Intel® MAX® 10 FPGA Device Datasheet
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Contents
Contents
Intel® MAX® 10 FPGA Device Datasheet..................................................................................................................................... 3
Electrical Characteristics...................................................................................................................................................... 3
Operating Conditions.................................................................................................................................................. 4
Switching Characteristics....................................................................................................................................................25
Core Performance Specifications.................................................................................................................................26
Periphery Performance Specifications.......................................................................................................................... 35
Configuration Specifications................................................................................................................................................ 57
JTAG Timing Parameters........................................................................................................................................... 58
Remote System Upgrade Circuitry Timing Specifications................................................................................................ 59
User Watchdog Internal Circuitry Timing Specifications..................................................................................................59
Uncompressed Raw Binary File (.rbf) Sizes.................................................................................................................. 59
Internal Configuration Time....................................................................................................................................... 60
Internal Configuration Timing Parameter..................................................................................................................... 61
I/O Timing....................................................................................................................................................................... 61
Programmable IOE Delay................................................................................................................................................... 62
Programmable IOE Delay On Row Pins........................................................................................................................ 62
Programmable IOE Delay for Column Pins....................................................................................................................63
Glossary.......................................................................................................................................................................... 64
Document Revision History for the Intel MAX 10 FPGA Device Datasheet...................................................................................67
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Intel® MAX® 10 FPGA Device Datasheet
This datasheet describes the electrical characteristics, switching characteristics, configuration specifications, and timing for
Intel MAX® 10 devices.
Table 1.
Intel MAX 10 Device Grades and Speed Grades Supported
Device Grade
Speed Grade Supported
Commercial
•
•
–C7
–C8 (slowest)
Industrial
•
•
–I6 (fastest)
–I7
Automotive
•
•
–A6
–A7
Note:
The –I6 and –A6 speed grades of the Intel MAX 10 FPGA devices are not available by default in the Intel Quartus® Prime
software. Contact your local Intel sales representatives for support.
Related Information
Device Ordering Information, Intel MAX 10 FPGA Device Overview
Provides more information about the densities and packages of devices in the Intel MAX 10.
Electrical Characteristics
The following sections describe the operating conditions and power consumption of Intel MAX 10 devices.
Intel Corporation. All rights reserved. Agilex, Altera, Arria, Cyclone, Enpirion, Intel, the Intel logo, MAX, Nios, Quartus and Stratix words and logos are trademarks
of Intel Corporation or its subsidiaries in the U.S. and/or other countries. Intel warrants performance of its FPGA and semiconductor products to current
specifications in accordance with Intel's standard warranty, but reserves the right to make changes to any products and services at any time without notice. Intel
assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in
writing by Intel. Intel customers are advised to obtain the latest version of device specifications before relying on any published information and before placing
orders for products or services.
*Other names and brands may be claimed as the property of others.
ISO
9001:2015
Registered
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Operating Conditions
Intel MAX 10 devices are rated according to a set of defined parameters. To maintain the highest possible performance and
reliability of the Intel MAX 10 devices, you must consider the operating requirements described in this section.
Absolute Maximum Ratings
This section defines the maximum operating conditions for Intel MAX 10 devices. The values are based on experiments
conducted with the devices and theoretical modeling of breakdown and damage mechanisms. The functional operation of the
device is not implied for these conditions.
Caution:
Conditions outside the range listed in the absolute maximum ratings tables may cause permanent damage to the device.
Additionally, device operation at the absolute maximum ratings for extended periods of time may have adverse effects on the
device.
Single Supply Devices Absolute Maximum Ratings
Table 2.
Absolute Maximum Ratings for Intel MAX 10 Single Supply Devices
Symbol
Parameter
Min
Max
Unit
VCC_ONE
Supply voltage for core and periphery through on-die voltage
regulator
–0.5
3.9
V
VCCIO
Supply voltage for input and output buffers
–0.5
3.9
V
VCCA
Supply voltage for phase-locked loop (PLL) regulator and analog-todigital converter (ADC) block (analog)
–0.5
3.9
V
Min
Max
Unit
Dual Supply Devices Absolute Maximum Ratings
Table 3.
Absolute Maximum Ratings for Intel MAX 10 Dual Supply Devices
Symbol
Parameter
VCC
Supply voltage for core and periphery
–0.5
1.63
V
VCCIO
Supply voltage for input and output buffers
–0.5
3.9
V
VCCA
Supply voltage for PLL regulator (analog)
–0.5
3.41
V
continued...
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Symbol
Parameter
Min
Max
Unit
VCCD_PLL
Supply voltage for PLL regulator (digital)
–0.5
1.63
V
VCCA_ADC
Supply voltage for ADC analog block
–0.5
3.41
V
VCCINT
Supply voltage for ADC digital block
–0.5
1.63
V
Min
Max
Unit
Absolute Maximum Ratings
Table 4.
Absolute Maximum Ratings for Intel MAX 10 Devices
Symbol
Parameter
VI
DC input voltage
–0.5
4.12
V
IOUT
DC output current per pin
–25
25
mA
TSTG
Storage temperature
–65
150
°C
TJ
Operating junction temperature
–40
125
°C
Maximum Allowed Overshoot During Transitions over a 11.4-Year Time Frame
During transitions, input signals may overshoot to the voltage listed in the following table and undershoot to –2.0 V for input
currents less than 100 mA and periods shorter than 20 ns.
The maximum allowed overshoot duration is specified as a percentage of high time over the lifetime of the device. A DC signal
is equivalent to 100% duty cycle.
For example, a signal that overshoots to 4.17 V can only be at 4.17 V for ~11.7% over the lifetime of the device; for a device
lifetime of 11.4 years, this amounts to 1.33 years.
Table 5.
Maximum Allowed Overshoot During Transitions over a 11.4-Year Time Frame for Intel MAX 10 Devices
Condition (V)
Overshoot Duration as % of High Time
Unit
4.12
100.0
%
4.17
11.7
%
4.22
7.1
%
4.27
4.3
%
continued...
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Condition (V)
Overshoot Duration as % of High Time
Unit
4.32
2.6
%
4.37
1.6
%
4.42
1.0
%
4.47
0.6
%
4.52
0.3
%
4.57
0.2
%
Recommended Operating Conditions
This section lists the functional operation limits for the AC and DC parameters for Intel MAX 10 devices. The tables list the
steady-state voltage values expected from Intel MAX 10 devices. Power supply ramps must all be strictly monotonic, without
plateaus.
Single Supply Devices Power Supplies Recommended Operating Conditions
Table 6.
Power Supplies Recommended Operating Conditions for Intel MAX 10 Single Supply Devices
Symbol
Parameter
Condition
Min
Typ
Max
Unit
VCC_ONE(1)
Supply voltage for core and periphery through ondie voltage regulator
—
2.85/3.135
3.0/3.3
3.15/3.465
V
VCCIO(2)
Supply voltage for input and output buffers
3.3 V
3.135
3.3
3.465
V
3.0 V
2.85
3
3.15
V
2.5 V
2.375
2.5
2.625
V
1.8 V
1.71
1.8
1.89
V
1.5 V
1.425
1.5
1.575
V
1.35 V
1.2825
1.35
1.4175
V
continued...
(1)
VCCA must be connected to VCC_ONE through a filter.
(2)
VCCIO for all I/O banks must be powered up during user mode because VCCIO I/O banks are used for the ADC and I/O functionalities.
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Symbol
VCCA
(1)
Parameter
Supply voltage for PLL regulator and ADC block
(analog)
Condition
Min
Typ
Max
Unit
1.2 V
1.14
1.2
1.26
V
1.0 V
0.95
1.0
1.05
V
—
2.85/3.135
3.0/3.3
3.15/3.465
V
Dual Supply Devices Power Supplies Recommended Operating Conditions
Table 7.
Power Supplies Recommended Operating Conditions for Intel MAX 10 Dual Supply Devices
Symbol
VCC
Parameter
Supply voltage for core and periphery
VCCIO
(3)
Supply voltage for input and output buffers
Condition
Min
Typ
Max
Unit
—
1.15
1.2
1.25
V
3.3 V
3.135
3.3
3.465
V
3.0 V
2.85
3
3.15
V
2.5 V
2.375
2.5
2.625
V
1.8 V
1.71
1.8
1.89
V
1.5 V
1.425
1.5
1.575
V
1.35 V
1.2825
1.35
1.4175
V
1.2 V
1.14
1.2
1.26
V
1.0 V
0.95
1.0
1.05
V
(4)
Supply voltage for PLL regulator (analog)
—
2.375
2.5
2.625
V
VCCD_PLL(5)
Supply voltage for PLL regulator (digital)
—
1.15
1.2
1.25
V
VCCA_ADC
Supply voltage for ADC analog block
—
2.375
2.5
2.625
V
VCCINT
Supply voltage for ADC digital block
—
1.15
1.2
1.25
V
VCCA
(3)
VCCIO for all I/O banks must be powered up during user mode because VCCIO I/O banks are used for the ADC and I/O functionalities.
(4)
All VCCA pins must be powered to 2.5 V (even when PLLs are not used), and must be powered up and powered down at the same
time.
(5)
VCCD_PLL must always be connected to VCC through a decoupling capacitor and ferrite bead.
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Recommended Operating Conditions
Table 8.
Recommended Operating Conditions for Intel MAX 10 Devices
Condition
Min
Max
Unit
VI
Symbol
DC input voltage
Parameter
—
–0.5
3.6
V
VO
Output voltage for I/O pins
—
0
VCCIO
V
TJ
Operating junction temperature
Commercial
0
85
°C
Industrial
–40(6)
100
°C
Automotive
–40(6)
125
°C
tRAMP
Power supply ramp time
—
(7)
10
ms
IDiode
Magnitude of DC current across PCI* clamp diode when
enabled
—
—
10
mA
Programming/Erasure Specifications
Table 9.
Programming/Erasure Specifications for Intel MAX 10 Devices
This table shows the programming cycles and data retention duration of the user flash memory (UFM) and configuration flash memory (CFM) blocks.
For more information about data retention duration with 10,000 programming cycles for automotive temperature devices, contact your Intel quality
representative.
Erase and reprogram cycles (E/P)
page)
Temperature (°C)
Data retention duration (Years)
10,000
85
20
10,000
100
10
(Cycles/
(6)
–40°C is only applicable to Start of Test, when the device is powered-on. The device does not stay at the minimum junction
temperature for a long time.
(7)
There is no absolute minimum value for the ramp time requirement. Intel characterized the minimum ramp time at 200 μs.
(8)
The number of E/P cycles applies to the smallest possible flash block that can be erased or programmed in each Intel MAX 10 device.
Each Intel MAX 10 device has multiple flash pages per device.
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DC Characteristics
Supply Current and Power Consumption
Intel offers two ways to estimate power for your design—the Excel-based Early Power Estimator (EPE) and the Intel Quartus
Prime Power Analyzer feature.
Use the Excel-based EPE before you start your design to estimate the supply current for your design. The EPE provides a
magnitude estimate of the device power because these currents vary greatly with the usage of the resources.
The Intel Quartus Prime Power Analyzer provides better quality estimates based on the specifics of the design after you
complete place-and-route. The Power Analyzer can apply a combination of user-entered, simulation-derived, and estimated
signal activities that, when combined with detailed circuit models, yield very accurate power estimates.
Related Information
•
Early Power Estimator User Guide
Provides more information about power estimation tools.
•
Power Analysis chapter, Intel Quartus Prime Handbook
Provides more information about power estimation tools.
I/O Pin Leakage Current
The values in the table are specified for normal device operation. The values vary during device power-up. This applies for all
VCCIO settings (3.3, 3.0, 2.5, 1.8, 1.5, 1.35, and 1.2 V).
10 µA I/O leakage current limit is applicable when the internal clamping diode is off. A higher current can be the observed
when the diode is on.
Input channel leakage of ADC I/O pins due to hot socket is up to maximum of 1.8 mA. The input channel leakage occurs when
the ADC IP core is enabled or disabled. This is applicable to all Intel MAX 10 devices with ADC IP core, which are 10M04,
10M08, 10M16, 10M25, 10M40, and 10M50 devices. The ADC I/O pins are in Bank 1A.
Table 10.
I/O Pin Leakage Current for Intel MAX 10 Devices
Min
Max
Unit
II
Symbol
Input pin leakage current
VI = 0 V to VCCIOMAX
–10
10
µA
IOZ
Tristated I/O pin leakage current
VO = 0 V to VCCIOMAX
–10
10
µA
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Parameter
Condition
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Table 11.
ADC_VREF Pin Leakage Current for Intel MAX 10 Devices
Symbol
Parameter
Iadc_vref
Condition
ADC_VREF pin leakage current
Min
Max
Unit
Single supply mode
—
10
µA
Dual supply mode
—
20
µA
Bus Hold Parameters
Bus hold retains the last valid logic state after the source driving it either enters the high impedance state or is removed.
Each I/O pin has an option to enable bus hold in user mode. Bus hold is always disabled in configuration mode.
Table 12.
Bus Hold Parameters for Intel MAX 10 Devices
Parameter
Condition
VCCIO (V)
1.2
1.8
2.5
3.0
3.3
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Bus-hold low, sustaining
current
VIN > VIL
(maximum)
8
—
12
—
30
—
50
—
70
—
70
—
µA
Bus-hold high, sustaining
current
VIN < VIH
(minimum)
–8
—
–12
—
–30
—
–50
—
–70
—
–70
—
µA
Bus-hold low, overdrive
current
0 V < VIN <
VCCIO
—
125
—
175
—
200
—
300
—
500
—
500
µA
Bus-hold high, overdrive
current
0 V < VIN <
VCCIO
—
–125
—
–175
—
–200
—
–300
—
–500
—
–500
µA
—
0.3
0.9
0.375
1.125
0.68
1.07
0.7
1.7
0.8
2
0.8
2
V
Bus-hold trip point
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1.5
Unit
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Series OCT without Calibration Specifications
Table 13.
Series OCT without Calibration Specifications for Intel MAX 10 Devices
This table shows the variation of on-chip termination (OCT) without calibration across process, voltage, and temperature (PVT).
