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HM51W17805LTS-7

HM51W17805LTS-7

  • 厂商:

    ELPIDA

  • 封装:

  • 描述:

    HM51W17805LTS-7 - 16 M EDO DRAM (2-Mword x 8-bit) 2 k Refresh - Elpida Memory

  • 数据手册
  • 价格&库存
HM51W17805LTS-7 数据手册
HM51W17805 Series 16 M EDO DRAM (2-Mword × 8-bit) 2 k Refresh EO Description Features E0155H10 (Ver. 1.0) (Previous ADE-203-631D (Z)) Jun. 27, 2001 The HM51W 17805 is a C MOS dynamic R AM orga nized 2, 097,152-w ord × 8-bit. It employs the most adva nce d C MOS tec hnology for high per forma nce and low powe r. The HM51W 17805 off ers Extende d Da ta Out (ED O) P age Mode as a high spee d ac ce ss mode. Multiplexe d addr ess input per mits the HM51W 17805 to be packaged in standard 28-pin plastic SOJ and 28-pin TSOP. • Single 3.3 V (±0.3 V) • Access time: 50 ns/60 ns/70 ns (max) • Power dissipation  Active mode: 396 mW/360 mW/324 mW (max)  Standby mode : 7.2 mW (max) : 0.54 mW (max) (L-version) • EDO page mode capability • Long refresh period  2048 refresh cycles : 32 ms : 128 ms (L-version) • 4 variations of refresh  RAS -only refresh  CAS -before-RAS refresh  Hidden refresh  Self refresh (L-version) • Battery backup operation (L-version) Elpida Memory, Inc. is a joint venture DRAM company of NEC Corporation and Hitachi, Ltd. LP ro du ct HM51W17805 Series Ordering Information Type No. Access time 50 ns 60 ns 70 ns 50 ns 60 ns 70 ns 50 ns 60 ns 70 ns 50 ns 60 ns 70 ns 50 ns 60 ns 70 ns 50 ns 60 ns 70 ns 50 ns 60 ns 70 ns 50 ns 60 ns 70 ns 300-mil 28-pin plastic TSOP II (TTP-28DB) 400-mil 28-pin plastic TSOP II (TTP-28DA) 300-mil 28-pin plastic SOJ (CP-28DNA) Package 400-mil 28-pin plastic SOJ (CP-28DA) HM51W17805J-5 HM51W17805J-6 HM51W17805J-7 EO HM51W17805LJ-5 HM51W17805LJ -6 HM51W17805LJ -7 HM51W17805S-5 HM51W17805S-6 HM51W17805S-7 HM51W17805LS-5 HM51W17805LS-6 HM51W17805LS-7 HM51W17805TT-5 HM51W17805TT-6 HM51W17805TT-7 HM51W17805TS-5 HM51W17805TS-6 HM51W17805TS-7 2 HM51W17805LTT-5 HM51W17805LTT-6 HM51W17805LTT-7 HM51W17805LTS-5 HM51W17805LTS-6 HM51W17805LTS-7 LP Data Sheet E0155H10 ro du ct HM51W17805 Series EO VCC I/O0 I/O1 I/O2 I/O3 WE RAS NC A10 A0 A1 A2 A3 VCC Pin Arrangement HM51W17805J/LJ Series HM51W17805S/LS Series 1 2 3 4 5 6 7 8 9 28 27 26 25 24 23 22 21 20 19 18 17 16 15 VSS I/O7 I/O6 I/O5 I/O4 CAS OE A9 A8 A7 A6 A5 A4 HM51W17805TT/LTT Series HM51W17805TS/LTS Series VCC I/O0 I/O1 I/O2 I/O3 WE RAS NC A10 A0 A1 A2 A3 VCC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 (Top view) 28 27 26 25 24 23 22 21 20 19 18 17 16 15 VSS I/O7 I/O6 I/O5 I/O4 CAS OE A9 A8 A7 A6 A5 A4 VSS Pin Description Pin name A0 to A10 Function LP 10 11 12 13 14 VSS ro Address input Output enable Power supply Ground No connection (Top view)  Row/Refresh address A0 to A10  Column address I/O0 to I/O7 RAS CAS WE OE VCC VSS NC Data input/data output Row address strobe A0 to A9 Column address strobe Read/Write enable Data Sheet E0155H10 3 du ct HM51W17805 Series Block Diagram Row decoder EO