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CY7S1049GE30-10VXI

CY7S1049GE30-10VXI

  • 厂商:

    EUPEC(英飞凌)

  • 封装:

    SOJ36_400MIL

  • 描述:

    IC SRAM 4MBIT PARALLEL 36SOJ

  • 数据手册
  • 价格&库存
CY7S1049GE30-10VXI 数据手册
CY7S1049G CY7S1049GE 4-Mbit (512K words × 8-bit) Static RAM with PowerSnooze™ and Error Correcting Code (ECC) 4-Mbit (512K words × 8-bit) Static RAM with PowerSnooze™ and Error Correcting Code (ECC) ultra-low power Deep-Sleep mode[3]. With Deep-Sleep mode currents as low as 15 µA, the CY7S1049G/CY7S1049GE devices combine the best features of fast and low- power SRAMs in industry-standard package options. The device also features embedded ECC. logic which can detect and correct single-bit errors in the accessed location. Deep-Sleep input (DS) must be deasserted HIGH for normal operating mode. Features ■ High speed ❐ Access time (tAA) = 10 ns / 15 ns ■ Ultra-low power Deep-Sleep (DS) current ❐ IDS = 15 µA ■ Low active and standby currents ❐ Active Current ICC = 38-mA typical ❐ Standby Current ISB2 = 6-mA typical ■ ■ Wide operating voltage range: 1.65 V to 2.2 V, 2.2 V to 3.6 V, 4.5 V to 5.5 V Embedded ECC for single-bit error correction[1, 2] ■ Error indication (ERR) pin to indicate 1-bit error detection and correction ■ 1.0-V data retention ■ TTL- compatible inputs and outputs ■ Available in Pb-free 44-pin TSOP II, and 36-pin (400-mil) molded SOJ Functional Description The CY7S1049G/CY7S1049GE[1] is a high-performance PowerSnooze™ static RAM organized as 512K words × 8 bits. This device features fast access times (10 ns) and a unique To perform data writes, assert the Chip Enable (CE) and Write Enable (WE) inputs LOW, and provide the data and address on device data pins (I/O0 through I/O7) and address pins (A0 through A18) respectively. To perform data reads, assert the Chip Enable (CE) and Output Enable (OE) inputs LOW and provide the required address on the address lines. Read data is accessible on the I/O lines (I/O0 through I/O7). The device is placed in a low-power Deep-Sleep mode when the Deep-Sleep input (DS) is asserted LOW. In this state, the device is disabled for normal operation and is placed in a low power data retention mode. The device can be activated by deasserting the Deep-Sleep input (DS) to HIGH. The CY7S1049G is available in 44-pin TSOP II, and 36-pin Molded SOJ (400 Mils). Product Portfolio Power Dissipation Product[4] CY7S1049G(E)18 Range Industrial CY7S1049G(E)30 VCC Range (V) Speed (ns) Operating ICC, (mA) f = fmax Deep-Sleep current (µA) Typ [5] Max Typ [5] Max Typ [5] Max 6 8 – 15 1.65 V–2.2 V 15 – 40 2.2 V–3.6 V 10 38 45 4.5–5.5 V 10 38 45 CY7S1049G(E) Standby, ISB2 (mA) Notes 1. This device does not support automatic write back on error detection. 2. SER FIT Rate 2001 V Storage temperature ................................ –65 C to +150 C Latch-up current .................................................... > 140 mA Ambient temperature with power applied ................................... –55 C to +125 C Operating Range Supply voltage on VCC relative to GND [10] ................. –0.5 V to VCC + 0.5 V DC voltage applied to outputs in HI-Z State [10] .................................. –0.5 V to VCC + 0.5 V Range Ambient Temperature VCC Industrial –40 C to +85 C 1.65 V to 2.2 V, 2.2 V to 3.6 V, 4.5 V to 5.5 V DC Electrical Characteristics Over the Operating Range of –40 C to +85 C Parameter VOH VOL VIH[10, 13] VIL [10, 13] Description Output HIGH voltage Output LOW voltage Input HIGH voltage Input LOW voltage Test Conditions 10 ns/ 15 ns Min Typ [11] Max 1.65 V to 2.2 V VCC = Min, IOH = –0.1 mA 1.4 – – 2.2 V to 2.7 V VCC = Min, IOH = –1.0 mA 2 – – 2.7 V to 3.6 V VCC = Min, IOH = –4.0 mA 2.4 – – 4.5 V to 5.5 V VCC = Min, IOH = –4.0 mA 2.4 – – [12] 4.5 V to 5.5 V VCC = Min, IOH = –0.1 mA – – 1.65 V to 2.2 