CY7C1474BV25

CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 72-Mbit (2 M × 36/4 M × 18/1 M × 72) Pipelined SRAM with NoBL™ Architecture 72-Mbit (2 M × 36/4 M × 18/1 M × 72) Pipelined SRAM with NoBL™ Architecture Features ■ ■ Functional Description The CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 are 2.5 V, 2 M × 36/4 M × 18/1 M × 72 synchronous pipelined burst SRAMs with No Bus Latency™ (NoBL logic, respectively. They are designed to support unlimited true back-to-back read or write operations with no wait states. The CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 are equipped with the advanced (NoBL) logic required to enable consecutive read or write operations with data being transferred on every clock cycle. This feature dramatically improves the throughput of data in systems that require frequent read or write transitions. The CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 are pin-compatible and functionally equivalent to ZBT devices. All synchronous inputs pass through input registers controlled by the rising edge of the clock. All data outputs pass through output registers controlled by the rising edge of the clock. The clock input is qualified by the Clock Enable (CEN) signal, which when deasserted suspends operation and extends the previous clock cycle. Write operations are controlled by the Byte Write Selects (BWa–BWd for CY7C1470BV25, BWa–BWb for CY7C1472BV25, and BWa–BWh for CY7C1474BV25) and a Write Enable (WE) input. All writes are conducted with on-chip synchronous self-timed write circuitry. Three synchronous Chip Enables (CE1, CE2, CE3) and an asynchronous Output Enable (OE) provide for easy bank selection and output tri-state control. To avoid bus contention, the output drivers are synchronously tri-stated during the data portion of a write sequence. Pin-compatible and functionally equivalent to ZBT™ Supports 250 MHz bus operations with zero wait states ❐ Available speed grades are 250, 200, and 167 MHz Internally self-timed output buffer control to eliminate the need to use asynchronous OE Fully registered (inputs and outputs) for pipelined operation Byte Write capability Single 2.5 V power supply 2.5 V IO supply (VDDQ) Fast clock-to-output times ❐ 3.0 ns (for 250-MHz device) Clock Enable (CEN) pin to suspend operation Synchronous self-timed writes CY7C1470BV25, CY7C1472BV25 available in JEDEC-standard Pb-free 100-pin TQFP, Pb-free and non-Pb-free 165-ball FBGA package. CY7C1474BV25 available in Pb-free and non-Pb-free 209-ball FBGA package IEEE 1149.1 JTAG Boundary Scan compatible Burst capability—linear or interleaved burst order “ZZ” Sleep Mode option and Stop Clock option ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ Selection Guide Description Maximum Access Time Maximum Operating Current Maximum CMOS Standby Current 250 MHz 3.0 450 120 200 MHz 3.0 450 120 167 MHz 3.4 400 120 Unit ns mA mA Cypress Semiconductor Corporation Document Number: 001-15032 Rev. *I • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised May 17, 2011 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Logic Block Diagram – CY7C1470BV25 (2 M × 36) A0, A1, A MODE C LK C EN ADDRESS REGISTER 0 A1 A1' D1 Q1 A0 A0' BURST D0 Q0 LOGIC ADV/LD C C WRITE ADDRESS REGISTER 1 WRITE ADDRESS REGISTER 2 ADV/LD BW a BW b BW c BW d WE WRITE REGISTRY AND DATA COHERENCY CONTROL LOGIC WRITE DRIVERS MEMORY ARRAY S E N S E A M P S O U T P U T R E G I S T E R S D A T A S T E E R I N G O U T P U T B U F F E R S E DQ s DQ Pa DQ Pb DQ Pc DQ Pd E INPUT REGISTER 1 E INPUT REGISTER 0 E OE CE1 CE2 CE3 ZZ READ LOGIC SLEEP CONTROL Logic Block Diagram – CY7C1472BV25 (4 M × 18) A0, A1, A MODE C LK C EN ADDRESS REGISTER 0 A1 A1' D1 Q1 A0 A0' BURST D0 Q0 LOGIC ADV/LD C C WRITE ADDRESS REGISTER 1 WRITE ADDRESS REGISTER 2 ADV/LD BW a BW b WE WRITE REGISTRY AND DATA COHERENCY CONTROL LOGIC WRITE DRIVERS MEMORY ARRAY S E N S E A M P S O U T P U T R E G I S T E R S D A T A S T E E R I N G O U T P U T B U F F E R S DQ s DQ Pa DQ Pb E E INPUT REGISTER 1 E INPUT REGISTER 0 E OE CE1 CE2 CE3 ZZ READ LOGIC Sleep Control Document Number: 001-15032 Rev. *I Page 2 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Logic Block Diagram – CY7C1474BV25 (1 M × 72) A0, A1, A MODE CLK CEN ADDRESS REGISTER 0 A1 A1' D1 Q1 A0 A0' BURST D0 Q0 LOGIC ADV/LD C C WRITE ADDRESS REGISTER 1 WRITE ADDRESS REGISTER 2 ADV/LD BW a BW b BW c BW d BW e BW f BW g BW h WRITE REGISTRY AND DATA COHERENCY CONTROL LOGIC WRITE DRIVERS MEMORY ARRAY S E N S E A M P S O U T P U T R E G I S T E R S D A T A S T E E R I N G O U T P U T B U F F E R S E E DQ s DQ Pa DQ Pb DQ Pc DQ Pd DQ Pe DQ Pf DQ Pg DQ Ph WE INPUT REGISTER 1 E INPUT REGISTER 0 E OE CE1 CE2 CE3 ZZ READ LOGIC Sleep Control Document Number: 001-15032 Rev. *I Page 3 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Contents Pin Configurations ........................................................... 5 Pin Definitions .................................................................. 7 Functional Overview ........................................................ 8 Single Read Accesses ................................................ 8 Burst Read Accesses .................................................. 8 Single Write Accesses ................................................. 8 Burst Write Accesses .................................................. 9 Sleep Mode ................................................................. 9 Linear Burst Address Table (MODE = GND) .................. 9 Interleaved Burst Address Table (MODE = Floating or VDD) ............................................... 9 ZZ Mode Electrical Characteristics ................................. 9 Truth Table ...................................................................... 10 Partial Write Cycle Description ..................................... 11 IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 12 Disabling the JTAG Feature ...................................... 12 TAP Controller State Diagram ....................................... 12 Test Access Port (TAP) ............................................. 12 TAP Controller Block Diagram ...................................... 12 Performing a TAP RESET ......................................... 12 TAP Registers ........................................................... 12 TAP Instruction Set ................................................... 13 TAP Timing ...................................................................... 14 TAP AC Switching Characteristics ............................... 15 2.5 V TAP AC Test Conditions ....................................... 16 2.5 V TAP AC Output Load Equivalent ......................... 16 TAP DC Electrical Characteristics and Operating Conditions ..................................................... 16 Identification Register Definitions ................................ 16 Scan Register Sizes ....................................................... 16 Identification Codes ....................................................... 17 Boundary Scan Exit Order (2 M × 36) ........................... 17 Boundary Scan Exit Order (4 M × 18) ........................... 