3D7522
MONOLITHIC MANCHESTER DECODER (SERIES 3D7522)
FEATURES
• • • • • • • All-silicon, low-power CMOS technology TTL/CMOS compatible inputs and outputs Vapor phase, IR and wave solderable Low ground bounce noise Maximum data rate: 50 MBaud Data rate range: ±15% Lock-in time: 1 bit
data 3 delay devices, inc.
PACKAGES
RX N/C N/C 1 2 3 4 5 6 7 14 13 12 11 10 9 8 N/C N/C N/C N/C N/C
VDD
RX CLK N/C GND
1 2 3 4
8 7 6 5
VDD N/C N/C DATB
CLK N/C N/C GND
DATB
3D7522Z-xxx
SOIC (.150)
3D7522D-xxx SOIC (.150)
For mechanical dimensions, click here. For package marking details, click here.
FUNCTIONAL DESCRIPTION
PIN DESCRIPTIONS
The 3D7522 product family consists of monolithic CMOS Manchester RX Signal Input Decoders. The unit accepts at the RX input a bi-phase-level, CLK Signal Output (Clock) embedded-clock signal. In this encoding mode, a logic one is DATB Signal Output (Data) represented by a high-to-low transition within the bit cell, while a logic VDD +5 Volts zero is represented by a low-to-high transition. The recovered clock GND Ground and data signals are presented on CLK and DATB, respectively, with the data signal inverted. The operating baud rate (in MBaud) is specified by the dash number. The input baud rate may vary by as much as ±15% from the nominal device baud rate without compromising the integrity of the information received. Because the 3D7522 is not PLL-based, it does not require a long preamble in order to lock onto the received signal. Rather, the device requires at most one bit cell before the data presented at the output is valid. This is extremely useful in cases where the information arrives in bursts and the input is otherwise turned off. The all-CMOS 3D7522 integrated circuit has been designed as a reliable, economic alternative to hybrid TTL Manchester Decoders. It is TTL- and CMOS-compatible, capable of driving ten 74LS-type loads. It is offered in space saving surface mount 8-pin and 14-pin SOICs.
TABLE 1: PART NUMBER SPECIFICATIONS
PART NUMBER
3D7522-0.5 3D7522-1 3D7522-5 3D7522-10 3D7522-20 3D7522-25 3D7522-50
BAUD RATE (MBaud) Nominal Minimum Maximum
0.50 1.00 5.00 10.00 20.00 25.00 50.00 0.43 0.85 4.25 8.50 17.00 21.25 42.50 0.57 1.15 5.75 11.50 23.00 28.75 57.50
NOTES: Any baud rate between 0.5 and 50 MBaud not shown is also available at no extra cost. 2007 Data Delay Devices
Doc #06002
10/31/2007
DATA DELAY DEVICES, INC.
3 Mt. Prospect Ave. Clifton, NJ 07013
1
3D7522
APPLICATION NOTES
The 3D7522 Manchester Decoder samples the input at precise pre-selected intervals to retrieve the data and to recover the clock from the received data stream. Its architecture comprises finely tuned delay elements and proprietary circuitry which, in conjunction with other circuits, implement the data decoding and clock recovery function.
OUTPUT SIGNAL CHARACTERISTICS
The 3D7522 presents at its outputs the decoded data (inverted) and the recovered clock. The decoded data is valid at the rising edge of the clock. The clock recovery function operates in two modes dictated by the input data stream bit sequence. When a data bit is succeeded by its inverse, the clock recovery circuit is engaged and forces the clock output low for a time equal to one over tw ice the baud rate. Otherwise, the input is presented at the clock output unchanged, shifted in time. When engaged, the clock recovery circuit generates a low-going pulse of fixed width. Therefore, the clock duty cycle is strongly dependent on the baud rate, as this will affect the clock-high duration. The clock output falling edge is not operated on by the clock recovery circuitry. It, therefore, preserves more accurately the clock frequency information embedded in the transmitted data. Therefore, it can be used, if it is desired, to retrieve clock frequency information.
INPUT SIGNAL CHARACTERISTICS
Encoded data transmitted from a source arrives at its destination corrupted. Such corruption of the received data manifests itself as jitter and/or pulse width distortion at the input to the device. The instantaneous deviations from nominal Baud Rate and/or Pulse Width (high or low) adversely impact the data extraction and clock recovery function if their published limits are exceeded. See Table 4, Allow ed Baud Rate/Duty Cycle. The 3D7522 Manchester Decoder Data Input is TTL compatible. The user should assure that the 1.5 volt TTL threshold is used when referring to all timing, especially the input pulse widths.
