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MRF5S9070NR1

MRF5S9070NR1

  • 厂商:

    FREESCALE(飞思卡尔)

  • 封装:

  • 描述:

    MRF5S9070NR1 - RF Power Field Effect Transistor N-Channel Enhancement-Mode Lateral MOSFET - Freescal...

  • 数据手册
  • 价格&库存
MRF5S9070NR1 数据手册
Freescale Semiconductor Technical Data Document Number: MRF5S9070NR1 Rev. 6, 5/2006 RF Power Field Effect Transistor N - Channel Enhancement - Mode Lateral MOSFET Designed for broadband commercial and industrial applications with frequencies up to 1000 MHz. The high gain and broadband performance of this device make it ideal for large - signal, common - source amplifier applications in 26 volt base station equipment. • Typical Single - Carrier N - CDMA Performance @ 880 MHz, VDD = 26 Volts, IDQ = 600 mA, Pout = 14 Watts Avg., IS - 95 CDMA (Pilot, Sync, Paging, Traffic Codes 8 Through 13) Power Gain — 17.8 dB Drain Efficiency — 30% ACPR @ 750 kHz Offset — - 47 dBc in 30 kHz Bandwidth • Capable of Handling 10:1 VSWR, @ 26 Vdc, 880 MHz, 70 Watts CW Output Power Features • Characterized with Series Equivalent Large - Signal Impedance Parameters • Integrated ESD Protection • 200°C Capable Plastic Package • N Suffix Indicates Lead - Free Terminations. RoHS Compliant. • In Tape and Reel. R1 Suffix = 500 Units per 24 mm, 13 inch Reel. MRF5S9070NR1 880 MHz, 70 W, 26 V SINGLE N - CDMA LATERAL N - CHANNEL BROADBAND RF POWER MOSFET CASE 1265 - 08, STYLE 1 TO - 270 - 2 PLASTIC Table 1. Maximum Ratings Rating Drain - Source Voltage Gate - Source Voltage Total Device Dissipation @ TC = 25°C Derate above 25°C Storage Temperature Range Operating Junction Temperature Symbol VDSS VGS PD Tstg TJ Value - 0.5, + 68 - 0.5, + 15 219 1.25 - 65 to +150 200 Unit Vdc Vdc W W/°C °C °C Table 2. Thermal Characteristics Characteristic Thermal Resistance, Junction to Case Case Temperature 80°C, 70 W CW Case Temperature 78°C, 14 W CW Symbol RθJC Value (1,2) 0.80 0.93 Unit °C/W Table 3. ESD Protection Characteristics Test Methodology Human Body Model (per JESD22 - A114) Machine Model (per EIA/JESD22 - A115) Charge Device Model (per JESD22 - C101) Class 2 (Minimum) A (Minimum) IV (Minimum) Table 4. Moisture Sensitivity Level Test Methodology Per JESD 22 - A113, IPC/JEDEC J - STD - 020 Rating 1 Package Peak Temperature 260 Unit °C 1. MTTF calculator available at http://www.freescale.com/rf . Select Tools/Software/Application Software/Calculators to access the MTTF calculators by product. 2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf . Select Documentation/Application Notes - AN1955. © Freescale Semiconductor, Inc., 2006. All rights reserved. MRF5S9070NR1 1 RF Device Data Freescale Semiconductor Table 5. Electrical Characteristics (TC = 25°C unless otherwise noted) Characteristic Off Characteristics Zero Gate Voltage Drain Leakage Current (VDS = 68 Vdc, VGS = 0 Vdc) Zero Gate Voltage Drain Leakage Current (VDS = 26 Vdc, VGS = 0 Vdc) Gate - Source Leakage Current (VGS = 5 Vdc, VDS = 0 Vdc) On Characteristics Gate Threshold Voltage (VDS = 10 Vdc, ID = 200 μA) Gate Quiescent Voltage (VDS = 26 Vdc, ID = 600 mAdc) Drain - Source On - Voltage (VGS = 10 Vdc, ID = 1.0 Adc) Forward Transconductance (VDS = 10 Vdc, ID = 4 Adc) Dynamic Characteristic Input Capacitance (VDS = 26 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc) Output