A0 A1 to A9 • • • • • • A10 4 RAS CAS WE OE Timing and control LP Column buffers address Row address buffers Column decoder 2M array 2M array 2M array 2M array 2M array 2M array 2M array 2M array I/O buffers I/O0 to I/O7 Data Sheet E0155H10 ro du ct HM51W17805 Series EO Parameter Power dissipation Parameter Supply voltage Input high voltage Input low voltage Note: Absolute Maximum Ratings Symbol VT VCC Iout PT Topr Tstg Value –0.5 to VCC + 0.5 (≤ 4.6 V (max)) –0.5 to +4.6 50 1.0 0 to +70 –55 to +125 Unit V V mA W °C °C Voltage on any pin relative to VSS Supply voltage relative to VSS Short circuit output current Operating temperature Storage temperature Recommended DC Operating Conditions (Ta = 0 to +70°C) Symbol VCC Min 3.0 2.0 –0.3 Typ 3.3 — — Max 3.6 VCC + 0.3 0.8 Unit V V V Note 1 1 1 1. All voltage referred to VSS . LP VIH VIL Data Sheet E0155H10 5 ro du ct HM51W17805 Series DC Characteristics (Ta = 0 to +70°C, VCC = 3.3 V ± 0.3 V, VSS = 0 V) -5 Symbol I CC1 I CC2 -6 -7 Test conditions t RC = min TTL interface RAS , CAS = VIH Dout = High-Z CMOS interface RAS , CAS ≥ VCC – 0.2V Dout = High-Z CMOS interface RAS , CAS ≥ VCC – 0.2V Dout = High-Z t RC = min RAS = VIH, CAS = VIL Dout = enable t RC = min t HPC = min CMOS interface Dout = High-Z CBR refresh: t RC = 62.5 µs t RAS ≤ 0.3 µs CMOS interface RAS , CAS ≤ 0.2V Dout = High-Z 0 V ≤ Vin ≤ 4.6 V 0 V ≤ Vout ≤ 4.6 V Dout = disable High Iout = –2 mA Low Iout = 2 mA EO Parameter Operating current Standby current Standby current *1 Min Max Min Max Min Max Unit — — 110 — 2 — 100 — 2 — 90 2 mA mA *1, *2 Standby current (L-version) RAS -only refresh current*2 CAS -before-RAS refresh current EDO page mode current*1, *3 Battery backup current (Standby with CBR refresh) (L-version) Self refresh mode current (L-version) Input leakage current Output leakage current Output high voltage Output low voltage *4 Notes: 1. I CC depends on output load condition when the device is selected. I CC max is specified at the output open condition. 2. Address can be changed once or less while RAS = VIL. 3. Address can be changed once or less while CAS = VIH. 4. CAS = L (≤ 0.2 V) while RAS = L (≤ 0.2 V). LP — I CC2 — I CC3 I CC5 — — — — — I CC6 I CC7 I CC10 I CC11 — I LI I LO VOH VOL 2.4 0 1 — 1 — 1 mA 150 — 150 — 150 µA 110 — 5 — 100 — 5 — 90 5 90 85 mA mA mA mA 110 — 100 — 400 — 100 — 90 — –10 10 –10 10 Data Sheet E0155H10 6 ro 250 — –10 10 –10 10 VCC 2.4 0.4 0 0.4 400 — 400 µA 250 — 250 µA VCC 2.4 0 du –10 10 –10 10 µA µA VCC 0.4 V V ct HM51W17805 Series EO Parameter Capacitance (Ta = 25°C, VCC = 3.3 V ± 0.3 V) Symbol CI1 CI2 CI/O Typ — — — Max 5 7 7 Unit pF pF pF Notes 1 1 1, 2 Input capacitance (Address) Input capacitance (Clocks) Output capacitance (Data-in, Data-out) Notes: 1. Capacitance measured with Boonton Meter or effective capacitance measuring method. 