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MRF6P9220HR3_06

MRF6P9220HR3_06

  • 厂商:

    FREESCALE(飞思卡尔)

  • 封装:

  • 描述:

    MRF6P9220HR3_06 - RF Power Field Effect Transistor N-Channel Enhancement-Mode Lateral MOSFET - Frees...

  • 数据手册
  • 价格&库存
MRF6P9220HR3_06 数据手册
Freescale Semiconductor Technical Data Document Number: MRF6P9220H Rev. 2, 5/2006 RF Power Field Effect Transistor N - Channel Enhancement - Mode Lateral MOSFET Designed for broadband commercial and industrial applications with frequencies up to 1000 MHz. The high gain and broadband performance of these devices make them ideal for large - signal, common - source amplifier applications in 28 volt base station equipment. • Typical Single - Carrier N - CDMA Performance @ 880 MHz: VDD = 28 Volts, IDQ = 1600 mA, Pout = 47 Watts Avg., IS - 95 CDMA (Pilot, Sync, Paging, Traffic Codes 8 Through 13). Channel Bandwidth = 1.2288 MHz. PAR = 9.8 dB @ 0.01% Probability on CCDF. Power Gain — 20 dB Drain Efficiency — 30% ACPR @ 750 kHz Offset — - 47.1 dBc in 30 kHz Bandwidth • Capable of Handling 10:1 VSWR, @ 28 Vdc, 880 MHz, 220 Watts CW Output Power Features • Characterized with Series Equivalent Large - Signal Impedance Parameters • Internally Matched for Ease of Use • Device Designed for Push - Pull Operation Only • Qualified Up to a Maximum of 32 VDD Operation • Integrated ESD Protection • Lower Thermal Resistance Package • Designed for Lower Memory Effects and Wide Instantaneous Bandwidth Applications • Low Gold Plating Thickness on Leads, 40μ″ Nominal. • RoHS Compliant • In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel. MRF6P9220HR3 880 MHz, 47 W AVG., 28 V SINGLE N - CDMA LATERAL N - CHANNEL RF POWER MOSFET CASE 375G - 04, STYLE 1 NI - 860C3 Table 1. Maximum Ratings Rating Drain- Source Voltage Gate- Source Voltage Total Device Dissipation @ TC = 25°C Derate above 25°C Storage Temperature Range Case Operating Temperature Operating Junction Temperature Symbol VDSS VGS PD Tstg TC TJ Value - 0.5, +68 - 0.5, +12 700 4 - 65 to +150 150 200 Unit Vdc Vdc W W/°C °C °C °C Table 2. Thermal Characteristics Characteristic Thermal Resistance, Junction to Case Case Temperature 80°C, 220 W CW Case Temperature 76°C, 47 W CW Symbol RθJC Value(1,2) 0.25 0.28 Unit °C/W 1. MTTF calculator available at http://www.freescale.com/rf. Select Tools/Software/Application Software/Calculators to access the MTTF calculators by product. 2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. © Freescale Semiconductor, Inc., 2006. All rights reserved. MRF6P9220HR3 1 RF Device Data Freescale Semiconductor Table 3. ESD Protection Characteristics Test Methodology Human Body Model (per JESD22 - A114) Machine Model (per EIA/JESD22 - A115) Charge Device Model (per JESD22 - C101) Class 3B (Minimum) C (Minimum) IV (Minimum) Table 4. Electrical Characteristics (TC = 25°C unless otherwise noted) Characteristic Off Characteristics (1) Symbol IDSS IDSS IGSS Min — — — Typ — — — Max 10 1 1 Unit μAdc μAdc μAdc Zero Gate Voltage Drain Leakage Current (4) (VDS = 68 Vdc, VGS = 0 Vdc) Zero Gate Voltage Drain Leakage Current (4) (VDS = 28 Vdc, VGS = 0 Vdc) Gate- Source Leakage Current (VGS = 5 Vdc, VDS = 0 Vdc) On Characteristics Gate Threshold Voltage (1) (VDS = 10 Vdc, ID = 350 μAdc) Gate Quiescent Voltage (3) (VDS = 28 Vdc, ID = 1600 mAdc, Measured in Functional Test) Drain- Source On - Voltage (1) (VGS = 10 Vdc, ID = 2.4 Adc) Forward Transconductance (1) (VDS = 10 Vdc, ID = 2.4 Adc) Dynamic Characteristics (1,2) Reverse Transfer Capacitance (VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc) VGS(th) VGS(Q) VDS(on) gfs 1 2 0.1 — 2.2 2.8 0.22 7.4 3 4 0.3 — Vdc Vdc Vdc S Crss — 2.1 — pF Functional Tests (3) (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 1600 mA, Pout = 47 W Avg. N - CDMA, f = 880 MHz, Single - Carrier N - CDMA, 1.2288 MHz Channel Bandwidth Carrier. ACPR measured in 30 kHz Channel Bandwidth @ ±750 kHz Offset. PAR = 9.8 dB @ 0.01% Probability on CCDF. Power Gain Drain Efficiency Adjacent Channel Power Ratio Input Return Loss 1. 2. 3. 4. Each side of device measured separately. Part internally matched both on input and output. Measurement made with device in push - pull configuration. Drains are tied together internally as this is a total device value. Gps ηD ACPR IRL 18.5 28.5 — — 20 30 - 47.1 - 14 23 — - 45 -9 dB % dBc dB MRF6P9220HR3 2 RF Device Data Freescale Semiconductor R1 VBIAS B1 + R3 COAX1 C1 C2 C3 Z19 Z8 Z10 Z12 Z14 Z16 C14 C10 Z3 C5 R2 COAX2 VBIAS + C9 C7 C8 C24 Z1, Z18 Z2, Z3 Z4, Z5 Z6, Z7 Z8, Z9 0.401″ x 0.081″ Microstrip 0.563″ x 0.081″ Microstrip 0.416″ x 0.727″ Microstrip 0.058″ x 1.01″ Microstrip 0.191″ x 0.507″ Microstrip Z10, Z11 Z12, Z13 Z14, Z15 Z16, Z17 Z19, Z20 PCB + C19 C20 + C22 C21 B2 Z7 Z20 C6 Z5 DUT C11 C12 RF Z18 OUTPUT C23 + C15 C16 + C18 C17 VSUPPLY COAX3 Z6 Z2 RF INPUT Z1 C4 Z4 Z9 Z13 Z15 Z17 C13 Z11 COAX4 VSUPPLY 1.054″ x 0.150″ Microstrip 0.225″ x 0.507″ Microstrip 0.440″ x 0.335″ Microstrip 0.123″ x 0.140″ Microstrip 0.165″ x 0.339″ Microstrip GX - 0300, 0.030″, εr = 2.55 Figure 1. MRF6P9220HR3 Test Circuit Schematic Table 5. MRF6P9220HR3 Test Circuit Component Designations and Values Part B1, B2 C1, C9 C2, C7, C17, C21 C3, C8, C16, C20 C4, C5, C13, C14 C6, C12 C10 C11 C15, C19 C18, C22 C23, C24 Coax1, 2, 3, 4 R1, R2 R3 Description Ferrite Beads, Short 1.0 μF, 50 V Tantalum Chip Capacitors 0.1 μF Chip Capacitors 1000 pF 100B Chip Capacitors 100 pF 100B Chip Capacitors 8.2 pF 600B Chip Capacitors 9.1 pF 600B Chip Capacitor 1.8 pF 600B Chip Capacitor 47 μF, 50 V Electrolytic Capacitors 470 μF, 63 V Electrolytic Capacitors 22 pF 600B Chip Capacitors 50 Ω, Semi Rigid Coax, 2.40″ Long 10 Ω, 1/8 W Chip Resistors (1206) 1.0 kΩ, 1/8 W Chip Resistor (1206) Part Number 2743019447 T491C105K050AS CDR33BX104AKWS 100B102JP50X 100B101JP500X 600B8R2BT250XT 600B9R1BT250XT 600B1R8BT250XT MVK50VC47RM8X10TP SME63V471M12X25LL 600B220FT250XT UT - 141A- TP Kemet Kemet ATC ATC ATC ATC ATC Nippon United Chemi - Con ATC Micro - Coax Manufacturer Fair- Rite MRF6P9220HR3 RF Device Data Freescale Semiconductor 3 C1 B1 C3 C15 C18 VDD C16 C17 VGG R3 C2 R1 C23 COAX1 COAX3 MRF6P9220, Rev. 1 C4 CUT OUT AREA C11 C10 C12 C14 C6 C5 C13 COAX2 COAX4 C20 VGG C7 C8 B2 C24 VDD C21 C9 R2 C19 C22 Figure 2. MRF6P9220HR3 Test Circuit Component Layout MRF6P9220HR3 4 RF Device Data Freescale Semiconductor TYPICAL CHARACTERISTICS ηD, DRAIN EFFICIENCY (%) ACPR (dBc), ALT1 (dBc) −7 −9 −11 −13 −15 −17 ηD, DRAIN EFFICIENCY (%) ACPR (dBc), ALT1 (dBc) −7 −9 −11 −13 −15 −17 2400 mA −50 2000 mA 1600 mA −60 3 10 100 500 5 10 100 Pout, OUTPUT POWER (WATTS) PEP 500 Pout, OUTPUT POWER (WATTS) PEP IRL, INPUT RETURN LOSS (dB) IRL, INPUT RETURN LOSS (dB) 21 20.7 20.4 Gps, POWER GAIN (dB) 20.1 19.8 19.5 19.2 18.9 18.6 18.3 18 850 860 870 880 890 900 f, FREQUENCY (MHz) ALT1 IRL ACPR VDD = 28 Vdc, Pout = 47 W (Avg.) IDQ = 1600 mA, N−CDMA IS−95 (Pilot, Sync, Paging, Traffic Codes 8 Through 13) Gps ηD 31 30 29 28 27 −45 −50 −55 −60 −65 −70 910 Figure 3. Single - Carrier N - CDMA Broadband Performance @ Pout = 47 Watts Avg. 20 19.8 V = 28 Vdc, Pout = 94 W (Avg.) 19.6 DD IDQ = 1600 mA, N−CDMA IS−95 19.4 (Pilot, Sync, Paging, Traffic Codes 8 Through 13) 19.2 19 18.8 18.6 18.4 18.2 18 850 860 870 880 890 900 f, FREQUENCY (MHz) ALT1 IRL ACPR ηD 42 41 40 39 Gps 38 −35 −40 −45 −50 −55 −60 910 20.5 20 Gps, POWER GAIN (dB) 19.5 19 18.5 800 mA 18 17.5 17 VDD = 28 Vdc, f1 = 879.95 MHz, f2 = 880.05 MHz Two−Tone Measurements, 100 kHz Tone Spacing 2000 mA 1600 mA IMD, THIRD ORDER INTERMODULATION DISTORTION (dBc) IDQ = 2400 mA Gps, POWER GAIN (dB) Figure 4. Single - Carrier N - CDMA Broadband Performance @ Pout = 94 Watts Avg. −10 VDD = 28 Vdc, f1 = 879.95 MHz, f2 = 880.05 MHz Two−Tone Measurements, 100 kHz Tone Spacing −20 −30 1200 mA IDQ = 800 mA −40 1200 mA Figure 5. Two - Tone Power Gain versus Output Power Figure 6. Third Order Intermodulation Distortion versus Output Power MRF6P9220HR3 RF Device Data Freescale Semiconductor 5 TYPICAL CHARACTERISTICS −10 IMD, INTERMODULATION DISTORTION (dBc) IMD, INTERMODULATION DISTORTION (dBc) −20 −30 −40 −50 −60 −70 −80 −90 7 10 100 Pout, OUTPUT POWER (WATTS) PEP 500 7th Order 3rd Order 5th Order VDD = 28 Vdc, IDQ = 1600 mA, f1 = 879.95 MHz f2 = 880.05 MHz, Two−Tone Measurements −20 −25 −30 −35 −40 −45 −50 −55 −60 0.1 1 TWO−TONE SPACING (MHz) 10 50 7th Order 3rd Order 5th Order VDD = 28 Vdc, Pout = 220 W (PEP) IDQ = 1600 mA, Two−Tone Measurements (f1 + f2)/2 = Center Frequency of 880 MHz Figure 7. Intermodulation Distortion Products versus Output Power Figure 8. Intermodulation Distortion Products versus Tone Spacing 61 Pout, OUTPUT POWER (dBm) 59 57 P6dB = 54.95 dBm (312.77 W) Ideal P3dB = 54.60 dBm (288.76 W) P1dB = 54.05 dBm (255.09 W) 55 53 51 49 29 31 33 35 37 39 41 Pin, INPUT POWER (dBm) VDD = 28 Vdc, IDQ = 1600 mA Pulsed CW, 8 μsec(on), 1 msec(off) f = 880 MHz Actual Figure 9. Pulse CW Output Power versus Input Power ACPR, ADJACENT CHANNEL POWER RATIO (dBc) ηD, DRAIN EFFICIENCY (%), Gps, POWER GAIN (dB) 50 VDD = 28 Vdc, IDQ = 1600 mA f = 880 MHz, N−CDMA IS−95 (Pilot, Sync, Paging, Traffic Codes 8 Through 13) 25_C ηD −30_C 25_C 85_C −30 40 −35 30 TC = −30_C 20 25_C 10 0 1 10 Pout, OUTPUT POWER (WATTS) AVG. 100 85_C ACPR Gps −40 −45 −50 −55 300 Figure 10. Single - Carrier N - CDMA ACPR, Power Gain and Drain Efficiency versus Output Power MRF6P9220HR3 6 RF Device Data Freescale Semiconductor TYPICAL CHARACTERISTICS 21 20.5 Gps, POWER GAIN (dB) 20 19.5 19 18.5 18 17.5 17 7 10 VDD = 28 Vdc IDQ = 1600 mA f = 880 MHz 100 Pout, OUTPUT POWER (WATTS) CW 85_C ηD 25_C Gps 25_C 85_C 48 40 32 24 16 8 500 TC = −30_C −30_C 72 64 56 ηD, DRAIN EFFICIENCY (%) Figure 11. Power Gain and Drain Efficiency versus CW Output