MX7545UQ/883B

SCOPE: CMOS, 12-BIT BUFFERED, MULTIPLYING D/A CONVERTER Device Type 01 02 03 04 Generic Number MX7545S(x)/883B MX7545T(x)/883B MX7545U(x)/883B MX7545GU(x)/883B Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows: Outline Letter Mil-Std-1835 Q GDIP1-T20 or CDIP2-T20 E CQCC1-N20 Case Outline 20 LEAD CERDIP 20 LCC Package Code J20 L20 Absolute Maximum Ratings: VREF to GND ..............................................................................................…….. -0.3V, + 17V Digital Input to DGND ...............................................................................…..... -0.3V to VDD VRFB to GND .........................................................................................................……... ±25V VREF to GND ..........................................................................................................….…. ±25V VOUT1 to AGND ........................................................................................……... -0.3V to VDD AGND to DGND ........................................................................................……. -0.3V to VDD Lead Temperature (soldering, 10 seconds) ....................................................................... +300°C Storage Temperature .......................................................................................... -65°C to +150°C Continuous Power Dissipation .........................................................................……... TA=+70°C 20 pin CERDIP(derate 11.1mW/°C above +70°C) ..................................................……. 889mW 20 pin LCC(derate 9.1mW/°C above +70°C) ........................................................……... 727mW Junction Temperature TJ .....................................................................................……... +150°C Thermal Resistance, Junction to Case, ΘJC 20 pin CERDIP................................................................................................…….... 40°C/W 20 pin LCC .....................................................................................................…….... 20°C/W Thermal Resistance, Junction to Ambient, ΘJA: 20 pin CERDIP...............................................................................................……..... 90°C/W 20 pin LCC ...................................................................................................………. 110°C/W Recommended Operating Conditions Ambient Operating Range (TA) ........................................................………... -55°C to +125°C Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ---------------------------- Electrical Characteristics of MX7545/883B 19-2454 Page 2 of Rev. B 7 TABLE 1. ELECTRICAL TESTS: Symbol CONDITIONS -55 °C ≤TA≤ +125°C 1/ Unless otherwise specified ACCURACY Resolution NOTE 2 RES VDD=+5V and +15V Relative Accuracy RA VDD=+5V and +15V TEST Group A Subgroup 12-bit monotonic, VDD=+5V and +15V VDD=5V Gain Error NOTE 3 ±1.0 1,2,3 01 02 ±20 ±10 1 2,3 03 ±5.0 ±6.0 NOTE 3 1,2,3 AE 1 2,3 Gain Temperature Coefficient NOTE 2 TCAE Power Supply Rejection PSRR 01 02 03,04 01 02 03 04 All 1 2,3 All ∆VDD=±5%, VDD=15V 1 2,3 1 2,3 4 All Out1 Leakage Current IOUT1 VDD=+5V & +15V, ___ __ D0-D11=0V, WR=CS=0V Output Current Settling Time NOTE 2 tSL Output Current Settling Time NOTE 2 tSL Feedthrough Error NOTE 2, NOTE 4 FTE VDD=5V, To ±0.5LSB. OUT1 load is 100Ω| | 13pF, from___ __ falling edge of WR with CS =0V VDD=15V. To ±0.5LSB. OUT1 load is 100Ω, output measured from trailing edge of ___ __ WR with CS=0V VREF=±10V, 10kHz sine wave VDD=5V 1.0 2.0 ±25 ±15 ±10 ±6.0 ±7.0 ±5 Electrical Characteristics of MX7545/883B LSB LSB LSB ppm/°C ±10 ±0.015 ±0.03 %/% All ±0.01 ±0.02 ±10 ±200 2 µs 4 All 2 µs 4 All 10 VREF=±10V, 10kHz sine wave VDD=15V ---------------------------- LSB 04 VDD=+5V VDD=+15V ∆VDD=±5%, VDD=5V