F DS4435A
October 2001
FDS4435A
P-Channel Logic Level PowerTrench® MOSFET
General Description
This P-Channel Logic Level MOSFET is produced using Fairchild Semiconductors advanced PowerTrench process that has been especially tailored to minimize the on-state resistance and yet maintain low gate charge for superior switching performance. These devices are well suited for notebook computer applications: load switching and power management, battery charging circuits, and DC/DC conversion.
Features
-9 A, -30 V. RDS(ON) = 0.017 W @ VGS = -10 V RDS(ON) = 0.025 W @ VGS = -4.5 V Low gate charge (21nC typical). High performance trench technology for extremely low RDS(ON). High power and current handling capability.
D D
D
D
5 6 4 3 2 1
SO-8
S
S
S
G
7 8
Absolute Maximum Ratings
Symbol
VDSS VGSS ID PD Drain-Source Voltage Gate-Source Voltage Drain Current - Continuous - Pulsed
TA = 25°C unless otherwise noted
Parameter
Ratings
-30 ± 20
(Note 1a)
Units
V V A W
-9 -50 2.5 1.2 1 -55 to +150
Power Dissipation for Single Operation
(Note 1a) (Note 1b) (Note 1c)
TJ, Tstg
Operating and Storage Junction Temperature Range
°C
Thermal Characteristics
RθJA RθJC Thermal Resistance, Junction-to-Ambient Thermal Resistance, Junction-to-Case
(Note 1a) (Note 1)
50 25
°C/W °C/W
Package Marking and Ordering Information
Device Marking
FDS4435A
Device
FDS4435A
Reel Size
13’’
Tape Width
12mm
Quantity
2500 units
ã2001 Fairchild Semiconductor Corporation
FDS4435A Rev. D
F DS4435A
Electrical Characteristics
Symbol Off Characteristics
BVDSS ∆BVDSS ∆TJ IDSS IGSSF IGSSR
TA = 25°C unless otherwise noted
Parameter
Drain-Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate-Body Leakage Current, Forward Gate-Body Leakage Current, Reverse
(Note 2)
Test Conditions
VGS = 0 V, ID = -250 µA ID = -250 µA,Referenced to 25°C VDS = -24 V, VGS = 0 TJ = 125°C VGS = 20 V, VDS = 0 V VGS = -20 V, VDS = 0 V
Min
-30
Typ
Max
Units
V
-26 -1 -10 100 -100
mV/°C µA nA nA
On Characteristics
VGS(th) ∆VGS(th) ∆TJ RDS(on)
Gate Threshold Voltage Gate Threshold Voltage Temperature Coefficient Static Drain-Source On-Resistance
VDS = VGS, ID = -250 µA ID = -250 µA,Referenced to 25°C VGS = -10 V, ID = -9 A TJ = 125°C VGS = -4.5 V, ID = -7 A
-1
-1.7 4.2 0.015 0.021 0.023
-2
V mV/°C
0.017 0.030 0.025
Ω
ID(on) gFS
On-State Drain Current Forward Transconductance
VGS = -10 V, VDS = -5 V VDS = -10 V, ID = -9 A
-40 25
A S
Dynamic Characteristics
Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance
(Note 2)
VDS = -15 V, VGS = 0 V f = 1.0 MHz
2010 590 260
pF pF pF
Switching Characteristics
td(on) tr td(off) tf Qg Qgs Qgd Turn-On Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge
VDD = -15 V, ID = -1 A VGS = -10 V, RGEN = 6 Ω
12 15 100 55
22 27 140 80 30
ns ns ns ns nC nC nC
VDS = -15 V, ID = -9 A VGS = -5 V,
21 6 8
Drain-Source Diode Characteristics and Maximum Ratings
IS VSD trr Maximum Continuous Drain-Source Diode Forward Current Drain-Source Diode Forward Voltage Source-Drain Reverse Recovery Time VGS = 0 V, IS = -2.1 A
(Note 2)
-2.1 0.75 36 -1.2 80
A V ns
IF = -10 A, dlF/dt = 100 A/µS
Notes: 1: RqJA is the sum of the junction-to-case and case-to-ambient resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RqJC is guaranteed by design while RqCA is determined by the user's board design.
a) 50° C/W when mounted on a 1 in2 pad of 2 oz. copper.
b) 105° C/W when mounted on a 0.04 in2 pad of 2 oz. copper.
c) 125° C/W when mounted on a minimum pad.