2. CAS = VIH to disable Dout. AC Characteristics (Ta = 0 to +70°C, VCC = 3.3 V ± 0.3 V, VSS = 0 V)*1, *2, *18 Test Conditions • • • • • Input rise and fall time: 2 ns Input levels: VIL = 0 V, VIH = 3 V Input timing reference levels: 0.8 V, 2.0 V Output timing reference levels: 0.8 V, 2.0 V Output load: 1 TTL gate + C L (100 pF) (Including scope and jig) LP Data Sheet E0155H10 7 ro du ct HM51W17805 Series Read, Write, Read-Modify-Write and Refresh Cycles (Common parameters) HM51W17805 -5 Symbol t RC t RP t CP t RAS t CAS t ASR Min 84 30 8 50 8 0 8 0 8 12 10 10 35 5 Max — — — -6 Min 104 40 10 Max — — — -7 Min 124 50 13 Max — — — Unit ns ns ns Notes EO Parameter RAS pulse width CAS pulse width RAS hold time CAS hold time 8 Random read or write cycle time RAS precharge time CAS precharge time Row address setup time Row address hold time Column address setup time Column address hold time RAS to CAS delay time RAS to column address delay time t RAD t RSH t CSH CAS to RAS precharge time OE to Din delay time OE delay time from Din CAS delay time from Din Transition time (rise and fall) LP t RAH t ASC t CAH t RCD t CRP t OED t DZO t DZC tT 10000 60 10000 10 — — — — 37 25 — — 0 10 0 10 14 12 13 40 5 15 0 0 2 10000 70 10000 13 — — — — 45 30 — — — — — — 50 0 10 0 13 14 12 13 45 5 18 0 0 2 10000 ns 10000 ns — — — — 52 35 — — — — — — 50 ns ns ns ns ns ns ns ns ns ns ns ns ns 5 6 6 7 3 4 Data Sheet E0155H10 ro — 13 0 0 2 — — — 50 du ct HM51W17805 Series EO Read Cycle Parameter HM51W17805 -5 Symbol t RAC t CAC t AA t OEA t RCS Min — — — — 0 0 50 0 25 15 0 3 3 — — Max 50 13 25 13 — — — — — — — — — 13 13 — -6 Min — — — — 0 0 60 0 30 18 0 3 3 — — 15 3 — — 15 15 60 Max 60 15 30 15 — — — — — — — — — 15 15 — — 15 15 — — — -7 Min — — — — 0 0 70 0 35 23 0 3 3 — — 18 3 — — 18 18 70 Max 70 18 35 18 — — — — — — — — — 15 15 — — 15 15 — — — Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns 13, 20 13 5 20 20 20 12 12 Notes 8, 9 9, 10, 17 9, 11, 17 9 Access time from RAS Access time from CAS Access time from address Access time from OE Read command setup time Read command hold time to CAS Read command hold time to RAS Read command hold time from RAS t RCHR t RRH Column address to RAS lead time Column address to CAS lead time CAS to output in low-Z Output data hold time Output data hold time from OE Output buffer turn-off time Output buffer turn-off to OE CAS to Din delay time Output data hold time from RAS Output buffer turn-off to RAS Output buffer turn-off to WE WE to Din delay time RAS to Din delay time RAS next CAS delay time LP t RCH t RAL t CAL t CLZ t OH t OHO t OFF t OEZ t CDD t OHR t OFR t WEZ t WED t RDD t RNCD Data Sheet E0155H10 9 ro 13 3 — — — 13 13 — — — 13 13 50 du ct HM51W17805 Series Write Cycle EO Parameter Data-in setup time Data-in hold time Parameter HM51W17805 -5 Symbol t WCS t WCH t WP t RWL t CWL t DS Min 0 8 8 8 8 0 8 Max — — — — — — — -6 Min 0 10 10 10 10 0 10 Max — — — — — — — -7 Min 0 13 10 13 13 0 13 Max — — — — — — — Unit ns ns ns ns ns ns ns 15 15 Notes 14 Write command setup time Write command hold time Write command pulse width Write command