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CY7C136E-25JXIT

CY7C136E-25JXIT

  • 厂商:

    EUPEC(英飞凌)

  • 封装:

    PLCC52

  • 描述:

    IC SRAM 16KBIT PARALLEL 52PLCC

  • 数据手册
  • 价格&库存
CY7C136E-25JXIT 数据手册
CY7C131E/CY7C131AE CY7C136E/CY7C136AE 1K/2K × 8 Dual-Port Static RAM 1K/2K × 8 Dual-Port Static RAM Features Functional Description ■ True dual-ported memory cells, which allow simultaneous reads of the same memory location ■ 1K/2K × 8 organization ■ 0.35 micron complementary metal oxide semiconductor (CMOS) for optimum speed and power ■ High speed access: 15 ns ■ Low operating power: ICC = 110 mA (typical), Standby: ISB3 = 0.05 mA (typical) ■ Fully asynchronous operation ■ Automatic power-down ■ BUSY output flag to indicate access to the same location by both ports ■ INT flag for port-to-port communication ■ Available in 52-pin plastic leaded chip carrier (PLCC), 52-pin plastic quad flat package (PQFP) ■ Pb-free packages available CY7C131E/CY7C131AE/CY7C136E/CY7C136AE are high-speed, low-power CMOS 1K/2K × 8 dual-port static RAMs. Two ports are provided permitting independent access to any location in memory. The CY7C131E/CY7C131AE/CY7C136E/ CY7C136AE can be used as a standalone dual-port static RAM. It is the solution to applications requiring shared or buffered data, such as cache memory for DSP, bit-slice, or multiprocessor designs. Each port has independent control pins; chip enable (CE), write enable (R/W), and output enable (OE). Two flags are provided on each port, BUSY and INT. The BUSY flag signals that the port is trying to access the same location, which is currently being accessed by the other port. The INT is an interrupt flag indicating that data is placed in a unique location[1]. The BUSY and INT flags are push pull outputs. An automatic power-down feature is controlled independently on each port by the chip enable (CE) pins. The CY7C131E/CY7C131AE/CY7C136E/CY7C136AE are available in 52-pin Pb-free PLCC and 52-pin Pb-free PQFP. For a complete list of related documentation, click here. Logic Block Diagram R/WL CEL R/WR CER OEL OER I/O7L I/O CONTROL I/O0L [2] BUSYL I/O CONTROL I/O7R I/O0R [2] BUSYR A 9/10L [4] A 0L ADDR DECODER CEL OEL MEMORY ARRAY ADDR DECODER 7C131E/7C131AE/ ARBITRATION 7C136E/7C136AE LOGIC ARBITRATION (7C130/7C131 LOGIC ONLY) A 9/10R [4] A 0R CER AND INTERRUPT LOGIC OER INTERRUPT LOGIC R/WL R/WR [3] INTL [3] INTR Notes 1. Unique location used by interrupt flag: 1K × 8: Left port reads from 3FE, Right port reads from 3FF; 2K × 8: Left port reads from 7FE, Right port reads from 7FF. 2. BUSY is a push-pull output. No pull-up resistor required. 3. INT: push-pull output. No pull-up resistor required. 4. 1K × 8: A0–A9, 2K × 8: A0–A10, address lines are for both left and right ports. Cypress Semiconductor Corporation Document Number: 001-64231 Rev. *I • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised November 14, 2017 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Contents Pin Configurations ........................................................... 3 Pin Definitions .................................................................. 3 Selection Guide ................................................................ 3 Maximum Ratings ............................................................. 4 Operating Range ............................................................... 4 Electrical Characteristics ................................................. 4 Capacitance ...................................................................... 5 AC Test Loads and Waveforms ....................................... 5 Switching Characteristics ................................................ 6 Switching Characteristics ................................................ 