IRF7738L2PbF
DirectFET® Power MOSFET
V(BR)DSS
40V
RDS(on) typ.
1.2mΩ
max.
1.6mΩ
ID (Silicon Limited)
184A
Qg
129nC
Features
• Advanced Process Technology
• Optimized for Motor Drive, DC-DC and
other Heavy Load Applications
• Exceptionally Small Footprint and Low Profile
• High Power Density
• Low Parasitic Parameters
• Dual Sided Cooling
• Repetitive Avalanche Capability for Robustness and
Reliability
• Lead free, RoHS Compliant and Halogen free
D
Applicable DirectFET® Outline and Substrate Outline
SB
SC
M2
G
S
S
S
S
S
S
D
DirectFET ISOMETRIC
L6
M4
L4
L6
L8
Description
The IRF7738L2TR(1)PbF combines the latest HEXFET® Power MOSFET Silicon technology with the advanced DirectFET® packaging to achieve the lowest onstate resistance in a package that has the footprint of a DPak (TO-252AA) and only 0.7 mm profile. The DirectFET package is compatible with existing layout
geometries used in power applications, PCB assembly equipment and vapor phase, infra-red or convection soldering techniques, when application note AN1035 is followed regarding the manufacturing methods and processes. The DirectFET package allows dual sided cooling to maximize thermal transfer.
This HEXFET® Power MOSFET is designed for applications where efficiency and power density are essential. The advanced DirectFET ® packaging platform
coupled with the latest silicon technology allows the IRF7738L2TR(1)PbF to offer substantial system level savings and performance improvement specifically
in motor drive, high frequency DC-DC and other heavy load applications. This MOSFET utilizes the latest processing techniques to achieve low on-resistance
and low Qg per silicon area. Additional features of this MOSFET are 175°C operating junction temperature and high repetitive peak current capability. These
features combine to make this MOSFET a highly efficient, robust and reliable device for high current applications.
P art n um be r
Package T ype
IR F 7 7 3 8 L 2 T R P b F
IR F 7 7 3 8 L 2 T R 1 P b F
D ir e c tF E T 2 L a r g e C a n
D ir e c tF E T 2 L a r g e C a n
S tan da rd P ac k
Form
Q u a n t it y
T a p e a nd R e e l
4000
T a p e a nd R e e l
1000
N o te
"T R " s u ffix
"T R 1 " s u ffix E O L no tic e # 2 6 4
Absolute Maximum Ratings
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only; and functional
operation of the device at these or any other condition beyond those indicated in the specifications is not implied. Exposure to absolute-maximum-rated conditions
for extended periods may affect device reliability. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions.
Ambient temperature (TA) is 25°C, unless otherwise specified.
Max.
Parameter
VDS
VGS
ID @ TC = 25°C
ID @ TC = 100°C
ID @ TA = 25°C
ID @ TC = 25°C
Drain-to-Source Voltage
Gate-to-Source Voltage
Continuous Drain Current,
Continuous Drain Current,
Continuous Drain Current,
Continuous Drain Current,
IDM
PD @TC = 25°C
PD @TA = 25°C
EAS
EAS (tested)
Pulsed Drain Current
Power Dissipation
Power Dissipation
Single Pulse Avalanche Energy (Thermally Limited)
Single Pulse Avalanche Energy Tested Value
Avalanche Current
Repetitive Avalanche Energy
Peak Soldering Temperature
Operating Junction and
Storage Temperature Range
IAR
EAR
TP
TJ
TSTG
f
e
g
VGS
VGS
VGS
VGS
@
@
@
@
10V
10V
10V
10V
f
f
e
(Silicon Limited)
(Silicon Limited)
(Silicon Limited)
(Package Limited)
h
g
g
Units
40
± 20
184
130
35
315
736
94
3.3
134
538
h
V
A
W
mJ
See Fig.18a, 18b, 16, 17
A
mJ
270
°C
-55 to + 175
Thermal Resistance
RθJA
RθJA
RθJA
RθJCan
RθJ-PCB
e
j
k
Parameter
Junction-to-Ambient
Junction-to-Ambient
Junction-to-Ambient
Junction-to-Can
Junction-to-PCB Mounted
Linear Derating Factor
fl
f
Typ.