Description
Series OCT without calibration
VCCIO (V)
Resistance Tolerance
Unit
–C7, –I6, –I7, –A6, –A7
–C8
3.00
±35
±30
%
2.50
±35
±30
%
1.80
±40
±35
%
1.50
±40
±40
%
1.35
±40
±50
%
1.20
±45
±60
%
Series OCT with Calibration at Device Power-Up Specifications
Table 14.
Series OCT with Calibration at Device Power-Up Specifications for Intel MAX 10 Devices
OCT calibration is automatically performed at device power-up for OCT enabled I/Os.
Description
Series OCT with calibration at device power-up
VCCIO (V)
Calibration Accuracy
Unit
3.00
±12
%
2.50
±12
%
1.80
±12
%
1.50
±12
%
1.35
±12
%
1.20
±12
%
OCT Variation after Calibration at Device Power-Up
The OCT resistance may vary with the variation of temperature and voltage after calibration at device power-up.
Use the following table and equation to determine the final OCT resistance considering the variations after calibration at
device power-up.
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Table 15.
OCT Variation after Calibration at Device Power-Up for Intel MAX 10 Devices
This table lists the change percentage of the OCT resistance with voltage and temperature.
Description
OCT variation after calibration at device power-up
Figure 1.
Nominal Voltage
dR/dT (%/°C)
dR/dV (%/mV)
3.00
0.25
–0.027
2.50
0.245
–0.04
1.80
0.242
–0.079
1.50
0.235
–0.125
1.35
0.229
–0.16
1.20
0.197
–0.208
Equation for OCT Resistance after Calibration at Device Power-Up
For
For
The definitions for equation are as follows:
•
T1 is the initial temperature.
•
T2 is the final temperature.
•
MF is multiplication factor.
•
Rinitial is initial resistance.
•
Rfinal is final resistance.
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•
Subscript x refers to both V and T.
•
∆RV is variation of resistance with voltage.
•
∆RT is variation of resistance with temperature.
•
dR/dT is the change percentage of resistance with temperature after calibration at device power-up.
•
dR/dV is the change percentage of resistance with voltage after calibration at device power-up.
•
V1 is the initial voltage.
•
V2 is final voltage.
The following figure shows the example to calculate the change of 50 Ω I/O impedance from 25°C at 3.0 V to 85°C at 3.15 V.
Figure 2.
Example for OCT Resistance Calculation after Calibration at Device Power-Up
B
1
B
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Pin Capacitance
Table 16.
Pin Capacitance for Intel MAX 10 Devices
Maximum
Unit
CIOB
Symbol
Input capacitance on bottom I/O pins
Parameter
8
pF
CIOLRT
Input capacitance on left/right/top I/O pins
7
pF
CLVDSB
Input capacitance on bottom I/O pins with dedicated LVDS output
8
pF
CADCL
Input capacitance on left I/O pins with ADC input
9
pF
CVREFLRT
Input capacitance on left/right/top dual purpose VREF pin when used as VREF or user
I/O pin (11)
48
pF
CVREFB
Input capacitance on bottom dual purpose VREF pin when used as VREF or user I/O pin
50
pF
CCLKB
Input capacitance on bottom dual purpose clock input pins
7
pF
CCLKLRT
Input capacitance on left/right/top dual purpose clock input pins
6
pF
(9)
(10)
(12)
(12)
Internal Weak Pull-Up Resistor
All I/O pins, except configuration, test, and JTAG pins, have an option to enable weak pull-up.
(9)
Dedicated LVDS output buffer is only available at bottom I/O banks.
(10)
ADC pins are only available at left I/O banks.
(11)
When VREF pin is used as regular input or output, Fmax performance is reduced due to higher pin capacitance. Using the VREF pin
capacitance specification from device datasheet, perform SI analysis on your board setup to determine the Fmax of your system.
(12)
10M40 and 10M50 devices have dual purpose clock input pins at top/bottom I/O banks.
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Table 17.
Internal Weak Pull-Up Resistor for Intel MAX 10 Devices
Pin pull-up resistance values may be lower if an external source drives the pin higher than VCCIO.
Symbol
R_PU
Parameter
Condition
Value of I/O pin (dedicated and dual-purpose)
pull-up resistor before and during configuration,
as well as user mode if the programmable pull-up
resistor option is enabled
Min
Typ
Max
Unit
VCCIO = 3.3 V ± 5%
7
12
34
kΩ
VCCIO = 3.0 V ± 5%
8
13
37
kΩ
VCCIO = 2.5 V ± 5%
10
15
46
kΩ
VCCIO = 1.8 V ± 5%
16
25
75
kΩ
VCCIO = 1.5 V ± 5%
20
36
106
kΩ
VCCIO = 1.2 V ± 5%
33
82
179
kΩ
Hot-Socketing Specifications
Table 18.
Hot-Socketing Specifications for Intel MAX 10 Devices
Symbol
Parameter
IIOPIN(DC)
DC current per I/O pin
IIOPIN(AC)
AC current per I/O pin
Maximum
300 µA
8 mA
(13)
Hysteresis Specifications for Schmitt Trigger Input
Intel MAX 10 devices support Schmitt trigger input on all I/O pins. A Schmitt trigger feature introduces hysteresis to the input
signal for improved noise immunity, especially for signal with slow edge rate.
(13)
The I/O ramp rate is 10 ns or more. For ramp rates faster than 10 ns, |IIOPIN| = C dv/dt, in which C is I/O pin capacitance and dv/dt
is the slew rate.
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Table 19.
Hysteresis Specifications for Schmitt Trigger Input for Intel MAX 10 Devices
Symbol
VHYS
Parameter
Hysteresis for Schmitt trigger input
Intel® MAX® 10 FPGA Device Datasheet
16
Condition
Minimum
Unit
VCCIO = 3.3 V
180
mV
VCCIO = 2.5 V
150
mV
VCCIO = 1.8 V
120
mV
VCCIO = 1.5 V
110
mV
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Figure 3.
LVTTL/LVCMOS Input Standard Voltage Diagram
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Figure 4.
Schmitt Trigger Input Standard Voltage Diagram
VHYS
I/O Standards Specifications
Tables in this section list input voltage (VIH and VIL), output voltage (VOH and VOL), and current drive characteristics (IOH and
IOL) for various I/O standards supported by Intel MAX 10 devices.
For minimum voltage values, use the minimum VCCIO values. For maximum voltage values, use the maximum VCCIO values.
You must perform timing closure analysis to determine the maximum achievable frequency for general purpose I/O standards.
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Single-Ended I/O Standards Specifications
Table 20.
Single-Ended I/O Standards Specifications for Intel MAX 10 Devices
To meet the IOL and IOH specifications, you must set the current strength settings accordingly. For example, to meet the 3.3-V LVTTL specification (4 mA), you
should set the current strength settings to 4 mA. Setting at lower current strength may not meet the IOL and IOH specifications in the datasheet.
I/O Standard
VCCIO (V)
VIL (V)
VIH (V)
VOL (V)
VOH (V)
IOL (mA)
IOH (mA)
Min
Typ
Max
Min
Max
Min
Max
Max
Min
3.3 V LVTTL
3.135
3.3
3.465
–0.3
0.8
1.7
3.6
0.45
2.4
4
–4
3.3 V LVCMOS
3.135
3.3
3.465
–0.3
0.8
1.7
3.6
0.2
VCCIO – 0.2
2
–2
3.0 V LVTTL
2.85
3
3.15
–0.3
0.8
1.7
VCCIO +
0.3
0.45
2.4
4
–4
3.0 V LVCMOS
2.85
3
3.15
–0.3
0.8
1.7
VCCIO +
0.3
0.2
VCCIO – 0.2
0.1
–0.1
2.5 V LVTTL and
LVCMOS
2.375
2.5
2.625
–0.3
0.7
1.7
VCCIO +
0.3
0.4
2
1
–1
1.8 V LVTTL and
LVCMOS
1.71
1.8
1.89
–0.3
0.35 ×
VCCIO
0.65 ×
VCCIO
2.25
0.45
VCCIO –
0.45
2
–2
1.5 V LVCMOS
1.425
1.5
1.575
–0.3
0.35 ×
VCCIO
0.65 ×
VCCIO
VCCIO +
0.3
0.25 ×
VCCIO
0.75 ×
VCCIO
2
–2
1.2 V LVCMOS
1.14
1.2
1.26
–0.3
0.35 ×
VCCIO
0.65 ×
VCCIO
VCCIO +
0.3
0.25 ×
VCCIO
0.75 ×
VCCIO
2
–2
0.95
1.0
1.05
–0.3
0.35 ×
VCCIO
0.65 ×
VCCIO
VCCIO +
0.3
0.25 ×
VCCIO
0.75 ×
VCCIO
4
–4
3.3 V Schmitt Trigger
3.135
3.3
3.465
–0.3
0.8
1.7
VCCIO +
0.3
—
—
—
—
2.5 V Schmitt Trigger
2.375
2.5
2.625
–0.3
0.7
1.7
VCCIO +
0.3
—
—
—
—
1.0 V LVCMOS
(14)
continued...
(14)
The 1.0 V LVCMOS I/O standard is only supported on the following devices: 10M02SCU324C8G, 10M04SCU324C8G,
10M08SCU324C8G, 10M16SCU324C8G, 10M16SCU169C8G, 10M16SAU169C8G, 10M16DCF484C8G, 10M16DAF484C8G,
10M25DCF484C8G, 10M25DAF484C8G, 10M40DCF484C8G, 10M40DAF484C8G, 10M50DCF484C8G, 10M50DAF484C8G.
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I/O Standard
VCCIO (V)
VIL (V)
VIH (V)
VOL (V)
VOH (V)
IOL (mA)
IOH (mA)
Min
Typ
Max
Min
Max
Min
Max
Max
Min
1.8 V Schmitt Trigger
1.71
1.8
1.89
–0.3
0.35 ×
VCCIO
0.65 ×
VCCIO
VCCIO +
0.3
—
—
—
—
1.5 V Schmitt Trigger
1.425
1.5
1.575
–0.3
0.35 ×
VCCIO
0.65 ×
VCCIO
VCCIO +
0.3
—
—
—
—
2.85
3
3.15
—
0.3 ×
VCCIO
0.5 ×
VCCIO
VCCIO +
0.3
0.1 ×
VCCIO
0.9 ×
VCCIO
1.5
–0.5
3.0 V PCI
Single-Ended SSTL, HSTL, and HSUL I/O Reference Voltage Specifications
Table 21.
Single-Ended SSTL, HSTL, and HSUL I/O Reference Voltage Specifications for Intel MAX 10 Devices
I/O Standard
VCCIO (V)
VREF (V)
(15)
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
2.375
2.5
2.625
1.19
1.25
1.31
VREF – 0.04
VREF
VREF + 0.04
SSTL-18 Class I, II
1.7
1.8
1.9
0.833
0.9
0.969
VREF – 0.04
VREF
VREF + 0.04
SSTL-15 Class I, II
1.425
1.5
1.575
0.49 × VCCIO
0.5 × VCCIO
0.51 × VCCIO
0.49 × VCCIO
0.5 × VCCIO
0.51 × VCCIO
SSTL-135 Class I, II
1.283
1.35
1.45
0.49 × VCCIO
0.5 × VCCIO
0.51 × VCCIO
0.49 × VCCIO
0.5 × VCCIO
0.51 × VCCIO
HSTL-18 Class I, II
1.71
1.8
1.89
0.85
0.9
0.95
0.85
0.9
0.95
HSTL-15 Class I, II
1.425
1.5
1.575
0.71
0.75
0.79
0.71
0.75
0.79
HSTL-12 Class I, II
1.14
1.2
1.26
0.48 × VCCIO
0.5 × VCCIO
(16)
0.52 × VCCIO
—
0.5 × VCCIO
—
0.47 × VCCIO
0.5 × VCCIO
(17)
—
—
—
SSTL-2 Class I, II
(16)
(17)
HSUL-12
1.14
1.2
1.3
0.49 × VCCIO
(15)
VTT of transmitting device must track VREF of the receiving device.
(16)
Value shown refers to DC input reference voltage, VREF(DC).
(17)
Value shown refers to AC input reference voltage, VREF(AC).
Intel® MAX® 10 FPGA Device Datasheet
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VTT (V)
(16)
0.5 × VCCIO
0.53 × VCCIO
(17)
0.51 × VCCIO
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Single-Ended SSTL, HSTL, and HSUL I/O Standards Signal Specifications
Table 22.
Single-Ended SSTL, HSTL, and HSUL I/O Standards Signal Specifications for Intel MAX 10 Devices
To meet the IOL and IOH specifications, you must set the current strength settings accordingly. For example, to meet the SSTL-15 Class I specification (8 mA), you
should set the current strength settings to 8 mA. Setting at lower current strength may not meet the IOL and IOH specifications in the datasheet.