18 Boundary Scan Exit Order (1 M × 72) ........................... 18 Maximum Ratings ........................................................... 19 Operating Range ............................................................. 19 Electrical Characteristics ............................................... 19 Capacitance .................................................................... 20 Thermal Resistance ........................................................ 20 AC Test Loads and Waveforms ..................................... 20 Switching Characteristics .............................................. 21 Switching Waveforms .................................................... 22 Ordering Information ...................................................... 24 Ordering Code Definitions ......................................... 24 Package Diagrams .......................................................... 25 Acronyms ........................................................................ 27 Document Conventions ................................................. 27 Units of Measure ....................................................... 27 Document History Page ................................................. 28 Sales, Solutions, and Legal Information ...................... 29 Worldwide Sales and Design Support ....................... 29 Products .................................................................... 29 PSoC Solutions ......................................................... 29 Document Number: 001-15032 Rev. *I Page 4 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Pin Configurations Figure 1. 100-pin TQFP Pinout A A CE1 CE2 BWd BWc BWb BWa CE3 VDD VSS CLK WE CEN OE ADV/LD A A A A CE1 CE2 NC NC BWb BWa CE3 VDD VSS CLK WE CEN OE ADV/LD A A NC DQPb NC DQb NC DQb VDDQ VDDQ VSS VSS NC DQb DQb NC DQb DQb DQb DQb VSS VSS VDDQ VDDQ DQb DQb DQb DQb NC VSS VDD NC NC VDD VSS ZZ DQb DQa DQa DQb VDDQ VDDQ VSS VSS DQa DQb DQa DQb DQa DQPb DQa NC VSS VSS VDDQ VDDQ NC DQa DQa NC DQPa NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 A A 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 DQPc DQc DQc VDDQ VSS DQc DQc DQc DQc VSS VDDQ DQc DQc NC VDD NC VSS DQd DQd VDDQ VSS DQd DQd DQd DQd VSS VDDQ DQd DQd DQPd 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 A A 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 A NC NC VDDQ VSS NC DQPa DQa DQa VSS VDDQ DQa DQa VSS NC VDD ZZ DQa DQa VDDQ VSS DQa DQa NC NC VSS VDDQ NC NC NC CY7C1470BV25 (2 M × 36) 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 CY7C1472BV25 (4 M × 18) 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 MODE A A A A A1 A0 NC(288) NC(144) MODE A A A A A1 A0 VSS VDD NC(288) NC(144) A A A A A A A A A Document Number: 001-15032 Rev. *I VSS VDD A A A A A A A A A 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 Page 5 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Pin Configurations (continued) 165-ball FBGA (15 × 17 × 1.4 mm) Pinout CY7C1470BV25 (2 M × 36) 1 A B C D E F G H J K L M N P R NC/576M NC/1G DQPc DQc DQc DQc DQc NC DQd DQd DQd DQd DQPd NC/144M MODE 2 A A NC DQc DQc DQc DQc NC DQd DQd DQd DQd NC A 3 CE1 CE2 VDDQ VDDQ VDDQ VDDQ VDDQ NC VDDQ VDDQ VDDQ VDDQ VDDQ A A 4 BWc BWd VSS VDD VDD VDD VDD VDD VDD VDD VDD VDD VSS A 5 BWb BWa VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS NC TDI TMS 6 CE3 CLK 7 CEN WE 8 ADV/LD 9 A 10 A A NC DQb DQb DQb DQb NC DQa DQa DQa DQa NC A A 11 NC NC DQPb DQb DQb DQb DQb ZZ DQa DQa DQa DQa DQPa OE A VDDQ VDDQ VDDQ VDDQ VDDQ NC VDDQ VDDQ VDDQ VDDQ VDDQ A A VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS NC A1 A0 VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS NC TDO TCK VSS VDD VDD VDD VDD VDD VDD VDD VDD VDD VSS A NC/288M A A A A CY7C1472BV25 (4 M × 18) 1 A B C D E F G H J K L M N P R NC/576M NC/1G NC NC NC NC NC NC DQb DQb DQb DQb DQPb NC/144M MODE 2 A A NC DQb DQb DQb DQb NC NC NC NC NC NC A 3 CE1 CE2 VDDQ VDDQ VDDQ VDDQ VDDQ NC VDDQ VDDQ VDDQ VDDQ VDDQ A A 4 BWb NC VSS VDD VDD VDD VDD VDD VDD VDD VDD VDD VSS A 5 NC BWa VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS NC TDI TMS 6 CE3 CLK 7 CEN WE VSS 8 ADV/LD 9 A 10 A A NC NC NC NC NC NC DQa DQa DQa DQa NC A A 11 A NC DQPa DQa DQa DQa DQa ZZ NC NC NC NC NC VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS NC A1 A0 OE VSS A VDDQ VDDQ VDDQ VDDQ VDDQ NC VDDQ VDDQ VDDQ VDDQ VDDQ A A VSS VSS VSS VSS VSS VSS VSS VSS VSS NC TDO TCK VDD VDD VDD VDD VDD VDD VDD VDD VDD VSS A NC/288M A A A A Document Number: 001-15032 Rev. *I Page 6 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Pin Definitions Pin Name A0 A1 A BWa BWb BWc BWd BWe BWf BWg BWh WE ADV/LD IO Type InputSynchronous InputSynchronous Pin Description Address Inputs Used to Select One of the Address Locations. Sampled at the rising edge of the CLK. Byte Write Select Inputs, Active LOW. Qualified with WE to conduct writes to the SRAM. Sampled on the rising edge of CLK. BWa controls DQa and DQPa, BWb controls DQb and DQPb, BWc controls DQc and DQPc, BWd controls DQd and DQPd, BWe controls DQe and DQPe, BWf controls DQf and DQPf, BWg controls DQg and DQPg, BWh controls DQh and DQPh. InputSynchronous InputSynchronous Write Enable Input, Active LOW. Sampled on the rising edge of CLK if CEN is active LOW. This signal must be asserted LOW to initiate a write sequence. Advance/Load Input Used to Advance the On-Chip Address Counter or Load a New Address. When HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a new address can be loaded into the device for an access. After being deselected, ADV/LD must be driven LOW to load a new address. Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with CEN. CLK is only recognized if CEN is active LOW. Chip Enable 1 Input, Active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE2 and CE3 to select/deselect the device. Chip Enable 2 Input, Active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE3 to select/deselect the device. Chip Enable 3 Input, Active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE2 to select/deselect the device. Output Enable, Active LOW. Combined with the synchronous logic block inside the device to control the direction of the IO pins. When LOW, the IO pins can behave as outputs. When deasserted HIGH, IO pins are tri-stated, and act as input data pins. OE is masked during the data portion of a write sequence, during the first clock when emerging from a deselected state and when the device has been deselected. Clock Enable Input, Active LOW. When asserted LOW the clock signal is recognized by the SRAM. When deasserted HIGH the clock signal is masked. Since deasserting CEN does not deselect the device, CEN can be used to extend the previous cycle when required. Bidirectional Data IO Lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by A[18:0] during the previous clock rise of the read cycle. The direction of the pins is controlled by OE and the internal control logic. When OE is asserted LOW, the pins can behave as outputs. When HIGH, DQa–DQh are placed in a tri-state condition. The outputs are automatically tri-stated during the data portion