to RAS lead time Write command to CAS lead time Read-Modify-Write Cycle Read-modify-write cycle time RAS to WE delay time CAS to WE delay time Column address to WE delay time OE hold time from WE LP t DH Symbol t RWC t RWD t CWD t AWD t OEH Symbol t WRH t RPC HM51W17805 -5 Min Max -6 Min 135 79 34 49 15 Max — — — — — -7 Min 161 92 40 57 18 Max — — — — — Unit ns ns ns ns ns 14 14 14 Notes ro 111 67 30 42 13 — — — — — HM51W17805 -5 Min 5 8 0 8 5 Max — — — — — du -6 -7 Min Max 5 — 5 10 — 10 0 10 5 — — — 0 10 5 Refresh Cycle Parameter Min Max — — — Unit ns ns ns Notes CAS setup time (CBR refresh cycle) t CSR CAS hold time (CBR refresh cycle) t CHR WE setup time (CBR refresh cycle) t WRP WE hold time (CBR refresh cycle) RAS precharge to CAS hold time ct — ns — ns Data Sheet E0155H10 10 HM51W17805 Series EO Parameter Parameter EDO Page Mode Cycle HM51W17805 -5 Symbol t HPC t RASP t CPA Min Max 20 — — 30 3 8 5 30 — -6 Min Max 25 — -7 Min Max 30 — Unit ns Notes 19 16 9, 17 EDO page mode cycle time EDO page mode RAS pulse width Access time from CAS precharge 100000 — 30 — — — — — — 35 3 10 5 35 100000 — 35 — — — — — — 40 3 13 5 40 100000 ns 40 — — — — — ns ns ns ns ns ns RAS hold time from CAS precharge t CPRH Output data hold time from CAS low t DOH CAS hold time referred OE CAS to OE setup time t COL Read command hold time from CAS t RCHC precharge EDO Page Mode Read-Modify-Write Cycle HM51W17805 -5 -6 Min 68 54 Max — — -7 Min 79 62 Max Unit ns ns 14 Notes EDO page mode read- modify-write t HPRWC cycle time WE delay time from CAS precharge t CPW LP t COP Symbol 9, 17 ro Min Max 57 45 — — 32 du Max Unit ms ms 128 Refresh Parameter Refresh period Refresh period (L-version) Symbol t REF t REF Note 2048 cycles 2048 cycles ct Data Sheet E0155H10 11 HM51W17805 Series Self Refresh Mode (L-version) HM51W17805L -5 Symbol t RASS t RPS t CHS Min 100 90 –50 Max — — — -6 Min 100 110 –50 Max — — — -7 Min 100 130 –50 Max — — — Unit µs ns ns Notes EO Parameter 12 RAS pulse width (self refresh) RAS precharge time (self refresh) CAS hold time (self refresh) Notes: 1. AC measurements assume t T = 2 ns. 2. An initial pause of 200 µs is required after power up followed by a minimum of eight initialization cycles (any combination of cycles containing RAS -only refresh or CAS -before-RAS refresh). If the internal refresh counter is used, a minimum of eight CAS -before-RAS refresh cycles are required. 3. Operation with the t RCD (max) limit insures that t RAC (max) can be met, t RCD (max) is specified as a reference point only; if t RCD is greater than the specified t RCD (max) limit, then access time is controlled exclusively by t CAC . 4. Operation with the t RAD (max) limit insures that t RAC (max) can be met, t RAD (max) is specified as a reference point only; if t RAD is greater than the specified t RAD (max) limit, then access time is controlled exclusively by t AA . 5. Either t OED or t CDD must be satisfied. 6. Either t DZO or t DZC must be satisfied. 