SCAN18541T

SCAN18541T Non-Inverting Line Driver with 3-STATE Outputs October 1991 Revised April 2000 SCAN18541T Non-Inverting Line Driver with 3-STATE Outputs General Description The SCAN18541T is a high speed, low-power line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented paired output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK). Features s IEEE 1149.1 (JTAG) Compliant s Dual output enable signals per byte s 3-STATE outputs for bus-oriented applications s 9-bit data busses for parity applications s Reduced-swing outputs source 32 mA/sink 64 mA s Guaranteed to drive 50Ω transmission line to TTL input levels of 0.8V and 2.0V s TTL compatible inputs s 25 mil pitch SSOP (Shrink Small Outline Package) s Includes CLAMP and HIGHZ instructions s Member of Fairchild’s SCAN Products Ordering Code: Order Number SCAN18541TSSC Package Number MS56A Package Description 56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Connection Diagram Pin Names Pin Names AI(0–8) BI(0–8) Description Input Pins, A Side Input Pins, B Side A Side B Side AOE1, AOE2 3-STATE Output Enable Input Pins, BOE1, BOE2 3-STATE Output Enable Input Pins, AO(0–8) AO(0–8) Output Pins, A Side Output Pins, B Side Truth Tables Inputs AOE1 L H X L AOE2 L X H L Inputs BOE1 L H X L H = HIGH Voltage Level L = LOW Voltage Level AI(0–8) H X X L AO(0–8) H Z Z L BO(0–8) H Z Z L BOE2 L X H L BI(0–8) H X X L X = Immaterial Z = High Impedance © 2000 Fairchild Semiconductor Corporation DS010965 www.fairchildsemi.com SCAN18541T Block Diagrams Byte A Tap Controller Byte B Note: BSR stands for Boundary Scan Register. www.fairchildsemi.com 2 SCAN18541T Description of Boundary-Scan Circuitry The scan cells used in the BOUNDARY-SCAN register are one of the following two types depending upon their location. Scan cell TYPE1 is intended to solely observe system data, while TYPE2 has the additional ability to control system data. Scan cell TYPE1 is located on each system input pin while scan cell TYPE2 is located at each system output pin as well as at each of the two internal active-high output enable signals. AOE controls the activity of the A-outputs while BOE controls the activity of the B-outputs. Each will activate their respective outputs by loading a logic high. The BYPASS register is a single bit shift register stage identical to scan cell TYPE1. It captures a fixed logic low. Bypass Register Scan Chain Definition Logic 0 00000000 10000001 10000010 The INSTRUCTION register is an 8-bit register which captures the default value of 10000001. The two least signifi00000011 All Others MSB→LSB Instruction Code Instruction EXTEST SAMPLE/PRELOAD CLAMP HIGH-Z BYPASS cant bits of this captured value (01) are required by IEEE Std 1149.1. The upper six bits are unique to the SCAN18541T device. SCAN CMOS Test Access Logic devices do not include the IEEE 1149.1 optional identification register. Therefore, this unique captured value can be used as a “pseudo ID” code to confirm that the correct device is placed in the appropriate location in the boundary scan chain. Instruction Register Scan Chain Definition Scan Cell TYPE1 Scan Cell TYPE2 3 www.fairchildsemi.com SCAN18541T Description of Boundary-Scan Circuitry (Continued) Boundary-Scan Register Scan Chain Definition (42 Bits in Length) www.fairchildsemi.com 4 SCAN18541T Description of Boundary-Scan Circuitry Bit No. 