74LVQ86

74LVQ86 Low Voltage Quad 2-Input Exclusive-OR Gate February 1992 Revised June 2003 74LVQ86 Low Voltage Quad 2-Input Exclusive-OR Gate General Description The LVQ86 contains four 2-input exclusive-OR gates. Features s Ideal for low power/low noise 3.3V applications s Guaranteed simultaneous switching noise level and dynamic threshold performance s Guaranteed pin-to-pin skew AC performance s Guaranteed incident wave switching into 75Ω Ordering Code: Order Number 74LVQ86SC 74LVQ86SJ Package Number M14A M14D Package Description 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code. Logic Symbol IEEE/IEC Connection Diagram Pin Descriptions Pin Names A0–A3 B0–B3 O0–O3 Description Inputs Inputs Outputs © 2003 Fairchild Semiconductor Corporation DS011348 www.fairchildsemi.com 74LVQ86 Absolute Maximum Ratings(Note 1) Supply Voltage (VCC) DC Input Diode Current (IIK) VI = −0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = −0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current (ICC or IGND ) Storage Temperature (TSTG) DC Latch-Up Source or Sink Current −0.5V to +7.0V −20 mA +20 mA −0.5V to VCC + 0.5V −20 mA +20 mA −0.5V to VCC + 0.5V ±50 mA ±200 mA −65°C to +150°C ±100 mA Recommended Operating Conditions (Note 2) Supply Voltage (VCC) LVQ Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) 74LVQ Minimum Input Edge Rate (∆V/∆t) VIN from 0.8V to 2.0V VCC @ 3.0V 125 mV/ns Note 1: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum ratings. The “Recommended Operating Conditions” table will define the conditions for actual device operation. Note 2: Unused inputs must be held HIGH or LOW. They may not float. 2.0V to 3.6V 0V to VCC 0V to VCC −40°C to +85°C DC Electrical Characteristics Symbol VIH VIL VOH Parameter Minimum High Level Input Voltage Maximum Low Level Input Voltage Minimum High Level Output Voltage VOL Maximum Low Level Output Voltage IIN IOLD IOHD ICC VOLP VOLV VIHD VILD Maximum Input Leakage Current Minimum Dynamic (Note 4) Output Current Maximum Quiescent Supply Current Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL Maximum High Level Dynamic Input Voltage Maximum Low Level Dynamic Input Voltage 3.0 3.0 3.0 3.0 3.6 3.6 3.6 3.6 3.3 3.3 3.3 3.3 0.5 −0.5 1.8 1.8 2.0 0.8 −0.8 2.0 0.8 0.002 2.99 2.9 2.58 0.1 0.36 ±0.1 2.9 2.48 0.1 0.44 ±1.0 36 −25 20.0 µA mA mA µA V V V V V V V 3.0 1.5 0.8 0.8 V VCC (V) 3.0 T A = 2 5 °C Typ 1.5 2.0 TA = −40°C to +85°C Guaranteed Limits 2.0 V V OUT = 0.1V or VCC − 0.1V V OUT = 0.1V or VCC − 0.1V IOUT = −50 µA V IN = VIL or VIH (Note 3) IOH = −12 mA IOUT = 50 µA V IN = VIL or VIH (Note 3) IOL = 12 mA V I = VCC, GND V OLD = 0.8V Max (Note 5) V OHD = 2.0V Min (Note 5) V IN = VCC or GND (Note 6)(Note 7) (Note 6)(Note 7) (Note 6)(Note 8) (Note 6)(Note 8) Units Conditions Note 3: All outputs loaded; thresholds on input associated with output under test. Note 4: Maximum test duration 20 ms, one output loaded at a time. Note 5: Incident wave switching on transmission lines with impedances as low as 75Ω for commercial temperature range is guaranteed for 74LVQ. Note 6: Worst case package. Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND. Note 8: Max number of Data Inputs (n) switching. (n − 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (VILD), 0V to threshold (VIHD), f = 1 M Hz. www.fairchildsemi.com 2 74LVQ86 AC Electrical Characteristics TA = +25°C Symbol Parameter VCC (V) tPLH tPHL tOSHL, tOSLH Propagation Delay Propagation Delay Output to Output Skew (Note 9) 2.7 3.3 ± 0.3 2.7 3.3 ± 0.3 2.7 3.3 ± 0.3 Min 2.0 2.0 2.0 2.0 CL = 50 pF Typ 7.2 6.0 7.8 6.5 1.0 1.0 Max 16.2 11.5 16.2 11.5 1.5 1.5 TA = −40°C to +85°C CL = 50 pF Min 1.5 1.5 1.5 1.5 Max 18.0 12.5 18.0 12.5 1.5 1.5 ns ns ns Units Note 9: Skews defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. Capacitance Symbol CIN CPD (Note 10) Parameter Input Capacitance Power Dissipation Capacitance Typ 4.5 23 Units pF pF Conditions V CC = Open VCC = 3.3V Note 10: CPD is measured at 10 MHz. 3 www.fairchildsemi.com 74LVQ86 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow Package Number M14A www.fairchildsemi.com 4 74LVQ86 Low Voltage Quad 2-Input Exclusive-OR Gate Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 5 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com www.fairchildsemi.com