I/O Standard
VIL(DC) (V)
VIH(DC) (V)
VIL(AC) (V)
VIH(AC) (V)
VOL (V)
VOH (V)
IOL (mA)
IOH (mA)
Min
Max
Min
Max
Min
Max
Min
Max
Max
Min
SSTL-2 Class I
—
VREF –
0.18
VREF +
0.18
—
—
VREF –
0.31
VREF +
0.31
—
VTT – 0.57
VTT + 0.57
8.1
–8.1
SSTL-2 Class II
—
VREF –
0.18
VREF +
0.18
—
—
VREF –
0.31
VREF +
0.31
—
VTT – 0.76
VTT + 0.76
16.4
–16.4
SSTL-18 Class I
—
VREF –
0.125
VREF +
0.125
—
—
VREF –
0.25
VREF +
0.25
—
VTT –
0.475
VTT +
0.475
6.7
–6.7
SSTL-18 Class II
—
VREF –
0.125
VREF +
0.125
—
—
VREF –
0.25
VREF +
0.25
—
0.28
VCCIO –
0.28
13.4
–13.4
SSTL-15 Class I
—
VREF – 0.1
VREF + 0.1
—
—
VREF –
0.175
VREF +
0.175
—
0.2 ×
VCCIO
0.8 ×
VCCIO
8
–8
SSTL-15 Class II
—
VREF – 0.1
VREF + 0.1
—
—
VREF –
0.175
VREF +
0.175
—
0.2 ×
VCCIO
0.8 ×
VCCIO
16
–16
SSTL-135
—
VREF –
0.09
VREF +
0.09
—
—
VREF –
0.16
VREF +
0.16
—
0.2 ×
VCCIO
0.8 ×
VCCIO
—
—
HSTL-18 Class I
—
VREF – 0.1
VREF + 0.1
—
—
VREF – 0.2
VREF + 0.2
—
0.4
VCCIO –
0.4
8
–8
HSTL-18 Class II
—
VREF – 0.1
VREF + 0.1
—
—
VREF – 0.2
VREF + 0.2
—
0.4
VCCIO –
0.4
16
–16
HSTL-15 Class I
—
VREF – 0.1
VREF + 0.1
—
—
VREF – 0.2
VREF + 0.2
—
0.4
VCCIO –
0.4
8
–8
HSTL-15 Class II
—
VREF – 0.1
VREF + 0.1
—
—
VREF – 0.2
VREF + 0.2
—
0.4
VCCIO –
0.4
16
–16
continued...
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I/O Standard
VIL(DC) (V)
VIH(DC) (V)
VIL(AC) (V)
VIH(AC) (V)
VOL (V)
VOH (V)
IOL (mA)
IOH (mA)
Min
Max
Min
Max
Min
Max
Min
Max
Max
Min
HSTL-12 Class I
–0.15
VREF –
0.08
VREF +
0.08
VCCIO +
0.15
–0.24
VREF –
0.15
VREF +
0.15
VCCIO +
0.24
0.25 ×
VCCIO
0.75 ×
VCCIO
8
–8
HSTL-12 Class II
–0.15
VREF –
0.08
VREF +
0.08
VCCIO +
0.15
–0.24
VREF –
0.15
VREF +
0.15
VCCIO +
0.24
0.25 ×
VCCIO
0.75 ×
VCCIO
14
–14
—
VREF –
0.13
VREF +
0.13
—
—
VREF –
0.22
VREF +
0.22
—
0.1 ×
VCCIO
0.9 ×
VCCIO
—
—
HSUL-12
Differential SSTL I/O Standards Specifications
Differential SSTL requires a VREF input.
Table 23.
Differential SSTL I/O Standards Specifications for Intel MAX 10 Devices
I/O Standard
VCCIO (V)
VSwing(DC) (V)
VX(AC) (V)
VSwing(AC) (V)
Min
Typ
Max
Min
Max(18)
Min
Typ
Max
Min
Max
2.375
2.5
2.625
0.36
VCCIO
VCCIO/2 –
0.2
—
VCCIO/2+
0.2
0.7
VCCIO
SSTL-18 Class I, II
1.7
1.8
1.9
0.25
VCCIO
VCCIO/2 –
0.175
—
VCCIO/2+
0.175
0.5
VCCIO
SSTL-15 Class I, II
1.425
1.5
1.575
0.2
—
VCCIO/2 –
0.15
—
VCCIO/2 +
0.15
2(VIH(AC) –
VREF)
2(VIL(AC) –
VREF)
SSTL-135
1.283
1.35
1.45
0.18
—
VREF –
0.135
0.5 × VCCIO
VREF +
0.135
2(VIH(AC) –
VREF)
2(VIL(AC) –
VREF)
SSTL-2 Class I, II
Differential HSTL and HSUL I/O Standards Specifications
Differential HSTL requires a VREF input.
(18)
The maximum value for VSWING(DC) is not defined. However, each single-ended signal needs to be within the respective single-ended
limits (VIH(DC) and VIL(DC)).
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Table 24.
Differential HSTL and HSUL I/O Standards Specifications for Intel MAX 10 Devices
I/O Standard
VCCIO (V)
VDIF(DC) (V)
VX(AC) (V)
VCM(DC) (V)
VDIF(AC)
(V)
Min
Typ
Max
Min
Max
Min
Typ
Max
Min
Typ
Max
Min
HSTL-18 Class I, II
1.71
1.8
1.89
0.2
—
0.85
—
0.95
0.85
—
0.95
0.4
HSTL-15 Class I, II
1.425
1.5
1.575
0.2
—
0.71
—
0.79
0.71
—
0.79
0.4
HSTL-12 Class I, II
1.14
1.2
1.26
0.16
VCCIO
0.48 ×
VCCIO
0.5 ×
VCCIO
0.52 ×
VCCIO
0.48 ×
VCCIO
0.5 ×
VCCIO
0.52 ×
VCCIO
0.3
HSUL-12
1.14
1.2
1.3
0.26
—
0.5 ×
VCCIO –
0.12
0.5 ×
VCCIO
0.5 ×
VCCIO +
0.12
0.4 ×
VCCIO
0.5 ×
VCCIO
0.6 ×
VCCIO
0.44
Differential I/O Standards Specifications
Table 25.
Differential I/O Standards Specifications for Intel MAX 10 Devices
I/O Standard
LVPECL
(22)
LVDS
VCCIO (V)
VID (mV)
VICM (V)
(19)
VOD (mV)
(20)(21)
VOS (V)
(20)
Min
Typ
Max
Min
Max
Min
Condition
Max
Min
Typ
Max
Min
Typ
Max
2.375
2.5
2.625
100
—
0.05
DMAX ≤ 500 Mbps
1.8
—
—
—
—
—
—
0.55
500 Mbps ≤ DMAX ≤
700 Mbps
1.8
1.05
DMAX > 700 Mbps
1.55
0.05
DMAX ≤ 500 Mbps
1.8
247
—
600
1.125
1.25
1.375
0.55
500 Mbps ≤ DMAX ≤
700 Mbps
1.8
2.375
2.5
2.625
100
—
continued...
(19)
VIN range: 0 V ≤ VIN ≤ 1.85 V.
(20)
RL range: 90 ≤ RL ≤
(21)
Low VOD setting is only supported for RSDS standard.
(22)
LVPECL input standard is only supported at clock input. Output standard is not supported.
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I/O Standard
VCCIO (V)
Min
BLVDS
(23)
mini-LVDS
2.375
(24)
Typ
2.5
VID (mV)
Max
Min
Max
VICM (V)
(19)
VOD (mV)
Min
Condition
Max
1.05
DMAX > 700 Mbps
1.55
—
—
2.625
100
—
—
(20)(21)
VOS (V)
(20)
Min
Typ
Max
Min
Typ
Max
—
—
—
—
—
—
2.375
2.5
2.625
—
—
—
—
—
300
—
600
1
1.2
1.4
2.375
2.5
2.625
—
—
—
—
—
100
200
600
0.5
1.2
1.5
PPDS (Row I/Os)
2.375
2.5
2.625
—
—
—
—
—
100
200
600
0.5
1.2
1.4
TMDS(25)
2.375
2.5
2.625
100
—
0.05
DMAX ≤ 500 Mbps
1.8
—
—
—
—
—
—
0.55
500 Mbps ≤ DMAX ≤
700 Mbps
1.8
1.05
DMAX > 700 Mbps
1.55
0.55
—
1.25
(27)
0.9
1
1.1
(27)
RSDS
(24)
(24)
Sub-LVDS
SLVS
(26)
1.71
2.375
1.8
2.5
1.89
2.625
100
100
—
—
0.05
—
0.8
(28)
continued...
(19)
(20)
(21)
VIN range: 0 V ≤ VIN ≤ 1.85 V.
RL range: 90 ≤ RL ≤ 110 Ω.
Low VOD setting is only supported for RSDS standard.
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I/O Standard
HiSpi
VCCIO (V)
VID (mV)
VICM (V)
(19)
VOD (mV)
(20)(21)
VOS (V)
(20)
Min
Typ
Max
Min
Max
Min
Condition
Max
Min
Typ
Max
Min
Typ
Max
2.375
2.5
2.625
100
—
0.05
DMAX ≤ 500 Mbps
1.8
—
—
—
—
—
—
0.55
500 Mbps ≤ DMAX ≤
700 Mbps
1.8
1.05
DMAX > 700 Mbps
1.55
Related Information
Intel MAX 10 LVDS SERDES I/O Standards Support, Intel MAX 10 High-Speed LVDS I/O User Guide
Provides the list of I/O standards supported in single supply and dual supply devices.
Switching Characteristics
This section provides the performance characteristics of Intel MAX 10 core and periphery blocks.
(19)
(20)
(21)
VIN range: 0 V ≤ VIN ≤ 1.85 V.
RL range: 90 ≤ RL ≤ 110 Ω.
Low VOD setting is only supported for RSDS standard.
(23)
No fixed VIN , VOD , and VOS specifications for Bus LVDS (BLVDS). They are dependent on the system topology.
(24)
Mini-LVDS, RSDS, and Point-to-Point Differential Signaling (PPDS) standards are only supported at the output pins for Intel MAX 10
devices.
(25)
Supported with requirement of an external level shift
(26)
Sub-LVDS input buffer is using 2.5 V differential buffer.
(27)
Differential output depends on the values of the external termination resistors.
(28)
Differential output offset voltage depends on the values of the external termination resistors.
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Core Performance Specifications
Clock Tree Specifications
Table 26.
Clock Tree Specifications for Intel MAX 10 Devices
Device
Performance
Unit
–I6
–A6, –C7
–I7
–A7
–C8
10M02
450
416
416
382
402
MHz
10M04
450
416
416
382
402
MHz
10M08
450
416
416
382
402
MHz
10M16
450
416
416
382
402
MHz
10M25
450
416
416
382
402
MHz
10M40
450
416
416
382
402
MHz
10M50
450
416
416
382
402
MHz
PLL Specifications
Table 27.
PLL Specifications for Intel MAX 10 Devices
VCCD_PLL should always be connected to VCCINT through decoupling capacitor and ferrite bead.
Symbol
fIN
(29)
fINPFD
Parameter
Condition
Min
Typ
Max
Unit
Input clock frequency
—
5
—
472.5
MHz
Phase frequency detector (PFD) input frequency
—
5
—
325
MHz
continued...
(29)
This parameter is limited in the Intel Quartus Prime software by the I/O maximum frequency. The maximum I/O frequency is
different for each I/O standard.
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Symbol
fVCO
(30)
fINDUTY
tINJITTER_CCJ
fOUT_EXT
(31)
Parameter
Condition
Min
Typ
Max
Unit
PLL internal voltage-controlled oscillator (VCO)
operating range
—
600
—
1300
MHz
Input clock duty cycle
—
40
—
60
%
FINPFD ≥ 100 MHz
—
—
0.15
UI
FINPFD < 100 MHz
—
—
±750
ps
—
—
—
472.5
MHz
–6 speed grade
—
—
472.5
MHz
–7 speed grade
—
—
450
MHz
Input clock cycle-to-cycle jitter
(29)
PLL output frequency for external clock output
fOUT
PLL output frequency to global clock
tOUTDUTY
Duty cycle for external clock output
tLOCK
Time required to lock from end of device
configuration
tDLOCK
Time required to lock dynamically
tOUTJITTER_PERIOD_IO
Regular I/O period jitter
(32)
tOUTJITTER_CCJ_IO
(32)
Regular I/O cycle-to-cycle jitter
–8 speed grade
—
—
402.5
MHz
Duty cycle set to 50%
45
50
55
%
—
—
—
1
ms
After switchover, reconfiguring
any non-post-scale counters or
delays, or when areset is
deasserted
—
—
1
ms
FOUT ≥ 100 MHz
—
—
650
ps
FOUT < 100 MHz
—
—
75
mUI
FOUT ≥ 100 MHz
—
—
650
ps
FOUT < 100 MHz
—
—
75
mUI
continued...
(30)
The VCO frequency reported by the Intel Quartus Prime software in the PLL summary section of the compilation report takes into
consideration the VCO post-scale counter K value. Therefore, if the counter K has a value of 2, the frequency reported can be lower
than the fVCO specification.
(31)
A high input jitter directly affects the PLL output jitter. To have low PLL output clock jitter, you must provide a clean clock source,
which is less than 200 ps.
(32)
Peak-to-peak jitter with a probability level of 10–12 (14 sigma, 99.99999999974404% confidence level). The output jitter specification
applies to the intrinsic jitter of the PLL, when an input jitter of 30 ps is applied.
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Symbol
Parameter
Condition
Min
Typ
Max
Unit
tPLL_PSERR
Accuracy of PLL phase shift
—
—
—
±50
ps
tARESET
Minimum pulse width on areset signal.
—
10
—
—
ns
—
SCANCLK
tCONFIGPLL
Time required to reconfigure scan chains for
PLLs
—
fSCANCLK
scanclk frequency
—
Table 28.
—
3.5
(33)
cycles
—
—
100
MHz
PLL Specifications for Intel MAX 10 Single Supply Devices
For V36 package, the PLL specification is based on single supply devices.
Symbol
Parameter
tOUTJITTER_PERIOD_DEDCLK
tOUTJITTER_CCJ_DEDCLK
Table 29.
(32)
(32)
Dedicated clock output period jitter
Dedicated clock output cycle-to-cycle jitter
Parameter
tOUTJITTER_PERIOD_DEDCLK
tOUTJITTER_CCJ_DEDCLK
(32)
(32)
Dedicated clock output period jitter
Dedicated clock output cycle-to-cycle jitter
Unit
FOUT ≥ 100 MHz
660
ps
FOUT < 100 MHz
66
mUI
FOUT ≥ 100 MHz
660
ps
FOUT < 100 MHz
66
mUI
Condition
Max
Unit
FOUT ≥ 100 MHz
300
ps
FOUT < 100 MHz
30
mUI
FOUT ≥ 100 MHz
300
ps
FOUT < 100 MHz
30
mUI
With 100 MHz scanclk frequency.
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PLL Specifications for Intel MAX 10 Dual Supply Devices
Symbol
(33)
Condition
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Embedded Multiplier Specifications
Table 30.
