CY7C1372DV25-167AXCT

THIS SPEC IS OBSOLETE Spec No: 38-05558 Spec Title: CY7C1370DV25/CY7C1372DV25, 18-MBIT (512K X 36/1M X 18) PIPELINED SRAM WITH NOBL(TM) ARCHITECTURE Replaced by: NONE CY7C1370DV25 CY7C1372DV25 18-Mbit (512K × 36/1M × 18) Pipelined SRAM with NoBL™ Architecture 18-Mbit (512K × 36/1M × 18) Pipelined SRAM with NoBL™ Architecture Features Functional Description ■ Pin-compatible and functionally equivalent to ZBT™ ■ Supports 200-MHz bus operations with zero wait states ❐ Available speed grades are 200 and 167 MHz ■ Internally self-timed output buffer control to eliminate the need to use asynchronous OE ■ Fully registered (inputs and outputs) for pipelined operation ■ Byte write capability ■ Single 2.5 V core power supply (VDD) ■ 2.5 V I/O power supply (VDDQ) ■ Fast clock-to-output times ❐ 3.0 ns (for 200-MHz device) ■ Clock enable (CEN) pin to suspend operation ■ Synchronous self-timed writes ■ Available in JEDEC-standard Pb-free 100-pin TQFP, and non Pb-free 165-ball FBGA packages ■ IEEE 1149.1 JTAG-compatible boundary scan ■ Burst capability – linear or interleaved burst order ■ “ZZ” sleep mode option and stop clock option The CY7C1370DV25 and CY7C1372DV25 are 2.5 V, 512K × 36 and 1M × 18 synchronous pipelined burst SRAMs with No Bus Latency™ (NoBL logic, respectively. They are designed to support unlimited true back-to-back read/write operations with no wait states. The CY7C1370DV25 and CY7C1372DV25 are equipped with the advanced NoBL logic required to enable consecutive read/write operations with data being transferred on every clock cycle. This feature dramatically improves the throughput of data in systems that require frequent write/read transitions. The CY7C1370DV25 and CY7C1372DV25 are pin-compatible and functionally equivalent to ZBT devices. All synchronous inputs pass through input registers controlled by the rising edge of the clock. All data outputs pass through output registers controlled by the rising edge of the clock. The clock input is qualified by the clock enable (CEN) signal, which when deasserted suspends operation and extends the previous clock cycle. Write operations are controlled by the byte write selects (BWa–BWd for CY7C1370DV25 and BWa–BWb for CY7C1372DV25) and a write enable (WE) input. All writes are conducted with on-chip synchronous self-timed write circuitry. Three synchronous chip enables (CE1, CE2, CE3) and an asynchronous output enable (OE) provide for easy bank selection and output three-state control. In order to avoid bus contention, the output drivers are synchronously three-stated during the data portion of a write sequence. For a complete list of related documentation, click here. Selection Guide Description Maximum access time Maximum operating current Maximum CMOS standby current 200 MHz 167 MHz Unit 3.0 300 70 3.4 275 70 ns mA mA Errata: For information on silicon errata, see “Errata” on page 30. Details include trigger conditions, devices affected, and proposed workaround. Cypress Semiconductor Corporation Document Number: 38-05558 Rev. *P • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised November 3, 2016 CY7C1370DV25 CY7C1372DV25 Logic Block Diagram – CY7C1370DV25 A0, A1, A ADDRESS REGISTER 0 A1 A1' D1 Q1 A0 A0' BURST D0 Q0 LOGIC MODE CLK CEN ADV/LD C C WRITE ADDRESS REGISTER 1 WRITE ADDRESS REGISTER 2 ADV/LD BWa BWb BWc BWd WRITE REGISTRY AND DATA COHERENCY CONTROL LOGIC WRITE DRIVERS MEMORY ARRAY WE S E N S E A M P S O U T P U T R E G I S T E R S E INPUT REGISTER 1 E OE CE1 CE2 CE3 ZZ Document Number: 38-05558 Rev. *P O U T P U T D A T A S T E E R I N G INPUT REGISTER 0 B U F F E R S DQs DQPa DQPb DQPc DQPd E E READ LOGIC SLEEP CONTROL Page 2 of 34 CY7C1370DV25 CY7C1372DV25 Logic Block Diagram – CY7C1372DV25 A0, A1, A ADDRESS REGISTER 0 A1 A1' D1 Q1 A0 BURST A0' D0 Q0 LOGIC MODE CLK CEN ADV/LD C C WRITE ADDRESS REGISTER 1 WRITE ADDRESS REGISTER 2 ADV/LD BWa WRITE REGISTRY AND DATA COHERENCY CONTROL LOGIC WRITE DRIVERS MEMORY ARRAY BWb WE S E N S E A M P S O U T P U T R E G I S T E R S D A T A S T E E R I N G OE CE1 CE2 CE3 ZZ Document Number: 38-05558 Rev. *P B U F F E R S DQs DQPa DQPb E E INPUT REGISTER 1 E O U T P U T INPUT REGISTER 0 E READ LOGIC Sleep Control Page 3 of 34 CY7C1370DV25 CY7C1372DV25 Contents Pin Configurations ........................................................... 5 Pin Definitions .................................................................. 7 Functional Overview ........................................................ 9 Single Read Accesses ................................................ 9 Burst Read Accesses .................................................. 9 Single Write Accesses ................................................. 9 Burst Write Accesses .................................................. 9 Sleep Mode ............................................................... 10 Interleaved Burst Address Table ............................... 10 Linear Burst Address Table ....................................... 10 ZZ Mode Electrical Characteristics ............................ 10 Truth Table ...................................................................... 11 Partial Truth Table for Read/Write ................................ 12 Partial Truth Table for Read/Write ................................ 12 IEEE 1149.1 Serial Boundary Scan (JTAG [18]) ........... 13 Disabling the JTAG Feature ...................................... 13 Test Access Port (TAP) ............................................. 13 PERFORMING A TAP RESET .................................. 13 TAP REGISTERS ...................................................... 13 TAP Instruction Set ................................................... 14 TAP Controller State Diagram ....................................... 15 TAP Controller Block Diagram ...................................... 16 TAP Timing ...................................................................... 16 TAP AC Switching Characteristics ............................... 17 2.5 V TAP AC Test Conditions ....................................... 18 2.5 V TAP AC Output Load Equivalent ......................... 18 TAP DC Electrical Characteristics and Operating Conditions ..................................................... 18 Scan Register Sizes ....................................................... 19 Identification Register Definitions ................................ 19 Document Number: 38-05558 Rev. *P Instruction Codes ........................................................... 19 Boundary Scan Order .................................................... 20 Maximum Ratings ........................................................... 21 Operating Range ............................................................. 21 Electrical Characteristics ............................................... 21 Capacitance .................................................................... 22 Thermal Resistance ........................................................ 22 AC Test Loads and Waveforms ..................................... 22 Switching Characteristics .............................................. 23 Switching Waveforms .................................................... 24 Ordering Information ...................................................... 26 Ordering Code Definitions ......................................... 26 Package Diagrams .......................................................... 27 Acronyms ........................................................................ 29 Document Conventions ................................................. 29 Units of Measure ....................................................... 29 Errata ............................................................................... 