CD4069UBC_02

CD4069UBC Inverter Circuits October 1987 Revised April 2002 CD4069UBC Inverter Circuits General Description The CD4069UB consists of six inverter circuits and is manufactured using complementary MOS (CMOS) to achieve wide power supply operating range, low power consumption, high noise immunity, and symmetric controlled rise and fall times. This device is intended for all general purpose inverter applications where the special characteristics of the MM74C901, MM74C907, and CD4049A Hex Inverter/Buffers are not required. In those applications requiring larger noise immunity the MM74C14 or MM74C914 Hex Schmitt Trigger is suggested. All inputs are protected from damage due to static discharge by diode clamps to VDD and VSS. Features s Wide supply voltage range: s Low power TTL compatibility: or 1 driving 74LS s Equivalent to MM74C04 3.0V to 15V Fan out of 2 driving 74L s High noise immunity: 0.45 VDD typ. Ordering Code: Order Number CD4069UBCM CD4069UBCSJ CD4069UBCN Package Number M14A M14D N14A Package Description 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide Device also available in Tape and Reel. Specify by appending suffix “X” to the ordering code. Connection Diagram Schematic Diagram © 2002 Fairchild Semiconductor Corporation DS005975 www.fairchildsemi.com CD4069UBC Absolute Maximum Ratings(Note 1) (Note 2) DC Supply Voltage (VDD) Input Voltage (VIN) Storage Temperature Range (TS) Power Dissipation (PD) Dual-In-Line Small Outline Lead Temperature (TL) (Soldering, 10 seconds) 260°C 700 mW 500 mW Recommended Operating Conditions (Note 2) DC Supply Voltage (VDD) Input Voltage (VIN) Operating Temperature Range (TA) 3V to 15VDC 0V to VDD VDC −0.5V to +18 VDC −0.5V to VDD +0.5 VDC −65°C to +150°C −55°C to +125°C Note 1: “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices should be operated at these limits. The table of “Recommended Operating Conditions” and Electrical Characteristics table provide conditions for actual device operation. Note 2: VSS = 0V unless otherwise specified. DC Electrical Characteristics (Note 3) Symbol IDD Parameter Quiescent Device Current VDD = 5V, VIN = VDD or VSS VDD = 10V, VIN = VDD or VSS VDD = 15V, VIN = VDD or VSS VOL LOW Level Output Voltage |IO| < 1 µA VDD = 5V VDD = 10V VDD = 15V VOH HIGH Level Output Voltage |IO| < 1 µA VDD = 5V VDD = 10V VDD = 15V VIL LOW Level Input Voltage |IO| < 1 µA VDD = 5V, VO = 4.5V VDD = 10V, VO = 9V VDD = 15V, VO = 13.5V VIH HIGH Level Input Voltage |IO| < 1 µA VDD = 5V, VO = 0.5V VDD = 10V, VO = 1V VDD = 15V, VO = 1.5V IOL LOW Level Output Current (Note 4) IOH HIGH Level Output Current (Note 4) IIN Input Current VDD = 5V, VO = 0.4V VDD = 10V, VO = 0.5V VDD = 15V, VO = 1.5V VDD = 5V, VO = 4.6V VDD = 10V, VO = 9.5V VDD = 15V, VO = 13.5V VDD = 15V, VIN = 0V VDD = 15V, VIN = 15V Note 3: VSS = 0V unless otherwise specified. Note 4: IOH and IOL are tested one output at a time. Conditions −55°C Min Max 0.25 0.5 1.0 Min +25°C Typ Max 0.25 0.5 1.0 +125°C Min Max 7.5 15 30 Units µA 0.05 0.05 0.05 4.95 9.95 14.95 1.0 2.0 3.0 4.0 8.0 12.0 0.64 1.6 4.2 −0.64 −1.6 −4.2 −0.1 0.1 4.0 8.0 12.0 0.51 1.3 3.4 −0.51 −1.3 −3.4 4.95 9.95 14.95 0 0 0 5 10 15 0.05 0.05 0.05 4.95 9.95 14.95 1.0 2.0 3.0 4.0 8.0 12.0 0.05 0.05 0.05 V V 1.0 2.0 3.0 V V 0.88 2.25 8.8 −0.88 −2.25 −8.8 −10−5 10−5 −0.1 0.1 0.36 0.9 2.4 −0.36 −0.9 −2.4 −1.0 1.0 µA mA mA www.fairchildsemi.com 2 CD4069UBC AC Electrical Characteristics Symbol tPHL or tPLH Parameter Propagation Delay Time from Input to Output tTHL or tTLH Transition Time (Note 5) Conditions Min Typ 50 30 25 80 50 40 6 12 Max 90 60 50 150 100 80 15 pF pF ns ns Units TA = 25°C, CL = 50 pF, RL = 200 kΩ, tr and tf ≤ 20 ns, unless otherwise specified VDD = 5V VDD = 10V VDD = 15V VDD = 5V VDD = 10V VDD = 15V CIN CPD Average Input Capacitance Power Dissipation Capacitance Any Gate Any Gate (Note 6) Note 5: AC Parameters are guaranteed by DC correlated testing. Note 6: CPD determines the no load AC power consumption of any CMOS device. For complete explanation, see Family Characteristics application note— AN-90. AC Test Circuits and Switching Time Waveforms 3 www.fairchildsemi.com CD4069UBC Typical Performance Characteristics Gate Transfer Characteristics Propagation Delay vs. Ambient Temperature Power Dissipation vs. Frequency Propagation Delay vs. Ambient Temperature Propagation Delay Time vs. Load Capacitance www.fairchildsemi.com 4 CD4069UBC Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow Package Number M14A 5 www.fairchildsemi.com CD4069UBC Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D www.fairchildsemi.com 6 CD4069UBC Inverter Circuits Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 7 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com www.fairchildsemi.com