0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
IRF3709ZCLPBF

IRF3709ZCLPBF

  • 厂商:

    EUPEC(英飞凌)

  • 封装:

    SOT226

  • 描述:

    MOSFET N-CH 30V 87A TO-262

  • 数据手册
  • 价格&库存
IRF3709ZCLPBF 数据手册
PD - 95529 IRF3709ZCSPbF IRF3709ZCLPbF Applications l High Frequency Synchronous Buck Converters for Computer Processor Power l Lead-Free HEXFET® Power MOSFET VDSS RDS(on) max 6.3m: 30V Benefits l Low RDS(on) at 4.5V VGS l Low Gate Charge l Fully Characterized Avalanche Voltage and Current D2Pak IRF3709ZCS Qg 17nC TO-262 IRF3709ZCL Absolute Maximum Ratings Parameter Max. Units 30 V VDS Drain-to-Source Voltage VGS Gate-to-Source Voltage ± 20 ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 87 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 62 IDM Pulsed Drain Current 350 PD @TC = 25°C Maximum Power Dissipation 79 PD @TC = 100°C Maximum Power Dissipation 40 TJ Linear Derating Factor Operating Junction and TSTG Storage Temperature Range h h c A W 0.53 -55 to + 175 Soldering Temperature, for 10 seconds W/°C °C 300 (1.6mm from case) Thermal Resistance Parameter RθJC RθJA Junction-to-Case i Junction-to-Ambient (PCB Mount) g Typ. Max. Units ––– 1.89 °C/W ––– 40 Notes  through ‡ are on page 11 www.irf.com 1 7/20/04 IRF3709ZCS/LPbF Static @ TJ = 25°C (unless otherwise specified) Parameter Min. Typ. Max. Units BVDSS Drain-to-Source Breakdown Voltage 30 ––– ––– ∆ΒVDSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.021 ––– RDS(on) Static Drain-to-Source On-Resistance V Conditions VGS = 0V, ID = 250µA ––– 5.0 6.3 mV/°C Reference to 25°C, ID = 1mA mΩ VGS = 10V, ID = 21A ––– 6.2 7.8 VGS = 4.5V, ID = 17A e e VGS(th) Gate Threshold Voltage 1.35 ––– 2.25 V ∆VGS(th)/∆TJ Gate Threshold Voltage Coefficient ––– -5.5 ––– mV/°C IDSS Drain-to-Source Leakage Current ––– ––– 1.0 µA VDS = 24V, VGS = 0V ––– ––– 150 IGSS Gate-to-Source Forward Leakage ––– ––– 100 nA VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -100 Forward Transconductance 88 ––– ––– Total Gate Charge ––– 17 26 Qgs1 Pre-Vth Gate-to-Source Charge ––– 4.4 ––– Qgs2 Post-Vth Gate-to-Source Charge ––– 1.7 ––– Qgd Gate-to-Drain Charge ––– 6.0 ––– ID = 17A Qgodr ––– 4.9 ––– See Fig. 14a&b Qsw Gate Charge Overdrive Switch Charge (Qgs2 + Qgd) ––– 7.7 ––– Qoss Output Charge ––– 11 ––– td(on) Turn-On Delay Time ––– 13 ––– VDD = 15V, VGS = 4.5V tr Rise Time ––– 41 ––– ID = 17A td(off) Turn-Off Delay Time ––– 16 ––– tf Fall Time ––– 4.7 ––– Ciss Input Capacitance ––– 2130 ––– Coss Output Capacitance ––– 450 ––– Crss Reverse Transfer Capacitance ––– 220 ––– gfs Qg VDS = VGS, ID = 250µA VDS = 24V, VGS = 0V, TJ = 125°C VGS = -20V S VDS = 15V, ID = 17A nC VGS = 4.5V VDS = 15V nC VDS = 16V, VGS = 0V e ns Clamped Inductive Load pF VDS = 15V VGS = 0V ƒ = 1.0MHz Avalanche Characteristics EAS Parameter Single Pulse Avalanche Energy IAR Avalanche Current EAR Repetitive Avalanche Energy c Typ. ––– d c Units mJ Max. 60 ––– 17 A ––– 7.9 mJ Diode Characteristics Parameter Min. Typ. Max. Units h Conditions IS Continuous Source Current ––– ––– 87 ISM (Body Diode) Pulsed Source Current ––– ––– 350 showing the integral reverse VSD (Body Diode) Diode Forward Voltage ––– ––– 1.0 V p-n junction diode. TJ = 25°C, IS = 17A, VGS = 0V trr Reverse Recovery Time ––– 16 24 ns Qrr Reverse