30 Part Numbers Affected .............................................. 30 Product Status ........................................................... 30 Ram9 NoBL ZZ Pin & JTAG Issues Errata Summary ............................................................... 30 Document History Page ................................................. 32 Sales, Solutions, and Legal Information ...................... 34 Worldwide Sales and Design Support ....................... 34 Products .................................................................... 34 PSoC® Solutions ...................................................... 34 Cypress Developer Community ................................. 34 Technical Support ..................................................... 34 Page 4 of 34 CY7C1370DV25 CY7C1372DV25 Pin Configurations 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 CY7C1372DV25 (1M × 18) 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 A NC NC VDDQ VSS NC DQPa DQa DQa VSS VDDQ DQa DQa VSS NC VDD ZZ DQa DQa VDDQ VSS DQa DQa NC NC VSS VDDQ NC NC NC A A A A A A A DQb DQb DQb DQb VSS VDDQ DQb DQb DQb DQb NC VSS VDD NC NC VDD VSS ZZ DQb DQa DQa DQb VDDQ VDDQ VSS VSS DQa DQb DQa DQb DQa DQPb NC DQa VSS VSS VDDQ VDDQ NC DQa DQa NC DQPa NC NC(36) VDDQ VSS NC NC DQb DQb VSS VDDQ 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 NC(72) A A A A A A A NC(36) NC(72) VSS VDD NC(288) NC(144) MODE A A A A A1 A0 NC NC NC VSS VDD (512K × 36) DQPb DQb DQb VDDQ VSS NC(288) NC(144) CY7C1370DV25 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 DQc DQc NC VDD NC VSS DQd DQd VDDQ VSS DQd DQd DQd DQd VSS VDDQ DQd DQd DQPd 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 VSS DQc DQc DQc DQc VSS VDDQ 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 MODE A A A A A1 A0 DQPc DQc DQc VDDQ A A A A CE1 CE2 NC NC BWb BWa CE3 VDD VSS CLK WE CEN OE ADV/LD A A A A 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 A A CE1 CE2 BWd BWc BWb BWa CE3 VDD VSS CLK WE CEN OE ADV/LD A A Figure 1. 100-pin TQFP (14 × 20 × 1.4 mm) pinout [1] Note 1. Errata: The ZZ pin (Pin 64) needs to be externally connected to ground. For more information, see “Errata” on page 30. Document Number: 38-05558 Rev. *P Page 5 of 34 CY7C1370DV25 CY7C1372DV25 Pin Configurations (continued) Figure 2. 165-ball FBGA (13 × 15 × 1.4 mm) pinout [2, 3] CY7C1370DV25 (512K × 36) A B C D E F G H J K L M N P R 1 2 3 4 5 NC/576M NC/1G 6 7 8 A CE1 BWc A CE2 DQPc DQc NC DQc VDDQ DQc DQc 9 10 BWb CE3 BWa VSS CEN WE VDDQ BWd VSS VDD CLK VSS VSS VSS VDDQ VDD VSS 11 ADV/LD A A NC OE A A NC VSS VSS VSS VDD VDDQ VDDQ NC DQb DQPb DQb VSS VSS VDD VDDQ DQb DQb DQc DQc VDDQ VDD VSS VSS VSS VDD VDDQ DQb DQb DQc NC DQd DQc NC DQd VDDQ NC VDDQ VDD VDD VDD VSS VSS VSS VSS VSS VSS VSS VSS VSS VDD VDD VDD VDDQ NC VDDQ DQb NC DQa DQb ZZ DQa DQd DQd VDDQ VDD VSS VSS VSS VDD VDDQ DQa DQa DQd DQd VDDQ VDD VSS VSS VSS VDD VDDQ DQa DQa DQd DQPd DQd NC VDDQ VDDQ VDD VSS VSS NC VSS NC VSS NC VDD VSS VDDQ VDDQ DQa NC DQa DQPa A A TDI A1 TDO A A A NC/288M A A TMS A0 TCK A A A A NC/144M NC/72M MODE NC/36M CY7C1372DV25 (1M × 18) 1 2 3 4 5 6 7 8 9 10 11 A B C D E F G H J K L M N P NC/576M A CE1 BWb NC CE3 CEN ADV/LD A A A R MODE NC/1G A CE2 NC BWa CLK NC VDDQ VSS VSS VSS VSS VDDQ VDDQ VSS VDD OE VSS VDD A NC DQb WE VSS VSS A NC NC VDDQ NC NC DQPa DQa NC DQb VDDQ VDD VSS VSS VSS VDD VDDQ NC DQa NC DQb VDDQ VDD VSS VSS VSS VDD VDDQ NC DQa NC NC DQb DQb NC NC VDDQ NC VDDQ VDD VDD VDD VSS VSS VSS VSS VSS VSS VSS VSS VSS VDD VDD VDD VDDQ NC VDDQ NC NC DQa DQa ZZ NC DQb NC VDDQ VDD VSS VSS VSS VDD VDDQ DQa NC DQb NC VDDQ VDD VSS VSS VSS VDD VDDQ DQa NC DQb DQPb NC NC VDDQ VDDQ VDD VSS VSS NC VSS NC VSS NC VDD VSS VDDQ VDDQ DQa NC NC NC NC/144M NC/72M A A TDI A1 TDO A A A NC/288M NC/36M A A TMS A0 TCK A A A A Notes 2. Errata: The ZZ ball (H11) needs to be externally connected to ground. For more information, see “Errata” on page 30. 3. Errata: The JTAG testing should be performed with these devices in BYPASS mode as the JTAG functionality is not guaranteed. For more information, see “Errata” on page 30. Document Number: 38-05558 Rev. *P Page 6 of 34 CY7C1370DV25 CY7C1372DV25 Pin Definitions Pin Name A0, A1, A I/O Type Pin Description InputAddress inputs used to select one of the address locations. Sampled at the rising edge of the CLK. synchronous BWa, BWb, InputByte write select inputs, active LOW. Qualified with WE to conduct writes to the SRAM. Sampled on BWc, BWd synchronous the rising edge of CLK. BWa controls DQa and DQPa, BWb controls DQb and DQPb, BWc controls DQc and DQPc, BWd controls DQd and DQPd. WE InputWrite enable input, active LOW. Sampled on the rising edge of CLK if CEN is active LOW. This signal synchronous must be asserted LOW to initiate a write sequence. ADV/LD InputAdvance/load input used to advance the on-chip address counter or load a new address. When synchronous HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a new address can be loaded into the device for an access. After being deselected, ADV/LD should be driven LOW in order to load a new address. CLK Input-clock Clock input. Used to capture all synchronous inputs to the device. CLK is qualified with CEN. CLK is only recognized if CEN is active LOW. CE1 InputChip enable 1 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE2 synchronous and CE3 to select/deselect the device. CE2 InputChip enable 2 input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 synchronous and CE3 to select/deselect the device. CE3 InputChip enable 3 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 synchronous and CE2 to select/deselect the device. OE InputOutput enable, active LOW. Combined with the synchronous logic block inside the device to control asynchronous the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs. When deasserted HIGH, I/O pins are three-stated, and act as input data pins. OE is masked during the data portion of a write sequence, during the first clock when emerging from a deselected state and when the device has been deselected. CEN InputClock enable input, active LOW. When asserted LOW the clock signal is recognized by the SRAM. synchronous When deasserted HIGH the clock signal is masked. Since deasserting CEN does not deselect the device, CEN can be used to extend the previous cycle when required. DQS I/OBidirectional data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the synchronous rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by A[17:0] during the previous clock rise of the read cycle. The direction of the pins is controlled by OE and the internal control logic. When OE is asserted LOW, the pins can behave as outputs. When HIGH, DQa–DQd are placed in a three-state condition. The outputs are automatically three-stated during the data portion of a write sequence, during the first clock when emerging from a deselected state, and when the device is deselected, regardless of the state of OE. DQPX I/OBidirectional data parity I/O lines. Functionally, these signals are identical to DQs. During write synchronous sequences, DQPa is controlled by BWa, DQPb is controlled by BWb, DQPc is controlled by BWc, and DQPd is controlled by BWd. MODE Input strap pin Mode input. Selects the burst order of the device. Tied HIGH selects the interleaved burst order. Pulled LOW selects the linear burst order. MODE should not change states during operation. When left floating MODE will default HIGH, to an interleaved burst order. Document Number: 38-05558 Rev. *P Page 7 of 34 CY7C1370DV25 CY7C1372DV25 Pin Definitions (continued) Pin Name TDO [4] I/O Type Pin Description JTAG serial Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK. output synchronous TDI [4] JTAG serial Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK. input synchronous TMS [4] Test mode This pin controls the Test access port state machine. Sampled on the rising edge of TCK. select synchronous TCK [4] JTAG-clock VDD VDDQ VSS NC NC/36M, NC/72M, NC/144M, NC/288M, NC/576M, NC/1G ZZ [5] Clock input to the JTAG circuitry. Power supply Power supply inputs to the core of the device. I/O power supply Ground – – Power supply for the I/O circuitry. Ground for the device. Should be connected to ground of the system. No connects. This pin is not connected to the die. These pins are not connected. They will be used for expansion to the 36M, 72M, 144M, 288M, 576M, and 1G densities. InputZZ “sleep” input. This active HIGH input places the device in a non-time critical “sleep” condition with asynchronous data integrity preserved. For normal operation, this pin has to be LOW or left floating. ZZ pin has an internal pull-down. Notes 4. Errata: The JTAG testing should be performed with these devices in BYPASS mode as the JTAG functionality is not guaranteed. For more information, see “Errata” on page 30. 