MOC211

SMALL OUTLINE OPTOCOUPLERS TRANSISTOR OUTPUT MOC211-M DESCRIPTION These devices consist of a gallium arsenide infrared emitting diode optically coupled to a monolithic silicon phototransistor detector, in a surface mountable, small outline, plastic package. They are ideally suited for high density applications, and eliminate the need for through-the-board mounting. MOC212-M MOC213-M FEATURES • UL Recognized (File #E90700, volume 2) • VDE Recognized (File #136616) (add option ‘V’ for VDE approval, e.g., MOC211V-M) • Convenient Plastic SOIC-8 Surface Mountable Package Style • Standard SOIC-8 Footprint, with 0.050" Lead Spacing • Compatible with Dual Wave, Vapor Phase and IR Reflow Soldering • High Input-Output Isolation of 2500 VAC(rms) Guaranteed • Minimum BVCEO of 30V guaranteed CATHODE 2 7 BASE ANODE 1 8 N/C APPLICATIONS • General Purpose Switching Circuits • Interfacing and coupling systems of different potentials and impedances • Regulation Feedback Circuits • Monitor and Detection Circuits N/C 3 6 COLLECTOR N/C 4 5 EMITTER © 2002 Fairchild Semiconductor Corporation Page 1 of 9 4/10/03 SMALL OUTLINE OPTOCOUPLERS TRANSISTOR OUTPUT MOC211-M MOC212-M MOC213-M ABSOLUTE MAXIMUM RATINGS (TA = 25°C Unless otherwise specified) Rating EMITTER Forward Current – Continuous Forward Current – Peak (PW = 100 µs, 120 pps) Reverse Voltage LED Power Dissipation @ TA = 25°C Derate above 25°C DETECTOR Collector-Emitter Voltage Emitter-Collector Voltage Collector-Base Voltage Collector Current-Continuous Detector Power Dissipation @ TA = 25°C Derate above 25°C TOTAL DEVICE Input-Output Isolation Voltage (1,2,3) (f = 60 Hz, t = 1 min.) Total Device Power Dissipation @ TA = 25°C Derate above 25°C Ambient Operating Temperature Range Storage Temperature Range VISO PD TA Tstg 2500 250 2.94 -40 to +100 -40 to +150 Vac(rms) mW mW/°C °C °C VCEO VECO VCBO IC PD 30 7.0 70 150 150 1.76 V V V mA mW mW/°C IF IF (pk) VR PD 60 1.0 6.0 90 0.8 mA A V mW mW/°C Symbol Value Unit © 2002 Fairchild Semiconductor Corporation Page 2 of 9 4/10/03 SMALL OUTLINE OPTOCOUPLERS TRANSISTOR OUTPUT MOC211-M MOC212-M MOC213-M ELECTRICAL CHARACTERISTICS (TA = 25°C Unless otherwise specified) Parameter EMITTER Input Forward Voltage Reverse Leakage Current Input Capacitance DETECTOR Collector-Emitter Dark Current Collector-Emitter Breakdown Voltage Emitter-Collector Breakdown Voltage Collector-Emitter Capacitance COUPLED Collector-Output Current(4) MOC211-M MOC212-M MOC213-M (IF = 10 mA, VCE = 10 V) (60 Hz AC Peak, 1 min.) (V = 500 V) (IC = 2.0 mA, IF = 10 mA) (V = 0 V, f = 1 MHz) (IC = 2.0 mA, VCC = 10 V, RL = 100 Ω) (Fig. 6) (IC = 2.0 mA, VCC = 10 V, RL = 100 Ω) (Fig. 6) (IC = 2.0 mA, VCC = 10 V, RL = 100 Ω) (Fig. 6) (IC = 2.0 mA, VCC = 10 V, RL = 100 Ω) (Fig. 6) CTR VISO RISO VCE (sat) CISO ton toff tr tf 20 50 100 2500 1011 — — — — — — 65 90 140 — — 0.15 0.2 7.5 5.7 3.2 4.7 — — — — — 0.4 — — — — — % Vac(rms) Ω V pF µs µs µs µs (VCE = 10 V, TA = 25°C) (VCE = 10 V, TA = 100°C) (IC = 100 µA) (IE = 100 µA) (f = 1.0 MHz, VCE = 0) ICEO1 ICEO2 BVCEO BVECO CCE — — 30 7.0 — 1.0 1.0 90 7.8 7.0 50 — — — — nA µA V V pF (IF = 10 mA) (VR = 6.0 V) VF IR CIN — — — 1.15 0.001 18 1.5 100 — V µA pF Test Conditions Symbol Min Typ** Max Unit Isolation Surge Voltage(1,2,3) Isolation Resistance(2) Collector-Emitter Saturation Voltage Isolation Capacitance(2) Turn-On Time Turn-Off Time Rise Time Fall Time ** Typical values at TA = 25°C 1. Isolation Surge Voltage, VISO, is an internal device dielectric breakdown rating. 2. For this test, Pins 1 and 2 are common and Pins 5, 6 and 7 are common. 