Capacitance (VDS = 26 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc) Reverse Transfer Capacitance (VDS = 26 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc) Ciss Coss Crss — — — 126 34 1.37 — — — pF pF pF VGS(th) VGS(Q) VDS(on) gfs 2 — — — 2.7 3.7 0.18 4.7 4 — 0.22 — Vdc Vdc Vdc S IDSS IDSS IGSS — — — — — — 10 1 1 μAdc μAdc μAdc Symbol Min Typ Max Unit Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 26 Vdc, IDQ = 600 mA, Pout = 14 W Avg., f = 880 MHz, Single - Carrier N - CDMA, 1.2288 MHz Channel Bandwidth Carrier. ACPR measured in 30 kHz Channel Bandwidth @ ±750 kHz Offset. PAR = 9.8 dB @ 0.01% Probability on CCDF Power Gain Drain Efficiency Adjacent Channel Power Ratio Input Return Loss Gps ηD ACPR IRL 17 29 — — 17.8 30 - 47 - 19 — — - 45 -9 dB % dBc dB Typical GSM CW Performances (In Freescale GSM Test Fixture Optimized for 921 - 960 MHz, 50 οhm system) VDD = 26 Vdc, IDQ = 400 mA, Pout = 60 W, f = 921 - 960 MHz Power Gain Drain Efficiency Input Return Loss Pout @ 1 dB Compression Point (f = 940 MHz) Gps ηD IRL P1dB — — — — 16.4 62 - 12 68 — — — — dB % dB W Typical GSM EDGE Performances (In Freescale GSM EDGE Test Fixture Optimized for 921 - 960 MHz, 50 οhm system) VDD = 26 Vdc, IDQ = 400 mA, Pout = 25 W Avg., f = 921 - 960 MHz, GSM EDGE Signal Power Gain Drain Efficiency Error Vector Magnitude Spectral Regrowth at 400 kHz Offset Spectral Regrowth at 600 kHz Offset Gps ηD EVM SR1 SR2 — — — — — 17 44 1.5 - 62 - 78 — — — — — dB % % dBc dBc (continued) MRF5S9070NR1 2 RF Device Data Freescale Semiconductor Table 5. Electrical Characteristics (TC = 25°C unless otherwise noted) (continued) Characteristic Symbol Min Typ Max Unit Typical GSM CW Performances (In Freescale GSM Test Fixture Optimized for 865 - 895 MHz, 50 οhm system) VDD = 26 Vdc, IDQ = 400 mA, Pout = 60 W, f = 865 - 895 MHz Power Gain Drain Efficiency Input Return Loss Pout @ 1 dB Compression Point (f = 880 MHz) Gps ηD IRL P1dB — — — — 16.4 59 - 15 71 — — — — dB % dB W Typical GSM EDGE Performances (In Freescale GSM EDGE Test Fixture Optimized for 865 - 895 MHz, 50 οhm system) VDD = 26 Vdc, IDQ = 400 mA, Pout = 25 W Avg., f = 865 - 895 MHz, GSM EDGE Signal Power Gain Drain Efficiency Error Vector Magnitude Spectral Regrowth at 400 kHz Offset Spectral Regrowth at 600 kHz Offset Gps ηD EVM SR1 SR2 — — — — — 17 41 1.35 - 66 - 81 — — — — — dB % % dBc dBc MRF5S9070NR1 RF Device Data Freescale Semiconductor 3 VSUPPLY B2 C18 VBIAS + C7 L2 R1 + C11 R2 R3 RF INPUT Z1 L1 C5 Z2 C1 C2 Z3 Z4 Z5 Z6 Z7 C3 Z8 C4 Z9 C6 DUT Z10 Z11 C13 C12 Z12 C14 Z13 Z14 C15 Z15 C16 C17 Z16 RF OUTPUT B1 C8 + C9 C10 C22 C19 + C20 + C21 R4 Z1 Z2 Z3 Z4 Z5 Z6 Z7 Z8 Z9 0.140″ x 0.060″ Microstrip 0.141″ x 0.060″ Microstrip 0.280″ x 0.060″ Microstrip 0.500″ x 0.100″ Microstrip 0.530″ x 0.270″ Microstrip 0.155″ x 0.270″ x 0.530″ Taper 0.376″ x 0.530″ Microstrip 0.116″ x 0.530″ Microstrip 0.055″ x 0.530″ Microstrip Z10 Z11 Z12 Z13 Z14 Z15 Z16 PCB 0.245″ x 0.270″ Microstrip 0.110″ x 0.270″ Microstrip 0.055″ x 0.270″ Microstrip 0.512″ x 0.060″ Microstrip 0.106″ x 0.060″ Microstrip 0.930″ x 0.060″ Microstrip 0.365″ x 0.060″ Microstrip Taconic RF - 35, 0.030″, εr = 3.5 Figure 1. MRF5S9070NR1 Test Circuit Schematic Table 6. MRF5S9070NR1 Test Circuit Component Designations and Values Part B1 B2 C1 C2 C3 C4, C16 C5, C6 