V VCC = Min, IOL = 0.1 mA – – 0.2 2.2 V to 2.7 V VCC = Min, IOL = 2 mA – – 0.4 2.7 V to 3.6 V VCC = Min, IOL = 8 mA – – 0.4 4.5 V to 5.5 V VCC = Min, IOL = 8 mA – – 0.4 1.65 V to 2.2 V – 1.4 – VCC + 0.2 2.2 V to 2.7 V – 2 – VCC + 0.3 2.7 V to 3.6 V – 2 – VCC + 0.3 VCC – 0.5 4.5 V to 5.5 V – 2 – VCC + 0.5 1.65 V to 2.2 V – –0.2 – 0.4 2.2 V to 2.7 V – –0.3 – 0.6 2.7 V to 3.6 V – –0.3 – 0.8 4.5 V to 5.5 V – –0.5 – 0.8 GND < VIN < VCC –1 – +1 Unit V V V V A IIX Input leakage current IOZ Output leakage current GND < VOUT < VCC, Output disabled –1 – +1 A VCC operating supply current VCC = Max, IOUT = 0 mA, CMOS levels f = 100 MHz – 38 45 mA f = 66.7 MHz – – 40 Standby current – TTL inputs Max VCC, CE > VIH, VIN > VIH or VIN < VIL, f = fMAX – – 15 ICC ISB1 mA Notes 10. VIL (min) = –2.0 V and VIH (max) = VCC + 2 V for pulse durations of less than 20 ns. 11. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = 1.8 V (for VCC range of 1.65 V–2.2 V), VCC = 3 V (for VCC range of 2.2 V–3.6 V), and VCC = 5 V (for VCC range of 4.5 V–5.5 V), TA = 25 °C. 12. Guaranteed by design and not tested. 13. For the DS pin, VIH (min) is VCC – 0.2 V and VIL (max) is 0.2 V. Document Number: 001-95414 Rev. *F Page 6 of 21 CY7S1049G CY7S1049GE DC Electrical Characteristics (continued) Over the Operating Range of –40 C to +85 C Parameter Description Test Conditions 10 ns/ 15 ns Min Typ [11] Max Unit ISB2 Standby current – CMOS inputs Max VCC, CE > VCC – 0.2 V, DS > VCC – 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V, f = 0 – 6 8 mA IDS Deep-Sleep current – – 15 µA Max VCC, CE > VCC – 0.2 V, DS < 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V, f = 0 Capacitance Parameter [14] Description CIN Input capacitance COUT I/O capacitance Test Conditions TA = 25 C, f = 1 MHz, VCC(typ) All packages Unit 10 pF 10 pF Thermal Resistance Parameter [14] Description JA Thermal resistance (junction to ambient) JC Thermal resistance (junction to case) 44-pin TSOP II Unit Package Test Conditions 36-pin SOJ Package Still air, soldered on a 3 × 4.5 inch, four-layer printed circuit board 59.52 68.85 C/W 31.48 15.97 C/W Note 14. Tested initially and after any design or process changes that may affect these parameters. Document Number: 001-95414 Rev. *F Page 7 of 21 CY7S1049G CY7S1049GE AC Test Loads and Waveforms Figure 5. AC Test Loads and Waveforms [15] HI-Z Characteristics: VCC 50  Output VTH Z0 = 50  R1 Output 30 pF* * Including JIG and Scope (a) * Capacitive Load Consists of all Components of the Test Environment (b) All Input Pulses VHIGH GND R2  5 pF* 90% 90% 10% Rise Time: > 1 V/ns 10% (c) Fall Time: > 1 V/ns Parameters 1.8 V 3.0 V 5.0 V Unit R1 1667 317 317  R2 1538 351 351  VTH VCC/2 1.5 1.5 V VHIGH 1.8 3.0 3.0 V Note 15. Full-device AC operation assumes a 100-s ramp time from 0 to VCC(min) or 100-s wait time after VCC stabilization. Document Number: 001-95414 Rev. *F Page 8 of 21 CY7S1049G CY7S1049GE Data Retention Characteristics Over the Operating Range of –40C to +85 C Parameter Conditions [16] Description Min Max Unit 1.0 – V VDR VCC for data retention – ICCDR Data retention current VCC = VDR, CE > VCC – 0.2 V, DS > VCC – 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V – 8 mA tCDR [17] Chip deselect to data retention time – 0 – ns tR[17, 18] Operation recovery time 2.2 V < VCC < 5.5 V 10 – ns VCC < 2.2 V 15 – ns Data Retention Waveform Figure 6. Data Retention Waveform [18] VCC VCC(min) DATA RETENTION MODE VDR = 1.0 V tCDR VCC(min) tR CE Notes 16. DS signal must be HIGH during Data Retention Mode. 17. These parameters are guaranteed by design. 