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IRF3711ZCL

IRF3711ZCL

  • 厂商:

    EUPEC(英飞凌)

  • 封装:

    SOT226

  • 描述:

    MOSFET N-CH 20V 92A TO-262

  • 数据手册
  • 价格&库存
IRF3711ZCL 数据手册
PD - 94792 IRF3711ZCS IRF3711ZCL Applications l High Frequency Synchronous Buck Converters for Computer Processor Power HEXFET® Power MOSFET VDSS RDS(on) max 6.0m: 20V Benefits l Low RDS(on) at 4.5V VGS l Ultra-Low Gate Impedance l Fully Characterized Avalanche Voltage and Current D2Pak IRF3711ZCS Qg 16nC TO-262 IRF3711ZCL Absolute Maximum Ratings Max. Units VDS Drain-to-Source Voltage Parameter 20 V VGS Gate-to-Source Voltage ± 20 ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 92 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 65 IDM Pulsed Drain Current PD @TC = 25°C Maximum Power Dissipation 79 PD @TC = 100°C Maximum Power Dissipation 40 TJ Linear Derating Factor Operating Junction and TSTG Storage Temperature Range c g g A 380 W 0.53 -55 to + 175 Soldering Temperature, for 10 seconds W/°C °C 300 (1.6mm from case) Thermal Resistance Parameter RθJC Junction-to-Case RθJA Junction-to-Ambient (PCB Mount) f Typ. Max. Units ––– 1.89 °C/W ––– 40 Notes  through … are on page 11 www.irf.com 1 10/07/03 IRF3711ZC/S/L Static @ TJ = 25°C (unless otherwise specified) Parameter Min. Typ. Max. Units BVDSS Drain-to-Source Breakdown Voltage 20 ––– ––– ∆ΒVDSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.013 ––– RDS(on) Static Drain-to-Source On-Resistance ––– 4.8 6.0 ––– 5.9 7.3 V Conditions VGS = 0V, ID = 250µA V/°C Reference to 25°C, ID = 1mA mΩ VGS = 10V, ID = 15A VGS = 4.5V, ID = 12A VGS(th) Gate Threshold Voltage 1.55 2.0 2.45 V ∆VGS(th)/∆TJ Gate Threshold Voltage Coefficient ––– -5.6 ––– mV/°C IDSS Drain-to-Source Leakage Current ––– ––– 1.0 µA VDS = 16V, VGS = 0V ––– ––– 150 Gate-to-Source Forward Leakage ––– ––– 100 nA VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -100 Forward Transconductance 46 ––– ––– Total Gate Charge ––– 16 24 Qgs1 Pre-Vth Gate-to-Source Charge ––– 4.6 ––– Qgs2 Post-Vth Gate-to-Source Charge ––– 1.4 ––– Qgd Gate-to-Drain Charge ––– 5.3 ––– ID = 12A Qgodr Gate Charge Overdrive Switch Charge (Qgs2 + Qgd) ––– 4.7 ––– See Fig. 16 Qsw ––– 6.7 ––– IGSS gfs Qg e e VDS = VGS, ID = 250µA VDS = 16V, VGS = 0V, TJ = 125°C VGS = -20V S VDS = 10V, ID = 12A nC VGS = 4.5V VDS = 10V Qoss Output Charge ––– 9.5 ––– td(on) Turn-On Delay Time ––– 12 ––– VDD = 10V, VGS = 4.5V tr Rise Time ––– 16 ––– ID = 12A td(off) Turn-Off Delay Time ––– 15 ––– tf Fall Time ––– 5.4 ––– Ciss Input Capacitance ––– 2150 ––– Coss Output Capacitance ––– 680 ––– Crss Reverse Transfer Capacitance ––– 320 ––– nC VDS = 10V, VGS = 0V e ns Clamped Inductive Load pF VDS = 10V VGS = 0V ƒ = 1.0MHz Avalanche Characteristics EAS Parameter Single Pulse Avalanche Energy IAR Avalanche Current EAR Repetitive Avalanche Energy c d c Typ. ––– Max. 130 Units mJ ––– 12 A ––– 7.9 mJ Diode Characteristics Parameter Min. Typ. Max. Units IS Continuous Source Current ––– ––– ISM (Body Diode) Pulsed Source Current ––– ––– VSD (Body Diode) Diode Forward Voltage ––– trr Reverse Recovery Time ––– Qrr Reverse Recovery Charge ––– 2 c 92 g Conditions MOSFET symbol A D 380 showing the integral reverse ––– 1.0 V p-n junction diode. TJ = 25°C, IS = 12A, VGS = 0V 16 24 ns 6.0 9.0 nC G S e TJ = 25°C, IF = 12A, VDD = 10V di/dt = 100A/µs e www.irf.com IRF3711ZC/S/L 100 1000 VGS TOP 10V 9.0V 7.0V 5.0V 4.5V 4.0V 3.5V BOTTOM 3.0V 3.0V 10 60µs PULSE WIDTH Tj = 25°C 100 3.0V 10 60µs PULSE WIDTH Tj = 175°C 1 1 0.1 1 0.1 10 1 10 VDS, Drain-to-Source Voltage (V) VDS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 1000 2.0 T J = 25°C T J = 175°C 100 10 VDS = 10V 60µs PULSE WIDTH 1 2.0 3.0 4.0 5.0 6.0 7.0 VGS, Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com 8.0 ID = 30A VGS = 10V 1.5 (Normalized) RDS(on) , Drain-to-Source On Resistance ID, Drain-to-Source Current (Α) VGS 10V 9.0V 7.0V 5.0V 4.5V 4.0V 3.5V BOTTOM 3.0V TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) 1000 1.0 0.5 -60 -40 -20 0 20 40 60 80 100 120 140 160 180 T J , Junction Temperature (°C) Fig 4. Normalized On-Resistance vs. Temperature 3 IRF3711ZC/S/L 10000 12 VGS = 0V, f = 1 MHZ C iss = C gs + C gd, C ds SHORTED C rss = C gd VGS, Gate-to-Source Voltage (V) ID= 12A C, Capacitance (pF) C oss = C ds + C gd Ciss 1000 Coss Crss VDS= 15V VDS= 10V 10 8 6 4 2 0 100 1 10 0 100 5 10 15 20 25 30 35 40 QG Total Gate Charge (nC) VDS, Drain-to-Source Voltage (V) Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage Fig 5. Typical Capacitance vs. Drain-to-Source Voltage 1000.0 10000 ID, Drain-to-Source Current (A) ISD, Reverse Drain Current (A) OPERATION IN THIS AREA LIMITED BY R DS(on) 100.0 T J = 175°C 10.0 1.0 T J = 25°C 1000 100 100µsec 10 VGS = 0V 10msec 1 0.1 0.0 0.5 1.0 1.5 2.0 VSD, Source-toDrain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 1msec Tc = 25°C Tj = 175°C Single Pulse 2.5 0 1 10 100 VDS , Drain-toSource Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRF3711ZC/S/L 100 2.4 VGS(th) Gate threshold Voltage (V) LIMITED BY PACKAGE ID , Drain Current (A) 80 60 40 20 2.0 1.6 1.2 0.8 0 25 50 75 100 125 150 ID = 250µA 0.4 175 -75 -50 -25 T C , Case Temperature (°C) 0 25 50 75 100 125 150 175 200 T J , Temperature ( °C ) Fig 9. Maximum Drain Current vs. Case Temperature Fig 10. Threshold Voltage vs. Temperature Thermal Response ( Z thJC ) 10 1 D = 0.50 0.20 0.10 0.1 τJ 0.05 0.02 0.01 R1 R1 τJ τ1 R2 R2 τ2 τ1 τ2 Ci= τi/Ri Ci= τi/Ri 0.01 SINGLE PULSE ( THERMAL RESPONSE ) R3 R3 τ3 τC τ τ3 Ri (°C/W) τi (sec) 0.894 0.000306 0.600 0.001019 0.401 0.006662 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc 0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRF3711ZC/S/L 15V D.U.T RG + V - DD IAS VGS 20V A 0.01Ω tp Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS tp EAS, Single Pulse Avalanche Energy (mJ) DRIVER L VDS 600 ID 7.3A 8.6A BOTTOM 12A TOP 500 400 300 200 100 0 25 50 75 100 125 150 175 Starting T J, Junction Temperature (°C) Fig 12c. Maximum Avalanche Energy vs. Drain Current I AS LD VDS Fig 12b. Unclamped Inductive Waveforms + VDD D.U.T Current Regulator Same Type as D.U.T. VGS Pulse Width < 1µs Duty Factor < 0.1% 50KΩ 12V .2µF .3µF Fig 14a. Switching Time Test Circuit D.U.T. + V - DS VDS 90% VGS 3mA 10% IG ID Current Sampling Resistors VGS td(on) Fig 13. Gate Charge Test Circuit tr td(off) tf Fig 14b. Switching Time Waveforms 6 www.irf.com IRF3711ZC/S/L D.U.T Driver Gate Drive + ƒ + P.W. - - „ • • • • D.U.T. ISD Waveform Reverse Recovery Current + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test P.W. Period *  RG D= VGS=10V Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer ‚ Period VDD + - Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent ISD Ripple ≤ 5% * VGS = 5V for Logic Level Devices Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs Id Vds Vgs Vgs(th) Qgs1 Qgs2 Qgd Qgodr Fig 16. Gate Charge Waveform www.irf.com 7 IRF3711ZC/S/L Power MOSFET Selection for Non-Isolated DC/DC Converters Control FET Synchronous FET Special attention has been given to the power losses in the switching elements of the circuit - Q1 and Q2. Power losses in the high side switch Q1, also called the Control FET, are impacted by the Rds(on) of the MOSFET, but these conduction losses are only about one half of the total losses. The power loss equation for Q2 is approximated by; * Ploss = Pconduction + Pdrive + Poutput ( 2 Ploss = Irms × Rds(on) ) Power losses in the control switch Q1 are given by; + (Qg × Vg × f ) Ploss = Pconduction+ Pswitching+ Pdrive+ Poutput Q  +  oss × Vin × f + (Qrr × Vin × f )   2 This can be expanded and approximated by; *dissipated primarily in Q1. Ploss = (Irms × Rds(on ) ) 2  Qgd +I × × Vin × ig    Qgs 2 f +  I × × Vin × ig    f  + (Qg × Vg × f ) +  Qoss × Vin × f   2  This simplified loss equation includes the terms Qgs2 and Qoss which are new to Power MOSFET data sheets. Qgs2 is a sub element of traditional gate-source charge that is included in all MOSFET data sheets. The importance of splitting this gate-source