Embedded Multiplier Specifications for Intel MAX 10 Devices
Mode
Number of Multipliers
9 × 9-bit multiplier
Power Supply Mode
1
18 × 18-bit multiplier
1
Performance
Unit
–I6
–A6, –C7, –I7,
–A7
–C8
Single supply mode
198
183
160
MHz
Dual supply mode
310
260
210
MHz
Single supply mode
198
183
160
MHz
Dual supply mode
265
240
190
MHz
Memory Block Performance Specifications
Table 31.
Memory Block Performance Specifications for Intel MAX 10 Devices
Memory
M9K Block
Mode
FIFO 256 × 36
Single-port 256 × 36
Simple dual-port 256 × 36
Resources Used
LEs
M9K
Memory
47
1
0
0
1
1
CLK
True dual port 512 × 18
single CLK
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0
1
Power Supply Mode
Performance
Unit
–I6
–A6, –C7, –I7,
–A7
–C8
Single supply mode
232
219
204
MHz
Dual supply mode
330
300
250
MHz
Single supply mode
232
219
204
MHz
Dual supply mode
330
300
250
MHz
Single supply mode
232
219
204
MHz
Dual supply mode
330
300
250
MHz
Single supply mode
232
219
204
MHz
Dual supply mode
330
300
250
MHz
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Internal Oscillator Specifications
Table 32.
Internal Oscillator Frequencies for Intel MAX 10 Devices
You can access to the internal oscillator frequencies in this table. The duty cycle of internal oscillator is approximately 45%–55%.
Device
Frequency
10M02
Unit
Minimum
Typical
Maximum
55
82
116
MHz
35
52
77
MHz
10M04
10M08
10M16
10M25
10M40
10M50
UFM Performance Specifications
Table 33.
Block
UFM
UFM Performance Specifications for Intel MAX 10 Devices
Mode
Avalon®-MM
Interface
slave
Parallel
Serial
Device
Maximum
3.43
7.25
MHz
10M04, 10M08, 10M16, 10M25, 10M40,
10M50
5
116
MHz
10M02, 10M04, 10M08, 10M16, 10M25
3.43
7.25
MHz
10M40, 10M50
2.18
4.81
MHz
10M02
(35)
(34)
Clock source is derived from user, except for 10M02 device.
(35)
Clock source is derived from 1/16 of the frequency of the internal oscillator.
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Unit
Minimum
(34)
(35)
Frequency
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ADC Performance Specifications
Single Supply Devices ADC Performance Specifications
Table 34.
ADC Performance Specifications for Intel MAX 10 Single Supply Devices
Parameter
Symbol
Condition
Min
Typ
Max
Unit
—
—
—
—
12
bits
VCC_ONE
—
2.85
3.0/3.3
3.465
V
VREF
—
VCC_ONE –
0.5
—
VCC_ONE
V
Sampling rate
FS
Accumulative sampling rate
—
—
1
MSPS
Operating junction temperature range
TJ
—
–40
25
125
°C
VIN
Prescalar disabled
0
—
VREF
V
0
—
3.6
V
ADC resolution
ADC supply voltage
External reference voltage
Analog input voltage
Prescalar enabled
(36)
Input resistance
RIN
—
—
(37)
—
—
Input capacitance
CIN
—
—
(37)
—
—
Eoffset
Prescalar disabled
–0.2
—
0.2
%FS
Prescalar enabled
–0.5
—
0.5
%FS
Prescalar disabled
–0.5
—
0.5
%FS
Prescalar enabled
–0.75
—
0.75
%FS
External VREF, no missing
code
–0.9
—
0.9
LSB
Internal VREF, no missing
code
–1
—
1.7
LSB
DC Accuracy
Offset error and drift
Gain error and drift
Differential non linearity
Egain
DNL
continued...
(36)
Prescalar function divides the analog input voltage by half. The analog input handles up to 3.6 V for the Intel MAX 10 single supply
devices.
(37)
Download the SPICE models for simulation.
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Parameter
Integral non linearity
AC Accuracy
Condition
Min
Typ
Max
Unit
INL
—
–2
—
2
LSB
—
—
dB
(38)
Total harmonic distortion
THD
FIN = 50 kHz, FS = 1 MHz,
PLL
–65
Signal-to-noise ratio
SNR
FIN = 50 kHz, FS = 1 MHz,
PLL
54
(39)
—
—
dB
SINAD
FIN = 50 kHz, FS = 1 MHz,
PLL
53
(40)
—
—
dB
Temperature sampling rate
TS
—
—
—
50
kSPS
Absolute accuracy
—
–40 to 125°C,
with 64 samples averaging
—
—
±10
°C
Signal-to-noise and distortion
On-Chip Temperature
Sensor
Symbol
(41)
Conversion Rate
(42)
Conversion time
—
Single measurement
—
—
1
Cycle
Continuous measurement
—
—
1
Cycle
Temperature measurement
—
—
1
Cycle
Related Information
SPICE Models for Intel FPGAs
(38)
THD with prescalar enabled is 6dB less than the specification.
(39)
SNR with prescalar enabled is 6dB less than the specification.
(40)
SINAD with prescalar enabled is 6dB less than the specification.
(41)
For the Intel Quartus Prime software version 15.0 and later, Modular ADC Core Intel FPGA IP and Modular Dual ADC Core Intel FPGA
IP cores handle the 64 samples averaging. For the Intel Quartus Prime software versions prior to 14.1, you need to implement your
own averaging calculation.
(42)
For more detailed description, refer to the Timing section in the Intel MAX 10 Analog-to-Digital Converter User Guide.
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Dual Supply Devices ADC Performance Specifications
Table 35.
ADC Performance Specifications for Intel MAX 10 Dual Supply Devices
Parameter
Symbol
Condition
Min
Typ
Max
Unit
—
—
—
—
12
bits
Analog supply voltage
VCCA_ADC
—
2.375
2.5
2.625
V
Digital supply voltage
VCCINT
—
1.15
1.2
1.25
V
VREF
—
VCCA_ADC –
0.5
—
VCCA_ADC
V
Sampling rate
FS
Accumulative sampling rate
—
—
1
MSPS
Operating junction temperature range
TJ
—
–40
25
125
°C
VIN
Prescalar disabled
0
—
VREF
V
0
—
3
V
ADC resolution
External reference voltage
Analog input voltage
Prescalar enabled
(43)
Analog supply current (DC)
IACC_ADC
Average current
—
275
450
µA
Digital supply current (DC)
ICCINT
Average current
—
65
150
µA
Input resistance
RIN
—
—
(44)
—
—
Input capacitance
CIN
—
—
(44)
—
—
Eoffset
Prescalar disabled
–0.2
—
0.2
%FS
Prescalar enabled
–0.5
—
0.5
%FS
Prescalar disabled
–0.5
—
0.5
%FS
Prescalar enabled
–0.75
—
0.75
%FS
External VREF, no missing
code
–0.9
—
0.9
LSB
DC Accuracy
Offset error and drift
Gain error and drift
Differential non linearity
Egain
DNL
continued...
(43)
Prescalar function divides the analog input voltage by half. The analog input handles up to 3 V input for the Intel MAX 10 dual supply
devices.
(44)
Download the SPICE models for simulation.
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Parameter
Integral non linearity
AC Accuracy
INL
Condition
Min
Typ
Max
Unit
Internal VREF, no missing
code
–1
—
1.7
LSB
—
–2
—
2
LSB
(45)(46)
—
—
dB
—
—
dB
—
—
dB
Total harmonic distortion
THD
FIN = 50 kHz, FS = 1 MHz,
PLL
Signal-to-noise ratio
SNR
FIN = 50 kHz, FS = 1 MHz,
PLL
SINAD
FIN = 50 kHz, FS = 1 MHz,
PLL
Temperature sampling rate
TS
—
—
—
50
kSPS
Absolute accuracy
—
–40 to 125°C,
with 64 samples averaging
—
—
±5
°C
Signal-to-noise and distortion
On-Chip Temperature
Sensor
Symbol
–70
62
(47)
(48)(49)(47)
61.5
(50)
(51)(47)
(52)
continued...
(45)
Total harmonic distortion is –65 dB for dual function pin.
(46)
THD with prescalar enabled is 6dB less than the specification.
(47)
When using internal VREF, THD = 66 dB, SNR = 58 dB and SINAD = 57.5 dB for dedicated ADC input channels.
(48)
Signal-to-noise ratio is 54 dB for dual function pin.
(49)
SNR with prescalar enabled is 6dB less than the specification.
(50)
Signal-to-noise and distortion is 53 dB for dual function pin.
(51)
SINAD with prescalar enabled is 6dB less than the specification.
(52)
For the Intel Quartus Prime software version 15.0 and later, Modular ADC Core and Modular Dual ADC Core IP cores handle the 64
samples averaging. For the Intel Quartus Prime software versions prior to 14.1, you need to implement your own averaging
calculation.
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Parameter
Conversion Rate
(53)
Conversion time
Symbol
Condition
Min
Typ
Max
Unit
—
Single measurement
—
—
1
Cycle
Continuous measurement
—
—
1
Cycle
Temperature measurement
—
—
1
Cycle
Related Information
SPICE Models for Intel FPGAs
Periphery Performance Specifications
This section describes the periphery performance, high-speed I/O, and external memory interface.
Actual achievable frequency depends on design and system specific factors. Ensure proper timing closure in your design and
perform HSPICE/IBIS simulations based on your specific design and system setup to determine the maximum achievable
frequency in your system.
High-Speed I/O Specifications
For more information about the high-speed and low-speed I/O performance pins, refer to the respective device pin-out files.
Related Information
Documentation: Pin-Out Files for Intel FPGAs
(53)
For more detailed description, refer to the Timing section in the Intel MAX 10 Analog-to-Digital Converter User Guide.
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True PPDS and Emulated PPDS_E_3R Transmitter Timing Specifications
Table 36.
True PPDS and Emulated PPDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
True PPDS transmitter is only supported at bottom I/O banks. Emulated PPDS transmitter is supported at the output pin of all I/O banks.
Symbol
fHSCLK
HSIODR
fHSCLK
HSIODR
Parameter
Input clock frequency
(high-speed I/O
performance pin)
Data rate (high-speed
I/O performance pin)
Input clock frequency
(low-speed I/O
performance pin)
Data rate (low-speed
I/O performance pin)
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×10
5
—
155
5
—
155
5
—
155
MHz
×8
5
—
155
5
—
155
5
—
155
MHz
×7
5
—
155
5
—
155
5
—
155
MHz
×4
5
—
155
5
—
155
5
—
155
MHz
×2
5
—
155
5
—
155
5
—
155
MHz
×1
5
—
310
5
—
310
5
—
310
MHz
×10
100
—
310
100
—
310
100
—
310
Mbps
×8
80
—
310
80
—
310
80
—
310
Mbps
×7
70
—
310
70
—
310
70
—
310
Mbps
×4
40
—
310
40
—
310
40
—
310
Mbps
×2
20
—
310
20
—
310
20
—
310
Mbps
×1
10
—
310
10
—
310
10
—
310
Mbps
×10
5
—
150
5
—
150
5
—
150
MHz
×8
5
—
150
5
—
150
5
—
150
MHz
×7
5
—
150
5
—
150
5
—
150
MHz
×4
5
—
150
5
—
150
5
—
150
MHz
×2
5
—
150
5
—
150
5
—
150
MHz
×1
5
—
300
5
—
300
5
—
300
MHz
×10
100
—
300
100
—
300
100
—
300
Mbps
×8
80
—
300
80
—
300
80
—
300
Mbps
×7
70
—
300
70
—
300
70
—
300
Mbps
continued...
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Symbol
Parameter
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×4
40
—
300
40
—
300
40
—
300
Mbps
×2
20
—
300
20
—
300
20
—
300
Mbps
×1
10
—
300
10
—
300
10
—
300
Mbps
tDUTY
Duty cycle on
transmitter output
clock
—
45
—
55
45
—
55
45
—
55
%
TCCS(54)
Transmitter channelto-channel skew
—
—
—
300
—
—
300
—
—
300
ps
tx Jitter(55)
Output jitter (highspeed I/O
performance pin)
—
—
—
425
—
—
425
—
—
425
ps
Output jitter (lowspeed I/O
performance pin)
—
—
—
470
—
—
470
—
—
470
ps
tRISE
Rise time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tFALL
Fall time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tLOCK
Time required for the
PLL to lock, after
CONF_DONE signal
goes high, indicating
the completion of
device configuration
—
—
—
1
—
—
1
—
—
1
ms
(54)
TCCS specifications apply to I/O banks from the same side only.
(55)
TX jitter is the jitter induced from core noise and I/O switching noise.
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True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications
Single Supply Devices True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications
Table 37.
True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Single Supply Devices
True RSDS transmitter is only supported at bottom I/O banks. Emulated RSDS transmitter is supported at the output pin of all I/O banks.
Symbol
fHSCLK
HSIODR
fHSCLK
HSIODR
Parameter
Input clock frequency
(high-speed I/O
performance pin)
Data rate (high-speed
I/O performance pin)
Input clock frequency
(low-speed I/O
performance pin)
Data rate (low-speed
I/O performance pin)
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×10
5
—
50
5
—
50
5
—
50
MHz
×8
5
—
50
5
—
50
5
—
50
MHz
×7
5
—
50
5
—
50
5
—
50
MHz
×4
5
—
50
5
—
50
5
—
50
MHz
×2
5
—
50
5
—
50
5
—
50
MHz
×1
5
—
100
5
—
100
5
—
100
MHz
×10
100
—
100
100
—
100
100
—
100
Mbps
×8
80
—
100
80
—
100
80
—
100
Mbps
×7
70
—
100
70
—
100
70
—
100
Mbps
×4
40
—
100
40
—
100
40
—
100
Mbps
×2
20
—
100
20
—
100
20
—
100
Mbps
×1
10
—
100
10
—
100
10
—
100
Mbps
×10
5
—
50
5
—
50
5
—
50
MHz
×8
5
—
50
5
—
50
5
—
50
MHz
×7
5
—
50
5
—
50
5
—
50
MHz
×4
5
—
50
5
—
50
5
—
50
MHz
×2
5
—
50
5
—
50
5
—
50
MHz
×1
5
—
100
5
—
100
5
—
100
MHz
×10
100
—
100
100
—
100
100
—
100
Mbps
continued...