18. Full-device operation requires linear VCC ramp from VDR to VCC(min.)  100 s or stable at VCC(min.)  100 s. Document Number: 001-95414 Rev. *F Page 9 of 21 CY7S1049G CY7S1049GE Deep-Sleep Mode Characteristics Over the Operating Range of –40 C to +85 C Parameter Description Conditions Max Unit – 15 µA IDS Deep-Sleep mode current tPDS[19] Minimum time for DS to be LOW – for part to successfully exit Deep-Sleep mode 100 – ns tDS[20] DS assertion to Deep-Sleep – mode transition time – 1 ms tDSCD[19] DS deassertion to chip disable If tPDS > tPDS(min) – 100 s If tPDS < tPDS(min) – 0 s 300 – s tDSCA VCC = VCC (max), DS < 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V Min DS deassertion to chip access If tPDS > tPDS(min) (Active/Standby) If tPDS < tPDS(min) Figure 7. Active, Standby, and Deep-Sleep Operation Modes Chip  Access Allowed Not Allowed CE ENABLE/ DISABLE DON’T CARE Allowed DISABLE ENABLE/ DISABLE tPDS DS tDSCD tDS Mode Active/Standby  Mode Standby  Mode Deep Sleep Mode tDSCA Standby  Active/Standby  Mode Mode Notes 19. CE must be pulled HIGH within tDSCD time of DS de-assertion to avoid SRAM data loss. 20. After assertion of DS signal, device will take a maximum of tDS time to stabilize to Deep-Sleep current IDS. During this period, DS signal must continue to be asserted to logic level LOW to keep the device in Deep-Sleep mode. Document Number: 001-95414 Rev. *F Page 10 of 21 CY7S1049G CY7S1049GE AC Switching Characteristics Over the Operating Range of –40 C to +85 C Parameter [21] Description 10 ns 15 ns Min Max Min Max Unit Read Cycle tRC Read cycle time 10 – 15 – ns tAA Address to data valid – 10 – 15 ns tOHA Data hold from address change 3 – 3 – ns tACE CE LOW to data valid – 10 – 15 ns tDOE OE LOW to data valid – 4.5 – 8 ns 0 – 0 – ns – 5 – 8 ns 3 – 3 – ns – 5 – 8 ns 0 – 0 – ns – 10 – 15 ns tLZOE OE LOW to low impedance tHZOE [22, 23, 24] OE HIGH to HI-Z tLZCE CE LOW to low impedance tHZCE CE HIGH to HI-Z [22, 23, 24] tPU tPD Write Cycle CE LOW to power-up [22, 23, 24] [22, 23, 24] [24] CE HIGH to power-down [24] [25, 26] tWC Write cycle time 10 – 15 – ns tSCE CE LOW to write end 7 – 12 – ns tAW Address setup to write end 7 – 12 – ns tHA Address hold from write end 0 – 0 – ns tSA Address setup to write start 0 – 0 – ns tPWE WE pulse width 7 – 12 – ns tSD Data setup to write end 5 – 8 – ns tHD Data hold from write end 0 – 0 – ns tLZWE WE HIGH to low impedance [22, 23, 24] 3 – 3 – ns – 5 – 8 ns tHZWE WE LOW to HI-Z [22, 23, 24] Notes 21. Test conditions assume a signal transition time (rise/fall) of 3 ns or less, timing reference levels of 1.5 V (for VCC > 3 V) and VCC/2 (for VCC < 3 V), and input pulse levels of 0 to 3 V (for VCC > 3 V) and 0 to VCC (for VCC < 3 V). Test conditions for the read cycle use output loading shown in part (a) of Figure 5 on page 8, unless specified otherwise. 22. tHZOE, tHZCE, tHZWE, tLZOE, tLZCE, and tLZWE are specified with a load capacitance of 5 pF as in (b) of Figure 5 on page 8. Transition is measured 200 mV from steady state voltage. 23. At any temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any device. 24. These parameters are guaranteed by design. 25. The internal write time of the memory is defined by the overlap of WE = VIL, CE = VIL ,DS = VIH and WE, CE, signals must be LOW and DS must be HIGH to initiate a write, and a HIGH transition of any of WE, CE, signals or LOW transition on DS signal can terminate the operation. The input data setup and hold timing should be referenced to the edge of the signal that terminates the write. 26. The minimum write pulse width for Write Cycle No. 2 (WE Controlled, OE LOW) should be the sum of tHZWE and tSD. Document Number: 001-95414 Rev. *F Page 11 of 21 CY7S1049G CY7S1049GE Switching Waveforms Figure 8. Read Cycle No. 1 of CY7S1049G (Address Transition Controlled) [27, 28, 29] tRC ADDRESS tAA tOHA PREVIOUS DATAOUT VALID DATA I/O DATAOUT VALID Figure 9. Read Cycle No. 2 of CY7S1041GE (Address Transition Controlled) [27, 28, 29] tRC ADDRESS tAA tOHA DATA I/O PREVIOUS DATAOUT VALID DATAOUT VALID tAA tOHA ERR PREVIOUS ERR VALID ERR VALID Notes 27. The device is continuously selected. OE = VIL, CE = VIL. 28. WE is HIGH for read cycle. 