IAUT150N10S5N035
OptiMOS™-5 Power-Transistor
Product Summary
VDS
100
V
RDS(on)
3.5
m
ID
150
A
Features
P/G-HSOF-8-1
• N-channel - Enhancement mode
Tab
• AEC qualified
• MSL1 up to 260°C peak reflow
8
1
• 175°C operating temperature
Tab
• Green product (RoHS compliant)
1
• Ultra low Rds(on)
8
• 100% Avalanche tested
Type
Package
Marking
IAUT150N10S5N035
P/G-HSOF-8-1
5N10035
Maximum ratings, at T j=25 °C, unless otherwise specified
Parameter
Symbol
Continuous drain current
ID
Conditions
T C=25°C, V GS=10V
T C=100 °C,
V GS=10 V1)
Value
150
Unit
A
95
Pulsed drain current1)
I D,pulse
T C=25 °C
600
Avalanche energy, single pulse1)
E AS
I D=75 A
210
mJ
Avalanche current, single pulse
I AS
-
150
A
Gate source voltage
V GS
-
±20
V
Power dissipation
P tot
T C=25 °C
166
W
Operating and storage temperature
T j, T stg
-
-55 ... +175
°C
IEC climatic category; DIN IEC 68-1
-
-
55/175/56
Rev. 1.0
page 1
2017-10-02
IAUT150N10S5N035
Parameter
Symbol
Values
Conditions
Unit
min.
typ.
max.
-
-
0.9
Thermal characteristics1)
Thermal resistance, junction - case
R thJC
-
K/W
Electrical characteristics, at T j=25 °C, unless otherwise specified
Static characteristics
Drain-source breakdown voltage
V (BR)DSS
V GS=0 V,
I D=1 mA
100
-
-
Gate threshold voltage
V GS(th)
V DS=V GS, I D=110 µA
2.2
3.0
3.8
Zero gate voltage drain current
I DSS
V DS=100 V, V GS=0 V,
T j=25 °C
-
0.1
1
-
1
20
V DS=50 V, V GS=0 V,
T j=85 °C2)
V
µA
Gate-source leakage current
I GSS
V GS=20 V, V DS=0 V
-
-
100
nA
Drain-source on-state resistance
RDS(on)
V GS=6 V, I D=40 A
-
3.7
5.0
mΩ
V GS=10 V, I D=75 A
-
3.0
3.5
Rev. 1.0
page 2
2017-10-02
IAUT150N10S5N035
Parameter
Symbol
Values
Conditions
Unit
min.
typ.
max.
-
4700
6110
-
780
1014
Dynamic characteristics1)
Input capacitance
C iss
Output capacitance
C oss
Reverse transfer capacitance
Crss
-
34
52
Turn-on delay time
t d(on)
-
12
-
Rise time
tr
-
7
-
Turn-off delay time
t d(off)
-
23
-
Fall time
tf
-
26
-
Gate to source charge
Q gs
-
23
30
Gate to drain charge
Q gd
-
15
23
Gate charge total
Qg
-
67
87
Gate plateau voltage
V plateau
-
5.2
-
V
-
-
150
A
-
-
600
-
0.9
1.3
V
-
63
-
ns
-
120
-
nC
V GS=0 V, V DS=50 V,
f =1 MHz
V DD=50 V, V GS=10 V,
I D=50 A, R G,ext=3.5
pF
ns
Gate Charge Characteristics1)
V DD=50 V, I D=100 A,
V GS=0 to 10 V
nC
Reverse Diode
Diode continous forward current1)
IS
Diode pulse current1)
I S,pulse
Diode forward voltage
V SD
Reverse recovery time1)
t rr
Reverse recovery charge1)
Q rr
1)
T C=25 °C
V GS=0 V, I F=75 A,
T j=25 °C
V R=50 V, I F=50A,
di F/dt =100 A/µs
Defined by design. Not subject to production test.