Power 20.5 19.5 Gps, POWER GAIN (dB) 18.5 17.5 16.5 16 V 15.5 14.5 0 50 VDD = 12 V 100 150 200 250 300 350 400 20 V IDQ = 1600 mA f = 880 MHz 24 V 28 V 32 V Pout, OUTPUT POWER (WATTS) CW Figure 12. Power Gain versus Output Power 1010 MTTF FACTOR (HOURS x AMPS2) 109 108 107 90 100 110 120 130 140 150 160 170 180 190 200 210 TJ, JUNCTION TEMPERATURE (°C) This above graph displays calculated MTTF in hours x ampere2 drain current. Life tests at elevated temperatures have correlated to better than ±10% of the theoretical prediction for metal failure. Divide MTTF factor by ID2 for MTTF in a particular application. Figure 13. MTTF Factor versus Junction Temperature MRF6P9220HR3 RF Device Data Freescale Semiconductor 7 N - CDMA TEST SIGNAL 100 10 PROBABILITY (%) 1 0.1 0.01 0.001 0.0001 0 2 4 6 8 10 PEAK−TO−AVERAGE (dB) IS−95 CDMA (Pilot, Sync, Paging, Traffic Codes 8 Through 13) 1.2288 MHz Channel Bandwidth Carriers. ACPR Measured in 30 kHz Bandwidth @ ±750 kHz Offset. ALT1 Measured in 30 kHz Bandwidth @ ±1.98 MHz Offset. PAR = 9.8 dB @ 0.01% Probability on CCDF. (dB) −10 −20 −30 −40 −50 −60 −70 −80 −90 −100 1.2288 MHz Channel BW . ... .... . .. ........................ .... ............ ................. . .. . . . . . . . . . . . . . . . . . . −ALT1 in 30 kHz +ALT1 in 30 kHz . . . . Integrated BW Integrated BW .... . ... ............. .... ........... ........ ........ . .... ... . ......... . ... .. ... . ........ . ..... . ........ . ... . .. ......... ...... ....... ..... ....... ..... ... ..... .... .... . ..... ... ........ . .... ......... . .. .... . ...... .... ....... .. .. ........ −ACPR in 30 kHz .. +ACPR in 30 kHz ............ ..... ........... ..... .. ... ............... ......... .. ... ... ...... Integrated BW Integrated BW .. ........ ..... ... . ....... ............ .. ....... ..... Figure 14. Single - Carrier CCDF N - CDMA −110 −3.6 −2.9 −2.2 −1.5 −0.7 0 0.7 1.5 2.2 2.9 3.6 f, FREQUENCY (MHz) Figure 15. Single - Carrier N - CDMA Spectrum MRF6P9220HR3 8 RF Device Data Freescale Semiconductor f = 850 MHz Zload Zo = 10 Ω f = 910 MHz f = 910 MHz f = 850 MHz Zsource VDD = 28 Vdc, IDQ = 1600 mA, Pout = 47 W Avg. f MHz 850 865 880 895 910 Zsource Ω 3.50 - j7.10 3.59 - j7.07 3.03 - j6.98 2.42 - j6.20 2.26 - j5.39 Zload Ω 6.04 - j0.49 6.83 - j1.14 7.41 - j1.19 7.60 - j0.98 8.06 - j0.45 Zsource = Test circuit impedance as measured from gate to gate, balanced configuration. Zload = Test circuit impedance as measured from drain to drain, balanced configuration. Input Matching Network + Device Under Test − Output Matching Network − Z source Z + load Figure 16. Series Equivalent Source and Load Impedance MRF6P9220HR3 RF Device Data Freescale Semiconductor 9 NOTES MRF6P9220HR3 10 RF Device Data Freescale Semiconductor PACKAGE DIMENSIONS G L ccc R M 4 2X TA M B M J 1 2 Q bbb M TA M B M (LID) NOTES: 1. CONTROLLING DIMENSION: INCH. 2. INTERPRET DIMENSIONS AND TOLERANCES PER ASME Y14.5M−1994. 