29. DS is HIGH for chip access. Document Number: 001-95414 Rev. *F Page 12 of 21 CY7S1049G CY7S1049GE Switching Waveforms (continued) Figure 10. Read Cycle No. 3 (OE Controlled) [30, 31, 32] ADDRESS tRC CE tPD t HZCE t ACE OE t HZOE t DOE t LZOE DATA I /O HIGH IMPEDANCE DATA OUT VALID HIGH IMPEDANCE t LZCE tPU VCC SUPPLY CURRENT ISB Notes 30. WE is HIGH for read cycle. 31. Address valid prior to or coincident with CE LOW transition. 32. DS must be HIGH for chip access. Document Number: 001-95414 Rev. *F Page 13 of 21 CY7S1049G CY7S1049GE Switching Waveforms (continued) Figure 11. Write Cycle No. 1 (CE Controlled) [33, 34, 35] tWC ADDRESS tSA tSCE CE tAW tHA tPWE WE OE tHZOE tHD tSD DATA I/O DATAIN VALID Figure 12. Write Cycle No. 2 (WE Controlled, OE LOW) [33, 34, 35, 36] tW C AD D R ES S t S CE CE tS A tA W tH A tP W E WE t H ZW E D ATA I/O tS D t LZW E tH D D A TA IN VA LID Notes 33. The internal write time of the memory is defined by the overlap of WE = VIL, CE = VIL, DS = VIH and WE, CE signals must be LOW and DS must be HIGH to initiate a write, and a HIGH transition of any of WE, CE signals or LOW transition on DS signal can terminate the operation. The input data setup and hold timing should be referenced to the edge of the signal that terminates the write. 34. Data I/O is in HI-Z state if CE = VIH, or OE = VIH. 35. DS must be HIGH for chip access. 36. The minimum write pulse width for Write Cycle No. 2 (WE Controlled, OE LOW) should be sum of tHZWE and tSD. Document Number: 001-95414 Rev. *F Page 14 of 21 CY7S1049G CY7S1049GE Switching Waveforms (continued) Figure 13. Write Cycle No. 3 (WE Controlled) [37, 38, 39] tW C ADDRESS tS C E CE tA W tS A tH A tP W E WE OE tH Z O E D A T A I/O Note 40 tH D tS D D A T A IN  V A L ID Notes 37. The internal write time of the memory is defined by the overlap of WE = VIL, CE = VIL, DS = VIH and WE, CE, signals must be LOW and DS must be HIGH to initiate a write, and a HIGH transition of any of WE, CE, signals or LOW transition on DS signal can terminate the operation. The input data setup and hold timing should be referenced to the edge of the signal that terminates the write. 38. Data I/O is in HI-Z state if CE = VIH, or OE = VIH or DS = VIL. 39. DS must be HIGH for chip access. 40. During this period, the I/Os are in output state. Do not apply input signals. Document Number: 001-95414 Rev. *F Page 15 of 21 CY7S1049G CY7S1049GE Truth Table DS CE OE [41] X WE I/O0–I/O7 Mode Power [41] HIGH-Z Standby Standby (ISB) H H X H L L H Data out Read all bits Active (ICC) H L X L Data in Write all bits Active (ICC) H L H H HI-Z Selected, outputs disabled Active (ICC) L[42] X X X HI-Z Deep-Sleep Deep-Sleep Ultra Low Power (IDS) ERR Output – CY7S1049GE Output [43] 0 1 High-Z Mode Read operation, no single-bit error in the stored data. Read operation, single-bit error detected and corrected. Device deselected / outputs disabled / Write operation Notes 41. The input voltage levels on these pins should be either at VIH or VIL. 42. VIL on DS must be < 0.2 V. 43. ERR is an Output pin.If not used, this pin should be left floating. Document Number: 001-95414 Rev. *F Page 16 of 21 CY7S1049G CY7S1049GE Ordering Information Speed (ns) 10 Voltage Range 2.2 V–3.6 V Ordering Code Package Diagram Package Type (All Pb-free) CY7S1049G30-10VXI 51-85090 36-pin SOJ CY7S1049G30-10VXIT 51-85090 36-pin SOJ, Tape and Reel CY7S1049GE30-10VXI 51-85090 36-pin SOJ, ERR Output CY7S1049GE30-10VXIT 51-85090 36-pin SOJ, ERR Output, Tape and Reel Operating Range Industrial Ordering Code Definitions CY 7 S 1 04 9 G X XX - XX XX X X X X = blank or T blank = Bulk; T = Tape and Reel Temperature Range: X = I I = Industrial Pb-free Package Type: XX = V V = 36-pin SOJ Speed: XX = 10 10 = 10 ns Voltage Range: XX = 30 30 = 2.2 V to 3.6 V X = blank or E blank = without ERR output; E = with ERR Output Process Technology: Revision Code “G” = 65 nm Technology Data Width: 9 = × 8-bits Density: 04 = 4-Mbit Family Code: 1 = Fast Asynchronous SRAM family S = Deep-Sleep feature Marketing Code: 7 = SRAM Company ID: CY = Cypress Document Number: 001-95414 Rev. *F Page 17 of 21 CY7S1049G CY7S1049GE Package Diagrams Figure 14. 