Max.
Units
–––
12.5
20
–––
–––
45
–––
–––
1.6
0.5
°C/W
0.63
W/°C
HEXFET® is a registered trademark of International Rectifier.
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IRF7738L2PbF
Static Characteristics @ TJ = 25°C (unless otherwise stated)
Parameter
V(BR)DSS
∆V(BR)DSS/∆TJ
RDS(on)
VGS(th)
Drain-to-Source Breakdown Voltage
Breakdown Voltage Temp. Coefficient
Static Drain-to-Source On-Resistance
Gate Threshold Voltage
∆VGS(th)/∆TJ
Gate Threshold Voltage Coefficient
gfs
RG
IDSS
Forward Transconductance
Gate Resistance
Drain-to-Source Leakage Current
IGSS
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
Min.
Typ.
Max.
40
–––
–––
0.02
–––
–––
–––
2.0
–––
113
–––
–––
–––
–––
–––
1.2
3.0
-8.4
–––
1.0
–––
–––
–––
–––
1.6
4.0
–––
–––
–––
5
250
100
-100
Units
Conditions
V
VGS = 0V, ID = 250µA
V/°C Reference to 25°C, ID = 1mA
mΩ VGS = 10V, ID = 109A
V
VDS = VGS, ID = 250µA
mV/°C
VDS = 10V, ID = 109A
S
i
Ω
µA
nA
VDS = 40V, VGS = 0V
VDS = 40V, VGS = 0V, TJ = 125°C
VGS = 20V
VGS = -20V
Dynamic Characteristics @ TJ = 25°C (unless otherwise stated)
Parameter
Qg
Total Gate Charge
Qgs1
Qgs2
Qgd
Qgodr
Qsw
Qoss
td(on)
tr
td(off)
tf
Ciss
Coss
Crss
Coss
Coss
Coss eff.
Pre-Vth Gate-to-Source Charge
Post-Vth Gate-to-Source Charge
Gate-to-Drain ("Miller") Charge
Gate Charge Overdrive
Switch Charge (Qgs2 + Qgd)
Output Charge
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Output Capacitance
Output Capacitance
Effective Output Capacitance
Min.
Typ.
Max.
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
129
27
10
45
47
55
54
21
77
39
38
7471
1640
737
5936
1465
2261
194
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
Units
Conditions
VDS = 20V, VGS = 10V
ID = 109A
nC
nC
ns
See Fig.11
VDS = 16V, VGS = 0V
VDD = 20V, VGS = 10V
ID = 109A
RG = 1.8Ω
i
VGS = 0V
VDS = 25V
pF
ƒ = 1.0MHz
VGS = 0V, VDS = 1.0V, f=1.0MHz
VGS = 0V, VDS = 32V, f=1.0MHz
VGS = 0V, VDS = 0V to 32V
Diode Characteristics @ TJ = 25°C (unless otherwise stated)
Parameter
Continuous Source Current
(Body Diode)
Pulsed Source Current
(Body Diode)
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
IS
ISM
g
VSD
trr
Qrr
Surface mounted on 1 in. square Cu
(still air).
Min.
Typ.
Max.
–––
–––
184
–––
–––
736
–––
–––
–––
–––
50
68
1.3
75
102
Mounted to a PCB with small
clip heatsink (still air)
Units
A
V
ns
nC
Conditions
MOSFET symbol
showing the
integral reverse
p-n junction diode.
