CY7C1440AV25-250BZXIT

CY7C1440AV25 CY7C1446AV25 36-Mbit (1 M × 36/512 K × 72) Pipelined Sync SRAM 36-Mbit (1 M × 36/512 K × 72) Pipelined Sync SRAM Features Functional Description ■ Supports bus operation up to 250 MHz ■ Available speed grades are 250 and 167 MHz ■ Registered inputs and outputs for pipelined operation ■ 2.5 V core power supply ■ 2.5 V power supply ■ Fast clock-to-output times ❐ 2.6 ns (for 250-MHz device) ■ Provide high-performance 3-1-1-1 access rate ■ User-selectable burst counter supporting Intel Pentium interleaved or linear burst sequences ■ Separate processor and controller address strobes ■ Synchronous self-timed writes ■ Asynchronous output enable ■ Single-cycle Chip Deselect ■ CY7C1440AV25 available in Pb-free and non-Pb-free 165-ball FBGA package. CY7C1446AV25 available in non-Pb-free 209-ball FBGA package ■ IEEE 1149.1 JTAG-Compatible Boundary Scan ■ “ZZ” Sleep Mode Option The CY7C1440AV25/CY7C1446AV25 SRAM integrates 1 M × 36/512 K × 72 SRAM cells with advanced synchronous peripheral circuitry and a two-bit counter for internal burst operation. All synchronous inputs are gated by registers controlled by a positive-edge-triggered Clock Input (CLK). The synchronous inputs include all addresses, all data inputs, address-pipelining Chip Enable (CE1), depth-expansion Chip Enables (CE2 and CE3), Burst Control inputs (ADSC, ADSP, and ADV), Write Enables (BWX, and BWE), and Global Write (GW). Asynchronous inputs include the Output Enable (OE) and the ZZ pin. Addresses and chip enables are registered at rising edge of clock when either Address Strobe Processor (ADSP) or Address Strobe Controller (ADSC) are active. Subsequent burst addresses can be internally generated as controlled by the Advance pin (ADV). Address, data inputs, and write controls are registered on-chip to initiate a self-timed Write cycle.This part supports Byte Write operations (see Pin Descriptions and Truth Table for further details). Write cycles can be one to two or four bytes wide as controlled by the byte write control inputs. GW when active LOW causes all bytes to be written. The CY7C1440AV25/CY7C1446AV25 operates from a +2.5 V core power supply while all outputs may operate with a +2.5 V supply. All inputs and outputs are JEDEC-standard JESD8-5-compatible. For a complete list of related documentation, click here. Selection Guide 250 MHz 167 MHz Unit Maximum Access Time Description 2.6 3.4 ns Maximum Operating Current 435 335 mA Maximum CMOS Standby Current 120 120 mA Cypress Semiconductor Corporation Document Number: 001-70167 Rev. *E • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised January 5, 2016 CY7C1440AV25 CY7C1446AV25 Logic Block Diagram – CY7C1440AV25 A0, A1, A ADDRESS REGISTER 2 A[1:0] MODE ADV CLK Q1 BURST COUNTER CLR AND Q0 LOGIC ADSC ADSP BWD DQD ,DQPD BYTE WRITE REGISTER DQD ,DQPD BYTE WRITE DRIVER BWC DQC ,DQPC BYTE WRITE REGISTER DQC ,DQPC BYTE WRITE DRIVER DQB ,DQPB BYTE WRITE REGISTER DQB ,DQPB BYTE WRITE DRIVER BWB BWA BWE GW CE1 CE2 CE3 OE ZZ SENSE AMPS OUTPUT REGISTERS OUTPUT BUFFERS E DQs DQPA DQPB DQPC DQPD DQA ,DQPA BYTE WRITE DRIVER DQA ,DQPA BYTE WRITE REGISTER ENABLE REGISTER MEMORY ARRAY PIPELINED ENABLE INPUT REGISTERS SLEEP CONTROL Document Number: 001-70167 Rev. *E Page 2 of 33 CY7C1440AV25 CY7C1446AV25 Logic Block Diagram – CY7C1446AV25 A0, A1,A ADDRESS REGISTER A[1:0] MODE Q1 BINARY COUNTER CLR Q0 ADV CLK ADSC ADSP BWH DQH, DQPH WRITE DRIVER DQH, DQPH WRITE DRIVER BWG DQF, DQPF WRITE DRIVER DQG, DQPG WRITE DRIVER BWF DQF, DQPF WRITE DRIVER DQF, DQPF WRITE DRIVER BWE DQE, DQPE WRITE DRIVER DQ E, DQP BYTE “a”E WRITE DRIVER BWD DQD, DQPD WRITE DRIVER DQD, DQPD WRITE DRIVER BWC DQC, DQPC WRITE DRIVER DQC, DQPC WRITE DRIVER MEMORY ARRAY SENSE AMPS BWB BWA BWE GW CE1 CE2 CE3 OE ZZ DQB, DQPB WRITE DRIVER DQB, DQPB WRITE DRIVER OUTPUT BUFFERS E DQA, DQPA WRITE DRIVER DQA, DQPA WRITE DRIVER ENABLE REGISTER OUTPUT REGISTERS PIPELINED ENABLE INPUT REGISTERS DQs DQPA DQPB DQPC DQPD DQPE DQPF DQPG DQPH SLEEP CONTROL Document Number: 001-70167 Rev. *E Page 3 of 33 CY7C1440AV25 CY7C1446AV25 Contents Pin Configurations ........................................................... 5 Pin Definitions .................................................................. 7 Functional Overview ........................................................ 8 Single Read Accesses ................................................ 8 Single Write Accesses Initiated by ADSP ................... 8 Single Write Accesses Initiated by ADSC ................... 9 Burst Sequences ......................................................... 9 Sleep Mode ................................................................. 9 Interleaved Burst Address Table ................................. 9 Linear Burst Address Table ......................................... 9 ZZ Mode Electrical Characteristics .............................. 9 Truth Table ...................................................................... 10 Truth Table for Read/Write ............................................ 11 Truth Table for Read/Write ............................................ 11 IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 12 Disabling the JTAG Feature ...................................... 12 Test Access Port (TAP) ............................................. 12 PERFORMING A TAP RESET .................................. 12 TAP REGISTERS ...................................................... 12 TAP Instruction Set ................................................... 12 TAP Controller State Diagram ....................................... 14 TAP Controller Block Diagram ...................................... 15 TAP Timing ...................................................................... 15 TAP AC Switching Characteristics ............................... 16 2.5 V TAP AC Test Conditions ....................................... 17 2.5 V TAP AC Output Load Equivalent ......................... 17 TAP DC Electrical Characteristics and Operating Conditions ............................................. 17 Identification Register Definitions ................................ 18 Document Number: 001-70167 Rev. *E Scan Register Sizes ....................................................... 18 Instruction Codes ........................................................... 18 Boundary Scan Order .................................................... 19 Boundary Scan Order .................................................... 20 Maximum Ratings ........................................................... 21 Operating Range ............................................................. 21 Electrical Characteristics ............................................... 21 DC Electrical Characteristics ..................................... 