IRFU3707ZPBF

IRFU3707ZPBF

  • 厂商:

    EUPEC(英飞凌)

  • 封装:

    TO-251-3

  • 描述:

  • 数据手册
  • 价格&库存
IRFU3707ZPBF 数据手册
IRFR3707ZPbF IRFU3707ZPbF   HEXFET® Power MOSFET Applications  High Frequency Synchronous Buck Converters for Computer Processor Power  High Frequency Isolated DC-DC Converters with Synchronous Rectification for Telecom and Industrial Use   VDSS 30V RDS(on) max 9.5m Qg 9.6nC D D S G Package Type IRFU3707ZPbF I-Pak IRFR3707ZPbF D-Pak Absolute Maximum Ratings Symbol I- Pak IRFU3707ZPbF D- Pak IRFR3707ZPbF Benefits  Very Low RDS(on) at 4.5V VGS  Ultra - Low Gate Impedance  Fully Characterized Avalanche Voltage and Current  Lead-Free Base part number G G Gate D Drain Standard Pack S D S Source Orderable Part Number Form Quantity Tube 75 IRFU3707ZPbF Tube 75 IRFR3707ZPbF Tape and Reel Left 3000 IRFR3707ZTRLPbF Max. Units VDS Drain -to-Source Voltage Parameter 30 V VGS Gate-to-Source Voltage ± 20 V ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 56   ID @ TC = 100°C IDM PD @TC = 25°C Continuous Drain Current, VGS @ 10V Pulsed Drain Current  Maximum Power Dissipation 39 220 50   PD @TC = 100°C Maximum Power Dissipation TJ TSTG Linear Derating Factor Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds (1.6mm from case) Thermal Resistance   Symbol Parameter Junction-to-Case RJC Junction-to-Ambient ( PCB Mount)  RJA Junction-to-Ambient RJA A W 25 W 0.33 -55 to + 175 W/°C   300   °C  Typ. ––– ––– ––– Max. 3.0 50 110 Units °C/W Notes  through  are on page 2. 1 2016-5-31 IRFR/U3707ZPbF   Static @ TJ = 25°C (unless otherwise specified) V(BR)DSS V(BR)DSS/TJ Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient RDS(on) Static Drain-to-Source On-Resistance VGS(th) Gate Threshold Voltage VGS(th)/TJ Gate Threshold Voltage Temp. Coefficient IDSS Drain-to-Source Leakage Current IGSS gfs Qg Qgs1 Qgs2 Qgd Qgodr Qsw Qoss td(on) tr td(off) tf Ciss Coss Crss Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Forward Trans conductance Total Gate Charge Pre-Vth Gate-to-Source Charge Post-Vth Gate-to-Source Charge Gate-to-Drain Charge Gate Charge Overdrive Switch Charge (Qgs2 + Qgd) Output Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Min. Typ. Max. Units Conditions 30 ––– ––– V VGS = 0V, ID = 250µA ––– 0.023 ––– V/°C Reference to 25°C, ID = 1mA ––– 7.5 9.5 VGS = 10V, ID = 15A  m ––– 10 12.5 VGS = 4.5V, ID = 12A  1.35 1.80 2.25 V VDS = VGS, ID = 25µA ––– -5.0 ––– mV/°C ––– ––– ––– ––– 71 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 9.6 2.6 0.90 3.5 2.6 4.4 5.8 8.0 11 12 3.3 1150 260 120 1.0 150 100 -100 ––– 14 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– µA nA S VDS = 24V, VGS = 0V VDS = 24V,VGS = 0V,TJ =125°C VGS = 20V VGS = -20V VDS = 15V, ID = 12A VDS = 15V V = 4.5V nC   GS ID = 12A See Fig. 16 nC  VDS = 15V, VGS = 0V VDD = 16V,VGS = 4.5V  ID = 12A ns Clamped Inductive Load VGS = 0V pF   VDS = 15V ƒ = 1.0MHz Avalanche Characteristics Parameter Single Pulse Avalanche Energy  Avalanche Current  Repetitive Avalanche Energy  EAS IAR EAR Max. Units 42 12 5.0 mJ A mJ Diode Characteristics Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time IS ISM VSD trr Qrr ton Min. Typ. Max. Units ––– ––– 56 A ––– ––– 220 ––– ––– ––– ––– 25 17 1.0 38 26 V ns nC Conditions MOSFET symbol showing the integral reverse p-n junction diode. TJ = 25°C,IS = 12A,VGS = 0V  TJ = 25°C ,IF = 12A, VDS = 15V di/dt = 100A/µs  Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes:  Repetitive rating; pulse width limited by max. junction temperature  starting TJ = 25°C, L = 0.58mH, RG = 25, IAS = 12A.  