5. Errata: The ZZ pin needs to be externally connected to ground. For more information, see “Errata” on page 30. Document Number: 38-05558 Rev. *P Page 8 of 34 CY7C1370DV25 CY7C1372DV25 Functional Overview The CY7C1370DV25 and CY7C1372DV25 are synchronous-pipelined Burst NoBL SRAMs designed specifically to eliminate wait states during write/read transitions. All synchronous inputs pass through input registers controlled by the rising edge of the clock. The clock signal is qualified with the clock enable input signal (CEN). If CEN is HIGH, the clock signal is not recognized and all internal states are maintained. All synchronous operations are qualified with CEN. All data outputs pass through output registers controlled by the rising edge of the clock. Maximum access delay from the clock rise (tCO) is 3.0 ns (200-MHz device). Accesses can be initiated by asserting all three chip enables (CE1, CE2, CE3) active at the rising edge of the clock. If clock enable (CEN) is active LOW and ADV/LD is asserted LOW, the address presented to the device will be latched. The access can either be a read or write operation, depending on the status of the write enable (WE). BWX can be used to conduct byte write operations. Write operations are qualified by the write enable (WE). All writes are simplified with on-chip synchronous self-timed write circuitry. Three synchronous chip enables (CE1, CE2, CE3) and an asynchronous output enable (OE) simplify depth expansion. All operations (reads, writes, and deselects) are pipelined. ADV/LD should be driven LOW once the device has been deselected in order to load a new address for the next operation. Single Read Accesses A read access is initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are all asserted active, (3) the write enable input signal WE is deasserted HIGH, and (4) ADV/LD is asserted LOW. The address presented to the address inputs is latched into the address register and presented to the memory core and control logic. The control logic determines that a read access is in progress and allows the requested data to propagate to the input of the output register. At the rising edge of the next clock the requested data is allowed to propagate through the output register and onto the data bus within 3.0ns (200-MHz device) provided OE is active LOW. After the first clock of the read access the output buffers are controlled by OE and the internal control logic. OE must be driven LOW in order for the device to drive out the requested data. During the second clock, a subsequent operation (read/write/deselect) can be initiated. Deselecting the device is also pipelined. Therefore, when the SRAM is deselected at clock rise by one of the chip enable signals, its output will three-state following the next clock rise. Burst Read Accesses The CY7C1370DV25 and CY7C1372DV25 have an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four reads without reasserting the address inputs. ADV/LD must be driven LOW in order to load a new address into the SRAM, as described in Single Read Accesses. The sequence of the burst counter is determined by the MODE input signal. A LOW input on MODE selects a linear burst mode, a HIGH selects an interleaved burst sequence. Both burst counters use A0 and A1 in the burst sequence, and will wrap around when incremented sufficiently. A HIGH input on Document Number: 38-05558 Rev. *P ADV/LD will increment the internal burst counter regardless of the state of chip enables inputs or WE. WE is latched at the beginning of a burst cycle. Therefore, the type of access (read or write) is maintained throughout the burst sequence. Single Write Accesses Write access are initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are all asserted active, and (3) the write signal WE is asserted LOW. The address presented is loaded into the address register. The write signals are latched into the control logic block. On the subsequent clock rise the data lines are automatically three-stated regardless of the state of the OE input signal. This allows the external logic to present the data on DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1370DV25 and DQa,b/DQPa,b for CY7C1372DV25). In addition, the address for the subsequent access (read/write/deselect) is latched into the address register (provided the appropriate control signals are asserted). On the next clock rise the data presented to DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1370DV25 & DQa,b/DQPa,b for CY7C1372DV25) (or a subset for byte write operations, see Write Cycle Description table for details) inputs is latched into the device and the write is complete. The data written during the write operation is controlled by BW (BWa,b,c,d for CY7C1370DV25 and BWa,b for CY7C1372DV25) signals. The CY7C1370DV25/CY7C1372DV25 provides byte write capability that is described in the Write Cycle Description table. Asserting the write enable input (WE) with the selected byte write select (BW) input will selectively write to only the desired bytes. Bytes not selected during a byte write operation will remain unaltered. A synchronous self-timed write mechanism has been provided to simplify the write operations. Byte write capability has been included in order to greatly simplify read/modify/write sequences, which can be reduced to simple byte write operations. Because the CY7C1370DV25 and CY7C1372DV25 are common I/O devices, data should not be driven into the device while the outputs are active. The output enable (OE) can be deasserted HIGH before presenting data to the DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1370DV25 and DQa,b/DQPa,b for CY7C1372DV25) inputs. Doing so will three-state the output drivers. As a safety precaution, DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1370DV25 and DQa,b/DQPa,b for CY7C1372DV25) are automatically three-stated during the data portion of a write cycle, regardless of the state of OE. Burst Write Accesses The CY7C1370DV25/CY7C1372DV25 has an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four write operations without reasserting the address inputs. ADV/LD must be driven LOW in order to load the initial address, as described in Single Write Accesses on page 9. When ADV/LD is driven HIGH on the subsequent clock rise, the chip enables (CE1, CE2, and CE3) and WE inputs are ignored and the burst counter is incremented. The correct BW (BWa,b,c,d for CY7C1370DV25 and BWa,b for CY7C1372DV25) inputs must be driven in each cycle of the burst write in order to write the correct bytes of data. Page 9 of 34 CY7C1370DV25 CY7C1372DV25 Sleep Mode Linear Burst Address Table The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation “sleep” mode. Two clock cycles are required to enter into or