C7, C8, C20 C9, C19, C22 C10, C18 C11 C12, C14 C13 C15 C17 C21 L1, L2 R1 R2 R3 R4 Description Small Ferrite Bead, Surface Mount Large Ferrite Bead, Surface Mount 0.6 - 6.0 pF Variable Capacitor, Gigatrim 16 pF Chip Capacitor 7.5 pF Chip Capacitor 0.8 - 8.0 pF Variable Capacitor, Gigatrim 15 pF Chip Capacitors 10 μF, 35 V Tantalum Capacitors 0.58 μF Chip Capacitors 18 pF Chip Capacitors 100 μF, 50 V Electrolytic Capacitor 13 pF Chip Capacitors 0.7 pF Chip Capacitor 3.9 pF Chip Capacitor 22 pF Chip Capacitor 470 μF, 63 V Electrolytic Capacitor 12.5 nH Surface Mount Inductors 1 kW Chip Resistor 560 kW Chip Resistor 12 W Chip Resistor 27 W Chip Resistor Part Number 2743019447 2743021447 272715L 100B160JP500X 100B7R5JP500X 272915L 100B150JP500X T491D106K035AS 700A561MP150X 100B180JP500X 515D107M050BB6A 100B130JP500X 100B0R7BP500X 100B3R9JP500X 100B180JP500X SME63VB471M12X25LL A04T - 5 Manufacturer Fair - Rite Fair - Rite Johanson ATC ATC Johanson ATC Kemet ATC ATC Vishay - Dale ATC ATC ATC ATC United Chemi - Con Coilcraft MRF5S9070NR1 4 RF Device Data Freescale Semiconductor B1 C7 R1 VGG C11 C2 C1 R2 R3 C8 C9 C19 B2 C21 VDD C20 R4 C22 C10 C6 L1 C12 C3 C5 C18 L2 C15 C16 C13 C14 C17 C4 CUT OUT AREA MRF5S9070N Rev 0 Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have no impact on form, fit or function of the current product. Figure 2. MRF5S9070NR1 Test Circuit Component Layout MRF5S9070NR1 RF Device Data Freescale Semiconductor 5 TYPICAL CHARACTERISTICS ηD, DRAIN EFFICIENCY (%) 20 19 18 17 16 15 14 13 12 11 10 9 8 860 865 870 875 880 885 890 895 f, FREQUENCY (MHz) Gps ηD VDD = 26 Vdc, Pout = 14 W (Avg.), IDQ = 600 mA Single−Carrier N−CDMA, IS−95 (Pilot, Sync, Paging, Traffic Codes 8 through 13) 45 40 35 30 25 −40 −45 ACPR ALT −50 −55 −60 −65 −70 900 G ps , POWER GAIN (dB) ACPR (dBc), ALT (dBc) IRL −12 −15 −18 −21 −24 −27 −30 Figure 3. Class AB Broadband Performance 20 IMD, THIRD ORDER INTERMODULATION DISTORTION (dBc) IDQ = 900 mA 750 mA 600 mA 450 mA 17 300 mA 16 VDD = 26 Vdc f1 = 880 MHz, f2 = 880.1 MHz Two−Tone Measurements 100 kHz Tone Spacing 10 Pout, OUTPUT POWER (WATTS) PEP 100 −20 −25 −30 −35 −40 −45 −50 −55 −60 1 1 10 Pout, OUTPUT POWER (WATTS) PEP 100 450 mA 300 mA 750 mA 600 mA VDD = 26 Vdc f1 = 880 MHz, f2 = 880.1 MHz Two−Tone Measurements 100 kHz Tone Spacing IDQ = 900 mA 19 G ps , POWER GAIN (dB) 18 15 Figure 4. Two - Tone Power Gain versus Output Power Figure 5. Third Order Intermodulation Distortion versus Output Power ηD, DRAIN EFFICIENCY (%) IMD, INTERMODULATION DISTORTION (dBc) IMD, INTERMODULATION DISTORTION (dBc) 20 Gps 18 G ps , POWER GAIN (dB) 16 ηD 14 12 10 8 1 10 Pout, OUTPUT POWER (WATTS) PEP 100 IMD VDD = 26 Vdc, IDQ = 600 mA f1 = 880 MHz, f2 = 880.1 MHz Two−Tone Measurements, 100 kHz Tone Spacing 60 40 20 0 −20 −40 −60 −10 −20 −30 −40 −50 −60 −70 −80 −90 1 10 Pout, OUTPUT POWER (WATTS) PEP 100 VDD = 26 Vdc, IDQ = 600 mA f1 = 880 MHz, f2 = 880.1 MHz Two−Tone Measurements (f1 + f2)/2 = Center Frequency of 880 MHz 100 kHz Tone Spacing 3rd Order 5th Order 7th Order Figure 6. Power Gain, Drain Efficiency and IMD versus Output Power Figure 7. Intermodulation Distortion Products versus Output Power MRF5S9070NR1 6 RF Device Data Freescale Semiconductor IRL, INPUT RETURN LOSS (dB) TYPICAL CHARACTERISTICS 55 54 Pout , OUTPUT POWER (dBm) 53 52 51 50 49 