8 Switching Waveforms .................................................... 10 Ordering Information ...................................................... 15 Document Number: 001-64231 Rev. *I Ordering Code Definitions ......................................... 16 Package Diagrams .......................................................... 17 Acronyms ........................................................................ 18 Document Conventions ................................................. 18 Units of Measure ....................................................... 18 Document History Page ................................................. 19 Sales, Solutions, and Legal Information ...................... 21 Worldwide Sales and Design Support ....................... 21 Products .................................................................... 21 PSoC® Solutions ...................................................... 21 Cypress Developer Community ................................. 21 Technical Support ..................................................... 21 Page 2 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Pin Configurations Figure 1. 52-pin PLCC pinout (Top View) I/O5R I/O6R A6R A7R A8R A9R NC I/O7R BUSYR INTR NC/A10R CER R/WR BUSYL R/W L CEL VCC A0L OEL NC/A10L INTL OER A0R A1R A2R A3R A4R A5R I/O2R I/O3R I/O4R 52 51 50 49 48 47 46 45 44 43 42 41 40 A1L A2L A3L A4L A5L A6L A7L A8L A9L I/O0L I/O1L I/O2L I/O3L 1 2 3 4 5 6 7 8 9 10 11 12 13 OER A0R A1R A2R A3R A4R A5R 39 38 37 36 35 34 33 32 31 30 29 28 27 7C131E/7C131AE 7C136E/7C131AE A6R A7R A8R A9R NC I/O7R I/O5R I/O6R I/O2R I/O3R I/O4R NC GND I/O0R I/O1R I/O6L I/O7L 14 15 16 17 18 19 20 21 22 23 24 25 26 I/O4L I/O5L I/O0R I/O1R NC GND I/O6L I/O7L 7 6 5 4 3 2 1 52 51 50 49 48 47 46 45 44 43 42 41 7C131E/7C131AE 40 7C136E/7C136AE 39 38 37 36 35 34 2122 23 24 25 26 27 28 29 30 31 32 33 [5] [5] BUSYR INTR NC/A10R CER R/WR BUSYL R/W L CEL VCC A0L OEL NC/A10L INTL 8 9 10 11 12 13 14 15 16 17 18 19 20 I/O4L I/O5L A1L A2L A3L A4L A5L A6L A7L A8L A9L I/O0L I/O1L I/O2L I/O3L Figure 2. 52-pin PQFP pinout (Top View) [5] [5] Pin Definitions Left Port Right Port Description CEL CER Chip Enable R/WL R/WR Read/Write Enable OEL OER Output Enable A0R–A9/10R[5] Address I/O0L–I/O7L I/O0R–I/O7R Data Bus Input/Output INTL INTR Interrupt Flag BUSYL BUSYR Busy Flag A0L–A9/10L [5] VCC Power GND Ground Selection Guide Parameter 7C131E-15 7C131AE-15 7C131E-25 7C136E-25 7C131E-55 7C136E-55 7C136AE-55 Unit Maximum Access Time 15 25 55 ns Typical Operating Current 110 100 95 mA Typical Standby Current for ISB1 (both ports TTL level) Typical Standby Current for ISB3 (Both ports CMOS level) 50 45 45 mA 0.05 0.05 0.05 mA Note 5. 1K × 8: A0–A9, 2K × 8: A0–A10, address lines are for both left and right ports. Document Number: 001-64231 Rev. *I Page 3 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE DC input voltage [7] ......................................–0.5 V to +7.0 V Maximum Ratings Exceeding maximum ratings [6] may shorten the useful life of the device. User guidelines are not tested. Output current into outputs (LOW) ............................. 20 mA Static discharge voltage .......................................... >1100 V Storage temperature ................................ –65 C to +150 C Latch up current ..................................................... >200 mA Ambient temperature with power applied ................................... –55 C to +125 C Operating Range Supply voltage to ground potential ..............–0.3 V to +7.0 V DC voltage applied to outputs in High Z State .............................................