SCAN182373ASSC

SCAN182373A Transparent Latch with 25Ω Series Resistor Outputs January 1993 Revised August 2000 SCAN182373A Transparent Latch with 25Ω Series Resistor Outputs General Description The SCAN182373A is a high performance BiCMOS transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture with the incorporation of the defined boundaryscan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK). Features s IEEE 1149.1 (JTAG) Compliant s High performance BiCMOS technology s 25Ω series resistor outputs eliminate need for external terminating resistors s Buffered active-low latch enable s 3-STATE outputs for bus-oriented applications s 25 mil pitch SSOP (Shrink Small Outline Package) s Includes CLAMP, IDCODE and HIGHZ instructions s Additional instructions SAMPLE-IN, SAMPLE-OUT and EXTEST-OUT s Power up 3-STATE for hot insert s Member of Fairchild’s SCAN Products Ordering Code: Order Number SCAN182373ASSC Package Number MS56A Package Description 56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Connection Diagram Pin Descriptions Pin Names AI(0–8), BI(0–8) ALE, BLE AOE1, BOE1 AO(0–8), BO(0–8) Data Inputs Latch Enable Inputs 3-STATE Output Enable Inputs 3-STATE Latch Outputs Description © 2000 Fairchild Semiconductor Corporation DS011544 www.fairchildsemi.com SCAN182373A Truth Tables Inputs ALE X H H L H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance Inputs AO (0–8) AI (0–8) X L H X Z L H AO0 BLE X H H L †BOE1 H L L L BO (0–8) BI (0–8) X L H X Z L H BO0 †AOE1 H L L L AO0 = Previous AO before H-to-L transition of ALE BO0 = Previous BO before H-to-L transition of BLE † = Inactive-to-active transition must occur to enable outputs upon power-up. Functional Description The SCAN182373A consists of two sets of nine D-type latches with 3-STATE standard outputs. When the Latch Enable (ALE or BLE) input is HIGH, data on the inputs (AI(0–8) or BI(0–8)) enters the latches. In this condition the latches are transparent, i.e., a latch output will change state each time its input changes. When Latch Enable is LOW, the latches store the information that was present on the inputs a set-up time preceding the HIGH-to-LOW transition of the Latch Enable. The 3-STATE standard outputs are controlled by the Output Enable (AOE1 or BOE1) input. When Output Enable is LOW, the standard outputs are in the 2-state mode. When Output Enable is HIGH, the standard outputs are in the high impedance mode, but this does not interfere with entering new data into the latches. Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.fairchildsemi.com 2 SCAN182373A Block Diagrams Byte-A Tap Controller Byte-B Note: BSR stands for Boundary Scan Register. 3 www.fairchildsemi.com SCAN182373A Description of BOUNDARY-SCAN Circuitry The scan cells used in the BOUNDARY-SCAN register are one of the following two types depending upon their location. Scan cell TYPE1 is intended to solely observe system data, while TYPE2 has the additional ability to control system data. Scan cell TYPE 1 is located on each system input pin while scan cell TYPE2 is located at each system output pin as well as at each of the two internal active-high output enable signals. AOE controls the activity of the A-outputs while BOE controls the activity of the B-outputs. Each will activate their respective outputs by loading a logic high. The BYPASS register is a single bit shift register stage identical to scan cell TYPE1. It captures a fixed logic low. Bypass Register Scan Chain Definition Logic 0 MSB → LSB Instruction Code 00000000 10000001 SCAN182373A Product IDCODE (32-Bit Code per IEEE 1149.1) Version Entity 0000 MSB Part Number Manufacturer Required by ID 1149.1 1 LSB 10000010 00000011 01000001 01000010 00100010 10101010 11111111 All Others Scan Cell TYPE1 Instruction EXTEST SAMPLE/PRELOAD CLAMP HIGH-Z SAMPLE-IN SAMPLE-OUT EXTEST-OUT IDCODE BYPASS BYPASS The INSTRUCTION register is an 8-bit register which captures the default value of 10000001 (SAMPLE/PRELOAD) during the CAPTURE-IR instruction command. The benefit of capturing SAMPLE/PRELOAD as the default instruction