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IRL1104LPBF

IRL1104LPBF

  • 厂商:

    EUPEC(英飞凌)

  • 封装:

    SOT226

  • 描述:

    MOSFET N-CH 40V 104A TO-262

  • 数据手册
  • 价格&库存
IRL1104LPBF 数据手册
PD -95576 Logic-Level Gate Drive l Advanced Process Technology l Surface Mount (IRL1104S) l Low-profile through-hole (IRL1104L) l 175°C Operating Temperature l Fast Switching l Fully Avalanche Rated l Lead-Free Description IRL1104SPbF IRL1104LPbF l HEXFET® Power MOSFET D VDSS = 40V RDS(on) = 0.008Ω G Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The D2Pak is a surface mount power package capable of accommodating die sizes up to HEX-4. It provides the highest power capability and the lowest possible on-resistance in any existing surface mount package. The D2Pak is suitable for high current applications because of its low internal connection resistance and can dissipate up to 2.0W in a typical surface mount application. The through-hole version (IRL1104L) is available for lowprofile applications. ID = 104A† S D 2 Pak TO-262 Absolute Maximum Ratings Parameter ID @ TC = 25°C ID @ TC = 100°C IDM PD @TA = 25°C PD @TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG Continuous Drain Current, VGS @ 10V… Continuous Drain Current, VGS @ 10V… Pulsed Drain Current … Power Dissipation Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy‚… Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt ƒ… Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Max. 104† 74† Units A 416 2.4 167 1.1 ±16 340 62 17 5.0 -55 to + 175 W W W/°C V mJ A mJ V/ns °C 300 (1.6mm from case ) Thermal Resistance Parameter RθJC RθJA www.irf.com Junction-to-Case Junction-to-Ambient(PCB Mounted,steady-state)** Typ. Max. Units ––– ––– 0.9 40 °C/W 1 07/19/04 IRL1104S/LPbF Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Parameter Drain-to-Source Breakdown Voltage ∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient Qg Qgs Qgd td(on) tr td(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Min. 40 ––– ––– ––– 1.0 53 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– LS Internal Source Inductance ––– Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance ––– ––– ––– V(BR)DSS RDS(on) Static Drain-to-Source On-Resistance VGS(th) gfs Gate Threshold Voltage Forward Transconductance IDSS Drain-to-Source Leakage Current IGSS Typ. ––– 0.04 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 18 257 32 64 Max. Units Conditions ––– V VGS = 0V, ID = 250µA ––– V/°C Reference to 25°C, ID =1mA… 0.008 VGS = 10V, ID = 62A „ W 0.012 VGS = 4.5V, ID = 52A „ V VDS = VGS, ID = 250µA ––– S VDS = 25V, ID = 62A… 25 VDS =40V, VGS = 0V µA 250 VDS = 32V, VGS = 0V, TJ = 150°C 100 VGS = 16V nA -100 VGS = -16V 68 ID =62A 24 nC VDS = 32V 34 VGS = 4.5V, See Fig. 6 and 13 „… ––– VDD = 20V ––– ID =54A ––– RG = 3.6Ω , V GS = 4.5V ––– RD = 0.4Ω, See Fig. 10 „… Between lead, 7.5 nH ––– and center of die contact 3445 ––– VGS = 0V 1065 ––– pF VDS = 25V 270 ––– ƒ = 1.0MHz, See Fig. 5… Source-Drain Ratings and Characteristics IS I SM VSD trr Q rr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode)  Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time Min. Typ. Max. Units Conditions D MOSFET symbol ––– ––– 104† showing the A G integral reverse ––– ––– 416 p-n junction diode. S ––– ––– 1.3 V TJ = 25°C, IS =62A, VGS = 0V „ ––– 84 126 ns TJ = 25°C, IF =62A ––– 223 335 nC di/dt = 100A/µs „… Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes:  Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) ‚ VDD = 15V, starting TJ = 25°C, L = 0.18mH RG = 25Ω, IAS = 62A. (See Figure 12) „ Pulse width ≤ 300µs; duty cycle ≤ 2%. … Uses IRL1104 data and test conditions. † Calculated continuous current based on maximum allowable ƒ ISD ≤ 62A, di/dt ≤ 217A/µs, VDD ≤ V(BR)DSS, junction temperature;for recommended current-handling of the package refer to Design Tip # 93-4 TJ ≤ 175°C ** When mounted on 1" square PCB ( FR-4 or G-10 Material ). For recommended footprint and soldering techniques refer to application note #AN-994. 