IPD50N04S308ATMA1

IPD50N04S3-08 OptiMOS®-T Power-Transistor Product Summary V DS 40 V R DS(on),max 7.5 mΩ ID 50 A Features • N-channel - Enhancement mode PG-TO252-3-11 • Automotive AEC Q101 qualified • MSL1 up to 260°C peak reflow • 175°C operating temperature • Green package (RoHS compliant) • 100% Avalanche tested Type Package Marking IPD50N04S3-08 PG-TO252-3-11 3N0408 Maximum ratings, at T j=25 °C, unless otherwise specified Parameter Symbol Continuous drain current ID Conditions T C=25°C, V GS=10V1) T C=100 °C, V GS=10 V2) Value 50 Unit A 49 Pulsed drain current2) I D,pulse T C=25 °C 200 Avalanche energy, single pulse E AS I D=50 A 111 mJ Gate source voltage V GS ±20 V Power dissipation P tot 68 W Operating and storage temperature T j, T stg -55 ... +175 °C T C=25 °C IEC climatic category; DIN IEC 68-1 Rev. 1.0 55/175/56 page 1 2007-05-03 IPD50N04S3-08 Parameter Symbol Values Conditions Unit min. typ. max. - - 2.2 minimal footprint - - 62 6 cm2 cooling area3) - - 40 Thermal characteristics2) Thermal resistance, junction - case R thJC SMD version, device on PCB R thJA K/W Electrical characteristics, at T j=25 °C, unless otherwise specified Static characteristics Drain-source breakdown voltage V (BR)DSS V GS=0 V, I D= 1 mA 40 - - Gate threshold voltage V GS(th) V DS=V GS, I D=40 µA 2.1 3.0 4.0 Zero gate voltage drain current I DSS V DS=40 V, V GS=0 V, T j=25 °C - - 1 - - 100 V DS=40 V, V GS=0 V, T j=125 °C2) V µA Gate-source leakage current I GSS V GS=20 V, V DS=0 V - - 100 nA Drain-source on-state resistance RDS(on) V GS=10 V, I D=50 A - 5.9 7.5 mΩ Rev. 1.0 page 2 2007-05-03 IPD50N04S3-08 Parameter Symbol Values Conditions Unit min. typ. max. - 1800 2350 - 540 710 Dynamic characteristics2) Input capacitance C iss Output capacitance C oss Reverse transfer capacitance Crss - 76 115 Turn-on delay time t d(on) - 11 - Rise time tr - 7 - Turn-off delay time t d(off) - 16 - Fall time tf - 6 - Gate to source charge Q gs - 10 14 Gate to drain charge Q gd - 7 12 Gate charge total Qg - 27 35 Gate plateau voltage V plateau - 5.8 - V - - 50 A - - 200 - 0.9 1.3 V - 30 - ns - 32 - nC V GS=0 V, V DS=25 V, f =1 MHz V DD=20 V, V GS=10 V, I D=50 A, R G=3.5 Ω pF ns Gate Charge Characteristics2) V DD=32 V, I D=50 A, V GS=0 to 10 V nC Reverse Diode Diode continous forward current2) IS Diode pulse current2) I S,pulse Diode forward voltage V SD Reverse recovery time2) t rr Reverse recovery charge2) Q rr T C=25 °C V GS=0 V, I F=50 A, T j=25 °C V R=20 V, I F=I S, di F/dt =100 A/µs 1) Current is limited by bondwire; with an R thJC = 2.2K/W the chip is able to carry 68A at 25°C. For detailed information see Application Note ANPS071E at www.infineon.com/optimos 2) Defined by design. Not subject to production test. 3) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm 2 (one layer, 70 µm