during CAPTURE-IR is that the user is no longer required to shift in the 8-bit instruction for SAMPLE/PRELOAD. The sequence of: CAPTURE-IR → EXIT1-IR → UPDATE-IR will update the SAMPLE/PRELOAD instruction. For more information refer to the section on instruction definitions. Instruction Register Scan Chain Definition 111111 0000001000 00000001111 Scan Cell TYPE2 www.fairchildsemi.com 4 SCAN182373A BOUNDARY-SCAN Register Scan Chain Definition (42 Bits in Length) 5 www.fairchildsemi.com SCAN182373A Input BOUNDARY-SCAN Register Scan Chain Definition (22 Bits in Length) When Sample In is Active www.fairchildsemi.com 6 SCAN182373A Output BOUNDARY-SCAN Register Scan Chain Definition (20 Bits in Length) When Sample Out and Extent Out are Active 7 www.fairchildsemi.com SCAN182373A BOUNDARY-SCAN Register Definition Index Bit No. 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 Pin Name AOE1 ALE AOE BOE1 BLE BOE AI0 AI1 AI2 AI3 AI4 AI5 AI6 AI7 AI8 BI0 BI1 BI2 BI3 BI4 BI5 BI6 BI7 BI8 AO0 AO1 AO2 AO3 AO4 AO5 AO6 AO7 AO8 BO0 BO1 BO2 BO3 BO4 BO5 BO6 BO7 BO8 55 53 52 50 49 47 46 44 43 42 41 39 38 36 35 33 32 30 2 4 5 7 8 10 11 13 14 15 16 18 19 21 22 24 25 27 26 31 Pin No. 3 54 Pin Type Input Input Internal Input Input Internal Input Input Input Input Input Input Input Input Input Input Input Input Input Input Input Input Input Input Output Output Output Output Output Output Output Output Output Output Output Output Output Output Output Output Output Output Scan Cell Type TYPE1 TYPE1 TYPE2 TYPE1 TYPE1 TYPE2 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 B-out A-out B-in A-in Control Signals www.fairchildsemi.com 8 SCAN182373A Absolute Maximum Ratings(Note 1) Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias VCC Pin Potential to Ground Pin Input Voltage (Note 2) Input Current (Note 2) Voltage Applied to Any Output in Disabled or Power-Off State in the HIGH State Current Applied to Output in LOW State (Max) DC Latchup Source Current Over Voltage Latchup (I/O) ESD (HBM) Min Twice the Rated IOL (mA) −65°C to +150 °C −55°C to +125 °C −55°C to +150 °C −0.5V to +7.0V −0.5V to +7.0V −30 mA to +5.0 mA −0.5V to +5.5V −0.5V to VCC Recommended Operating Conditions Free Air Ambient Temperature Supply Voltage Minimum Input Edge Rate Data Input Enable Input −40°C to +85°C +4.5V to +5.5V (∆V/∆t) 50 mV/ns 20 mV/ns −500 mA 10V 2000V Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit of current limit is sufficient to protect inputs. DC Electrical Characteristics Symbol VIH VIL VCD VOH VOL IIH Parameter Input HIGH Voltage Input LOW Voltage Input Clamp Diode Voltage Output HIGH Voltage Output LOW Voltage Input HIGH Current All Others TMS, TDI IBVI IBVIT IIL Input HIGH Current Breakdown Test Input HIGH Current Breakdown Test (I/O) Input LOW Current All Others TMS, TDI VID IIH + IOZH IIL + LOZL IOZH IOZL IOS ICEX IZZ ICCH ICCL ICCZ ICCT ICCD Input Leakage Test Output Leakage Current Output Leakage Current Output Leakage Current Output Leakage Current Output Short-Circuit Current Output HIGH Leakage Current Bus Drainage Test Power Supply Current Power Supply Current Power Supply Current Additional ICC/Input Dynamic ICC All Other Inputs TDI, TMS Inputs No Load Min Min Min Min Max Max Max Max Max Max Max Max 0.0 Max Max Max Max Max Max 0.0 Max Max Max Max Max Max Max Max Max −100 4.75 50 −50 50 −50 −275 50 100 250 1.0 65 65.8 250 1.0 2.9 3 0.2 µA µA mA µA µA µA mA mA mA µA mA mA mA mA/ MHz Note 3: Guaranteed not tested. VCC Min 2.0 Typ Max 0.8 −1.2 Units V V V V V Conditions Recognized HIGH Signal Recognized LOW Signal IIN = −18 mA IOH = −3 mA IOH = −32 mA IOL = 15 mA VIN = 2.7V (Note 3) VIN = VCC VIN = VCC VIN = 7.0V VIN = 5.5V VIN = 0.5V (Note 3) VIN = 0.0V VIN = 0.0V IID = 1.9 µA All Other Pins Grounded VOUT = 2.7V VOUT = 0.5V VOUT = 2.7V VOUT = 0.5V VOUT = 0.0V VOUT = VCC VOUT = 5.5V All Others Grounded VOUT = VCC; TDI, TMS = VCC VOUT = VCC; TDI, TMS = GND VOUT = LOW; TDI, TMS = VCC VOUT = LOW; TDI, TMS = GND TDI, TMS = VCC TDI, TMS = GND VIN = VCC −2.1V VIN = VCC −2.1V Outputs Open One Bit Toggling, 50% Duty Cycle 2.5 2.0 