of a write sequence, during the first clock when emerging from a deselected state, and when the device is deselected, regardless of the state of OE. Bidirectional Data Parity IO Lines. Functionally, these signals are identical to DQ[71:0]. During write sequences, DQPa is controlled by BWa, DQPb is controlled by BWb, DQPc is controlled by BWc, and DQPd is controlled by BWd, DQPe is controlled by BWe, DQPf is controlled by BWf, DQPg is controlled by BWg, DQPh is controlled by BWh. Mode Input. Selects the burst order of the device. Tied HIGH selects the interleaved burst order. Pulled LOW selects the linear burst order. MODE must not change states during operation. When left floating MODE defaults HIGH, to an interleaved burst order. Serial Data Out to the JTAG Circuit. Delivers data on the negative edge of TCK. CLK CE1 CE2 CE3 OE InputClock InputSynchronous InputSynchronous InputSynchronous InputAsynchronous CEN InputSynchronous IOSynchronous DQs DQPX IOSynchronous MODE Input Strap Pin TDO JTAG Serial Output Synchronous TDI JTAG Serial Input Serial Data In to the JTAG Circuit. Sampled on the rising edge of TCK. Synchronous Page 7 of 29 Document Number: 001-15032 Rev. *I [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Pin Definitions (continued) Pin Name TMS TCK VDD VDDQ VSS NC NC(144M, 288M, 576M, 1G) ZZ IO Type Pin Description Test Mode Select TMS Pin Controls the Test Access Port State Machine. Sampled on the rising edge of TCK. Synchronous JTAG Clock Power Supply Ground – – Clock Input to the JTAG Circuitry. Power Supply Inputs to the Core of the Device. Ground for the Device. Must be connected to ground of the system. No Connects. This pin is not connected to the die. These Pins are Not Connected. They are used for expansion to the 144M, 288M, 576M, and 1G densities. ZZ “Sleep” Input. This active HIGH input places the device in a non-time critical “sleep” condition with data integrity preserved. For normal operation, this pin has must be LOW or left floating. ZZ pin has an internal pull down. register and onto the data bus within 2.6 ns (250-MHz device) provided OE is active LOW. After the first clock of the read access the output buffers are controlled by OE and the internal control logic. OE must be driven LOW to drive out the requested data. During the second clock, a subsequent operation (read, write, or deselect) can be initiated. Deselecting the device is also pipelined. Therefore, when the SRAM is deselected at clock rise by one of the chip enable signals, its output tri-states following the next clock rise. IO Power Supply Power Supply for the IO Circuitry. InputAsynchronous Functional Overview The CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 are synchronous-pipelined Burst NoBL SRAMs designed specifically to eliminate wait states during read or write transitions. All synchronous inputs pass through input registers controlled by the rising edge of the clock. The clock signal is qualified with the Clock Enable input signal (CEN). If CEN is HIGH, the clock signal is not recognized and all internal states are maintained. All synchronous operations are qualified with CEN. All data outputs pass through output registers controlled by the rising edge of the clock. Maximum access delay from the clock rise (tCO) is 3.0 ns (250-MHz device). Accesses can be initiated by asserting all three Chip Enables (CE1, CE2, CE3) active at the rising edge of the clock. If CEN is active LOW and ADV/LD is asserted LOW, the address presented to the device is latched. The access can either be a read or write operation, depending on the status of the Write Enable (WE). BW[x] can be used to conduct Byte Write operations. Write operations are qualified by the Write Enable (WE). All writes are simplified with on-chip synchronous self-timed write circuitry. Three synchronous Chip Enables (CE1, CE2, CE3) and an asynchronous Output Enable (OE) simplify depth expansion. All operations (reads, writes, and deselects) are pipelined. ADV/LD must be driven LOW after the device is deselected to load a new address for the next operation. Burst Read Accesses The CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 have an on-chip burst counter that enables the user to supply a single address and conduct up to four reads without reasserting the address inputs. ADV/LD must be driven LOW to load a new address into the SRAM, as described in the Single Read Accesses section. The sequence of the burst counter is determined by the MODE input signal. A LOW input on MODE selects a linear burst mode, a HIGH selects an interleaved burst sequence. Both burst counters use A0 and A1 in the burst sequence, and wraps around when incremented sufficiently. A HIGH input on ADV/LD increments the internal burst counter regardless of the state of chip enables inputs or WE. WE is latched at the beginning of a burst cycle. Therefore, the type of access (read or write) is maintained throughout the burst sequence. Single Write Accesses Write accesses are initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are ALL asserted active, and (3) the signal WE is asserted LOW. The address presented to the address inputs is loaded into the Address Register. The write signals are latched into the Control Logic block. On the subsequent clock rise the data lines are automatically tri-stated regardless of the state of the OE input signal. This allows the external logic to present the data on DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1470BV25, DQa,b/DQPa,b for CY7C1472BV25, and DQa,b,c,d,e,f,g,h/DQPa,b,c,d,e,f,g,h for CY7C1474BV25). In addition, the address for the subsequent Single Read Accesses A read access is initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are ALL asserted active, (3) the input signal WE is deasserted HIGH, and (4) ADV/LD is asserted LOW. The address presented to the address inputs is latched into the Address Register and presented to the memory core and control logic. The control logic determines that a read access is in progress and allows the requested data to propagate to the input of the output register. At the rising edge of the next clock the requested data is allowed to propagate through the output Document Number: 001-15032 Rev. *I Page 8 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 access (read, write, or deselect) is latched into the Address Register (provided the appropriate control signals are asserted). On the next clock rise the data presented to DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1470BV25, DQa,b/DQPa,b for CY7C1472BV25, DQa,b,c,d,e,f,g,h/DQPa,b,c,d,e,f,g,h for CY7C1474BV25) (or a subset for Byte Write operations, see Partial Write Cycle Description on page 11 for details) inputs is latched into the device and the Write is complete. The data written during the Write operation is controlled by BW (BWa,b,c,d for CY7C1470BV25, BWa,b for CY7C1472BV25, and BWa,b,c,d,e,f,g,h for CY7C1474BV25) signals. The CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 provides Byte Write capability that is described in Partial Write Cycle Description on page 11. Asserting the WE input with the