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BSZ0501NSI

BSZ0501NSI

  • 厂商:

    EUPEC(英飞凌)

  • 封装:

    TSDSON-8(3.3x3.3)

  • 描述:

    类型:-;漏源电压(Vdss):-;连续漏极电流(Id):-;功率(Pd):-;导通电阻(RDS(on)@Vgs,Id):-;阈值电压(Vgs(th)@Id):-;栅极电荷(Qg@Vgs):-;输入电...

  • 数据手册
  • 价格&库存
BSZ0501NSI 数据手册
MOSFET MetalOxideSemiconductorFieldEffectTransistor OptiMOSTM OptiMOSTM5Power-MOSFET,30V BSZ0501NSI DataSheet Rev.2.0 Final PowerManagement&Multimarket OptiMOSTM5Power-MOSFET,30V BSZ0501NSI 1Description TSDSON-8FL (enlarged source interconnection) Features •Optimizedforhighperformancebuckconverters •MonolithicintegratedSchottky-likediode •Verylowon-resistanceRDS(on)@VGS=4.5V •100%avalanchetested •N-channel •QualifiedaccordingtoJEDEC1)fortargetapplications •Pb-freeleadplating;RoHScompliant •Halogen-freeaccordingtoIEC61249-2-21 Table1KeyPerformanceParameters Parameter Value Unit VDS 30 V RDS(on),max 2.0 mΩ ID 40 A QOSS 18 nC QG(0V..4.5V) 11.4 nC S1 8D S2 7D S3 6D G4 5D Type/OrderingCode Package Marking RelatedLinks BSZ0501NSI PG-TSDSON-8 FL 0501NSI - 1) J-STD20 and JESD22 Final Data Sheet 2 Rev.2.0,2015-04-27 OptiMOSTM5Power-MOSFET,30V BSZ0501NSI TableofContents Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Thermal characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Electrical characteristics diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Package Outlines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Disclaimer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Final Data Sheet 3 Rev.2.0,2015-04-27 OptiMOSTM5Power-MOSFET,30V BSZ0501NSI 2Maximumratings atTj=25°C,unlessotherwisespecified Table2Maximumratings Parameter Symbol Values Unit Note/TestCondition 40 40 40 40 25 A VGS=10V,TC=25°C VGS=10V,TC=100°C VGS=4.5V,TC=25°C VGS=4.5V,TC=100°C VGS=10V,TA=25°C,RthJA=60K/W1) - 160 A TC=25°C - - 20 A TC=25°C EAS - - 40 mJ ID=20A,RGS=25Ω Gate source voltage VGS -20 - 20 V - Power dissipation Ptot - 50 2.1 - W TC=25°C TA=25°C,RthJA=60K/W1) Operating and storage temperature Tj,Tstg -55 - 150 °C IEC climatic category; DIN IEC 68-1: 55/150/56 Unit Note/TestCondition Min. Typ. Max. ID - - ID,pulse - Avalanche current, single pulse IAS Avalanche energy, single pulse Continuous drain current Pulsed drain current2) 3) 3Thermalcharacteristics Table3Thermalcharacteristics Parameter Symbol Thermal resistance, junction - case Device on PCB, 6 cm2 cooling area1) Values Min. Typ. Max. RthJC - - 2.5 K/W - RthJA - - 60 K/W - 1) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain connection. PCB is vertical in still air. 2) See figure 3 for more detailed information 3) See figure 13 for more detailed information Final Data Sheet 4 Rev.2.0,2015-04-27 OptiMOSTM5Power-MOSFET,30V BSZ0501NSI 4Electricalcharacteristics Table4Staticcharacteristics Parameter Symbol Drain-source breakdown voltage V(BR)DSS Breakdown voltage temperature coefficient Values Unit Note/TestCondition - V VGS=0V,ID=10mA 15 - mV/K ID=10mA,referencedto25°C 1.2 - 2 V VDS=VGS,ID=250µA IDSS - 2 0.5 - mA VDS=20V,VGS=0V,Tj=25°C VDS=24V,VGS=0V,Tj=125°C Gate-source leakage current IGSS - 10 100 nA VGS=20V,VDS=0V Drain-source on-state resistance RDS(on) - 2.1 1.7 2.5 2.0 mΩ VGS=4.5V,ID=20A VGS=10V,ID=20A Gate