7. VIH (min) and VIL (max) are reference levels for measuring timing of input signals. Also, transition times are measured between VIH (min) and VIL (max). 8. Assumes that t RCD ≤ t RCD (max) and t RAD ≤ t RAD (max). If t RCD or t RAD is greater than the maximum recommended value shown in this table, t RAC exceeds the value shown. 9. Measured with a load circuit equivalent to 1 TTL loads and 100 pF. 10. Assumes that t RCD ≥ t RCD (max) and t RAD ≤ t RAD (max). 11. Assumes that t RCD ≤ t RCD (max) and t RAD ≥ t RAD (max). 12. Either t RCH or t RRH must be satisfied for a read cycles. 13. t OFF (max) and t OEZ (max) define the time at which the outputs achieve the open circuit condition and are not referred to output voltage levels. 14. t WCS , t RWD, t CWD, t AWD and t CPW are not restrictive operating parameters. They are included in the data sheet as electrical characteristics only; if t WCS ≥ t WCS (min), the cycle is an early write cycle and the data out pin will remain open circuit (high impedance) throughout the entire cycle; if t RWD ≥ t RWD (min), t CWD ≥ t CWD (min), and t AWD ≥ t AWD (min), or t CWD ≥ t CWD (min), t AWD ≥ t AWD (min) and t CPW ≥ t CPW (min), the cycle is a read-modify-write and the data output will contain data read from the selected cell; if neither of the above sets of conditions is satisfied, the condition of the data out (at access time) is indeterminate. 15. These parameters are referred to CAS leading edge in early write cycles and to WE leading edge in delayed write or read-modify-write cycles. 16. t RASP defines RAS pulse width in EDO page mode cycles. 17. Access time is determined by the longest among t AA , t CAC and t CPA. 18. In delayed write or read-modify-write cycles, OE must disable output buffer prior to applying data to the device. 19. t HPC (min) can be achieved during a series of EDO page mode write cycles or EDO page mode read cycles. If both write and read operation are mixed in a EDO page mode RAS cycle (EDO page mode mix cycle (1), (2)), minimum value of CAS cycle (tCAS + t CP + 2 t T) becomes greater than the specified t HPC (min) value. The value of CAS cycle time of mixed EDO page mode is shown in EDO page mode mix cycle (1) and (2). LP Data Sheet E0155H10 ro du ct HM51W17805 Series EO 20. Data output turns off and becomes high impedance from later rising edge of RAS and CAS . Hold time and turn off time are specified by the timing specifications of later rising edge of RAS and CAS between t OHR and t OH , and between t OFR and t OFF. 21. Please do not use t RASS timing, 10 µs ≤ t RASS ≤ 100 µs. During this period, the device is in transition state from normal operation mode to self refresh mode. If t RASS ≥ 100 µs, then RAS precharge time should use t RPS instead of t RP. 22. If you use RAS only refresh or CBR burst refresh mode in normal read/write cycles, 2048 cycles of distributed CBR refresh with 15.6 µs interval should be executed within 32 ms