100328SC

100328 Low Power Octal ECL/TTL Bi-Directional Translator with Latch April 1989 Revised August 2000 100328 Low Power Octal ECL/TTL Bi-Directional Translator with Latch General Description The 100328 is an octal latched bi-directional translator designed to convert TTL logic levels to 100K ECL logic levels and vice versa. The direction of this translation is determined by the DIR input. A LOW on the output enable input (OE) holds the ECL outputs in a cut-off state and the TTL outputs at a high impedance level. A HIGH on the latch enable input (LE) latches the data at both inputs even though only one output is enabled at the time. A LOW on LE makes the 100328 transparent. The cut-off state is designed to be more negative than a normal ECL LOW level. This allows the output emitter-followers to turn off when the termination supply is −2.0V, presenting a high impedance to the data bus. This high impedance reduces termination power and prevents loss of low state noise margin when several loads share the bus. The 100328 is designed with FAST TTL output buffers, featuring optimal DC drive and capable of quickly charging and discharging highly capacitive loads. All inputs have 50 kΩ pull-down resistors. Features s Identical performance to the 100128 at 50% of the supply current s Bi-directional translation s 2000V ESD protection s Latched outputs s FAST TTL outputs s 3-STATE outputs s Voltage compensated operating range = −4.2V to −5.7V s Available to industrial grade temperature range Ordering Code: Order Number 100328SC 100328PC 100328QC 100328QI Package Number M24B N24E V28A V28A Package Description 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide 28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square 28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square Industrial Temperature Range (−40°C to +85°C) Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbol Pin Descriptions Pin Names E0–E7 T0–T7 OE LE DIR Description ECL Data I/O TTL Data I/O Output Enable Input Latch Enable Input Direction Control Input All pins function at 100K ECL levels except for T0–T7. FAST is a registered trademark of Fairchild Semiconductor Corporation. © 2000 Fairchild Semiconductor Corporation DS010219 www.fairchildsemi.com 100328 Connection Diagrams 24-Pin DIP/SOIC Functional Diagram 28-Pin PLCC Truth Table OE L L L H H H H H H DIR X L H L L L H H H LE L H H L L H L L H ECL Port LOW (Cut-Off) Input LOW (Cut-Off) L H X L H Latched L H L H X Z Input (Note 1)(Note 3) (Note 2)(Note 3) (Note 1)(Note 4) (Note 1)(Note 4) (Note 2)(Note 4) (Note 2)(Note 4) (Note 2)(Note 4) Note: LE, DIR, and OE use ECL logic levels TTL Port Z Notes Detail Latched (Note 1)(Note 3) H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care Z = High Impedance Note 1: ECL input to TTL output mode. Note 2: TTL input to ECL output mode. Note 3: Retains data present before LE set HIGH. Note 4: Latch is transparent. www.fairchildsemi.com 2 100328 Absolute Maximum Ratings(Note 5) Storage Temperature (TSTG) VEE Pin Potential to Ground Pin VTTL Pin Potential to Ground Pin ECL Input Voltage (DC) ECL Output Current (DC Output HIGH) TTL Input Voltage (Note 6) TTL Input Current (Note 6) Voltage Applied to Output in HIGH State 3-STATE Output Current Applied to TTL Output in LOW State (Max) ESD (Note 7) twice the rated IOL (mA) −65°C to +150 °C −7.0V to +0.5V −0.5V to +6.0V VEE to +0.5V Recommended Operating Conditions Case Temperature (TC) Commercial Industrial ECL Supply Voltage (VEE) TTL Supply Voltage (VTTL) 0°C to +85°C Maximum Junction Temperature (TJ) +150°C −40°C to +85°C −5.7V to −4.2V +4.5V to +5.5V −50 mA −0.5V to +6.0V −30 mA to +5.0 mA −0.5V to +5.5V Note 5: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum rating. The “Recommended Operating Conditions” table will define the conditions for actual device operation. Note 6: Either voltage limit or current limit is sufficient to protect inputs. Note 7: ESD testing conforms to MIL-STD-883, Method 3015. ≥2000V Commercial Version TTL-to-ECL DC Electrical Characteristics (Note 8) VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = 0°C to +85°C, VTTL = +4.5V to +5.5V Symbol VOH VOL Parameter Output HIGH Voltage Output LOW Voltage Cutoff Voltage −2000 VOHC VOLC VIH VIL IIH IIL VFCD IEE Output HIGH Voltage Corner Point HIGH Output LOW Voltage Corner Point LOW Input HIGH Voltage Input LOW Voltage Input HIGH Current Breakdown Test Input LOW Current Input Clamp Diode Voltage VEE Supply Current −159 −169 −75 −75 mA −700 −1.2 2.0 0 −1950 mV Min −1025 −1830 Typ −955 −1705 Max −870 −1620 Units mV mV Conditions VIN = VIH(Max) or VIL(Min) Loading with 50Ω to − 2V OE or DIR LOW, VIN = VIH(Max) or VIL(Min), Loading with 50Ω to −2V −1035 −1610 5.0 0.8 70 1.0 mV mV V V µA mA µA V VIN = VIH(Min) or VIL(Max) Loading with 50Ω to −2V Over VTTL, VEE, TC Range Over VTTL, VEE, TC Range VIN = +2.7V VIN = +5.5V VIN = +0.5V IIN = −18 mA LE LOW, OE and DIR HIGH Inputs OPEN VEE = −4.2V to −4.8V VEE = −4.2V to −5.7V Note 8: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under “worst case” conditions. 3 www.fairchildsemi.com 100328 Commercial Version (Continued) ECL-to-TTL DC Electrical Characteristics (Note 9) VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = 0°C to +85°C, CL = 50 pF, VTTL = +4.5V to +5.5V Symbol VOH VOL VIH VIL IIH IIL IOZHT IOZLT IOS ITTL Parameter Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Input HIGH Current Input LOW Current 3-STATE Current Output HIGH 3-STATE Current Output LOW Output Short-Circuit Current VTTL Supply Current −700 −150 −60 74 49 67 0.50 70 −1165 −1830 Min 2.7 2.4 Typ 3.1 2.9 0.3 0.5 −870 −1475 350 Max Units V V mV mV µA µA µA µA mA mA mA mA Conditions IOH = −3 mA, VTTL = 4.75V IOH = −3 mA, VTTL = 4.50V IOL = 24 mA, VTTL = 4.50V Guaranteed HIGH Signal for All Inputs Guaranteed LOW Signal for All Inputs VIN = VIH (Max) VIN = VIL (Min) VOUT = +2.7V VOUT = +0.5V VOUT = 0.0V, VTTL = +5.5V TTL Outputs LOW TTL Outputs HIGH TTL Outputs in 3-STATE DIP TTL-to-ECL AC Electrical Characteristics (Note 9) VEE = −4.2V to −5.7V, VTTL = +4.5V to +5.5V, VCC = VCCA = GND TC = 0°C TC = 25°C Symbol Parameter Min Max Min Max tPLH tPHL tPLH tPHL tPZH tPHZ tPHZ tSET tHOLD tPW(H) tTLH tTHL OE to En (Cutoff to HIGH) OE to En (HIGH to Cutoff) DIR to En (HIGH to Cutoff) Tn to LE Tn to LE Pulse Width LE Transition Time 20% to 80%, 80% to 20% T N to E n (Transparent) LE to En 1.1 1.7 1.3 1.5 1.6 1.1 1.1 2.1 0.6 1.6 3.5 3.6 4.2 4.5 4.3 1.1 1.7 1.5 1.6 1.6 1.1 1.1 2.1 0.6 1.6 3.6 3.7 4.4 4.5 4.3 TC = 85°C Min 1.1 1.9 1.7 1.6 1.7 1.1 1.1 2.1 0.6 1.6 Max 3.8 3.9 4.8 4.6 4.5 ns ns ns ns ns ns ns ns ns Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Units Conditions Note 9: The specified limits represent the “worst” case