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HM62864

HM62864

  • 厂商:

    ETC

  • 封装:

  • 描述:

    HM62864 - 65536-word ´ 8-bit High Speed CMOS Static RAM - List of Unclassifed Manufacturers

  • 数据手册
  • 价格&库存
HM62864 数据手册
HM62864 Series 65536-word × 8-bit High Speed CMOS Static RAM ADE-203-255B (Z) Rev. 2.0 Jul. 4, 1995 Description The Hitachi HM62864 is a CMOS static RAM organized 64-kword × 8-bit. It realizes higher density, higher performance and low power consumption by employing 0.8 µm Hi-CMOS process technology. It offers low power standby power dissipation; therefore, it is suitable for battery backup systems. The device, packaged in a 525-mil SOP (460-mil body SOP) and a 8 × 20 mm TSOP with thickness of 1.2 mm, is available for high density mounting. TSOP package is suitable for cards. Features • • High speed — Fast access time: 55/70/85 ns (max) Low power — Active: 50 mW (typ) (f = 1 MHz) — Standby: 2 µW (typ) Single 5 V supply Completely static memory No clock or timing strobe required Equal access and cycle times Common data input and output Three state output Directly TTL compatible All inputs and outputs Capability of battery backup operation 2 chip selection for battery backup • • • • • • HM62864 Series Ordering Information Type No. HM62864LFP-7 HM62864LFP-8 HM62864LFP-5SL HM62864LFP-7SL HM62864LFP-8SL HM62864LT-7 HM62864LT-8 HM62864LT-5SL HM62864LT-7SL HM62864LT-8SL Access Time 70 ns 85 ns 55 ns 70 ns 85 ns 70 ns 85 ns 55 ns 70 ns 85 ns 8 mm × 20 mm 32-pin TSOP (normal type) (TFP-32D) Package 525-mil 32-pin plastic SOP (FP-32D) 2 HM62864 Series Pin Arrangement HM62864LFP Series 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 (Top view) 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 VCC A15 CS2 WE A13 A8 A9 A11 OE A10 CS1 I/O7 I/O6 I/O5 I/O4 I/O3 (Top view) HM62864LT Series NC NC A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 I/O0 I/O1 I/O2 VSS A11 A9 A8 A13 WE CS2 A15 VCC NC NC A14 A12 A7 A6 A5 A4 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 OE A10 CS1 I/O7 I/O6 I/O5 I/O4 I/O3 VSS I/O2 I/O1 I/O0 A0 A1 A2 A3 Pin Description Pin Name A0 to A15 I/O0 to I/O7 CS1 CS2 WE OE NC VCC VSS Function Address Input/output Chip select 1 Chip select 2 Write enable Output enable No connection Power supply Ground 3 HM62864 Series Block Diagram V CC V SS • • • • • (MSB) A14 A6 A12 A7 A8 A13 A15 A5 Row Decoder Memory Matrix 512 x 1,024 (LSB) A4 I/O0 Input Data Control I/O7 • • Column I/O Column Decoder • • A10 A11 A9 A0 A1 A2 A3 (MSB) • • (LSB) CS2 CS1 WE OE Timing Pulse Generator Read/Write Control 4 HM62864 Series Function Table CS1 H X L L L L CS2 X L H H H H OE X X H L H L WE X X H H L L Mode Not selected Not selected Output disable Read Write Write VCC Current I SB , I SB1 I SB , I SB1 I CC I CC I CC I CC I/O Pin High-Z High-Z High-Z Dout Din Din Ref. Cycle — — — Read cycle (1) to (3) Write cycle (1) Write cycle (2) Note: X: High or Low Absolute Maximum Ratings Parameter Power supply voltage *1 Terminal voltage *1 Symbol VCC VT PT Topr Tstg Tbias Value – 0.5 to +7.0 – 0.5 1.0 0 to +70 – 55 to +125 – 10 to +85 *2 *3 Unit V V W °C °C °C to V CC + 0.3 Power dissipation Operating temperature Storage temperature Storage temperature under bias Notes: 1. Relative to VSS 2. VT min: – 3.0 V for pulse half-width ≤ 50 ns 3. Maximum voltage is 7.0V Recommended DC Operating Conditions (Ta = 0 to +70 °C) Parameter Supply voltage Symbol VCC VSS Input high (logic 1) voltage Input low (logic 0) voltage Note: VIH VIL Min 4.5 0 2.2 – 0.3 *1 Typ 5.0 0 — — Max 5.5 0 VCC + 0.3 0.8 Unit V V V V 1. VIL min: – 3.0 V for pulse half-width ≤ 50 ns 5 HM62864 Series DC Characteristics (Ta = 0 to +70°C, VCC = 5 V ±10%, VSS = 0 V) Parameter Input leakage current Output