21 Capacitance .................................................................... 22 Thermal Resistance ........................................................ 22 AC Test Loads and Waveforms ..................................... 22 Switching Characteristics .............................................. 23 Switching Waveforms .................................................... 24 Ordering Information ...................................................... 28 Ordering Code Definitions ......................................... 28 Package Diagrams .......................................................... 29 Acronyms ........................................................................ 31 Document Conventions ................................................. 31 Units of Measure ....................................................... 31 Document History Page ................................................. 32 Sales, Solutions, and Legal Information ...................... 33 Worldwide Sales and Design Support ....................... 33 Products .................................................................... 33 PSoC® Solutions ...................................................... 33 Cypress Developer Community ................................. 33 Technical Support ..................................................... 33 Page 4 of 33 CY7C1440AV25 CY7C1446AV25 Pin Configurations Figure 1. 165-ball FBGA (15 × 17 × 1.4 mm) pinout CY7C1440AV25 (1 M × 36) 1 A B C D E F G H J K L M N P NC/288M R 2 A 3 4 5 6 7 8 9 10 11 CE1 BWC BWB CE3 BWE ADSC ADV A NC NC/144M A CE2 BWD BWA CLK DQPC DQC NC DQC VDDQ VSS VSS VSS VSS GW VSS VSS OE VSS VDD ADSP VDDQ VDDQ VSS VDD A NC/576M VDDQ NC/1G DQB DQPB DQB DQC DQC VDDQ VDD VSS VSS VSS VDD VDDQ DQB DQB DQC DQC VDDQ VDD VSS VSS VSS VDD VDDQ DQB DQB DQC NC DQD DQC NC DQD VDDQ NC VDDQ VDD VDD VDD VSS VSS VSS VSS VSS VSS VSS VSS VSS VDD VDD VDD VDDQ NC VDDQ DQB NC DQA DQB ZZ DQA DQD DQD VDDQ VDD VSS VSS VSS VDD VDDQ DQA DQA DQD DQD VDDQ VDD VSS VSS VSS VDD VDDQ DQA DQA DQD DQPD DQD NC VDDQ VDDQ VDD VSS VSS NC VSS A VSS NC VDD VSS VDDQ VDDQ DQA NC DQA DQPA NC NC/72M A A TDI A1 TDO A A A A MODE A A A TMS TCK A A A A Document Number: 001-70167 Rev. *E A0 Page 5 of 33 CY7C1440AV25 CY7C1446AV25 Pin Configurations (continued) Figure 2. 209-ball FBGA (14 × 22 × 1.76 mm) pinout CY7C1446AV25 (512 K × 72) 1 2 3 7 8 9 10 11 A DQG DQG ADV B DQG DQG CE3 A DQB DQB BWSC BWSG NC/288M BW DQB DQB C DQG DQG BWSH BWSD NC/144M CE1 D BWSA DQB DQB DQG DQG VSS NC NC/1G OE NC VSS DQB E DQPG DQPC VDDQ VDDQ DQB VDD VDD F DQC VDD VDDQ VDDQ DQPF DQPB DQC VSS VSS VSS NC VSS VSS VSS DQF G DQC DQC VDDQ VDDQ DQF VDD NC VDD H DQC VDDQ VDDQ DQF DQF DQC VSS VSS VSS NC VSS VSS VSS DQF J DQC DQC DQF VDDQ VDDQ VDD NC VDD VDDQ VDDQ K DQF DQF NC NC CLK NC VSS VSS VSS NC NC NC L NC DQH DQH VDDQ VDDQ VDD NC VDD VDDQ VDDQ DQA DQA M DQH DQH VSS VSS VSS NC VSS VSS VSS DQA DQA N DQH DQH VDDQ VDDQ VDD NC VDD VDDQ VDDQ DQA DQA P DQH DQH VSS VSS VSS ZZ VSS VSS VSS DQA DQA R DQPD DQPH VDDQ VDDQ VDD VDD VDD VDDQ VDDQ DQPA T DQD DQD NC NC MODE NC NC VSS U DQD DQD V DQD DQD W DQD DQD A VSS 4 CE2 5 6 ADSP ADSC A BWSB NC/576M BWSE GW BWSF DQPE DQE DQE A A A A A A DQE DQE A A A A1 A A A DQE DQE TMS TDI A A0 A TCK DQE DQE NC/72M Document Number: 001-70167 Rev. *E TDO Page 6 of 33 CY7C1440AV25 CY7C1446AV25 Pin Definitions Name A0, A1, A I/O Description InputAddress Inputs used to select one of the address locations. Sampled at the rising edge of the CLK Synchronous if ADSP or ADSC is active LOW, and CE1, CE2, and CE3 are sampled active. A1:A0 are fed to the two-bit counter. BWA, BWB, InputByte Write Select Inputs, active LOW. Qualified with BWE to conduct byte writes to the SRAM. Sampled BWC, BWD, Synchronous on the rising edge of CLK. BWE, BWF, BWG, BWH GW InputGlobal Write Enable Input, active LOW. When asserted LOW on the rising edge of CLK, a global write Synchronous is conducted (ALL bytes are written, regardless of the values on BWX and BWE). BWE InputByte Write Enable Input, active LOW. Sampled on the rising edge of CLK. This signal must be asserted Synchronous LOW to conduct a byte write. CLK InputClock Clock Input. Used to capture all synchronous inputs to the device. Also used to increment the burst counter when ADV is asserted LOW, during a burst operation. CE1 InputChip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE2 Synchronous and CE3 to select/deselect the device. ADSP is ignored if CE1 is HIGH. CE1 is sampled only when a new external address is loaded. CE2 InputChip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 Synchronous and CE3 to select/deselect the device. CE2 is sampled only when a new external address is loaded. CE3 InputChip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 Synchronous and CE2 to select/deselect the device. Not connected for BGA. Where referenced, CE3 is assumed active throughout this document for BGA. CE3 is sampled only when a new external address is loaded. OE InputOutput Enable, asynchronous input, active LOW. Controls the direction of the I/O pins. When LOW, Asynchronous the I/O pins behave as outputs. When deasserted HIGH, I/O pins are tri-stated, and act as input data pins. OE is masked during the first clock of a read cycle when emerging from a deselected state. ADV InputAdvance Input signal, sampled on the rising edge of CLK, active LOW. When asserted, it Synchronous automatically increments the address in a burst cycle. ADSP InputAddress Strobe from Processor, sampled on the rising edge of CLK, active LOW. When asserted Synchronous LOW, addresses presented to the device are captured in the address registers. A1:A0 are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized. ASDP is ignored when CE1 is deasserted HIGH. ADSC InputAddress Strobe from Controller, sampled on the rising edge of CLK, active LOW. When asserted Synchronous LOW, addresses presented to the device are captured in the address registers. A1:A0 are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized. ZZ InputZZ “sleep” Input, active HIGH. When asserted HIGH places the device in a non-time-critical “sleep” Asynchronous condition with data integrity preserved. For normal operation, this pin has to be LOW or left floating. ZZ pin has an internal pull-down. DQs, DQPs I/OBidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the Synchronous rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by the addresses presented during the previous clock rise of the read cycle. The direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs. When HIGH, DQs and DQPX are placed in a tri-state condition. VDD Power Supply Power supply inputs to the core of the device. VSS Ground Ground for the core of the device. VSSQ I/O Ground Ground for the I/O circuitry. VDDQ I/O Power Supply Power supply for the I/O circuitry. Document