value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under “worst case” conditions. www.fairchildsemi.com 4 100328 Commercial Version (Continued) DIP ECL-to-TTL AC Electrical Characteristics VEE = −4.2V to −5.7V, VTTL = +4.5V to +5.5V, VCC = VCCA = GND, CL = 50 pF TC = 0°C TC = 25°C Symbol Parameter Min Max Min Max tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ tPHZ tPLZ tSET tHOLD tPW(H) OE to Tn (Enable Time) OE to Tn (Disable Time) DIR to Tn (Disable Time) En to LE En to LE Pulse Width LE 3.4 3.8 3.2 3.0 2.7 2.8 1.1 2.1 4.1 8.45 9.2 8.95 7.7 8.2 7.45 3.7 4.0 3.3 3.4 2.8 3.1 1.1 2.1 4.1 8.95 9.2 8.95 8.7 8.7 7.95 4.0 4.3 3.5 4.1 3.1 4.0 1.1 2.6 4.1 9.7 9.95 9.2 9.95 8.95 9.2 ns ns ns ns ns ns Figures 3, 5 Figures 3, 5 Figures 3, 6 Figures 3, 6 Figures 3, 4 Figures 3, 7 En to Tn (Transparent) LE to Tn 3.1 7.2 3.1 7.2 3.3 7.7 ns Figures 3, 4 2.3 5.6 2.4 5.6 TC = 85°C Min 2.6 Max 5.9 ns Figures 3, 4 Units Conditions SOIC and PLCC TTL-to-ECL AC Electrical Characteristics VEE = −4.2V to −5.7V, VTTL = +4.5V to +5.5V Symbol tPLH tPHL tPLH tPHL tPZH tPHZ tPHZ tSET tHOLD tPW(H) tTLH tTHL tOSHL OE to En (Cutoff to HIGH) OE to En (HIGH to Cutoff) DIR to En (HIGH to Cutoff) Tn to LE Tn to LE Pulse Width LE Transition Time 20% to 80%, 80% to 20% Maximum Skew Common Edge Output-to-Output Variation Data to Output Path tOSLH Maximum Skew Common Edge Output-to-Output Variation Data to Output Path tOST Maximum Skew Opposite Edge Output-to-Output Variation Data to Output Path tPS Maximum Skew Pin (Signal) Transition Variation Data to Output Path Note 10: Output-to-Output Skew is defined as the absolute value of the difference between the actual propagation delay for any outputs within the same packaged device. The specifications apply to any outputs switching in the same direction either HIGH-to-LOW (tOSHL), or LOW-to-HIGH (tOSLH), or in opposite directions both HL and LH (tOST). Parameters tOST and tps guaranteed by design. Parameter Tn to En (Transparent) LE to En TC = 0°C Min 1.1 1.7 1.3 1.5 1.6 1.0 1.0 2.0 0.6 1.6 Max 3.3 3.4 4.0 4.3 4.1 TC = 25°C Min 1.1 1.7 1.5 1.6 1.6 1.0 1.0 2.0 0.6 1.6 Max 3.4 3.5 4.2 4.3 4.1 TC = 85°C Min 1.1 1.9 1.7 1.6 1.7 1.0 1.0 2.0 0.6 1.6 Max 3.6 3.7 4.6 4.4 4.3 Units ns ns ns ns ns ns ns ns ns Conditions Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 PLCC Only 200 200 200 ps (Note 10) PLCC Only 200 200 200 ps (Note 10) PLCC Only 650 650 650 ps (Note 10) PLCC Only 650 650 650 ps (Note 10) 5 www.fairchildsemi.com 100328 Commercial Version (Continued) SOIC and PLCC ECL-to-TTL AC Electrical Characteristics VEE = −4.2V to −5.7V, VTTL = +4.5V to +5.5V, CL = 50 pF TC = 0°C Symbol Parameter Min Max tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ tPHZ tPLZ tSET tHOLD tPW(H) tOSHL OE to Tn (Enable Time) OE to Tn (Disable Time) DIR to Tn (Disable Time) En to LE En to LE Pulse Width LE Maximum Skew Common Edge Output-to-Output Variation Data to Output Path tOSLH Maximum Skew Common Edge Output-to-Output Variation Data to Output Path tOST Maximum Skew Opposite Edge Output-to-Output Variation Data to Output Path tPS Maximum Skew Pin (Signal) Transition Variation Data to Output Path Note 11: Output-to-Output Skew is defined as the absolute value of the difference between the actual propagation delay for any outputs within the same packaged device. The specifications apply to any outputs switching in the same direction either HIGH-to-LOW (tOSHL), or LOW-to-HIGH (tOSLH), or in opposite directions both HL and LH (tOST). Parameters tOST and tPS guaranteed by design. TC = 25°C Min 2.4 3.1 3.7 4.0 3.3 3.4 2.8 3.1 1.0 2.0 4.0 Max 5.4 7.0 8.75 9.0 8.75 8.5 8.5 7.75 TC = 85°C Min 2.6 3.3 4.0 4.3 3.5 4.1 3.1 4.0 1.0 2.5 4.0 Max 5.7 7.5 9.5 9.75 9.0 9.75 8.75 9.0 Units ns ns Conditions Figures 3, 4 Figures 3, 4 E n to T n (Transparent) LE to Tn 2.3 3.1 3.4 3.8 3.2 3.0 2.7 2.8 1.0 2.0 4.0 5.4 7.0 8.25 9.0 8.75 7.5 8.0 7.25 ns ns ns ns ns ns Figures 3, 5 Figures 3, 5 Figures 3, 6 Figures 3, 4 Figures 3, 4 Figures 3, 4 PLCC Only (Note 11) PLCC Only 600 600 600 ps 850 850 850 ps (Note 11) PLCC Only 1350 1350 1350 ps (Note 11) PLCC Only 950 950 950 ps (Note 11) www.fairchildsemi.com 6 100328 Industrial Version PLCC TTL-to-ECL DC Electrical Characteristics (Note 12) VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −40°C to +85°C, VTTL = +4.5V to +5.5V TC = −40°C TC = 0°C to +85°C Symbol Parameter Units Min Max Min Max VOH VOL Output HIGH Voltage Output LOW Voltage Cutoff Voltage −1900 VOHC VOLC VIH VIL IIH IIL VFCD IEE Output HIGH Voltage Corner Point HIGH Output LOW Voltage Corner Point LOW Input HIGH Voltage Input LOW Voltage Input HIGH Current Breakdown Test Input LOW Current Input Clamp Diode Voltage VEE Supply Current −159 −169 −70 −70 −159 −169 −75 −75 mA −700 −1.2 2.0 0 −1950 mV −1085 −1830 −870 −1575 −1025 −1830 −870 −1620 mV mV Conditions VIN = VIH(Max) or VIL(Min) Loading with 50Ω to −2V OE or DIR LOW, VIN= VIH(Max) or VIL(Min), Loading with 50Ω to −2V −1095 −1565 5.0 0.8 70 1.0 −700 −1.2 2.0 0 −1035 −1610 5.0 0.8 70 1.0 mV mV V V µA mA µA V VIN = VIH(Min) or VIL(Max) Loading with 50Ω to −2V Over VTTL, VEE, TC Range Over VTTL, VEE, TC Range VIN = +2.7V VIN = +5.5V VIN = +0.5V IIN = −18 mA LE LOW, OE and DIR HIGH Inputs OPEN VEE = −4.2V to −4.8V VEE = −4.2V to −5.7V PLCC ECL-to-TTL DC Electrical Characteristics (Note 12) VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −40°C to +85°C, CL = 50 pF, VTTL = +4.5V to +5.5V TC = −40°C TC = 0°C to +85°C Symbol Parameter Units Min Max Min Max VOH VOL VIH VIL IIH IIH IOZHT IOZLT IOS ITTL Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Input HIGH Current Input LOW Current 3-STATE Current Output HIGH 3-STATE Current Output LOW Output Short-Circuit Current VTTL Supply Current −700 −150 −60 74 49 67 0.50 70 −700 −150 −60 74 49 67 mA −1170 −1830 2.7 2.4 0.5 −870 −1480 425 0.50 70 −1165 −1830 2.7 2.4 0.5 −870 −1475 350 V V mV mV µA µA µA µA mA Conditions IOH = −3 mA, VTTL = 4.75V IOH = −3 mA, VTTL = 4.50V IOL = 24 mA, VTTL = 4.50V Guaranteed HIGH Signal for All Inputs Guaranteed LOW Signal for All Inputs VIN = VIH (Max) VIN = VIH (Min) VOUT = +2.7V VOUT = +0.5V VOUT = 0.0V, VTTL = +5.5V TTL Outputs LOW TTL Outputs HIGH TTL Outputs in 3-STATE Note 12: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under “worst case” conditions. 7 www.fairchildsemi.com 100328 Industrial Version (Continued) PLCC TTL-to-ECL AC Electrical Characteristics VEE = −4.2V to −5.7V, VTTL = +4.5V to +5.5V Symbol tPLH tPHL tPLH tPHL tPZH tPHZ tPHZ tSET tHOLD tPW(H) tTLH tTHL OE to En (Cutoff to HIGH) OE to En (HIGH to Cutoff) DIR to En (HIGH to Cutoff) Tn to LE Tn to LE Pulse Width LE Transition Time 20% to 80%, 80% to 20% T n to E n (Transparent) LE to En Parameter TC = −40°C Min 1.0 1.7 1.2 1.5 1.6 2.5 1.0 2.5 0.4 2.3 Max 3.3 3.4 4.0 4.5 4.1 TC = 25°C Min 1.1 