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Symbol
Parameter
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×8
80
—
100
80
—
100
80
—
100
Mbps
×7
70
—
100
70
—
100
70
—
100
Mbps
×4
40
—
100
40
—
100
40
—
100
Mbps
×2
20
—
100
20
—
100
20
—
100
Mbps
×1
10
—
100
10
—
100
10
—
100
Mbps
tDUTY
Duty cycle on
transmitter output
clock
—
45
—
55
45
—
55
45
—
55
%
TCCS(56)
Transmitter channelto-channel skew
—
—
—
300
—
—
300
—
—
300
ps
tx Jitter(57)
Output jitter (highspeed I/O
performance pin)
—
—
—
425
—
—
425
—
—
425
ps
Output jitter (lowspeed I/O
performance pin)
—
—
—
470
—
—
470
—
—
470
ps
tRISE
Rise time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tFALL
Fall time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tLOCK
Time required for the
PLL to lock, after
CONF_DONE signal
goes high, indicating
the completion of
device configuration
—
—
—
1
—
—
1
—
—
1
ms
(56)
TCCS specifications apply to I/O banks from the same side only.
(57)
TX jitter is the jitter induced from core noise and I/O switching noise.
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Dual Supply Devices True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications
Table 38.
True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
True RSDS transmitter is only supported at bottom I/O banks. Emulated RSDS transmitter is supported at the output pin of all I/O banks.
Symbol
fHSCLK
HSIODR
fHSCLK
HSIODR
Parameter
Input clock frequency
(high-speed I/O
performance pin)
Data rate (high-speed
I/O performance pin)
Input clock frequency
(low-speed I/O
performance pin)
Data rate (low-speed
I/O performance pin)
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×10
5
—
155
5
—
155
5
—
155
MHz
×8
5
—
155
5
—
155
5
—
155
MHz
×7
5
—
155
5
—
155
5
—
155
MHz
×4
5
—
155
5
—
155
5
—
155
MHz
×2
5
—
155
5
—
155
5
—
155
MHz
×1
5
—
310
5
—
310
5
—
310
MHz
×10
100
—
310
100
—
310
100
—
310
Mbps
×8
80
—
310
80
—
310
80
—
310
Mbps
×7
70
—
310
70
—
310
70
—
310
Mbps
×4
40
—
310
40
—
310
40
—
310
Mbps
×2
20
—
310
20
—
310
20
—
310
Mbps
×1
10
—
310
10
—
310
10
—
310
Mbps
×10
5
—
150
5
—
150
5
—
150
MHz
×8
5
—
150
5
—
150
5
—
150
MHz
×7
5
—
150
5
—
150
5
—
150
MHz
×4
5
—
150
5
—
150
5
—
150
MHz
×2
5
—
150
5
—
150
5
—
150
MHz
×1
5
—
300
5
—
300
5
—
300
MHz
×10
100
—
300
100
—
300
100
—
300
Mbps
×8
80
—
300
80
—
300
80
—
300
Mbps
×7
70
—
300
70
—
300
70
—
300
Mbps
continued...
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Symbol
Parameter
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×4
40
—
300
40
—
300
40
—
300
Mbps
×2
20
—
300
20
—
300
20
—
300
Mbps
×1
10
—
300
10
—
300
10
—
300
Mbps
tDUTY
Duty cycle on
transmitter output
clock
—
45
—
55
45
—
55
45
—
55
%
TCCS(58)
Transmitter channelto-channel skew
—
—
—
300
—
—
300
—
—
300
ps
tx Jitter(59)
Output jitter (highspeed I/O
performance pin)
—
—
—
425
—
—
425
—
—
425
ps
Output jitter (lowspeed I/O
performance pin)
—
—
—
470
—
—
470
—
—
470
ps
tRISE
Rise time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tFALL
Fall time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tLOCK
Time required for the
PLL to lock, after
CONF_DONE signal
goes high, indicating
the completion of
device configuration
—
—
—
1
—
—
1
—
—
1
ms
(58)
TCCS specifications apply to I/O banks from the same side only.
(59)
TX jitter is the jitter induced from core noise and I/O switching noise.
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Emulated RSDS_E_1R Transmitter Timing Specifications
Table 39.
Emulated RSDS_E_1R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
Emulated RSDS_E_1R transmitter is supported at the output pin of all I/O banks.
Symbol
fHSCLK
HSIODR
fHSCLK
HSIODR
Parameter
Input clock frequency
(high-speed I/O
performance pin)
Data rate (high-speed
I/O performance pin)
Input clock frequency
(low-speed I/O
performance pin)
Data rate (low-speed
I/O performance pin)
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×10
5
—
85
5
—
85
5
—
85
MHz
×8
5
—
85
5
—
85
5
—
85
MHz
×7
5
—
85
5
—
85
5
—
85
MHz
×4
5
—
85
5
—
85
5
—
85
MHz
×2
5
—
85
5
—
85
5
—
85
MHz
×1
5
—
170
5
—
170
5
—
170
MHz
×10
100
—
170
100
—
170
100
—
170
Mbps
×8
80
—
170
80
—
170
80
—
170
Mbps
×7
70
—
170
70
—
170
70
—
170
Mbps
×4
40
—
170
40
—
170
40
—
170
Mbps
×2
20
—
170
20
—
170
20
—
170
Mbps
×1
10
—
170
10
—
170
10
—
170
Mbps
×10
5
—
85
5
—
85
5
—
85
MHz
×8
5
—
85
5
—
85
5
—
85
MHz
×7
5
—
85
5
—
85
5
—
85
MHz
×4
5
—
85
5
—
85
5
—
85
MHz
×2
5
—
85
5
—
85
5
—
85
MHz
×1
5
—
170
5
—
170
5
—
170
MHz
×10
100
—
170
100
—
170
100
—
170
Mbps
×8
80
—
170
80
—
170
80
—
170
Mbps
×7
70
—
170
70
—
170
70
—
170
Mbps
continued...
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Symbol
Parameter
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×4
40
—
170
40
—
170
40
—
170
Mbps
×2
20
—
170
20
—
170
20
—
170
Mbps
×1
10
—
170
10
—
170
10
—
170
Mbps
tDUTY
Duty cycle on
transmitter output
clock
—
45
—
55
45
—
55
45
—
55
%
TCCS(60)
Transmitter channelto-channel skew
—
—
—
300
—
—
300
—
—
300
ps
tx Jitter(61)
Output jitter (highspeed I/O
performance pin)
—
—
—
425
—
—
425
—
—
425
ps
Output jitter (lowspeed I/O
performance pin)
—
—
—
470
—
—
470
—
—
470
ps
tRISE
Rise time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tFALL
Fall time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tLOCK
Time required for the
PLL to lock, after
CONF_DONE signal
goes high, indicating
the completion of
device configuration
—
—
—
1
—
—
1
—
—
1
ms
(60)
TCCS specifications apply to I/O banks from the same side only.
(61)
TX jitter is the jitter induced from core noise and I/O switching noise.
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True Mini-LVDS and Emulated Mini-LVDS_E_3R Transmitter Timing Specifications
Table 40.
True Mini-LVDS and Emulated Mini-LVDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply
Devices
True mini-LVDS transmitter is only supported at the bottom I/O banks. Emulated mini-LVDS_E_3R transmitter is supported at the output pin of all I/O banks.
Symbol
fHSCLK
HSIODR
fHSCLK
HSIODR
Parameter
Input clock frequency
(high-speed I/O
performance pin)
Data rate (high-speed
I/O performance pin)
Input clock frequency
(low-speed I/O
performance pin)
Data rate (low-speed
I/O performance pin)
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×10
5
—
155
5
—
155
5
—
155
MHz
×8
5
—
155
5
—
155
5
—
155
MHz
×7
5
—
155
5
—
155
5
—
155
MHz
×4
5
—
155
5
—
155
5
—
155
MHz
×2
5
—
155
5
—
155
5
—
155
MHz
×1
5
—
310
5
—
310
5
—
310
MHz
×10
100
—
310
100
—
310
100
—
310
Mbps
×8
80
—
310
80
—
310
80
—
310
Mbps
×7
70
—
310
70
—
310
70
—
310
Mbps
×4
40
—
310
40
—
310
40
—
310
Mbps
×2
20
—
310
20
—
310
20
—
310
Mbps
×1
10
—
310
10
—
310
10
—
310
Mbps
×10
5
—
150
5
—
150
5
—
150
MHz
×8
5
—
150
5
—
150
5
—
150
MHz
×7
5
—
150
5
—
150
5
—
150
MHz
×4
5
—
150
5
—
150
5
—
150
MHz
×2
5
—
150
5
—
150
5
—
150
MHz
×1
5
—
300
5
—
300
5
—
300
MHz
×10
100
—
300
100
—
300
100
—
300
Mbps
×8
80
—
300
80
—
300
80
—
300
Mbps
continued...
Intel® MAX® 10 FPGA Device Datasheet
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Symbol
Parameter
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×7
70
—
300
70
—
300
70
—
300
Mbps
×4
40
—
300
40
—
300
40
—
300
Mbps
×2
20
—
300
20
—
300
20
—
300
Mbps
×1
10
—
300
10
—
300
10
—
300
Mbps
tDUTY
Duty cycle on
transmitter output
clock
—
45
—
55
45
—
55
45
—
55
%
TCCS(62)
Transmitter channelto-channel skew
—
—
—
300
—
—
300
—
—
300
ps
tx Jitter(63)
Output jitter (highspeed I/O
performance pin)
—
—
—
425
—
—
425
—
—
425
ps
Output jitter (lowspeed I/O
performance pin)
—
—
—
470
—
—
470
—
—
470
ps
tRISE
Rise time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tFALL
Fall time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tLOCK
Time required for the
PLL to lock, after
CONF_DONE signal
goes high, indicating
the completion of
device configuration
—
—
—
1
—
—
1
—
—
1
ms
(62)
TCCS specifications apply to I/O banks from the same side only.
(63)
TX jitter is the jitter induced from core noise and I/O switching noise.
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True LVDS Transmitter Timing
Single Supply Devices True LVDS Transmitter Timing Specifications
Table 41.
True LVDS Transmitter Timing Specifications for Intel MAX 10 Single Supply Devices
True LVDS transmitter is only supported at the bottom I/O banks.
Symbol
fHSCLK
HSIODR
Parameter
Input clock frequency
Data rate
Mode
–C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×10
5
—
145
5
—
100
5
—
100
MHz
×8
5
—
145
5
—
100
5
—
100
MHz
×7
5
—
145
5
—
100
5
—
100
MHz
×4
5
—
145
5
—
100
5
—
100
MHz
×2
5
—
145
5
—
100
5
—
100
MHz
×1
5
—
290
5
—
200
5
—
200
MHz
×10
100
—
290
100
—
200
100
—
200
Mbps
×8
80
—
290
80
—
200
80
—
200
Mbps
×7
70
—
290
70
—
200
70
—
200
Mbps
×4
40
—
290
40
—
200
40
—
200
Mbps
×2
20
—
290
20
—
200
20
—
200
Mbps
×1
10
—
290
10
—
200
10
—
200
Mbps
tDUTY
Duty cycle on
transmitter output
clock
—
45
—
55
45
—
55
45
—
55
%
TCCS(64)
Transmitter channelto-channel skew
—
—
—
300
—
—
300
—
—
300
ps
tx Jitter(65)
Output jitter
—
—
—
1,000
—
—
1,000
—
—
1,000
ps
continued...
(64)
TCCS specifications apply to I/O banks from the same side only.
(65)
TX jitter is the jitter induced from core noise and I/O switching noise.
Intel® MAX® 10 FPGA Device Datasheet
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Symbol
Parameter
Mode
–C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
tRISE
Rise time
20 – 80%, CLOAD =
5 pF
—
500
—
—
500
—
—
500
—
ps
tFALL
Fall time
20 – 80%, CLOAD =
5 pF
—
500
—
—
500
—
—
500
—
ps
tLOCK
Time required for the
PLL to lock, after
CONF_DONE signal
goes high, indicating
the completion of
device configuration
—
—
—
1
—
—
1
—
—
1
ms
Dual Supply Devices True LVDS Transmitter Timing Specifications
Table 42.
True LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
True LVDS transmitter is only supported at the bottom I/O banks.
Symbol
fHSCLK
HSIODR
Parameter
Input clock
frequency
Data rate
Mode
–I6
–A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×10
5
—
360
5
—
340
5
—
310
5
—
300
MHz
×8
5
—
360
5
—
360
5
—
320
5
—
320
MHz
×7
5
—
360
5
—
340
5
—
310
5
—
300
MHz
×4
5
—
360
5
—
350
5
—
320
5
—
320
MHz
×2
5
—
360
5
—
350
5
—
320
5
—
320
MHz
×1
5
—
360
5
—
350
5
—
320
5
—
320
MHz
×10
100
—
720
100
—
680
100
—
620
100
—
600
Mbps
×8
80
—
720
80
—
720
80
—
640
80
—
640
Mbps
×7
70
—
720
70
—
680
70
—
620
70
—
600
Mbps
×4
40
—
720
40
—
700
40
—
640
40
—
640
Mbps
×2
20
—
720
20
—
700
20
—
640
20
—
640
Mbps
continued...
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Symbol
Parameter
Mode
–I6
–A6, –C7, –I7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×1
10
—
360
10
—
350
10
—
320
10
—
320
Mbps
tDUTY
Duty cycle on
transmitter output
clock
—
45
—
55
45
—
55
45
—
55
45
—
55
%
TCCS(66)
Transmitter
channel-tochannel skew
—
—
—
300
—
—
300
—
—
300
—
—
300
ps
tx
Output jitter
—
—
—
380
—
—
380
—
—
380
—
—
380
ps
tRISE
Rise time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
—
500
—
ps
tFALL
Fall time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
—
500
—
ps
tLOCK
Time required for
the PLL to lock,
after CONF_DONE
signal goes high,
indicating the
completion of
device
configuration
—
—
—
1
—
—
1
—
—
1
—
—
1
ms
(67)
Jitter
(66)
TCCS specifications apply to I/O banks from the same side only.