36-pin SOJ V36.4 (Molded) Package Outline, 51-85090 51-85090 *G Figure 15. 44-pin TSOP II Package Outline, 51-85087 51-85087 *E Document Number: 001-95414 Rev. *F Page 18 of 21 CY7S1049G CY7S1049GE Acronyms Acronym Document Conventions Description Units of Measure CE Chip Enable CMOS Complementary Metal Oxide Semiconductor °C degrees Celsius I/O Input/Output MHz megahertz OE Output Enable A microampere SOJ Small-Outline J-lead s microsecond SRAM Static Random Access Memory mA milliampere TSOP Thin Small Outline Package mm millimeter TTL Transistor-Transistor Logic ns nanosecond WE Write Enable  ohm ECC Write Enable % percent pF picofarad V volt W watt Document Number: 001-95414 Rev. *F Symbol Unit of Measure Page 19 of 21 CY7S1049G CY7S1049GE Document History Page Document Title: CY7S1049G/CY7S1049GE, 4-Mbit (512K words × 8-bit) Static RAM with PowerSnooze™ and Error Correcting Code (ECC) Document Number: 001-95414 Rev. ECN No. Orig. of Change Submission Date *B 5025315 VINI 11/24/2015 Changed status from Preliminary to Final. *C 5090263 NILE 01/18/2016 Updated Ordering Information: Updated part numbers. Completing Sunset Review. *D 5428860 NILE 09/07/2016 Updated Functional Description: Added Note 1 and referred the same note in “CY7S1049G/CY7S1049GE”. Updated Maximum Ratings: Updated Note 10 (Replaced “2 ns” with “20 ns”). Updated DC Electrical Characteristics: Changed minimum value of VOH parameter from 2.2 V to 2.4 V corresponding to Operating Range “2.7 V to 3.6 V” and Test Condition “VCC = Min, IOH = –4.0 mA”. Changed minimum value of VIH parameter from 2.2 V to 2 V corresponding to Operating Range “4.5 V to 5.5 V”. Updated Ordering Information: Updated part numbers. Updated to new template. *E 5981584 AESATMP8 12/01/2017 Updated logo and Copyright. *F 6120487 NILE 04/03/2018 Updated Features: Referred Note 1 in “Embedded ECC for single-bit error correction”. Added Note 2 and referred the same note in “Embedded ECC for single-bit error correction”. Updated Functional Description: Added Note 3 and referred the same note at the end of sentence “This device features fast access times (10 ns) and a unique ultra-low power Deep-Sleep mode”. Updated to new template. Completing Sunset Review. Document Number: 001-95414 Rev. *F Description of Change Page 20 of 21 CY7S1049G CY7S1049GE Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office closest to you, visit us at Cypress Locations. PSoC® Solutions Products Arm® Cortex® Microcontrollers Automotive cypress.com/arm cypress.com/automotive Clocks & Buffers Interface cypress.com/clocks cypress.com/interface Internet of Things Memory cypress.com/iot cypress.com/memory Microcontrollers cypress.com/mcu PSoC cypress.com/psoc Power Management ICs Cypress Developer Community Community | Projects | Video | Blogs | Training | Components Technical Support cypress.com/support cypress.com/pmic Touch Sensing cypress.com/touch USB Controllers Wireless Connectivity PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP | PSoC 6 MCU cypress.com/usb cypress.com/wireless © Cypress Semiconductor Corporation, 2015-2018. This document is the property of Cypress Semiconductor Corporation and its subsidiaries, including Spansion LLC (“Cypress”). This document, including any software or firmware included or referenced in