74ACTQ827SC

74ACTQ827 Quiet Series 10-Bit Buffer/Line Driver with 3-STATE Outputs March 1990 Revised September 2000 74ACTQ827 Quiet Series 10-Bit Buffer/Line Driver with 3-STATE Outputs General Description The ACTQ827 10-bit bus buffer provides high performance bus interface buffering for wide data/address paths or buses carrying parity. The 10-bit buffers have NOR output enables for maximum control flexibility. The ACTQ827 utilizes Fairchild Quiet Series technology to guarantee quiet output switching and improved dynamic threshold performance. FACT Quiet Series features GTO output control and undershoot corrector in addition to a split ground bus for superior performance. Features s Guaranteed simultaneous switching noise level and dynamic threshold performance s Guaranteed pin-to-pin skew AC performance s Inputs and outputs on opposite sides of package allow easy interface with microprocessors s Improved latch-up immunity s Outputs source/sink 24 mA s TTL compatible inputs Ordering Code: Order Number 74ACTQ827SC 74ACTQ827SPC Package Number M24B N24C Package Description 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code. Logic Symbols Connection Diagram IEEE/IEC Pin Descriptions Pin Names OE1, OE2 D0–D9 O0–O9 Description Output Enable Data Inputs Data Outputs FACT, Quiet Series, FACT Quiet Series and GTO are trademarks of Fairchild Semiconductor Corporation. © 2000 Fairchild Semiconductor Corporation DS010687 www.fairchildsemi.com 74ACTQ827 Functional Description The ACTQ827 line driver is designed to be employed as memory address driver, clock driver and bus-oriented transmitter/receiver. The devices have 3-STATE outputs controlled by the Output Enable (OE) pins. When the OE is LOW, the device is transparent. When OE is HIGH, the device is in 3-STATE mode. Function Table Inputs OE L L H H = H IGH Voltage Level L = LOW Voltage Level Z = HIGH Impedance X = Immaterial Outputs Function On H L Z Transparent Transparent High Z Dn H L X Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.fairchildsemi.com 2 74ACTQ827 Absolute Maximum Ratings(Note 1) Supply Voltage (VCC) DC Input Diode Current (IIK) VI = −0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = −0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) DC Latch-Up Source or Sink Current Junction Temperature (TJ) PDIP 140°C −0.5V to +7.0V −20 mA +20 mA −0.5V to VCC + 0.5V −20 mA +20 mA −0.5V to VCC + 0.5V ± 50 mA ± 50 mA −65°C to +150°C ± 300 mA Recommended Operating Conditions Supply Voltage (VCC) Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) Minimum Input Edge Rate ∆V/∆t VIN from 0.8V to 2.0V VCC @ 4.5V, 5.5V 4.5V to 5.5V 0V to VCC 0V to VCC −40°C to +85°C 125 mV/ns Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside databook specifications. DC Electrical Characteristic Symbol VIH VIL VOH Parameter Minimum HIGH Level Input Voltage Maximum LOW Level Input Voltage Minimum HIGH Level Output Voltage VCC (V) 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 VOL Maximum LOW Level Output Voltage 4.5 5.5 4.5 5.5 IIN IOZ ICCT IOLD IOHD ICC VOLP VOLV VIHD VILD Maximum Input Leakage Current Maximum 3-STATE Current Maximum ICC/Input Minimum Dynamic Output Current (Note 3) Maximum Quiescent Supply Current Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL Minimum HIGH Level Dynamic Input Voltage Maximum LOW Level Dynamic Input Voltage 5.5 5.5 5.5 5.5 5.5 5.5 5.0 5.0 5.0 5.0 1.1 −0.6 1.9 1.2 8.0 1.6V −1.3 2.0 0.8 0.6 0.001 0.001 TA = +25°C Typ 1.5 1.5 1.5 1.5 4.49 5.49 2.0 2.0 0.8 0.8 4.4 5.4 3.86 4.86 0.1 0.1 0.36 0.36 ±0.1 ±0.5 TA = −40°C to +85°C Guaranteed Limits 2.0 2.0 0.8 0.8 4.4 5.4 3.76 4.76 0.1 0.1 0.44 0.44 ±1.0 ±5.0 1.5 75 −75 80.0 µA µA mA mA mA µA V V V V V Units V V V Conditions VOUT = 0.1V or VCC − 0.1V VOUT = 0.1V or VCC − 0.1V IOUT = −50 µA VIN = VIL or VIH V IOH = −24 mA IOH = −24 mA (Note 2) IOUT = 50 µA VIN = VIL or VIH V IOL = 24 mA IOL = 24 mA (Note 2) VI = VCC, GND VI = VIL, VIH VO = VCC, GND VI = VCC − 2.1V VOLD = 1.65V Max VOHD = 3.85V Min VIN = VCC or GND Figures 1, 2 (Note 4)(Note 5) Figures 1, 2 (Note 4)(Note 5) (Note 4)(Note 6) (Note 4)(Note 6) 3 www.fairchildsemi.com 74ACTQ827 DC Electrical Characteristic Note 4: DIP package. (Continued) Note 2: All outputs loaded; thresholds on input associated with output under test. Note 3: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND. Note 6: Max number of data inputs (n−1) inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (VILD), 0V to threshold. (VIHD), f = 1 MHz. AC Electrical Characteristics VCC Symbol tPHL tPLH tPZL tPZH tPHZ tPLZ tOSHL tOSLH Parameter Propagation Delay Data to Output Output Enable Time Output Disable Time Output to Output Skew Data to Output (Note 8) (V) (Note 7) 5.0 5.0 5.0 5.0 Min 2.5 3.0 1.0 TA = +25°C CL = 50 pF Typ 5.6 7.1 5.8 0.5 Max 8.0 10.0 8.0 1.5 TA = −40°C to +85°C CL = 50 pF Min 2.5 3.0 1.0 Max 9.0 11.0 8.5 1.5 ns ns ns ns Units Note 7: Voltage Range 5.0 is 5.0V ± 0.5V. Note 8: Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs within the same packaged device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. Not tested. Capacitance Symbol CIN CPD Parameter Input Capacitance Power Dissipation Capacitance Typ 4.5 82 Units pF pF VCC = OPEN VCC = 5.0V Conditions www.fairchildsemi.com 4 74ACTQ827 FACT Noise Characteristics The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT. Equipment: Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture Tektronics Model 7854 Oscilloscope Procedure: 1. Verify Test Fixture Loading: Standard Load 50 pF, 500Ω. 2. Deskew the HFS generator so that no two channels have greater than 150 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs switch simultaneously. 3. Terminate all inputs and outputs to ensure proper loading of the outputs and that the input levels are at the correct voltage. 4. Set the HFS generator to toggle all but one output at a frequency of 1 MHz. Greater frequencies will increase DUT heating and effect the results of the measurement. 5. Set the word generator input levels at 0V LOW and 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope. VOLP/VOLV and VOHP/VOHV: • Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the ground pin. Monitor the output voltages using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. • Measure VOLP and VOLV on the quiet output during the worst case transition for active and enable. Measure VOHP and VOHV on the quiet output during the worst case active and enable transition. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. VILD and VIHD: • Monitor one of the switching outputs using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. • First increase the input LOW voltage level, VIL, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input LOW voltage level at which oscillation occurs is defined as VILD. • Next decrease the input HIGH voltage level, VIH, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input HIGH voltage level at which oscillation occurs is defined as VIHD. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. Note 9: VOHV and VOLP are measured with respect to ground reference. Note 10: Input pulses have the following characteristics: f = 1 MHz, tr = 3 ns, tf = 3 ns, skew < 150 ps. FIGURE 1. Quiet Output Noise Voltage Waveforms FIGURE 2. Simultaneous Switching Test Circuit 5 www.fairchildsemi.com 74ACTQ827 Physical Dimensions inches (millimeters) unless otherwise noted 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M24B www.fairchildsemi.com 6 74ACTQ827 Quiet Series 10-Bit Buffer/Line Driver with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N24C Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 7 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com www.fairchildsemi.com