eGaN® FET DATASHEET
EPC2818
EPC2818 – Enhancement Mode Power Transistor
NEW PRODUCT
VDSS , 150 V
RDS(ON) , 25 mW
ID , 12 A
High Lead Bump Finish: 95%Pb/5%Sn
EFFICIENT POWER CONVERSION
HAL
Gallium Nitride is grown on Silicon Wafers and processed using standard CMOS equipment leveraging the infrastructure that has been developed over the last 55 years. GaN’s exceptionally high electron mobility and low temperature coefficient allows very low RDS(ON), while its lateral device structure
and majority carrier diode provide exceptionally low QG and zero QRR. The end result is a device that
can handle tasks where very high switching frequency, and low on-time are beneficial as well as
those where on-state losses dominate.
Maximum Ratings
VDS
ID
VGS
TJ
TSTG
Drain-to-Source Voltage
150
Continuous (TA =25˚C, θJA = 17)
12
Pulsed (25˚C, Tpulse = 300 µs)
60
Gate-to-Source Voltage
6
Gate-to-Source Voltage
-5
Operating Temperature
-40 to 125
Storage Temperature
-40 to 150
PARAMETER
EPC2818 eGaN® FETs are supplied only in
passivated die form with solder bars
Applications
• High Speed DC-DC conversion
• Class D Audio
• Hard Switched and High Frequency Circuits
V
A
Benefits
• Ultra High Efficiency
• Ultra Low RDS(on)
• Ultra low QG
• Ultra small footprint
V
˚C
TEST CONDITIONS
MIN
150
TYP
MAX
UNIT
Static Characteristics (TJ= 25˚C unless otherwise stated)
BVDSS
Drain-to-Source Voltage
VGS = 0 V, ID = 200 µA
IDSS
Drain Source Leakage
VDS = 120 V, VGS = 0 V
50
150
Gate-Source Forward Leakage
VGS = 5 V
1
3
Gate-Source Reverse Leakage
VGS = -5 V
0.2
1
1.4
2.5
V
18
25
mΩ
IGSS
VGS(TH)
Gate Threshold Voltage
RDS(ON)
Drain-Source On Resistance
VDS = VGS, ID = 3 mA
0.7
VGS = 5 V, ID = 6 A
V
µA
mA
Source-Drain Characteristics (TJ= 25˚C unless otherwise stated)
VSD
Source-Drain Forward Voltage
IS = 0.5 A, VGS = 0 V, T = 25˚C
1.8
IS = 0.5 A, VGS = 0 V, T = 125˚C
1.8
V
All measurements were done with substrate shorted to source.
PARAMETER
Thermal
Characteristics
TEST CONDITIONS
MIN
Dynamic Characteristics (TJ= 25˚C unless otherwise stated)
CRISSθJC
RθJB
COSS
R
CRSSθJA
Thermal
InputResistance,
CapacitanceJunction to Case
Thermal
Junction to Board VDS = 100 V, VGS = 0 V
OutputResistance,
Capacitance
Thermal Resistance, Junction to Ambient (Note 1)
Reverse Transfer Capacitance
Note 1: RθJA is determined with the device mounted on one square inch of copper pad, single layer 2 oz copper on FR4 board.
Total Gate Charge (VGS = 5 V)
G
SeeQhttp://epc-co.com/epc/documents/product-training/Appnote_Thermal_Performance_of_eGaN_FETs.pdf
for details.