–0.5 V to +7.0 V Range Ambient Temperature VCC 0C to +70 C 5 V ± 10% –40 C to +85 C 5 V ± 10% Commercial Industrial Electrical Characteristics Over the Operating Range Parameter Description Test Conditions 7C131E-15 7C131AE-15 7C131E-25 7C136E-25 7C131E-55 7C136E-55 7C136AE-55 Unit Min Typ [8] Max Min Typ [8] Max Min Typ [8] Max VOH Output HIGH Voltage VCC = Min, IOH = –4.0 mA 2.4 – – 2.4 – – 2.4 – – V VOL Output LOW Voltage VCC = Min, IOL = 4.0 mA – – 0.4 – – 0.4 – – 0.4 V VIH Input HIGH Voltage 2.2 – – 2.2 – – 2.2 – – V VIL Input LOW Voltage – – 0.8 – – 0.8 – – 0.8 V IOZ Output Leakage Current –20 – +20 –20 – +20 –20 – +20 A ICC VCC Operating VCC = Max, IOUT = 0 mA Supply Current Outputs disabled Commercial Industrial – 110 115 190 200 – 100 110 170 180 – 95 105 160 170 mA ISB1 Standby Current, Both Ports, TTL Inputs CEL and CER > VIH, f = fMAX[9] Commercial Industrial – 50 65 70 95 – 45 65 65 95 – 45 65 65 95 mA ISB2 Standby Current, One Port, TTL Inputs CEL or CER > VIH, Active Port Outputs Open, f = fMAX[9] Commercial Industrial – 120 135 180 205 – 110 135 160 205 – 110 135 160 205 mA ISB3 Standby Current, Both Ports, CMOS Inputs Both Ports Commercial CEL and CER > VCC – 0.2 V, Industrial VIN > VCC – 0.2 V or VIN < 0.2 V, f = 0 – 0.05 0.05 0.5 0.5 – 0.05 0.05 0.5 0.5 – 0.05 0.05 0.5 0.5 mA ISB4 Standby Current, One Port, CMOS Inputs One Port CEL or CER > VCC – 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V, Active Port Outputs Open, f = fMAX[9] – 110 125 160 175 – 100 125 140 175 – 100 125 140 175 mA GND < VO < VCC, Output disabled Commercial Industrial Notes 6. The voltage on any I/O pin cannot exceed the power pin during power-up. 7. Pulse width < 20 ns. 8. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ.), TA = 25 °C. 9. At f = fMAX, address and data inputs are cycling at the maximum frequency of read cycle of 1/tRC and using AC Test Waveforms input levels of GND to 3 V. Document Number: 001-64231 Rev. *I Page 4 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Capacitance Parameter [10] Description CIN Input capacitance COUT Output capacitance Test Conditions TA = 25 C, f = 1 MHz, VCC = 5.0 V Max Unit 15 pF 10 pF AC Test Loads and Waveforms Figure 3. AC Test Loads and Waveforms 5V 5V R1 = 893  OUTPUT C = 30 pF OUTPUT R2 = 347  RTH = 250  R1 = 893  OUTPUT C = 30 pF C = 5 pF VTH = 1.4 V (a) Normal Load (Load 1) ALL INPUT PULSES 3.0 V GND 10% 90%  5 ns (b) Thévenin Equivalent (Load 1) R2 = 347  (c) Three-State Delay (Load 2) (Used for tLZ, tHZ, tHZWE, and tLZWE including scope and jig) (CY7C131E/CY7C131AE ONLY) 90% 10% 5ns Note 10. Tested initially and after any design or process changes that may affect these parameters. Document Number: 001-64231 Rev. *I Page 5 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Switching Characteristics Over the Operating Range Parameter [11] Description 7C131E-15/7C131AE-15 7C131E-25/7C136E-25 Unit Min Max Min Max 15 – 25 – ns – 15 – 25 ns Read Cycle tRC Read cycle time [12] tAA Address to data valid tOHA Data hold from Address change 3 – 3 – ns tACE CE LOW to data valid [12] – 15 – 25 ns tDOE OE LOW to data valid [12] – 10 – 15 ns 3 – 3 – ns – 10 – 15 ns 3 – 5 – ns – 10 – 15 ns 0 – 0 – ns – 15 – 25 ns tLZOE tHZOE OE LOW to Low Z [13, 14, 15] OE HIGH to High Z [13, 14, 15] [13, 14, 15] tLZCE CE LOW to Low Z tHZCE CE HIGH to High Z [13, 14, 15] tPU tPD Write Cycle CE LOW to power-up [13] CE HIGH to power-down [13] [16] tWC Write cycle time 15 – 25 – ns tSCE CE LOW to write end 12 – 20 – ns tAW Address setup to write end 12 – 20 – ns tHA Address hold from write end 0 – 0 – ns tSA Address setup to write start 0 – 0 – ns tPWE R/W pulse width 10 – 12 – ns tSD Data setup to write end 10 – 15 – ns tHD Data hold from write end 0 – 0 – ns tHZWE[13] R/W LOW to High Z [15] – 10 – 15 ns tLZWE[13] [15] 3 – 3 – ns R/W HIGH to Low Z Notes 11. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V and output loading of the specified IOL/IOH, and 30 pF load capacitance. 