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 Pin Name AOE1 AOE2 AOE BOE1 BOE2 BOE AI0 AI1 AI2 AI3 AI4 AI5 AI6 AI7 AI8 BI0 BI1 BI2 BI3 BI4 BI5 BI6 BI7 BI8 AO0 AO1 AO2 AO3 AO4 AO5 AO6 AO7 AO8 BO0 BO1 BO2 BO3 BO4 BO5 BO6 BO7 BO8 55 53 52 50 49 47 46 44 43 42 41 39 38 36 35 33 32 30 2 4 5 7 8 10 11 13 14 15 16 18 19 21 22 24 25 27 26 31 Pin No. 3 54 (Continued) Boundary-Scan Register Definition Index Pin Type Input Input Internal Input Input Internal Input Input Input Input Input Input Input Input Input Input Input Input Input Input Input Input Input Input Output Output Output Output Output Output Output Output Output Output Output Output Output Output Output Output Output Output Scan Cell Type TYPE1 TYPE1 TYPE2 TYPE1 TYPE1 TYPE2 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE1 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 TYPE2 B–out A–out B–in A–in Control Signals 5 www.fairchildsemi.com SCAN18541T Absolute Maximum Ratings(Note 1) Supply Voltage (VCC ) DC Input Diode Current (IIK) VI = −0.5V VI = VCC +0.5V DC Output Diode Current (IOK) VO = −0.5V VO = VCC +0.5V DC Output Voltage (VO) DC Output Source/Sink Current (IO) DC VCC or Ground Current Per Output Pin Junction Temperature SSOP Storage Temperature ESD (Min) +140 °C −65°C to +150 °C 2000V ±70 mA −20 mA +20 mA −0.5V to VCC +0.5V ±70 mA −20 mA +20 mA −0.5V to +7.0V Recommended Operating Conditions Supply Voltage (VCC) SCAN Products Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) Minimum Input Edge Rate ∆V/∆t VIN from 0.8V to 2.0V VCC @ 4.5V, 5.5V Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. Fairchild does not recommend operation of SCAN circuits outside databook specifications. 4.5V to 5.5V 0V to VCC 0V to VCC −40°C to +85°C 125 mV/ns DC Electrical Characteristics Symbol VIH VIL VOH Parameter Minimum HIGH Input Voltage Maximum LOW Input Voltage Minimum HIGH Output Voltage (Note 3) VCC (V) 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 VOL Maximum LOW Output Voltage (Note 3) 4.5 5.5 4.5 5.5 4.5 5.5 IIN IIN TDI, TMS Maximum Input Leakage Current Maximum Input Leakage Minimum Input Leakage IOLD IOHD IOZ IOS ICC Minimum Dynamic Output Current (Note 2) Maximum Output Leakage Current Output Short Circuit Current Maximum Quiescent Supply Current 5.5 5.5 16.0 750 88 820 5.5 5.5 5.5 5.5 5.5 5.5 TA = +25°C Typ 1.5 1.5 1.5 1.5 2.0 2.0 0.8 0.8 3.15 4.15 2.4 2.4 2.4 2.4 0.1 0.1 0.55 0.55 0.55 0.55 ±0.1 2.8 −385 −160 94 −40 ±0.5 −100 ±1.0 3.6 −385 −160 94 −40 ±5.0 −100 0.1 0.1 0.55 0.55 TA = −40°C to +85°C Guaranteed Limits 2.0 2.0 0.8 0.8 3.15 4.15 2.4 2.4 Units V V V V V V V V µA µA µA µA mA mA µA mA (min) µA µA VO = Open TDI, TMS = VCC VO = Open TDI, TMS = GND Conditions VOUT = 0.1V or VCC −0.1V VOUT = 0.1V or VCC −0.1V IOUT = −50 µA VIN = VIL or VIH IOH = −32 mA VIN = VIL or VIH IOH = −24 mA IOUT = 50 µA VIN = VIL or VIH IOL = 64 mA VIN = VIL or VIH IOL = 48 mA VI = VCC, GND VI = VCC VI = GND VI = GND VOLD = 0.8V Max VOHD = 2.0V Min VI (OE) = VIL, VIH V O = 0V www.fairchildsemi.com 6 SCAN18541T DC Electrical Characteristics Symbol ICCt Parameter Maximum ICC Per Input 5.5 VCC (V) 5.5 (Continued) TA = +25°C Typ 2.0 TA = −40°C to +85°C Guaranteed Limits 2.0 mA VI = VCC–2.1V