48 47 46 45 27 28 29 30 31 32 33 34 35 36 37 Pin, INPUT POWER (dBm) Actual VDD = 26 Vdc, IDQ = 600 mA Pulsed CW, 8 μsec (on), 1 msec (off) f = 880 MHz P3dB = 49.78 dBm (94.97 W) Ideal 18 G ps , POWER GAIN (dB) 16 14 12 10 ACPR 8 ALT 6 1 10 Pout, OUTPUT POWER (WATTS) AVG. −80 −60 20 Gps 60 40 20 0 VDD = 26 Vdc, IDQ = 600 mA, f = 880 MHz −20 Single−Carrier N−CDMA, IS−95 (Pilot, Sync, Paging, Traffic Codes 8 through 13) −40 ACPR, ADJACENT CHANNEL POWER RATIO (dBc) ηD, DRAIN EFFICIENCY (%) ηD P1dB = 49.11 dBm (81.54 W) Figure 8. Pulse CW Output Power versus Input Power 20 18 16 14 12 10 8 1 10 Gps Figure 9. N - CDMA ACPR, Power Gain and Drain Efficiency versus Output Power 70 60 50 40 30 VDD = 26 Vdc IDQ = 600 mA f = 880 MHz 100 20 10 ηD, DRAIN EFFICIENCY (%) ηD Pout, OUTPUT POWER (WATTS) CW Figure 10. Power Gain and Drain Efficiency versus CW Output Power 109 MTTF FACTOR (HOURS X AMPS2) 108 107 106 90 100 110 120 130 140 150 160 170 180 190 200 210 TJ, JUNCTION TEMPERATURE (°C) This above graph displays calculated MTTF in hours x ampere2 drain current. Life tests at elevated temperatures have correlated to better than ±10% of the theoretical prediction for metal failure. Divide MTTF factor by ID2 for MTTF in a particular application. Figure 11. MTTF Factor versus Junction Temperature MRF5S9070NR1 RF Device Data Freescale Semiconductor 7 N - CDMA TEST SIGNAL 100 10 PROBABILITY (%) 1 0.1 0.01 0.001 0.0001 0 2 4 6 8 10 PEAK−TO−AVERAGE (dB) IS−95 CDMA (Pilot, Sync, Paging, Traffic Codes 8 Through 13) 1.2288 MHz Channel Bandwidth Carriers. ACPR Measured in 30 kHz Bandwidth @ ±750 kHz Offset. ALT1 Measured in 30 kHz Bandwidth @ ±1.98 MHz Offset. PAR = 9.8 dB @ 0.01% Probability on CCDF. (dB) −10 −20 −30 −40 −50 −60 −70 −80 −90 −100 1.2288 MHz Channel BW . ... ..... . .. .............................. ............ ............. . . .. . . . . . . . . . . . . . . . . . . −ALT1 in 30 kHz +ALT1 in 30 kHz . . . . Integrated BW Integrated BW .... . . . ............ ........... ...... .... ........ ..... ... . ....... ....... .. ... ....... . .... .... .. . . .. ......... ......... ... . ..... ...... ....... .. ..... . ..... ... ... . .... .... . ..... .... . ..... . .... ......... . .. .. . ...... .... ....... .. ........ −ACPR in 30 kHz +ACPR in 30 kHz .............. . . .. . . ... .... .......... ..... . ............... . ......... .... ........... Integrated BW Integrated BW .. ...... ............ . . ...... ... . .. .. ...... ....... ... Figure 12. Single - Carrier CCDF N - CDMA −110 −3.6 −2.9 −2.2 −1.5 −0.7 0 0.7 1.5 2.2 2.9 3.6 f, FREQUENCY (MHz) Figure 13. Single - Carrier N - CDMA Spectrum MRF5S9070NR1 8 RF Device Data Freescale Semiconductor Zo = 2 Ω f = 895 MHz Zsource f = 895 MHz f = 865 MHz Zload f = 865 MHz VDD = 26 Vdc, IDQ = 600 mA, Pout = 14 W Avg. f MHz 865 875 885 895 Zsource Ω 0.7 + j0.4 0.7 + j0.5 0.6 + j0.5 0.5 + j0.5 Zload Ω 2.1 + j0.6 2.0 + j0.7 1.8 + j0.8 1.8 + j0.9 Zsource = Test circuit impedance as measured from gate to ground. Zload = Test circuit impedance as measured from drain to ground. Input Matching Network Device Under Test Output Matching Network Z source Z load Figure 14. Series Equivalent Source and Load Impedance MRF5S9070NR1 RF Device Data Freescale Semiconductor 9 NOTES MRF5S9070NR1 10 RF Device Data Freescale Semiconductor NOTES