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74ALVC86

74ALVC86

  • 厂商:

    FAIRCHILD(仙童半导体)

  • 封装:

  • 描述:

    74ALVC86 - Low Voltage Quad 2-Input Exclusive-OR Gate with 3.6V Tolerant Inputs and Outputs - Fairch...

  • 数据手册
  • 价格&库存
74ALVC86 数据手册
74ALVC86 Low Voltage Quad 2-Input Exclusive-OR Gate with 3.6V Tolerant Inputs and Outputs December 2001 Revised March 2005 74ALVC86 Low Voltage Quad 2-Input Exclusive-OR Gate with 3.6V Tolerant Inputs and Outputs General Description The ALVC86 contains four 2-input exclusive OR gates. This product is designed for low voltage (1.65V to 3.6V) VCC applications with I/O compatibility up to 3.6V The 74ALVC86 is fabricated with an advanced CMOS technology to achieve high-speed operation while maintaining low CMOS power dissipation. Features s 1.65V to 3.6V VCC supply operation s 3.6V tolerant inputs and outputs s tPD 3.5 ns max for 3.0V to 3.6V VCC 4.4 ns max for 2.3V to 2.7V VCC 7.8 ns max for 1.65V to 1.95V VCC s Power-off high impedance inputs and outputs s Uses patented Quiet Series¥ noise/EMI reduction circuitry s Latchup conforms to JEDEC JED78 s ESD performance: Human body model ! 2000V Machine model ! 250V Ordering Code: Order Number 74ALVC86M 74ALVC86MTC 74ALVC86MTCX_NL (Note 1) Package Number M14A MTC14 MTC14 Package Description 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Pb-Free 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Note 1: “_NL” indicates Pb-Free package (per JEDEC J-STD-020B). Device available in Tape and Reel only. Logic Symbol IEEE/IEC Connection Diagram Pin Descriptions Pin Names An , Bn On Description Inputs Outputs Quiet Series¥ is a trademark of Fairchild Semiconductor Corporation © 2005 Fairchild Semiconductor Corporation DS500718 www.fairchildsemi.com 74ALVC86 Absolute Maximum Ratings(Note 2) Supply Voltage (VCC) DC Input Voltage (VI) Output Voltage (VO) (Note 3) DC Input Diode Current (IIK) VI  0V DC Output Diode Current (IOK) VO  0V DC Output Source/Sink Current (IOH/IOL) DC VCC or GND Current per Supply Pin (I CC or GND) Storage Temperature Range (TSTG) 0.5V to 4.6V 0.5V to 4.6V 0.5V to VCC 0.5V 50 mA 50 mA r50 mA r100 mA 65qC to 150qC Recommended Operating Conditions (Note 4) Power Supply Operating Input Voltage (VI) Output Voltage (VO) Free Air Operating Temperature (TA) Minimum Input Edge Rate ('t/'V) VIN 0.8V to 2.0V, VCC 3.0V 10 ns/V Note 2: The Absolute Maximum Ratings are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the Absolute Maximum Ratings. The “Recommended Operating Conditions” table will define the conditions for actual device operation. Note 3: IO Absolute Maximum Rating must be observed. Note 4: Floating or unused inputs must be held HIGH or LOW. 1.65V to 3.6V 0V to VCC 0V to VCC 40qC to 85qC DC Electrical Characteristics Symbol VIH Parameter HIGH Level Input Voltage Conditions VCC (V) 1.65 -1.95 2.3 - 2.7 2.7 - 3.6 VIL LOW Level Input Voltage 1.65 -1.95 2.3 - 2.7 2.7 - 3.6 VOH HIGH Level Output Voltage IOH IOH IOH IOH Min 0.65 x VCC 1.7 2.0 0.35 x VCC 0.7 0.8 VCC - 0.2 1.2 2 1.7 2.2 2.4 2 0.2 0.45 0.4 0.7 0.4 0.55 V V V V Max Units 100 PA 4 mA 6 mA 12 mA 1.65 - 3.6 1.65 2.3 2.3 2.7 3.0 IOH VOL LOW Level Output Voltage IOL IOL IOL IOL IOL II IOZ ICC Input Leakage Current 3-STATE Output Leakage Quiescent Supply Current Increase in ICC per Input 24 mA 100 PA 4 mA 6 mA 12mA 24 mA 3.0 1.65 - 3.6 1.65 2.3 2.3 2.7 3 3.6 3.6 0 3.6 3 -3.6 0 d VI d 3.6V 0 d VO d 3.6V VI VIH VCC or GND, IO VCC  0.6V r5.0 r10 40 750 PA PA PA PA 'ICC www.fairchildsemi.com 2 74ALVC86 AC Electrical Characteristics TA Symbol Parameter V CC Min tPHL, tPLH Propagation Delay Bus to Bus 1.1 CL 3.3V r 0.3V Max 3.5 50 pF V CC Min 1.3 2.7V Max 4.4 V CC Min 0.8 40qC to 85qC, RL 500: CL 2.5V r 0.2V Max 3.9 30 pF V CC Min 1.0 1.8V r 0.15V Max 7.8 ns Units Capacitance Symbol CIN COUT CPD Input Capacitance Output Capacitance Power Dissipation Capacitance Parameter VI VI Outputs Enabled f 0V or VCC 0V or VCC 10 MHz, CL 50 pF Conditions TA VCC 3.3 3.3 3.3 2.5 25qC Typical 6 7 20 20 Units pF pF pF AC Loading and Waveforms TABLE 1. Values for Figure 1 TEST tPLH,tPHL SWITCH Open FIGURE 1. AC Test Circuit TABLE 2. Variable Matrix (Input Characteristics: f 1MHz; tr tf 2ns; Z0 Symbol Vmi Vmo VCC 3.3V r 0.3V 1.5V 1.5V 2.7V 1.5V 1.5V 2.5V r 0.2V VCC /2 VCC /2 1.8V r 0.15V VCC/2 VCC/2 50: FIGURE 2. Waveform for Inverting and Non-inverting Functions 3 www.fairchildsemi.com 74ALVC86 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow Package Number M14A www.fairchildsemi.com 4 74ALVC86 Low Voltage Quad 2-Input Exclusive-OR Gate with 3.6V Tolerant Inputs and Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Package Number MTC14 Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 5 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com www.fairchildsemi.com
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