VI = VCC–2.1V 2.15 2.15 mA TDI/TMS Pin, Test One with the Other Floating Units Conditions Note 2: M aximum test duration 2.0 ms, one output loaded at a time. Note 3: All outputs loaded; thresholds associated with output under test. Noise Specifications Symbol VOLP VOLV VOHP VOHV VIHD VILD Parameter Maximum HIGH Output Noise (Note 4)(Note 5) Minimum LOW Output Noise (Note 4)(Note 5) Maximum Overshoot (Note 4)(Note 6) Minimum VCC Droop (Note 4)(Note 6) Minimum HIGH Dynamic Input Voltage Level (Note 6)(Note 7) Maximum LOW Dynamic Input Voltage Level (Note 6)(Note 7) VCC (V) 5.0 5.0 5.0 5.0 5.5 5.5 Typ 1.0 −0.6 VOH+1.0 VOH−1.0 1.6 1.4 1.5 −1.2 VOH+1.5 VOH−1.8 2.0 0.8 2.0 0.8 TA = +25°C TA = −40°C to +85°C Guaranteed Limits Units V V V V V V Note 4: M aximum number of outputs that can switch simultaneously is n. (n-1) outputs are switched LOW and one output held LOW. Note 5: M aximum number of outputs that can switch simultaneously is n. (n-1) outputs are switched HIGH and one output held HIGH. Note 6: Worst case package. Note 7: M aximum number of data inputs (n) switching. (n-1) input switching 0V to 3V. Input under test switching 3V to threshold (VILD). AC Electrical Characteristics Normal Operation: VCC Symbol Parameter (V) (Note 8) tPLH, tPHL tPLZ, tPHZ tPZL, tPZH Note 8: Voltage Range 5.0 is 5.0V ± 0.5V. TA = +25°C CL = 50 pF Min 2.5 2.5 1.5 1.5 2.0 2.0 Typ Max 9.0 9.0 10.2 10.2 11.8 9.5 TA = −40°C to +85°C CL = 50 pF Min 2.5 2.5 1.5 1.5 2.0 2.0 Max 9.8 9.8 10.7 10.7 12.8 10.5 ns ns ns Units Propagation Delay Data to Q Disable Time Enable Time 5.0 5.0 5.0 7 www.fairchildsemi.com SCAN18541T AC Electrical Characteristics Scan Test Operation: VCC Symbol Parameter (V) (Note 9) tPLH, tPHL tPLZ, tPHZ tPZL, tPZH tPLH, tPHL tPLH, tPHL tPLH, tPHL Propagation Delay TCK to TDO Disable Time TCK to TDO Enable Time TCK to TDO Propagation Delay TCK to Data Out During Update-DR State Propagation Delay TCK to Data Out During Update-IR State Propagation Delay TCK to Data Out During Test Logic Reset State tPLZ, tPHZ tPLZ, tPHZ tPLZ, tPHZ Propagation Delay TCK to Data Out During Update-DR State Propagation Delay TCK to Data Out During Update-IR State Propagation Delay TCK to Data Out During Test Logic Reset State tPZL, tPZH tPZL, tPZH tPZL, tPZH Propagation Delay TCK to Data Out During Update-DR State Propagation Delay TCK to Data Out During Update-IR State Propagation Delay TCK to Data Out During Test Logic Reset State Note: All Propagation Delays involving TCK are measured from the falling edge of TCK. Note 9: Voltage Range 5.0 is 5.0V ± 0.5V. TA = +25°C CL = 50 pF Min 3.5 3.5 2.5 2.5 3.0 3.0 5.0 Typ Max 13.2 13.2 11.5 11.5 14.5 14.5 18.0 18.0 18.6 18.6 TA = −40°C to +85°C CL = 50 pF Min 3.5 3.5 2.5 2.5 3.0 3.0 5.0 5.0 5.0 5.0 Max 14.5 14.5 11.9 11.9 15.8 15.8 19.8 19.8 20.2 20.2 ns ns ns ns ns Units 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.5 5.5 4.0 19.9 19.9 16.4 16.4 19.5 19.5 5.5 5.5 4.0 4.0 5.0 5.0 21.5 21.5 18.2 18.2 20.8 20.8 ns 5.0 4.0 5.0 ns 5.0 5.0 ns 5.0 5.0 5.0 5.0 19.9 19.9 18.9 18.9 22.4 22.4 5.0 5.0 5.0 5.0 6.5 6.5 21.5 21.5 20.9 20.9 24.2 24.2 ns 5.0 5.0 6.5 ns 5.0 6.5 ns 5.0 7.0 7.0 23.8 23.8 7.0 7.0 25.7 25.7 ns www.fairchildsemi.com 8 SCAN18541T AC Operating Requirements Scan Test Operation: VCC Symbol Parameter (V) (Note 