12. AC Test Conditions use VOH = 1.6 V and VOL = 1.4 V. 13. This parameter is guaranteed but not tested. 14. At any given temperature and voltage condition for any given device, tHZCE is less than tLZCE and tHZOE is less than tLZOE. 15. Parameters tLZCE, tLZWE, tHZOE, tLZOE, tHZCE and tHZWE are tested with CL = 5 pF as in part (c) of Figure 3 on page 5. Transition is measured ±500 mV from steady state voltage. 16. The internal write time of the memory is defined by the overlap of CE LOW and R/W LOW. Both signals must be low to initiate a write and either signal can terminate a write by going high. The data input setup and hold timing should be referenced to the rising edge of the signal that terminates the write. Document Number: 001-64231 Rev. *I Page 6 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Switching Characteristics (continued) Over the Operating Range Parameter [11] 7C131E-15/7C131AE-15 Description 7C131E-25/7C136E-25 Unit Min Max Min Max – 15 – 20 ns – 15 – 20 ns Busy/Interrupt Timing[17] tBLA BUSY LOW from Address match [18] tBHA BUSY HIGH from Address mismatch tBLC BUSY LOW from CE LOW – 15 – 20 ns tBHC BUSY HIGH from CE HIGH [18] – 15 – 20 ns tPS Port setup for priority 5 – 5 – ns tBDD BUSY HIGH to valid data – 15 – 25 ns – 25 – 30 ns – 30 – 45 ns tDDD Write data valid to read data valid tWDD Write pulse to data delay [19] [19] Interrupt Timing tWINS R/W to INTERRUPT set time – 15 – 25 ns tEINS CE to INTERRUPT set time – 15 – 25 ns tINS Address to INTERRUPT set time – 15 – 25 ns OE to INTERRUPT reset time [18] – 15 – 25 ns CE to INTERRUPT reset time [18] – 15 – 25 ns – 15 – 25 ns tOINR tEINR tINR Address to INTERRUPT reset time [18] Notes 17. Test conditions used are Load 2. 18. These parameters are measured from the input signal changing, until the output pin goes to a high impedance state. 19. A write operation on Port A, where Port A has priority, leaves the data on Port B’s outputs undisturbed until one access time after one of the following: BUSY on Port B goes HIGH. Port B’s address toggled. CE for Port B is toggled. Document Number: 001-64231 Rev. *I Page 7 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Switching Characteristics Over the Operating Range Parameter Description 7C131E-55/7C136E-55/ 7C136AE-55 Min Unit Max Read Cycle tRC Read cycle time 55 – ns tAA Address to data valid [20] – 55 ns tOHA Data hold from Address change 3 – ns CE LOW to data valid [20] – 55 ns tDOE OE LOW to data valid [20] – 25 ns tLZOE OE LOW to Low Z [20, 21, 22] 3 – ns – 25 ns 5 – ns – 25 ns 0 – ns – 35 ns tACE tHZOE tLZCE OE HIGH to High Z CE LOW to Low Z [20, 21, 22] [20, 21, 22] [20, 21, 22] tHZCE CE HIGH to High Z tPU CE LOW to power-up [21] tPD CE HIGH to power-down [21] Write Cycle tWC Write cycle time 55 – ns tSCE CE LOW to write end 40 – ns tAW Address setup to write end 40 – ns tHA Address hold from write end 2 – ns tSA Address setup to write start 0 – ns tPWE R/W pulse width 30 – ns tSD Data setup to write end 20 – ns tHD Data hold from write end 0 – ns tHZWE R/W LOW to High Z [23] – 25 ns tLZWE R/W HIGH to Low Z [23] 3 – ns Notes 20. The internal write time of the memory is defined by the overlap of CE LOW and R/W LOW. Both signals must be low to initiate a write and either signal can terminate a write by going high. The data input setup and hold timing should be referenced to the rising edge of the signal that terminates the write. 21. AC Test Conditions use VOH = 1.6 V and VOL = 1.4 V. 22. These parameters are measured from the input signal changing, until the output pin goes to a high impedance state. 