FJT44 NPN Epitaxial Silicon Transistor
September 2006
FJT44
NPN Epitaxial Silicon Transistor
•
tm
High Voltage Transistor
3 2 1
SOT-223
1. Base 2. Collector 3. Emitter
Absolute Maximum Ratings* T =25°C unless otherwise noted
a
Symbol
VCBO VCEO VEBO IC PC TJ TSTG
Parameter
Collector-Base Voltage Collector-Emitter Voltage Emitter-Base Voltage Collector Current
Collector Dissipation
Value
500 400 6 300
Units
V V V mA W °C °C
(Ta = 25 oC)
2 150 - 55 ~ +150
Junction Temperature Storage Temperature Range
* These ratings are limiting values above which the serviceability of any semiconductor device may be impaired. NOTES: 1) These ratings are based on a maximum junction temperature of 150°C. 2) These are steady state limits. The factory should be consulted on applications involving pulsed or low duty cycle operations.
Thermal Characteristics* T =25°C unless otherwise noted
a
Symbol
RθJA
Parameter
Thermal Resistance, Junction to Ambient
Value
62.5
Units
°C/W
* Device mounted on FR-4 PCB 36 mm X 18 mm X 1.5 mm. mounting pad for the collector lead min. 6 cm 2
Electrical Characteristics*
Symbol
BVCBO BVCEO BVEBO ICBO ICES IEBO hFE
Ta = 25°C unless otherwise noted
Parameter
Collector-Base Breakdown Voltage Collector-Emitter Breakdown Voltage Emitter-Base Breakdown Voltage Collector-Base Cutoff Current Collector-Emitter Cutoff Current Emitter-Base Cutoff Current DC Current Gain
Test Conditions
IC = 100uA, IE = 0 IC = 1mA, IB = 0 IE = 100µA, IC = 0 VCB = 400V IE = 0 VCE = 400V, VBE = 0 VCE = 4V, IC = 0 VCE=10V, IC=1mA VCE=10V, IC=10mA VCE=10V, IC=50mA VCE=10V, IC=100mA IC = 1mA, IB = 0.1mA IC = 10mA, IB = 1mA IC = 50mA, IB = 5mA IC = 10mA, IB = 1mA VCB = 20V, IE = 0, f = 1MHz
Min.
500 400 6
Typ.
Max.
Units
V V V
100 500 100 40 50 45 40
nA nA nA
200
VCE(sat)
Collector-Emitter Saturation Voltage
0.4 0.5 0.75 0.75 7
V V V V pF
VBE(sat) Cobo
Base-Emitter Saturation Voltage Output Capacitance
* Pulse Test: Pulse Width ≤ 300µs, Duty Cycle ≤ 2.0%
©2006 Fairchild Semiconductor Corporation
1
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FJT44 Rev. B
FJT44 NPN Epitaxial Silicon Transistor
Typical Performance Characteristics
160
10
VCE=10V
140 120
hFE, DC CURRENT GAIN
VCC=150V IC/IB=10 o Ta=25 C VBE(off)=4V
100
60 40 20 0 -20 -40 1 10 100 1000 10000
t[us], TIME
80
1
tf td
0.1 1 10 100
IC[mA], COLLECTOR CURRENT
IC[mA], COLLECTOR CURRENT
Figure 1. DC current Gain
Figure 2. Turn-On Switching Times
100
1000
Cib[pF],Cob[pF], CAPACITANCE
VCC=150V IC/IB=10 Ta=25℃
10
Ta=25 C f=1MHz
o
100
t[us], TIME
Cib
ts
1
10
Cob
tf
0.1 1 10 100
1 0.1
1
10
100
1000
IC[mA], COLLECTOR CURRENT
VCB[V], COLLECTOR-BASE VOLTAGE
Figure 3. Turn-Off Switching Times
Figure 4. Capacitance
1.0
0.5
VCE[V] COLLECTOR EMITTER VOLTAGE
Ta=25 C
0.8
o
IC=1mA
0.4
IC=10mA
IC=50mA
Ta=25 c
o
VBE(sat) @IC/IB=10
[V], VOLTAGE
0.6
0.3
VBE(on) @VCE=10V
0.4
0.2
0.2
VCE(sat)@IC/IB=10
0.1
0.0 0.1
1
10
100
1000
0.0 10
100
1000
10000
100000
IC[mA], COLLECTOR CURRENT
IC[mA], COLLECTOR CURRENT
Figure 5. On Voltage
Figure 6. Collector Saturation Region
2 FJT44 Rev. B
www.fairchildsemi.com
FJT44 NPN Epitaxial Silicon Transistor
Typical Performance Characteristics
100
hFE, SMALL SIGNAL CURRENT GAIN
VCE=10V f=10MHz o Ta=25 C
10
1
0.1 0.1
1
10
100
1000
IC[mA], COLLECTOR CURRENT
Figure 1. High Frequency Current Gain
3 FJT44 Rev. B
www.fairchildsemi.com
FJT44 NPN Epitaxial Silicon Transistor
Mechanical Dimensions
SOT-223
0.08MAX
3.00 ±0.10
MAX1.80
1.75 ±0.20
3.50 ±0.20
(0.60)
0.65 ±0.20
+0.04
0.06 –0.02
2.30 TYP (0.95) 4.60 ±0.25
0.70 ±0.10 (0.95)
+0.10 0.25 –0.05
(0.60)
0°~
10
°
1.60 ±0.20
(0.46)
(0.89)
6.50 ±0.20
7.00 ±0.30
Dimensions in Millimeters
4 FJT44 Rev. B
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FJT44 NPN Epitaxial Silicon Transistor FJT44 NPN Epitaxial Silicon Transistor
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user. 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification
Advance Information
Product Status
Formative or In Design
Definition
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Preliminary
First Production
No Identification Needed
Full Production
Obsolete
Not In Production
This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. I20
5 FJT44 Rev. B
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