IS = 109A, VGS = 0V
IF = 109A, VDD = 20V
di/dt = 100A/µs
D
G
S
i
i
Mounted on minimum footprint full size
board with metalized back and with small
clip heatsink (still air)
Notes through are on page 9
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IRF7738L2PbF
10000
≤60µs PULSE WIDTH
TOP
Tj = 25°C
ID, Drain-to-Source Current (A)
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
1000
BOTTOM
100
10
≤60µs PULSE WIDTH
TOP
Tj = 175°C
ID, Drain-to-Source Current (A)
10000
1000
BOTTOM
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
100
4.5V
4.5V
10
1
0.1
1
10
0.1
100
Fig 1. Typical Output Characteristics
RDS(on), Drain-to -Source On Resistance ( mΩ)
RDS(on), Drain-to -Source On Resistance (m Ω)
ID = 109A
3
T J = 125°C
1
T J = 25°C
0
6
8
10
12
14
16
18
Vgs = 10V
1.8
T J = 125°C
1.6
1.4
1.2
T J = 25°C
1.0
0.8
5
30
55
80
105 130 155 180 205
ID, Drain Current (A)
Fig 4. Typical On-Resistance vs. Drain Current
Fig 3. Typical On-Resistance vs. Gate Voltage
2.0
1000
VDS = 25V
≤60µs PULSE WIDTH
RDS(on) , Drain-to-Source On Resistance
(Normalized)
ID, Drain-to-Source Current (A)
2.0
20
VGS, Gate -to -Source Voltage (V)
100
T J = -40°C
TJ = 25°C
TJ = 175°C
10
1.8
ID = 109A
VGS = 10V
1.6
1.4
1.2
1.0
0.8
0.6
1
3
4
5
6
7
8
VGS, Gate-to-Source Voltage (V)
Fig 5. Typical Transfer Characteristics
3
100
Fig 2. Typical Output Characteristics
4
4
10
V DS, Drain-to-Source Voltage (V)
V DS, Drain-to-Source Voltage (V)
2
1
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-60 -40 -20 0 20 40 60 80 100120140160180
T J , Junction Temperature (°C)
Fig 6. Normalized On-Resistance vs. Temperature
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IRF7738L2PbF
1000
4.5
3.5
ID = 1.0A
ID = 10mA
ID = 1.0mA
ID = 250µA
2.5
TJ = -40°C
ISD, Reverse Drain Current (A)
VGS(th) , Gate threshold Voltage (V)
5.5
TJ = 25°C
TJ = 175°C
100
10
VGS = 0V
1.5
1.0
-75 -50 -25
0
25 50 75 100 125 150 175
0.2
T J , Temperature ( °C )
0.8
1.0
1.2
Fig 8. Typical Source-Drain Diode Forward Voltage
100000
VGS = 0V,
f = 1 MHZ
C iss = C gs + C gd, C ds SHORTED
C rss = C gd
350
T J = 25°C
C oss = C ds + C gd
C, Capacitance (pF)
Gfs, Forward Transconductance (S)
400
250
200
T J = 175°C
150
100
10000
Ciss
Coss
1000
Crss
V DS = 10V
50
380µs PULSE WIDTH
0
100
0
20
40
60
80
100 120 140 160
1
ID,Drain-to-Source Current (A)
12
200
VDS= 32V
VDS= 20V
VDS= 8V
180
160
ID, Drain Current (A)
10
100
Fig 10. Typical Capacitance vs.Drain-to-Source Voltage
14
ID= 109A
10
VDS, Drain-to-Source Voltage (V)
Fig 9. Typical Forward Transconductance Vs. Drain Current
VGS, Gate-to-Source Voltage (V)
0.6
VSD, Source-to-Drain Voltage (V)
Fig 7. Typical Threshold Voltage vs. Junction Temperature
300
0.4
8
6
4
140
120
100
80
60
40
2
20
0
0
0
25
50
75
100
125
150
175
25
50
75
100
125
150
175
QG, Total Gate Charge (nC)
T C , Case Temperature (°C)
Fig.11 Typical Gate Charge vs.Gate-to-Source Voltage
Fig 12. Maximum Drain Current vs. Case Temperature
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IRF7738L2PbF
600
EAS , Single Pulse Avalanche Energy (mJ)
OPERATION IN THIS AREA
LIMITED BY RDS(on)
1000
100µsec
100
DC
1msec
10msec
10
Tc = 25°C
Tj = 175°C
Single Pulse
ID
17A
29A
BOTTOM 109A
TOP