Number: 001-70167 Rev. *E Page 7 of 33 CY7C1440AV25 CY7C1446AV25 Pin Definitions (continued) Name MODE I/O Description Input-Static Selects Burst Order. When tied to GND selects linear burst sequence. When tied to VDD or left floating selects interleaved burst sequence. This is a strap pin and should remain static during device operation. Mode Pin has an internal pull-up. TDO JTAG serial Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK. If the JTAG feature is output not being utilized, this pin should be disconnected. Synchronous TDI JTAG serial Serial data-In to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature is not being utilized, this pin can be disconnected or connected to VDD. input Synchronous TMS JTAG serial Serial data-In to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature is not being input utilized, this pin can be disconnected or connected to VDD. Synchronous TCK JTAG-Clock Clock input to the JTAG circuitry. If the JTAG feature is not being utilized, this pin must be connected to VSS. NC – No Connects. Not internally connected to the die NC/72M, NC/144M, NC/288M, NC/576, NC/1G – No Connects. Not internally connected to the die. 72M, 144M, 288M, 576M and 1G are address expansion pins are not internally connected to the die. Functional Overview All synchronous inputs pass through input registers controlled by the rising edge of the clock. All data outputs pass through output registers controlled by the rising edge of the clock. Maximum access delay from the clock rise (tCO) is 2.6 ns (250-MHz device). The CY7C1440AV25/CY7C1446AV25 supports secondary cache in systems utilizing either a linear or interleaved burst sequence. The interleaved burst order supports Pentium and i486 processors. The linear burst sequence is suited for processors that utilize a linear burst sequence. The burst order is user selectable, and is determined by sampling the MODE input. Accesses can be initiated with either the Processor Address Strobe (ADSP) or the Controller Address Strobe (ADSC). Address advancement through the burst sequence is controlled by the ADV input. A two-bit on-chip wraparound burst counter captures the first address in a burst sequence and automatically increments the address for the rest of the burst access. Byte Write operations are qualified with the Byte Write Enable (BWE) and Byte Write Select (BWX) inputs. A Global Write Enable (GW) overrides all Byte Write inputs and writes data to all four bytes. All writes are simplified with on-chip synchronous self-timed Write circuitry. Three synchronous Chip Selects (CE1, CE2, CE3) and an asynchronous Output Enable (OE) provide for easy bank selection and output tri-state control. ADSP is ignored if CE1 is HIGH. Single Read Accesses This access is initiated when the following conditions are satisfied at clock rise: (1) ADSP or ADSC is asserted LOW, (2) CE1, CE2, CE3 are all asserted active, and (3) the Write signals (GW, BWE) are all deserted HIGH. ADSP is ignored if CE1 is Document Number: 001-70167 Rev. *E HIGH. The address presented to the address inputs (A) is stored into the address advancement logic and the Address Register while being presented to the memory array. The corresponding data is allowed to propagate to the input of the Output Registers. At the rising edge of the next clock the data is allowed to propagate through the output register and onto the data bus within 2.6 ns (250-MHz device) if OE is active LOW. The only exception occurs when the SRAM is emerging from a deselected state to a selected state, its outputs are always tri-stated during the first cycle of the access. After the first cycle of the access, the outputs are controlled by the OE signal. Consecutive single Read cycles are supported. Once the SRAM is deselected at clock rise by the chip select and either ADSP or ADSC signals, its output will tri-state immediately. Single Write Accesses Initiated by ADSP This access is initiated when both of the following conditions are satisfied at clock rise: (1) ADSP is asserted LOW, and (2) CE1, CE2, CE3 are all asserted active. The address presented to A is loaded into the address register and the address advancement logic while being delivered to the memory array. The Write signals (GW, BWE, and BWX) and ADV inputs are ignored during this first cycle. ADSP-triggered Write accesses require two clock cycles to complete. If GW is asserted LOW on the second clock rise, the data presented to the DQs inputs is written into the corresponding address location in the memory array. If GW is HIGH, then the Write operation is controlled by BWE and BWX signals. The CY7C1440AV25/CY7C1446AV25 provides Byte Write capability that is described in the Write Cycle Descriptions table. Asserting the Byte Write Enable input (BWE) with the selected Byte Write (BWX) input, will selectively write to only the desired bytes. Bytes not selected during a Byte Write operation will Page 8 of 33 CY7C1440AV25 CY7C1446AV25 remain unaltered. A synchronous self-timed Write mechanism has been provided to simplify the Write operations. Because CY7C1440AV25/CY7C1446AV25 is a common I/O device, the Output Enable (OE) must be deasserted HIGH before presenting data to the DQs inputs. Doing so will tri-state the output drivers. As a safety precaution, DQs are automatically tri-stated whenever a Write cycle is detected, regardless of the state of OE. Single Write Accesses Initiated by ADSC ADSC Write accesses are initiated when the following conditions are satisfied: (1) ADSC is asserted LOW, (2) ADSP is deserted HIGH, (3) CE1, CE2, CE3 are all asserted active, and (4) the appropriate combination of the Write inputs (GW, BWE, and BWX) are asserted active to conduct a Write to the desired byte(s). ADSC-triggered Write accesses require a single clock cycle to complete. The address presented to A is loaded into the address register and the address advancement logic while being delivered to the memory array. The ADV input is ignored during this cycle. If a global Write is conducted, the data presented to the DQs is written into the corresponding address location in the memory core. If a Byte Write is conducted, only the selected bytes are written. Bytes not selected during a Byte Write operation will remain unaltered. A synchronous self-timed Write mechanism has been provided to simplify the Write operations. Because CY7C1440AV25/CY7C1446AV25 is a common I/O device, the Output Enable (OE) must be deasserted HIGH before presenting data to the DQs inputs. Doing so will tri-state the output drivers. As a safety precaution, DQs are automatically tri-stated whenever a Write cycle is detected, regardless of the state of OE. Burst Sequences Asserting ADV LOW at clock rise will automatically increment the burst counter to the next address in the burst sequence. Both