Recovery Charge ––– 6.2 9.3 nC 2 c MOSFET symbol A D G S e TJ = 25°C, IF = 17A, VDD = 15V di/dt = 100A/µs e www.irf.com IRF3709ZCS/LPbF 1000 1000 BOTTOM TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP VGS 10V 9.0V 7.0V 5.0V 4.5V 4.0V 3.5V 3.0V 100 100 3.0V BOTTOM VGS 10V 9.0V 7.0V 5.0V 4.5V 4.0V 3.5V 3.0V 3.0V 10 ≤60µs PULSE WIDTH ≤60µs PULSE WIDTH Tj = 175°C Tj = 25°C 10 0.1 1 1 10 100 0.1 V DS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 10 100 Fig 2. Typical Output Characteristics 1000 2.0 RDS(on) , Drain-to-Source On Resistance (Normalized) ID, Drain-to-Source Current (Α) 1 V DS, Drain-to-Source Voltage (V) T J = 175°C 100 10 1 T J = 25°C VDS = 15V ≤60µs PULSE WIDTH 0.1 0 1 2 3 4 5 6 7 VGS, Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com ID = 42A VGS = 10V 1.5 1.0 0.5 8 -60 -40 -20 0 20 40 60 80 100 120 140 160 180 T J , Junction Temperature (°C) Fig 4. Normalized On-Resistance vs. Temperature 3 IRF3709ZCS/LPbF 10000 6.0 VGS = 0V, f = 1 MHZ C iss = C gs + Cgd, C ds SHORTED C rss = C gd ID= 17A 5.0 VGS, Gate-to-Source Voltage (V) C, Capacitance(pF) C oss = C ds + Cgd Ciss 1000 Coss Crss VDS= 24V VDS= 15V 4.0 3.0 2.0 1.0 0.0 100 1 10 100 0 10 1000.00 20 25 ID, Drain-to-Source Current (A) 10000 OPERATION IN THIS AREA LIMITED BY R DS(on) 1000 100.00 T J = 175°C 10.00 100 T J = 25°C 100µsec 10 1msec 1 Tc = 25°C Tj = 175°C Single Pulse VGS = 0V 1.00 10msec 0.1 0.0 0.5 1.0 1.5 2.0 VSD, Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 15 Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage Fig 5. Typical Capacitance vs. Drain-to-Source Voltage ISD, Reverse Drain Current (A) 5 QG Total Gate Charge (nC) VDS, Drain-to-Source Voltage (V) 2.5 0 1 10 100 1000 VDS, Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRF3709ZCS/LPbF 90 80 VGS(th) Gate threshold Voltage (V) 2.5 Limited By Package ID, Drain Current (A) 70 60 50 40 30 20 10 2.0 1.5 ID = 250µA 1.0 0.5 0 25 50 75 100 125 150 -75 -50 -25 175 0 25 50 75 100 125 150 175 200 T J , Temperature ( °C ) T C , Case Temperature (°C) Fig 9. Maximum Drain Current vs. Case Temperature Fig 10. Threshold Voltage vs. Temperature Thermal Response ( Z thJC ) 10 1 D = 0.50 0.20 0.10 0.05 0.1 τJ 0.02 0.01 0.01 R1 R1 τJ τ1 τ1 R2 R2 τ2 τC τ τ2 Ri (°C/W) τi (sec) 0.832 0.000221 1.058 0.001171 Ci= τi/Ri Ci i/Ri SINGLE PULSE ( THERMAL RESPONSE ) Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc 0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 9.00 RDS(on), Drain-to -Source On Resistance (m Ω) RDS(on), Drain-to -Source On Resistance ( mΩ) IRF3709ZCS/LPbF Vgs = 10V 8.00 T J = 125°C 7.00 6.00 T J = 25°C 5.00 4.00 10.0 20.0 30.0 40.0 50.0 60.0 70.0 16 ID = 21A 14 12 10 T J = 125°C 8 6 T J = 25°C 4 2 0 2 ID, Drain Current (A) 3 4 5 6 7 8 9 10 VGS, Gate -to -Source Voltage (V) Fig 12. On-Resistance vs. Drain Current Fig 13. On-Resistance vs. Gate Voltage Current Regulator Same Type as D.U.T. Id Vds 50KΩ Vgs .2µF 12V 250 .3µF EAS , Single Pulse Avalanche Energy (mJ) D.U.T. + V - DS Vgs(th) VGS 3mA IG ID Current Sampling Resistors Qgs1 Qgs2 Qgd Qgodr Fig 14a&b. Basic Gate Charge Test Circuit and Waveform 15V V(BR)DSS tp L VDS D.U.T RG IAS 20V I AS tp DRIVER + V - DD 0.01Ω Fig 15a&b. Unclamped Inductive Test circuit and Waveforms 6 ID 5.4A 8.0A BOTTOM 17A TOP 200 150 