(67)
TX jitter is the jitter induced from core noise and I/O switching noise.
Intel® MAX® 10 FPGA Device Datasheet
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–A7
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Emulated LVDS_E_3R, SLVS, and Sub-LVDS Transmitter Timing Specifications
Single Supply Devices Emulated LVDS_E_3R Transmitter Timing Specifications
Table 43.
Emulated LVDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Single Supply Devices
Emulated LVDS_E_3R transmitters are supported at the output pin of all I/O banks.
Symbol
fHSCLK
HSIODR
fHSCLK
HSIODR
Parameter
Input clock frequency
(high-speed I/O
performance pin)
Data rate (high-speed
I/O performance pin)
Input clock frequency
(low-speed I/O
performance pin)
Data rate (low-speed
I/O performance pin)
Mode
–C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×10
5
—
142.5
5
—
100
5
—
100
MHz
×8
5
—
142.5
5
—
100
5
—
100
MHz
×7
5
—
142.5
5
—
100
5
—
100
MHz
×4
5
—
142.5
5
—
100
5
—
100
MHz
×2
5
—
142.5
5
—
100
5
—
100
MHz
×1
5
—
285
5
—
200
5
—
200
MHz
×10
100
—
285
100
—
200
100
—
200
Mbps
×8
80
—
285
80
—
200
80
—
200
Mbps
×7
70
—
285
70
—
200
70
—
200
Mbps
×4
40
—
285
40
—
200
40
—
200
Mbps
×2
20
—
285
20
—
200
20
—
200
Mbps
×1
10
—
285
10
—
200
10
—
200
Mbps
×10
5
—
100
5
—
100
5
—
100
MHz
×8
5
—
100
5
—
100
5
—
100
MHz
×7
5
—
100
5
—
100
5
—
100
MHz
×4
5
—
100
5
—
100
5
—
100
MHz
×2
5
—
100
5
—
100
5
—
100
MHz
×1
5
—
200
5
—
200
5
—
200
MHz
×10
100
—
200
100
—
200
100
—
200
Mbps
continued...
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Symbol
Parameter
Mode
–C7, –I7
–A7
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×8
80
—
200
80
—
200
80
—
200
Mbps
×7
70
—
200
70
—
200
70
—
200
Mbps
×4
40
—
200
40
—
200
40
—
200
Mbps
×2
20
—
200
20
—
200
20
—
200
Mbps
×1
10
—
200
10
—
200
10
—
200
Mbps
tDUTY
Duty cycle on
transmitter output
clock
—
45
—
55
45
—
55
45
—
55
%
TCCS(68)
Transmitter channelto-channel skew
—
—
—
300
—
—
300
—
—
300
ps
tx Jitter(69)
Output jitter
—
—
—
1,000
—
—
1,000
—
—
1,000
ps
tRISE
Rise time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tFALL
Fall time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tLOCK
Time required for the
PLL to lock, after
CONF_DONE signal
goes high, indicating
the completion of
device configuration
—
—
—
1
—
—
1
—
—
1
ms
(68)
TCCS specifications apply to I/O banks from the same side only.
(69)
TX jitter is the jitter induced from core noise and I/O switching noise.
Intel® MAX® 10 FPGA Device Datasheet
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–C8
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Dual Supply Devices Emulated LVDS_E_3R, SLVS, and Sub-LVDS Transmitter Timing Specifications
Table 44.
Emulated LVDS_E_3R, SLVS, and Sub-LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply
Devices
Emulated LVDS_E_3R, SLVS, and Sub-LVDS transmitters are supported at the output pin of all I/O banks.
Symbol
fHSCLK
HSIODR
fHSCLK
HSIODR
Parameter
Input clock frequency
(high-speed I/O
performance pin)
Data rate (high-speed
I/O performance pin)
Input clock frequency
(low-speed I/O
performance pin)
Data rate (low-speed
I/O performance pin)
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×10
5
—
300
5
—
275
5
—
275
MHz
×8
5
—
300
5
—
275
5
—
275
MHz
×7
5
—
300
5
—
275
5
—
275
MHz
×4
5
—
300
5
—
275
5
—
275
MHz
×2
5
—
300
5
—
275
5
—
275
MHz
×1
5
—
300
5
—
275
5
—
275
MHz
×10
100
—
600
100
—
550
100
—
550
Mbps
×8
80
—
600
80
—
550
80
—
550
Mbps
×7
70
—
600
70
—
550
70
—
550
Mbps
×4
40
—
600
40
—
550
40
—
550
Mbps
×2
20
—
600
20
—
550
20
—
550
Mbps
×1
10
—
300
10
—
275
10
—
275
Mbps
×10
5
—
150
5
—
150
5
—
150
MHz
×8
5
—
150
5
—
150
5
—
150
MHz
×7
5
—
150
5
—
150
5
—
150
MHz
×4
5
—
150
5
—
150
5
—
150
MHz
×2
5
—
150
5
—
150
5
—
150
MHz
×1
5
—
300
5
—
300
5
—
300
MHz
×10
100
—
300
100
—
300
100
—
300
Mbps
×8
80
—
300
80
—
300
80
—
300
Mbps
continued...
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Symbol
Parameter
Mode
–I6, –A6, –C7, –I7
–A7
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
×7
70
—
300
70
—
300
70
—
300
Mbps
×4
40
—
300
40
—
300
40
—
300
Mbps
×2
20
—
300
20
—
300
20
—
300
Mbps
×1
10
—
300
10
—
300
10
—
300
Mbps
tDUTY
Duty cycle on
transmitter output
clock
—
45
—
55
45
—
55
45
—
55
%
TCCS(70)
Transmitter channelto-channel skew
—
—
—
300
—
—
300
—
—
300
ps
tx Jitter(71)
Output jitter (highspeed I/O
performance pin)
—
—
—
425
—
—
425
—
—
425
ps
Output jitter (lowspeed I/O
performance pin)
—
—
—
470
—
—
470
—
—
470
ps
tRISE
Rise time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tFALL
Fall time
20 – 80%, CLOAD
= 5 pF
—
500
—
—
500
—
—
500
—
ps
tLOCK
Time required for the
PLL to lock, after
CONF_DONE signal
goes high, indicating
the completion of
device configuration
—
—
—
1
—
—
1
—
—
1
ms
(70)
TCCS specifications apply to I/O banks from the same side only.
(71)
TX jitter is the jitter induced from core noise and I/O switching noise.
Intel® MAX® 10 FPGA Device Datasheet
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–C8
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LVDS, TMDS, HiSpi, SLVS, and Sub-LVDS Receiver Timing Specifications
Single Supply Devices LVDS Receiver Timing Specifications
Table 45.
LVDS Receiver Timing Specifications for Intel MAX 10 Single Supply Devices
LVDS receivers are supported at all banks.
Symbol
fHSCLK
HSIODR
fHSCLK
HSIODR
Parameter
Input clock frequency (highspeed I/O performance pin)
Data rate (high-speed I/O
performance pin)
Input clock frequency (lowspeed I/O performance pin)
Data rate (low-speed I/O
performance pin)
Mode
–C7, –I7
–A7
–C8
Unit
Min
Max
Min
Max
Min
Max
×10
5
145
5
100
5
100
MHz
×8
5
145
5
100
5
100
MHz
×7
5
145
5
100
5
100
MHz
×4
5
145
5
100
5
100
MHz
×2
5
145
5
100
5
100
MHz
×1
5
290
5
200
5
200
MHz
×10
100
290
100
200
100
200
Mbps
×8
80
290
80
200
80
200
Mbps
×7
70
290
70
200
70
200
Mbps
×4
40
290
40
200
40
200
Mbps
×2
20
290
20
200
20
200
Mbps
×1
10
290
10
200
10
200
Mbps
×10
5
100
5
100
5
100
MHz
×8
5
100
5
100
5
100
MHz
×7
5
100
5
100
5
100
MHz
×4
5
100
5
100
5
100
MHz
×2
5
100
5
100
5
100
MHz
×1
5
200
5
200
5
200
MHz
×10
100
200
100
200
100
200
Mbps
continued...
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Symbol
Parameter
Mode
–C7, –I7
–A7
–C8
Unit
Min
Max
Min
Max
Min
Max
×8
80
200
80
200
80
200
Mbps
×7
70
200
70
200
70
200
Mbps
×4
40
200
40
200
40
200
Mbps
×2
20
200
20
200
20
200
Mbps
×1
10
200
10
200
10
200
Mbps
Sampling window (highspeed I/O performance pin)
—
—
910
—
910
—
910
ps
Sampling window (lowspeed I/O performance pin)
—
—
1,110
—
1,110
—
1,110
ps
tx Jitter(72)
Input jitter
—
—
1,000
—
1,000
—
1,000
ps
tLOCK
Time required for the PLL to
lock, after CONF_DONE
signal goes high, indicating
the completion of device
configuration
—
—
1
—
1
—
1
ms
SW
Dual Supply Devices LVDS, TMDS, HiSpi, SLVS, and Sub-LVDS Receiver Timing Specifications
Table 46.
LVDS, TMDS, HiSpi, SLVS, and Sub-LVDS Receiver Timing Specifications for Intel MAX 10 Dual Supply Devices
LVDS, TMDS, HiSpi, SLVS, and Sub-LVDS receivers are supported at all banks.
Symbol
fHSCLK
Parameter
Input clock frequency (highspeed I/O performance pin)
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Max
Min
Max
Min
Max
×10
5
350
5
320
5
320
MHz
×8
5
360
5
320
5
320
MHz
×7
5
350
5
320
5
320
MHz
×4
5
360
5
320
5
320
MHz
continued...
(72)
TX jitter is the jitter induced from core noise and I/O switching noise.
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Symbol
HSIODR
fHSCLK
HSIODR
SW
Parameter
Data rate (high-speed I/O
performance pin)
Input clock frequency (lowspeed I/O performance pin)
Data rate (low-speed I/O
performance pin)
Sampling window (highspeed I/O performance pin)
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Max
Min
Max
Min
Max
×2
5
360
5
320
5
320
MHz
×1
5
360
5
320
5
320
MHz
×10
100
700
100
640
100
640
Mbps
×8
80
720
80
640
80
640
Mbps
×7
70
700
70
640
70
640
Mbps
×4
40
720
40
640
40
640
Mbps
×2
20
720
20
640
20
640
Mbps
×1
10
360
10
320
10
320
Mbps
×10
5
150
5
150
5
150
MHz
×8
5
150
5
150
5
150
MHz
×7
5
150
5
150
5
150
MHz
×4
5
150
5
150
5
150
MHz
×2
5
150
5
150
5
150
MHz
×1
5
300
5
300
5
300
MHz
×10
100
300
100
300
100
300
Mbps
×8
80
300
80
300
80
300
Mbps
×7
70
300
70
300
70
300
Mbps
×4
40
300
40
300
40
300
Mbps
×2
20
300
20
300
20
300
Mbps
×1
10
300
10
300
10
300
Mbps
—
—
510
—
510
—
510
ps
continued...
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Symbol
Parameter
Mode
–I6, –A6, –C7, –I7
–A7
–C8
Unit
Min
Max
Min
Max
Min
Max
Sampling window (lowspeed I/O performance pin)
—
—
910
—
910
—
910
ps
tx Jitter(73)
Input jitter
—
—
500
—
500
—
500
ps
tLOCK
Time required for the PLL to
lock, after CONF_DONE
signal goes high, indicating
the completion of device
configuration
—
—
1
—
1
—
1
ms
Memory Standards Supported by the Soft Memory Controller
Table 47.
Memory Standards Supported by the Soft Memory Controller for Intel MAX 10 Devices
Contact your local sales representatives for access to the -I6 or -A6 speed grade devices in the Intel Quartus Prime software.
External Memory Interface
Standard
Rate Support
Speed Grade
Voltage (V)
Max Frequency (MHz)
DDR3 SDRAM
Half
–I6
1.5
303
DDR3L SDRAM
Half
–I6
1.35
303
DDR2 SDRAM
Half
–I6
1.8
200
–I7 and –C7
LPDDR2(74)
Half
–I6
167
1.2
200(75)
Related Information
External Memory Interface Spec Estimator
Provides the specific details of the memory standards supported.
(73)
TX jitter is the jitter induced from core noise and I/O switching noise.
(74)
Intel MAX 10 devices support only single-die LPDDR2.
(75)
To achieve the specified performance, constrain the memory device I/O and core power supply variation to within ±3%. By default,
the frequency is 167 MHz.
Intel® MAX® 10 FPGA Device Datasheet
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Memory Output Clock Jitter Specifications
Intel MAX 10 devices support external memory interfaces up to 303 MHz. The external memory interfaces for Intel MAX 10
devices calibrate automatically.
The memory output clock jitter measurements are for 200 consecutive clock cycles.
The clock jitter specification applies to memory output clock pins generated using DDIO circuits clocked by a PLL output
routed on a PHY clock network.
DDR3 and LPDDR2 SDRAM memory interfaces are only supported on the fast speed grade device.
Table 48.
Memory Output Clock Jitter Specifications for Intel MAX 10 Devices
Parameter
Symbol
–6 Speed Grade
–7 Speed Grade
Min
Max
Min
Max
Unit
Clock period jitter
tJIT(per)
–127
127
–215
215
ps
Cycle-to-cycle period jitter
tJIT(cc)
—
242
—
360
ps
Related Information
Literature: External Memory Interfaces
Provides more information about external memory system performance specifications, board design guidelines, timing
analysis, simulation, and debugging information.
Configuration Specifications
This section provides configuration specifications and timing for Intel MAX 10 devices.
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JTAG Timing Parameters
Table 49.
JTAG Timing Parameters for Intel MAX 10 Devices
The values are based on CL = 10 pF of TDO.
