0402H500N1R8BCT

H SERIES HIGH Q CAPACITOR SPEC Rev. C FEATURES: - High Q and low ESR - Extend working range for wireless products - Extend battery life of portable devices PART NUMBER DESCRIPTION H 0402 Series Size 0201 (0603) H : High Q, Low 0402 (1005) ESR 0603 (1608) 0805 (2012) 250 Rated Voltage (VDC) 6R3=6.3 100-10 160=16 250=25 500=50 101=100 201=200 251=250 501=500 631=630 N Dielectric N: NP0 0R1 Capacitance 0R1=0.10pF 0R5=0.5pF 1R0=1.0pF 100=10pF 101=100pF B Tolerance A: ±0.05pF B: ±0.1pF C: ±0.25pF D: ±0.5pF F: ±1% G: ±2% J: ±5% T C Termination C=Cu/Ni/Sn Packaging T=7” Paper Tape U=13” Paper Tape E=7” Plastic Tape Q=13” Plastic Tape Z or blank=Bulk General Electrical Data Dielectric Size Capacitance Range Capacitance tolerance Rated voltage (WVDC) NP0 0201, 0402, 0603, 0805 0201: 0.2pF to 33pF 0402: 0.2pF to 470pF 0603: 0.5pF to 3300pF 0805: 0.5pF to 390pF Cap≤5pF: A (±0.05pF ), B (±0.1pF), C (±0.25pF) 5pF10GΩ With no electrical load. T.C. Operating Temp NPO (C0G) NPO (C0H) -55~125°C at 25°C NPO (C0J) X7R X5R -55~ 85°C at 25°C Y5V -25~ 85°C at 20°C *Pressurizing force： 0201: 2N 0402 & 0603: 5N >0603: 10N *Test time：10 ±1 sec Frontier Electronics Corp.® Rated voltage 100V: X7R 50V:0603≥1µF,0805≥1µF, 1206≥2.2μF, 1210≥4.7µF 35V:0805≥2.2µF,1210≥10μF 25V:0402≥1µF,0603≥2.2µF,0805≥2.2µF, 1206≥10µF,1210≥10µF 16V:0402≥0.22µF,0603≥1µF,0805≥2.2µF, 1206≥10µF,1210≥47µF 10V:0201≥47nF,0402≥0.47µF,0603≥0.47µF, 0805≥2.2µF, T.C. NPO (C0G) NPO (C0H) NPO (C0J) X7R X5R Y5V Capacitance Change Within ±30ppm/°C Within ±60ppm/°C Within ±120ppm/°C Within ±15% Within ±15% Within +30%/-80% * No remarkable damage or removal of the terminations. Page 6 of 9 667 E. Cochran St. Simi valley, CA 93065 Phone: 1-805-522-9998, Fax: 1-805-522-9989 H SERIES HIGH Q CAPACITOR SPEC Item 8 Vibration Resistance 9 Solderability 10 11 Test Condition * Vibration frequency: 10~55 Hz/min. * Total amplitude: 1.5mm * Test time: 6 hours (Two hrs each in three mutually perpendicular directions) * Measurement to be made after keeping at room temp. for 24±2 hours * Solder temperature: 235±5°C * Dipping time: 2±0.5 sec. Bending Test *The middle part of substrate shall be pressurized by means of the pressurizing rod at a rate of approximately 1 mm per second until the deflection becomes 1 mm and then the pressure shall be maintained for 5±1 sec. *Measurement to be made after keeping at room temp. for 24±2 hrs. Resistance to Soldering Heat * Solder temperature: 260±5°C * Dipping time: 10±1 sec * Preheating: 120 to 150°C for 1 minute before immersing the capacitor in an eutectic solder. * Before initial measurement (Class II only): Perform 150+0/-10°C for 1 hr and then set for 24±2 hrs at room temp. * Measurement to be made after keeping at room temp. for 24±2 hrs. * Conduct the five cycles according to the temperatures and time. Step 1 2 12 3 Temperature Cycle 4 Temp. (°C) Min. operating temp. +0/-3 Room temp. Max. operating temp. +3/-0 Room temp. Time (min.) 30±3 2~3 Rev. C Requirements * No remarkable damage. * Cap change and Q/D.F.: To meet initial spec. 95% min. coverage of all metalized area. * No remarkable damage. * Capacitance change： NP0: within ±5% or 0.5pF whichever is larger X7R, X7E, X5R: within ±12.5% Y5V: within ±30% (This capacitance change means the change of capacitance under specified flexure of substrate from the capacitance measured before the test.) * No remarkable damage. * Capacitance change: NP0: within ±2.5% or 0.25pF whichever is larger X7R, X7E, X5R: within ±7.5% Y5V: within ±20% * Q/D.F., I.R. and dielectric strength: To meet initial requirements. * 25% max. leaching on each edge. * No remarkable damage. * Capacitance change NP0: within ±2.5% or 0.25pF whichever is larger X7R, X7E, X5R: within ±7.5% Y5V: within ±20% * Q/D.F., I.R. and dielectric strength: To meet initial requirements. 30±3 2~3 * Before initial measurement (Class II only): Perform 150+0/-10°C for 1 hr and then set for 24±2 hrs at room temp. * Measurement to be made after keeping at room temp. for 24±2 hrs. * No remarkable damage. * Cap change: NP0: within ±5% or 0.5pF whichever is larger X7R, X7E, X5R: ≥10V**,within ±12.5%;6.3V within ±25%;TT series,within ±25% **10V:0603≥4.7μF;0402≥1μF;0201≥0.1μF, within ±25%; Y5V: ≥10V, within ±30%; 6.3V, within +30/-40% * Q/D.F. value: NP0: More than 30pF Q≥350, 10pF≤C≤30pF, Q≥275+2.5C,Less than 10pF Q≥200+10C X7R, X5R: Rated vol. D.F.≤ ≥50V ≤3% 35V ≤5% 25V ≤5% ≤5％ 16V 13 Humidity (Damp Heat) Steady State * Test temp.: 40±2°C * Humidity: 90~95% RH * Test time: 500+24/-0hrs. * Before initial measurement (Class II only): Perform 150 +0/-10°C for 1 hr and then set for 24±2 hrs. at room temp. * Measurement to be made after keeping at room temp. for 24±2 hrs. ≤6% ≤10% ≤20% ≤20% ≤10% ≤14% Exception of D.F.≤ 0201(50V); 0603≥0.047μF; 0805≥0.18μF; 1206≥0.47μF 1210≥4.7μF 0603≥1μF; 0805≥1μF; 1206≥2.2μF; 1210≥10μF 0805≥2.2µF;1210≥10μF 0201≥0.01μF;0805≥1μF; 1210≥10μF 0603≥0.33μF;1206≥4.7μF ≤15% 6≥6.8μF1210≥22μF ≤10% 0603≥0.15μF;0805≥0.68μF;1206≥2.2μF;1210≥4.7μF ≤15% 0201≥0.01μF;0402≥0.033μF;0603≥0.68μF;0805≥2.2μF; 1206≥4.7μF; 1210≥22μF ≤ ≤15% ≤20% 6.3V ≤15% ≤30% 4V X7R/X7E, LD≤20% series : DF--- 3% ≤7.5% 10V Y5V: Rated vol. D.F.≤ ≥50V ≤7.5% 35V ≤10% ≤10% --≤10% 25V ≤7.5% 16V (C