AUIRLL024ZTR

AUIRLL024ZTR

  • 厂商:

    EUPEC(英飞凌)

  • 封装:

    SOT-223

  • 描述:

  • 数据手册
  • 价格&库存
AUIRLL024ZTR 数据手册
AUTOMOTIVE GRADE   AUIRLL024Z HEXFET® Power MOSFET Features  Advanced Process Technology  Ultra Low On-Resistance  Logic Level Gate Drive  150°C Operating Temperature  Fast Switching  Repetitive Avalanche Allowed up to Tjmax  Lead-Free, RoHS Compliant  Automotive Qualified * Package Type AUIRLL024Z SOT-223 55V RDS(on) typ. max. ID 48m 60m 5.0A D Description Specifically designed for Automotive applications, this HEXFET® Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications. Base part number VDSS   S D G SOT-223 AUIRLL024Z G Gate Standard Pack Form Quantity Tape and Reel 2500 D Drain S Source Orderable Part Number AUIRLL024ZTR Absolute Maximum Ratings Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only; and functional operation of the device at these or any other condition beyond those indicated in the specifications is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions. Ambient temperature (TA) is 25°C, unless otherwise specified. Symbol Parameter Max. ID @ TA = 25°C Continuous Drain Current, VGS @ 10V  5.0 ID @ TA = 70°C IDM PD @TA = 25°C Continuous Drain Current, VGS @ 10V  Pulsed Drain Current  Maximum Power Dissipation (PCB Mount)  4.0 40 2.8 PD @TA = 25°C Maximum Power Dissipation (PCB Mount)  Linear Derating Factor (PCB Mount)  Gate-to-Source Voltage Single Pulse Avalanche Energy (Thermally Limited)  Single Pulse Avalanche Energy (Tested Value)  Avalanche Current  Repetitive Avalanche Energy  Operating Junction and Storage Temperature Range VGS EAS EAS (Tested) IAR EAR TJ TSTG Thermal Resistance   Symbol RJA RJA Parameter Junction-to-Ambient (PCB Mount, steady state)  Junction-to-Ambient (PCB Mount, steady state)  Units A  1.0 0.02 ± 16 21 38 See Fig. 12a, 12b, 15, 16 -55 to + 150 Typ. ––– ––– W W/°C V mJ A mJ °C  Max. Units 45 120 °C/W HEXFET® is a registered trademark of Infineon. *Qualification standards can be found at www.infineon.com 1 2015-10-29 AUIRLL024Z   Static @ TJ = 25°C (unless otherwise specified) V(BR)DSS V(BR)DSS/TJ Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient RDS(on) Static Drain-to-Source On-Resistance VGS(th) gfs Gate Threshold Voltage Forward Trans conductance IDSS Drain-to-Source Leakage Current IGSS Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Min. Typ. Max. Units Conditions 55 ––– ––– V VGS = 0V, ID = 250µA ––– 0.049 ––– V/°C Reference to 25°C, ID = 1mA ––– 48 60 VGS = 10V, ID = 3.0A  ––– ––– 80 mVGS = 5.0V, ID = 3.0A  ––– ––– 100 VGS = 4.5V, ID = 3.0A  1.0 ––– 3.0 V VDS = VGS, ID = 250µA 7.5 ––– ––– S VDS = 25V, ID = 3.0A ––– ––– 20 VDS = 55V, VGS = 0V µA ––– ––– 250 VDS = 55V,VGS = 0V,TJ = 125°C ––– ––– 200 VGS = 16V nA ––– ––– -200 VGS = -16V Dynamic Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Qg Qgs Qgd td(on) tr td(off) tf Ciss Coss Crss Coss Total Gate Charge Gate-to-Source Charge Gate-to-Drain Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 7.0 1.5 4.0 8.6 33 20 15 380 66 36 220 11 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ID = 3.0A nC   VDS = 44V VGS = 5.0V  VDD = 28V ID = 3.0A ns RG = 56 VGS = 5.0V  VGS = 0V VDS = 25V ƒ = 1.0MHz pF   V = 0V, V = 1.0V,ƒ = 1.0MHz GS DS Coss Output Capacitance ––– 53 ––– VGS = 0V, VDS = 44V,ƒ = 1.0MHz Coss eff. Effective Output Capacitance ––– 93 ––– VGS = 0V, VDS = 0V to 44V  Diode Characteristics   Parameter Continuous Source Current IS (Body Diode) Pulsed Source Current ISM (Body Diode) VSD Diode Forward Voltage trr Reverse Recovery Time Reverse Recovery Charge Qrr ton Forward Turn-On Time Min. Typ. Max. Units Conditions MOSFET symbol showing the A integral reverse p-n junction diode. V TJ = 25°C,IS = 3.0A,VGS = 0V  ns TJ = 25°C ,IF = 3.0A, VDD = 28V nC di/dt = 100A/µs  ––– ––– 5.0 ––– ––– 40 ––– ––– ––– ––– 15 9.1 1.3 23 14 Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes:  Repetitive rating; pulse width limited by max. junction temperature. (See fig. 11)  Limited by TJmax, Starting TJ = 25°C, L = 4.8mH, RG = 25, IAS = 3.A. VGS = 10V.Part not recommended for use above this value.  