FDS7079ZN3
February 2004
FDS7079ZN3
30 Volt P-Channel PowerTrench MOSFET
General Description
Advanced P Channel MOSFET combined with Advanced SO8 FLMP package providing a device with extremely low thermal impedance and improved electrical performance. Applications for this device include multi-cell battery protection and charging, including protection and load switching in notebook computer and notebook battery packs. Features • –16 A, –30 V. RDS(ON) = 7.5 mΩ @ VGS = –10 V RDS(ON) = 11.5 mΩ @ VGS = – 4.5 V • ESD protection diode (note 3) • ESD rating: 4kV • High performance trench technology for extremely low RDS(ON) • FLMP SO-8 package for enhanced thermal performance in industry-standard package size
NC D N DC NC D N DC
FLMP SO-8
D
Bottom Side Drain Contact
5 6
4 3 2 1
Pin 1SO-
G SG S S SS S
TA=25oC unless otherwise noted
7 8
Absolute Maximum Ratings
Symbol
VDSS VGSS ID PD TJ, TSTG Drain-Source Voltage Gate-Source Voltage Drain Current – Continuous – Pulsed
Parameter
Ratings
–30 ±25
(Note 1a)
Units
V V A W °C
–16 –60 3.13 1.5 –55 to +150
Power Dissipation for Single Operation
(Note 1a) (Note 1b)
Operating and Storage Junction Temperature Range
Thermal Characteristics
RθJA RθJC Thermal Resistance, Junction-to-Ambient Thermal Resistance, Junction-to-Case
(Note 1a) (Note 1)
40 0.5
°C/W
Package Marking and Ordering Information
Device Marking FDS7079ZN3
2004 Fairchild Semiconductor Corporation
Device FDS7079ZN3
Reel Size 13’’
Tape width 12mm
Quantity 2500 units
FDS7079ZN3 Rev C1 (W)
FDS7079ZN3
Electrical Characteristics
Symbol
BVDSS ∆BVDSS ∆TJ IDSS IGSS VGS(th) ∆VGS(th) ∆TJ RDS(on)
TA = 25°C unless otherwise noted
Parameter
Drain–Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate–Body Leakage
(Note 2)
Test Conditions
VGS = 0 V, ID = –250 µA ID = –250 µA,Referenced to 25°C VDS = –24 V, VGS = 0 V VGS = ±25 V, VDS = 0 V ID = –250 µA VDS = VGS, ID = –250 µA,Referenced to 25°C VGS = –10 V, ID = –16 A VGS = –4.5 V, ID = –13 A VGS= –10 V, ID =–16A, TJ=125°C VDS = –10 V, ID = –16 A
Min
–30
Typ
Max Units
V
Off Characteristics
–20 –1 ±10 mV/°C µA µA
On Characteristics
Gate Threshold Voltage Gate Threshold Voltage Temperature Coefficient Static Drain–Source On–Resistance Forward Transconductance
–1
–1.5 0.5 6.7 9.4 9.2 47
–3
V mV/°C
7.5 11.5
mΩ
gFS Ciss Coss Crss RG td(on) tr td(off) tf Qg Qgs Qgd IS VSD tRR QRR
Notes:
S
Dynamic Characteristics
Input Capacitance Output Capacitance Reverse Transfer Capacitance Gate Resistance
(Note 2)
VDS = –15 V, V GS = 0 V, f = 1.0 MHz VGS = 15 mV, f = 1.0 MHz
3630 985 490 3.0
pF pF pF Ω 19 35 102 157 55 ns ns ns ns nC nC nC
Switching Characteristics
Turn–On Delay Time Turn–On Rise Time Turn–Off Delay Time Turn–Off Fall Time Total Gate Charge Gate–Source Charge Gate–Drain Charge
VDD = –15 V, VGS = –10 V,
ID = –1 A, RGEN = 6 Ω
10 20 64 98
VDS = –15 V, ID = –16 A, VGS = –5 V
39 10 15
Drain–Source Diode Characteristics and Maximum Ratings
Maximum Continuous Drain–Source Diode Forward Current Drain–Source Diode Forward VGS = 0 V, IS = –2.5 A Voltage IF = –16 A, Reverse Recovery Time diF/dt = 100 A/µs Reverse Recovery Charge –2.5
(Note 2)
A V ns nC
–0.7 38 24
–1.2
(Note 2)
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.
a)
40°C/W when mounted on a 1in2 pad of 2 oz copper
b)
85°C/W when mounted on a minimum pad of 2 oz copper
Scale 1 : 1 on letter size paper 2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0% 3. The diode connected between the gate and source serves only as protection against ESD. No gate overvoltage rating is implied.
FDS7079ZN3 Rev C1 (W)
FDS7079ZN3
Typical Characteristics
60 50 -ID, DRAIN CURRENT (A)
2.8 RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE
VGS = -10V
-4.5V
-3.5V
2.4
VGS = - 3.0V
-6.0V
40 30 20 10 0 0 0.5 1 1.5 -VDS, DRAIN TO SOURCE VOLTAGE (V) 2
2
-3.5V -4.0V -4.5V
-3.0V
1.6
1.2
-6.0V -10V
-2.5V
0.8 0 15 30 -ID, DRAIN CURRENT (A) 45 60
Figure 1. On-Region Characteristics.