FREQUENCY (JITTER) ERRORS
The 3D7522 Manchester Decoder, being a selftimed device, is tolerant of frequency modulation (jitter) present in the input data stream, provided that the input data pulse width variations remain within the allowable ranges.
POWER SUPPLY AND TEMPERATURE CONSIDERATIONS
CMOS integrated circuitry is strongly dependent on power supply and temperature. The monolithic 3D7522 Manchester Decoder utilizes novel and innovative compensation circuitry to minimize timing variations induced by fluctuations in power supply and/or temperature. . 1
ENCODED RECEIVED (RX)
0
1
0
1
0
0
1
tC tCL
CLOCK (CLK) DATA (DATB) DECODED
tCW L
tCD
1
0
1
1
0
0
1
Figure 1: T iming Diagram
Doc #06002
10/31/2007
DATA DELAY DEVICES, INC.
Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com
2
3D7522
DEVICE SPECIFICATIONS
TABLE 2: ABSOLUTE MAXIMUM RATINGS
PARAMETER DC Supply Voltage Input Pin Voltage Input Pin Current Storage Temperature Lead Temperature SYMBOL VDD VIN IIN TSTRG TLEAD MIN -0.3 -0.3 -10 -55 MAX 7.0 VDD+0.3 10 150 300 UNITS V V mA C C NOTES
25C 10 sec
TABLE 3: DC ELECTRICAL CHARACTERISTICS
(-40C to 85C, 4.75V to 5.25V) PARAMETER Static Supply Current* High Level Input Voltage Low Level Input Voltage High Level Input Current Low Level Input Current High Level Output Current Low Level Output Current Output Rise & Fall Time SYMBOL IDD VIH VIL IIH IIL IOH IOL TR & TF MIN 2.0 0.8 1.0 1.0 -4.0 4.0 2 MAX 5 UNITS mA V V µA µA mA mA ns NOTES
VIH = VDD VIL = 0V VDD = 4.75V VOH = 2.4V VDD = 4.75V VOL = 0.4V CLD = 5 pf
*IDD(Dynamic) = 2 * CLD * VDD * F where: CLD = Average capacitance load/pin (pf) F = Input frequency (GHz)
Input Capacitance = 10 pf typical Output Load Capacitance (CLD) = 25 pf max
TABLE 4: AC ELECTRICAL CHARACTERISTICS
(-40C to 85C, 4.75V to 5.25V, except as noted) PARAMETER Nominal Input Baud Rate Allowed Input Baud Rate Deviation Allowed Input Baud Rate Deviation Allowed Input Baud Rate Deviation Allowed Input Duty Cycle Bit Cell Time Input Data Edge to Clock Falling Edge Clock Width Low Clock Falling Edge to Data Transition
SYMBOL
fBN fB fB fB tc tCL tCWL tCD
MIN 5 -0.15 fBN -0.05 fBN -0.03 fBN 42.5
TYP
MAX 50 0.15 fBN 0.05 fBN 0.03 fBN
UNITS MBaud MBaud MBaud MBaud % ns ns ns ns
NOTES 0C to 70C 25C, 5.00V 4.75V to 5.25V -55C to 125C 4.75V to 5.25V
3.0
50.0 1000/fB 0.75 tc 500/fBN 4.0
57.5
±2ns or 5%
5.0
Doc #06002
10/31/2007
DATA DELAY DEVICES, INC.
3 Mt. Prospect Ave. Clifton, NJ 07013
3
3D7522
SILICON DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT: Ambient Temperature: 25oC ± 3oC Supply Voltage (Vcc): 5.0V ± 0.1V Input Pulse: High = 3.0V ± 0.1V Low = 0.0V ± 0.1V Source Impedance: 50Ω Max. Rise/Fall Time: 3.0 ns Max. (measured between 0.6V and 2.4V ) Pulse Width: PWIN = 1/(2*BAUD) Period: PERIN = 1/BAUD OUTPUT: Rload: Cload: Threshold: 10KΩ ± 10% 5pf ± 10% 1.5V (Rising & Falling)
Dev ice Under Test
10KΩ 5pf
Digital Scope
470Ω
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER SYSTEM
PRINTER
W AVEFORM GENERATOR
OUT TRIG
IN
DEVICE UNDER TEST (DUT)
OUT
IN TRIG
DIGITAL SCOPE
Figure 2: T est Setup
PERIN PW IN tRISE INPUT SIGNAL
2.4V 1.5V 0.6V
tFALL VIH
2.4V 1.5V 0.6V
VIL tPHL
tPLH OUTPUT SIGNAL
1.5V
VOH
1.5V
VOL
Figure 3: T iming Diagram
Doc #06002
10/31/2007
DATA DELAY DEVICES, INC.
Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com
4
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