Pulse width 1.0ms; duty cycle  2%.  Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS.  Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive avalanche performance.  This value determined from sample failure population, starting TJ = 25°C, L = 4.8mH, RG = 25, IAS = 3.0A, VGS =10V. When mounted on 1 inch square copper board.  When mounted on FR-4 board using minimum recommended footprint. 2 2015-10-29 AUIRLL024Z   100 100 10 BOTTOM TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP VGS 10V 9.0V 7.0V 5.0V 4.5V 4.0V 3.5V 3.0V 3.0V 1 10 BOTTOM 3.0V 1 60µs PULSE WIDTH 60µs PULSE WIDTH Tj = 150°C Tj = 25°C 0.1 0.1 1 0.1 10 0.1 100 10 100 Fig. 2 Typical Output Characteristics Fig. 1 Typical Output Characteristics 100 10 Gfs, Forward Transconductance (S) ID , Drain-to-Source Current ) 1 V DS, Drain-to-Source Voltage (V) V DS, Drain-to-Source Voltage (V) T J = 150°C 10 T J = 25°C 1 VDS = 10V 60µs PULSE WIDTH 0.1 0 2 4 6 8 10 T J = 25°C 8 T J = 150°C 6 4 2 V DS = 10V 300µs PULSE WIDTH 0 0 VGS, Gate-to-Source Voltage (V) Fig. 3 Typical Transfer Characteristics 3 VGS 10V 9.0V 7.0V 5.0V 4.5V 4.0V 3.5V 3.0V 2 4 6 8 10 12 ID ,Drain-to-Source Current (A) Fig. 4 Typical Forward Trans conductance vs. Drain Current 2015-10-29 AUIRLL024Z   10000 6.0 VGS = 0V, f = 1 MHZ Ciss = C gs + Cgd, C ds SHORTED Crss = C gd ID = 3.0A 1000 Ciss Coss 100 5.0 VGS, Gate-to-Source Voltage (V) C, Capacitance(pF) Coss = Cds + Cgd Crss VDS = 44V VDS = 28V VDS = 11V 4.0 3.0 2.0 1.0 10 0.0 1 10 100 0 VDS , Drain-to-Source Voltage (V) 3 4 5 6 7 8 Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage 1000 100 OPERATION IN THIS AREA LIMITED BY R DS (on) ID, Drain-to-Source Current (A) 100 ISD, Reverse Drain Current (A) 2 QG Total Gate Charge (nC) Fig 5. Typical Capacitance vs. Drain-to-Source Voltage T J = 150°C 10 T J = 25°C 1 10 100µsec 1 0.1 0.01 DC 1msec 10msec T A = 25°C Tj = 150°C Single Pulse 0.001 VGS = 0V 0.0001 0 0.0 0.5 1.0 1.5 2.0 2.5 VSD , Source-to-Drain Voltage (V) Fig. 7 Typical Source-to-Drain Diode Forward Voltage   4 1 3.0 0.1 1.0 10 100 1000.0 VDS, Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area 2015-10-29 AUIRLL024Z   2.0 RDS(on) , Drain-to-Source On Resistance (Normalized) 5 ID, Drain Current (A) 4 3 2 1 0 ID = 3.0A VGS = 10V 1.5 1.0 0.5 25 50 75 100 125 -60 -40 -20 150 0 20 40 60 80 100 120 140 160 T J , Junction Temperature (°C) TA , Ambient Temperature (°C) Fig 9. Maximum Drain Current Vs. Ambient Temperature Fig 10. Normalized On-Resistance vs. Temperature 100 D = 0.50 0.20 0.10 0.05 0.02 0.01 Thermal Response ( Z thJA ) 10 1 J 0.1 0.01 R1 R1 J 1 R2 R2 R3 R3 C 2 1 3 2 C 3 Ci= iRi Ci= iRi SINGLE PULSE ( THERMAL RESPONSE ) 0.001 Ri (°C/W) i (sec) 5.3396 0.000805 19.881 0.706300 19.771 20.80000 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthja + Tc 0.0001 1E-006 1E-005 0.0001 0.001 0.01 0.1 1 10 100 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient 5 2015-10-29 AUIRLL024Z   15V + V - DD IAS 20V tp A 0.01 Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS tp EAS , Single Pulse Avalanche Energy (mJ) D.U.T RG 100 DRIVER L VDS ID 3.0A 0.80A BOTTOM 0.69A TOP 80 60 40 20 0 25 50 75 100 125 150 Starting T J , Junction Temperature (°C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current I AS Fig 12b. Unclamped Inductive Waveforms Id Vds Vgs Vgs(th) Qgs1 Qgs2 Qgd Qgodr Fig 13a. Basic Gate Charge Waveform VGS(th) Gate threshold Voltage (V) 2.5 2.0 ID = 250µA 1.5 1.0 -75 -50 -25 0 25 50 75 100 125 150 T J , Temperature ( °C ) Fig 14. Threshold Voltage vs. Temperature Fig 13b. Gate Charge Test Circuit 6 2015-10-29 AUIRLL024Z   Avalanche Current (A) 100 10 Duty Cycle = Single Pulse Allowed avalanche Current vs avalanche pulsewidth, tav assuming  Tj = 25°C due to avalanche losses 0.01 1 0.05 0.10 0.1 0.01 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01 1.0E+00 1.0E+01 tav (sec) Fig 15. Typical Avalanche Current vs. Pulse width EAR , Avalanche Energy (mJ) 25 TOP Single Pulse BOTTOM 1% Duty Cycle ID = 3.0A 20 Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.infineon.com) 