this document (“Software”), is owned by Cypress under the intellectual property laws and treaties of the United States and other countries worldwide. Cypress reserves all rights under such laws and treaties and does not, except as specifically stated in this paragraph, grant any license under its patents, copyrights, trademarks, or other intellectual property rights. If the Software is not accompanied by a license agreement and you do not otherwise have a written agreement with Cypress governing the use of the Software, then Cypress hereby grants you a personal, non-exclusive, nontransferable license (without the right to sublicense) (1) under its copyright rights in the Software (a) for Software provided in source code form, to modify and reproduce the Software solely for use with Cypress hardware products, only internally within your organization, and (b) to distribute the Software in binary code form externally to end users (either directly or indirectly through resellers and distributors), solely for use on Cypress hardware product units, and (2) under those claims of Cypress's patents that are infringed by the Software (as provided by Cypress, unmodified) to make, use, distribute, and import the Software solely for use with Cypress hardware products. Any other use, reproduction, modification, translation, or compilation of the Software is prohibited. TO THE EXTENT PERMITTED BY APPLICABLE LAW, CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS DOCUMENT OR ANY SOFTWARE OR ACCOMPANYING HARDWARE, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. To the extent permitted by applicable law, Cypress reserves the right to make changes to this document without further notice. Cypress does not assume any liability arising out of the application or use of any product or circuit described in this document. Any information provided in this document, including any sample design information or programming code, is provided only for reference purposes. It is the responsibility of the user of this document to properly design, program, and test the functionality and safety of any application made of this information and any resulting product. Cypress products are not designed, intended, or authorized for use as critical components in systems designed or intended for the operation of weapons, weapons systems, nuclear installations, life-support devices or systems, other medical devices or systems (including resuscitation equipment and surgical implants), pollution control or hazardous substances management, or other uses where the failure of the device or system could cause personal injury, death, or property damage (“Unintended Uses”). A critical component is any component of a device or system whose failure to perform can be reasonably expected to cause the failure of the device or system, or to affect its safety or effectiveness. Cypress is not liable, in whole or in part, and you shall and hereby do release Cypress from any claim, damage, or other liability arising from or related to all Unintended Uses of Cypress products. You shall indemnify and hold Cypress harmless from and against all claims, costs, damages, and other liabilities, including claims for personal injury or death, arising from or related to any Unintended Uses of Cypress products. Cypress, the Cypress logo, Spansion, the Spansion logo, and combinations thereof, WICED, PSoC, CapSense, EZ-USB, F-RAM, and Traveo are trademarks or registered trademarks of Cypress in the United States and other countries. For a more complete list of Cypress trademarks, visit cypress.com. Other names and brands may be claimed as property of their respective owners. Document Number: 001-95414 Rev. *F Revised April 3, 2018 Page 21 of 21
CY7S1049GE30-10VXI 价格&库存

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