2 www.irf.com IRL1104S/LPbF 1000 1000 VGS 15V 10V 7.0V 5.5V 4.5V 4.0V 3.5V BOTTOM 2.7V 100 10 2.7V 20µs PULSE WIDTH TJ = 25 °C 1 0.1 1 10 100 100 RDS(on) , Drain-to-Source On Resistance (Normalized) I D , Drain-to-Source Current (A) TJ = 25 ° C TJ = 175 ° C 100 10 V DS = 25 50V 20µs PULSE WIDTH 10.0 VGS , Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com 10 100 Fig 2. Typical Output Characteristics 2.5 8.0 1 VDS , Drain-to-Source Voltage (V) 1000 6.0 20µs PULSE WIDTH TJ = 175 °C 1 0.1 Fig 1. Typical Output Characteristics 4.0 2.7V 10 VDS , Drain-to-Source Voltage (V) 1 2.0 VGS 15V 10V 7.0V 5.5V 4.5V 4.0V 3.5V BOTTOM 2.7V TOP I D , Drain-to-Source Current (A) I D , Drain-to-Source Current (A) TOP ID = 104A 2.0 1.5 1.0 0.5 0.0 -60 -40 -20 0 VGS = 10V 20 40 60 80 100 120 140 160 180 TJ , Junction Temperature ( °C) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRL1104S/LPbF VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd C, Capacitance (pF) 5000 4000 Ciss 3000 2000 Coss 1000 10 VGS , Gate-to-Source Voltage (V) 6000 ID = 62 A VDS = 32V VDS = 20V 8 6 4 2 Crss 0 1 10 0 100 VDS , Drain-to-Source Voltage (V) 0 20 40 60 80 QG , Total Gate Charge (nC) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 10000 OPERATION IN THIS AREA LIMITED BY RDS(on) 100 TJ = 175 ° C 1000 ID , Drain Current (A) ISD , Reverse Drain Current (A) FOR TEST CIRCUIT SEE FIGURE 13 10 TJ = 25 ° C 1 0.1 0.2 100 100us 1ms 10 10ms TC = 25 °C TJ = 175 °C Single Pulse VGS = 0 V 0.8 1.4 2.0 VSD ,Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 10us 2.6 1 1 10 100 VDS , Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRL1104S/LPbF 120 100 ID , Drain Current (A) RD V DS LIMITED BY PACKAGE V GS D.U.T. RG + V - DD 80 4.5V 60 Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 40 Fig 10a. Switching Time Test Circuit 20 VDS 90% 0 25 50 75 100 125 150 175 TC , Case Temperature ( °C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 1 D = 0.50 0.20 0.1 0.10 0.05 PDM 0.02 0.01 t1 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJC + TC 0.01 0.00001 0.0001 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 15V L VDS D.U.T RG IAS 5 10V DRIVER + V - DD A 0.01Ω tp Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS EAS , Single Pulse Avalanche Energy (mJ) IRL1104S/LPbF 800 TOP BOTTOM ID 25A 44A 62A 600 400 200 0 25 50 75 100 125 150 175 Starting TJ , Junction Temperature ( °C) tp Fig 12c. Maximum Avalanche Energy Vs. Drain Current I AS Current Regulator Same Type as D.U.T. Fig 12b. Unclamped Inductive Waveforms 50KΩ QG 12V .2µF .3µF 4.5 V QGS QGD D.U.T. + V - DS VGS VG 3mA Charge Fig 13a. Basic Gate Charge Waveform 6 IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit www.irf.com IRL1104S/LPbF Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer ƒ + ‚ - - „ +  RG • • • • dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Driver Gate Drive P.W. Period D= + - V DD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFETS www.irf.com 7 IRL1104S/LPbF D2Pak Package Outline Dimensions are shown in millimeters (inches) D2Pak Part Marking Information T H IS IS AN IR F 530S WIT H L OT CODE 8024 AS S E MB L E D ON WW 02, 2000 IN T H E AS S E MB L Y L INE "L" INT E R NAT IONAL R E CT IF IE R LOGO Note: "P " in as s embly line pos ition indicates "Lead-F ree" P AR T NU MB E R F 530S AS S E MB L Y L OT CODE OR INT E R NAT IONAL R E CT IF IE R L OGO AS S E MB L Y LOT CODE 8 DAT E CODE YE AR 0 = 2000 WE E K 02 L INE L PAR T NU MB E R F 530S DAT E CODE P = DE S IGNAT E S L E AD-F R E E PRODU CT (OPT IONAL) YE AR 0 = 2000 WE E K 02 A = AS S E MB LY S IT E CODE www.irf.com IRL1104S/LPbF TO-262 Package Outline Dimensions are shown in millimeters (inches) TO-262 Part Marking Information E XAMPL E : T H IS IS AN IRL 3103L L OT CODE 1789 AS S E MB L E D ON WW 19, 1997 IN T H E AS S E MB L Y LINE "C" Note: "P" in as s embly line pos ition indicates "L ead-F ree" INT E RNAT IONAL RE CT IF IE R L OGO AS S E MB L Y L OT CODE PART NUMB ER DAT E CODE YE AR 7 = 1997 WE E K 19 L INE C OR INT E RNAT IONAL RE CT IF IE R L OGO AS S E MB L Y L OT CODE www.irf.com PART NUMB E R DAT E CODE P = DE S IGNAT E S L EAD-F REE PRODUCT (OPT IONAL ) YE AR 7 = 1997 WE E K 19 A = AS S E MB L Y S IT E CODE 9 IRL1104S/LPbF D2Pak Tape & Reel Information Dimensions are shown in millimeters (inches) TRR 1.60 (.063) 1.50 (.059) 4.10 (.161) 3.90 (.153) FEED DIRECTION 1.85 (.073) 1.60 (.063) 1.50 (.059) 11.60 (.457) 11.40 (.449) 1.65 (.065) 0.368 (.0145) 0.342 (.0135) 15.42 (.609) 15.22 (.601) 24.30 (.957) 23.90 (.941) TRL 1.75 (.069) 1.25 (.049) 10.90 (.429) 10.70 (.421) 4.72 (.136) 4.52 (.178) 16.10 (.634) 15.90 (.626) FEED DIRECTION 13.50 (.532) 12.80 (.504) 27.40 (1.079) 23.90 (.941) 4 330.00 (14.173) MAX. 60.00 (2.362) MIN. NOTES : 1. COMFORMS TO EIA-418. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION MEASURED @ HUB. 4. INCLUDES FLANGE DISTORTION @ OUTER EDGE. 30.40 (1.197) MAX. 26.40 (1.039) 24.40 (.961) 3 4 Data and specifications subject to change without notice. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. 07/04 10 www.irf.com Note: For the most current drawings please refer to the IR website at: http://www.irf.com/package/
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