum Ratings ............................................................. 4 Operating Range ............................................................... 4 DC Electrical Characteristics .......................................... 4 Capacitance ...................................................................... 5 Thermal Resistance .......................................................... 5 AC Test Loads and Waveforms ....................................... 5 Data Retention Characteristics ....................................... 6 Data Retention Waveform ................................................ 6 AC Switching Characteristics ......................................... 7 Switching Waveforms ...................................................... 8 Truth Table (Single Chip Enable) .................................. 10 Truth Table (Dual Chip Enable) ..................................... 10 Document Number: 001-50282 Rev. *F Ordering Information ...................................................... 11 Ordering Code Definitions ......................................... 11 Package Diagrams .......................................................... 12 Acronyms ........................................................................ 13 Document Conventions ................................................. 13 Units of Measure ....................................................... 13 Document History Page ................................................. 14 Sales, Solutions, and Legal Information ...................... 15 Worldwide Sales and Design Support ....................... 15 Products .................................................................... 15 PSoC® Solutions ...................................................... 15 Cypress Developer Community ................................. 15 Technical Support ..................................................... 15 Page 2 of 15 CY7C1079DV33 Selection Guide -12 Unit Maximum Access Time Description 12 ns Maximum Operating Current 250 mA Maximum CMOS Standby Current 50 mA Pin Configuration Figure 1. 48-ball FBGA (Single Chip Enable) pinout [2] 1 2 3 4 5 6 NC OE A0 A1 A2 NC NC NC A3 A4 CE IO0 NC A5 A6 VSS IO1 A17 VCC IO2 IO3 Figure 2. 48-ball FBGA (Dual Chip Enable) pinout [2] 1 2 3 4 5 6 A NC OE A0 A1 A2 CE2 A NC B NC NC A3 A4 CE1 NC B NC IO4 C IO0 NC A5 A6 NC IO4 C A7 IO5 VCC D VSS IO1 A17 A7 IO5 VCC D A18 A16 IO6 VSS E VCC IO2 A18 A16 IO6 VSS E NC A14 A15 NC IO7 F IO3 NC A14 A15 NC IO7 F NC A21 A12 A13 WE NC G NC A21 A12 A13 WE NC G A19 A8 A9 A10 A11 A20 H A19 A8 A9 A10 A11 A20 H Note 2. NC pins are not connected to the die. Document Number: 001-50282 Rev. *F Page 3 of 15 CY7C1079DV33 DC Input Voltage [3] ............................ –0.5 V to VCC + 0.5 V Maximum Ratings Current into Outputs (LOW) ........................................ 20 mA Exceeding maximum ratings may shorten the useful life of the device. These user guidelines are not tested. Static Discharge Voltage (MIL-STD-883, Method 3015) ................................. > 2001 V Storage Temperature ............................... –65 C to +150 C Latch Up Current ................................................... > 200 mA Ambient Temperature with Power Applied ......................................... –55 C to +125 C Operating Range Supply Voltage on VCC Relative to GND [3] ...............................–0.5 V to +4.6 V DC Voltage Applied to Outputs in High Z State [3] ................................ –0.5 V to VCC + 0.5 V Range Ambient Temperature VCC Industrial –40 C to +85 C 3.3 V  0.3 V DC Electrical Characteristics Over the Operating Range Parameter Description Test Conditions VOH Output HIGH Voltage VCC = Min, IOH = –4.0 mA VOL Output LOW Voltage VCC = Min, IOL = 8.0 mA -12 Unit Min Max 2.4 – V – 0.4 V VIH Input HIGH Voltage 2.0 VCC + 0.3 V VIL Input LOW Voltage [3] –0.3 0.8 V IIX Input Leakage Current GND < VI < VCC –1 +1 A IOZ Output Leakage Current GND < VOUT < VCC, Output disabled –1 +1 A ICC VCC Operating Supply Current VCC = Max, f = fMAX = 1/tRC, IOUT = 0 mA CMOS levels – 250 mA ISB1 Automatic CE Power Down Current – TTL Inputs Max VCC, CE [4] > VIH, VIN > VIH or VIN < VIL, f = fMAX – 60 mA ISB2 Automatic CE Power Down Current – CMOS Inputs Max VCC, CE [4] > VCC – 0.3 V, VIN > VCC – 0.3 V, or VIN < 0.3 V, f = 0 – 50 mA Notes 3. VIL (min) = –2.0 V and VIH(max) = VCC + 2 V for pulse durations of less than 20 ns. 4. BGA packaged device is offered in single CE and dual CE options. In this data sheet, for a dual CE device, CE refers to the internal logical combination of CE1 and CE2 such that when CE1 is LOW and CE2 is HIGH, CE is LOW. For all other cases CE is HIGH. Document Number: 001-50282 Rev. *F Page 4 of 15 CY7C1079DV33 Capacitance Parameter [5] Description CIN Input capacitance COUT I/O capacitance Test Conditions 48-ball FBGA Unit 16 pF 20 pF Test Conditions 48-ball FBGA Unit Still air, soldered on a 3 × 4.5 inch, four layer printed circuit board 30.91 C/W 13.60 C/W TA = 25 C, f = 1 MHz, VCC = 3.3 V Thermal Resistance Parameter [5] Description JA Thermal resistance (junction to ambient) JC Thermal resistance (junction to case) AC Test Loads and Waveforms Figure 3. AC Test Loads and Waveforms [6] High-Z characteristics 3.3 V 50  VTH = 1.5 V OUTPUT Z0 = 50  R1 317  OUTPUT 30 pF* 5 pF* (a) * Capacitive load consists of all components of the test environment 3.0 V GND Rise Time > 1 V/ns ALL INPUT PULSES 90% 90% 10% 10% (c) R2 351 INCLUDING JIG AND SCOPE (b) Fall Time: > 1 V/ns Notes 5. Tested initially and after any design or process changes that may affect these parameters. 6. Valid SRAM operation does not occur until the power supplies have reached the minimum operating VDD (3.0 V). 100 s (tpower) after reaching the minimum operating VDD, normal SRAM operation begins including reduction in VDD to the data retention (VCCDR, 2.0 V) voltage. Document Number: 001-50282 Rev. *F Page 5 of 15 CY7C1079DV33 Data Retention Characteristics Over the Operating Range Parameter Description Conditions VCC for Data Retention VDR [7] ICCDR Data Retention Current VCC = 2 V, CE > VCC – 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V tCDR [8] Chip Deselect to Data Retention Time tR [9] Operation Recovery Time Min Typ Max Unit 2 – – V – – 50 mA 0 – – ns tRC – – ns Data Retention Waveform Figure 4. Data Retention Waveform DATA RETENTION MODE VCC 3.0 V tCDR VDR > 2 V 3.0 V tR CE [6] Notes 7. BGA packaged device is offered in single CE and dual CE options. In this data sheet, for a dual CE device, CE refers to the internal logical combination of CE1 and CE2 such that when CE1 is LOW and CE2 is HIGH, CE is LOW. For all other cases CE is HIGH. 8. Tested initially and after any design or process changes that may affect these parameters. 9. Full device operation requires linear VCC ramp from VDR to VCC(min.) > 50 s or stable at VCC(min.) > 50 s. Document Number: 001-50282 Rev. *F Page 6 of 15 CY7C1079DV33 AC Switching Characteristics Over the Operating Range Parameter [10] Description -12 Min Max Unit Read Cycle tpower VCC(Typical) to the First Access [11] 100 – s tRC Read Cycle Time 12 – ns tAA Address to Data Valid – 12 ns tOHA Data Hold from Address Change 3 – ns tACE CE [12] LOW to Data Valid – 12 ns tDOE OE LOW to Data Valid – 7 ns tLZOE OE LOW to Low Z 1 – ns – 7 ns 3 – ns – 7 ns 0 – ns – 12 ns [13] tHZOE OE HIGH to High Z tLZCE CE LOW to Low Z [12, 13] tHZCE tPU tPD CE HIGH LOW to High Z [12, 13] CE LOW HIGH to Power Up [12, 14] CE HIGH LOW to Power Down [12, 14] Write Cycle [15, 16] tWC Write Cycle Time 12 – ns tSCE CE [12] LOW 9 – ns tAW Address Setup to Write End 9 – ns tHA Address Hold from Write End 0 – ns tSA Address Setup to Write Start 0 – ns tPWE WE Pulse Width 9 – ns tSD Data Setup to Write End 7 – ns tHD Data Hold from Write End 0 – ns WE HIGH to Low Z [13] 3 – ns WE LOW to High Z [13] – 7 ns tLZWE tHZWE HIGH to Write End Notes 10. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, and input pulse levels of 0 to 3.0 V. Test conditions for the read cycle use output loading shown in part a) of Figure 3 on page 5, unless specified otherwise. 11. tPOWER gives the minimum amount of time that the power supply is at typical VCC values until the first memory access is performed. 12. BGA packaged device is offered in single CE and dual CE options. In this data sheet, for a dual CE device, CE refers to the internal logical combination of CE1 and CE2 such that when CE1 is LOW and CE2 is HIGH, CE is LOW. For all other cases CE is HIGH. 13. tHZOE, tHZCE, tHZWE, tLZOE, tLZCE, and tLZWE are specified with a load capacitance of 5 pF as in (b) of Figure 3 on page 5. Transition is measured 200 mV from steady state voltage. 14. These parameters are guaranteed by design and are not tested. 15. The internal write time of the memory is defined by the overlap of WE, CE = VIL. CE and WE are LOW to initiate a write, and the transition of any of these signals can terminate. The input data setup and hold timing should be referenced to the edge of the signal that terminates the write. 16. The minimum write cycle time for Write Cycle No. 2 (WE controlled, OE LOW) is the sum of tHZWE and tSD. Document Number: 001-50282 Rev. *F Page 7 of 15 CY7C1079DV33 Switching Waveforms Figure 5. Read Cycle No. 1 [17, 18] tRC RC ADDRESS tOHA DATA OUT tAA PREVIOUS DATA VALID DATA VALID Figure 6. Read Cycle No. 2 (OE Controlled) [18, 19, 20] tRC ADDRESS CE tACE OE tHZOE tDOE tHZCE tLZOE DATA OUT HIGH IMPEDANCE tLZCE VCC SUPPLY CURRENT HIGH IMPEDANCE DATA VALID tPD tPU 50% 50% ICC ISB Notes 17. The device is continuously selected. CE = VIL. 18. WE is HIGH for read cycle. 19. BGA packaged device is offered in single CE and dual CE options. In this data sheet, for a dual CE device, CE refers to the internal logical combination of CE1 and CE2 such that when CE1 is LOW and CE2 is HIGH, CE is LOW. For all other cases CE is HIGH. 20. Address valid before or similar to CE transition LOW. Document Number: 001-50282 Rev. *F Page 8 of 15 CY7C1079DV33 Switching Waveforms (continued) Figure 7. Write Cycle No. 1 (CE Controlled) [21, 22, 23] tWC ADDRESS tSA CE tSCE tAW tHA tPWE WE tSD tHD DATA I/O Figure 8. Write Cycle No. 2 (WE Controlled, OE LOW) [21, 22, 23] tWC ADDRESS tSCE CE tAW tHA tSA tPWE WE tHZWE tSD tHD DATA I/O tLZWE Notes 21. BGA packaged device is offered in single CE and dual CE options. In this data sheet, for a dual CE device, CE refers to the internal logical combination of CE1 and CE2 such that when CE1 is LOW and CE2 is HIGH, CE is LOW. For all other cases CE is HIGH. 22. Data I/O is high impedance if OE = VIH. 23. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high impedance state. Document Number: 001-50282 Rev. *F Page 9 of 15 CY7C1079DV33 Truth Table (Single Chip Enable) CE [1] OE WE H X X High Z Power Down Standby (ISB) L L H Data Out Read All Bits Active (ICC) L X L Data In Write All Bits Active (ICC) L H H High Z Selected, Outputs Disabled Active (ICC) I/O0–I/O7 Mode Power Truth Table (Dual Chip Enable) CE1 CE2 OE WE I/O0–I/O7 H X X X High Z Power Down Standby (ISB) X L X X High Z Power Down Standby (ISB) L H L H Data Out Read All Bits Active (ICC) L H X L Data In Write All Bits Active (ICC) L H H H High Z Selected, Outputs Disabled Active (ICC) Document Number: 001-50282 Rev. *F Mode Power Page 10 of 15 CY7C1079DV33 Ordering Information Speed (ns) 12 Ordering Code CY7C1079DV33-12BAXI Package Diagram Package Type 51-85191 48-ball FBGA (8 × 9.5 × 1.2 mm) (Pb-free) [24] Operating