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74ACTQ841

74ACTQ841

  • 厂商:

    FAIRCHILD(仙童半导体)

  • 封装:

  • 描述:

    74ACTQ841 - Quiet Series 10-Bit Transparent Latch with 3-STATE Outputs - Fairchild Semiconductor

  • 数据手册
  • 价格&库存
74ACTQ841 数据手册
74ACTQ841 Quiet Series 10-Bit Transparent Latch with 3-STATE Outputs March 1990 Revised September 2000 74ACTQ841 Quiet Series 10-Bit Transparent Latch with 3-STATE Outputs General Description The ACTQ841 bus interface latch is designed to eliminate the extra packages required to buffer existing latches and provide extra data width for wider address/data paths or buses carrying parity. The 841 is a 10-bit transparent latch, a 10-bit version of the 373. The ACTQ841 utilizes Fairchild Quiet Series technology to guarantee quiet output switching and improved dynamic threshold performance. FACT Quiet Series features GTO output control and undershoot corrector in addition to a split ground bus for superior performance. Features s Guaranteed simultaneous switching noise level and dynamic threshold performance s Guaranteed pin-to-pin skew AC performance s Inputs and outputs on opposite sides of package allow easy interface with microprocessors s Improved latch-up immunity s Outputs source/sink 24 mA s Has TTL-compatible inputs Ordering Code: Order Number 74ACTQ841SC 74ACTQ841SPC Package Number M24B N24C Package Description 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code. Logic Symbols Connection Diagram Pin Descriptions Pin Names D0–D9 O0–O9 OE LE Description Data Inputs 3-STATE Outputs Output Enable Latch Enable FACT, Quiet Series, FACT Quiet Series and GTO are trademarks of Fairchild Semiconductor Corporation. © 2000 Fairchild Semiconductor Corporation DS010688 www.fairchildsemi.com 74ACTQ841 Functional Description The ACTQ841 consists of ten D-type latches with 3-STATE outputs. The flip-flops appear transparent to the data when Latch Enable (LE) is HIGH. This allows asynchronous operation, as the output transition follows the data in transition. On the LE HIGH-to-LOW transition, the data that meets the setup and hold time is latched. Data appears on the bus when the Output Enable (OE) is LOW. When OE is HIGH the bus output is in the high impedance state. Function Table Inputs OE X H H H L L L LE X H H L H H L D X L H X L H X Internal Output Function Q X L H NC L H NC O Z Z Z Z L H NC High Z High Z High Z Latched Transparent Transparent Latched H = H IGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance NC = No Change Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.fairchildsemi.com 2 74ACTQ841 Absolute Maximum Ratings(Note 1) Supply Voltage (VCC) DC Input Diode Current (IIK) VI = − 0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = − 0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) DC Latch-Up Source or Sink Current Junction Temperature (TJ) PDIP 140°C − 0.5V to + 7.0V − 20 mA + 20 mA − 0.5V to VCC + 0.5V − 20 mA + 20 mA − 0.5V to VCC + 0.5V ± 50 mA ± 50 mA − 65°C to + 150°C ± 300 mA Recommended Operating Conditions Supply Voltage (VCC) Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) Minimum Input Edge Rate ∆V/∆t VIN from 0.8V to 2.0V VCC @ 4.5V, 5.5V 4.5V to 5.5V 0V to VCC 0V to VCC − 40°C to + 85°C 125 mV/ns Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside databook specifications. DC Electrical Characteristics Symbol VIH VIL VOH Parameter Minimum HIGH Level Input Voltage Maximum LOW Level Input Voltage Minimum HIGH Level Output Voltage VCC (V) 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 VOL Maximum LOW Level Output Voltage 4.5 5.5 4.5 5.5 IIN IOZ ICCT IOLD IOHD ICC VOLP VOLV VIHD Maximum Input Leakage Current Maximum 3-STATE Leakage Current Maximum ICC/Input Minimum Dynamic Output Current (Note 3) Maximum Quiescent Supply Current Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL Minimum HIGH Level Dynamic Input Voltage 5.5 5.5 5.5 5.5 5.5 5.5 5.0 5.0 5.0 1.1 −0.6 1.9 8.0 1.5 −1.2 2.2 0.6 0.001 0.001 TA = +25°C Typ 1.5 1.5 1.5 1.5 4.49 5.49 2.0 2.0 0.8 0.8 4.4 5.4 3.86 4.86 0.1 0.1 0.36 0.36 ± 0.1 ± 0.5 TA = − 40°C to +85°C Guaranteed Limits 2.0 2.0 0.8 0.8 4.4 5.4 3.76 4.76 0.1 0.1 0.44 0.44 ± 1.0 ± 5.0 1.5 75 −75 80.0 µA µA mA mA mA µA V V V V Units V V V Conditions VOUT = 0.1V or VCC − 0.1V VOUT = 0.1V or VCC − 0.1V IOUT = − 50 µA VIN = VIL or VIH V IOH = − 24 mA IOH = − 24 mA (Note 2) IOUT = 50 µA VIN = VIL or VIH V IOL = − 24 mA IOL = − 24 mA (Note 2) VI = VCC, GND VI = VIL, VIH VO = VCC, GND VI = VCC − 2.1V VOLD = 1.65V Max VOHD = 3.85V Min VIN = VCC or GND Figures 1, 2 (Note 4)(Note 5) Figures 1, 2 (Note 4)(Note 5) (Note 4)(Note 6) 3 www.fairchildsemi.com 74ACTQ841 DC Electrical Characteristics Symbol VILD Parameter Maximum LOW Level Dynamic Input Voltage VCC (V) 5.0 Typ 1.2 (Continued) TA = +25°C TA = − 40°C to +85°C Guaranteed Limits 0.8 V (Note 4)(Note 6) Units Conditions Note 2: All outputs loaded; thresholds on input associated with output under test. Note 3: Maximum test duration 2.0 ms, one output loaded at a time. Note 4: PDIP package. Note 5: Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND. Note 6: Max number of data inputs (n) switching. (n − 1) inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz. AC Electrical Characteristics VCC Symbol tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ tOSLH tOSHL Parameter Propagation Delay Dn to On Propagation Delay LE to On Output Enable Time OE to On Output Disable Time OE to On Output to Output Skew Dn to On (Note 8) (V) (Note 7) 5.0 5.0 5.0 5.0 5.0 Min 2.5 2.5 2.5 1.0 TA = +25°C CL = 50 pF Typ 7.0 7.0 8.5 6.0 0.5 Max 9.5 9.5 11.0 9.0 1.0 TA = −40°C to +85°C CL = 50 pF Min 2.0 2.0 2.0 1.0 Max 10.0 10.0 12.0 9.5 1.0 ns ns ns ns ns Units Note 7: Voltage Range 5.0 is 5.0V ± 0.5V. Note 8: Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs within the same packaged device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. Not tested. AC Operating Requirements VCC Symbol tS tH tW Parameter Setup Time, HIGH or LOW Dn to LE Hold Time, HIGH or LOW Dn to LE LE Pulse Width, HIGH Note 9: Voltage Range 5.0 is 5.0V ± 0.5V. T A = + 25 CL = 50 pF °C Typ 3.0 1.5 4.0 TA = − 40°C to + 85°C CL = 50 pF Guaranteed Minimum 3.0 1.5 4.0 ns ns ns Units (V) (Note 9) 5.0 5.0 5.0 Capacitance Symbol CIN CPD Parameter Input Capacitance Power Dissipation Capacitance Typ 4.5 85.0 Units pF pF VCC = OPEN VCC = 5.0V Conditions www.fairchildsemi.com 4 74ACTQ841 FACT Noise Characteristics The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT. Equipment: Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture Tektronics Model 7854 Oscilloscope Procedure: 1. Verify Test Fixture Loading: Standard Load 50 pF, 500Ω. 2. Deskew the HFS generator so that no two channels have greater than 150 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs switch simultaneously. 3. Terminate all inputs and outputs to ensure proper loading of the outputs and that the input levels are at the correct voltage. 4. Set the HFS generator to toggle all but one output at a frequency of 1 MHz. Greater frequencies will increase DUT heating and effect the results of the measurement. 5. Set the HFS generator input levels at 0V LOW and 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope. VOLP/VOLV and VOHP/VOHV: • Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the ground pin. Monitor the output voltages using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. • Measure VOLP and VOLV on the quiet output during the worst case transition for active and enable. Measure VOHP and VOHV on the quiet output during the worst case active and enable transition. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. VILD and VIHD: • Monitor one of the switching outputs using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. • First increase the input LOW voltage level, VIL, until the output begins to oscillate or steps out of a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input LOW voltage level at which oscillation occurs is defined as VILD. • Next decrease the input HIGH voltage level, VIH, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input HIGH voltage level at which oscillation occurs is defined as VIHD. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. Note A: VOHV and VOLP are measured with respect to ground reference. Note B: Input pulses have the following characteristics: f = 1 MHz, tr = 3 ns, tf = 3 ns, skew < 150 ps. FIGURE 1. Quiet Output Noise Voltage Waveforms FIGURE 2. Simultaneous Switching Test Circuit 5 www.fairchildsemi.com 74ACTQ841 Physical Dimensions inches (millimeters) unless otherwise noted 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M24B www.fairchildsemi.com 6 74ACTQ841 Quiet Series 10-Bit Transparent Latch with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N24C Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 7 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com www.fairchildsemi.com
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