leakage current Symbol |ILI| |ILO | Min — — — — — — — Typ*1 — — 10 55 55 45 10 Max 1 1 15 70 70 60 15 mA Cycle time = 1 µs, duty = 100%, I I/O = 0 mA, CS1 ≤ V IL, CS2 ≥ V IH, Others = VIH/VIL, VIH ≥ VCC – 0.2 V, 0 V ≤ VIL ≤ 0.2 V (1) or (2) (1) CS1 = VIH, CS2 = VIH (2) CS2 = VIL 0 V ≤ Vin ≤ VCC (1) or (2) (1) CS1 ≥ V CC – 0.2 V, CS2 ≥ VCC – 0.2V (2) 0 V ≤ CS2 ≤ 0.2 V V V I OL = 2.1 mA I OH = –1.0 mA Unit µA µA mA mA Test conditions VSS ≤ Vin ≤ VCC CS1 = VIH or CS2 = VIL or OE = VIH or WE = VIL, VSS ≤ VI/O ≤ VCC CS1 = VIL, CS2 = VIH, Others = VIH/VIL, I I/O = 0 mA Min cycle, duty = 100%, CS1 = VIL, CS2 = VIH, Others = VIH/VIL, I I/O = 0 mA Operating power supply current I CC Average operating HM62864-5 I CC1 power supply current HM62864-7 I CC1 HM62864-8 I CC1 I CC2 Standby power supply current I SB — 0.7 3 mA I SB1 I SB1 Output low voltage Output high voltage VOL VOH — — — 2.4 0.4 0.4 — — 100 50*2 0.4 — µA Notes: 1. Typical values are at VCC = 5.0 V, Ta = +25°C and not guaranteed. 2. This characteristics is guaranteed only for SL version. Capacitance (Ta = 25°C, f = 1.0 MHz)*1 Parameter Input capacitance Input/output capacitance Note: Symbol Cin CI/O Min — — Typ — — Max 5 8 Unit pF pF Test Conditions Vin = 0 V VI/O = 0 V 1. This parameter is sampled and not 100% tested. 6 HM62864 Series AC Characteristics (Ta = 0 to +70°C, VCC = 5 V ± 10%, unless otherwise noted.) Test Conditions • • • • Input pulse levels: 0.8 V to 2.4 V Input rise and fall time: 5 ns Input and output timing reference levels: 1.5 V Output load: HM62864-5: 1 TTL + 30 pF (Including scope & jig) HM62864-7/8: 1 TTL + 100 pF (Including scope & jig) Read Cycle HM62864-5 Parameter Read cycle time Address access time Chip select access time CS1 CS2 Output enable to output valid Chip selection to output in low-Z Output enable to output in low-Z Chip deselection in output in CS1 high-Z Output disable to output in high-Z Output hold from address change CS2 CS1 CS2 Symbol Min t RC t AA t CO1 t CO2 t OE t LZ1 t LZ2 t OLZ t HZ1 t HZ2 t OHZ t OH 55 — — — — 5 5 5 0 0 0 5 Max — 55 55 55 30 — — — 20 20 20 — HM62864-7 Min 70 — — — — 10 10 5 0 0 0 10 Max — 70 70 70 40 — — — 25 25 25 — HM62864-8 Min 85 — — — — 10 10 5 0 0 0 10 Max — 85 85 85 45 — — — 30 30 30 — Unit ns ns ns ns ns ns ns ns ns ns ns ns 2 2 2 1, 2 1, 2 1, 2 Notes Notes: 1. t HZ and t OHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referred to output voltage levels. 2. This parameter is sampled and not 100% tested. 7 HM62864 Series Read Timing Waveform (1) (WE = VIH) t RC Address Valid address t AA CS1 t CO1 t LZ1 CS2 t HZ1 t CO2 t LZ2 t HZ2 OE t OE t OLZ Dout High Impedance t OHZ t OH Valid data 8 HM62864 Series Read Timing Waveform (2) (WE = VIH) Address Valid address t AA t OH t OH Valid data Dout Read Timing Waveform (3) (WE = VIH) t CO1 t HZ1 t LZ1 CS2 t CO2 t LZ2 Dout Valid data t HZ2 CS1 9 HM62864 Series Write Cycle HM62864-5 Parameter Write cycle time Chip selection to end of write Address setup time Address valid to end of write Write pulse width Write recovery time Write to output in high-Z Data to write time overlap Data hold from write time Output active from end of write Output disable to output in high-Z Symbol Min t WC t CW t AS t AW t WP t WR t WHZ t DW t DH t OW t OHZ 55 50 0 50 40 0 0 30 0 5 0 Max — — — — — — 20 — — — 20 HM62864-7 Min 70 60 0 60 50 0 0 30 0 5 0 Max — — — — — — 25 — — — 25 HM62864-8 Min 85 75 0 75 55 0 0 35 0 5 0 Max — — — — — — 30 — — — 30 Unit ns ns ns ns ns ns ns ns ns ns ns 2 1, 2, 7 3, 8 6 1, 2, 7 4 5 Notes Notes: 1. t WHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referred to output voltage levels. 2. This parameter is sampled and not 100% tested. 