exit from this “sleep” mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the “sleep” mode are not considered valid nor is the completion of the operation guaranteed. The device must be deselected prior to entering the “sleep” mode. CE1, CE2, and CE3, must remain inactive for the duration of tZZREC after the ZZ input returns LOW. (MODE = GND) First Address A1:A0 Second Address A1:A0 Third Address A1:A0 Fourth Address A1:A0 00 01 10 11 01 10 11 00 10 11 00 01 11 00 01 10 Interleaved Burst Address Table (MODE = Floating or VDD) First Address A1:A0 Second Address A1:A0 Third Address A1:A0 Fourth Address A1:A0 00 01 10 11 01 00 11 10 10 11 00 01 11 10 01 00 ZZ Mode Electrical Characteristics Parameter Description Test Conditions IDDZZ Sleep mode standby current ZZ  VDD 0.2 V tZZS Device operation to ZZ ZZ VDD  0.2 V tZZREC ZZ recovery time ZZ  0.2 V tZZI ZZ active to sleep current tRZZI ZZ Inactive to exit sleep current Document Number: 38-05558 Rev. *P Min Max Unit – 80 mA – 2tCYC ns 2tCYC – ns This parameter is sampled – 2tCYC ns This parameter is sampled 0 – ns Page 10 of 34 CY7C1370DV25 CY7C1372DV25 Truth Table The truth table for CY7C1370DV25/CY7C1372DV25 follows. [6, 7, 8, 9, 10, 11, 12] Operation Deselect cycle Address Used CE ZZ ADV/LD WE BWx OE CEN CLK None H L L Continue deselect cycle None X L Read cycle (begin burst) External L L Read cycle (continue burst) NOP/dummy read (begin burst) Dummy read (continue burst) DQ X X X L L–H Tri-state H X X X L L–H Tri-state L H X L L L–H Data out (Q) Next X L H X X L L L–H Data out (Q) External L L L H X H L L–H Tri-state Next X L H X X H L L–H Tri-state External L L L L L X L L–H Data in (D) Write cycle (continue burst) Next X L H X L X L L–H Data in (D) NOP/write abort (begin burst) None L L L L H X L L–H Tri-state Write cycle (begin burst) Write abort (continue burst) Ignore clock edge (stall) Sleep mode Next X L H X H X L L–H Tri-state Current X L X X X X H L–H – None X H X X X X X X Tri-state Notes 6. X = “Don't Care”, H = Logic HIGH, L = Logic LOW, CE stands for all chip enables active. BWx = L signifies at least one byte write select is active, BWx = valid signifies that the desired byte write selects are asserted, see Write Cycle Description table for details. 7. Write is defined by WE and BWX. See Write Cycle Description table for details. 8. When a write cycle is detected, all I/Os are tri-stated, even during byte writes. 9. The DQ and DQP pins are controlled by the current cycle and the OE signal. 10. CEN = H inserts wait states. 11. Device will power-up deselected and the I/Os in a tri-state condition, regardless of OE. 12. OE is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles.During a read cycle DQs and DQPX = three-state when OE is inactive or when the device is deselected, and DQs = data when OE is active. 13. Table only lists a partial listing of the byte write combinations. Any Combination of BWX is valid. Appropriate write will be done based on which byte write is active. Document Number: 38-05558 Rev. *P Page 11 of 34 CY7C1370DV25 CY7C1372DV25 Partial Truth Table for Read/Write The partial truth table for Read/Write for CY7C1370DV25 follows. [14, 15, 16, 17] WE BWd BWc BWb BWa Read Function (CY7C1370DV25) H X X X X Write – No bytes written L H H H H Write byte a – (DQa and DQPa) L H H H L Write byte b – (DQb and DQPb) L H H L H Write bytes b, a L H H L L Write byte c – (DQc and DQPc) L H L H H Write bytes c, a L H L H L Write bytes c, b L H L L H Write bytes c, b, a L H L L L Write byte d – (DQd and DQPd) L L H H H Write bytes d, a L L H H L Write bytes d, b L L H L H Write bytes d, b, a L L H L L Write bytes d, c L L L H H Write bytes d, c, a L L L H L Write bytes d, c, b L L L L H Write all bytes L L L L L Partial Truth Table for Read/Write The partial truth table for Read/Write for CY7C1372DV25 follows. [14, 15, 16, 17] WE BWb BWa Read Function (CY7C1372DV25) H x x Write – no bytes written L H H Write byte a – (DQa and DQPa) L H L Write byte b – (DQb and DQPb) L L H Write both bytes L L L Notes 14. X = “Don't Care”, H = Logic HIGH, L = Logic LOW, CE stands for all chip enables active. BWx = L signifies at least one byte write select is active, BWx = valid signifies that the desired byte write selects are asserted, see Write Cycle Description table for details. 15. Write is defined by WE and BWX. See Write Cycle Description table for details. 16. When a write cycle is detected, all I/Os are tri-stated, even during byte writes. 17. Table only lists a partial listing of the byte write combinations. Any Combination of BWX is valid. Appropriate write will be done based on which byte write is active. Document Number: 38-05558 Rev. *P Page 12 of 34 CY7C1370DV25 CY7C1372DV25 IEEE 1149.1 Serial Boundary Scan (JTAG [18]) The CY7C1370DV25/CY7C1372DV25 incorporates a serial boundary scan test access port (TAP).This part is fully compliant with 1149.1. The TAP operates using JEDEC-standard 3.3 V or 2.5 V I/O logic levels. The CY7C1370DV25/CY7C1372DV25 contains a TAP controller, instruction register, boundary scan register, bypass register, and ID register. Disabling the JTAG Feature It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW (VSS) to prevent clocking of the device. TDI and TMS are internally pulled up and may be unconnected. They may alternately be connected to VDD through a pull-up resistor. TDO should be left unconnected. Upon power-up, the device will come up in a reset state which will not interfere with the operation of the device. Test Access Port (TAP) Test Clock (TCK) The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK. Test Mode Select (TMS) The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. It is allowable to leave this ball unconnected if the TAP is not used. The ball is pulled up internally, resulting in a logic HIGH level. Test Data-In (TDI) The TDI ball is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. For information on loading the instruction register, see TAP Controller State Diagram on page 15. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the most significant bit (MSB) of any register. Test Data-Out (TDO) The TDO output ball is used to serially clock data-out from the registers. The output is active depending upon the current state of the TAP state machine (see Instruction Codes on page 19). The output changes on the falling edge of TCK. TDO is connected to the least significant bit (LSB) of any register. Performing a TAP Reset A RESET is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This RESET does not affect the operation of the SRAM and may be performed while the SRAM is operating. At power-up, the TAP is reset internally to ensure that TDO comes up in a high Z state. TAP Registers Registers are connected between the TDI and TDO balls and allow data to be scanned into and out of the SRAM test circuitry. Only one register can be selected at a time through the instruction register. Data is serially loaded into the TDI ball on the rising edge of TCK. Data is output on the TDO ball on the falling edge of TCK. Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the TDI and TDO balls as shown in the TAP Controller Block Diagram on page 16. Upon power-up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as described in the previous section. When the TAP controller is in the Capture-IR state, the two least significant bits are loaded with a binary “01” pattern to allow for fault isolation of the board-level serial test data path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain chips. The bypass register is a single-bit register that can be placed between the TDI and TDO balls. This allows data to be shifted through the SRAM with minimal delay. The bypass register is set LOW (VSS) when the BYPASS instruction is executed. Boundary Scan Register The boundary scan register is connected to all the input and bidirectional balls on the SRAM. The boundary scan register is loaded with the contents of the RAM I/O ring when the TAP controller is in the Capture-DR state and is then placed between the TDI and TDO balls when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD and SAMPLE Z instructions can be used to capture the contents of the I/O ring. The Boundary Scan Order on page 20 show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI and the LSB is connected to TDO. Identification (ID) Register The ID register is loaded with a vendor-specific, 32-bit code during the Capture-DR state when the IDCODE command is loaded in the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has a vendor code and other information described in Identification Register Definitions on page 19. Note 18. Errata: The JTAG testing should be performed with these devices in BYPASS mode as the JTAG functionality is not guaranteed. For more information, see “Errata” on page 30. Document Number: 38-05558 Rev. *P Page 13 of 34 CY7C1370DV25 CY7C1372DV25 TAP Instruction Set Overview Eight different instructions are possible with the three bit instruction register. All combinations are listed in the Instruction Codes table. Three of these instructions are listed as RESERVED and should not be used. The other five instructions are described in detail below. Instructions are loaded into the TAP controller during the Shift-IR state when the instruction register is placed between TDI and TDO. During this state, instructions are shifted through the instruction register through the TDI and TDO balls. To execute the instruction once it is shifted in, the TAP controller needs to be moved into the Update-IR state. EXTEST The EXTEST instruction enables the preloaded data to be driven out through the system output pins. This instruction also selects the boundary scan register to be connected for serial access between the TDI and TDO in the shift-DR controller state. IDCODE The IDCODE instruction causes a vendor-specific, 32-bit code to be loaded into the instruction register. It also places the instruction register between the TDI and TDO balls and allows the IDCODE to be shifted out of the device when the TAP controller enters the Shift-DR state. The IDCODE instruction is loaded into the instruction register upon power-up or whenever the TAP controller is given a test logic reset state. SAMPLE Z The SAMPLE Z instruction causes the boundary scan register to be connected between the TDI and TDO balls when the TAP controller is in a Shift-DR state. It also places all SRAM outputs into a high Z state. SAMPLE/PRELOAD SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When the SAMPLE/PRELOAD instructions are loaded into the instruction register and the TAP controller is in the Capture-DR state, a snapshot of data on the inputs and output pins is captured in the boundary scan register. The user must be aware that the TAP controller clock can only operate at a frequency up to 20 MHz, while the SRAM clock operates more than an order of magnitude faster. Because there is a large difference in the clock frequencies, it is possible that during the Capture-DR state, an input or output will undergo a transition. The TAP may then try to capture a signal while in transition (metastable state). This will not harm the device, but there is no guarantee as to the value that will be captured. Repeatable results may not be possible. Document Number: 38-05558 Rev. *P To guarantee that the boundary scan register will capture the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller’s capture set-up plus hold times (tCS and tCH). The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE/PRELOAD instruction. If this is an issue, it is still possible to capture all other signals and simply ignore the value of the CK and CK captured in the boundary scan register. Once the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO pins. PRELOAD allows an initial data pattern to be placed at the latched parallel outputs of the boundary scan register cells prior to the selection of another boundary scan test operation. The shifting of data for the SAMPLE and PRELOAD phases can occur concurrently when required – that is, while data captured is shifted out, the preloaded data can be shifted in. BYPASS When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO balls. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. EXTEST Output Bus Tri-State IEEE Standard 1149.1 mandates that the TAP controller be able to put the output bus into a tri-state mode. The boundary scan register has a special bit located at bbit #89 (for 165-ball FBGA package). When this scan cell, called the “extest output bus tri-state,” is latched into the preload register during the “Update-DR” state in the TAP controller, it will directly control the state of the output (Q-bus) pins, when the EXTEST is entered as the current instruction. When HIGH, it will enable the output buffers to drive the output bus. When LOW, this bit will place the output bus into a high Z condition. This bit can be set by entering the SAMPLE/PRELOAD or EXTEST command, and then shifting the desired bit into that cell, during the “Shift-DR” state. During “Update-DR,” the value loaded into that shift-register cell will latch into the preload register. When the EXTEST instruction is entered, this bit will directly control the output Q-bus pins. Note that this bit is preset HIGH to enable the output when the device is powered-up, and also when the TAP controller is in the “Test-Logic-Reset” state. Reserved These instructions are not implemented but are reserved for future use. Do not use these instructions. Page 14 of 34 CY7C1370DV25 CY7C1372DV25 TAP Controller State Diagram 1 TEST-LOGIC RESET 0 0 RUN-TEST/ IDLE 1 SELECT DR-SCAN 1 SELECT IR-SCAN 0 1 0 1 CAPTURE-DR CAPTURE-IR 0 0 SHIFT-DR 0 SHIFT-IR 1 1 EXIT1-IR 1 0 0 PAUSE-DR 0 PAUSE-IR 1 0 1 EXIT2-DR 0 EXIT2-IR 1 1 UPDATE-DR 1 0 1 EXIT1-DR 0 1 0 UPDATE-IR 1 0 The 0/1 next to each state represents the value of TMS at the rising edge of TCK. Document Number: 38-05558 Rev. *P Page 15 of 34 CY7C1370DV25 CY7C1372DV25 TAP Controller Block Diagram 0 Bypass Register 2 1 0 TDI Selection Circuitry Instruction Register 31 30 29 . . . 2 1 0 Selection Circuitry TDO Identification Register x . . . . . 2 1 0 Boundary Scan Register TCK TMS TAP CONTROLLER TAP Timing Figure 3. TAP Timing 1 2 Test Clock (TCK) 3 tTH tTMSS tTMSH tTDIS tTDIH t TL 4 5 6 tCYC Test Mode Select (TMS) Test Data-In (TDI) tTDOV tTDOX Test Data-Out (TDO) DON’T CARE Document Number: 38-05558 Rev. *P UNDEFINED Page 16 of 34 CY7C1370DV25 CY7C1372DV25 TAP AC Switching Characteristics Over the Operating Range Parameter [19, 20] Description Min Max Unit 50 – ns Clock tTCYC TCK clock cycle time tTF TCK clock frequency – 20 MHz tTH TCK clock HIGH time 20 – ns tTL TCK clock LOW time 20 – ns tTDOV TCK clock LOW to TDO valid – 10 ns tTDOX TCK clock LOW to TDO invalid 0 – ns tTMSS TMS set-up to TCK clock rise 5 – ns tTDIS TDI set-up to TCK clock rise 5 – ns tCS Capture set-up to TCK rise 5 – ns tTMSH TMS hold after TCK clock rise 5 – ns tTDIH TDI hold after clock rise 5 – ns tCH Capture hold after clock rise 5 – ns Output Times Set-up Times Hold Times Notes 19. tCS and tCH refer to the set-up and hold time requirements of latching data from the boundary scan register. 20. Test conditions are specified using the load in TAP AC test Conditions. tR/tF = 1 ns. Document Number: 38-05558 Rev. *P Page 17 of 34 CY7C1370DV25 CY7C1372DV25 2.5 V TAP AC Test Conditions 2.5 V TAP AC Output Load Equivalent 1.25V Input pulse levels ...............................................VSS to 2.5 V Input rise and fall time ....................................................1 ns 50Ω Input timing reference levels ....................................... 