100 50 0 A 25 50 75 100 125 150 175 Starting T J , Junction Temperature (°C) Fig 16. Maximum Avalanche Energy vs. Drain Current www.irf.com IRF3709ZCS/LPbF D.U.T Driver Gate Drive ƒ + - - „ * D.U.T. ISD Waveform Reverse Recovery Current +  RG • • • • dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test P.W. Period VGS=10V Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer ‚ D= Period P.W. + VDD + Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage - Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs LD VDS + VDD D.U.T VGS Pulse Width < 1µs Duty Factor < 0.1% Fig 18a. Switching Time Test Circuit VDS 90% 10% VGS td(on) tr td(off) tf Fig 18b. Switching Time Waveforms www.irf.com 7 IRF3709ZCS/LPbF Power MOSFET Selection for Non-Isolated DC/DC Converters Control FET Synchronous FET Special attention has been given to the power losses in the switching elements of the circuit - Q1 and Q2. Power losses in the high side switch Q1, also called the Control FET, are impacted by the Rds(on) of the MOSFET, but these conduction losses are only about one half of the total losses. The power loss equation for Q2 is approximated by; * Ploss = Pconduction + Pdrive + Poutput ( 2 Ploss = Irms × Rds(on) ) Power losses in the control switch Q1 are given by; + (Qg × Vg × f ) Ploss = Pconduction+ Pswitching+ Pdrive+ Poutput ⎛Q ⎞ + ⎜ oss × Vin × f + (Qrr × Vin × f ) ⎠ ⎝ 2 This can be expanded and approximated by; *dissipated primarily in Q1. Ploss = (Irms × Rds(on ) ) 2 ⎛ ⎞ ⎛ Qgs 2 Qgd +⎜I× × Vin × f ⎟ + ⎜ I × × Vin × ig ig ⎝ ⎠ ⎝ ⎞ f⎟ ⎠ + (Qg × Vg × f ) + ⎛ Qoss × Vin × f ⎞ ⎝ 2 ⎠ This simplified loss equation includes the terms Qgs2 and Qoss which are new to Power MOSFET data sheets. Qgs2 is a sub element of traditional gate-source charge that is included in all MOSFET data sheets. The importance of splitting this gate-source charge into two sub elements, Qgs1 and Qgs2, can be seen from Fig 16. Qgs2 indicates the charge that must be supplied by the gate driver between the time that the threshold voltage has been reached and the time the drain current rises to Idmax at which time the drain voltage begins to change. Minimizing Qgs2 is a critical factor in reducing switching losses in Q1. Qoss is the charge that must be supplied to the output capacitance of the MOSFET during every switching cycle. Figure A shows how Qoss is formed by the parallel combination of the voltage dependant (nonlinear) capacitance’s Cds and Cdg when multiplied by the power supply input buss voltage. For the synchronous MOSFET Q2, Rds(on) is an important characteristic; however, once again the importance of gate charge must not be overlooked since it impacts three critical areas. Under light load the MOSFET must still be turned on and off by the control IC so the gate drive losses become much more significant. Secondly, the output charge Qoss and reverse recovery charge Qrr both generate losses that are transfered to Q1 and increase the dissipation in that device. Thirdly, gate charge will impact the MOSFETs’ susceptibility to Cdv/dt turn on. The drain of Q2 is connected to the switching node of the converter and therefore sees transitions between ground and Vin. As Q1 turns on and off there is a rate of change of drain voltage dV/dt which is capacitively