Range Industrial Contact sales for part availability. Ordering Code Definitions CY 7 C 1 07 9 D V33 - 12 XX X I Temperature Range: I = Industrial Pb-free Package Type: XX = BA or B2 BA = 48-ball FBGA – Single Chip Enable B2 = 48-ball FBGA – Dual Chip Enable Speed: 12 ns Voltage Range: V33 = 3 V to 3.6 V Process Technology: D = C9, 90 nm Technology Data width: 9 = × 8-bits Density: 07 = 32-Mbit density Family Code: 1 = Fast Asynchronous SRAM family Technology Code: C = CMOS Marketing Code: 7 = SRAM Company ID: CY = Cypress Notes 24. This BGA package is offered with single chip enable. 25. This BGA package is offered with dual chip enable. Document Number: 001-50282 Rev. *F Page 11 of 15 CY7C1079DV33 Package Diagrams Figure 9. 48-ball FBGA (8 × 9.5 × 1.2 mm) BA48J Package Outline, 51-85191 51-85191 *C Document Number: 001-50282 Rev. *F Page 12 of 15 CY7C1079DV33 Acronyms Acronym Document Conventions Description Units of Measure CE Chip Enable CMOS Complementary Metal Oxide Semiconductor °C degree Celsius FPBGA Fine-Pitch Ball Grid Array MHz megahertz I/O Input/Output µA microampere OE Output Enable µs microsecond SRAM Static Random Access Memory mA milliampere mm millimeter TTL Transistor-Transistor Logic WE Write Enable Document Number: 001-50282 Rev. *F Symbol Unit of Measure ms millisecond mV millivolt ns nanosecond  ohm % percent pF picofarad V volt W watt Page 13 of 15 CY7C1079DV33 Document History Page Document Title: CY7C1079DV33, 32-Mbit (4 M × 8) Static RAM Document Number: 001-50282 Rev. ECN No. Submission Date Orig. of Change ** 2711136 05/29/2009 VKN / PYRS New data sheet. *A 2759408 09/03/2009 VKN / AESA Removed 10 ns speed bin related information across the document. Description of Change Updated Thermal Resistance: Marked thermal specs as “TBD”. Updated AC Switching Characteristics: Changed maximum value of tDOE, tHZOE, tHZCE, tHZWE parameters from 6 ns to 7 ns. Updated Ordering Information: Added -12B2XI part (Dual CE option) *B 2813370 11/23/2009 VKN *C 3132969 01/11/2011 PRAS Updated DC Electrical Characteristics: Changed maximum value of ICC parameter from 225 mA to 250 mA. Added Ordering Code Definitions under Ordering Information. Updated Package Diagrams. Added Acronyms and Units of Measure. Changed all instances of IO to I/O. Updated in new template. *D 3232668 04/18/2011 PRAS Changed status from Preliminary to Final. Updated Pin Configuration (Figure 2). Updated Thermal Resistance. *E 4434923 07/09/2014 VINI Updated Package Diagrams: spec 51-85191 – Changed revision from *A to *C. Updated in new template. Completing Sunset Review. *F 4582593 11/28/2014 Document Number: 001-50282 Rev. *F VINI Added related documentation hyperlink in page 1. Removed missing part number CY7C1079DV33-12B2XI in Ordering Information. Page 14 of 15 CY7C1079DV33 Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office closest to you, visit us at Cypress Locations. PSoC® Solutions Products Automotive Clocks & Buffers Interface Lighting & Power Control cypress.com/go/automotive cypress.com/go/clocks cypress.com/go/interface cypress.com/go/powerpsoc cypress.com/go/plc Memory cypress.com/go/memory PSoC Touch Sensing cypress.com/go/psoc PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP Cypress Developer Community Community | Forums | Blogs | Video | Training Technical Support cypress.com/go/support cypress.com/go/touch USB Controllers Wireless/RF psoc.cypress.com/solutions cypress.com/go/USB cypress.com/go/wireless © Cypress Semiconductor Corporation, 2009-2014. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. Document Number: 001-50282 Rev. *F Revised November 28, 2014 All products and company names mentioned in this document may be the trademarks of their respective holders. Page 15 of 15
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