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long as Tjmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figures 12a, 12b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 14, 15). tav = Average time in avalanche. D = Duty cycle in avalanche = tav ·f ZthJC(D, tav) = Transient thermal resistance, see Figures 13) 15 10 5 0 25 50 75 100 125 Starting T J , Junction Temperature (°C) 150 PD (ave) = 1/2 ( 1.3·BV·Iav) = T/ ZthJC Iav = 2T/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav Fig 16. Maximum Avalanche Energy vs. Temperature 7 2015-10-29 AUIRLL024Z   Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs Fig 18a. Switching Time Test Circuit Fig 18b. Switching Time Waveforms 8 2015-10-29 AUIRLL024Z   SOT-223 (TO-261AA) Package Outline (Dimensions are shown in millimeters (inches) SOT-223(TO-261AA) Part Marking Information LL024Z Date Code Y= Year WW= Work Week A= Automotive, Lead Free Note: For the most current drawing please refer to IR website at http://www.irf.com/package/   9 2015-10-29 AUIRLL024Z   SOT-223(TO-261AA) Tape and Reel (Dimensions are shown in millimeters (inches) 2.05 (.080) 1.95 (.077) TR 4.10 (.161) 3.90 (.154) 0.35 (.013) 0.25 (.010) 1.85 (.072) 1.65 (.065) 7.55 (.297) 7.45 (.294) 16.30 (.641) 15.70 (.619) 7.60 (.299) 7.40 (.292) 1.60 (.062) 1.50 (.059) TYP. FEED DIRECTION 12.10 (.475) 11.90 (.469) 2.30 (.090) 2.10 (.083) 7.10 (.279) 6.90 (.272) NOTES : 1. CONTROLLING DIMENSION: MILLIMETER. 2. OUTLINE CONFORMS TO EIA-481 & EIA-541. 3. EACH O330.00 (13.00) REEL CONTAINS 2,500 DEVICES. 13.20 (.519) 12.80 (.504) 15.40 (.607) 11.90 (.469) 4 330.00 (13.000) MAX. NOTES : 1. OUTLINE COMFORMS TO EIA-418-1. 2. CONTROLLING DIMENSION: MILLIMETER.. 3. DIMENSION MEASURED @ HUB. 4. INCLUDES FLANGE DISTORTION @ OUTER EDGE. 50.00 (1.969) MIN. 18.40 (.724) MAX. 14.40 (.566) 12.40 (.488) 4 3 Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 10 2015-10-29 AUIRLL024Z   Qualification Information Qualification Level Moisture Sensitivity Level Machine Model Human Body Model   ESD Charged Device Model RoHS Compliant Automotive (per AEC-Q101) Comments: This part number(s) passed Automotive qualification. Infineon’s Industrial and Consumer qualification level is granted by extension of the higher Automotive level. SOT-223 MSL1 Class M1B (+/- 100V)† AEC-Q101-002 Class H0 (+/- 250V)† AEC-Q101-001 Class C5 (+/- 1125V)† AEC-Q101-005 Yes † Highest passing voltage. Revision History Date 3/26/2014 10/29/2015 Comments      Added "Logic Level Gate Drive" bullet in the features section on page 1 Updated part marking on page 9 Updated data sheet with new IR corporate template Updated datasheet with corporate template Corrected ordering table on page 1. Published by Infineon Technologies AG 81726 München, Germany © Infineon Technologies AG 2015 All Rights Reserved. IMPORTANT NOTICE The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”). With respect to any examples, hints or any typical values stated herein and/or any information regarding the application of the product, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. In addition, any information given in this document is subject to customer’s compliance with its obligations stated in this document and any applicable legal requirements, norms and standards concerning customer’s products and any use of the product of Infineon Technologies in customer’s applications. The data contained in this document is exclusively intended for technically trained staff. It is the responsibility of customer’s technical departments to evaluate the suitability of the product for the intended application and the completeness of the product information given in this document with respect to such application. For further information on the product, technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies office (www.infineon.com). WARNINGS Due to technical requirements products may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies office. Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury.   11 2015-10-29
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