Pulse width 400µs; duty cycle  2%.  Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 30A. When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994. 2 2016-5-31 IRFR/U3707ZPbF   1000 10000 ID, Drain-to-Source Current (A) 1000 100 BOTTOM TOP ID, Drain-to-Source Current (A) TOP VGS 10V 6.0V 4.5V 4.0V 3.3V 2.8V 2.5V 2.2V 10 1 0.1 2.2V 0.01 10 2.2V 1 0.1 0.001 1 BOTTOM 20µs PULSE WIDTH Tj = 175°C 20µs PULSE WIDTH Tj = 25°C 0.1 100 0.1 10 10 Fig. 2 Typical Output Characteristics Fig. 1 Typical Output Characteristics 2.0 100 RDS(on) , Drain-to-Source On Resistance (Normalized) 1000 ID, Drain-to-Source Current ) 1 VDS , Drain-to-Source Voltage (V) VDS, Drain-to-Source Voltage (V) T J = 175°C 10 1 T J = 25°C 0.1 VDS = 10V 20µs PULSE WIDTH 0 2 4 6 VGS, Gate-to-Source Voltage (V) Fig. 3 Typical Transfer Characteristics ID = 30A VGS = 10V 1.5 1.0 0.5 0.01 3 VGS 10V 6.0V 4.5V 4.0V 3.3V 2.8V 2.5V 2.2V 8 -60 -40 -20 0 20 40 60 80 100 120 140 160 180 T J , Junction Temperature (°C) Fig. 4 Normalized On-Resistance vs. Temperature 2016-5-31 IRFR/U3707ZPbF   6.0 10000 VGS = 0V, f = 1 MHZ Ciss = C gs + Cgd, C ds SHORTED Crss = C gd ID= 12A VGS, Gate-to-Source Voltage (V) C, Capacitance(pF) Coss = Cds + Cgd Ciss 1000 Coss VDS = 24V VDS = 15V 5.0 4.0 3.0 2.0 1.0 Crss 0.0 100 1 10 0 100 2 4 6 8 10 12 QG Total Gate Charge (nC) VDS , Drain-to-Source Voltage (V) Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage Fig 5. Typical Capacitance vs. Drain-to-Source Voltage 1000.00 1000 ID, Drain-to-Source Current (A) ISD, Reverse Drain Current (A) OPERATION IN THIS AREA LIMITED BY R DS (on) 100.00 100 T J = 175°C 10.00 1.00 T J = 25°C 100µsec 1msec 1 10msec Tc = 25°C Tj = 175°C Single Pulse VGS = 0V 0.10 0.1 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 VSD , Source-to-Drain Voltage (V) Fig. 7 Typical Source-to-Drain Diode Forward Voltage   4 10 0 1 10 100 1000 VDS , Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area 2016-5-31 IRFR/U3707ZPbF   60 Limited By Package 50 ID, Drain Current (A) VGS(th) Gate threshold Voltage (V) 2.5 40 30 20 10 0 2.0 ID = 250µA 1.5 1.0 25 50 75 100 125 150 -75 -50 -25 175 TC , Case Temperature (°C) 0 25 50 75 100 125 150 175 200 T J , Temperature ( °C ) Fig 9. Maximum Drain Current vs. Case Temperature Fig 10. Threshold Voltage vs. Temperature Thermal Response ( Z thJC ) 10 1 D = 0.50 0.20 0.10 0.1 0.01 0.05 0.02 0.01 J SINGLE PULSE ( THERMAL RESPONSE ) R1 R1 J 1 R2 R2 R3 R3 C 1 2 2 3 Ci= iRi Ci= iRi 3 C Ri (°C/W) i (sec) 0.823 0.000128 1.698 0.000845 0.481 0.016503 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc 0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 5 2016-5-31 IRFR/U3707ZPbF   200 DRIVER L VDS D.U.T RG + V - DD IAS 20V A 0.01 tp Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS tp EAS , Single Pulse Avalanche Energy (mJ) 15V ID TOP 3.7A 5.6A BOTTOM 12A 180 160 140 120 100 80 60 40 20 0 25 50 75 100 125 150 175 Starting T J , Junction Temperature (°C) Fig 12c. Maximum Avalanche Energy vs. Drain Current I AS Fig 12b. Unclamped Inductive Waveforms LD VDS Id Vds + Vgs VDD D.U.T Vgs(th) VGS Pulse Width < 1µs Duty Factor < 0.1% Qgs1 Qgs2 Qgd Qgodr Fig 14a. Switching Time Test Circuit Fig 13a. Gate Charge Waveform VDS 90% 10% VGS td(on) Fig 13b. Gate Charge Test Circuit   6 tr td(off) tf Fig 14b. Switching Time Waveforms 2016-5-31 IRFR/U3707ZPbF   Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs   7 2016-5-31 IRFR/U3707ZPbF   Power MOSFET Selection for Non-Isolated DC/DC Converters Control FET Synchronous FET Special attention has been given to the power losses in the switching elements of the circuit - Q1 and Q2. Power losses in the high side switch Q1, also called the Control FET, are impacted by the Rds(on) of the MOSFET, but these conduction losses are only about one half of the total losses. The power loss equation for Q2 is approximated by; Power losses in the control switch Q1 are given by; Ploss = Pconduction+ Pswitching+ Pdrive+ Poutput This can be expanded and approximated by; Ploss  Irms  Rds(on)  2  Q   Q   I  gd  Vin  f  I  gs2  Vin  f  i i     g g  Qg  Vg  f   Qoss  Vin  f   2  This simplified loss equation includes the terms Qgs2 and Qoss which are new to Power MOSFET data sheets. Qgs2 is a subelement of traditional gate-source charge that is included in all MOSFET data sheets. The importance of splitting this gate-source charge into two sub elements, Qgs1 and Qgs2, can be seen from Fig 16. Qgs2 indicates the charge that must be supplied by the gate driver between the time that the threshold voltage has been reached and the time the drain current rises to Id max at which time the drain voltage begins to change. Minimizing Qgs2 is a critical factor in reducing switching losses in Q1. Qoss is the charge that must be supplied to the output capacitance of the MOSFET during every switching cycle. Figure A shows how Qoss is formed by the parallel combination of the voltage dependent (non-linear) capacitance’s Cds and Cdg when multiplied by the power supply input buss voltage. * Ploss  Pconduction  Pdrive  Poutput  2 Ploss  Irms  Rds(on)   Qg  Vg  f  Q    oss  Vin  f  Qrr  Vin  f   2  *dissipated primarily in Q1 For the synchronous MOSFET Q2, Rds(on) is an important characteristic; however, once again the importance of gate charge must not be overlooked since it impacts three critical areas. Under light load the MOSFET must still be turned on and off by the control IC so the gate drive losses become much more significant. Secondly, the output charge Qoss and reverse recovery charge Qrr both generate losses that are transferred to Q1 and increase the dissipation in that device. Thirdly, gate charge will impact the MOSFETs’ susceptibility to Cdv/dt turn on. The drain of Q2 is connected to the switching node of the converter and therefore sees transitions between