Scale 1 : 1 on letter size paper 2: Pulse Test: Pulse Width £ 300 ms, Duty Cycle £ 2.0%
FDS4435A Rev. D
F DS4435A
Typical Characteristics
- I D, DRAIN-SOURCE CURRENT (A)
RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE
VGS= -10V -6.0V -4.5V -4.0V -3.5V
2.4 2.2 2 1.8 1.6 1.4 1.2 1 0.8 0 10 20 30 40 50 -ID, DRAIN CURRENT (A) VGS = -3.5V -4.0V -4.5V -5.0V -6.0V -7.0V -8.0V -10V
-3.0V
-2.5V
-V DS, DRAIN-SOURCE VOLTAGE (V)
Figure 1. On-Region Characteristics
Figure 2. On-Resistance Variation with Drain Current and Gate Voltage
0.07
1.6
RDS(ON), ON RESISTANCE (OHM)
NORMALIZED ON-RESISTANCE
VGS = -10V ID = -9A
ID = -4.5A
0.06 0.05 0.04 0.03 0.02 0.01 0
1.4
1.2
1
TJ = 125 C
O
0.8
TJ = 25 C
O
0.6 -50 -25 0 25 50 75 100 125 150
2
4
6
8
10
TJ, JUNCTION TEMPERATURE (OC)
-VGS, GATE TO SOURCE VOLTAGE (V)
Figure 3. On-Resistance Variation with Temperature
40
Figure 4. On-Resistance Variation with Gate-to-Source Voltage
100
VDS = -5V -ID, DRAIN CURRENT (A)
30
TJ = -55 C
O
25 C 125 C
O
-IS, REVERSE DRAIN CURRENT (A)
O
VGS = 0V 10 1 0.1 -55oC 0.01 0.001 0.0001 TA = 125oC 25oC
20
10
0 0 1 2 3 4 5
0
0.2
0.4
0.6
0.8
1
1.2
1.4
-VGS, GATE TO SOURCE VOLTAGE (V)
-VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 5. Transfer Characteristics
Figure 6. Body Diode Forward Voltage Variation with Source Current and Temperature
FDS4435A Rev. D
F DS4435A
Typical Characteristics
10 -VGS, GATE-SOURCE VOLTAGE (V) ID = -8.8A 8
(continued)
2500
VDS = -5V -10V -15V
CAPACITANCE (pF) 2000 CISS
f = 1 MHz VGS = 0 V
6
1500
4
1000
2
500
COSS CRSS
0 0 5 10 15 20 25 30 35 Qg, GATE CHARGE (nC)
0 0 5 10 15 20 25 30 -VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 7. Gate-Charge Characteristics
50
RDS(ON) LIMIT -ID, DRAIN CURRENT (A) 10 100µs 1ms 10ms 100ms 1 DC VGS = -10V SINGLE PULSE o RθJA = 125 C/W TA = 25 C 0.01 0.1 1 10 100 -VDS, DRAIN-SOURCE VOLTAGE (V)
o
Figure 8. Capacitance Characteristics
100
40 POWER (W)
SINGLE PULSE RθJA =125°C/W TA = 25°C
30
1s 10s
20
0.1
10
0 0.001
0.01
0.1 1 10 SINGLE PULSE TIME (SEC)
100
300
Figure 9. Maximum Safe Operating Area
Figure 10. Single Pulse Maximum Power Dissipation
TR ANSI ENT T ER M H AL RESISTANC E
1 0.5 0.2 0.1 0 .05 0 .02 0 .01 0. 05 0 0. 02 0 0. 01 0 0.0 001 0. 01 0 0 .01 0.1 t 1, TI M E (s e c ) 1 10 100 300
D= 0 .5 0 .2 0 .1 005 . 002 . 0 .01 S i n g le P ul s e
r(t), NORM AL IZED EFFECTIVE
R θJ A (t) = r(t) * R θJ A R θJ A= 125°C /W
P(pk )
t1
t2
TJ - TA = P * RθJ ( t A) D u t y C y c l e , D = t 1 /t2
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c. Transient themal response will change depending on the circuit board design.
FDS4435A Rev. D
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks.
ACEx™ Bottomless™ CoolFET™ CROSSVOLT ™ DenseTrench™ DOME™ EcoSPARK™ E2CMOSTM EnSignaTM FACT™ FACT Quiet Series™
DISCLAIMER
FAST ® FASTr™ FRFET™ GlobalOptoisolator™ GTO™ HiSeC™ ISOPLANAR™ LittleFET™ MicroFET™ MicroPak™ MICROWIRE™
OPTOLOGIC™ OPTOPLANAR™ PACMAN™ POP™ Power247™ PowerTrench ® QFET™ QS™ QT Optoelectronics™ Quiet Series™ SILENT SWITCHER ®
SMART START™ STAR*POWER™ Stealth™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic™ TruTranslation™ UHC™ UltraFET ®
VCX™
STAR*POWER is used under license
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or 2. A critical component is any component of a life systems which, (a) are intended for surgical implant into support device or system whose failure to perform can the body, or (b) support or sustain life, or (c) whose be reasonably expected to cause the failure of the life failure to perform when properly used in accordance support device or system, or to affect its safety or with instructions for use provided in the labeling, can be effectiveness. reasonably expected to result in significant injury to the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Product Status Formative or In Design Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Preliminary
First Production
No Identification Needed
Full Production
Obsolete
Not In Production
This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. H4