1.25 V Output reference levels .............................................. 1.25 V TDO Test load termination supply voltage .......................... 1.25 V Z O= 50Ω 20pF TAP DC Electrical Characteristics and Operating Conditions (0 °C < TA < +70 °C; VDD = 2.5 V ± 0.125 V unless otherwise noted) Parameter [21] Description Test Conditions Min Max Unit IOH = –1.0 mA, VDDQ = 2.5 V 2.0 – V VOH1 Output HIGH voltage VOH2 Output HIGH voltage IOH = –100 µA, VDDQ = 2.5 V 2.1 – V VOL1 Output LOW voltage IOL = 8.0 mA, VDDQ = 2.5 V – 0.4 V VOL2 Output LOW voltage IOL = 100 µA VDDQ = 2.5 V – 0.2 V VIH Input HIGH voltage VDDQ = 2.5 V 1.7 VDD + 0.3 V VIL Input LOW voltage VDDQ = 2.5 V –0.3 0.7 V IX Input load current –5 5 µA GND < VIN < VDDQ Note 21. All voltages referenced to VSS (GND). Document Number: 38-05558 Rev. *P Page 18 of 34 CY7C1370DV25 CY7C1372DV25 Scan Register Sizes Register Name Instruction Bit Size (× 18) Bit Size (× 36) 3 3 Bypass 1 1 ID 32 32 Boundary scan order (165-ball FBGA package) 89 89 CY7C1372DV25 Description Identification Register Definitions Instruction Field CY7C1370DV25 Revision number (31:29) 000 000 Cypress device ID (28:12) 01011001000010101 01011001000100101 Cypress JEDEC ID (11:1) 00000110100 00000110100 Allows unique identification of SRAM vendor. 1 1 Indicate the presence of an ID register. ID register presence (0) Reserved for version number. Reserved for future use. Instruction Codes Instruction Code Description EXTEST 000 Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Forces all SRAM outputs to high Z state. IDCODE 001 Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operations. SAMPLE Z 010 Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a high Z state. RESERVED 011 Do Not Use: This instruction is reserved for future use. SAMPLE/PRELOAD 100 Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Does not affect SRAM operation. RESERVED 101 Do Not Use: This instruction is reserved for future use. RESERVED 110 Do Not Use: This instruction is reserved for future use. BYPASS 111 Places the bypass register between TDI and TDO. This operation does not affect SRAM operations. Document Number: 38-05558 Rev. *P Page 19 of 34 CY7C1370DV25 CY7C1372DV25 Boundary Scan Order 165-ball FBGA [22, 23] Bit # Ball ID Bit # Ball ID Bit # Ball ID 1 N6 31 2 N7 32 D10 61 G1 C11 62 D2 3 N10 33 A11 63 E2 4 P11 34 B11 64 F2 5 P8 35 A10 65 G2 6 R8 36 B10 66 H1 7 R9 37 A9 67 H3 8 P9 38 B9 68 J1 9 P10 39 C10 69 K1 10 R10 40 A8 70 L1 11 R11 41 B8 71 M1 12 H11 42 A7 72 J2 13 N11 43 B7 73 K2 14 M11 44 B6 74 L2 15 L11 45 A6 75 M2 16 K11 46 B5 76 N1 17 J11 47 A5 77 N2 18 M10 48 A4 78 P1 19 L10 49 B4 79 R1 20 K10 50 B3 80 R2 21 J10 51 A3 81 P3 22 H9 52 A2 82 R3 23 H10 53 B2 83 P2 24 G11 54 C2 84 R4 25 F11 55 B1 85 P4 26 E11 56 A1 86 N5 27 D11 57 C1 87 P6 28 G10 58 D1 88 R6 89 Internal 29 F10 59 E1 30 E10 60 F1 Notes 22. Balls which are NC (No Connect) are pre-set LOW. 23. Bit# 89 is pre-set HIGH. Document Number: 38-05558 Rev. *P Page 20 of 34 CY7C1370DV25 CY7C1372DV25 Maximum Ratings DC input voltage ................................. –0.5 V to VDD + 0.5 V Exceeding maximum ratings may shorten the useful life of the device. User guidelines are not tested. Storage temperature ................................ –65 °C to +150 °C Ambient temperature with power applied .......................................... –55 °C to +125 °C Supply voltage on VDD relative to GND .......–0.5 V to +3.6 V Supply voltage on VDDQ relative to GND ...... –0.5 V to +VDD DC to outputs in tri-state ...................–0.5 V to VDDQ + 0.5 V Current into outputs (LOW) ........................................ 20 mA Static discharge voltage (per MIL-STD-883, method 3015) .......................... > 2001 V Latch-up current .................................................... > 200 mA Operating Range Range Ambient Temperature VDD/VDDQ Commercial 0 °C to +70 °C 2.5 V ± 5% Electrical Characteristics Over the Operating Range Parameter [24, 25] Description Test Conditions VDD Power supply voltage VDDQ I/O supply voltage for 2.5 V I/O VOH Output HIGH voltage for 2.5 V I/O, IOH = 1.0 mA VOL Output LOW voltage for 2.5 V I/O, IOL= 1.0 mA Min Max Unit 2.375 2.625 V 2.375 VDD V 2.0 – V – 0.4 V V Input HIGH voltage [26] for 2.5 V I/O 1.7 VDD + 0.3 V VIL Input LOW voltage [26] for 2.5 V I/O –0.3 0.7 V IX Input leakage current except ZZ GND  VI  VDDQ and MODE –5 5 A Input current of MODE –30 – A Input = VDD – 5 A Input = VSS –5 – A VIH Input current of ZZ Input = VSS Input = VDD – 30 A IOZ Output leakage current GND  VI  VDD, output disabled –5 5 A IDD VDD operating supply VDD = Max, IOUT = 0 mA, f = fMAX = 1/tCYC 5.0-ns cycle, 200 MHz – 300 mA 6.0-ns cycle, 167 MHz – 275 mA 5.0-ns cycle, 200 MHz – 150 mA 6.0-ns cycle, 167 MHz – 140 mA ISB1 Automatic CE power-down current – TTL inputs Max. VDD, device deselected, VIN  VIH or VIN  VIL, f = fMAX = 1/tCYC ISB2 Automatic CE power-down current – CMOS inputs Max. VDD, device deselected, All speed VIN  0.3 V or VIN > VDDQ 0.3 V, grades f=0 – 70 mA ISB3 Automatic CE power-down current – CMOS Inputs Max. VDD, device deselected, 5.0-ns cycle, VIN  0.3 V or VIN > VDDQ 0.3 V, 200 MHz f = fMAX = 1/tCYC 6.0-ns cycle, 167 MHz – 130 mA – 125 mA – 80 mA ISB4 Automatic CE power-down current—TTL Inputs Max. VDD, device deselected, VIN  VIH or VIN  VIL, f = 0 All speed grades Notes 24. Overshoot: VIH(AC) < VDD + 1.5 V (Pulse width less than tCYC/2), undershoot: VIL(AC) > –2 V (Pulse width less than tCYC/2). 25. TPower-up: Assumes a linear ramp from 0 V to VDD(min) within 200 ms. During this time VIH < VDD and VDDQ < VDD. 26. Tested initially and after any design or process change that may affect these parameters. Document Number: 38-05558 Rev. *P Page 21 of 34 CY7C1370DV25 CY7C1372DV25 Capacitance Parameter [27] 100-pin TQFP Package 165-ball FBGA Package Unit 5 9 pF 5 9 pF 5 9 pF Test Conditions 100-pin TQFP Package 165-ball FBGA Package Unit Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA/JESD51. 28.66 20.7 C/W 4.08 4.0 C/W Description Test Conditions CIN Input capacitance CCLK Clock input capacitance CI/O Input/output capacitance TA = 25 C, f = 1 MHz, VDD = 2.5 V, VDDQ = 2.5 V Thermal Resistance Parameter [27] Description JA Thermal resistance (junction to ambient) JC Thermal resistance (junction to case) AC Test Loads and Waveforms Figure 4. AC Test Loads and Waveforms 2.5 V I/O Test Load R = 1667  2.5 V OUTPUT OUTPUT RL = 50  Z0 = 50  GND 5 pF R = 1538  VT = 1.25 V (a) ALL INPUT PULSES VDDQ INCLUDING JIG AND SCOPE (b) 10% 90% 10% 90%  1 ns  1 ns (c) Note 27. Tested initially and after any design or process change that may affect these parameters. Document Number: 38-05558 Rev. *P Page 22 of 34 CY7C1370DV25 CY7C1372DV25 Switching Characteristics Over the Operating Range Parameter [28, 29] Description -200 -167 Unit Min Max Min Max VCC(typical) to the first access read or write 1 – 1 – ms tCYC Clock cycle time 5 – 6 – ns FMAX Maximum operating frequency – 200 – 167 MHz tCH Clock HIGH 2.0 – 2.2 – ns tCL Clock LOW 2.0 – 2.2 – ns tPower[30] Clock Output Times tCO Data output valid after CLK rise – 3.0 – 3.4 ns tEOV OE LOW to output valid – 3.0 – 3.4 ns tDOH Data output hold after CLK rise 1.3 – 1.3 – ns tCHZ Clock to high Z [31, 32, 33] – 3.0 – 3.4 ns 1.3 – 1.3 – ns – 3.0 – 3.4 ns 0 – 0 – ns tCLZ tEOHZ tEOLZ Clock to low Z [31, 32, 33] OE HIGH to output high Z OE LOW to output low Z [31, 32, 33] [31, 32, 33] Set-up Times tAS Address set-up before CLK rise 1.4 – 1.5 – ns tDS Data input set-up before CLK rise 1.4 – 1.5 – ns tCENS CEN set-up before CLK rise 1.4 – 1.5 – ns tWES WE, BWx set-up before CLK rise 1.4 – 1.5 – ns tALS ADV/LD set-up before CLK rise 1.4 – 1.5 – ns tCES Chip select set-up 1.4 – 1.5 – ns tAH Address hold after CLK rise 0.4 – 0.5 – ns tDH Data input hold after CLK rise 0.4 – 0.5 – ns tCENH CEN hold after CLK rise 0.4 – 0.5 – ns tWEH WE, BWx hold after CLK rise 0.4 – 0.5 – ns tALH ADV/LD hold after CLK rise 0.4 – 0.5 – ns tCEH Chip select hold after CLK rise 0.4 – 0.5 – ns Hold Times Notes 28. Timing reference 1.25 V when VDDQ = 2.5 V. 29. Test conditions shown in (a) of Figure 4 on page 22 unless otherwise noted. 