resistance RG - 1.4 2.3 Ω - Transconductance gfs 55 110 - S |VDS|>2|ID|RDS(on)max,ID=20A Unit Note/TestCondition Min. Typ. Max. 30 - dV(BR)DSS/dTj - Gate threshold voltage VGS(th) Zero gate voltage drain current Table5Dynamiccharacteristics Parameter Symbol Values Min. Typ. Max. Ciss - 1500 2000 pF VGS=0V,VDS=15V,f=1MHz Output capacitance Coss - 540 730 pF VGS=0V,VDS=15V,f=1MHz Reverse transfer capacitance Crss - 36 - pF VGS=0V,VDS=15V,f=1MHz Turn-on delay time td(on) - 4 - ns VDD=15V,VGS=10V,ID=30A, RG,ext=1.6Ω Rise time tr - 4 - ns VDD=15V,VGS=10V,ID=30A, RG,ext=1.6Ω Turn-off delay time td(off) - 22 - ns VDD=15V,VGS=10V,ID=30A, RG,ext=1.6Ω Fall time tf - 3 - ns VDD=15V,VGS=10V,ID=30A, RG,ext=1.6Ω Input capacitance1) 1) 1) Defined by design. Not subject to production test Final Data Sheet 5 Rev.2.0,2015-04-27 OptiMOSTM5Power-MOSFET,30V BSZ0501NSI Table6Gatechargecharacteristics1) Parameter Symbol Gate to source charge Values Unit Note/TestCondition - nC VDD=15V,ID=30A,VGS=0to4.5V 2.5 - nC VDD=15V,ID=30A,VGS=0to4.5V - 2.9 - nC VDD=15V,ID=30A,VGS=0to4.5V Qsw - 4.3 - nC VDD=15V,ID=30A,VGS=0to4.5V Gate charge total Qg - 11.4 15 nC VDD=15V,ID=30A,VGS=0to4.5V Gate plateau voltage Vplateau - 2.5 - V VDD=15V,ID=30A,VGS=0to4.5V Gate charge total Qg - 24 33 nC VDD=15V,ID=30A,VGS=0to10V Gate charge total, sync. FET Qg(sync) - 10.5 - nC VDS=0.1V,VGS=0to4.5V Output charge Qoss - 18 - nC VDD=15V,VGS=0V Unit Note/TestCondition Min. Typ. Max. Qgs - 3.9 Gate charge at threshold Qg(th) - Gate to drain charge Qgd Switching charge Table7Reversediode Parameter Symbol Diode continuous forward current Values Min. Typ. Max. IS - - 40 A TC=25°C Diode pulse current IS,pulse - - 160 A TC=25°C Diode forward voltage VSD - 0.55 0.7 V VGS=0V,IF=7A,Tj=25°C Reverse recovery charge Qrr - 5 - nC VR=15V,IF=7A,diF/dt=400A/µs 1) See ″Gate charge waveforms″ for parameter definition Final Data Sheet 6 Rev.2.0,2015-04-27 OptiMOSTM5Power-MOSFET,30V BSZ0501NSI 5Electricalcharacteristicsdiagrams Diagram1:Powerdissipation Diagram2:Draincurrent 60 50 50 40 40 ID[A] Ptot[W] 30 30 20 20 10 10 0 0 40 80 120 0 160 0 40 80 TC[°C] 120 160 TC[°C] Ptot=f(TC) ID=f(TC);VGS≥10V Diagram3:Safeoperatingarea Diagram4:Max.transientthermalimpedance 3 101 10 1 µs 2 10 100 10 µs 100 µs 0.5 0.2 ZthJC[K/W] ID[A] 0.1 1 ms 101 10 ms DC 0.05 0.02 10-1 0.01 single pulse 100 10-1 10-1 10-2 100 101 102 10-3 10-6 10-5 10-4 VDS[V] 10-2 10-1 100 tp[s] ID=f(VDS);TC=25°C;D=0;parameter:tp Final Data Sheet 10-3 ZthJC=f(tp);parameter:D=tp/T 7 Rev.2.0,2015-04-27 OptiMOSTM5Power-MOSFET,30V BSZ0501NSI Diagram5:Typ.outputcharacteristics Diagram6:Typ.drain-sourceonresistance 400 4 4V 10 V 5V 4.5 V 3.2 V 300 3 3.5 V RDS(on)[mΩ] ID[A] 3.5 V 200 3.2 V 4V 4.5 V 5V 2 7V 8V 10 V 3V 100 1 2.8 V 0 0 1 2 0 3 0 10 20 VDS[V] 30 40 50 200 250 ID[A] ID=f(VDS);Tj=25°C;parameter:VGS RDS(on)=f(ID);Tj=25°C;parameter:VGS Diagram7:Typ.transfercharacteristics Diagram8:Typ.forwardtransconductance 400 400 320 300 ID[A] gfs[S] 240 200 160 100 80 150 °C 25 °C 0 0 1 2 3 4 5 0 0 VGS[V] 100 150 ID[A] ID=f(VGS);|VDS|>2|ID|RDS(on)max;parameter:Tj Final Data Sheet 50 gfs=f(ID);Tj=25°C 8 Rev.2.0,2015-04-27 OptiMOSTM5Power-MOSFET,30V BSZ0501NSI