QGD
Gate to Drain Charge
VDS = 100 V, ID = 12 A
EPC – EFFICIENT
POWER CONVERSION
CORPORATION
| WWW.EPC-CO.COM | COPYRIGHT 2014 |
QGS
Gate to Source
Charge
QOSS
Output Charge
VDS = 100 V, VGS = 0 V
TYP
TYP
MAX
480 2.4
270 16
540
˚C/W
350
˚C/W pF
˚C/W
9.2
56
12
5
7.5
1.7
2.6
1.3
2
40
50
UNIT
| nC
PAGE 1
Source-Drain Characteristics (TJ= 25˚C unless otherwise stated)
Source-Drain Forward Voltage
eGaN®VSDFET DATASHEET
IS = 0.5 A, VGS = 0 V, T = 25˚C
1.8
IS = 0.5 A, VGS = 0 V, T = 125˚C
1.8
V
EPC2818
All measurements were done with substrate shorted to source.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
480
540
270
350
UNIT
Dynamic Characteristics (TJ= 25˚C unless otherwise stated)
CISS
Input Capacitance
COSS
Output Capacitance
CRSS
Reverse Transfer Capacitance
9.2
12
QG
Total Gate Charge (VGS = 5 V)
5
7.5
QGD
Gate to Drain Charge
1.7
2.6
QGS
Gate to Source Charge
1.3
2
QOSS
Output Charge
40
50
QRR
Source-Drain Recovery Charge
VDS = 100 V, VGS = 0 V
VDS = 100 V, ID = 12 A
VDS = 100 V, VGS = 0 V
pF
nC
0
All measurements were done with substrate shorted to source.
60
Figure 1: Typical Output Characteristics
VGS = 5
VGS = 4
VGS = 3
VGS = 2
30
20
40
30
20
10
10
0
0.5
1
1.5
2
VDS – Drain to Source Voltage (V)
2.5
0
3
Figure 3: RDS(ON) vs VG for Various Current
1
1.5
2
2.5
3
VGS – Gate to Source Voltage (V)
3.5
4
4.5
RDS(ON) – Drain to Source Resistance (mΩ)
60
50
40
30
20
ID = 10 A
ID = 20 A
ID = 40 A
ID = 60 A
10
0
0.5
Figure 4: RDS(ON) vs VG for Various Temperature
60
RDS(ON) – Drain to Source Resistance (mΩ)
25˚C
125˚C
VDS = 3 V
40
0
Figure 2: Transfer Characteristics
50
ID – Drain Current (A)
50
ID – Drain Current (A)
60
2
2.5
3
3.5
4
4.5
VGS – Gate to Source Voltage (V)
5
5.5
25˚C
125˚C
50
40
30
20
10
0
2
2.5
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3
3.5
4
4.5
5
5.5
VGS – Gate to Source Voltage (V)
| PAGE 2
eGaN® FET DATASHEET
EPC2818
Figure 5: Capacitance
1
COSS = CGD + CSD
CISS = CGD + CGS
CRSS = CGD
0.6
0.4
0.2
0
50
ISD – Source to Drain Current (A)
2
0
150
Figure 7: Reverse Drain-Source Characteristics
25˚C
125˚C
30
20
10
0
0.5
1
1.5
2
2.5
3
VSD – Source to Drain Voltage (V)
3.5
4
1
2
3
4
5
QG – Gate Charge (nC)
6
Figure 8: Normalized On Resistance vs Temperature
ID = 12 A
VGS = 5 V
2.5
2
1.5
1
0.5
0
-20
4.5
Figure 9: Normalized Threshold Voltage vs Temperature
1.15
0
3
40
1.2
.03
0
20
40
60
80
100
TJ – Junction Temperature ( ˚C )
120
140
Figure 10: Gate Current
25˚C
125˚C
ID = 3 mA
.025
1.1
IG – Gate Current (A)
Normalized Threshold Voltage (V)
100
VDS – Drain to Source Voltage (V)
50
0
3
1
Normalized On-State Resistance – RDS(ON)
60
ID = 12 A
VD = 100 V
4
VG – Gate Voltage (V)
C – Capacitance (nF)
0.8
0
Figure 6: Gate Charge
5
1.05
1
0.95
.02
.015
.01
0.9
.005
0.85
0.8
-20
0
20
40
60
80
100
120
140
0
0
1
TJ – Junction Temperature ( ˚C )
2
3
4
5
6
VGS – Gate-to-Source Voltage (V)
All measurements were done with substrate shortened to source.