500
400
300
200
100
0
1
0.10
1
10
25
100
50
75
100
125
150
175
Starting T J , Junction Temperature (°C)
VDS, Drain-to-Source Voltage (V)
Fig 13. Maximum Safe Operating Area
Fig 14. Maximum Avalanche Energy vs. Temperature
Thermal Response ( Z thJC ) °C/W
10
1
D = 0.50
0.20
0.10
0.02
0.1
τJ
0.01
0.05
0.01
R1
R1
τJ
τ1
R2
R2
R3
R3
τC
τ2
τ1
τ2
τ3
τ3
τ4
τ4
τ
τi (sec)
0.00399
18.81517
0.81430
0.03055
0.15982
0.00014
0.62239
0.00402
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
SINGLE PULSE
( THERMAL RESPONSE )
1E-005
Ri (°C/W)
R4
R4
Ci= τi/Ri
Ci i/Ri
0.001
1E-006
0.0001
0.001
0.01
0.1
t1 , Rectangular Pulse Duration (sec)
Fig 15. Maximum Effective Transient Thermal Impedance, Junction-to-Case
1000
Duty Cycle = Single Pulse
Avalanche Current (A)
ID, Drain-to-Source Current (A)
10000
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming ∆Tj = 150°C and
Tstart =25°C (Single Pulse)
100
0.01
10
0.05
0.10
1
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming ∆Τ j = 25°C and
Tstart = 150°C.
0.1
1.0E-06
1.0E-05
1.0E-04
1.0E-03
1.0E-02
1.0E-01
tav (sec)
Fig 16. Typical Avalanche Current Vs.Pulsewidth
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IRF7738L2PbF
160
TOP
Single Pulse
BOTTOM 1.0% Duty Cycle
ID = 109A
EAR , Avalanche Energy (mJ)
140
120
100
80
60
40
20
0
25
50
75
100
125
150
175
Notes on Repetitive Avalanche Curves , Figures 16, 17:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of Tjmax. This is validated for
every part type.
2. Safe operation in Avalanche is allowed as long asTjmax is
not exceeded.
3. Equation below based on circuit and waveforms shown in
Figures 18a, 18b.
4. PD (ave) = Average power dissipation per single
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. Iav = Allowable avalanche current.
7. ∆T = Allowable rise in junction temperature, not to exceed
Tjmax (assumed as 25°C in Figure 16, 17).
tav = Average time in avalanche.
D = Duty cycle in avalanche = tav ·f
ZthJC(D, tav) = Transient thermal resistance, see figure 15)
Starting T J , Junction Temperature (°C)
PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC
Iav = 2DT/ [1.3·BV·Zth]
EAS (AR) = PD (ave)·tav
Fig 17. Maximum Avalanche Energy Vs. Temperature
V(BR)DSS
15V
tp
DRIVER
L
VDS
D.U.T
RG
VGS
20V
+
- VDD
IAS
tp
A
0.01Ω
I AS
Fig 18a. Unclamped Inductive Test Circuit
Fig 18b. Unclamped Inductive Waveforms
Id
Vds
L
VCC
DUT
0
20K
1K
Vgs
S
Vgs(th)
Fig 19a. Gate Charge Test Circuit
V DS
V GS
RG
Qgodr
RD
Qgd
Qgs2 Qgs1
Fig 19b. Gate Charge Waveform
D.U.T.
VDS
+
-
V DD
90%
10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
10%
VGS
td(on)
Fig 20a. Switching Time Test Circuit
6
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tr
t d(off)
tf
Fig 20b. Switching Time Waveforms
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IRF7738L2PbF
DirectFET® Board Footprint, L6 (Large Size Can).
Please see AN-1035 for DirectFET® assembly details and stencil and substrate design recommendations
G = GATE
D = DRAIN
S = SOURCE
D
D
S
D
S
G
D
S
S
D
7
S
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S
D
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IRF7738L2PbF
DirectFET® Outline Dimension, L6 Outline (LargeSize Can).