selected BW input selectively writes to only the desired bytes. Bytes not selected during a Byte Write operation remain unaltered. A synchronous self-timed write mechanism has been provided to simplify the write operations. Byte Write capability has been included to greatly simplify read, modify, or write sequences, which can be reduced to simple Byte Write operations. Because the CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 are common IO devices, data must not be driven into the device while the outputs are active. OE can be deasserted HIGH before presenting data to the DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1470BV25, DQa,b/DQPa,b for CY7C1472BV25, and DQa,b,c,d,e,f,g,h/DQPa,b,c,d,e,f,g,h for CY7C1474BV25) inputs. Doing so tri-states the output drivers. As a safety precaution, DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1470BV25, DQa,b/DQPa,b for CY7C1472BV25, and DQa,b,c,d,e,f,g,h/DQPa,b,c,d,e,f,g,h for CY7C1474BV25) are automatically tri-stated during the data portion of a write cycle, regardless of the state of OE. clock rise, the Chip Enables (CE1, CE2, and CE3) and WE inputs are ignored and the burst counter is incremented. The correct BW (BWa,b,c,d for CY7C1470BV25, BWa,b for CY7C1472BV25, and BWa,b,c,d,e,f,g,h for CY7C1474BV25) inputs must be driven in each cycle of the burst write to write the correct bytes of data. Sleep Mode The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation “sleep” mode. Two clock cycles are required to enter into or exit from this “sleep” mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the “sleep” mode are not considered valid nor is the completion of the operation guaranteed. The device must be deselected before entering the “sleep” mode. CE1, CE2, and CE3, must remain inactive for the duration of tZZREC after the ZZ input returns LOW. Linear Burst Address Table (MODE = GND) First Address A1, A0 00 01 10 11 Second Address A1, A0 01 10 11 00 Third Address A1, A0 10 11 00 01 Fourth Address A1, A0 11 00 01 10 Interleaved Burst Address Table (MODE = Floating or VDD) First Address A1, A0 00 01 10 11 Second Address A1, A0 01 00 11 10 Third Address A1, A0 10 11 00 01 Fourth Address A1, A0 11 10 01 00 Burst Write Accesses The CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 has an on-chip burst counter that enables the user to supply a single address and conduct up to four write operations without reasserting the address inputs. ADV/LD must be driven LOW to load the initial address, as described in Single Write Accesses on page 8. When ADV/LD is driven HIGH on the subsequent ZZ Mode Electrical Characteristics Parameter IDDZZ tZZS tZZREC tZZI tRZZI Description Sleep mode standby current Device operation to ZZ ZZ recovery time ZZ active to sleep current ZZ Inactive to exit sleep current Test Conditions ZZ  VDD 0.2 V ZZVDD  0.2 V ZZ  0.2 V This parameter is sampled This parameter is sampled Min – – 2tCYC – 0 Max 120 2tCYC – 2tCYC – Unit mA ns ns ns ns Document Number: 001-15032 Rev. *I Page 9 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Truth Table The truth table for CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 follows. [1, 2, 3, 4, 5, 6, 7] Operation Deselect Cycle Continue Deselect Cycle Read Cycle (Begin Burst) Read Cycle (Continue Burst) NOP/Dummy Read (Begin Burst) Dummy Read (Continue Burst) Write Cycle (Begin Burst) Write Cycle (Continue Burst) NOP/Write Abort (Begin Burst) Write Abort (Continue Burst) Ignore Clock Edge (Stall) Sleep Mode Address Used None None External Next External Next External Next None Next Current None CE H X L X L X L X L X X X ZZ L L L L L L L L L L L H ADV/LD L H L H L H L H L H X X WE X X H X H X L X L X X X BWx X X X X X X L L H H X X OE X X L L H H X X X X X X CEN L L L L L L L L L L H X CLK L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H X DQ Tri-State Tri-State Data Out (Q) Data Out (Q) Tri-State Tri-State Data In (D) Data In (D) Tri-State Tri-State – Tri-State Notes 1. X = “Don't Care”, H = Logic HIGH, L = Logic LOW, CE stands for ALL Chip Enables active. BWx = L signifies at least one Byte Write Select is active, BWx = Valid signifies that the desired Byte Write Selects are asserted, see Partial Write Cycle Description on page 11 for details. 2. Write is defined by WE and BW[a:d]. See Partial Write Cycle Description on page 11 for details. 3. When a write cycle is detected, all IOs are tri-stated, even during Byte Writes. 4. The DQ and DQP pins are controlled by the current cycle and the OE signal. 5. CEN = H inserts wait states. 6. Device powers up deselected with the IOs in a tri-state condition, regardless of OE. 7. OE is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles.During a Read cycle DQs and DQP[a:d] = tri-state when OE is inactive or when the device is deselected, and DQs = data when OE is active. Document Number: 001-15032 Rev. *I Page 10 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Partial Write Cycle Description The partial write cycle description for CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 follows.[8, 9, 10, 11] Function (CY7C1470BV25) Read Write – No bytes written Write Byte a – (DQa and DQPa) Write Byte b – (DQb and DQPb) Write Bytes b, a Write Byte c – (DQc and DQPc) Write Bytes c, a Write Bytes c, b Write Bytes c, b, a Write Byte d – (DQd and DQPd) Write Bytes d, a Write Bytes d, b Write Bytes d, b, a Write Bytes d, c Write Bytes d, c, a Write Bytes d, c, b Write All Bytes Function (CY7C1472BV25) Read Write – No Bytes Written Write Byte a – (DQa and DQPa) Write Byte b – (DQb and DQPb) Write Both Bytes Function (CY7C1474BV25) Read Write – No Bytes Written Write Byte X(DQx and DQPx) Write All Bytes WE H L L L L L L L L L L L L L L L L WE H L L L L WE H L L L BWd X H H H H H H H H L L L L L L L L BWb x H H L L BWx x H L All BW = L BWc X H H H H L L LL L H H H H L L L L BWb X H H L L H H L L H H L L H H L L BWa x H L H L BWa X H L H L H L H L H L H L H L H L Notes 8. X = “Don't Care”, H = Logic HIGH, L = Logic LOW, CE stands for ALL Chip Enables active. BWx = L signifies at least one Byte Write Select is active, BWx = Valid signifies that the desired Byte Write Selects are asserted, see Partial Write Cycle Description for details. 9. Write is defined by WE and BW[a:d]. See Partial Write Cycle Description for details. 10. When a write cycle is detected, all IOs are tri-stated, even during Byte Writes. 11. Table lists only a partial listing of the Byte Write combinations. Any combination of BW[a:d] is valid. Appropriate write is based on which Byte Write is active. Document Number: 001-15032 Rev. *I Page 11 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 IEEE 1149.1 Serial Boundary Scan (JTAG) The CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 incorporates a serial boundary scan test access port (TAP). This port operates in accordance with IEEE Standard 1149.1-1990 but does not have the set of functions required for full 1149.1 compliance. These functions from the IEEE specification are excluded because their inclusion places an added delay in the critical speed path of the SRAM. Note that the TAP controller functions in a manner that does not conflict with the operation of other devices using 1149.1 fully compliant TAPs. The TAP operates using JEDEC-standard 2.5 V IO logic levels. The CY7C1470BV25, CY7C1472BV25, and CY7C1474BV25 contains a TAP controller, instruction register, boundary scan register, bypass register, and ID register. Test Mode Select (TMS) The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. It is allowable to leave this ball unconnected if the TAP is not used. The ball is pulled up internally, resulting in a logic HIGH level. Test Data-In (TDI) The TDI ball is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. For information about loading the instruction register, see the TAP Controller State Diagram. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the most significant bit (MSB) of any register. (See TAP Controller Block Diagram.) Test Data-Out (TDO) The TDO output ball is used to serially clock data-out from the registers. The output is active depending upon the current state of the TAP state machine. The output changes on the falling edge of TCK. TDO is connected to the least significant bit (LSB) of any register. (See TAP Controller State Diagram.) Disabling the JTAG Feature It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW (VSS) to prevent clocking of the device. TDI and TMS are internally pulled up and may be unconnected. They may alternately be connected to VDD through a pull up resistor. TDO must be left unconnected. During power up, the device comes up in a reset state, which does not interfere with the operation of the device. TAP Controller Block Diagram 0 Bypass Register 210 TAP Controller State Diagram 1 TEST-LOGIC RESET 0 0 RUN-TEST/ IDLE 1 SELECT DR-SCA N 0 1 CAPTURE-DR 0 SHIFT-DR 1 EXIT1-DR 0 PAUSE-DR 1 0 EXIT2-DR 1 UPDATE-DR 1 0 0 0 1 0 1 1 SELECT IR-SCAN 0 CAPTURE-IR 0 SHIFT-IR 1 EXIT1-IR 0 PAUSE-IR 1 EXIT2-IR 1 UPDATE-IR 1 0 0 1 0 1 TDI Selection Circuitry Instruction Register 31 30 29 . . . 2 1 0 Selection Circuitry TDO Identification Register x. . . . .210 Boundary Scan Register TCK TM S TAP CONTROLLER Performing a TAP RESET A RESET is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This RESET does not affect the operation of the SRAM and may be performed while the SRAM is operating. During power up, the TAP is reset internally to ensure that TDO comes up in a High Z state. The 0/1 next to each state represents the value of TMS at the rising edge of TCK. TAP Registers Registers are connected between the TDI and TDO balls to scan the data in and out of the SRAM test circuitry. Only one register can be selected at a time through the instruction register. Data is serially loaded into the TDI ball on the rising edge of TCK. Data is output on the TDO ball on the falling edge of TCK. Test Access Port (TAP) Test Clock (TCK) The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK. Document Number: 001-15032 Rev. *I Page 12 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the TDI and TDO balls as shown in the TAP Controller Block Diagram on page 12. During power up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as described in the previous section. When the TAP controller is in the Capture-IR state, the two least significant bits are loaded with a binary ‘01’ pattern to enable fault isolation of the board-level serial test data path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain chips. The bypass register is a single-bit register that can be placed between the TDI and TDO balls. This shifts the data through the SRAM with minimal delay. The bypass register is set LOW (VSS) when the BYPASS instruction is executed. Boundary Scan Register The boundary scan register is connected to all the input and bidirectional balls on the SRAM. The boundary scan register is loaded with the contents of the RAM IO ring when the TAP controller is in the Capture-DR state and is then placed between the TDI and TDO balls when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD and SAMPLE Z instructions can be used to capture the contents of the IO ring. The Boundary Scan Order tables show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI and the LSB is connected to TDO. Identification (ID) Register The ID register is loaded with a vendor-specific, 32-bit code during the Capture-DR state when the IDCODE command is loaded in the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has a vendor code and other information described in Identification Register Definitions on page 16. Instructions are loaded into the TAP controller during the Shift-IR state when the instruction register is placed between TDI and TDO. During this state, instructions are shifted through the instruction register through the TDI and TDO balls. To execute the instruction after it is shifted in, the TAP controller must be moved into the Update-IR state. EXTEST EXTEST is a mandatory 1149.1 instruction which is executed whenever the instruction register is loaded with all 0s. EXTEST is not implemented in this SRAM TAP controller, and therefore this device is not compliant to 1149.1. The TAP controller does recognize an all-0 instruction. When an EXTEST instruction is loaded into the instruction register, the SRAM responds as if a SAMPLE/PRELOAD instruction has been loaded. There is one difference between the two instructions. Unlike the SAMPLE/PRELOAD instruction, EXTEST places the SRAM outputs in a High Z state. IDCODE The IDCODE instruction loads a vendor-specific, 32-bit code into the instruction register. It also places the instruction register between the TDI and TDO balls and shifts the IDCODE out of the device when the TAP controller enters the Shift-DR state. The IDCODE instruction is loaded into the instruction register during power up or whenever the TAP controller is in a test logic reset state. SAMPLE Z The SAMPLE Z instruction connects the boundary scan register between the TDI and TDO pins when the TAP controller is in a Shift-DR state. It also places all SRAM outputs into a High Z state. SAMPLE/PRELOAD SAMPLE/PRELOAD is a 1149.1 mandatory instruction. The PRELOAD portion of this instruction is not implemented, so the device TAP controller is not fully 1149.1 compliant. When the SAMPLE/PRELOAD instruction is loaded into the instruction register and the TAP controller is in the Capture-DR state, a snapshot of data on the inputs and bidirectional balls is captured in the boundary scan register. The user must be aware that the TAP controller clock can only operate at a frequency up to 20 MHz, while the SRAM clock operates more than an order of magnitude faster. Because there is a large difference in the clock frequencies, it is possible that during the Capture-DR state, an input or output may undergo a transition. The TAP may then try to capture a signal while in transition (metastable state). This does not harm the device, but there is no guarantee as to the value that is captured. Repeatable results may not be possible. To guarantee that the boundary scan register captures the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller’s capture setup plus hold time (tCS plus