Read and Write burst operations are supported. Sleep Mode The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation “sleep” mode. Two clock cycles are required to enter into or exit from this “sleep” mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the “sleep” mode are not considered valid nor is the completion of the operation guaranteed. The device must be deselected prior to entering the “sleep” mode. CE1, CE2, CE3, ADSP, and ADSC must remain inactive for the duration of tZZREC after the ZZ input returns LOW. Interleaved Burst Address Table (MODE = Floating or VDD) First Address A1:A0 Second Address A1:A0 Third Address A1:A0 Fourth Address A1:A0 00 01 10 11 01 00 11 10 10 11 00 01 11 10 01 00 Fourth Address A1:A0 Linear Burst Address Table (MODE = GND) The CY7C1440AV25/CY7C1446AV25 provides a two-bit wraparound counter, fed by A1:A0, that implements either an interleaved or linear burst sequence. The interleaved burst sequence is designed specifically to support Intel Pentium applications. The linear burst sequence is designed to support processors that follow a linear burst sequence. The burst sequence is user selectable through the MODE input. First Address A1:A0 Second Address A1:A0 Third Address A1:A0 00 01 10 11 01 10 11 00 10 11 00 01 11 00 01 10 ZZ Mode Electrical Characteristics Parameter Description Test Conditions Min Max Unit IDDZZ Sleep mode standby current ZZ > VDD– 0.2 V – 100 mA tZZS Device operation to ZZ ZZ > VDD – 0.2 V – 2tCYC ns tZZREC ZZ recovery time ZZ < 0.2 V 2tCYC – ns tZZI ZZ Active to sleep current This parameter is sampled – 2tCYC ns tRZZI ZZ Inactive to exit sleep current This parameter is sampled 0 – ns Document Number: 001-70167 Rev. *E Page 9 of 33 CY7C1440AV25 CY7C1446AV25 Truth Table The truth table for CY7C1440AV25/CY7C1446AV25 follows. [1, 2, 3, 4, 5, 6] Operation Address Used CE1 CE2 CE3 ZZ ADSP ADSC ADV WRITE OE CLK DQ Deselect Cycle, Power Down None H X X L X L X X X L–H Tri-State Deselect Cycle, Power Down None L L X L L X X X X L–H Tri-State Deselect Cycle, Power Down None L X H L L X X X X L–H Tri-State Deselect Cycle, Power Down None L L X L H L X X X L–H Tri-State L–H Tri-State Deselect Cycle, Power Down None L X H L H L X X X Sleep Mode, Power Down None X X X H X X X X X X Tri-State READ Cycle, Begin Burst External L H L L L X X X L L–H Q READ Cycle, Begin Burst External L H L L L X X X H L–H Tri-State WRITE Cycle, Begin Burst External L H L L H L X L X L–H D READ Cycle, Begin Burst External L H L L H L X H L L–H Q READ Cycle, Begin Burst External L H L L H L X H H L–H Tri-State Next X X X L H H L H L L–H READ Cycle, Continue Burst Q READ Cycle, Continue Burst Next X X X L H H L H H L–H Tri-State READ Cycle, Continue Burst Next H X X L X H L H L L–H READ Cycle, Continue Burst Next H X X L X H L H H L–H Tri-State WRITE Cycle, Continue Burst Next X X X L H H L L X L–H D WRITE Cycle, Continue Burst Next H X X L X H L L X L–H D READ Cycle, Suspend Burst Current X X X L H H H H L L–H Q READ Cycle, Suspend Burst Current X X X L H H H H H L–H Tri-State READ Cycle, Suspend Burst Current H X X L X H H H L L–H READ Cycle, Suspend Burst Current H X X L X H H H H L–H Tri-State WRITE Cycle, Suspend Burst Current X X X L H H H L X L–H D WRITE Cycle, Suspend Burst Current H X X L X H H L X L–H D Q Q Notes 1. X = “Don't Care.” H = Logic HIGH, L = Logic LOW. 2. WRITE = L when any one or more Byte Write enable signals and BWE = L or GW = L. WRITE = H when all Byte write enable signals, BWE, GW = H. 3. The DQ pins are controlled by the current cycle and the OE signal. OE is asynchronous and is not sampled with the clock. 4. BGA package has only two chip selects CE1 and CE2. 5. The SRAM always initiates a read cycle when ADSP is asserted, regardless of the state of GW, BWE, or BWX. Writes may occur only on subsequent clocks after the ADSP or with the assertion of ADSC. As a result, OE must be driven HIGH prior to the start of the write cycle to allow the outputs to tri-state. OE is a don't care for the remainder of the write cycle. 6. OE is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles. During a read cycle all data bits are Tri-State when OE is inactive or when the device is deselected, and all data bits behave as output when OE is active (LOW). Document Number: 001-70167 Rev. *E Page 10 of 33 CY7C1440AV25 CY7C1446AV25 Truth Table for Read/Write The Truth Table for Read/Write for CY7C1440AV25 follows. [7, 8, 9] Function (CY7C1440AV25) GW BWE BWD BWC BWB BWA Read H H X X X X Read H L H H H H Write Byte A – (DQA and DQPA) H L H H H L Write Byte B – (DQB and DQPB) H L H H L H Write Bytes B, A H L H H L L Write Byte C – (DQC and DQPC) H L H L H H Write Bytes C, A H L H L H L Write Bytes C, B H L H L L H Write Bytes C, B, A H L H L L L Write Byte D – (DQD and DQPD) H L L H H H Write Bytes D, A H L L H H L Write Bytes D, B H L L H L H Write Bytes D, B, A H L L H L L Write Bytes D, C H L L L H H Write Bytes D, C, A H L L L H L Write Bytes D, C, B H L L L L H Write All Bytes H L L L L L Write All Bytes L X X X X X Truth Table for Read/Write The Truth Table for Read/Write for CY7C1446AV25 follows. [7, 8, 9] Function (CY7C1446AV25) GW BWE BWx Read H H X Read H L All BW = H Write Byte x – (DQx and DQPx) H L L Write All Bytes H L All BW = L Notes 7. The DQ pins are controlled by the current cycle and the OE signal. OE is asynchronous and is not sampled with the clock. 8. BWx represents any byte write signal. To enable any byte write BWx, a Logic LOW signal should be applied at clock rise. Any number of bye writes can be enabled at the same time for any given write. 9. Table only lists a partial listing of the byte write combinations. Any combination of BWX is valid. Appropriate write will be done based on which byte write is active. Document Number: 001-70167 Rev. *E Page 11 of 33 CY7C1440AV25 CY7C1446AV25 IEEE 1149.1 Serial Boundary Scan (JTAG) The CY7C1440AV25/CY7C1446AV25 incorporates a serial boundary scan test access port (TAP). This part is fully compliant with IEEE Standard 1149.1.The TAP operates using JEDEC-standard 2.5 V I/O logic level. The CY7C1440AV25/CY7C1446AV25 contains a TAP controller, instruction register, boundary scan register, bypass register, and ID register. Disabling the JTAG Feature It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW(VSS) to prevent clocking of the device. TDI and TMS are internally pulled up and may be unconnected. They may alternately be connected to VDD through a pull-up resistor. TDO should be left unconnected. Upon power-up, the device will come up in a reset state which will not interfere with the operation of the device. Test Access Port (TAP) Test Clock (TCK) The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK. Test Mode Select (TMS) The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. It is allowable to leave this ball unconnected if the TAP is not used. The ball is pulled up internally, resulting in a logic HIGH level. Test Data-In (TDI) The TDI ball is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. For information on loading the instruction register, see TAP Controller State Diagram on page 14. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the most significant bit (MSB) of any register. Test Data-Out (TDO) The TDO output ball is used to serially clock data-out from the registers. The output is active depending upon the current state of the TAP state machine (see Instruction Codes on page 18). The output changes on the falling edge of TCK. TDO is connected to the least significant bit (LSB) of any register. Performing a TAP Reset A RESET is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This RESET does not affect the operation of the SRAM and may be performed while the SRAM is operating. At power-up, the TAP is reset internally to ensure that TDO comes up in a High Z state. TAP Registers Registers are connected between the TDI and TDO balls and allow data to be scanned into and out of the SRAM test circuitry. Document Number: 001-70167 Rev. *E Only one register can be selected at a time through the instruction register. Data is serially loaded into the TDI ball on the rising edge of TCK. Data is output on the TDO ball on the falling edge of TCK. Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the TDI and TDO balls as shown in the TAP Controller Block Diagram on page 15. Upon power-up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as described in the previous section. When the TAP controller is in the Capture-IR state, the two least significant bits are loaded with a binary “01” pattern to allow for fault isolation of the board-level serial test data path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain chips. The bypass register is a single-bit register that can be placed between the TDI and TDO balls. This allows data to be shifted through the SRAM with minimal delay. The bypass register is set LOW (VSS) when the BYPASS instruction is executed. Boundary Scan Register The boundary scan register is connected to all the input and bidirectional balls on the SRAM. The boundary scan register is loaded with the contents of the RAM I/O ring when the TAP controller is in the Capture-DR state and is then placed between the TDI and TDO balls when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD and SAMPLE Z instructions can be used to capture the contents of the I/O ring. The Boundary Scan Order on page 19 and Boundary Scan Order on page 20 show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI, and the LSB is connected to TDO. Identification (ID) Register The ID register is loaded with a vendor-specific, 32-bit code during the Capture-DR state when the IDCODE command is loaded in the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has a vendor code and other information described in the Identification Register Definitions on page 18. TAP Instruction Set Overview Eight different instructions are possible with the three bit instruction register. All combinations are listed in the Instruction Codes on page 18. Three of these instructions are listed as RESERVED and should not be used. The other five instructions are described in detail below. Instructions are loaded into the TAP controller during the Shift-IR state when the instruction register is placed between TDI and TDO. During this state, instructions are shifted through the Page 12 of 33 CY7C1440AV25 CY7C1446AV25 instruction register through the TDI and TDO balls. To execute the instruction once it is shifted in, the TAP controller needs to be moved into the Update-IR state. Once the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO pins. IDCODE PRELOAD allows an initial data pattern to be placed at the latched parallel outputs of the boundary scan register cells prior to the selection of another boundary scan test operation. The IDCODE instruction causes a vendor-specific, 32-bit code to be loaded into the instruction register. It also places the instruction register between the TDI and TDO balls and allows the IDCODE to be shifted out of the device when the TAP controller enters the Shift-DR state. The IDCODE instruction is loaded into the instruction register upon power-up or whenever the TAP controller is given a test logic reset state. SAMPLE Z The SAMPLE Z instruction causes the boundary scan register to be connected between the TDI and TDO pins when the TAP controller is in a Shift-DR state. The SAMPLE Z command puts the output bus into a High Z state until the next command is given during the “Update IR” state. SAMPLE/PRELOAD SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When the SAMPLE/PRELOAD instructions are loaded into the instruction register and the TAP controller is in the Capture-DR state, a snapshot of data on the inputs and output pins is captured in the boundary scan register. The user must be aware that the TAP controller clock can only operate at a frequency up to 20 MHz, while the SRAM clock operates more than an order of magnitude faster. Because there is a large difference in the clock frequencies, it is possible that during the Capture-DR state, an input or output will undergo a transition. The TAP may then try to capture a signal while in transition (metastable state). This will not harm the device, but there is no guarantee as to the value that will be captured. Repeatable results may not be possible. To guarantee that the boundary scan register will capture the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller’s capture set-up plus hold times (tCS and tCH). The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE/PRELOAD instruction. If this is an issue, it is still possible to capture all other signals and simply ignore the value of the CK and CK# captured in the boundary scan register. The shifting of data for the SAMPLE and PRELOAD phases can occur concurrently when required — that is, while data captured is shifted out, the preloaded data can be shifted in. BYPASS When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO pins. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. EXTEST The EXTEST instruction enables the preloaded data to be driven out through the system output pins. This instruction also selects the boundary scan register to be connected for serial access between the TDI and TDO in the shift-DR controller state. EXTEST OUTPUT BUS TRI-STATE IEEE Standard 1149.1 mandates that the TAP controller be able to put the output bus into a tri-state mode. The boundary scan register has a special bit located at bit #89 (for 165-ball FBGA package) or bit #138 (for 209-ball FBGA package). When this scan cell, called the “extest output bus tri-state”, is latched into the preload register during the “Update-DR” state in the TAP controller, it will directly control the state of the output (Q-bus) pins, when the EXTEST is entered as the current instruction. When HIGH, it will enable the output buffers to drive the output bus. When LOW, this bit will place the output bus into a High Z condition. This bit can be set by entering the SAMPLE/PRELOAD or EXTEST command, and then shifting the desired bit into that cell, during the “Shift-DR” state. During “Update-DR”, the value loaded into that shift-register cell will latch into the preload register. When the EXTEST instruction is entered, this bit will directly control the output Q-bus pins. Note that this bit is pre-set HIGH to enable the output when the device is powered-up, and also when the TAP controller is in the “Test-Logic-Reset” state. Reserved These instructions are not implemented but are reserved for future use. Do not use these instructions. Document Number: 001-70167 Rev. *E Page 13 of 33 CY7C1440AV25 CY7C1446AV25 TAP Controller State Diagram The 0/1 next to each state represents the value of TMS at the rising edge of TCK. 1 TEST-LOGIC RESET 0 0 RUN-TEST/ IDLE 1 SELECT DR-SCAN 1 SELECT IR-SCAN 0 1 0 1 CAPTURE-DR CAPTURE-IR 0 0 SHIFT-DR 0 SHIFT-IR 1 1 EXIT1-IR 0 0 PAUSE-IR 1 0 1 EXIT2-DR 0 EXIT2-IR 1 1 UPDATE-DR Document Number: 001-70167 Rev. *E 1 0 PAUSE-DR 1 0 1 EXIT1-DR 0 1 0 UPDATE-IR 1 0 Page 14 of 33 CY7C1440AV25 CY7C1446AV25 TAP Controller Block Diagram 0 Bypass Register 2 1 0 TDI Selection Circuitry Instruction Register 31 30 29 . . Selection Circuitry . 2 1 0 TDO Identification Register x . . . . . 2 1 0 Boundary Scan Register TCK TMS TAP CONTROLLER TAP Timing Figure 3. TAP Timing 1 2 Test Clock (TCK) 3 tTH tTMSS tTMSH tTDIS tTDIH t TL 4 5 6 tCYC Test Mode Select (TMS) Test Data-In (TDI) tTDOV tTDOX Test Data-Out (TDO) DON’T CARE Document Number: 001-70167 Rev. *E UNDEFINED Page 15 of 33 CY7C1440AV25 CY7C1446AV25 TAP AC Switching Characteristics Over the Operating Range Parameter [10, 11] Description Min Max Unit Clock tTCYC TCK Clock Cycle Time 50 – ns tTF TCK Clock Frequency – 20 MHz tTH TCK Clock HIGH time 20 – ns tTL TCK Clock LOW time 20 – ns tTDOV TCK Clock LOW to TDO Valid – 10 ns tTDOX TCK Clock LOW to TDO Invalid 0 – ns tTMSS TMS Set-up to TCK Clock Rise 5 – ns tTDIS TDI Set-up to TCK Clock Rise 5 – ns tCS Capture Set-up to TCK Rise 5 tTMSH TMS Hold after TCK Clock Rise 5 – ns tTDIH TDI Hold after Clock Rise 5 – ns tCH Capture Hold after Clock Rise 5 – ns Output Times Set-up Times ns Hold Times Notes 10. tCS and tCH refer to the set-up and hold time requirements of latching data from the boundary scan register. 11. Test conditions are specified using the load in TAP AC test Conditions. tR/tF = 1 ns. Document Number: 001-70167 Rev. *E Page 16 of 33 CY7C1440AV25 CY7C1446AV25 2.5 V TAP AC Test Conditions 2.5 V TAP AC Output Load Equivalent 1.25V Input pulse levels ...............................................VSS to 2.5 V Input rise and fall time ....................................................1 ns 50Ω Input timing reference levels ....................................... 1.25 V Output reference levels .............................................. 1.25 V TDO Test load termination supply voltage .......................... 1.25 V Z O= 50Ω 20pF TAP DC Electrical Characteristics and Operating Conditions (0 °C < TA < +70 °C; VDD = 2.5 V ± 0.125 V unless otherwise noted) Parameter [12] Min Max Unit VOH1 Output HIGH Voltage Description IOH = –1.0 mA Test Conditions VDDQ = 2.5 V 2.0 – V VOH2 Output HIGH Voltage IOH = –100 µA VDDQ = 2.5 V 2.1 – V VOL1 Output LOW Voltage IOL = 1.0 mA VDDQ = 2.5 V – 0.4 V VOL2 Output LOW Voltage IOL = 100 µA VDDQ = 2.5 V – 0.2 V VIH Input HIGH Voltage VDDQ = 2.5 V 1.7 VDD + 0.3 V VIL Input LOW Voltage VDDQ = 2.5 V –0.3 0.7 V IX Input Load Current –5 5 µA GND < VIN < VDDQ Note 12. All voltages referenced to VSS (GND). Document Number: 001-70167 Rev. *E Page 17 of 33 CY7C1440AV25 CY7C1446AV25 Identification Register Definitions CY7C1440AV25 (1 M × 36) Instruction Field Revision Number (31:29) CY7C1446AV25 (512 K × 72) Description 000 000 01011 01011 Architecture/Memory Type (23:18) 000000 000000 Defines memory type and architecture Bus Width/Density (17:12) 100111 110111 Defines width and density 00000110100 00000110100 1 1 Device Depth (28:24) Cypress JEDEC ID Code (11:1) ID Register Presence Indicator (0) Describes the version number. Reserved for Internal Use Allows unique identification of SRAM vendor. Indicates the presence of an ID register. Scan Register Sizes Register Name Instruction Bit Size (× 36) Bit Size (× 72) 3 3 Bypass 1 1 ID 32 32 Boundary Scan Order (165-ball FBGA package) 89 – Boundary Scan Order (209-ball FBGA package) – 138 Instruction Codes Instruction Code Description EXTEST 000 Captures I/O ring contents. IDCODE 001 Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operations. SAMPLE Z 010 Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a High Z state. RESERVED 011 Do Not Use: This instruction is reserved for future use. SAMPLE/PRELOAD 100 Captures I/O ring contents. Places the boundary scan register between TDI and TDO. Does not affect SRAM operation. RESERVED 101 Do Not Use: This instruction is reserved for future use. RESERVED 110 Do Not Use: This instruction is reserved for future use. BYPASS 111 Places the bypass register between TDI and TDO. This operation does not affect SRAM operations. Document Number: 001-70167 Rev. *E Page 18 of 33 CY7C1440AV25 CY7C1446AV25 Boundary Scan Order 165-ball FBGA [13, 14] CY7C1440AV25 (1 M × 36) Bit # Ball ID Bit # Ball ID Bit # Ball ID Bit # Ball ID 1 N6 26 E11 51 A3 76 N1 2 N7 N10 27 D11 52 A2 77 N2 3 28 G10 53 B2 78 P1 4 P11 29 F10 54 C2 79 R1 5 P8 30 E10 55 B1 80 R2 6 R8 31 D10 56 A1 81 P3 7 R9 32 C11 57 C1 82 R3 8 P9 33 A11 58 D1 83 P2 9 P10 34 B11 59 E1 84 R4 10 R10 35 A10 60 F1 85 P4 11 R11 36 B10 61 G1 86 N5 12 H11 37 A9 62 D2 87 P6 13 N11 38 B9 63 E2 88 R6 14 M11 39 C10 64 F2 89 Internal 15 L11 40 A8 65 G2 16 K11 41 B8 66 H1 17 J11 42 A7 67 H3 18 M10 43 B7 68 J1 19 L10 44 B6 69 K1 20 K10 45 A6 70 L1 21 J10 46 B5 71 M1 22 H9 47 J2 H10 48 A5 A4 72 23 73 K2 24 G11 49 B4 74 L2 25 F11 50 B3 75 M2 Notes 13. Balls which are NC (No Connect) are Pre-Set LOW. 14. Bit# 89 is Pre-Set HIGH. Document Number: 001-70167 Rev. *E Page 19 of 33 CY7C1440AV25 CY7C1446AV25 Boundary Scan Order 209-ball FBGA [15, 16] CY7C1446AV25 (512 K × 72) Bit # Ball ID Bit # Ball ID Bit # 1 W6 36 F6 71 Ball ID Bit # Ball ID K3 72 H6 C6 106 2 V6 U6 37 K8 3 38 K9 107 K4 73 B6 108 K6 4 W7 39 5 V7 40 K10 74 A6 109 K2 J11 75 A5 110 L2 6 U7 41 J10 76 B5 111 L1 7 T7 42 H11 77 C5 112 M2 8 V8 43 H10 78 D5 113 M1 9 U8 44 G11 79 D4 114 N2 10 T8 45 G10 80 C4 115 N1 11 V9 46 F11 81 A4 116 P2 12 U9 47 F10 82 B4 117 P1 13 P6 48 E10 83 C3 118 R2 14 W11 49 E11 84 B3 119 R1 15 W10 50 D11 85 A3 120 T2 16 V11 51 D10 86 A2 121 T1 17 V10 52 C11 87 A1 122 U2 18 U11 53 C10 88 B2 123 U1 19 U10 54 B11 89 B1 124 V2 20 T11 55 B10 90 C2 125 V1 21 T10 56 A11 91 C1 126 W2 22 R11 57 A10 92 D2 127 W1 23 R10 58 C9 93 D1 128 T6 24 P11 59 B9 94 E1 129 U3 25 P10 60 A9 95 E2 130 V3 26 N11 61 D7 96 F2 131 T4 27 N10 62 C8 97 F1 132 T5 28 M11 63 B8 98 G1 133 U4 29 M10 64 A8 99 G2 134 V4 30 L11 65 D8 100 H2 135 5W 31 L10 66 C7 101 H1 136 5V 32 K11 67 B7 102 J2 137 5U 33 M6 68 A7 103 J1 138 Internal 34 L6 69 D6 104 K1 35 J6 70 G6 105 N6 Notes 15. Balls which are NC (No Connect) are Pre-Set LOW. 16. Bit# 138 is Pre-Set HIGH. Document Number: 001-70167 Rev. *E Page 20 of 33 CY7C1440AV25 CY7C1446AV25 Maximum Ratings DC Input Voltage ................................ –0.5 V to VDD + 0.5 V Exceeding maximum ratings may impair the useful life of the device. These user guidelines are not tested. Storage Temperature ............................... –65 °C to +150 °C Ambient Temperature with Power Applied .................................. –55 °C to +125 °C Current into Outputs (LOW) ........................................ 20 mA Static Discharge Voltage (per MIL-STD-883, Method 3015) ......................... > 2001 V Latch-up Current ................................................... > 200 mA Operating Range Supply Voltage on VDD Relative to GND .....–0.3 V to +3.6 V Supply Voltage on VDDQ Relative to GND .... –0.3 V to +VDD Range Ambient Temperature VDD VDDQ DC Voltage Applied to Outputs in Tri-State ........................................–0.5 V to VDDQ + 0.5 V Commercial 0 °C to +70 °C 2.5 V+ 5% 1.7 V to VDD Industrial –40 °C to +85 °C Electrical Characteristics Over the Operating Range DC Electrical Characteristics Over the Operating Range Parameter [17, 18] Description Test Conditions Min Max Unit 2.375 2.625 V 2.375 2.625 V 2.0 – V – 0.4 V for 2.5 V I/O 1.7 VDD + 0.3 V for 2.5 V I/O –0.3 0.7 V VDD Power Supply Voltage VDDQ I/O Supply Voltage for 2.5 V I/O VOH Output HIGH Voltage for 2.5 V I/O, IOH = –1.0 mA VOL Output LOW Voltage for 2.5 V I/O, IOL = 1.0 mA Voltage[17] VIH Input HIGH VIL Input LOW Voltage[17] IX Input Leakage Current except ZZ GND  VI  VDDQ and MODE –5 5 A Input Current of MODE Input = VSS –30 – A Input = VDD – 5 A Input = VSS –5 – A Input = VDD – 30 A Input Current of ZZ IOZ Output Leakage Current GND  VI  VDDQ, Output Disabled –5 5 A IDD VDD Operating Supply Current VDD = Max, IOUT = 0 mA, f = fMAX = 1/tCYC – 435 mA 335 mA 4-ns cycle, 250 MHz 6-ns cycle, 167 MHz ISB1 Automatic CE Power-down Current – TTL Inputs VDD = Max, Device Deselected, VIN  VIH or VIN  VIL, f = fMAX = 1/tCYC All speeds – 185 mA ISB2 Automatic CE Power-down Current – CMOS Inputs VDD = Max, Device Deselected, All speeds VIN  0.3 V or VIN > VDDQ – 0.3 V, f=0 – 120 mA ISB3 Automatic CE Power-down Current – CMOS Inputs VDD = Max, Device Deselected, All speeds VIN  0.3 V or VIN > VDDQ – 0.3 V, f = fMAX = 1/tCYC – 160 mA ISB4 Automatic CE Power-down Current – TTL Inputs VDD = Max, Device Deselected, VIN  VIH or VIN  VIL, f = 0 – 135 mA All speeds Notes 17. Overshoot: VIH(AC) < VDD + 1.5 V (Pulse width less than tCYC/2), undershoot: VIL(AC) > –2 V (Pulse width less than tCYC/2). 18. TPower-up: Assumes a linear ramp from 0 V to VDD(min) within 200 ms. During this time VIH < VDD and VDDQ < VDD. Document Number: 001-70167 Rev. *E Page 21 of 33 CY7C1440AV25 CY7C1446AV25 Capacitance Parameter [19] Description 165-ball FBGA 209-ball FBGA Unit Max Max Test Conditions CIN Input Capacitance 7 5 pF CCLK Clock Input Capacitance 7 5 pF CI/O Input/Output Capacitance 6 7 pF TA = 25 °C, f = 1 MHz, VDD/VDDQ = 2.5 V Thermal Resistance Parameter [19] Description JA Thermal resistance (junction to ambient) JC Thermal resistance (junction to case) 165-ball FBGA 209-ball FBGA Unit Package Package Test Conditions Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA/JESD51. 20.8 25.31 °C/W 3.2 4.48 °C/W AC Test Loads and Waveforms Figure 4. AC Test Loads and Waveforms 2.5 V I/O Test Load R = 1667  2.5 V OUTPUT OUTPUT RL = 50  Z0 = 50  VT = 1.25 V (a) ALL INPUT PULSES VDDQ GND 5 pF INCLUDING JIG AND SCOPE R = 1538  (b) 10% 90% 10% 90%  1 ns  1 ns (c) Note 19. Tested initially and after any design or process change that may affect these parameters. Document Number: 001-70167 Rev. *E Page 22 of 33 CY7C1440AV25 CY7C1446AV25 Switching Characteristics Over the Operating Range Parameter [20, 21] tPOWER Description VDD(typical) to the first Access[22] -250 -167 Unit Min Max Min Max 1 – 1 – ms Clock tCYC Clock Cycle Time 4.0 – 6.0 – ns tCH Clock HIGH 1.5 – 2.4 – ns tCL Clock LOW 1.5 – 2.4 – ns Output Times tCO Data Output Valid After CLK Rise – 2.6 – 3.4 ns tDOH Data Output Hold After CLK Rise 1.0 – 1.5 – ns 1.0 – 1.5 – ns – 2.6 – 3.4 ns – 2.6 – 3.4 ns 0 – 0 – ns – 2.6 – 3.4 ns [23, 24, 25] tCLZ Clock to Low Z tCHZ Clock to High Z [23, 24, 25] tOEV OE LOW to Output Valid tOELZ tOEHZ OE LOW to Output Low Z [23, 24, 25] OE HIGH to Output High Z [23, 24, 25] Set-up Times tAS Address Set-up Before CLK Rise 1.2 – 1.5 – ns tADS ADSC, ADSP Set-up Before CLK Rise 1.2 – 1.5 – ns tADVS ADV Set-up Before CLK Rise 1.2 – 1.5 – ns tWES GW, BWE, BWX Set-up Before CLK Rise 1.2 – 1.5 – ns tDS Data Input Set-up Before CLK Rise 1.2 – 1.5 – ns tCES Chip Enable Set-Up Before CLK Rise 1.2 – 1.5 – ns tAH Address Hold After CLK Rise 0.3 – 0.5 – ns tADH ADSP, ADSC Hold After CLK Rise 0.3 – 0.5 – ns tADVH ADV Hold After CLK Rise 0.3 – 0.5 – ns tWEH GW, BWE, BWX Hold After CLK Rise 0.3 – 0.5 – ns tDH Data Input Hold After CLK Rise 0.3 – 0.5 – ns tCEH Chip Enable Hold After CLK Rise 0.3 – 0.5 – ns Hold Times Notes 20. Timing reference level is 1.25 V when VDDQ = 2.5 V. 21. Test conditions shown in (a) of Figure 4 on page 22 unless otherwise noted. 22. This part has a voltage regulator internally; tPOWER is the time that the power needs to be supplied above VDD(minimum) initially before a read or write operation can be initiated. 23. tCHZ, tCLZ,tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of Figure 4 on page 22. Transition is measured ± 200 mV from steady-state voltage. 24. At any given voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve High Z prior to Low Z under the same system conditions. 