MX7543SQ/883B

MX7543SQ/883B

  • 厂商:

    AD(亚德诺)

  • 封装:

    CDIP16

  • 描述:

    IC DAC 12BIT A-OUT 16CDIP

  • 数据手册
  • 价格&库存
MX7543SQ/883B 数据手册
SCOPE: CMOS, Serial, 12-Bit D/A Converter Device Type: -01 -02 -03 Generic Number: MX7543S(x)/883B MX7543T(x)/883B MX7543GT(x)/883B Case Outline(s). Outline Letter Q E Mil-Std-1835 GDIP1-T16 or CDIP2-T16 CQCC1-N20 Case Outline Package Code 16 Lead CERDIP J16 20-Pin Ceramic LCC L20 Absolute Maxi mum Ratings: (TA=+25°C, unless otherwise noted.) VDD to AGND ........................................................................................……….... 0V, +7V VDD to DGND ......................................................................................…..….…... 0V, +7V AGND to DGND …………………………………………………………………….... VDD DGND to AGND …………………………………………………………………….... VDD Digital Input Voltage to DGND .....................................................……….... -0.3V to +15V VOUT1, VOUT2 to AGND ...............................................……………………... -0.3V to +15V VREF to AGND ......................................................................................…... -25V to +25V VRFB to AGND ......................................................................................…..... -25V to +25V Lead Temperature (soldering, 10 seconds) ................................................................. +300°C Storage Temperature .................................................................................... -65°C to +150°C Continuous Power Dissipation ........................................................................….. TA=+70°C 16 pin CERDIP(derate 10mW/°C above +70°C) .................................….............….. 800mW 20 pin LCC(derate 9.09mW/°C above +70°C) .....................................................…... 727mW Junction Temperature TJ .....................................................................................….. +150°C Thermal Resistance, Junction to Case, ΘJC 16 pin CERDIP................................................................................................…... 50°C/W 20 pin LCC .....................................................................................................…... 20°C/W Thermal Resistance, Junction to Ambient, ΘJA: 16 pin CERDIP..............................................................................................…... 100°C/W 20 pin LCC ...................................................................................................…... 110°C/W Recommended Operating Conditions Ambient Operating Range (TA) ...........................................................….. -55°C to +125°C Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ------------------------------------- Electrical Characteristics of MX7543/883B 19-2453 Page 2 of Rev. B 7 TABLE 1. ELECTRICAL TESTS: TEST Symbol Resolution Relative Accuracy RES RA Differential Nonlinearity DNL Gain Error NOTE 2 Gain Error NOTE 2 Gain Tempco Power-Supply Rejection OUT1 Leakage Current OUT2 Leakage Current Output Current Settling Time NOTE 3 AE Feedthrough Error NOTE 3 Reference Input Resistance Digital Input High Voltage Digital Input Low Voltage Digital Input Leakage Current Digital Input Capacitance NOTE 3 Output Capacitance NOTE 3 FTE CONDITIONS 1/ -55°C≤TA≤+125°C Unless otherwise specified Guaranteed but not tested GROUP A Subgroup All Monotonic to 11-Bit All Monotonic to 12-Bit 1 2,3 1 2,3 AE TCAE PSRR IOUT1 IOUT2 tSL NOTE 3 VDD=±5% (∆Gain/∆VDD) DAC register loaded with all 0s DAC register loaded with all 1s To ±0.5LSB, OUT1 load is 100 Ω in parallel with13pF. Output measured from falling edge of ____ ____ LD1 and LD2. VREF=10V, 10kHz sine wave 1 2,3 1 2,3 1 2,3 Device type Limits Min Limits Max All 01 02,03 01 12 -1 -0.5 -2 02,03 01,02 -1 -12.3 -14.5 -1 -2 -5 -0.005 -0.01 -1 -200 -1 -200 All 2.5 mVp-p 25 kΩ All All All All All 8 VIH 1,2,3 All 3.0 VIL 1,2,3 All 1,2,3 All CIN COUT1 0.8 -1 All COUT2 ppm/°C %/%VDD nA nA µs V 1 µA 8 pF pF 75 Digital inputs at VIL, DAC register loaded with all 0s Digital inputs at VIH, DAC register loaded