tCH). The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE/PRELOAD instruction. If this is an issue, it is still TAP Instruction Set Overview Eight different instructions are possible with the three-bit instruction register. All combinations are listed in Identification Codes on page 17. Three of these instructions are listed as RESERVED and must not be used. The other five instructions are described in this section in detail. The TAP controller used in this SRAM is not fully compliant to the 1149.1 convention because some of the mandatory 1149.1 instructions are not fully implemented. The TAP controller cannot be used to load address data or control signals into the SRAM and cannot preload the IO buffers. The SRAM does not implement the 1149.1 commands EXTEST or INTEST or the PRELOAD portion of SAMPLE/PRELOAD; rather, it performs a capture of the IO ring when these instructions are executed. Document Number: 001-15032 Rev. *I Page 13 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 possible to capture all other signals and simply ignore the value of the CLK captured in the boundary scan register. After the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO balls. Note that since the PRELOAD part of the command is not implemented, putting the TAP to the Update-DR state while performing a SAMPLE/PRELOAD instruction has the same effect as the Pause-DR command. BYPASS When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO balls. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. Reserved These instructions are not implemented but are reserved for future use. Do not use these instructions. TAP Timing 1 Test Clock (TCK ) t TM SS 2 3 4 5 6 t TH t TM SH t TL t CY C T est M ode Select (TM S) t TDIS t TDIH Test Data-In (TDI) t TDOV t TDOX Test Data-Out (TDO) DON’T CA RE UNDEFINED Document Number: 001-15032 Rev. *I Page 14 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 TAP AC Switching Characteristics Over the Operating Range [12, 13] Parameter Clock tTCYC tTF tTH tTL tTDOV tTDOX Setup Times tTMSS tTDIS tCS Hold Times tTMSH tTDIH tCH TMS Hold after TCK Clock Rise TDI Hold after Clock Rise Capture Hold after Clock Rise 5 5 5 – – – ns ns ns TMS Setup to TCK Clock Rise TDI Setup to TCK Clock Rise Capture Setup to TCK Rise 5 5 5 – – – ns ns ns TCK Clock Cycle Time TCK Clock Frequency TCK Clock HIGH time TCK Clock LOW time TCK Clock LOW to TDO Valid TCK Clock LOW to TDO Invalid 50 – 20 20 – 0 – 20 – – 10 – ns MHz ns ns ns ns Description Min Max Unit Output Times Notes 12. tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register. 13. Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns. Document Number: 001-15032 Rev. *I Page 15 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 2.5 V TAP AC Test Conditions Input pulse levels................................................VSS to 2.5 V Input rise and fall time .....................................................1 ns Input timing reference levels........................................ 1.25 V Output reference levels ............................................... 1.25 V Test load termination supply voltage ........................... 1.25 V 2.5 V TAP AC Output Load Equivalent 1.25V 50 Ω TDO Z O= 50 Ω 20pF TAP DC Electrical Characteristics and Operating Conditions (0 °C < TA < +70 °C; VDD = 2.5 V ± 0.125 V unless otherwise noted)[14] Parameter VOH1 VOH2 VOL1 VOL2 VIH VIL IX Description Output HIGH Voltage Output HIGH Voltage Output LOW Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Input Load Current Test Conditions IOH = –1.0 mA, VDDQ = 2.5 V IOH = –100 A, VDDQ = 2.5 V IOL = 1.0 mA, VDDQ = 2.5 V IOL = 100 A, VDDQ = 2.5 V VDDQ = 2.5 V VDDQ = 2.5 V GND  VI  VDDQ Min 1.7 2.1 – – 1.7 –0.3 –5 Max – – 0.4 0.2 VDD + 0.3 0.7 5 Unit V V V V V V A Identification Register Definitions Instruction Field Revision Number (31:29) Device Depth (28:24) Architecture/Memory Type (23:18) Bus Width/Density (17:12) Cypress JEDEC ID Code (11:1) ID Register Presence Indicator (0) CY7C1470BV25 (2 M × 36) 000 01011 001000 100100 00000110100 1 CY7C1472BV25 (4 M × 18) 000 01011 001000 010100 00000110100 1 CY7C1474BV25 (1 M × 72) 000 01011 001000 110100 00000110100 1 Description Describes the version number Reserved for internal use Defines memory architecture Allows unique SRAM vendor type and Defines width and density identification of Indicates the presence of an ID register Scan Register Sizes Register Name Instruction Bypass ID Boundary Scan Order–165-ball FBGA Boundary Scan Order–209-ball BGA Bit Size (× 36) 3 1 32 71 – Bit Size (× 18) 3 1 32 52 – Bit Size (× 72) 3 1 32 – 110 Note 14. All voltages refer to VSS (GND). Document Number: 001-15032 Rev. *I Page 16 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Identification Codes Instruction EXTEST IDCODE SAMPLE Z RESERVED SAMPLE/PRELOAD Code 000 001 010 011 100 Description Captures IO ring contents. Places the boundary scan register between TDI and TDO. Forces all SRAM outputs to High Z state. This instruction is not 1149.1-compliant. Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operations. Captures IO ring contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a High Z state. Do Not Use: This instruction is reserved for future use. Captures IO ring contents. Places the boundary scan register between TDI and TDO. Does not affect SRAM operation. This instruction does not implement 1149.1 preload function and is therefore not 1149.1-compliant. Do Not Use: This instruction is reserved for future use. Do Not Use: This instruction is reserved for future use. Places the bypass register between TDI and TDO. This operation does not affect SRAM operations. RESERVED RESERVED BYPASS 101 110 111 Boundary Scan Exit Order (2 M × 36) Bit # 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 165-ball ID C1 D1 E1 D2 E2 F1 G1 F2 G2 J1 K1 L1 J2 M1 N1 K2 L2 M2 R1 R2 Bit # 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 165-ball ID R3 P2 R4 P6 R6 R8 P3 P4 P8 P9 P10 R9 R10 R11 N11 M11 L11 M10 L10 K11 Bit # 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 165-ball ID J11 K10 J10 H11 G11 F11 E11 D10 D11 C11 G10 F10 E10 A9 B9 A10 B10 A8 B8 A7 Bit # 61 62 63 64 65 66 67 68 69 70 71 165-ball ID B7 B6 A6 B5 A5 A4 B4 B3 A3 A2 B2 Document Number: 001-15032 Rev. *I Page 17 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Boundary Scan Exit Order (4 M × 18) Bit # 1 2 3 4 5 6 7 8 9 10 11 12 13 165-ball ID D2 E2 F2 G2 J1 K1 L1 M1 N1 R1 R2 R3 P2 Bit # 14 15 16 17 18 19 20 21 22 23 24 25 26 165-ball ID R4 P6 R6 R8 P3 P4 P8 P9 P10 R9 R10 R11 M10 Bit # 27 28 29 30 31 32 33 34 35 36 37 38 39 165-ball ID L10 K10 J10 H11 G11 F11 E11 D11 C11 A11 A9 B9 A10 Bit # 40 41 42 43 44 45 46 47 48 49 50 51 52 165-ball ID B10 A8 B8 A7 B7 B6 A6 B5 A4 B3 A3 A2 B2 Boundary Scan Exit Order (1 M × 72) Bit # 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 209-ball ID A1 A2 B1 B2 C1 C2 D1 D2 E1 E2 F1 F2 G1 G2 H1 H2 J1 J2 L1 L2 M1 M2 N1 N2 P1 P2 R2 R1 Bit # 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 209-ball ID T1 T2 U1 U2 V1 V2 W1 W2 T6 V3 V4 U4 W5 V6 W6 V5 U5 U6 W7 V7 U7 V8 V9 W11 W10 V11 V10 U11 Bit # 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 209-ball ID U10 T11 T10 R11 R10 P11 P10 N11 N10 M11 M10 L11 L10 P6 J11 J10 H11 H10 G11 G10 F11 F10 E10 E11 D11 D10 C11 C10 Bit # 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 209-ball ID B11 B10 A11 A10 A7 A5 A9 U8 A6 D6 K6 B6 K3 A8 B4 B3 C3 C4 C8 C9 B9 B8 A4 C6 B7 A3 Document Number: 001-15032 Rev. *I Page 18 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Maximum Ratings Exceeding maximum ratings may impair the useful life of the device. These user guidelines are not tested. Storage Temperature ................................ –65 °C to +150 °C Ambient Temperature with Power Applied .......................................... –55 °C to +125 °C Supply Voltage on VDD Relative to GND ......–0.5 V to +3.6 V Supply Voltage on VDDQ Relative to GND ..... –0.5 V to +VDD DC to Outputs in Tri-State..................–0.5 V to VDDQ + 0.5 V DC Input Voltage ................................. –0.5 V to VDD + 0.5 V Current into Outputs (LOW)......................................... 20 mA Static Discharge Voltage......................................... > 2001 V (MIL-STD-883, Method 3015) Latch up Current.................................................... > 200 mA Operating Range Range Commercial Industrial Ambient Temperature –40 °C to +85 °C VDD VDDQ 0 °C to +70 °C 2.5 V – 5% / +5% 2.5 V – 5% to VDD Electrical Characteristics Over the Operating Range[15, 16] Parameter VDD VDDQ VOH VOL VIH VIL IX Description Power Supply Voltage IO Supply Voltage Output HIGH Voltage Output LOW Voltage Input HIGH Input LOW Voltage[15] Voltage[15] For 2.5 V IO For 2.5 V IO, IOH =1.0 mA For 2.5 V IO, IOL =1.0 mA For 2.5 V IO For 2.5 V IO GND  VI  VDDQ Input = VSS Input = VDD Input Current of ZZ IOZ IDD [17] Test Conditions Min 2.375 2.375 2.0 – 1.7 –0.3 –5 –30 – –5 – –5 – – – – – – – Max 2.625 VDD – 0.4 VDD + 0.3 V 0.7 5 – 5 – 30 5 450 450 400 200 200 200 120 Unit V V V V V V A A A A A A mA mA mA mA mA mA mA Input Leakage Current except ZZ and MODE Input Current of MODE Input = VSS Input = VDD Output Leakage Current GND  VI  VDDQ, Output Disabled VDD Operating Supply VDD = Max, IOUT = 0 mA, f = fMAX = 1/tCYC 4.0-ns cycle, 250 MHz 5.0-ns cycle, 200 MHz 6.0-ns cycle, 167 MHz ISB1 Automatic CE Power Down Current—TTL Inputs Automatic CE Power Down Current—CMOS Inputs Max. VDD, Device Deselected, 4.0-ns cycle, 250MHz VIN  VIH or VIN  VIL, 5.0-ns cycle, 200 MHz f = fMAX = 1/tCYC 6.0-ns cycle, 167 MHz Max. VDD, Device Deselected, All speed grades VIN  0.3 V or VIN > VDDQ 0.3 V, f = 0 ISB2 Notes 15. Overshoot: VIH(AC) < VDD +1.5 V (pulse width less than tCYC/2). Undershoot: VIL(AC) > –2 V (pulse width less than tCYC/2). 16. TPower-up: assumes a linear ramp from 0 V to VDD (min.) within 200 ms. During this time VIH < VDD and VDDQ < VDD. 17. The operation current is calculated with 50% read cycle and 50% write cycle. Document Number: 001-15032 Rev. *I Page 19 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Electrical Characteristics (continued) Over the Operating Range[15, 16] (continued) Parameter ISB3 Description Automatic CE Power Down Current—CMOS Inputs Automatic CE Power Down Current—TTL Inputs Test Conditions Max. VDD, Device Deselected, 4.0-ns cycle, 250 MHz VIN  0.3 V or 5.0-ns cycle, 200 MHz VIN > VDDQ 0.3 V, f = fMAX = 1/tCYC 6.0-ns cycle, 167 MHz Max. VDD, Device Deselected, All speed grades VIN  VIH or VIN  VIL, f = 0 Min – – – – Max 200 200 200 135 Unit mA mA mA mA ISB4 Capacitance Tested initially and after any design or process changes that may affect these parameters. Parameter CADDRESS CDATA CCTRL CCLK CIO Description Address Input Capacitance Data Input Capacitance Control Input Capacitance Clock Input Capacitance Input/Output Capacitance Test Conditions TA = 25 °C, f = 1 MHz, VDD = 2.5 V VDDQ = 2.5 V 100-pin TQFP 165-ball FBGA 209-ball FBGA Unit Max Max Max 6 5 8 6 5 6 5 8 6 5 6 5 8 6 5 pF pF pF pF pF Thermal Resistance Tested initially and after any design or process changes that may affect these parameters. Parameter JA JC Description Thermal Resistance (Junction to Ambient) Thermal Resistance (Junction to Case) Test Conditions Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA/JESD51. 100-pin TQFP 165-ball FBGA 209-ball FBGA Unit Package Package Package 24.63 2.28 16.3 2.1 15.2 1.7 C/W C/W AC Test Loads and Waveforms 2.5 V IO Test Load OUTPUT Z0 = 50  2.5 V OUTPUT RL = 50  VL = 1.25 V R = 1667  VDDQ 5 pF GND R = 1538  10% ALL INPUT PULSES 90% 90% 10%  1 ns  1 ns (a) INCLUDING JIG AND SCOPE (b) (c) Document Number: 001-15032 Rev. *I Page 20 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Switching Characteristics Over the Operating Range[18, 19] Parameter tPower[20] Clock tCYC FMAX tCH tCL Output Times tCO tOEV tDOH tCHZ tCLZ tEOHZ tEOLZ Setup Times tAS tDS tCENS tWES tALS tCES Hold Times tAH tDH tCENH tWEH tALH tCEH Address Hold After CLK Rise Data Input Hold After CLK Rise CEN Hold After CLK Rise WE, BWx Hold After CLK Rise ADV/LD Hold after CLK Rise Chip Select Hold After CLK Rise 0.4 0.4 0.4 0.4 0.4 0.4 – – – – – – 0.4 0.4 0.4 0.4 0.4 0.4 – – – – – – 0.5 0.5 0.5 0.5 0.5 0.5 – – – – – – ns ns ns ns ns ns Address Setup Before CLK Rise Data Input Setup Before CLK Rise CEN Setup Before CLK Rise WE, BWx Setup Before CLK Rise ADV/LD Setup Before CLK Rise Chip Select Setup 1.4 1.4 1.4 1.4 1.4 1.4 – – – – – – 1.4 1.4 1.4 1.4 1.4 1.4 – – – – – – 1.5 1.5 1.5 1.5 1.5 1.5 – – – – – – ns ns ns ns ns ns Data Output Valid After CLK Rise OE LOW to Output Valid Data Output Hold After CLK Rise Clock to High Z[21, 22, 23] Clock to Low Z[21, 22, 23] Z[21, 22, 23] Z[21, 22, 23] OE HIGH to Output High OE LOW to Output Low – – 1.3 – 1.3 – 0 3.0 3.0 – 3.0 – 3.0 – – – 1.3 – 1.3 – 0 3.0 3.0 – 3.0 – 3.0 – – – 1.5 – 1.5 – 0 3.4 3.4 – 3.4 – 3.4 – ns ns ns ns ns ns ns Clock Cycle Time Maximum Operating Frequency Clock HIGH Clock LOW 4.0 – 2.0 2.0 – 250 – – 5.0 – 2.0 2.0 – 200 – – 6.0 – 2.2 2.2 – 167 – – ns MHz ns ns Description VCC (typical) to the First Access Read or Write 250 MHz Min 1 Max – 200 MHz Min 1 Max – 167 MHz Min 1 Max – Unit ms Notes 18. Timing reference is 1.25 V when VDDQ = 2.5 V. 19. Test conditions shown in (a) of AC Test Loads and Waveforms on page 20 unless otherwise noted. 20. This part has a voltage regulator internally; tpower is the time power is supplied above VDD minimum initially, before a read or write operation can be initiated. 21. tCHZ, tCLZ, tEOLZ, and tEOHZ are specified with AC test conditions shown in (b) of AC Test Loads and Waveforms on page 20. Transition is measured ±200 mV from steady-state voltage. 22. At any supplied voltage and temperature, tEOHZ is less than tEOLZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve High Z before Low Z under the same system conditions. 23. This parameter is sampled and not 100% tested. Document Number: 001-15032 Rev. *I Page 21 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Switching Waveforms Figure 2 shows read-write timing waveform.