Please see AN-1035 for DirectFET® assembly details and stencil and substrate design recommendations
DIMENSIONS
CODE
A
B
C
D
E
F
G
H
J
K
L
L1
L2
M
P
R
METRIC
MIN MAX
9.05 9.15
6.85 7.10
5.90 6.00
0.55 0.65
0.58 0.62
1.18 1.22
0.98 1.02
0.73 0.77
0.38 0.42
1.35 1.45
2.55 2.65
3.95 4.05
5.35 5.45
0.68 0.74
0.09 0.17
0.02 0.08
IMPERIAL
MIN
MAX
0.356
0.360
0.270
0.280
0.232
0.236
0.022
0.026
0.023
0.024
0.046
0.048
0.039
0.040
0.029
0.030
0.017
0.015
0.053
0.057
0.100
0.104
0.155
0.159
0.210
0.214
0.027
0.029
0.003
0.007
0.001
0.003
DirectFET® Part Marking
GATE MARKING
LOGO
PART NUMBER
BATCH NUMBER
DATE CODE
Line above the last character of
the date code indicates "Lead-Free"
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
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IRF7738L2PbF
DirectFET® Tape & Reel Dimension (Showing component orientation).
NOTE: Controlling dimensions in mm
Std reel quantity is 4000 parts. (ordered as IRF7738L2TRPBF). For 1000 parts on 7"
reel, order IRF7738L2TR1PBF
REEL DIMENSIONS
STANDARD OPTION (QTY 4000)
IMPERIAL
METRIC
MIN
CODE
MAX
MAX
MIN
12.992
A
N.C
N.C
330.00
0.795
B
N.C
20.20
N.C
0.504
C
0.520
12.80
13.20
0.059
D
1.50
N.C
N.C
3.900
E
99.00
3.940
100.00
N.C
F
N.C
22.40
0.880
G
0.650
16.40
18.40
0.720
H
0.630
15.90
0.760
19.40
LOADED TAPE FEED DIRECTION
NOTE: CONTROLLING
DIMENSIONS IN MM
9
CODE
A
B
C
D
E
F
G
H
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DIMENSIONS
IMPERIAL
METRIC
MIN
MIN
MAX
MAX
4.69
11.90
0.476
12.10
0.154
0.161
4.10
3.90
0.623
0.642
16.30
15.90
0.291
7.60
7.40
0.299
0.283
7.40
7.20
0.291
0.390
9.90
0.398
10.10
0.059
1.50
N.C
N.C
0.059
1.60
1.50
0.063
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IRF7738L2PbF
†
Qualification Information
Industrial
Qualification level
††
(per JEDEC JESD47F††† guidelines)
Comments: This family of products has passed JEDEC’s Industrial
qualification. IR’s Consumer qualification level is granted by extension of the
higher Industrial level.
Moisture Sensitivity Level
MSL1
DFET2
(per JEDEC J-STD-020D†††)
Yes
RoHS Compliant
Qualification standards can be found at International Rectifier’s web site
http://www.irf.com/product-info/reliability
Higher qualification ratings may be available should the user have such requirements.
Please contact your International Rectifier sales representative for further information:
http://www.irf.com/whoto-call/salesrep/
Applicable version of JEDEC standard at the time of product release.
Notes:
Click on this section to link to the appropriate technical paper.
Click on this section to link to the DirectFET® Website.
Surface mounted on 1 in. square Cu board, steady state.
TC measured with thermocouple mounted to top (Drain) of part.
Repetitive rating; pulse width limited by max. junction temperature.
Revision History
Date
2/12/2014
Starting TJ = 25°C, L = 0.022mH, RG = 50Ω, IAS = 109A.
Pulse width ≤ 400µs; duty cycle ≤ 2%.
Used double sided cooling, mounting pad with large heatsink.
Mounted on minimum footprint full size board with metalized
back and with small clip heatsink.
Rθ is measured at TJ of approximately 90°C.
Comments
• Updated ordering information to reflect the End-Of-life (EOL) of the mini-reel option (EOL notice #264).
• Updated data sheet with new IR corporate template.
IR WORLD HEADQUARTERS: 101 N. Sepulveda Blvd., El Segundo, California 90245, USA
To contact International Rectifier, please visit http://www.irf.com/whoto-call/
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