Rev. 1.0
page 3
2017-10-02
IAUT150N10S5N035
2 Drain current
P tot = f(T C); V GS ≥ 6 V
I D = f(T C); V GS ≥ 6 V
200
200
150
150
ID [A]
Ptot [W]
1 Power dissipation
100
50
100
50
0
0
0
50
100
150
200
0
50
100
TC [°C]
150
200
TC [°C]
3 Safe operating area
4 Max. transient thermal impedance
I D = f(V DS); T C = 25 °C; D = 0
Z thJC = f(t p)
parameter: t p
parameter: D =t p/T
1000
100
1 µs
0.5
10 µs
100 µs
1 ms
100
10-1
ID [A]
ZthJC [K/W]
0.1
10
0.05
0.01
10-2
single pulse
1
10-3
0.1
1
10
100
VDS [V]
Rev. 1.0
10-6
10-5
10-4
10-3
10-2
10-1
100
tp [s]
page 4
2017-10-02
IAUT150N10S5N035
5 Typ. output characteristics
6 Typ. drain-source on-state resistance
I D = f(V DS); T j = 25 °C
R DS(on) = f(I D); T j = 25 °C
parameter: V GS
parameter: V GS
12
700
10 V
11
7V
10
6.5 V
5V
525
RDS(on) [m]
ID [A]
9
6V
350
5.5 V
8
7
6
5
175
5.5 V
4
6V
5V
6.5 V
7V
10 V
3
2
0
0
1
2
3
4
5
6
0
7
50
100
150
ID [A]
VDS [V]
7 Typ. transfer characteristics
8 Typ. drain-source on-state resistance
I D = f(V GS); V DS = 6V
R DS(on) = f(T j); I D = 100 A; V GS = 10 V
parameter: T j
6.5
700
25 °C
6
175 °C
-55 °C
5.5
525
RDS(on) [m]
ID [A]
5
350
4.5
4
3.5
3
175
2.5
2
1.5
0
2
4
6
8
-20
20
60
100
140
180
Tj [°C]
VGS [V]
Rev. 1.0
-60
page 5
2017-10-02
IAUT150N10S5N035
9 Typ. gate threshold voltage
10 Typ. capacitances
V GS(th) = f(T j); V GS = V DS
C = f(V DS); V GS = 0 V; f = 1 MHz
parameter: I D
104
4
Ciss
3.5
110 µA
103
Coss
C [pF]
VGS(th) [V]
3
110 µA
2.5
102
2
1.5
1
-60
-20
20
60
100
140
0
180
20
40
Crss
60
80
100
VDS [V]
Tj [°C]
11 Typical forward diode characteristics
12 Typ. avalanche characteristics
IF = f(VSD)
I AS = f(t AV)
parameter: T j
parameter: Tj(start)
103
1000
102
100
175 °C
IAV [A]
IF [A]
25 °C
25 °C
150 °C
10
101
1
100
0
0.2
0.4
0.6
0.8
1
1.2
1.4
VSD [V]
Rev. 1.0
100 °C
1
10
100
1000
tAV [µs]
page 6
2017-10-02
IAUT150N10S5N035
13 Typical avalanche energy
14 Drain-source breakdown voltage
E AS = f(T j)
V BR(DSS) = f(T j); I D_typ = 1 mA
parameter: I D
108
400
106
40 A
104
VBR(DSS) [V]
EAS [mJ]
300
200
75 A
102
100
98
100
150 A
96
94
0
25
75
125
-60
175
-20
20
Tj [°C]
60
100
140
180
Tj [°C]
15 Typ. gate charge
16 Gate charge waveforms
V GS = f(Q gate); I D = 100 A pulsed
parameter: V DD
10
V GS
9
20 V
8
Qg
50 V
80V
7
VGS [V]
6
5
4
3
2
Q gate
1
Q gs
Q gd
0
0
25
50
75
Qgate [nC]
Rev. 1.0
page 7
2017-10-02
IAUT150N10S5N035
Published by
Infineon Technologies AG
81726 Munich, Germany
© Infineon Technologies AG 2017
All Rights Reserved.
Legal Disclaimer
The information given in this document shall in no event be regarded as a guarantee of conditions
or characteristics. With respect to any examples or hints given herein, any typical values stated
herein and/or any information regarding the application of the device, Infineon Technologies hereby
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties
of non-infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact
the nearest Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances.
For information on the types in question, please contact the nearest Infineon Technologies Office.
Infineon Technologies components may be used in life-support devices or systems only with the
express written approval of Infineon Technologies, if a failure of such components can reasonably be
expected to cause the failure of that life-support device or system or to affect the safety or
effectiveness of that device or system. Life support devices or systems are intended to be implanted
in the human body or to support and/or maintain and sustain and/or protect human life.
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 1.0
page 8
2017-10-02
IAUT150N10S5N035
Revision History
Version
Date
Changes
Version 1.0
2017-10-02
Final Data Sheet
Rev. 1.0
page 9
2017-10-02
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