30. This part has a voltage regulator internally; tPower is the time power needs to be supplied above VDD(minimum) initially, before a read or write operation can be initiated. 31. tCHZ, tCLZ, tEOLZ, and tEOHZ are specified with AC test conditions shown in (b) of Figure 4 on page 22. Transition is measured ± 200 mV from steady-state voltage. 32. At any given voltage and temperature, tEOHZ is less than tEOLZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve high Z prior to low Z under the same system conditions. 33. This parameter is sampled and not 100% tested. Document Number: 38-05558 Rev. *P Page 23 of 34 CY7C1370DV25 CY7C1372DV25 Switching Waveforms Figure 5. Read/Write Cycle Timing [34, 35, 36] 1 2 3 t CYC 4 5 6 A3 A4 7 8 9 A5 A6 A7 10 CLK tCENS tCENH tCH tCL CEN tCES tCEH CE ADV/LD WE BWx A1 ADDRESS A2 tCO tAS tDS tAH Data In-Out (DQ) tDH D(A1) tCLZ D(A2) D(A2+1) tDOH Q(A3) tOEV Q(A4) tCHZ Q(A4+1) D(A5) Q(A6) tOEHZ tDOH tOELZ OE WRITE D(A1) WRITE D(A2) BURST WRITE D(A2+1) READ Q(A3) READ Q(A4) DON’T CARE BURST READ Q(A4+1) WRITE D(A5) READ Q(A6) WRITE D(A7) DESELECT UNDEFINED Notes 34. For this waveform ZZ is tied LOW. 35. When CE is LOW, CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH, CE1 is HIGH or CE2 is LOW or CE3 is HIGH. 36. Order of the Burst sequence is determined by the status of the MODE (0 = Linear, 1 = Interleaved). Burst operations are optional. Document Number: 38-05558 Rev. *P Page 24 of 34 CY7C1370DV25 CY7C1372DV25 Switching Waveforms (continued) Figure 6. NOP, STALL and DESELECT Cycles [37, 38, 39] 1 2 A1 A2 3 4 5 A3 A4 6 7 8 9 10 CLK CEN CE ADV/LD WE BWx ADDRESS A5 tCHZ D(A1) Data Q(A2) D(A4) Q(A3) Q(A5) In-Out (DQ) WRITE D(A1) READ Q(A2) STALL READ Q(A3) WRITE D(A4) STALL DON’T CARE NOP READ Q(A5) DESELECT CONTINUE DESELECT UNDEFINED Figure 7. ZZ Mode Timing [40, 41] CLK t ZZ ZZ I t ZZREC t ZZI SUPPLY I DDZZ t RZZI ALL INPUTS (except ZZ) Outputs (Q) DESELECT or READ Only High-Z DON’T CARE Notes 37. For this waveform ZZ is tied LOW. 38. When CE is LOW, CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH, CE1 is HIGH or CE2 is LOW or CE3 is HIGH. 39. The Ignore Clock Edge or Stall cycle (Clock 3) illustrated CEN being used to create a pause. A write is not performed during this cycle 40. Device must be deselected when entering ZZ mode. See cycle description table for all possible signal conditions to deselect the device. 41. I/Os are in high Z when exiting ZZ sleep mode. Document Number: 38-05558 Rev. *P Page 25 of 34 CY7C1370DV25 CY7C1372DV25 Ordering Information Cypress offers other versions of this type of product in different configurations and features. The following table contains only the list of parts that are currently available. For a complete listing of all options, visit the Cypress website at www.cypress.com and refer to the product summary page at http://www.cypress.com/products, or contact your local sales representative. Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives and distributors. To find the office closest to you, visit us at http://www.cypress.com/go/datasheet/offices. Speed (MHz) 167 Ordering Code CY7C1370DV25-167AXC Package Diagram Part and Package Type 51-85050 100-pin TQFP (14 × 20 × 1.4 mm) Pb-free Operating Range Commercial CY7C1372DV25-167AXC 200 CY7C1370DV25-167BZC 51-85180 165-ball FBGA (13 × 15 × 1.4 mm) CY7C1370DV25-200AXC 51-85050 100-pin TQFP (14 × 20 × 1.4 mm) Pb-free CY7C1370DV25-200BZC 51-85180 165-ball FBGA (13 × 15 × 1.4 mm) Commercial Ordering Code Definitions CY 7 C 137X D V25 - XXX XX X C Temperature Range: C = Commercial = 0 C to +70 C X = Pb-free; X Absent = Leaded Package Type: XX = A or BZ A = 100-pin TQFP BZ = 165-ball FBGA Speed Grade: XXX = 167 MHz or 200 MHz V25 = 2.5 V VDD Process Technology: D  90nm Part Identifier: 137X = 1370 or 1372 1370 = PL, 512Kb × 36 (18Mb) 1372 = PL, 1Mb × 18 (18Mb) Technology Code: C = CMOS Marketing Code: 7 = SRAM Company ID: CY = Cypress Document Number: 38-05558 Rev. *P Page 26 of 34 CY7C1370DV25 CY7C1372DV25 Package Diagrams Figure 8. 100-pin TQFP (14 × 20 × 1.4 mm) A100RA Package Outline, 51-85050 51-85050 *E Document Number: 38-05558 Rev. *P Page 27 of 34 CY7C1370DV25 CY7C1372DV25 Package Diagrams (continued) Figure 9. 165-ball FBGA (13 × 15 × 1.4 mm) BB165D/BW165D (0.5 Ball Diameter) Package Outline, 51-85180 51-85180 *F Document Number: 38-05558 Rev. *P Page 28 of 34 CY7C1370DV25 CY7C1372DV25 Acronyms Acronym Document Conventions Description Units of Measure CE Chip Enable CEN Clock Enable °C degree Celsius CMOS Complementary Metal Oxide Semiconductor MHz megahertz EIA Electronic Industries Alliance µA microampere FBGA Fine-Pitch Ball Grid Array mA milliampere I/O Input/Output mm millimeter JEDEC Joint Electron Devices Engineering Council ms millisecond JTAG Joint Test Action Group mV millivolt LSB Least Significant Bit ns nanosecond MSB Most Significant Bit  ohm NoBL No Bus Latency % percent OE Output Enable pF picofarad SRAM Static Random Access Memory V volt TAP Test Access Port W watt TCK Test Clock TDI Test Data-In TDO Test Data-Out TMS Test Mode Select TQFP Thin Quad Flat Pack TTL Transistor-Transistor Logic WE Write Enable Document Number: 38-05558 Rev. *P Symbol Unit of Measure Page 29 of 34 CY7C1370DV25 CY7C1372DV25 Errata This section describes the Ram9 NoBL ZZ pin and JTAG issues. Details include trigger conditions, the devices affected, proposed workaround and silicon revision applicability. Please contact your local Cypress sales representative if you have further questions. Part Numbers Affected Density & Revision 18Mb-Ram9 NoBL SRAMs: CY7C137*DV25 Package Type Operating Range 100-pin TQFP Commercial 165-ball FBGA Product Status All of the devices in the Ram9 18Mb NoBL family are qualified and available in production quantities. Ram9 NoBL ZZ Pin & JTAG Issues Errata Summary The following table defines the errata applicable to available Ram9 18Mb NoBL family devices. Item Issues Description Device Fix Status 1. ZZ Pin When asserted HIGH, the ZZ pin places device in a “sleep” condition with data integrity preserved.The ZZ pin currently does not have an internal pull-down resistor and hence cannot be left floating externally by the user during normal mode of operation. 18M-Ram9 (90nm) For the 18M Ram9 (90 nm) devices, there is no plan to fix this issue. 2. JTAG Functionality During JTAG test mode, the Boundary scan circuitry does not perform as described in the datasheet.However, it is possible to perform the JTAG test with these devices in “BYPASS mode”. 18M-Ram9 (90nm) This issue will be fixed in the new revision, which use the 65 nm technology. Please contact your local sales rep for availability. Document Number: 38-05558 Rev. *P Page 30 of 34 CY7C1370DV25 CY7C1372DV25 1. ZZ Pin Issue ■ PROBLEM DEFINITION The problem occurs only when the device is operated in the normal mode with ZZ pin left floating. The ZZ pin on the SRAM device does not have an internal pull-down resistor. Switching noise in the system may cause the SRAM to recognize a HIGH on the ZZ input, which may cause the SRAM to enter sleep mode. This could result in incorrect or undesirable operation of the SRAM. ■ TRIGGER CONDITIONS Device operated with ZZ pin left floating. ■ SCOPE OF IMPACT When the ZZ pin is left floating, the device delivers incorrect data. ■ WORKAROUND Tie the ZZ pin externally to ground. ■ FIX STATUS For the 18M Ram9 (90 nm) devices, there is no plan to fix this issue. 