1.7 1.5 1.6 1.6 1.0 1.0 2.0 0.6 1.6 Max 3.4 3.5 4.2 4.3 4.1 TC = 85°C Min 1.1 1.9 1.7 1.6 1.7 1.0 1.0 2.0 0.6 1.6 Max 3.6 3.7 4.6 4.4 4.3 ns Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Figures 1, 2 Units Conditions ns ns ns ns ns ns ns ns PLCC ECL-to-TTL AC Electrical Characteristics VEE = −4.2V to −5.7V, VTTL = +4.5V to +5.5V, CL = 50 pF Symbol tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ tPHZ tPLZ tSET tHOLD tPW(H) OE to Tn (Enable Time) OE to Tn (Disable Time) DIR to Tn (Disable Time) En to LE En to LE Pulse Width LE E n to T n (Transparent) LE to Tn Parameter T C = 0 °C Min 2.3 3.1 3.4 3.7 3.2 3.0 2.7 2.8 2.5 2.3 4.0 Max 5.4 7.4 8.3 9.0 9.0 7.5 8.0 7.3 T C = 2 5 °C Min 2.4 3.1 3.7 4.0 3.3 3.4 2.8 3.1 1.0 2.0 4.0 Max 5.4 7.0 8.75 9.0 8.75 8.5 8.5 7.75 T C = 8 5 °C Min 2.6 3.3 4.0 4.3 3.5 4.1 3.1 4.0 1.0 2.5 4.0 Max 5.7 7.5 9.5 9.75 9.0 9.75 8.75 9.0 Units ns ns ns ns ns ns ns ns Conditions Figures 3, 4 Figures 3, 4 Figures 3, 5 Figures 3, 5 Figures 3, 5 Figures 3, 4 Figures 3, 4 Figures 3, 4 www.fairchildsemi.com 8 100328 Test Circuitry (TTL-to-ECL) Note: • • • • Rt = 50Ω termination. When an input or output is being monitored by a scope, Rt is supplied by the scope's 50Ω resistance. When an input or output is not being monitored, an external 50Ω resistance must be applied to serve as Rt. TTL and ECL force signals are brought to the DUT via 50Ω coax lines. VTTL is decoupled to ground with 0.1 µF to ground, VEE is decoupled to ground with 0.01 µF and VCC is connected to ground. For ECL input pins, the equivalent force/sense circuitry is optional. FIGURE 1. TTL-to-ECL AC Test Circuit Switching Waveforms (TTL-to-ECL) FIGURE 2. TTL to ECL Transition—Propagation Delay and Transition Times 9 www.fairchildsemi.com 100328 Test Circuitry (ECL-to-TTL) Note: • • • • Rt = 50Ω termination. When an input or output is being monitored by a scope, Rt is supplied by the scope's 50Ω resistance. When an input or output is not being monitored, an external 50Ω resistance must be applied to serve as Rt. The TTL 3-State pull up switch is connected to +7V only for ZL and LZ tests. TTL and ECL force signals are brought to the DUT via 50Ω coax lines. VTTL is decoupled to ground with 0.1 µF, VEE is decoupled to ground with 0.01 µF and VCC is connected to ground. FIGURE 3. ECL-to-TTL AC Test Circuit Switching Waveforms (ECL-to-TTL) Note: DIR is LOW, and OE is HIGH FIGURE 4. ECL-to-TTL Transition—Propagation Delay and Transition Times www.fairchildsemi.com 10 100328 Switching Waveforms (ECL-to-TTL) (Continued) Note: DIR is LOW, LE is HIGH FIGURE 5. ECL-to-TTL Transition, OE to TTL Output, Enable and Disable Times Note: OE is HIGH, LE is HIGH FIGURE 6. ECL-to-TTL Transition, DIR to TTL Output, Disable Time 11 www.fairchildsemi.com 100328 Applications FIGURE 7. Applications Diagram—MOS/TTL SRAM Interface Using 100328 ECL–TTL Latched Translator www.fairchildsemi.com 12 100328 Physical Dimensions inches (millimeters) unless otherwise noted 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M24B 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide Package Number N24E 13 www.fairchildsemi.com 100328 Low Power Octal ECL/TTL Bi-Directional Translator with Latch Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square Package Number V28A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 14 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com