25. This parameter is sampled and not 100% tested. Document Number: 001-70167 Rev. *E Page 23 of 33 CY7C1440AV25 CY7C1446AV25 Switching Waveforms Figure 5. Read Cycle Timing [26] t CYC CLK t CH t ADS t CL t ADH ADSP tADS tADH ADSC tAS tAH A1 ADDRESS A2 tWES A3 Burst continued with new base address tWEH GW, BWE, BWx tCES Deselect cycle tCEH CE tADVS tADVH ADV ADV suspends burst. OE t OEHZ t CLZ Data Out (Q) High-Z Q(A1) tOEV tCO t OELZ tDOH Q(A2) t CHZ Q(A2 + 1) Q(A2 + 2) Q(A2 + 3) Q(A2) Q(A2 + 1) t CO Burst wraps around to its initial state Single READ BURST READ DON’T CARE UNDEFINED Note 26. On this diagram, when CE is LOW: CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH: CE1 is HIGH or CE2 is LOW or CE3 is HIGH. Document Number: 001-70167 Rev. *E Page 24 of 33 CY7C1440AV25 CY7C1446AV25 Switching Waveforms (continued) Figure 6. Write Cycle Timing [27, 28] t CYC CLK tCH tADS tCL tADH ADSP tADS ADSC extends burst tADH tADS tADH ADSC tAS tAH A1 ADDRESS A2 A3 Byte write signals are ignored for first cycle when ADSP initiates burst tWES tWEH BWE, BWX tWES tWEH GW tCES tCEH CE t t ADVS ADVH ADV ADV suspends burst OE tDS Data In (D) High-Z t OEHZ tDH D(A1) D(A2) D(A2 + 1) D(A2 + 1) D(A2 + 2) D(A2 + 3) D(A3) D(A3 + 1) D(A3 + 2) Data Out (Q) BURST READ Single WRITE BURST WRITE Extended BURST WRITE Notes 27. On this diagram, when CE is LOW: CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH: CE1 is HIGH or CE2 is LOW or CE3 is HIGH. 28. Full width write can be initiated by either GW LOW; or by GW HIGH, BWE LOW and BWX LOW. Document Number: 001-70167 Rev. *E Page 25 of 33 CY7C1440AV25 CY7C1446AV25 Switching Waveforms (continued) Figure 7. Read/Write Cycle Timing [29, 30, 31] tCYC CLK tCL tCH tADS tADH ADSP ADSC tAS ADDRESS A1 tAH A2 A3 A4 tWES tWEH tDS tDH A5 A6 D(A5) D(A6) BWE, BWX tCES tCEH CE ADV OE tCO tOELZ Data In (D) High-Z tCLZ Data Out (Q) High-Z Q(A1) tOEHZ D(A3) Q(A4) Q(A2) Back-to-Back READs Single WRITE Q(A4+1) BURST READ DON’T CARE Q(A4+2) Q(A4+3) Back-to-Back WRITEs UNDEFINED Notes 29. On this diagram, when CE is LOW: CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH: CE1 is HIGH or CE2 is LOW or CE3 is HIGH. 30. The data bus (Q) remains in high Z following a WRITE cycle, unless a new read access is initiated by ADSP or ADSC. 31. GW is HIGH. Document Number: 001-70167 Rev. *E Page 26 of 33 CY7C1440AV25 CY7C1446AV25 Switching Waveforms (continued) Figure 8. ZZ Mode Timing [32, 33] CLK t ZZ ZZ I t ZZREC t ZZI SUPPLY I DDZZ t RZZI ALL INPUTS (except ZZ) Outputs (Q) DESELECT or READ Only High-Z DON’T CARE Notes 32. Device must be deselected when entering ZZ mode. See Cycle Descriptions table for all possible signal conditions to deselect the device. 33. DQs are in high Z when exiting ZZ sleep mode. Document Number: 001-70167 Rev. *E Page 27 of 33 CY7C1440AV25 CY7C1446AV25 Ordering Information Not all of the speed, package and temperature ranges are available. Please contact your local sales representative or visit www.cypress.com for actual products offered. Speed (MHz) 250 167 Ordering Code Package Diagram Part and Package Type CY7C1440AV25-250BZXI 51-85195 165-ball FBGA (15 × 17 × 1.4mm) Pb-free CY7C1446AV25-250BGI 51-85167 209-ball FBGA (14 × 22 × 1.76mm) CY7C1440AV25-167BZXC 51-85195 165-ball FBGA (15 × 17 × 1.4mm) Pb-free Operating Range Industrial Commercial Ordering Code Definitions CY 7 C 144X A V25 - XXX XX X X Temperature range: X = C or I C = Commercial = 0 °C to +70 °C; I = Industrial = –40 °C to +85 °C Pb-free Package Type: XX = BZ or BG BZ = 165-ball FBGA; BG = 209-ball FBGA Speed grade: XXX = 250 or 167 MHz V25 = 2.5 V Process Technology: A = greater than or equal to 90 nm Part Identifier: 144X = 1440 or 1446 1440 = SCD 1 Mb × 36 (36 Mb); 1446 = SCD 512 K × 72 (36 MB) Technology Code: C = CMOS Marketing Code: 7 = SRAM Company ID: CY = Cypress Document Number: 001-70167 Rev. *E Page 28 of 33 CY7C1440AV25 CY7C1446AV25 Package Diagrams Figure 9. 165-ball FBGA (15 × 17 × 1.40 mm) (0.50 ball diameter) Package Outline, 51-85195 51-85195 *D Document Number: 001-70167 Rev. *E Page 29 of 33 CY7C1440AV25 CY7C1446AV25 Package Diagrams (continued) Figure 10. 209-ball FBGA (14 × 22 × 1.76 mm) BB209A Package Outline, 51-85167 51-85167 *C Document Number: 001-70167 Rev. *E Page 30 of 33 CY7C1440AV25 CY7C1446AV25 Acronyms Acronym Document Conventions Description Units of Measure CMOS Complementary Metal Oxide Semiconductor CE Chip Enable °C degree Celsius FBGA Fine-Pitch Ball Grid Array MHz megahertz I/O Input/Output µA microampere JTAG Joint Test Action Group µs microsecond LSB Least Significant Bit mA milliampere mm millimeter MSB Most Significant Bit OE Output Enable SRAM Static Random Access Memory TCK Test Clock TDI Test Data-In TDO Test Data-Out TMS Test Mode Select TTL Transistor-Transistor Logic WE Write Enable Document Number: 001-70167 Rev. *E Symbol Unit of Measure ms millisecond mV millivolt ns nanosecond % percent pF picofarad V volt W watt Page 31 of 33 CY7C1440AV25 CY7C1446AV25 Document History Page Document Title:CY7C1440AV25/CY7C1446AV25, 36-Mbit (1 M × 36/512 K × 72) Pipelined Sync SRAM Document Number: 001-70167 Rev. ECN No. Issue Date Orig. of Change ** 3281372 01/17/2012 NJY Description of Change New data sheet. *A 3508385 01/25/2012 NJY Changed status from Preliminary to Final. *B 4234753 01/07/2014 PRIT Updated Package Diagrams: Replaced spec 51-85165 with spec 51-85195. spec 51-85167 – Changed revision from *B to *C. Updated to new template. Completing Sunset Review. *C 4575228 11/20/2014 PRIT Updated Functional Description: Added “For a complete list of related documentation, click here.” at the end. *D 4905904 09/02/2015 PRIT Removed 1.8 V TAP AC Test Conditions. Removed 1.8 V TAP AC Output Load Equivalent. Updated TAP DC Electrical Characteristics and Operating Conditions: Removed details corresponding to Test Condition “VDDQ = 1.8 V” for all parameters. Updated Electrical Characteristics: Removed details corresponding to Test Condition “for 1.8 V I/O” for all parameters. Updated Package Diagrams: spec 51-85195 – Changed revision from *C to *D. Updated to new template. *E 5072691 01/05/2016 PRIT No technical updates. Completing Sunset Review. Document Number: 001-70167 Rev. *E Page 32 of 33 CY7C1440AV25 CY7C1446AV25 Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office closest to you, visit us at Cypress Locations. PSoC® Solutions Products Automotive Clocks & Buffers Interface Lighting & Power Control Memory PSoC Touch Sensing cypress.com/go/automotive cypress.com/go/clocks cypress.com/go/interface cypress.com/go/powerpsoc cypress.com/go/memory cypress.com/go/psoc cypress.com/go/touch USB Controllers Wireless/RF psoc.cypress.com/solutions PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP Cypress Developer Community Community | Forums | Blogs | Video | Training Technical Support cypress.com/go/support cypress.com/go/USB cypress.com/go/wireless © Cypress Semiconductor Corporation, 2012-2016. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. Document Number: 001-70167 Rev. *E Revised January 5, 2016 Page 33 of 33 i486 is a trademark, and Intel and Pentium are registered trademarks of Intel Corporation. PowerPC is a trademark of IBM Corporation. All products and company names mentioned in this document may be the trademarks of their respective holders.