2. JTAG Functionality ■ PROBLEM DEFINITION The problem occurs only when the device is operated in the JTAG test mode.During this mode, the JTAG circuitry can perform incorrectly by delivering the incorrect data or the incorrect scan chain length. ■ TRIGGER CONDITIONS Several conditions can trigger this failure mode. 1. The device can deliver an incorrect length scan chain when operating in JTAG mode. 2. Some Byte Write inputs only recognize a logic HIGH level when in JTAG mode. 3. Incorrect JTAG data can be read from the device when the ZZ input is tied HIGH during JTAG operation. ■ SCOPE OF IMPACT The device fails for JTAG test. This does not impact the normal functionality of the device. ■ WORKAROUND 1.Perform JTAG testing with these devices in “BYPASS mode”. 2.Do not use JTAG test. ■ FIX STATUS This issue will be fixed in the new revision, which use the 65 nm technology. Please contact your local sales rep for availability Document Number: 38-05558 Rev. *P Page 31 of 34 CY7C1370DV25 CY7C1372DV25 Document History Page Document Title: CY7C1370DV25/CY7C1372DV25, 18-Mbit (512K × 36/1M × 18) Pipelined SRAM with NoBL™ Architecture Document Number: 38-05558 Rev. ECN No. Issue Date Orig. of Change Description of Change ** 254509 See ECN RKF New data sheet. *A 288531 See ECN SYT Updated Selection Guide (Removed 225 MHz frequency related information). Updated IEEE 1149.1 Serial Boundary Scan (JTAG [18]) (Edited description for non-compliance with 1149.1). Updated Electrical Characteristics (Removed 225 MHz frequency related information). Updated Switching Characteristics (Removed 225 MHz frequency related information). Updated Ordering Information (Added Pb-free information for 100-pin TQFP, 119-ball BGA and 165-ball FBGA package) and added comment for ‘Pb-free BG packages availability’ below the Ordering Information. *B 326078 See ECN PCI Updated Pin Configurations (Address expansion pins/balls in the pinouts for all packages are modified as per JEDEC standard). Updated IEEE 1149.1 Serial Boundary Scan (JTAG [18]) (Updated TAP Instruction Set (Updated OVERVIEW (description), updated EXTEST (description), added EXTEST Output Bus Tri-State)). Updated Electrical Characteristics (Modified Test Conditions for VOL, VOH parameters). Updated Thermal Resistance (Changed JA and JC for 100-pin TQFP Package from 31 and 6 C/W to 28.66 and 4.08 C/W respectively, changed JA and JC for 119-ball BGA Package from 45 and 7 C/W to 23.8 and 6.2 C/W respectively, changed JA and JC for FBGA Package from 46 and 3 C/W to 20.7 and 4.0 C/W respectively). Updated Ordering Information (Updated part numbers) and removed comment for ‘Pb-free BG packages availability’ below the Ordering Information *C 418125 See ECN NXR Changed status from Preliminary to Final. Changed address of Cypress Semiconductor Corporation from “3901 North First Street” to “198 Champion Court”. Updated Electrical Characteristics (Changed the description of IX parameter from Input Load Current to Input Leakage Current, changed the minimum and maximum values of IX parameter (corresponding to Input Current of MODE) from –5 A and 30 A to –30 A and 5 A, changed the minimum and maximum values of IX parameter (corresponding to Input current of ZZ) from –30 A and 5 A to –5 A and 30 A, updated Note 25). Updated Ordering Information (Updated part numbers). *D 475677 See ECN VKN Updated TAP AC Switching Characteristics (Changed minimum values of tTH, and tTL parameters from 25 ns to 20 ns, and maximum value of tTDOV parameter from 5 ns to 10 ns). Updated Maximum Ratings (Added the Maximum Rating for Supply Voltage on VDDQ Relative to GND). Updated Ordering Information (Updated part numbers). *E 2897278 03/22/2010 NJY Updated Ordering Information (Removed obsolete part numbers). Updated Package Diagrams. *F 3031731 09/16/2010 NJY Updated Ordering Information (Updated part numbers) and added Ordering Code Definitions. Added Acronyms and Units of Measure. Minor edits. Updated to new template. *G 3050869 10/07/2010 NJY Updated Ordering Information (Removed CY7C1370DV25-167BZI, CY7C1370DV25-250AXC, and CY7C1370DV25-167AXI). *H 3067198 10/20/2010 NJY Updated Ordering Information (Updated part numbers). Document Number: 38-05558 Rev. *P Page 32 of 34 CY7C1370DV25 CY7C1372DV25 Document History Page (continued) Document Title: CY7C1370DV25/CY7C1372DV25, 18-Mbit (512K × 36/1M × 18) Pipelined SRAM with NoBL™ Architecture Document Number: 38-05558 Rev. ECN No. Issue Date Orig. of Change PRIT Description of Change *I 3378887 09/21/2011 *J 3575766 04/10/2012 Updated Package Diagrams. *K 3753130 09/24/2012 PRIT Updated Package Diagrams (spec 51-85180 (Changed revision from *E to *F)). *L 3981545 04/25/2013 PRIT Added Errata. *M 4070450 07/20/2013 PRIT Added Errata footnotes (Note 1, 2, 3, 4, 5, 18). Updated Pin Configurations: Added Note 1 and referred the same note in Figure 1. Added Note 2, 3 and referred the same note in Figure 2. Updated Pin Definitions: Added Note 4 and referred the same note in TDO, TDI, TMS, TCK pins. Added Note 5 and referred the same note in ZZ pin. Updated IEEE 1149.1 Serial Boundary Scan (JTAG [18]): Added Note 18 and referred the same note in JTAG in the heading. Updated to new template. NJY / PRIT Updated Features (Removed 250 MHz frequency related information, removed 119-ball BGA package related information). Updated Selection Guide (Removed 250 MHz frequency related information). Updated Pin Configurations (Removed 119-ball BGA package related information). Updated Scan Register Sizes (Removed 119-ball BGA package related information). Removed Boundary Scan Order (Corresponding to 119-ball BGA package). Updated Operating Range (Removed Industrial Temperature Range). Updated Electrical Characteristics (Removed 250 MHz frequency related information). Updated Capacitance (Removed 119-ball BGA package related information). Updated Thermal Resistance (Removed 119-ball BGA package related information). Updated Switching Characteristics (Removed 250 MHz frequency related information). Updated Package Diagrams (Removed 119-ball BGA package related information). *N 4151890 10/09/2013 PRIT Updated Errata. *O 4572829 11/18/2014 PRIT Updated Functional Description: Added “For a complete list of related documentation, click here.” at the end. Updated Package Diagrams: spec 51-85050 – Changed revision from *D to *E. *P 5508335 11/03/2016 PRIT Obsolete document. Completing Sunset Review. Document Number: 38-05558 Rev. *P Page 33 of 34 CY7C1370DV25 CY7C1372DV25 Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office closest to you, visit us at Cypress Locations. PSoC® Solutions Products Automotive Clocks & Buffers Interface Lighting & Power Control cypress.com/go/automotive cypress.com/go/clocks cypress.com/go/interface cypress.com/go/powerpsoc cypress.com/go/plc Memory cypress.com/go/memory PSoC cypress.com/go/psoc Touch Sensing PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP Cypress Developer Community Community | Forums | Blogs | Video | Training Technical Support cypress.com/go/support cypress.com/go/touch USB Controllers Wireless/RF psoc.cypress.com/solutions cypress.com/go/USB cypress.com/go/wireless © Cypress Semiconductor Corporation, 2004-2016. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. Document Number: 38-05558 Rev. *P Revised November 3, 2016 Page 34 of 34 NoBL and No Bus Latency are trademarks of Cypress Semiconductor Corporation. ZBT is a trademark of Integrated Device Technology, Inc. All products and company names mentioned in this document may be the trademarks of their respective holders.