Diagram9:Drain-sourceon-stateresistance Diagram10:Typ.gatethresholdvoltage 3.0 2.5 2.5 2.0 10 mA 1.5 typ VGS(th)[V] RDS(on)[mΩ] 2.0 1.5 1.0 1.0 0.5 0.5 0.0 -60 -20 20 60 100 140 0.0 -60 180 -20 20 Tj[°C] 60 100 140 180 Tj[°C] RDS(on)=f(Tj);ID=30A;VGS=10V VGS(th)=f(Tj);VGS=VDS Diagram11:Typ.capacitances Diagram12:Forwardcharacteristicsofreversediode 4 103 10 -55 °C 25 °C 125 °C 150 °C Ciss 102 103 IF[A] C[pF] Coss 101 102 100 Crss 101 0 10 20 30 10-1 0.0 VDS[V] 0.8 1.2 VSD[V] C=f(VDS);VGS=0V;f=1MHz Final Data Sheet 0.4 IF=f(VSD);parameter:Tj 9 Rev.2.0,2015-04-27 OptiMOSTM5Power-MOSFET,30V BSZ0501NSI Diagram13:Avalanchecharacteristics Diagram14:Typ.gatecharge 102 12 15 V 10 6V VGS[V] IAV[A] 8 25 °C 101 24 V 6 100 °C 4 125 °C 2 100 100 101 102 103 0 0 5 tAV[µs] 10 15 20 25 Qgate[nC] IAS=f(tAV);RGS=25Ω;parameter:Tj(start) VGS=f(Qgate);ID=30Apulsed;parameter:VDD Diagram15:Typ.drain-sourceleakagecurrent Gate charge waveforms 10-2 10-3 IDSS[A] 125 °C 100 °C 10-4 75 °C 10-5 25 °C 10-6 0 5 10 15 20 25 VDS[V] IDSS=f(VDS);VGS=0V;parameter:Tj Final Data Sheet 10 Rev.2.0,2015-04-27 OptiMOSTM5Power-MOSFET,30V BSZ0501NSI 6PackageOutlines Figure1OutlinePG-TSDSON-8FL,dimensionsinmm/inches Final Data Sheet 11 Rev.2.0,2015-04-27 OptiMOSTM5Power-MOSFET,30V BSZ0501NSI RevisionHistory BSZ0501NSI Revision:2015-04-27,Rev.2.0 Previous Revision Revision Date Subjects (major changes since last revision) 2.0 2015-04-27 Release of final version WeListentoYourComments Anyinformationwithinthisdocumentthatyoufeeliswrong,unclearormissingatall?Yourfeedbackwillhelpustocontinuously improvethequalityofthisdocument.Pleasesendyourproposal(includingareferencetothisdocument)to: erratum@infineon.com Publishedby InfineonTechnologiesAG 81726München,Germany ©2015InfineonTechnologiesAG AllRightsReserved. LegalDisclaimer Theinformationgiveninthisdocumentshallinnoeventberegardedasaguaranteeofconditionsorcharacteristics.With respecttoanyexamplesorhintsgivenherein,anytypicalvaluesstatedhereinand/oranyinformationregardingtheapplication ofthedevice,InfineonTechnologiesherebydisclaimsanyandallwarrantiesandliabilitiesofanykind,includingwithout limitation,warrantiesofnon-infringementofintellectualpropertyrightsofanythirdparty. Information Forfurtherinformationontechnology,deliverytermsandconditionsandpricespleasecontactyournearestInfineon TechnologiesOffice(www.infineon.com). Warnings Duetotechnicalrequirements,componentsmaycontaindangeroussubstances.Forinformationonthetypesinquestion, pleasecontactthenearestInfineonTechnologiesOffice. TheInfineonTechnologiescomponentdescribedinthisDataSheetmaybeusedinlife-supportdevicesorsystemsand/or automotive,aviationandaerospaceapplicationsorsystemsonlywiththeexpresswrittenapprovalofInfineonTechnologies,ifa failureofsuchcomponentscanreasonablybeexpectedtocausethefailureofthatlife-support,automotive,aviationand aerospacedeviceorsystemortoaffectthesafetyoreffectivenessofthatdeviceorsystem.Lifesupportdevicesorsystemsare intendedtobeimplantedinthehumanbodyortosupportand/ormaintainandsustainand/orprotecthumanlife.Iftheyfail,itis reasonabletoassumethatthehealthoftheuserorotherpersonsmaybeendangered. Final Data Sheet 12 Rev.2.0,2015-04-27
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