0.8 5 5 5 7 100 −5 −5 −385 V µA µA µA µA µA µA µA µA V µA 9 www.fairchildsemi.com SCAN182373A AC Electrical Characteristics Normal Operation: VCC Symbol Parameter (V) (Note 4) tPLH tPHL tPLH tPHL tPLZ tPHZ tPZL tPZH Note 4: Voltage Range 5.0V ± 0.5V TA = −40°C to +85°C CL = 50 pF Min 1.2 2.0 1.3 1.8 1.6 1.8 1.6 1.0 Typ 3.7 4.5 4.1 4.5 4.9 6.0 6.0 5.0 Max 6.5 7.4 7.4 7.3 9.0 10.7 9.5 9.3 ns ns ns ns Units Propagation Delay D to Q Propagation Delay LE to Q Disable Time Enable Time 5.0 5.0 5.0 5.0 AC Operating Requirements Normal Operation: VCC Symbol Parameter (V) (Note 5) tS tH tW Setup Time, H or L Data to LE Hold Time, H or L LE to Data LE Pulse Width 5.0 2.3 ns Note 5: Voltage Range 5.0V ±0.5V TA = −40°C to +85°C CL = 50 pF Guaranteed Minimum 1.7 1.6 ns ns Units 5.0 5.0 AC Electrical Characteristics Scan Test Operation: VCC Symbol Parameter (V) (Note 6) tPLH tPHL tPLZ tPHZ tPZL tPZH tPLH tPHL tPLH tPHL tPLH tPHL tPLZ tPHZ tPLZ tPHZ tPLZ tPHZ tPZL tPZH tPZL tPZH tPZL tPZH Propagation Delay TCK to TDO Disable Time TCK to TDO Enable Time TCK to TDO Propagation Delay TCK to Data Out during Update-DR State Propagation Delay TCK to Data Out during Update-IR State Propagation Delay TCK to Data Out during Test Logic Reset State Disable Time TCK to Data Out during Update-DR State Disable Time TCK to Data Out during Update-IR State Disable Time TCK to Data Out during Test Logic Reset State Enable Time TCK to Data Out during Update-DR State Enable Time TCK to Data Out during Update-IR State Enable Time TCK to Data Out during Test Logic Reset State 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 Min 3.6 4.8 2.7 4.0 5.2 3.6 3.9 5.1 4.7 5.7 5.5 6.7 4.1 4.7 4.2 4.7 5.5 6.3 5.8 4.3 6.1 4.7 7.3 5.8 TA = −40°C to +85°C CL = 50 pF Typ 5.8 7.4 5.6 7.1 8.6 6.6 6.4 8.0 7.7 9.1 9.2 10.7 7.7 8.4 8.3 9.0 10.1 10.8 9.6 7.7 11.0 9.0 12.5 10.5 Max 8.6 10.6 9.0 10.9 12.5 10.1 9.5 11.6 11.3 13.1 13.6 15.6 12.1 12.7 13.5 14.0 15.6 16.2 14.2 11.7 16.0 13.7 18.3 15.8 ns ns ns ns ns ns ns ns ns ns ns ns Units Note 6: Voltage Range 5.0V ± 0.5V www.fairchildsemi.com 10 SCAN182373A AC Operating Requirements Scan Test Operation: VCC Symbol Parameter (V) (Note 7) tS tH tS tH tS tH Setup Time, Data to TCK (Note 8) Hold Time, Data to TCK (Note 8) Setup Time, H or L AOE 1, BOE 1 to TCK (Note 9) Hold Time, H or L TCK to AOE 1, BOE 1 (Note 9) Setup Time, H or L Internal AOE, BOE, to TCK (Note 10) Hold Time, H or L TCK to Internal AOE, BOE (Note 10) tS tH tS tH tS tH tW fMAX tPU tDN Setup Time ALE, BLE (Note 11) to TCK Hold Time TCK to ALE, BLE (Note 11) Setup Time, H or L TMS to TCK Hold Time, H or L TCK to TMS Setup Time, H or L TDI to TCK Hold Time, H or L TCK to TDI Pulse Width TCK Maximum TCK Clock Frequency Wait Time, Power Up to TCK Power Down Delay H L 5.0 5.0 0.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.1 1.8 7.9 1.8 6.0 3.0 10.3 10.3 50 100 100 ns ns ns ns ns ns ns MHz ns ms 5.0 1.8 ns 5.0 5.0 5.0 5.0 5.0 TA = −40°C to +85°C CL = 50 pF Guaranteed Minimum 2.7 2.4 5.1 1.8 3.5 ns ns ns ns ns Units Note 7: Voltage Range 5.0V ± 0.5V. Note 8: This delay represents the timing relationship between the data input and TCK at the associated scan cells numbered 0-8, 9-17, 18-26 and 27-35. Note 9: Timing pertains to BSR 38 and 41 only. Note 10: This delay represents the timing relationship between AOE/BOE and TCK for scan cells 36 and 39 only. Note 11: Timing pertains to BSR 37 and 40 only. Note: All Input Timing Delays involving TCK are measured from the rising edge of TCK. Capacitance Symbol CIN COUT Parameter Input Capacitance Output Capacitance (Note 12) Typ 5.8 13.8 Units pF pF Conditions, TA = 25°C VCC = 0.0V VCC = 5.0V Note 12: COUT is measured at frequency f = 1 MHz, per MIL-STD-883B, Method 3012 11 www.fairchildsemi.com SCAN182373A Transparent Latch with 25Ω Series Resistor Outputs Physical Dimensions inches (millimeters) unless otherwise noted 56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide Package Number MS56A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 12 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com