23. Parameters tLZCE, tLZWE, tHZOE, tLZOE, tHZCE and tHZWE are tested with C = 5 pF as in part (b) of Figure 3 on page 5. Transition is measured ±500 mV from steady state voltage. Document Number: 001-64231 Rev. *I Page 8 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Switching Characteristics (continued) Over the Operating Range Parameter Description 7C131E-55/7C136E-55/ 7C136AE-55 Unit Min Max – 30 ns – 30 ns – 30 ns – 30 ns 5 – ns – 45 ns – 30 ns – 45 ns Busy/Interrupt Timing [24] tBLA BUSY LOW from Address match tBHA BUSY HIGH from Address mismatch tBLC BUSY LOW from CE LOW tBHC BUSY HIGH from CE HIGH tPS Port setup for priority tBDD BUSY HIGH to valid data tDDD tWDD [25] Write data valid to read data valid Write pulse to data delay [25] [25] [25] Interrupt Timing tWINS R/W to INTERRUPT set time – 45 ns tEINS CE to INTERRUPT set time – 45 ns tINS Address to INTERRUPT set time – 45 ns tOINR OE to INTERRUPT reset time [26] – 45 ns tEINR [26] – 45 ns – 45 ns tINR CE to INTERRUPT reset time Address to INTERRUPT reset time [26] Notes 24. Test conditions used are Load 2. 25. A write operation on Port A, where Port A has priority, leaves the data on Port B’s outputs undisturbed until one access time after one of the following: BUSY on Port B goes HIGH. Port B’s address toggled. CE for Port B is toggled. R/W for Port B is toggled during valid read. 26. These parameters are measured from the input signal changing, until the output pin goes to a high impedance state. Document Number: 001-64231 Rev. *I Page 9 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Switching Waveforms Figure 4. Read Cycle No. 1 [27, 28] Either Port ADDR Access tRC ADDR tAA tOHA DATA OUT PREVIOUS DATAVALID DATA VALID Figure 5. Read Cycle No. 2 [27, 29] Either Port CE/OE Access CE tHZCE tACE OE tLZOE tHZOE tDOE tLZCE DATA VALID DATA OUT tPU tPD ICC ISB Figure 6. Write Cycle No. 1 (OE Three-States Data I/Os – Either Port) [30, 31] Either Port tWC ADDR tSCE CE tSA tAW tPWE tHA R/W tSD DATAIN tHD DATA VALID OE tHZOE DOUT HIGH IMPEDANCE Notes 27. R/W is HIGH for read cycle. 28. Device is continuously selected, CE = VIL and OE = VIL. 29. Address valid prior to or coincident with CE transition LOW. 30. The internal write time of the memory is defined by the overlap of CE LOW and R/W LOW. Both signals must be LOW to initiate a write and either signal can terminate a write by going HIGH. The data input setup and hold timing must be referenced to the rising edge of the signal that terminates the write. 31. If OE is LOW during a R/W controlled write cycle, the write pulse width must be the larger of tPWE or tHZWE + tSD to allow the data I/O pins to enter high impedance and for data to be placed on the bus for the required tSD. Document Number: 001-64231 Rev. *I Page 10 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Switching Waveforms (continued) Figure 7. Write Cycle No. 2 (R/W Three-States Data I/Os – Either Port) [32, 33] tWC ADDR tSCE tHA CE tAW tSA tPWE[34] R/W tSD DATAIN tHD DATA VALID tLZWE [35] tHZWE HIGH IMPEDANCE DATAOUT Figure 8. Read Cycle No. 3 [36] Read with BUSY tRC ADDR R ADDR MATCH tPWE R/WR tHD DINR VALID ADDR MATCH ADDR L tPS tBHA BUSYL tBLA tBDD DOUTL VALID tWDD tDDD Notes 32. These parameters are measured from the input signal changing, until the output pin goes to a high impedance state. 33. If the CE LOW transition occurs simultaneously with or after the R/W LOW transition, the outputs remain in a high impedance state. 34. If OE is LOW during a R/W controlled write cycle, the write pulse width must be the larger of tPWE or (tHZWE + tSD) to allow the I/O drivers to turn off and data to be placed on the bus for the required tSD. If OE is HIGH during a R/Wn controlled write cycle, this requirements does not apply and the write pulse can be as short as the specified tPWE. 35. Transition is measured ±500 mV from steady state with a 5 pF load (including scope and jig). This parameter is sampled and not 100% tested. 