with all 1s 75 All pF 260 Digital inputs at VIL, DAC register loaded with all 0s Electrical Characteristics of MX7543/883B LSB 260 Digital inputs at VIH, DAC register loaded with all 1s ------------------------------------- LSB V All Output Capacitance NOTE 3 LSB All 03 1,2,3 VIN=0V or VDD Bits LSB 1 12.3 14.5 1 2 5 0.005 0.01 1 200 1 200 2 RIN IIN 1 0.5 2 Units 19-2453 Page 3 of Rev. B 7 TABLE 1. ELECTRICAL TESTS: TEST Symbol Serial Input to Strobe Setup Time NOTE 3 tDS1 Serial Input to Strobe Hold Time NOTE 3 SRI Data Pulse Width NOTE 3 Strobe Pulse Width NOTE 3 tDS2 CONDITIONS 1/ -55°C≤TA≤+125°C Unless otherwise specified STB1 GROUP A Subgroup Device type Limits Min All Limits Max 100 40 tDS3 STB2 _____ STB3 tDS4 STB4 0 tDH1 STB1 tDH2 200 tDH3 STB2 _____ STB3 tDH4 STB4 250 ns 0 All 70 ns 250 tSRI All 160 ns All 160 ns tSTB1 STB1 tSTB2 180 tSTB3 STB2 _____ STB3 tSTB4 STB4 230 230 Load Pulse Width tLD1 All 300 NOTE 3 300 tLD2 tASB Time Between All 80 Strobing LSB into Register A and Loading Register B NOTE 3 CLEAR Pulse tCLR All 400 Width NOTE 3 NOTE 1: VDD=+5V, VOUT1=VOUT2=0V, VREF=+10V, unless otherwise noted. NOTE 2: Measured using internal feedback resistor; includes effects of leakage current and gain TC. NOTE 3: Characteristics supplied for use as a typical design limit but not production tested. ------------------------------------- Units Electrical Characteristics of MX7543/883B 19-2453 Page 4 of Rev. B 7 ns ns ns TERMINAL CONNECTIONS: MX7543 J16 L20 1 OUT1 NC 11 2 OUT2 OUT1 12 J16 STB4 DGND 3 AGND OUT2 13 4 5 STB1 ____ LD1 NC SRI AGND STB1 14 15 NC ____ LD1 NC SRI 16 17 18 19 NC ____ CLR VDD VREF STB2 20 RFB 6 7 8 9 10 STB2 ____ LD2 _____ STB3 ____ CLR VDD VREF 1 ↓ 1 X 0 X X ↑ 0 0 X X 1 X 0 0 0 X X X 1 STB4 DGND RFB MODE CONTROL TABLE: LOGIC INPUTS REGISTER A REGISTER B CONTROL INPUTS CONTROL INPUTS _____ ____ ____ STB4 STB3 STB2 STB1 CLR LD2 LD1 0 1 0 X X X ↑ 0 0 ↑ 1 X X X L20 NC ____ LD2 STB3 X X X X X X X X X 0 X X 1 1 1 1 X 0 X 1 0 OPERATION NOTES Data appearing at SRI strobed into register A Same as above Same as above Same as above No operation (Register A) 1,2 1,2 1,2 1,2 2 Clear Register B to code all 0s (Asynchronous Operation) No Operation (Register B) 2,3 Load Register B with contents of Register A 2 2 NOTE 1: Serial data is loaded into Register A MSB first, on edges as shown in timing diagram in commercial datasheet. NOTE 2: 0=Logic Low, 1=Logic High, X=Don’t care. NOTE 3: CLR=0 asynchronously resets Register B to all 0s, but has no effect on Register A. ------------------------------------- Electrical Characteristics of MX7543/883B 19-2453 Page 5 of Rev. B 7 ORDERING INFORMATION: 01 J16 MX7543SQ/883B 01 L20 MX7543SE/883B 02 J16 MX7543TQ/883B 02 L20 MX7543TE/883B 03 J16 MX7543GTQ/883B 03 L20 MX7543GTE/883B QUALITY ASSURANCE Sampling and inspection procedures shall be in accordance with Mil-Prf-38535, Appendix A as Specified in Mil-Std-883. Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015: 1. Test Condition, A, B, C, or D. 2. TA = +125°C, minimum. 3. Interim and final electrical test requirements shall be specified in Table 2. Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, Including Groups A, B, C, and D inspection. Group A inspection: 1. Tests as specified in Table 2. 2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted. Group C and D inspections: a. End-point electrical parameters shall be specified in Table 1. b. Steady-state life test, Method 1005 of Mil-Std-883. 1. Test condition A, B, C, D. 2. TA = +125°C, minimum. 3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883. TABLE 2. ELECTRICAL TEST REQUIREMENTS Mil-Std-883 Test Requirements Interim Electric Parameters Method 5004 Final Electrical Parameters Method 5005 Group A Test Requirements Method 5005 Group C and D End-Point Electrical Parameters Method 5005 * Subgroups Per Method 5005, Table 1 1 1*, 2, 3 1, 2, 3 1 PDA applies to Subgroup 1 only. ------------------------------------- Electrical Characteristics of MX7543/883B 19-2453 Page 6 of Rev. B 7
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