thick) copper area for drain connection. PCB is vertical in still air. Rev. 1.0 page 3 2007-05-03 IPD50N04S3-08 1 Power dissipation 2 Drain current P tot = f(T C); V GS ≥ 6 V I D = f(T C); V GS ≥ 6 V 80 60 70 60 40 I D [A] P tot [W] 50 40 30 20 20 10 0 0 0 50 100 150 200 0 50 100 T C [°C] 150 200 T C [°C] 3 Safe operating area 4 Max. transient thermal impedance I D = f(V DS); T C = 25 °C; D = 0 Z thJC = f(t p) parameter: t p parameter: D =t p/T 1000 101 1 µs 0.5 100 10 µs 100 0.1 Z thJC [K/W] I D [A] 100 µs 1 ms 0.05 -1 10 0.01 10 10-2 10-3 1 0.1 1 10 100 10-6 10-5 10-4 10-3 10-2 10-1 100 t p [s] V DS [V] Rev. 1.0 single pulse page 4 2007-05-03 IPD50N04S3-08 5 Typ. output characteristics 6 Typ. drain-source on-state resistance I D = f(V DS); T j = 25 °C R DS(on) = f(I D); T j = 25 °C parameter: V GS parameter: V GS 20 200 5.5 V 10 V 6V 6.5 V 7V 18 160 16 14 7V R DS(on) [mΩ] I D [A] 120 6.5 V 80 12 10 8 6V 6 40 10 V 5.5 V 4 5V 2 0 0 2 4 6 0 8 20 40 60 80 100 120 140 180 I D [A] V DS [V] 7 Typ. transfer characteristics 8 Typ. drain-source on-state resistance I D = f(V GS); V DS = 6V R DS(on) = f(T j); I D = 50 A; V GS = 10 V parameter: T j 200 11 -55 °C 10 160 25 °C 9 R DS(on) [mΩ] I D [A] 120 175 °C 80 8 7 6 40 5 0 2 3 4 5 6 7 8 V GS [V] Rev. 1.0 4 -60 -20 20 60 100 T j [°C] page 5 2007-05-03 IPD50N04S3-08 9 Typ. gate threshold voltage 10 Typ. capacitances V GS(th) = f(T j); V GS = V DS C = f(V DS); V GS = 0 V; f = 1 MHz parameter: I D 104 4 3.5 Ciss V GS(th) [V] 3 C [pF] 400 µA 103 Coss 40 µA 2.5 102 2 Crss 1.5 101 1 -60 -20 20 60 100 140 0 180 5 10 15 20 25 30 V DS [V] T j [°C] 11 Typical forward diode characteristicis 12 Typ. avalanche characteristics IF = f(VSD) I A S= f(t AV) parameter: T j parameter: T j(start) 100 103 25 °C 100 °C 2 10 I F [A] I AV [A] 150 °C 101 175 °C 25 °C 0.6 0.8 100 1 0 0.2 0.4 1 1.2 1.4 V SD [V] Rev. 1.0 10 1 10 100 1000 t AV [µs] page 6 2007-05-03 IPD50N04S3-08 13 Typical avalanche energy 14 Typ. drain-source breakdown voltage E AS = f(T j) V BR(DSS) = f(T j); I D = 1 mA parameter: I D 55 500 450 50 400 12.5 A 350 V BR(DSS) [V] E AS [mJ] 300 250 200 45 40 25 A 150 35 100 50 A 50 30 0 25 75 125 -60 175 -20 T j [°C] 20 60 100 140 180 T j [°C] 15 Typ. gate charge 16 Gate charge waveforms V GS = f(Q gate); I D = 50 A pulsed parameter: V DD 12 V GS 8V 10 Qg 32 V V GS [V] 8 6 V g s(th) 4 2 Q g (th) Q sw Q gs 0 0 10 20 Q gate Q gd 30 Q gate [nC] Rev. 1.0 page 7 2007-05-03 IPD50N04S3-08 Published by Infineon Technologies AG 81726 Munich, Germany © Infineon Technologies AG 2007 All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”). With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non‑infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev. 1.0 page 8 2007-05-03 IPD50N04S3-08 Revision History Version Rev. 1.0 Date Changes page 9 2007-05-03