immediately after exiting from and before entering into the self refresh mode. 23. If you use distributed CBR refresh mode with 15.6 µs interval in normal read/write cycle, CBR refresh should be executed within 15.6 µs immediately after exiting from and before entering into self refresh mode. 24. Repetitive self refresh mode without refreshing all memory is not allowed. Once you exit from self refresh mode, all memory cells need to be refreshed before re-entering the self refresh mode again. 25. XXX: H or L (H: VIH (min) ≤ VIN ≤ VIH (max), L: VIL (min) ≤ VIN ≤ VIL (max)) ///////: Invalid Dout When the address, clock and input pins are not described on timing waveforms, their pins must be applied VIH or VIL. LP Data Sheet E0155H10 13 ro du ct HM51W17805 Series Timing Waveforms*25 Read Cycle   t RAC t CLZ Dout Dout EO RAS t RC t RAS t RP CAS Address WE Din OE LP t RCD tT t RAD t ASR t RAH Row t RCS t CSH t RSH t CAS t CRP t RAL t CAL t CAH t ASC Column t RRH t RCH Data Sheet E0155H10 ro t RCHR t DZC High-Z t DZO t OEA t CAC t AA t WED t CDD t RDD du t OED t OEZ t OHO t OFF t OH t OFR t OHR ct t WEZ 14 HM51W17805 Series EO Early Write Cycle RAS tT CAS tASR tRAH Address Row WE Din Dout tRC tRAS tRP tCSH tRCD tRSH tCAS tCRP LP tWCS tDS tASC tCAH Column Data Sheet E0155H10 15 ro tWCH du High-Z* tDH Din ct * t WCS t WCS (min) HM51W17805 Series Delayed Write Cycle*18 t RC t RAS   t OEZ t CLZ Dout High-Z Invalid Dout Data Sheet E0155H10 16 EO RAS CAS Address WE Din OE t RP t CSH t RCD tT t RSH t CAS t CRP LP t ASR t RAH Row t DZC t DZO t ASC t CAH Column t CWL t RWL t WP t RCS High-Z ro t OED t DS t DH du Din t OEH ct HM51W17805 Series EO RAS CAS Address WE Din OE Dout Read-Modify-Write Cycle*18 t RWC t RAS t RP tT t RCD t CAS t CRP LP t RAD t ASR tRAH Row t RCS t ASC t CAH Column t CWD t AWD t RWD tCWL t RWL t WP Data Sheet E0155H10 17 ro t DZC High-Z t DH t DS Din du t OED t OEH t OEZ t DZO t OEA t CAC t AA t RAC ct High-Z t OHO Dout t CLZ HM51W17805 Series RAS-Only Refresh Cycle t RC t RAS t RP !  18 EO RAS CAS Address Dout tT t CRP t RPC t CRP LP t ASR Row t OFR t OFF t RAH High-Z Data Sheet E0155H10 ro du ct HM51W17805 Series  , tT EO RAS CAS WE Address Dout CAS-Before-RAS Refresh Cycle t RC t RP t RAS t RP t RPC t CSR t CHR t RPC t CRP LP t CP t OFR t OFF t WRP t WRH t CP Data Sheet E0155H10 19 ro High-Z du ct HM51W17805 Series Hidden Refresh Cycle t RC t RAS t RP t RC t RAS t RP t RAS t RC t RP  ro t OEA WE t DZC High-Z Din EO RAS CAS tT t RSH t RCD t CHR t CRP t ASR t RAH Address Row LP t RAD t RAL t ASC Column t RCS t DZO t AA t RAC t CLZ t CAH t RRH t WRH t WRP t WRP tWRH t RRH t RCH t WED t CDD t RDD du Dout t OED OE t CAC t OFF t OH t OEZ t WEZ t OHO ct t OFR t OHR Dout Data Sheet E0155H10 20 HM51W17805 Series    OE EO RAS EDO Page Mode Read Cycle t RP t RASP t CP t CAS t RCHR t RCH t RCS t HPC t CAS t CP t HPC tCAS t RCHC t HPC t CPRH t CP t t CRP t RNCD tT t CSH RSH CAS tCAS t RRH t RCH t RCS LP tCAH Column 1 t CAL