36. CEL = CER = LOW. Document Number: 001-64231 Rev. *I Page 11 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Switching Waveforms (continued) Figure 9. Busy Timing Diagram No. 1 (CE Arbitration) [37] CEL Valid First: ADDR L,R ADDR MATCH CEL tPS CER tBLC tBHC BUSYR CER Valid First: ADDRL,R ADDR MATCH CER tPS CEL tBLC tBHC BUSYL Figure 10. Busy Timing Diagram No. 2 (ADDR Arbitration) [37] Left ADDR Valid First: ADDRL tRC or tWC ADDR MATCH ADDR MISMATCH tPS ADDR R tBLA tBHA BUSYR Right Address Valid First: tRC or tWC ADDRR ADDR MATCH ADDR MISMATCH tPS ADDRL tBLA tBHA BUSYL Note 37. If tPS is violated, the busy signal will be asserted on one side or the other, but there is no guarantee to which side BUSY will be asserted. Document Number: 001-64231 Rev. *I Page 12 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Switching Waveforms (continued) Figure 11. Interrupt Timing Diagrams Left Side Sets INTR tWC ADDR L WRITE 3FF/7FF [39] tINS[38] tHA CEL tEINS R/WL tSA tWINS INTR Right Side Clears INTR tRC ADDRR READ 3FF/7FF [39] tHA [38] tINR CER tEINR R/WR OER tOINR INTR Notes 38. Parameter tINS or tINR depends on which enable pin (CEL or R/WL) is asserted last. 39. Parameter tHA depends on which enable pin (CEL or R/WL) is deasserted first. Document Number: 001-64231 Rev. *I Page 13 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Switching Waveforms (continued) Figure 12. Interrupt Timing Diagrams Right Side Sets INTL t WC ADDRR WRITE 3FE/7FE [40] tHA[41] tINS CER tEINS R/WR INTL tSA tWINS Left Side Clears INTL tRC ADDR R READ 3FE/7FE [41] tHA CEL [40] tINR tEINR R/WL OEL tOINR INTL Notes 40. Parameter tINS or tINR depends on which enable pin (CEL or R/WL) is asserted last. 41. Parameter tHA depends on which enable pin (CEL or R/WL) is deasserted first. Document Number: 001-64231 Rev. *I Page 14 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Ordering Information Speed (ns) Ordering Code Package Name Package Type Operating Range 1K × 8 Dual-port SRAM 15 25 55 CY7C131E-15NXI 51-85042 52-pin PQFP (Pb-free) CY7C131E-15NXIT 51-85042 52-pin PQFP (Pb-free), Tape and Reel CY7C131E-25JXC 51-85004 52-pin PLCC (Pb-free) CY7C131E-25JXCT 51-85004 52-pin PLCC (Pb-free), Tape and Reel CY7C131E-25NXC 51-85042 52-pin PQFP (Pb-free) CY7C131E-25NXCT 51-85042 52-pin PQFP (Pb-free), Tape and Reel CY7C131E-55JXC 51-85004 52-pin PLCC (Pb-free) CY7C131E-55JXCT 51-85004 52-pin PLCC (Pb-free), Tape and Reel CY7C131E-55NXC 51-85042 52-pin PQFP (Pb-free) CY7C131E-55NXCT 51-85042 52-pin PQFP (Pb-free), Tape and Reel CY7C131E-55JXI 51-85004 52-pin PLCC (Pb-free) CY7C131E-55JXIT 51-85004 52-pin PLCC (Pb-free), Tape and Reel Industrial Commercial Commercial Industrial 2K × 8 Dual-port SRAM 25 55 CY7C136E-25JXC 51-85004 52-pin PLCC (Pb-free) CY7C136E-25JXCT 51-85004 52-pin PLCC (Pb-free), Tape and Reel CY7C136E-25NXC 51-85042 52-pin PQFP (Pb-free) CY7C136E-25NXCT 51-85042 52-pin PQFP (Pb-free), Tape and Reel CY7C136E-25JXI 51-85004 52-pin PLCC (Pb-free) CY7C136E-25JXIT 51-85004 52-pin PLCC (Pb-free), Tape and Reel CY7C136E-55JXC 51-85004 52-pin PLCC (Pb-free) CY7C136E-55JXCT 51-85004 52-pin PLCC (Pb-free), Tape and Reel CY7C136E-55NXC 51-85042 52-pin PQFP (Pb-free) CY7C136E-55NXCT 51-85042 52-pin PQFP (Pb-free), Tape and Reel CY7C136AE-55JXI 51-85004 52-pin PLCC (Pb-free) CY7C136AE-55JXIT 51-85004 52-pin PLCC (Pb-free), Tape and Reel CY7C136AE-55NXI 51-85042 52-pin PQFP (Pb-free) CY7C136AE-55NXIT 51-85042 52-pin PQFP (Pb-free), Tape and Reel Document Number: 001-64231 Rev. *I Commercial Industrial Commercial Industrial Page 15 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Ordering Code Definitions CY 7 C 13X X E - XX X X X X X = blank or T blank = Tube; T = Tape and Reel Temperature Grade: X = I or C I = Industrial; C = Commercial Pb-free Package Type: X = J or N J = 52-pin PLCC; N = 52-pin PQFP Speed Grade: XX = 15 or 25 or 55 15 = 15 ns; 25 = 25 ns; 55 = 55 ns Process Version X = A or blank Part Identifier: 13X = 131 or 136 Technology Code: C = CMOS Marketing Code: 7 = SRAM Company ID: CY = Cypress Document Number: 001-64231 Rev. *I Page 16 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Package Diagrams Figure 13. 