Figure 2. On-Resistance Variation with Drain Current and Gate Voltage.
0.04
1.5 RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE 1.4 1.3 1.2 1.1 1 0.9 0.8 0.7 -50 -25 0 25 50 75 100 o TJ, JUNCTION TEMPERATURE ( C) 125 150
ID = -16A VGS = -10V
ID = -8.0A RDS(ON), ON-RESISTANCE (OHM) 0.03
0.02 TA = 125 C 0.01 TA = 25 C
o o
0.00 2 4 6 8 -VGS, GATE TO SOURCE VOLTAGE (V) 10
igure 3. On-Resistance Variation with Temperature.
60 50 -ID, DRAIN CURRENT (A) 40 30 20
-IS, REVERSE DRAIN CURRENT (A)
Figure 4. On-Resistance Variation with Gate-to-Source Voltage.
100
VDS = -5V
VGS = 0V
10
1
TA = 125 C
o
TA = 125oC 25oC
0.1
25 C
o
10
0.01
-55 C
o
-55oC
0 1.5 2 2.5 3 3.5 -VGS, GATE TO SOURCE VOLTAGE (V) 4
0.001 0 0.2 0.4 0.6 0.8 1 -VSD, BODY DIODE FORWARD VOLTAGE (V) 1.2
Figure 5. Transfer Characteristics.
Figure 6. Body Diode Forward Voltage Variation with Source Current and Temperature.
FDS7079ZN3 Rev C1 (W)
FDS7079ZN3
Typical Characteristics
10
5000
ID = -16A f = 1 MHz VGS = 0 V
-VGS, GATE-SOURCE VOLTAGE (V)
8
4000 CAPACITANCE (pF)
VDS = -10V -15V Ciss
6 -20V
3000
4
2000
Coss
2
1000
Crss
0 0 10 20 30 40 50 60 70 80
0 0 5 10 15 20 25 -VDS, DRAIN TO SOURCE VOLTAGE (V) 30
Qg, GATE CHARGE (nC)
Figure 7. Gate Charge Characteristics.
100
RDS(ON) LIMIT 100µs 1ms 10ms 100ms 1s 10s DC
P(pk), PEAK TRANSIENT POWER (W) 50
Figure 8. Capacitance Characteristics.
-ID, DRAIN CURRENT (A)
10
40
SINGLE PULSE RθJA = 85°C/W TA = 25°C
30
1
20
0.1
VGS = -10V SINGLE PULSE RθJA = 85oC/W T A = 25 C
o
10
0.01 0.01
0.1 1 10 -VDS, DRAIN-SOURCE VOLTAGE (V)
100
0 0.001
0.01
0.1
1 t1, TIME (sec)
10
100
1000
Figure 9. Maximum Safe Operating Area.
Figure 10. Single Pulse Maximum Power Dissipation.
r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE
1
D = 0.5 0.2
RθJA(t) = r(t) * RθJA RθJA = 85 C/W P(pk)
0.01
o
0.1
0.1 0.05 0.02
t1
0.01
t2
SINGLE PULSE
TJ - TA = P * RθJA(t) Duty Cycle, D = t1 / t2
0.001 0.0001
0.001
0.01
0.1
t1, TIME (sec)
1
10
100
1000
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c. Transient thermal response will change depending on the circuit board design.
FDS7079ZN3 Rev C1 (W)
FDS7079ZN3
Dimensional Outline and Pad Layout
FDS7079ZN3 Rev C1 (W)
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks.
ACEx™ FACT Quiet Series™ ActiveArray™ FAST Bottomless™ FASTr™ CoolFET™ FPS™ CROSSVOLT™ FRFET™ DOME™ GlobalOptoisolator™ EcoSPARK™ GTO™ E2CMOSTM HiSeC™ EnSignaTM I2C™ FACT™ ImpliedDisconnect™ Across the board. Around the world.™ The Power Franchise™ Programmable Active Droop™
DISCLAIMER
ISOPLANAR™ LittleFET™ MICROCOUPLER™ MicroFET™ MicroPak™ MICROWIRE™ MSX™ MSXPro™ OCX™ OCXPro™ OPTOLOGIC OPTOPLANAR™ PACMAN™
POP™ Power247™ PowerSaver™ PowerTrench QFET QS™ QT Optoelectronics™ Quiet Series™ RapidConfigure™ RapidConnect™ SILENT SWITCHER SMART START™ SPM™
Stealth™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic TINYOPTO™ TruTranslation™ UHC™ UltraFET VCX™
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component is any component of a life 1. Life support devices or systems are devices or support device or system whose failure to perform can systems which, (a) are intended for surgical implant into be reasonably expected to cause the failure of the life the body, or (b) support or sustain life, or (c) whose support device or system, or to affect its safety or failure to perform when properly used in accordance with instructions for use provided in the labeling, can be effectiveness. reasonably expected to result in significant injury to the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Product Status Formative or In Design Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Preliminary
First Production
No Identification Needed
Full Production
Obsolete
Not In Production
This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. I8