The affected Boundary Scan Test (BST) instructions are SAMPLE/PRELOAD, EXTEST, INTEST, and CHECK_STATUS.
Symbol
Parameter
Non-BST and non-CONFIG_IO Operation
Minimum
Maximum
Minimum
Maximum
Unit
tJCP
TCK clock period
40
—
50
—
ns
tJCH
TCK clock high time
20
—
25
—
ns
tJCL
TCK clock low time
20
—
25
—
ns
tJPSU_TDI
JTAG port setup time
2
—
2
—
ns
tJPSU_TMS
JTAG port setup time
3
—
3
—
ns
tJPH
JTAG port hold time
10
—
10
—
ns
tJPCO
JTAG port clock to output
—
•
•
tJPZX
JTAG port high impedance to
valid output
—
•
•
tJPXZ
JTAG port valid output to high
impedance
—
•
•
Intel® MAX® 10 FPGA Device Datasheet
58
BST and CONFIG_IO Operation
15 (for VCCIO = 3.3, 3.0,
and 2.5 V)
17 (for VCCIO = 1.8 and
1.5 V)
—
15 (for VCCIO = 3.3, 3.0,
and 2.5 V)
17 (for VCCIO = 1.8 and
1.5 V)
—
15 (for VCCIO = 3.3, 3.0,
and 2.5 V)
17 (for VCCIO = 1.8 and
1.5 V)
—
•
•
•
•
•
•
18 (for VCCIO = 3.3, 3.0,
and 2.5 V)
20 (for VCCIO = 1.8 and
1.5 V)
ns
15 (for VCCIO = 3.3, 3.0,
and 2.5 V)
17 (for VCCIO = 1.8 and
1.5 V)
ns
15 (for VCCIO = 3.3, 3.0,
and 2.5 V)
17 (for VCCIO = 1.8 and
1.5 V)
ns
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Remote System Upgrade Circuitry Timing Specifications
Table 50.
Remote System Upgrade Circuitry Timing Specifications for Intel MAX 10 Devices
Parameter
Device
Minimum
Maximum
Unit
tMAX_RU_CLK
All
—
40
MHz
tRU_nCONFIG
10M02, 10M04, 10M08, 10M16, 10M25
250
—
ns
10M40, 10M50
350
—
ns
10M02, 10M04, 10M08, 10M16, 10M25
300
—
ns
10M40, 10M50
500
—
ns
tRU_nRSTIMER
User Watchdog Internal Circuitry Timing Specifications
Table 51.
User Watchdog Timer Specifications for Intel MAX 10 Devices
The specifications are subject to PVT changes.
Parameter
User watchdog frequency
Device
Minimum
Typical
Maximum
Unit
10M02, 10M04, 10M08, 10M16,
10M25
3.4
5.1
7.3
MHz
10M40, 10M50
2.2
3.3
4.8
MHz
Uncompressed Raw Binary File (.rbf) Sizes
Table 52.
Uncompressed .rbf Sizes for Intel MAX 10 Devices
Device
CFM Data Size (bits)
Without Memory Initialization
With Memory Initialization
10M02/10M02SCU324
554,000/1,540,000
—
10M04
1,540,000
1,880,000
10M08
1,540,000
1,880,000
10M16
2,800,000
3,430,000
continued...
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Device
CFM Data Size (bits)
Without Memory Initialization
With Memory Initialization
10M25
4,140,000
4,780,000
10M40
7,840,000
9,670,000
10M50
7,840,000
9,670,000
Internal Configuration Time
The internal configuration time measurement is from the rising edge of nSTATUS signal to the rising edge of CONF_DONE
signal.
Table 53.
Internal Configuration Time for Intel MAX 10 Devices (Uncompressed .rbf)
Device
Internal Configuration Time (ms)
Unencrypted
Without Memory Initialization
With Memory Initialization
Without Memory Initialization
With Memory Initialization
Min
Max
Min
Max
Min
Max
Min
Max
10M02/
10M02SCU324
0.3/0.6
1.7/2.7
—
—
1.7/5.0
5.4/15.0
—
—
10M04
0.6
2.7
1.0
3.4
5.0
15.0
6.8
19.6
10M08
0.6
2.7
1.0
3.4
5.0
15.0
6.8
19.6
10M16
1.1
3.7
1.4
4.5
9.3
25.3
11.7
31.5
10M25
1.0
3.7
1.3
4.4
14.0
38.1
16.9
45.7
10M40
2.6
6.9
3.2
9.8
41.5
112.1
51.7
139.6
10M50
2.6
6.9
3.2
9.8
41.5
112.1
51.7
139.6
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Encrypted
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Table 54.
Internal Configuration Time for Intel MAX 10 Devices (Compressed .rbf)
Compression ratio depends on design complexity. The minimum value is based on the best case (25% of original .rbf sizes) and the maximum value is based on
the typical case (70% of original .rbf sizes).
Device
Internal Configuration Time (ms)
Unencrypted/Encrypted
Without Memory Initialization
With Memory Initialization
Min
Max
Min
Max
10M02/10M02SCU324
0.3/0.6
5.2/10.7
—
—
10M04
0.6
10.7
1.0
13.9
10M08
0.6
10.7
1.0
13.9
10M16
1.1
17.9
1.4
22.3
10M25
1.1
26.9
1.4
32.2
10M40
2.6
66.1
3.2
82.2
10M50
2.6
66.1
3.2
82.2
Internal Configuration Timing Parameter
Table 55.
Internal Configuration Timing Parameter for Intel MAX 10 Devices
Symbol
tCD2UM
Parameter
Device
Minimum
Maximum
Unit
CONF_DONE high to
10M02, 10M04, 10M08, 10M16, 10M25
182.8
385.5
μs
10M40, 10M50
275.3
605.7
μs
user mode
I/O Timing
The data is typically used prior to designing the FPGA to get an estimate of the timing budget as part of the link timing
analysis.
The Intel Quartus Prime Timing Analyzer provides a more accurate and precise I/O timing data based on the specific device
and design after you complete place-and-route.
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Table 56.
I/O Timing for Intel MAX 10 Devices
These I/O timing parameters are for the 3.3-V LVTTL I/O standard with the maximum drive strength and fast slew rate for 10M08DAF484 device.
Symbol
Parameter
–C7, –I7
–C8
Unit
–0.750
–0.808
ns
Tsu
Global clock setup time
Th
Global clock hold time
1.180
1.215
ns
Tco
Global clock to output delay
5.131
5.575
ns
Tpd
Best case pin-to-pin propagation delay through one LUT
4.907
5.467
ns
Programmable IOE Delay
Programmable IOE Delay On Row Pins
Table 57.
IOE Programmable Delay on Row Pins for Intel MAX 10 Devices
The incremental values for the settings are generally linear. For exact values of each setting, refer to the Assignment Name column in the latest version of the
Intel Quartus Prime software.
The minimum and maximum offset timing numbers are in reference to setting ‘0’ as available in the Intel Quartus Prime software.
Parameter
Paths Affected
Minimum
Offset
Maximum Offset
Fast Corner
Unit
Slow Corner
–I7
–C8
–A6
–C7
–C8
–I7
–A7
Input delay from
pin to internal
cells
Pad to I/O
dataout to core
7
0
0.815
0.873
1.831
1.811
1.874
1.871
1.922
ns
Input delay from
pin to input
register
Pad to I/O input
register
8
0
0.924
0.992
2.081
2.055
2.125
2.127
2.185
ns
Delay from
output register to
output pin
I/O output
register to pad
2
0
0.479
0.514
1.069
1.070
1.117
1.105
1.134
ns
Intel® MAX® 10 FPGA Device Datasheet
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Number of
Settings
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Programmable IOE Delay for Column Pins
Table 58.
IOE Programmable Delay on Column Pins for Intel MAX 10 Devices
The incremental values for the settings are generally linear. For exact values of each setting, refer to the Assignment Name column in the latest version of the
Intel Quartus Prime software.
The minimum and maximum offset timing numbers are in reference to setting ‘0’ as available in the Intel Quartus Prime software.
Parameter
Paths Affected
Number of
Settings
Minimum
Offset
Maximum Offset
Fast Corner
Unit
Slow Corner
–I7
–C8
–A6
–C7
–C8
–I7
–A7
Input delay from
pin to internal
cells
Pad to I/O
dataout to core
7
0
0.81
0.868
1.823
1.802
1.864
1.862
1.912
ns
Input delay from
pin to input
register
Pad to I/O input
register
8
0
0.914
0.981
2.06
2.032
2.101
2.102
2.161
ns
Delay from
output register to
output pin
I/O output
register to pad
2
0
0.435
0.466
0.971
0.97
1.013
1.001
1.028
ns
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Glossary
Table 59.
Glossary
Term
JTAG Timing Specifications
Definition
TMS
TDI
t JCH
t JCP
t JCL
t JPSU
tJPH
TCK
tJPZX
tJPCO
t JPXZ
TDO
RL
Receiver differential input discrete resistor (external to Intel MAX 10 devices).
RSKM (Receiver input skew margin)
HIGH-SPEED I/O block: The total margin left after accounting for the sampling window and TCCS. RSKM = (TUI – SW – TCCS) / 2.
Sampling window (SW)
HIGH-SPEED I/O Block: The period of time during which the data must be valid to capture it correctly. The setup and hold times
determine the ideal strobe position in the sampling window.
Single-ended voltage referenced I/O
standard
The AC input signal values indicate the voltage levels at which the receiver must meet its timing specifications. The DC input signal
values indicate the voltage levels at which the final logic state of the receiver is unambiguously defined. After the receiver input
crosses the AC value, the receiver changes to the new logic state.
The new logic state is then maintained as long as the input stays beyond the DC threshold. This approach is intended to provide
predictable receiver timing in the presence of input waveform ringing.
tC
High-speed receiver/transmitter input and output clock period.
TCCS (Channel-to- channel-skew)
HIGH-SPEED I/O block: The timing difference between the fastest and slowest output edges, including tCO variation and clock skew.
The clock is included in the TCCS measurement.
tcin
Delay from clock pad to I/O input register.
tCO
Delay from clock pad to I/O output.
tcout
Delay from clock pad to I/O output register.
continued...
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Term
Definition
tDUTY
HIGH-SPEED I/O Block: Duty cycle on high-speed transmitter output clock.
tFALL
Signal high-to-low transition time (80–20%).
tH
Input register hold time.
Timing Unit Interval (TUI)
HIGH-SPEED I/O block: The timing budget allowed for skew, propagation delays, and data sampling window. (TUI = 1/(Receiver
Input Clock Frequency Multiplication Factor) = tC/w).
tINJITTER
Period jitter on PLL clock input.
tOUTJITTER_DEDCLK
Period jitter on dedicated clock output driven by a PLL.
tOUTJITTER_IO
Period jitter on general purpose I/O driven by a PLL.
tpllcin
Delay from PLL inclk pad to I/O input register.
tpllcout
Delay from PLL inclk pad to I/O output register.
tRISE
Signal low-to-high transition time (20–80%).
tSU
Input register setup time.
VCM(DC)
DC common mode input voltage.
VDIF(AC)
AC differential input voltage: The minimum AC input differential voltage required for switching.
VDIF(DC)
DC differential input voltage: The minimum DC input differential voltage required for switching.
VHYS
Hysteresis for Schmitt trigger input.
VICM
Input common mode voltage: The common mode of the differential signal at the receiver.
VID
Input differential Voltage Swing: The difference in voltage between the positive and complementary conductors of a differential
transmission at the receiver.
VIH
Voltage input high: The minimum positive voltage applied to the input which is accepted by the device as a logic high.
VIH(AC)
High-level AC input voltage.
VIH(DC)
High-level DC input voltage.
VIL
Voltage input low: The maximum positive voltage applied to the input which is accepted by the device as a logic low.
VIL (AC)
Low-level AC input voltage.
VIL (DC)
Low-level DC input voltage.
VIN
DC input voltage.
continued...
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Term
VOCM
Output common mode voltage: The common mode of the differential signal at the transmitter.
VOD
Output differential voltage swing: The difference in voltage between the positive and complementary conductors of a differential
transmission line at the transmitter. VOD = VOH – VOL.
VOH
Voltage output high: The maximum positive voltage from an output which the device considers is accepted as the minimum positive
high level.
VOL
Voltage output low: The maximum positive voltage from an output which the device considers is accepted as the maximum positive
low level.
VOS
Output offset voltage: VOS = (VOH + VOL) / 2.
VOX (AC)
AC differential Output cross point voltage: The voltage at which the differential output signals must cross.
VREF
Reference voltage for SSTL, HSTL, and HSUL I/O Standards.
VREF(AC)
AC input reference voltage for SSTL, HSTL, and HSUL I/O Standards. VREF(AC) = VREF(DC) + noise. The peak-to-peak AC noise on
VREF should not exceed 2% of VREF(DC).
VREF(DC)
DC input reference voltage for SSTL, HSTL, and HSUL I/O Standards.
VSWING (AC)
AC differential input voltage: AC Input differential voltage required for switching.
VSWING (DC)
DC differential input voltage: DC Input differential voltage required for switching.
VTT
Termination voltage for SSTL, HSTL, and HSUL I/O Standards.
VX (AC)
AC differential Input cross point voltage: The voltage at which the differential input signals must cross.
Intel® MAX® 10 FPGA Device Datasheet
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Document Revision History for the Intel MAX 10 FPGA Device Datasheet
Document
Version
2020.06.30
Changes
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2018.06.29
Date
December 2017
•
•
•
Added VCCIO specifications for 1.0 V in the following tables:
— Power Supplies Recommended Operating Conditions for Intel MAX 10 Single Supply Devices
— Power Supplies Recommended Operating Conditions for Intel MAX 10 Dual Supply Devices
Added 1.0 V LVCMOS specifications in the Single-Ended I/O Standards Specifications for Intel MAX 10 Devices table.
Added specifications for 10M02SCU324 device in the following tables:
— Uncompressed .rbf Sizes for Intel MAX 10 Devices
— Internal Configuration Time for Intel MAX 10 Devices (Uncompressed .rbf)
— Internal Configuration Time for Intel MAX 10 Devices (Compressed .rbf)
Removed links on instant-on feature.