ground and Vin. As Q1 turns on and off there is a rate of change of drain voltage dV/dt which is capacitive coupled to the gate of Q2 and can induce a voltage spike on the gate that is sufficient to turn the MOSFET on, resulting in shoot-through current . The ratio of Qgd/Qgs1 must be minimized to reduce the potential for Cdv/dt turn on. Figure A: Qoss Characteristic 8 2016-5-31 IRFR/U3707ZPbF   D-Pak (TO-252AA) Package Outline (Dimensions are shown in millimeters (inches)) D-Pak (TO-252AA) Part Marking Information EXAMPLE: THIS IS AN IRFR120 WITH ASSEMBLY LOT CODE 1234 ASSEMBLED ON WW 16, 2001 IN THE ASSEMBLY LINE "A" PART NUMBER INTERNATIONAL RECTIFIER LOGO Note: "P" in assembly line position indicates "Lead-Free" IRFR120 12 116A 34 ASSEMBLY LOT CODE DATE CODE YEAR 1 = 2001 WEEK 16 LINE A "P" in assembly line position indicates "Lead-Free" qualification to the consumer-level OR INTERNATIONAL RECTIFIER LOGO PART NUMBER IRFR120 12 ASSEMBLY LOT CODE 34 DATE CODE P = DESIGNATES LEAD-FREE PRODUCT (OPTIONAL) P = DESIGNATES LEAD-FREE PRODUCT QUALIFIED TO THE CONSUMER LEVEL (OPTIONAL) YEAR 1 = 2001 WEEK 16 A = ASSEMBLY SITE CODE Note: For the most current drawing please refer to Infineon’s web site www.infineon.com   9 2016-5-31 IRFR/U3707ZPbF   I-Pak (TO-251AA) Package Outline Dimensions are shown in millimeters (inches) I-Pak (TO-251AA) Part Marking Information EXAMPLE: THIS IS AN IRFU120 WITH ASSEMBLY LOT CODE 5678 ASSEMBLED ON WW 19, 2001 IN THE ASSEMBLY LINE "A" INTERNATIONAL RECTIFIER LOGO PART NUMBER IRFU120 119A 56 78 ASSEMBLY LOT CODE Note: "P" in assembly line position indicates Lead-Free" DATE CODE YEAR 1 = 2001 WEEK 19 LINE A OR INTERNATIONAL RECTIFIER LOGO PART NUMBER IRFU120 56 ASSEMBLY LOT CODE 78 DATE CODE P = DESIGNATES LEAD-FREE PRODUCT (OPTIONAL) YEAR 1 = 2001 WEEK 19 A = ASSEMBLY SITE CODE Note: For the most current drawing please refer to Infineon’s web site www.infineon.com 10 2016-5-31 IRFR/U3707ZPbF   D-Pak (TO-252AA) Tape & Reel Information Dimensions are shown in millimeters (inches) TR TRR 16.3 ( .641 ) 15.7 ( .619 ) 12.1 ( .476 ) 11.9 ( .469 ) FEED DIRECTION TRL 16.3 ( .641 ) 15.7 ( .619 ) 8.1 ( .318 ) 7.9 ( .312 ) FEED DIRECTION NOTES : 1. CONTROLLING DIMENSION : MILLIMETER. 2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ). 3. OUTLINE CONFORMS TO EIA-481 & EIA-541. 13 INCH 16 mm NOTES : 1. OUTLINE CONFORMS TO EIA-481. Note: For the most current drawing please refer to Infineon’s web site www.infineon.com 11 2016-5-31 IRFR/U3707ZPbF   Qualification Information†   Industrial (per JEDEC JESD47F) †† Qualification Level   Moisture Sensitivity Level D-Pak MSL1 I-Pak (per JEDEC J-STD-020D) †† Yes RoHS Compliant † Qualification standards can be found at Infineon’s web site www.infineon.com †† Applicable version of JEDEC standard at the time of product release. Revision History Date 5/31/2016 Comments   Updated datasheet with corporate template. Added disclaimer on last page. Trademarks of Infineon Technologies AG  µHVIC™, µIPM™, µPFC™, AU‐ConvertIR™, AURIX™, C166™, CanPAK™, CIPOS™, CIPURSE™, CoolDP™, CoolGaN™, COOLiR™, CoolMOS™, CoolSET™, CoolSiC™,  