US5781
CMOS High Sensitivity Switch Preliminary Datasheet
• • • •
Features and Benefits
Chopper stabilized amplifier stage New miniature package / thin, high reliability package Operation down to 3.5V CMOS for optimum stability, quality, and cost
Applications
• • • • Solid state switch Limit switch Current limit Interrupter
Ordering Information
Part No. US5781 US5781 Temperature Suffix E L
ry a in im l re P
Package SO or UA SO or UA
Temperature Range -40°C to 85°C Extended -40°C to 150°C Automotive
Functional Diagram
Description
The US5781 is a unipolar Hall effect sensor IC fabricated from mixed signal CMOS technology. It incorporates advanced chopper stabilization techniques to provide accurate and stable magnetic switch points. There are many applications for this sensor in addition to those listed above. The design, specifications and performance have been optimized for applications of solid state switches. The output transistor will b switched on (BOP) in e the presence of a sufficiently strong South pole magnetic field facing the marked side of the package. Similarly, the output will be switched off (BRP) in the presence of a weaker South field and remain off with “0” field. The SOT-23 device is reversed from the UA package. The SOT-23 output transistor will be switched on (BOP) in the presence of a sufficiently strong North pole magnetic field subjected to the marked face.
V DD
Output
Voltage Regulator
Chopper
GND UA Package Pin 1 - V D D Pin 2 - GND Pin 3 - Output SO Package Pin 1 - VD D Pin 2 - Output Pin 3 - GND
Note: This is a static-sensitive device; please observe ESD precau tions. Reverse VDD protection is not included. For reverse voltage protection, a 100 Ωresistor in series with VDD is recommended.
US5781 CMOS High Sensitivity Switch
3901005781 Rev 1.7
7/23/01
Page 1
US5781
CMOS High Sensitivity Switch Preliminary Datasheet
US5781 Electrical Specifications
DC operating parameters: TA = -40 to 150oC, VDD = 12V DC (unless otherwise specified).
Parameter
Supply Voltage Supply Current Saturation Voltage Output Leakage Output Rise Time Output Fall Time
Symbol Test Conditions
VDD IDD VDS(on) IOFF tr tf Operating BBOP B
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