Added JTAG timing specifications term in Glossary.
Renamed the following IP cores as per Intel rebranding:
— Renamed Altera Modular ADC IP core to Modular ADC core Intel FPGA IP core.
— Renamed Altera Modular Dual ADC IP core to Modular Dual ADC core Intel FPGA IP core.
Version
2017.12.15
Changes
•
•
June 2017
2017.06.16
•
Removed the units for "Input resistance" and "Input capacitance" parameters in the following tables:
— ADC Performance Specifications for Intel MAX 10 Single Supply Devices
— ADC Performance Specifications for Intel MAX 10 Dual Supply Devices
Removed the specification with memory initialization for 10M02 device in the Uncompressed .rbf Sizes for Intel MAX 10
Devices table.
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Added notes for TJ for Industrial and Automotive devices in Recommended Operating Conditions for Intel MAX 10 Devices
table.
Updated the parameter in Internal Weak Pull-Up Resistor for Intel MAX 10 Devices table.
Changed "Performance" to "Frequency" in UFM Performance Specifications for Intel MAX 10 Devices table.
Removed PowerPlay text from tool name.
February 2017
2017.02.21
•
Rebranded as Intel.
October 2016
2016.10.31
•
•
Updated the note to the Intel MAX 10 Device Grades and Speed Grades Supported table.
Updated the Memory Standards Supported by the Soft Memory Controller for Intel MAX 10 Devices table.
continued...
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Date
May 2016
Version
2016.05.02
Changes
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Updated tRAMP specifications in Recommended Operating Conditions for Intel MAX 10 Devices table.
— Removed standard POR and fast POR specifications.
— Updated maximum value from 3 ms to 10 ms and added a not for the minimum value.
Added Supply Current and Power Consumption section.
Added the following tables:
— Memory Standards Supported by the Soft Memory Controller for Intel MAX 10 Devices
— Internal Configuration Timing Parameter for Intel MAX 10 Devices
Removed POR Delay Specifications for Intel MAX 10 Devices table.
Updated the description in the Internal Configuration Time section.
Updated the following tables:
— Internal Configuration Time for Intel MAX 10 Devices (Uncompressed .rbf)
— Internal Configuration Time for Intel MAX 10 Devices (Compressed .rbf)
January 2016
2016.01.22
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Added description about automotive temperature devices in the Programming/Erasure Specifications table.
Changed the pin capacitance to maximum values.
Updated maximum TCCS specifications from 410 ps to 300 ps in the following tables:
— True PPDS and Emulated PPDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— Emulated RSDS_E_1R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True Mini-LVDS and Emulated Mini-LVDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True LVDS Transmitter Timing Specifications for Intel MAX 10 Single Supply Devices
— True LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— Emulated LVDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Single Supply Devices
— Emulated LVDS_E_3R, SLVS, and Sub-LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
Added new table: True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Single Supply
Devices.
Updated maximum fHSCLK and HSIODR specifications for –A6, –C7, and –I7 speed grades in True LVDS Transmitter Timing
Specifications for Intel MAX 10 Dual Supply Devices table.
Updated SW specifications in the following tables:
— LVDS Receiver Timing Specifications for Intel MAX 10 Single Supply Devices
— LVDS, TMDS, HiSpi, SLVS, and Sub-LVDS Receiver Timing Specifications for Intel MAX 10 Dual Supply Devices
Updated maximum fHSCLK and HSIODR (high-speed I/O performance pin) specifications for –I6, –A6, –C7, –I7 speed
grades in LVDS, TMDS, HiSpi, SLVS, and Sub-LVDS Receiver Timing Specifications for Intel MAX 10 Dual Supply Devices
table.
Removed Internal Configuration Time information in the Uncompressed .rbf Sizes for Intel MAX 10 Devices table.
Added Internal Configuration Time tables for uncompressed .rbf files and compressed .rbf files.
Removed Preliminary tags for all tables.
continued...
Intel® MAX® 10 FPGA Device Datasheet
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Date
November 2015
Version
2015.11.02
Changes
•
•
Added description to Maximum Allowed Overshoot During Transitions over a 11.4-Year Time Frame topic.
•
Updated the condition for "Bus-hold high, sustaining current" parameter from "VIN < VIL (minimum)" to "VIN < VIH
(minimum)" in Bus Hold Parameters table.
Added –A6 speed grade in the following tables:
— Intel MAX 10 Device Grades and Speed Grades Supported
— Series OCT without Calibration Specifications for Intel MAX 10 Devices
— Clock Tree Specifications for Intel MAX 10 Devices
— Embedded Multiplier Specifications for Intel MAX 10 Devices
— Memory Block Performance Specifications for Intel MAX 10 Devices
— True PPDS and Emulated PPDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— Emulated RSDS_E_1R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True Mini-LVDS and Emulated Mini-LVDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— Emulated LVDS_E_3R, SLVS, and Sub-LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— LVDS, TMDS, HiSpi, SLVS, and Sub-LVDS Receiver Timing Specifications for Intel MAX 10 Dual Supply Devices
— IOE Programmable Delay on Row Pins for Intel MAX 10 Devices
— IOE Programmable Delay on Column Pins for Intel MAX 10 Devices
Updated the maximum value for input clock cycle-to-cycle jitter (tINJITTER_CCJ) with FINPFD < 100 MHz condition from 750 ps
to ±750 ps in PLL Specifications for Intel MAX 10 Devices table.
Updated the dual supply mode performance in Embedded Multiplier Specifications for Intel MAX 10 Devices table.
Updated the dual supply mode performance in Memory Block Performance Specifications for Intel MAX 10 Devices table.
Added typical specifications in Internal Oscillator Frequencies for Intel MAX 10 Devices table.
Updated specifications in UFM Performance Specifications for Intel MAX 10 Devices table.
Updated sampling window specifications in LVDS, TMDS, HiSpi, SLVS, and Sub-LVDS Receiver Timing Specifications for
Intel MAX 10 Dual Supply Devices table.
Updated IOE programmable delay for row and column pins.
Changed instances of Quartus II to Quartus Prime.
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June 2015
2015.06.12
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Added ADC_VREF Pin Leakage Current for Intel MAX 10 Devices table.
Updated the maximum values in Internal Weak Pull-Up Resistor for Intel MAX 10 Devices table.
Removed Internal Weak Pull-Up Resistor equation.
Updated the note for input resistance and input capacitance parameters in the ADC Performance Specifications table for
both single supply and dual supply devices. Note: Download the SPICE models for simulation.
Added a note to AC Accuracy - THD, SNR, and SINAD parameters in the ADC Performance Specifications for Intel MAX 10
Dual Supply Devices table. Note: When using internal VREF, THD = 66 dB, SNR = 58 dB and SINAD = 57.5 dB for
dedicated ADC input channels.
Updated clock period jitter and cycle-to-cycle period jitter parameters in the Memory Output Clock Jitter Specifications for
Intel MAX 10 Devices table.
continued...
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Intel® MAX® 10 FPGA Device Datasheet
M10-DATASHEET | 2020.06.30
Date
May 2015
Version
2015.05.04
Changes
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Updated a note to VCCIO for both single supply and dual supply power supplies recommended operating conditions tables.
Note updated: VCCIO for all I/O banks must be powered up during user mode because VCCIO I/O banks are used for the
ADC and I/O functionalities.
Updated Example for OCT Resistance Calculation after Calibration at Device Power-Up.
Removed a note to BLVDS in Differential I/O Standards Specifications for Intel MAX 10 Devices table. BLVDS is now
supported in Intel MAX 10 single supply devices. Note removed: BLVDS TX is not supported in single supply devices.
Updated ADC Performance Specifications for both single supply and dual supply devices.
— Changed the symbol for Operating junction temperature range parameter from TA to TJ.
— Edited sampling rate maximum value from 1000 kSPS to 1 MSPS.
— Added a note to analog input voltage parameter.
— Removed input frequency, fIN specification.
— Updated the condition for DNL specification: External VREF, no missing code. Added DNL specification for condition:
Internal VREF, no missing code.
— Added notes to AC accuracy specifications that the value with prescalar enabled is 6dB less than the specification.
— Added a note to On-Chip Temperature Sensor (absolute accuracy) parameter about the averaging calculation.
Updated ADC Performance Specifications for Intel MAX 10 Single Supply Devices table.
— Added condition for On-Chip Temperature Sensor (absolute accuracy) parameter: with 64 samples averaging.
Updated ADC Performance Specifications for Intel MAX 10 Dual Supply Devices table.
— Updated Digital Supply Voltage minimum value from 1.14 V to 1.15 V and maximum value from 1.26 V to 1.25 V.
Updated fHSCLK and HSIODR specifications for –A7 speed grade in the following tables:
— True PPDS and Emulated PPDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True Mini-LVDS and Emulated Mini-LVDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True LVDS Transmitter Timing Specifications for Intel MAX 10 Single Supply Devices
— True LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— Emulated LVDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Single Supply Devices
— Emulated LVDS_E_3R, SLVS, and Sub-LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— LVDS Receiver Timing Specifications for Intel MAX 10 Single Supply Devices
— LVDS, TMDS, HiSpi, SLVS, and Sub-LVDS Receiver Timing Specifications for Intel MAX 10 Dual Supply Devices
continued...
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Date
Version
Changes
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•
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January 2015
2015.01.23
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•
December 2014
2014.12.15
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Updated TCCS specifications in the following tables:
— True PPDS and Emulated PPDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— Emulated RSDS_E_1R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True Mini-LVDS and Emulated Mini-LVDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True LVDS Transmitter Timing Specifications for Intel MAX 10 Single Supply Devices
— True LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— Emulated LVDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Single Supply Devices
— Emulated LVDS_E_3R, SLVS, and Sub-LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
Updated tx Jitter specifications in the following tables:
— True PPDS and Emulated PPDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— Emulated RSDS_E_1R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True Mini-LVDS and Emulated Mini-LVDS_E_3R Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— True LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
— Emulated LVDS_E_3R, SLVS, and Sub-LVDS Transmitter Timing Specifications for Intel MAX 10 Dual Supply Devices
Updated SW specifications in LVDS Receiver Timing Specifications for Intel MAX 10 Single Supply Devices table.
Added a note to tx Jitter for all LVDS tables. Note: TX jitter is the jitter induced from core noise and I/O switching noise.
Updated the description for tLOCK for all LVDS tables: Time required for the PLL to lock, after CONF_DONE signal goes high,
indicating the completion of device configuration.
Updated Memory Output Clock Jitter Specifications section.
— Updated maximum external memory interfaces frequency from 300 MHz to 303 MHz.
— Updated PLL output routing from global clock network to PHY clock network.
Added I/O Timing for Intel MAX 10 Devices table.
Added VHYS in the Glossary table.
Removed a note to VCCA in Power Supplies Recommended Operating Conditions for Intel MAX 10 Dual Supply Devices
table. This note is not valid: All VCCA pins must be connected together for EQFP package.
Corrected the maximum value for tOUTJITTER_CCJ_ IO (FOUT ≥ 100 MHz) from 60 ps to 650 ps in PLL Specifications for Intel
MAX 10 Devices table.
Restructured Programming/Erasure Specifications for Intel MAX 10 Devices table to add temperature specifications that
affect the data retention duration.
Added statements in the I/O Pin Leakage Current section: Input channel leakage of ADC I/O pins due to hot socket is up
to maximum of 1.8 mA. The input channel leakage occurs when the ADC IP core is enabled or disabled. This is applicable
to all Intel MAX 10 devices with ADC IP core, which are 10M04, 10M08, 10M16, 10M25, 10M40, and 10M50 devices. The
ADC I/O pins are in Bank 1A.
Added a statement in the I/O Standards Specifications section: You must perform timing closure analysis to determine the
maximum achievable frequency for general purpose I/O standards.
continued...
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Date
Version
Changes
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September 2014
2014.09.22
Intel® MAX® 10 FPGA Device Datasheet
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Updated SSTL-2 Class I and II I/O standard specifications for JEDEC compliance as follows:
— VIL(AC) Max: Updated from VREF – 0.35 to VREF – 0.31
— VIH(AC) Min: Updated from VREF + 0.35 to VREF + 0.31
Added a note to BLVDS in Differential I/O Standards Specifications for Intel MAX 10 Devices table: BLVDS TX is not
supported in single supply devices.
Added a link to MAX 10 High-Speed LVDS I/O User Guide for the list of I/O standards supported in single supply and dual
supply devices.
Added a statement in PLL Specifications for Intel MAX 10 Single Supply Device table: For V36 package, the PLL
specification is based on single supply devices.
Added Internal Oscillator Specifications from Intel MAX 10 Clocking and PLL User Guide.
Added UFM specifications for serial interface.
Updated total harmonic distortion (THD) specifications as follows:
— Single supply devices: Updated from 65 dB to –65 dB
— Dual supply devices: Updated from 70 dB to –70 dB (updated from 65 dB to –65 dB for dual function pin)
Added condition for On-Chip Temperature Sensor—Absolute accuracy parameter in ADC Performance Specifications for
Intel MAX 10 Dual Supply Devices table. The condition is: with 64 samples averaging.
Updated the description in Periphery Performance Specifications to mention that proper timing closure is required in
design.
Updated HSIODR and fHSCLK specifications for x10 and x7 modes in True LVDS Transmitter Timing Specifications for Intel
MAX 10 Dual Supply Devices.
Added specifications for low-speed I/O performance pin sampling window in LVDS Receiver Timing Specifications for Intel
MAX 10 Single Supply Devices table: Max = 900 ps for –C7, –I7, –A7, and –C8 speed grades.
Added tRU_nCONFIG and tRU_nRSTIMER specifications for different devices in Remote System Upgrade Circuitry Timing
Specifications for Intel MAX 10 Devices table.
Removed the word "internal oscillator" in User Watchdog Timer Specifications for Intel MAX 10 Devices table to avoid
confusion.
Added IOE programmable delay specifications.
Initial release.
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