10) tS tH tS tH tS tH tS tH tS tH tW Setup Time, H or L Data to TCK (Note 11) Hold Time, H or L TCK to Data (Note 11) Setup Time, H or L AOE n, BOEn to TCK (Note 12) Hold Time, H or L TCK to AOEn, BOEn (Note 12) Setup Time, H or L Internal AOE, BOE, to TCK (Note 13) Hold Time, H or L TCK to Internal AOE, BOE (Note 13) Setup Time, H or L TMS to TCK Hold Time, H or L TCK to TMS Setup Time, H or L TDI to TCK Hold Time, H or L TCK to TDI Pulse Width TCK H L fMAX TPU TDN Maximum TCK Clock Frequency Wait Time, Power Up to TCK Power Down Delay 5.0 5.0 0.0 5.0 15.0 5.0 25 100 100 15.0 5.0 25 100 100 MHz ns ms ns 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 3.0 4.5 3.0 4.5 3.0 3.0 8.0 2.0 4.0 4.5 TA = +25°C CL = 50 pF TA = −40°C to +85°C CL = 50 pF Units Guaranteed Minimum 3.0 4.5 3.0 4.5 3.0 3.0 8.0 2.0 4.0 4.5 ns ns ns ns ns ns ns ns ns ns Note: All Input Timing Delays involving TCK are measured from the rising edge of TCK. Note 10: Voltage Range 5.0 is 5.0V ± 0.5V. Note 11: This delay represents the timing relationship between the data input and TCK at the associated scan cells numbered 0-8, 9-17, 18-26 and 27-35. Note 12: Timing pertains to BSR 37, 38, 40 and 41 only. Note 13: This delay represents the timing relationship between AOE/BOE and TCK for scan cells 36 and 39 only. 9 www.fairchildsemi.com SCAN18541T Extended AC Electrical Characteristics TA = +25°C VCC = 5.0V Symbol Parameter CL = 50 pF 18 Outputs Switching (Note 14) Min tPLH, tPHL tPZH, tPZL tPHZ, tPLZ tOSHL (Note 18) tOSLH (Note 18) Pin to Pin Skew HL Data to Output Pin to Pin Skew LH Data to Output Output Disable Time Propagation Delay Data to Output Output Enable Time 3.0 3.0 2.5 2.5 2.0 2.0 0.5 0.5 Typ Max 11.0 11.0 11.5 14.0 11.5 11.5 1.0 1.0 Min 4.0 4.0 TA = −40°C to +85°C VCC = 5.0V ± 0.5V CL = 250 pF (Note 5) Max 13.0 15.0 (Note 16) (Note 17) 1.0 1.0 ns ns ns ns ns Units Note 14: This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase (i.e., all LOW-toHIGH, HIGH-to-LOW, etc.). Note 15: This specification is guaranteed but not tested. The limits represent propagation delays with 250 pF load capacitors in place of the 50 pF load capacitors in the standard AC load. This specification pertains to single output switching only. Note 16: 3-STATE delays are load dominated and have been excluded from the datasheet. Note 17: The Output Disable Time is dominated by the RC network (500Ω, 250 pF) on the output and has been excluded from the datasheet. Note 18: Skew is defined as the absolute value of the difference between the actual propagation delays for any two separate outputs of the same device. The specification applies to any outputs switching HIGH-to-LOW (tOSHL), LOW-to-HIGH (tOSLH), or any combination switching LOW-to-HIGH and/or HIGHto-LOW. Capacitance Symbol CIN COUT CPD Parameter Input Pin Capacitance Output Pin Capacitance Power Dissipation Capacitance Typ 4.0 13.0 34.0 Units pF pF pF Conditions VCC = 5.0V VCC = 5.0V VCC = 5.0V www.fairchildsemi.com 10 SCAN18541T Non-Inverting Line Driver with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted 56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide Package Number MS56A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 11 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com www.fairchildsemi.com