DAVE™, DI‐POL™, DirectFET™, DrBlade™, EasyPIM™, EconoBRIDGE™, EconoDUAL™, EconoPACK™, EconoPIM™, EiceDRIVER™, eupec™, FCOS™, GaNpowIR™,  HEXFET™,  HITFET™,  HybridPACK™,  iMOTION™,  IRAM™,  ISOFACE™,  IsoPACK™,  LEDrivIR™,  LITIX™,  MIPAQ™,  ModSTACK™,  my‐d™,  NovalithIC™,  OPTIGA™,  Op MOS™,  ORIGA™,  PowIRaudio™,  PowIRStage™,  PrimePACK™,  PrimeSTACK™,  PROFET™,  PRO‐SIL™,  RASIC™,  REAL3™,  SmartLEWIS™,  SOLID  FLASH™,  SPOC™, StrongIRFET™, SupIRBuck™, TEMPFET™, TRENCHSTOP™, TriCore™, UHVIC™, XHP™, XMC™    Trademarks updated November 2015    Other Trademarks  All referenced product or service names and trademarks are the property of their respec ve owners.   Edi on 2016‐04‐19  Published by  Infineon Technologies AG  81726 Munich, Germany     © 2016 Infineon Technologies AG.  All Rights Reserved.     Do you have a ques on about this  document?  Email: erratum@infineon.com    Document reference  ifx1       12 IMPORTANT NOTICE  The informa on given in this document shall in no  event be regarded as a guarantee of condi ons or  characteris cs  (“Beschaffenheitsgaran e”) .     With  respect  to  any  examples,  hints  or  any  typical  values  stated  herein  and/or  any  informa on  regarding  the  applica on  of  the  product,  Infineon  Technologies  hereby  disclaims  any  and  all  warran es  and  liabili es  of  any  kind,  including  without  limita on  warran es  of  non‐infringement  of intellectual property rights of any third party.     In addi on, any informa on given in this document  is  subject  to  customer’s  compliance  with  its  obliga ons  stated  in  this  document  and  any  applicable  legal  requirements,  norms  and  standards concerning customer’s products and any  use  of  the  product  of  Infineon  Technologies  in  customer’s applica ons.     The data contained in this document is exclusively  intended  for  technically  trained  staff.  It  is  the  responsibility of customer’s technical departments  to  evaluate  the  suitability  of  the  product  for  the  intended  applica on  and  the  completeness  of  the  product  informa on  given  in  this  document  with  respect to such applica on.        For further informa on on the product, technology,  delivery  terms  and  condi ons  and  prices  please  contact  your  nearest  Infineon  Technologies  office  (www.infineon.com).     Please  note  that  this  product  is  not  qualified  according to the AEC Q100 or AEC Q101 documents  of the Automo ve Electronics Council.   WARNINGS   Due  to  technical  requirements  products  may  contain  dangerous  substances.  For  informa on  on  the  types  in  ques on  please  contact  your  nearest  Infineon Technologies office.     Except  as  otherwise  explicitly  approved  by  Infineon  Technologies  in  a  wri en  document  signed  by  authorized representa ves of Infineon Technologies,  Infineon Technologies’ products may not be used in  any  applica ons  where  a  failure  of  the  product  or  any consequences of the use thereof can reasonably  be expected to result in personal injury.      2016-5-31
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