52-pin PLCC (0.756 × 0.756 Inches) J52 Package Outline, 51-85004 51-85004 *D Figure 14. 52-pin PQFP (10 × 10 × 2.0 mm) N5210 Package Outline, 51-85042 51-85042 *E Document Number: 001-64231 Rev. *I Page 17 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Acronyms Acronym Document Conventions Description Units of Measure CE Chip Enable CMOS Complementary Metal Oxide Semiconductor °C degree Celsius I/O Input/Output µA microampere OE Output Enable mA milliampere PLCC Plastic Leaded Chip Carrier mV millivolt PQFP Plastic Quad Flat Package ns nanosecond SRAM Static Random Access Memory  ohm TTL Transistor-Transistor Logic % percent WE Write Enable pF picofarad V volt W watt Document Number: 001-64231 Rev. *I Symbol Unit of Measure Page 18 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Document History Page Document Title: CY7C131E/CY7C131AE/CY7C136E/CY7C136AE, 1K/2K × 8 Dual-Port Static RAM Document Number: 001-64231 Rev. ECN No. Orig. of Change Submission Date ** 3038037 ADMU 09/24/2010 New data sheet. *A 3394800 ADMU 10/04/2011 Changed status from Preliminary to Final. Updated Maximum Ratings (Removed (Pin 48 to Pin 24)). Updated Electrical Characteristics (changed minimum value of IOZ parameter from –10 µA to –20 µA, changed maximum value of IOZ parameter from +10 µA to +20 µA and changed maximum value of ISB3 from 0.5 mA to 15 mA for both Commercial and Industrial temperature ranges). Updated Package Diagrams (Updated revision of 51-85004 from *B to *C and revision of 51-85042 from *A to *C). Updated in new template. *B 3403147 ADMU 10/12/2011 No technical updates. *C 3435230 ADMU 11/17/2011 Updated Features (Removed a feature “Expandable data bus width to 16 bits or more using Master/Slave chip select when using more than one device.” and updated another feature to read as “BUSY output flag to indicate access to the same location by both ports.”. Updated Functional Description (Updated the sentence in the first paragraph to read as “The CY7C131E / CY7C131AE / CY7C136E / CY7C136AE can be used as a standalone dual-port static RAM.”. Updated Note 2 to read as “BUSY is a push-pull output. No pull-up resistor required.”. Updated Note 3 to read as “Interrupt: push-pull output. No pull-up resistor required.”. Updated Maximum Ratings (Removed “(per MIL-STD-883, Method 3015)”). Updated Electrical Characteristics (Removed the Note “See the last page of this specification for Group A subgroup testing information.” and its reference in Parameter column.). Updated Capacitance (Changed maximum value of CIN parameter from 10 pF to 15 pF). Updated AC Test Loads and Waveforms. Updated Switching Characteristics (Removed the Note “See the last page of this specification for Group A subgroup testing information.” and its reference in Parameter column.). Updated Switching Characteristics (Changed the minimum value of tOHA from 0 ns to 3 ns). Removed the section “Typical DC and AC Characteristics”. Removed the section “Reference Documents”. Document Number: 001-64231 Rev. *I Description of Change Page 19 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Document History Page (continued) Document Title: CY7C131E/CY7C131AE/CY7C136E/CY7C136AE, 1K/2K × 8 Dual-Port Static RAM Document Number: 001-64231 Rev. ECN No. Orig. of Change Submission Date *D 3620277 ADMU 06/15/2012 Updated missing overbars in