MRF5S9070NR1 RF Device Data Freescale Semiconductor 11 NOTES MRF5S9070NR1 12 RF Device Data Freescale Semiconductor PACKAGE DIMENSIONS MRF5S9070NR1 RF Device Data Freescale Semiconductor 13 MRF5S9070NR1 14 RF Device Data Freescale Semiconductor MRF5S9070NR1 RF Device Data Freescale Semiconductor 15 How to Reach Us: Home Page: www.freescale.com E - mail: support@freescale.com USA/Europe or Locations Not Listed: Freescale Semiconductor Technical Information Center, CH370 1300 N. Alma School Road Chandler, Arizona 85224 +1 - 800 - 521 - 6274 or +1 - 480 - 768 - 2130 support@freescale.com Europe, Middle East, and Africa: Freescale Halbleiter Deutschland GmbH Technical Information Center Schatzbogen 7 81829 Muenchen, Germany +44 1296 380 456 (English) +46 8 52200080 (English) +49 89 92103 559 (German) +33 1 69 35 48 48 (French) support@freescale.com Japan: Freescale Semiconductor Japan Ltd. Headquarters ARCO Tower 15F 1 - 8 - 1, Shimo - Meguro, Meguro - ku, Tokyo 153 - 0064 Japan 0120 191014 or +81 3 5437 9125 support.japan@freescale.com Asia/Pacific: Freescale Semiconductor Hong Kong Ltd. Technical Information Center 2 Dai King Street Tai Po Industrial Estate Tai Po, N.T., Hong Kong +800 2666 8080 support.asia@freescale.com For Literature Requests Only: Freescale Semiconductor Literature Distribution Center P.O. Box 5405 Denver, Colorado 80217 1 - 800 - 441 - 2447 or 303 - 675 - 2140 Fax: 303 - 675 - 2150 LDCForFreescaleSemiconductor@hibbertgroup.com Information in this document is provided solely to enable system and software implementers to use Freescale Semiconductor products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits or integrated circuits based on the information in this document. Freescale Semiconductor reserves the right to make changes without further notice to any products herein. Freescale Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Freescale Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be provided in Freescale Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals”, must be validated for each customer application by customer’s technical experts. Freescale Semiconductor does not convey any license under its patent rights nor the rights of others. Freescale Semiconductor products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Freescale Semiconductor product could create a situation where personal injury or death may occur. Should Buyer purchase or use Freescale Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold Freescale Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Freescale Semiconductor was negligent regarding the design or manufacture of the part. Freescalet and the Freescale logo are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © Freescale Semiconductor, Inc. 2006. All rights reserved. RoHS-compliant and/or Pb-free versions of Freescale products have the functionality and electrical characteristics of their non-RoHS-compliant and/or non-Pb-free counterparts. For further information, see http://www.freescale.com or contact your Freescale sales representative. For information on Freescale’s Environmental Products program, go to http://www.freescale.com/epp. MRF5S9070NR1 1Rev. 6, 5/2006 6 Document Number: MRF5S9070NR1 RF Device Data Freescale Semiconductor
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