EPC – EFFICIENT POWER CONVERSION CORPORATION | WWW.EPC-CO.COM | COPYRIGHT 2014 |
| PAGE 3
eGaN® FET DATASHEET
EPC2818
Figure 11: Transient Thermal Response Curves
Normalized Maximum Transient Thermal Impedance
ZθJB, Normalized Thermal Impedance
1
Duty Factors:
0.5
0.1 0.2
0.1
0.05
0.01 0.02
0.01
t1
Single Pulse
0.001
0.0001
PDM
10-5
10-4
t2
Notes:
Duty Factor: D = t1/t2
Peak TJ = PDM x ZθJB x RθJB + TB
10-3
10-2
10-1
1
10
100
tp, Rectangular Pulse Duration, seconds
Normalized Maximum Transient Thermal Impedance
ZθJC, Normalized Thermal Impedance
1
Duty Factors:
0.5
0.1 0.2
0.1
PDM
0.05
t1
0.01 0.02
0.01
Notes:
Duty Factor: D = t1/t2
Peak TJ = PDM x ZθJC x RθJC + TC
Single Pulse
0.001
t2
10-6
10-5
10-4
10-3
10-2
10-1
1
tp, Rectangular Pulse Duration, seconds
Figure 12: Safe Operating Area
I D- Drain Current (A)
100
10
10 µs
100 µs
limited by RDS(ON)
1
0.1
1 ms
10 ms
100 ms/DC
TJ = Max Rated, TC = +25°C, Single Pulse
0.1
1
10
100
1000
VDS - Drain-Source Voltage (V)
EPC – EFFICIENT POWER CONVERSION CORPORATION | WWW.EPC-CO.COM | COPYRIGHT 2014 |
| PAGE 4
eGaN® FET DATASHEET
EPC2818
TAPE AND REEL CONFIGURATION
4mm pitch, 12mm wide tape on 7” reel
b
e
d
g
f
Loaded Tape Feed Direction
Die
orientation
dot
7” reel
c
a
Gate
solder bar is
under this
corner
Die is placed into pocket
solder bar side down
(face side down)
EPC2818
Dimension (mm)
a
b
c (note 2)
d
e
f (note 2)
g
target
min
max
12.0
1.75
5.50
4.00
4.00
2.00
1.5
11.9
1.65
5.45
3.90
3.90
1.95
1.5
12.3
1.85
5.55
4.10
4.10
2.05
1.6
Note 1: Pocket position is relative to the sprocket hole measured as true position of the pocket,
not the pocket hole.
DIE MARKINGS
2818
YYYY
Die orientation dot
ZZZZ
Gate Pad solder bar
is under this corner
A
f
3
Lot_Date Code
Marking line 2
Lot_Date Code
Marking Line 3
2818
YYYY
ZZZZ
4
High Lead Bump Finish: 95%Pb/5%Sn
f
X5
5
6
DIM
7
c
B
d
X2
2
Part #
Marking Line 1
EPC2818
DIE OUTLINE
Solder Bar View
Laser Markings
Part
Number
1
e
g
g
X4
A
B
c
d
e
f
g
MIN
micrometers
Nominal
MAX
3524
1602
1379
577
262
245
600
3554
1632
1382
580
277
250
600
3584
1662
1385
583
292
255
600
(690)
85 +/-15
SEATING PLANE
800 Max
Side View
EPC – EFFICIENT POWER CONVERSION CORPORATION | WWW.EPC-CO.COM | COPYRIGHT 2014 |
| PAGE 5
eGaN® FET DATASHEET
EPC2818
The land pattern is solder mask defined.
RECOMMENDED
LAND PATTERN
(units in µm)
3
4
5
6
7
802
1
Pad no. 1 is Gate;
Pads no. 3, 5, 7 are Drain;
Pads no. 4, 6 are Source;
Pad no. 2 is Substrate
2
600
600
X4
1362
1632
560
3554
230
230
X5
Efficient Power Conversion Corporation (EPC) reserves the right to make changes without further notice to any products herein to
improve reliability, function or design. EPC does not assume any liability arising out of the application or use of any product or circuit
described herein; neither does it convey any license under its patent rights, nor the rights of others.
eGaN® is a registered trademark of Efficient Power Conversion Corporation.
U.S. Patents 8,350,294; 8,404,508; 8,431,960; 8,436,398
EPC – EFFICIENT POWER CONVERSION CORPORATION | WWW.EPC-CO.COM | COPYRIGHT 2014 |
Information subject to
change without notice.
Revised March, 2014
| PAGE 6