3. VISO rating of 2500 VAC(rms) for t = 1 min. is equivalent to a rating of 3,000 VAC(rms) for t = 1 sec. 4. Current Transfer Ratio (CTR) = IC/IF x 100%. © 2002 Fairchild Semiconductor Corporation Page 3 of 9 4/10/03 SMALL OUTLINE OPTOCOUPLERS TRANSISTOR OUTPUT MOC211-M 1.8 MOC212-M 10 MOC213-M Fig. 2 Output Curent vs. Input Current Fig. 1 LED Forward Voltage vs. Forward Current I C - OUTPUT COLLECTOR CURRENT (NORMALIZED) 1.7 VF - FORWARD VOLTAGE (V) 1.6 1.5 1 VCE = 5V NORMALIZED TO IF = 10mA 1.4 TA = –55°C 1.3 TA = 25°C TA = 100°C 1.2 0.1 1.1 1.0 1 10 100 IF - LED FORWARD CURRENT (mA) 0 .01 0.1 1 10 100 Fig. 3 Output Current vs. Ambient Temperature 10 IF - LED INPUT CURRENT (mA) Fig. 4 Output Current vs. Collector - Emitter Voltage I C - OUTPUT COLLECTOR CURRENT (NORMALIZED) 1.6 I C - O UTPUT COLLECTOR CURRENT (NORMALIZED) 1.4 1.2 1.0 1 0.8 0.6 0.4 0.2 I F = 10mA NORMALIZED TO VCE = 5V 0.0 0 1 2 3 4 5 6 7 8 9 10 NORMALIZED TO TA = 25 °C 0.1 -80 -60 -40 -20 0 20 40 60 80 100 120 TA - AMBIENT TEMPERATURE ( °C) VCE - COLLECTOR -EMITTER VOLTAGE (V) Fig. 5 Dark Current vs. Ambient Temperature 10000 I CEO - COLLECTOR -EMITTER DARK CURRENT (nA) 1000 VCE=10V 100 10 1 0.1 0 20 40 60 80 100 TA - AMBIENT TEMPERATURE (°C) © 2002 Fairchild Semiconductor Corporation Page 4 of 9 4/10/03 SMALL OUTLINE OPTOCOUPLERS TRANSISTOR OUTPUT MOC211-M TEST CIRCUIT VCC = 10V INPUT PULSE MOC212-M MOC213-M WAVE FORMS IF INPUT RBE IC RL 10% 90% tr ton Adjust IF to produce IC = 2 mA tf toff OUTPUT PULSE OUTPUT Figure 6. Switching Time Test Circuit and Waveforms © 2002 Fairchild Semiconductor Corporation Page 5 of 9 4/10/03 SMALL OUTLINE OPTOCOUPLERS TRANSISTOR OUTPUT MOC211-M MOC212-M MOC213-M 8-Pin Small Outline Package Dimensions (Surface Mount) PIN 1 ID. 0.024 (0.61) 0.164 (4.16) 0.144 (3.66) SEATING PLANE 0.060 (1.52) 0.202 (5.13) 0.182 (4.63) 0.275 (6.99) 0.155 (3.94) 0.010 (0.25) 0.006 (0.16) 0.143 (3.63) 0.123 (3.13) 0.021 (0.53) 0.011 (0.28) 0.008 (0.20) 0.003 (0.08) 0.050 (1.27) TYP 0.244 (6.19) 0.224 (5.69) 0.050 (1.27) Lead Coplanarity : 0.004 (0.10) MAX © 2002 Fairchild Semiconductor Corporation Page 6 of 9 4/10/03 SMALL OUTLINE OPTOCOUPLERS TRANSISTOR OUTPUT MOC211-M ORDERING INFORMATION Option V R1 R1V R2 R2V Order Entry Identifier V R1 R1V R2 R2V Description VDE 0884 Tape and reel (500 units per reel) VDE 0884, Tape and reel (500 units per reel) Tape and reel (2500 units per reel) VDE 0884, Tape and reel (2500 units per reel) MOC212-M MOC213-M MARKING INFORMATION 1 211 V X YY S 2 6 3 4 5 Definitions 1 2 3 4 5 6 Fairchild logo Device number VDE mark (Note: Only appears on parts ordered with VDE option – See order entry table) One digit year code, e.g., ‘3’ Two digit work week ranging from ‘01’ to ‘53’ Assembly package code © 2002 Fairchild Semiconductor Corporation Page 7 of 9 4/10/03 SMALL OUTLINE OPTOCOUPLERS TRANSISTOR OUTPUT MOC211-M Carrier Tape Specifications MOC212-M MOC213-M 8.0 ± 0.10 3.50 ± 0.20 0.30 MAX 4.0 ± 0.10 2.0 ± 0.05 Ø1.5 MIN 1.75 ± 0.10 5.5 ± 0.05 8.3 ± 0.10 12.0 ± 0.3 5.20 ± 0.20 0.1 MAX 6.40 ± 0.20 Ø1.5 ± 0.1/-0 User Direction of Feed Reflow Profile 300 Temperature (°C) 250 200 150 100 50 0 0 0.5 1 1.5 2 2.5 245°C peak 230°C, 10–30 s Time above 183°C, 120–180 sec Ramp up = 2–10°C/sec • Peak reflow temperature: 245°C (package surface temperature) • Time of temperature higher than 183°C for 120–180 seconds • One time soldering reflow is recommended 3.5 4 4.5 3 Time (Minute) © 2002 Fairchild Semiconductor Corporation Page 8 of 9 4/10/03 SMALL OUTLINE OPTOCOUPLERS TRANSISTOR OUTPUT MOC211-M MOC212-M MOC213-M DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. © 2002 Fairchild Semiconductor Corporation Page 9 of 9 4/10/03