all instances across the document. Updated Selection Guide: Updated all values of “Typical Operating Current” parameter. Updated Maximum Ratings: Changed value of “Static discharge voltage” from “>2001 V” to “>1100 V”. Updated Electrical Characteristics: Fixed typos. Added Note 8 and referred the same note in “Typ” column. Updated all values of ICC parameter. Updated AC Test Loads and Waveforms: Updated Figure 3 (Replaced 3 ns with 5 ns). Updated Switching Characteristics: Added Note 17 and referred the same note in “Busy/Interrupt Timing”. Updated Switching Characteristics: Added Note 24 and referred the same note in “Busy/Interrupt Timing”. Updated Switching Waveforms: Added Note 34 and referred the same note in “tPWE” in Figure 7. Added Note 35 and referred the same note in “tPWE” in Figure 7. Added Note 38 and referred the same note in “tINS” in Figure 11. Added Note 39 and referred the same note in “tHA” in Figure 11. Added Note 40 and referred the same note in “tINS” in Figure 12. Added Note 41 and referred the same note in “tHA” in Figure 12. Removed “Busy Timing Diagram No. 3”. Updated Package Diagrams: spec 51-85042 – Changed revision from *C to *D. *E 3997575 ADMU 05/15/2013 Updated Package Diagrams: spec 51-85004 – Changed revision from *C to *D. Added Appendix: Silicon Errata for CY7C131E/131AE/136E/136AE 1K/2K × 8 Dual Port Static RAM. *F 4241174 ADMU 01/09/2014 Removed Appendix: Silicon Errata for CY7C131E/131AE/136E/136AE 1K/2K × 8 Dual Port Static RAM. Updated to new template. *G 4559526 AMDU 11/07/2014 Updated Functional Description: Added “For a complete list of related documentation, click here.” at the end. *H 5397125 NILE 08/09/2016 Updated Ordering Information: Updated part numbers. Updated Package Diagrams: spec 51-85042 – Changed revision from *D to *E. Updated to new template. *I 5966445 AESATMP8 11/14/2017 Updated logo and Copyright. Document Number: 001-64231 Rev. *I Description of Change Page 20 of 21 CY7C131E/CY7C131AE CY7C136E/CY7C136AE Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office closest to you, visit us at Cypress Locations. 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Cypress products are not designed, intended, or authorized for use as critical components in systems designed or intended for the operation of weapons, weapons systems, nuclear installations, life-support devices or systems, other medical devices or systems (including resuscitation equipment and surgical implants), pollution control or hazardous substances management, or other uses where the failure of the device or system could cause personal injury, death, or property damage (“Unintended Uses”). A critical component is any component of a device or system whose failure to perform can be reasonably expected to cause the failure of the device or system, or to affect its safety or effectiveness. Cypress is not liable, in whole or in part, and you shall and hereby do release Cypress from any claim, damage, or other liability arising from or related to all Unintended Uses of Cypress products. You shall indemnify and hold Cypress harmless from and against all claims, costs, damages, and other liabilities, including claims for personal injury or death, arising from or related to any Unintended Uses of Cypress products. Cypress, the Cypress logo, Spansion, the Spansion logo, and combinations thereof, WICED, PSoC, CapSense, EZ-USB, F-RAM, and Traveo are trademarks or registered trademarks of Cypress in the United States and other countries. For a more complete list of Cypress trademarks, visit cypress.com. Other names and brands may be claimed as property of their respective owners. Document Number: 001-64231 Rev. *I Revised November 14, 2017 Page 21 of 21
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