Units Bits 02,03, 04 1 2,3 Gain Error 12 01 AE VDD=15V Limits Max ±2.0 ±1.0 ±0.5 ±4.0 1,2,3 1,2,3 DNL Limits Min All 10-bit monotonic, VDD=+5V and +15V Differential Nonlinearity Device type 19-2454 Page 3 of Rev. B 7 nA mVp-p Symbol CONDITIONS -55 °C ≤TA≤ +125°C 1/ Unless otherwise specified Input Resistance Digital Input High Voltage RIN VIH VDD=+5V and +15V VDD=+5V Digital Input Low Voltage VIL TEST Digital Input Leakage Current Digital Input Capacitance NOTE 2 Output Capacitance NOTE 2 Group A Device type Limits Min Limits Max 1,2,3 All 7 2.4 25 1,2,3 All Subgroup VDD=+15V VDD=+5V IIN CIN COUT1 0.8 All 4 All Data-Setup Time NOTE 5 Data-Hold Time NOTE 5 Supply Current V 1.5 ±1.0 ±10 5 µA 20 pF D0-D11, VIN=0V, VDD=15V ___ __ WR, CS, VIN=0V, VDD=15V VDD=5V ___ __ D0-D11=0V, WR, CS=0V 5 20 70 pF 200 4 Chip Select to Write-Hold Time NOTE 5 Write Pulse Width NOTE 5 All 1 2,3 ___ __ VDD=5V D0-D11=VDD, WR, CS=0V Chip Select to WriteSetup Time NOTE 5 kΩ V 13.5 1,2,3 VDD=+15V VIN=0V or VDD VDD=+5V or +15V D0-D11, VDD=5V ___ __ WR, CS, VDD=5V Units tCS VDD=15V ___ __ D0-D11=0V, WR, CS=0V 70 VDD=15V ___ __ D0-D11=VDD, WR, CS=0V VDD=5V 200 380 9 tCH VDD=15V VDD=+5V and +15V tWR VDD=+5V tDS All 9 All tCS≥tWR, tCH≥0, VDD=15V VDD=5V ns ns 240 210 VDD=15V VDD=+5V and +15V All digital inputs VIL or VIH VDD=+5V and +15V 9 1,2,3 All digital inputs 0V or VDD VDD=+5V and +15V 1 2,3 Electrical Characteristics of MX7545/883B ns 200 0 400 All All ns 120 30 ns 2.0 All IDD ---------------------------- All 9 9 tDH All µA 100 500 19-2454 Page 4 of Rev. B 7 NOTE 1: NOTE 2: NOTE 3: NOTE 4: NOTE 5: VDD=+15V, VOUT1=0V; VREF=+10V, AGND=DGND, unless otherwise specified. Characteristics supplied for use as a typical design limit, but not production tested. Measured using internal feedback resistor and includes effect of 5ppm max gain TC. Feedthrough error can be reduced by connecting the metal lid on the package to ground. Timing Diagram. See Commercial Datasheet ORDERING INFORMATION: Package Pkg. Code 01 20 pin CERDIP J20 01 20 pin LCC L20 02 20 pin CERDIP J20 02 20 pin LCC L20 03 20 pin CERDIP J20 03 20 pin LCC L20 04 20 pin CERDIP J20 04 20 pin LCC L20 MAXIM PART # MX7545SQ/883B MX7545SE/883B MX7545TQ/883B MX7545TE/883B MX7545UQ/883B MX7545UE/883B MX7545GUQ/883B MX7545GUE/883B TERMINAL CONNECTIONS: J20 & L20 Pin 1 OUT1 2 AGND 3 DGND 4 D11(MSB) 5 D10 6 D9 7 D8 8 D7 9 D6 10 D5 11 D4 12 D3 13 D2 14 D1 15 D0(LSB) 16 __ CS 17 ___ WR 18 VDD 19 VREF 20 RFB ---------------------------- Electrical Characteristics of MX7545/883B 19-2454 Page 5 of Rev. B 7 QUALITY ASSURANCE Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in MilStd-883. Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015: 1. Test Condition, A, B, C, or D. 2. TA = +125°C minimum. 3. Interim and final electrical test requirements shall be specified in Table 2. Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B, C, and D inspection. Group A inspection: 1. Tests as specified in Table 2. 2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted. Group C and D inspections: a. End-point electrical parameters shall be specified in Table 1. b. Steady-state life test, Method 1005 of Mil-Std-883: 1. Test condition A, B, C, D. 2. TA = +125°C, minimum. 3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883. TABLE 2. ELECTRICAL TEST REQUIREMENTS Mil-Std-883 Test Requirements Interim Electric Parameters Method 5004 Final Electrical Parameters Method 5005 Group A Test Requirements Method 5005 Group C and D End-Point Electrical Parameters Method 5005 * ** Subgroups per Method 5005, Table 1 1 1*, 2, 3, 9 1, 2, 3, 4**, 9 1 PDA applies to Subgroup 1 only. Subgroup 4 shall be tested at initial qualification and upon redesign. Sample size will be 116 units. ---------------------------- Electrical Characteristics of MX7545/883B 19-2454 Page 6 of Rev. B 7