charge into two sub elements, Qgs1 and Qgs2, can be seen from Fig 16. Qgs2 indicates the charge that must be supplied by the gate driver between the time that the threshold voltage has been reached and the time the drain current rises to Idmax at which time the drain voltage begins to change. Minimizing Qgs2 is a critical factor in reducing switching losses in Q1. Qoss is the charge that must be supplied to the output capacitance of the MOSFET during every switching cycle. Figure A shows how Qoss is formed by the parallel combination of the voltage dependant (nonlinear) capacitance’s Cds and Cdg when multiplied by the power supply input buss voltage. For the synchronous MOSFET Q2, Rds(on) is an important characteristic; however, once again the importance of gate charge must not be overlooked since it impacts three critical areas. Under light load the MOSFET must still be turned on and off by the control IC so the gate drive losses become much more significant. Secondly, the output charge Qoss and reverse recovery charge Qrr both generate losses that are transfered to Q1 and increase the dissipation in that device. Thirdly, gate charge will impact the MOSFETs’ susceptibility to Cdv/dt turn on. The drain of Q2 is connected to the switching node of the converter and therefore sees transitions between ground and Vin. As Q1 turns on and off there is a rate of change of drain voltage dV/dt which is capacitively coupled to the gate of Q2 and can induce a voltage spike on the gate that is sufficient to turn the MOSFET on, resulting in shoot-through current . The ratio of Qgd/Qgs1 must be minimized to reduce the potential for Cdv/dt turn on. Figure A: Qoss Characteristic 8 www.irf.com IRF3711ZC/S/L D2Pak Package Outline D2Pak Part Marking Information T HIS IS AN IRF530S WIT H LOT CODE 8024 AS S EMBLED ON WW 02, 2000 IN T HE AS S EMBLY LINE "L" INTERNATIONAL RECT IFIER LOGO PART NUMBER F530S DAT E CODE YEAR 0 = 2000 WEEK 02 LINE L ASS EMBLY LOT CODE For GB Production T HIS IS AN IRF530S WIT H LOT CODE 8024 AS S EMBLED ON WW 02, 2000 IN T HE AS S EMBLY LINE "L" INTERNATIONAL RECT IFIER LOGO LOT CODE www.irf.com PART NUMBER F530S DAT E CODE 9 IRF3711ZC/S/L TO-262 Package Outline Dimensions are shown in millimeters (inches) IGBT 1- GATE 2- COLLECTOR TO-262 Part Marking Information EXAMPLE: THIS IS AN IRL3103L LOT CODE 1789 AS SEMBLED ON WW 19, 1997 IN T HE AS S EMBLY LINE "C" INT ERNAT IONAL RECTIFIER LOGO AS SEMBLY LOT CODE 10 PART NUMBER DAT E CODE YEAR 7 = 1997 WEEK 19 LINE C www.irf.com IRF3711ZC/S/L D2Pak Tape & Reel Information TRR 1.60 (.063) 1.50 (.059) 1.60 (.063) 1.50 (.059) 4.10 (.161) 3.90 (.153) FEED DIRECTION 1.85 (.073) 11.60 (.457) 11.40 (.449) 1.65 (.065) 0.368 (.0145) 0.342 (.0135) 15.42 (.609) 15.22 (.601) 24.30 (.957) 23.90 (.941) TRL 1.75 (.069) 1.25 (.049) 10.90 (.429) 10.70 (.421) 4.72 (.136) 4.52 (.178) 16.10 (.634) 15.90 (.626) FEED DIRECTION 13.50 (.532) 12.80 (.504) 27.40 (1.079) 23.90 (.941) 4 330.00 (14.173) MAX. 60.00 (2.362) MIN. NOTES : 1. COMFORMS TO EIA-418. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION MEASURED @ HUB. 4. INCLUDES FLANGE DISTORTION @ OUTER EDGE. Notes:  Repetitive rating; pulse width limited by max. junction temperature. ‚ Starting TJ = 25°C, L = 1.8mH, RG = 25Ω, IAS = 12A. ƒ Pulse width ≤ 400µs; duty cycle ≤ 2%. 26.40 (1.039) 24.40 (.961) 3 30.40 (1.197) MAX. 4 „ This is applied to D2Pak, when mounted on 1" square PCB (FR4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994. … Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 30A. TO-220AB package is not recommended for Surface Mount Application. Data and specifications subject to change without notice. This product has been designed and qualified for the Consumer market. Qualification Standards can be found on IR’s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. 10/03 www.irf.com 11 Note: For the most current drawings please refer to the IR website at: http://www.irf.com/package/
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