3. A write occurs during the overlap of a low CS1 , a high CS2 and a low WE. A write begins at the latest transition among CS1 going low, CS2 going high, and WE going low. A write ends at the earliest transition among CS1 going high, CS2 going low, and WE going high. tWP is measured from the beginning of write to the end of write. 4. t CW is measured from the later of CS1 going low or CS2 going high to the end of write. 5. t AS is measured from the address valid to the beginning of write. 6. t WR is measured from the earliest of CS1 or WE going high or CS2 going low to the end of write cycle. 7. During this period, I/O pin are in the output state; therefore, the input signals of the opposite phase to the outputs must not be applied. 8. In the write cycle with OE low fixed, tWP must satisfy the following equation to avoid a problem of data bus contention, tWP ≥ tWHZ max + tDW min. 10 HM62864 Series Write Timing Waveform (1) (OE Clock) t WC Address Valid address t AW OE t CW CS1 *1 t WR CS2 t AS WE t OHZ High Impedance Dout t DW Din High Impedance t DH t WP Valid data Notes:1.If CS1 goes low or CS2 goes high simultaneously with WE going low or after WE going low, the outputs remain in the high impedance state. 11 HM62864 Series Write Timing Waveform (2) (OE Low Fixed) t WC Address Valid address t CW t WR CS1 *1 CS2 t AW t WP WE t AS t WHZ t OW *2 *3 t OH Dout t DW Din High Impedance Valid data t DH *4 Notes: 1. If CS1 goes low or CS2 goes high simultaneously with WE going low or after WE going low, the outputs remain in the high impedance state. 2. Dout is the same phase of the latest written data in this write cycle. 3. Dout is the read data of next address. 4. If CS1 is low and CS2 is high during this period, I/O pins are in the output state. Therefore, the input signals of opposite phase to the outputs must not be applied to them. 12 HM62864 Series Low VCC Data Retention Characteristics (Ta = 0 to +70 °C) This characteristics is guaranteed only for L-version. Parameter VCC for data retention Symbol VDR Min 2.0 Typ*1 — Max 5.5 Unit V Test conditions*5 0 V ≤ Vin ≤ VCC, (1) or (2) (1) CS1 ≥ V CC – 0.2 V, CS2 ≥ V CC – 0.2 V (2) 0 V ≤ CS2 ≤ 0.2 V VCC = 3.0 V, 0 V ≤ Vin ≤ VCC, (1) or (2) (1) CS1 ≥ V CC – 0.2 V, CS2 ≥ V CC – 0.2V (2) 0 V ≤ CS2 ≤ 0.2 V Data retention current I CCDR — 0.1 30*2 µA I CCDR Chip deselect to data retention time Operation recovery time Notes: 1. 2. 3. 4. 5. t CDR tR — 0 t RC*4 0.1 — — 10*3 — — µA ns ns See retention waveform Typical values are at VCC = 3.0 V, Ta = 25°C and not guaranteed. 10 µA max at Ta = 0 to 40°C. This characteristics guaranteed for only L-SL version. 3 µA max at Ta = 0 to 40°C. t RC = Read cycle time. CS2 controls address buffer, WE buffer, CS1 buffer, OE buffer, and Din buffer. If CS2 controls data retention mode, Vin levels (address, WE, OE, CS1, I/O) can be in the high impedance state. If CS1 controls data retention mode, CS2 must be CS2 ≥ VCC – 0.2 V or 0 V ≤ CS2 ≤ 0.2 V. The other input levels (address, WE, OE, I/O) can be in the high impedance state. Low V CC Data Retention Timing Waveform (1) (CS1 Controlled) Data retention mode tR t CDR V CC 4.5 V 2.2 V V DR1 CS1 0V CS1 ≥ VCC – 0.2 V 13 HM62864 Series Low V CC Data Retention Timing Waveform (2) (CS2 Controlled) t CDR V CC 4.5 V CS2 V DR2 0.4 V 0V 0V < CS2 < 0.2 V Data retention mode tR Package Dimensions HM62864LFP Series (FP-32D) Unit: mm 20.45 20.95 Max 32 17 1 1.00 Max 16 3.00 Max 14.14 ± 0.30 + 0.13 – 0.07 11.30 1.42 0.22 1.27 0.10 0.40 + 0.05 – 0.10 0.15 M + 0.12 – 0.10 0–8° 0.80 ± 0.20 0.15 14 HM62864 Series HM62864LT Series (TFP-32D) 8.00 8.20 Max 32 17 Unit: mm 1 0.20 ± 0.10 16 0.50 0.08 M 0.45 Max 20.00 ± 0.20 0 – 5° 0.17 ± 0.05 0.13 ± 0.05 0.50 ± 0.10 0.80 1.20 Max 0.10 18.40 15
HM62864 价格&库存

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