High-Z tDZO tOEA tCAC tAA tWEZ tRAC Dout 1 WE tASR Address tRAH tASC Row t ASC t CAH Column 2 t CAL t ASC t CAH Column 3 t CAL tASC t RAL t CAH Column 4 t WED t CAL tRDD tCDD tDZC Din tCOL tCOP tOED tCPA ro tAA tCAC tOEZ tOHO Dout 2 tCPA tCPA tAA tCAC tAA tOEZ tOFR tOHR tOEZ tCAC tOEA tDOH tOHO tOEA tOHO tOFF tOH du Dout 2 Dout 3 Dout Dout 4 ct Data Sheet E0155H10 21 HM51W17805 Series EDO Page Mode Early Write Cycle tRASP tRP EO RAS CAS Address WE Din Dout 22 tT tRCD tCSH tCAS tCP tHPC tCAS tCP tRSH tCAS tCRP tASR Row LP tRAH tASC tCAH Column 1 tWCS tWCH tDS tDH Din 1 tASC tCAH tASC tCAH Column 2 Column N Data Sheet E0155H10 ro tWCS tDS tWCH tWCS tWCH tDH tDS tDH Din 2 High-Z* du Din N ct * t WCS t WCS (min) HM51W17805 Series       t OED t OED t OED t OEH t OEH t OEH OE t CLZ t CLZ t CLZ t OEZ t OEZ t OEZ Dout High-Z EO RAS tT CAS EDO Page Mode Delayed Write Cycle*18 t RASP t RP t CP t CSH t RCD t CAS t HPC t CAS t CP t RSH t CAS t CRP LP t RAD t ASC t RAH t CAH Row Column 1 t RCS t WP t DZC t DS t DZO Invalid Dout t ASR t ASC t CAH Column 2 t CWL t RCS t ASC t CAH Column N t CWL t RWL Address t CWL t RCS ro t DH Din 1 t DZO WE t WP t DH Din 2 t DZO t WP t DZC t DS t DH Din N t DZC t DS Din Invalid Dout Data Sheet E0155H10 du Invalid Dout ct 23 HM51W17805 Series EDO Page Mode Read-Modify-Write Cycle*18 t RASP t RP *    OE t OHO t OHO t OHO t AA t OEA t CAC t RAC t AA t CPA t OEA t CAC t AA t CPA t OEA t CAC t CLZ t OEZ t CLZ t OEZ t CLZ t OEZ EO RAS tT CAS t HPRWC t CP t CAS t CP t RCD t CAS t RSH t CAS t CRP LP t RAD t ASC t RAH t CAH Row Column 1 t RWD t AWD t CWD t RCS t WP t DZC t DS t DZO t OED t ASR t ASC t CAH Column 2 t CPW t AWD t CWD t RCS t CWL t ASC t CAH Column N t CPW t AWD t CWD t RWL t CWL Address t CWL t RCS ro t DH Din 1 t DZO t OED Dout 2 WE t WP t DH Din 2 t WP t DZC t DS t DH Din N t DZC t DS Din du t DZO t OEH t OED t OEH t OEH ct High-Z Dout Dout 1 Dout N Data Sheet E0155H10 24 HM51W17805 Series   OE EO RAS EDO Page Mode Mix Cycle (1) t RP t RASP t CRP tCAS tRSH t RCS tCPW tAWD tASC t CAH Column 3 t CAL t CAL t DS High-Z tOED t DH Din 3 tWED tWP t RAL t CAH Column 4 t CAL tRDD tCDD t RRH t RCH tT t CP t CAS t CSH t CAS t CP tCAS t CP CAS t RCD LP t WCS t WCH t RCS tCAH Column 1 t CAL t DH Din 1 WE tASR Address t ASC tRAH Row t ASC t CAH Column 2 tASC t DS Din ro tCPA tAA tOEA tCAC tCPA tCPA tAA t OEZ tAA tOFR tWEZ tOEZ tCAC tOHO tOFF tOH t DOH tCAC t OHO tOEA du Dout 3 Dout Dout 2 Dout 4 ct Data Sheet E0155H10 25 HM51W17805 Series EDO Page Mode Mix Cycle (2) t RNCD t RASP EO RAS t RP tT t CSH t CAS t RCHR t CAS t CP tCAS t CP tCAS t RCS tCPW tWP t RAL tASC t CAH Column 4 t CAL t DS t DH Din 3 tOED tCOP tRSH t CRP CAS t RCD t RCS WE tASR Address t ASC tRAH Row LP tCAH Column 1 t CAL t DS High-Z tOED tAA tOEA tCAC tRAC t OHO tOEZ Dout 1 t RCH tWCS t WCH t RCS t RRH t RCH t ASC t CAH Column 2 t CAL t DH Din 2 t ASC t CAH Column 3 t CAL tRDD tCDD Din ro tCOL tWED OE t OEA tCPA tAA tCAC tOEZ tCPA tAA tCAC