coupled to the gate of Q2 and can induce a voltage spike on the gate that is sufficient to turn the MOSFET on, resulting in shoot-through current . The ratio of Qgd/Qgs1 must be minimized to reduce the potential for Cdv/dt turn on. Figure A: Qoss Characteristic 8 www.irf.com IRF3709ZCS/LPbF D2Pak Package Outline Dimensions are shown in millimeters (inches) D2Pak Part Marking Information (Lead-Free) T H IS IS AN IR F 5 3 0 S W IT H L OT COD E 8 0 24 AS S E M B L E D O N W W 0 2 , 2 0 0 0 IN T H E AS S E M B L Y L IN E "L " IN T E R N AT IO N AL R E C T IF IE R L O GO N ote: "P " in as s em bly line pos ition in dicates "L ead-F ree" P AR T N U M B E R F 530S AS S E M B L Y L O T CO D E D AT E C O D E Y E AR 0 = 2 0 0 0 WE E K 02 L IN E L OR IN T E R N AT IO N AL R E C T IF IE R L O GO AS S E M B L Y L OT COD E www.irf.com P AR T N U M B E R F 530S D AT E CO D E P = D E S IG N AT E S L E AD - F R E E P R O D U C T (O P T IO N AL ) Y E AR 0 = 2 0 0 0 WE E K 02 A = AS S E M B L Y S IT E C O D E 9 IRF3709ZCS/LPbF TO-262 Package Outline IGBT 1- GATE 2- COLLECTOR 3- EMITTER TO-262 Part Marking Information EXAMPLE: T HIS IS AN IRL3103L LOT CODE 1789 AS S EMBLED ON WW 19, 1997 IN THE AS S EMBLY LINE "C" Note: "P" in ass embly line pos ition indicates "Lead-Free" INTERNAT IONAL RECT IFIER LOGO AS S EMBLY LOT CODE PART NUMBER DAT E CODE YEAR 7 = 1997 WEEK 19 LINE C OR INTERNAT IONAL RECT IFIER LOGO AS S EMBLY LOT CODE 10 PART NUMBER DAT E CODE P = DES IGNAT ES LEAD-FREE PRODUCT (OPT IONAL) YEAR 7 = 1997 WEEK 19 A = AS S EMBLY S IT E CODE www.irf.com IRF3709ZCS/LPbF D2Pak Tape & Reel Infomation TRR 1.60 (.063) 1.50 (.059) 4.10 (.161) 3.90 (.153) FEED DIRECTION 1.85 (.073) 1.65 (.065) 1.60 (.063) 1.50 (.059) 11.60 (.457) 11.40 (.449) 0.368 (.0145) 0.342 (.0135) 15.42 (.609) 15.22 (.601) 24.30 (.957) 23.90 (.941) TRL 10.90 (.429) 10.70 (.421) 1.75 (.069) 1.25 (.049) 4.72 (.136) 4.52 (.178) 16.10 (.634) 15.90 (.626) FEED DIRECTION 13.50 (.532) 12.80 (.504) 27.40 (1.079) 23.90 (.941) 4 330.00 (14.173) MAX. NOTES : 1. COMFORMS TO EIA-418. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION MEASURED @ HUB. 4. INCLUDES FLANGE DISTORTION @ OUTER EDGE. 60.00 (2.362) MIN. 26.40 (1.039) 24.40 (.961) 3 30.40 (1.197) MAX. 4 Notes:  Repetitive rating; pulse width limited by … This is applied to D2Pak, when mounted on 1" square PCB (FR4 or G-10 Material). For recommended footprint and soldering max. junction temperature. techniques refer to application note #AN-994. ‚ Starting TJ = 25°C, L = 0.42mH, RG = 25Ω, † Calculated continuous current based on maximum allowable IAS = 17A. junction temperature. Package limitation current is 42A. ƒ Pulse width ≤ 400µs; duty cycle ≤ 2%. „ Coss eff. is a fixed capacitance that gives the same ‡ Rθ is measured at TJ of approximately 90°C. charging time as Coss while VDS is rising from 0 to 80% VDSS. Data and specifications subject to change without notice. This product has been designed and qualified for the Consumer market. Qualification Standards can be found on IR’s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. 7/04 www.irf.com 11 Note: For the most current drawings please refer to the IR website at: http://www.irf.com/package/
IRF3709ZCLPBF 价格&库存

很抱歉,暂时无法提供与“IRF3709ZCLPBF”相匹配的价格&库存,您可以联系我们找货

免费人工找货