3. DIMENSION H TO BE MEASURED 0.030 (0.762) AWAY FROM PACKAGE BODY. 4. RECOMMENDED BOLT CENTER DIMENSION OF 1.140 (28.96) BASED ON 3M SCREW. DIM A B C D E F G H J K L M N Q R S bbb ccc INCHES MIN MAX 1.335 1.345 0.380 0.390 0.180 0.224 0.325 0.335 0.060 0.070 0.004 0.006 1.100 BSC 0.097 0.107 0.2125 BSC 0.135 0.165 0.425 BSC 0.852 0.868 0.851 0.869 0.118 0.138 0.395 0.405 0.394 0.406 0.010 REF 0.015 REF DRAIN DRAIN GATE GATE SOURCE MILLIMETERS MIN MAX 33.91 34.16 9.65 9.91 4.57 5.69 8.26 8.51 1.52 1.78 0.10 0.15 27.94 BSC 2.46 2.72 5.397 BSC 3.43 4.19 10.8 BSC 21.64 22.05 21.62 22.07 3.00 3.30 10.03 10.29 10.01 10.31 0.25 REF 0.38 REF B 5 4X (FLANGE) K 4X 3 4 S (INSULATOR) M D bbb M B TA M bbb TA M B M B M ccc M TA (LID) M B M N F E H bbb A (INSULATOR) M M C B M T TA A M SEATING PLANE STYLE 1: PIN 1. 2. 3. 4. 5. CASE 375G - 04 ISSUE G NI - 860C3 MRF6P9220HR3 RF Device Data Freescale Semiconductor 11 How to Reach Us: Home Page: www.freescale.com E - mail: support@freescale.com USA/Europe or Locations Not Listed: Freescale Semiconductor Technical Information Center, CH370 1300 N. Alma School Road Chandler, Arizona 85224 +1 - 800- 521- 6274 or +1 - 480- 768- 2130 support@freescale.com Europe, Middle East, and Africa: Freescale Halbleiter Deutschland GmbH Technical Information Center Schatzbogen 7 81829 Muenchen, Germany +44 1296 380 456 (English) +46 8 52200080 (English) +49 89 92103 559 (German) +33 1 69 35 48 48 (French) support@freescale.com Japan: Freescale Semiconductor Japan Ltd. Headquarters ARCO Tower 15F 1 - 8 - 1, Shimo - Meguro, Meguro - ku, Tokyo 153 - 0064 Japan 0120 191014 or +81 3 5437 9125 support.japan@freescale.com Asia/Pacific: Freescale Semiconductor Hong Kong Ltd. Technical Information Center 2 Dai King Street Tai Po Industrial Estate Tai Po, N.T., Hong Kong +800 2666 8080 support.asia@freescale.com For Literature Requests Only: Freescale Semiconductor Literature Distribution Center P.O. Box 5405 Denver, Colorado 80217 1 - 800- 441- 2447 or 303 - 675- 2140 Fax: 303 - 675- 2150 LDCForFreescaleSemiconductor@hibbertgroup.com Information in this document is provided solely to enable system and software implementers to use Freescale Semiconductor products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits or integrated circuits based on the information in this document. Freescale Semiconductor reserves the right to make changes without further notice to any products herein. Freescale Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Freescale Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be provided in Freescale Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals”, must be validated for each customer application by customer’s technical experts. Freescale Semiconductor does not convey any license under its patent rights nor the rights of others. Freescale Semiconductor products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Freescale Semiconductor product could create a situation where personal injury or death may occur. Should Buyer purchase or use Freescale Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold Freescale Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Freescale Semiconductor was negligent regarding the design or manufacture of the part. Freescalet and the Freescale logo are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © Freescale Semiconductor, Inc. 2006. All rights reserved. MRF6P9220HR3 1Rev. 2, 5/2006 2 Document Number: MRF6P9220H RF Device Data Freescale Semiconductor
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