tOEA tOFR tWEZ tOEZ tOHO tOFF tOH Dout 4 du Dout 3 t OHO Dout ct Data Sheet E0155H10 26 HM51W17805 Series  ,  , t CP t CSR CAS t WRP WE t OFR t OFF Dout , + &  $  Data Sheet E0155H10 27 EO RAS Self Refresh Cycle (L-version)* 21, 22, 23, 24 t RASS t RP t RPS t RPC tT t CRP t CHS LP t WRH ro High-Z du ct HM51W17805 Series Package Dimensions HM51W17805J/LJ Series (CP-28DA) Unit: mm 18.17 18.54 Max 10.16 ± 0.13 3.50 ± 0.26 1 0.74 14 2.85 ± 0.12 11.18 ± 0.13 1.30 Max 0.80 +0.25 –0.17 EO 28 28 15 0.43 ± 0.10 0.41 ± 0.08 Dimension including the plating thickness Base material dimension LP 1.27 ro 9.40 ± 0.25 Hitachi Code JEDEC EIAJ Weight (reference value) CP-28DA Conforms Conforms 1.16 g 0.10 Data Sheet E0155H10 du ct HM51W17805 Series 1 0.74 14 3.50 ± 0.26 7.62 ± 0.12 8.51 ± 0.12 1.165 Max 0.90 ± 0.26 0.43 ± 0.10 0.41 ± 0.08 6.79 ± 0.18 1.27 Hitachi Code JEDEC EIAJ Weight (reference value) CP-28DNA — — 0.95 g 0.10 Dimension including the plating thickness Base material dimension Data Sheet E0155H10 29 0.25 2.45 + 0.36 – EO HM51W17805S/LS Series (CP-28DNA) Unit: mm 18.41 18.84 Max 28 15 LP ro du ct HM51W17805 Series HM51W17805TT/LTT Series (TTP-28DA) Unit: mm 18.41 18.81 Max 15 1 0.42 ± 0.08 0.40 ± 0.06 1.27 M 14 10.16 0.10 0.145 ± 0.05 0.125 ± 0.04 0.13 ± 0.05 1.20 Max Dimension including the plating thickness Base material dimension Hitachi Code JEDEC EIAJ Weight (reference value) TTP-28DA Conforms — 0.43 g Data Sheet E0155H10 30 0.68 EO 28 LP 0.21 1.15 Max 0.80 11.76 ± 0.20 0° – 5° 0.50 ± 0.10 ro du ct HM51W17805 Series 1 1.27 14 0.42 ± 0.08 0.40 ± 0.06 0.21 M 7.62 0.50 ± 0.10 0.10 0.145 ± 0.05 0.125 ± 0.04 0.13 ± 0.05 1.20 Max Dimension including the plating thickness Base material dimension Hitachi Code JEDEC EIAJ Weight (reference value) TTP-28DB — — 0.35 g Data Sheet E0155H10 31 0.63 EO HM51W17805TS/LTS Series (TTP-28DB) Unit: mm 18.41 18.81 Max 28 15 LP 1.15 Max 0.80 9.22 ± 0.2 0° – 5° ro du ct HM51W17805 Series Cautions EO 32 1. Elpida Memory, Inc. neither warrants nor grants licenses of any rights of Elpida Memory, Inc.’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Elpida Memory, Inc. bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Elpida Memory, Inc. makes every attempt to ensure that its products are of high quality and reliability. However, contact Elpida Memory, Inc. before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Elpida Memory, Inc. particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Elpida Memory, Inc. bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating Elpida Memory, Inc. product does not cause bodily injury, fire or other consequential damage due to operation of the Elpida Memory, Inc. product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Elpida Memory, Inc.. 7. Contact Elpida Memory, Inc. for any questions regarding this document or Elpida Memory, Inc. semiconductor products. LP Data Sheet E0155H10 ro du ct
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