DS3644EVKIT#

3/29/2010 PRODUCT RELIABILITY REPORT FOR DS3644, Rev A3 Maxim Integrated Products 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Manager, Reliability Engineering Maxim Integrated Products 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email: don.lipps@maxim-ic.com ph: 972-371-3739 fax: 972-371-6016 Rev B, 1/3/08 Conclusion: The following qualification successfully meets the quality and reliability standards required of all Maxim products: DS3644, Rev A3 In addition, Maxim's continuous reliability monitor program ensures that all outgoing product will continue to meet Maxim's quality and reliability standards. The current status of the reliability monitor program can be viewed at http://www.maxim-ic.com/TechSupport /dsreliability.html. Device Description: A description of this device can be found in the product data sheet. You can find the product data sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm. Reliability Derating: The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that are temperature accelerated. AfT = exp((Ea/k)*(1/Tu - 1/Ts)) = tu/ts AfT = Acceleration factor due to Temperature tu = Time at use temperature (e.g. 55°C) ts = Time at stress temperature (e.g. 125°C) k = Boltzmann’s Constant (8.617 x 10-5 eV/°K) Tu = Temperature at Use (°K) Ts = Temperature at Stress (°K) Ea = Activation Energy (e.g. 0.7 ev) The activation energy of the failure mechanism is derived from either internal studies or industry accepted standards, or activation energy of 0.7ev will be used whenever actual failure mechanisms or their activation energies are unknown. All deratings will be done from the stress ambient temperature to the use ambient temperature. An exponential model will be used to determine the acceleration factor for failure mechanisms, which are voltage accelerated. AfV = exp(B*(Vs - Vu)) AfV = Acceleration factor due to Voltage Vs = Stress Voltage (e.g. 7.0 volts) Vu = Maximum Operating Voltage (e.g. 5.5 volts) B = Constant related to failure mechanism type (e.g. 1.0, 2.4, 2.7, etc.) The Constant, B, related to the failure mechanism is derived from either internal studies or industry accepted standards, or a B of 1.0 will be used whenever actual failure mechanisms or their B are unknown. All deratings will be done from the stress voltage to the maximum operating voltage. Failure rate data from the operating life test is reported using a Chi-Squared statistical model at the 60% or 90% confidence level (Cf). The failure rate, Fr, is related to the acceleration during life test by: Fr = X/(ts * AfV * AfT * N * 2) X = Chi-Sq statistical upper limit N = Life test sample size Rev B, 1/3/08 Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT rate is related to MTTF by: MTTF = 1/Fr NOTE: MTTF is frequently used interchangeably with MTBF. The calculated failure rate for this device/process is: FAILURE RATE: MTTF (YRS): 103071 FITS: 1.1 DEVICE HOURS: 827321919 FAILS: 0 Only data from Operating