[24, 25, 26] Figure 2. Read/Write Timing 1 CLK t CENS t CENH 2 t CYC 3 4 5 6 7 8 9 10 t CH t CL CEN t CES t CEH CE ADV/LD WE BW x ADDRESS t AS A1 t AH A2 t DS t DH A3 A4 t CO t CLZ t DOH A5 t OEV A6 t CHZ A7 Data I n-Out (DQ) D(A1) D(A2) D(A2+1) Q(A3) Q(A4) t OEHZ Q(A4+1) D(A5) Q(A6) t DOH OE WRITE D(A1) WRITE D(A2) BURST WRITE D(A2+1) READ Q(A3) READ Q(A4) BURST READ Q(A4+1) WRITE D(A5) t OELZ READ Q(A6) WRITE D(A7) DESELECT DON’T CARE UNDEFINED Notes 24. For this waveform ZZ is tied LOW. 25. When CE is LOW, CE1 is LOW, CE2 is HIGH, and CE3 is LOW. When CE is HIGH,CE1 is HIGH, CE2 is LOW, or CE3 is HIGH. 26. Order of the Burst sequence is determined by the status of the MODE (0 = Linear, 1 = Interleaved).Burst operations are optional. Document Number: 001-15032 Rev. *I Page 22 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Switching Waveforms (continued) Figure 3 shows NOP, STALL and DESELECT Cycles waveform. [27, 28, 29] Figure 3. NOP, STALL and DESELECT Cycles 1 CLK CEN CE ADV/LD WE BWx ADDRESS A1 2 3 4 5 6 7 8 9 10 A2 A3 A4 A5 t CHZ Data In-Out (DQ) WRITE D(A1) READ Q(A2) STALL D(A1) Q(A2) Q(A3) D(A4) Q(A5) READ Q(A3) WRITE D(A4) STALL NOP READ Q(A5) DESELECT CONTINUE DESELECT DON’T CARE UNDEFINED Figure 4 shows ZZ Mode timing waveform. [30, 31] Figure 4. ZZ Mode Timing CLK t ZZ t ZZREC ZZ t ZZI I SUPPLY I DDZZ t RZZI DESELECT or READ Only A LL INPUTS (except ZZ) Outputs (Q) High-Z DON’T CARE Notes 27. For this waveform ZZ is tied LOW. 28. When CE is LOW, CE1 is LOW, CE2 is HIGH, and CE3 is LOW. When CE is HIGH,CE1 is HIGH, CE2 is LOW, or CE3 is HIGH. 29. The IGNORE CLOCK EDGE or STALL cycle (Clock 3) illustrated CEN being used to create a pause. A write is not performed during this cycle. 30. Device must be deselected when entering ZZ mode. See Truth Table on page 10 for all possible signal conditions to deselect the device. 31. IOs are in High Z when exiting ZZ sleep mode. Document Number: 001-15032 Rev. *I Page 23 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Ordering Information Cypress offers other versions of this type of product in many different configurations and features. The below table contains only the list of parts that are currently available. For a complete listing of all options, visit the Cypress website at www.cypress.com and refer to the product summary page at http://www.cypress.com/products or contact your local sales representative. Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives and distributors. To find the office closest to you, visit us at t http://www.cypress.com/go/datasheet/offices. Speed (MHz) 167 200 Ordering Code CY7C1470BV25-167AXC CY7C1470BV25-167BZXI CY7C1470BV25-200AXC CY7C1472BV25-200AXC CY7C1470BV25-200BZXC CY7C1470BV25-200BZXI 250 CY7C1470BV25-250AXC 51-85050 100-pin Thin Quad Flat Pack (14 × 20 × 1.4 mm) Pb-free 51-85165 165-ball Fine-Pitch Ball Grid Array (15 × 17 × 1.4 mm) Pb-free Commercial Industrial Commercial Package Diagram Part and Package Type Operating Range Commercial Industrial Commercial 51-85050 100-pin Thin Quad Flat Pack (14 × 20 × 1.4 mm) Pb-free 51-85165 165-ball Fine-Pitch Ball Grid Array (15 × 17 × 1.4 mm) Pb-free 51-85050 100-pin Thin Quad Flat Pack (14 × 20 × 1.4 mm) Pb-free Ordering Code Definitions CY 7C 147X B V25 - XXX XX X X X = T or blank T = Tape and Reel; blank = Tube Temperature Range: X = C or I C = Commercial; I = Industrial Package Type: AX = 100-pin TQFP (Pb-free) BZX = 165-ball FBGA (Pb-free) Frequency Range: XXX = 167 MHz or 200 MHz or 250 MHz VDD = 2.5 V Process Technology 147X = 1470 or 1472 or 1474 1470 = PL, 2Mb x 36 (72Mb) 1472 = PL, 4Mb x 18 (72Mb) 1474 = PL, 1Mb x 72 (72Mb) Marketing Code: 7C = SRAMs Company ID: CY = Cypress Document Number: 001-15032 Rev. *I Page 24 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Package Diagrams Figure 5. 100-pin TQFP (14 × 20 × 1.4 mm), 51-85050 51-85050 *D Document Number: 001-15032 Rev. *I Page 25 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Package Diagrams (continued) Figure 6. 165-ball FBGA (15 × 17 × 1.4 mm), 51-85165 51-85165 *B Document Number: 001-15032 Rev. *I Page 26 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Acronyms Acronym BGA CMOS FBGA I/O JTAG LSB MSB OE SRAM TAP TCK TDI TDO TMS TQFP TTL WE ball grid array complementary metal oxide semiconductor fine-pitch ball grid array input/output Joint Test Action Group least significant bit most significant bit output enable static random access memory test access port test clock test data-in test data-out test mode select thin quad flat pack transistor transistor logic write enable Description Document Conventions Units of Measure Symbol °C µA mA mm ms MHz ns  % pF V W degree Celcius micro Amperes milli Amperes milli meter milli seconds Mega Hertz nano seconds Ohms percent pico Farad Volts Watts Unit of Measure Document Number: 001-15032 Rev. *I Page 27 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Document History Page Document Title: CY7C1470BV25/CY7C1472BV25/CY7C1474BV25, 72-Mbit (2 M × 36/4 M × 18/1 M × 72) Pipelined SRAM with NoBL™ Architecture Document Number: 001-15032 REV. ** *A *B *C *D *E *F ECN No. Issue Date Orig. of Change 1032642 1562503 1897447 2082487 2159486 See ECN See ECN See ECN See ECN See ECN VKN/KKVTMP VKN/AESA VKN/AESA VKN VKN/PYRS NJY VKN New data sheet Removed 1.8V IO offering from the data sheet Added footnote 14 related to IDD Converted from preliminary to final Minor Change-Moved to the external web Removed inactive parts from Ordering Information table; Updated package diagram. Removed inactive part numbers CY7C1470BV25-167BZC,CY7C1470BV25-167BZI, CY7C1470BV25-167BZXC,CY7C1470BV25-200BZC, CY7C1472BV25-250BZC,CY7C1474BV25-167BGC, CY7C1474BV25-167BGI, CY7C1474BV25-200BGC,CY7C1474BV25-200BGI, CY7C1474BV25-200BGXI,from the ordering information table. Removed pruned parts CY7C1472BV25-200BZI, CY7C1472BV25-200BZIT from ordering information table. Removed associated package. Added Ordering Code Definitions, sales links, and TOC. Updated Ordering Information. Updated Package Diagrams. Updated in new template. Updated Ordering Information. Added Acronyms and Units of Measure. Description of Change 2898663 03/24/2010 2905460 04/06/2010 *G *H *I 3061663 10/15/2010 3207526 03/28/2011 3257192 05/14/2011 NJY NJY NJY Document Number: 001-15032 Rev. *I Page 28 of 29 [+] Feedback CY7C1470BV25 CY7C1472BV25, CY7C1474BV25 Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office closest to you, visit us at Cypress Locations. Products Automotive Clocks & Buffers Interface Lighting & Power Control Memory Optical & Image Sensing PSoC Touch Sensing USB Controllers Wireless/RF cypress.com/go/automotive cypress.com/go/clocks cypress.com/go/interface cypress.com/go/powerpsoc cypress.com/go/plc cypress.com/go/memory cypress.com/go/image cypress.com/go/psoc cypress.com/go/touch cypress.com/go/USB cypress.com/go/wireless PSoC Solutions psoc.cypress.com/solutions PSoC 1 | PSoC 3 | PSoC 5 © Cypress Semiconductor Corporation, 2007-2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. Document Number: 001-15032 Rev. *I Revised May 17, 2011 Page 29 of 29 NoBL and No Bus Latency are trademarks of Cypress Semiconductor Corporation. ZBT is a trademark of Integrated Device Technology, Inc. All products and company names mentioned in this document may be the trademarks of their respective holders. [+] Feedback