Life or similar stresses are used for this calculation. The parameters used to calculate this failure rate are as follows: Cf: 60% Ea: 0.7 B: 0 Tu: 25 °C Vu: 3.6 Volts The reliability data follows. At the start of this data is the device information. The next section is the detailed reliability data for each stress. The reliability data section includes the latest data available and may contain some generic data. Bold Product Number denotes specific product data. Device Information: Process: Passivation: Die Size: Number of Transistors: Interconnect: Gate Oxide Thickness: SA E35X-0.5um, 5V CMOS with embedded Array EEPROM, embedded RSE EEPROM, 18V CMOS, VNPN, P2-P1 Cap, LVMOSCAP, HVMOSCAP, Varactor Cap, CrSi R's & Laser Fuses, 3LM. TEOS Oxide-Nitride Passivation 187 x 155 142536 Aluminum / 0.5% Copper 120 Å ESD HBM DESCRIPTION DATE CODE/PRODUCT/LOT CONDITION ESD SENSITIVITY 1004 DS3644 WS046549D JESD22-A114 HBM 500 VOLTS 1 PUL'S 3 0 ESD SENSITIVITY 1004 DS3644 WS046549D JESD22-A114 HBM 1000 VOLTS 1 PUL'S 3 0 ESD SENSITIVITY 1004 DS3644 WS046549D JESD22-A114 HBM 2000 VOLTS 1 PUL'S 3 0 ESD SENSITIVITY 1004 DS3644 WS046549D JESD22-A114 HBM 4000 VOLTS 1 PUL'S 3 0 ESD SENSITIVITY 1004 DS3644 WS046549D JESD22-A114 HBM 8000 VOLTS 1 PUL'S 3 3 READPOIN QTY FAILS FA# No FA 3 Total: LATCH-UP DESCRIPTION DATE CODE/PRODUCT/LOT LATCH-UP I 1004 LATCH-UP V 1004 CONDITION READPOIN DS3644 WS046549D JESD78A, I-TEST 125C 6 0 DS3644 WS046549D JESD78A, V-SUPPLY TEST 125C 6 0 Total: Rev B, 1/3/08 QTY FAILS 0 FA# OPERATING LIFE DESCRIPTION DATE CODE/PRODUCT/LOT CONDITION HIGH TEMP OP LIFE 0839 DS2784 WJ942986T 125C, 4.6 V (PSA) & 15.0 1000 HRS V (PSB) 77 0 HIGH TEMP OP LIFE 0843 DS2784 WJ941766O 125C, 4.6 V (PSA) & 15.0 1000 HRS V (PSB) 77 0 HIGH TEMP OP LIFE 0848 DS2784 WJ943239LC 125C, 4.6 V (PSA) & 15.0 1000 HRS V (PSB) 77 0 HIGH TEMP OP LIFE 0914 DS2780 WJ944804A 125C, 5.5 VOLTS 1000 HRS 77 0 HIGH TEMP OP LIFE 0916 DS2784 WJ943240IC 125C, 5.5 V (PSA) & 15.0 1000 HRS V (PSB) 77 0 HIGH TEMP OP LIFE 0916 DS2784 WJ945481A 125C, 5.5 V (PSA) & 15.0 1000 HRS V (PSB) 77 0 HIGH TEMP OP LIFE 0922 DS36A92 WJ946542A 125C, 3.6 VOLTS 192 HRS 45 0 HIGH TEMP OP LIFE 0932 MAX17043 WJ946441P 125C, 4.5V (PSA) & 9.2V (PSB) 192 HRS 45 0 HIGH TEMP OP LIFE 0933 DS1873 QJ917612BC 125C, 4.2 VOLTS 192 HRS 77 0 HIGH TEMP OP LIFE 0937 DS2784 WJ046898JC 125C, 5.5 V (PSA) & 15.0 1000 HRS V (PSB) 77 0 HIGH TEMP OP LIFE 0940 DS2784 WJ048759A 125C, 5.5 V (PSA) & 15.0 1000 HRS V (PSB) 80 0 HIGH TEMP OP LIFE 0946 DS1876 WJ048840A 125C, 4.2 VOLTS 192 HRS 77 0 HIGH TEMP OP LIFE 0948 DS1091L WJ946344E 150C, 3.6 VOLTS 408 HRS 45 0 HIGH TEMP OP LIFE 0948 DS1091L WJ946344E 150C, 3.6 VOLTS 408 HRS 45 0 HIGH TEMP OP LIFE 0951 DS2784 WJ049559A 125C, 5.5 V (PSA) & 15.0 1000 HRS V (PSB) 80 0 HIGH TEMP OP LIFE 1004 DS3644 WS046549D 125C, 3.6V (PSA) & 3.3V (PSB) 45 0 READPOIN 192 HRS Total: FAILURE RATE: Rev B, 1/3/08 MTTF (YRS): 103071 FITS: 1.1 DEVICE HOURS: 827321919 FAILS: 0 QTY FAILS 0 FA#