FMP16N60ES
Super FAP-E3S series
Features
Maintains both low power loss and low noise Lower RDS (on) characteristic More controllable switching dv/dt by gate resistance Smaller VGS ringing waveform during switching Narrow band of the gate threshold voltage (4.2± 0.5V) High avalanche durability
FUJI POWER MOSFET
N-CHANNEL SILICON POWER MOSFET
Outline Drawings [mm]
TO-220AB
Equivalent circuit schematic
Drain(D)
Applications
Switching regulators UPS (Uninterruptible Power Supply) DC-DC converters
Gate(G) Source(S)
Maximum Ratings and Characteristics
Absolute Maximum Ratings at Tc=25°C (unless otherwise specified)
Description Drain-Source Voltage Continuous Drain Current Pulsed Drain Current Gate-Source Voltage Repetitive and Non-Repetitive Maximum AvalancheCurrent Non-Repetitive Maximum Avalanche Energy Repetitive Maximum Avalanche Energy Peak Diode Recovery dV/dt Peak Diode Recovery -di/dt Maximum Power Dissipation Operating and Storage Temperature range Symbol VDS VDSX ID I DP VGS I AR E AS E AR dV/dt -di/dt PD Tch Tstg Characteristics 6 00 6 00 ±16 ± 64 ± 30 16 554.8 27 3.8 100 2.02 270 150 -55 to + 150 Unit V V A A V A mJ mJ kV/µs A/µs W °C °C Remarks VGS = - 30V
Note*1 Note*2 Note*3 Note*4 Note*5 Ta=25°C Tc=25°C
Electrical Characteristics at Tc=25°C (unless otherwise specified)
Description Drain-Source Breakdown Voltage Gate Threshold Voltage Zero Gate Voltage Drain Current Gate-Source Leakage Current Drain-Source On-State Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Time Turn-Off Time Total Gate Charge Gate-Source Charge Gate-Drain Charge Gate-Drain Crossover Charge Avalanche Capability Diode Forward On-Voltage Reverse Recovery Time Reverse Recovery Charge Symbol BVDSS VGS (th) I DSS I GSS R DS (on) gfs Ciss Coss Crss td(on) tr td(off) tf QG Q GS Q GD Q SW I AV VSD trr Qrr Conditions I D =250 µ A, VGS =0V I D =250 µ A, VDS =VGS VDS =600V, VGS =0V VDS =480V, VGS =0V VGS = ± 30V, VDS =0V I D =8A, VGS =10V I D =8A, VDS =25V VDS =25V VGS =0V f=1MHz Vcc =300V VGS =10V I D =8A RG =18Ω Vcc =300V I D =16A VGS =10V L=1.74mH, Tch =25°C I F =16A, VGS =0V, Tch =25°C I F =16A, VGS =0V -di/dt=100A/µs, Tch=25°C min. 6 00 3.7 5 16 typ. 4.2 10 0.40 10 2100 23 0 13 43 41 94 20 56 20 21 9.5 0.90 0.7 9 max. 4.7 25 250 100 0.47 3150 345 19.5 64.5 61.5 141 30 114 25.5 33 10 1.35 Unit V V µA nA Ω S pF
Tch =25°C Tch =125°C
ns
nC A V µS µC
Thermal Characteristics
Description Thermal resistance Symbol Rth (ch-c) Rth (ch-a) Test Conditions Channel to c ase Channel to ambient min. typ. max. 0.460 62.0 Unit °C/W °C/W
Note *1 : Tch≤150°C Note *2 : Stating Tch=25°C, IAS =7A, L=20.8mH, Vcc=60V, RG =50Ω E AS limited by maximum channel temperature and avalanche current. See to 'Avalanche Energy' graph.
Note *3 : Repetitive rating : Pulse width limited by maximum channel temperature. See to the 'Transient Themal impeadance' graph. Note *4 : I F ≤ -I D, -di/dt=100A/µs, Vcc ≤ BVDSS, Tch≤150°C. Note *5 : I F ≤ -I D, dv/dt=3.8kV/µs, Vcc ≤ BVDSS, Tch≤150°C.
1
FMP16N60ES
Allowable Power Dissipation PD=f(Tc)
Safe Operating Area ID=f(VDS):Duty=0(Single pulse),Tc=25 °c
FUJI POWER MOSFET
400
10
2
t= 1µs 10µs
300
10
1
100µs
PD [W]
ID [A]
200
10
0
1m s
100
10
-1
P o w e r l o s s w a v e fo r m : S q u a r e w a v e fo r m PD
t
0 0 25 50 75 Tc [°C] 100 125 150
10
-2
10
-1
10
0
10 VDS [V]
1
10
2
10
3
Typical Output Characteristics ID=f(VDS):80 µs pulse test,Tch=25 °C
40 35 30 25
I D [ A]
100
Typical Transfer Characteristic ID=f(VGS):80 µs pulse test,VDS=25V,Tch=25 °C
10V 8 .0 V
10
20 15
7 .5 V
ID[A]
1
7 .0 V
10
6.5V
5 0 0 4 8 12 VDS [V] 16 20 24
0 2 4 6 VGS[V] 8 10 12
VGS=6.0V
0.1
100
Typical Transconductance gfs=f(ID):80 µs pulse test,VDS=25V,Tch=25 °C
0.8
Typical Drain-Source on-state Resistance RDS(on)=f(ID):80 µs pulse test,Tch=25 °C
VGS=6.0V
0.7
6.5V
7V 8V 10V 20V
10
RDS(on) [ Ω ]
0.6
g f s [ S]
0.5
1
0.4
0.1 0.1 1 ID [A] 10 100
0.3 0 5 10 15 20 ID [A] 25 30 35 40
2
FMP16N60ES
Drain-Source On-state Resistance RDS(on)=f(Tch):ID=8A,VGS=10V
FUJI POWER MOSFET
1.4
8 7 6
VGS(th) [V]
Gate Threshold Voltage vs. Tch VGS(th)=f(Tch):VDS=VGS,ID=250µA
1.2
1.0
5 4 3 2 1 0
RDS(on) [ Ω ]
0.8
m ax. typ. m in.
0.6
m ax. typ.
0.4
0.2
0.0 -50 -25 0 25 50 T ch [ ° ] C 75 100 125 150
-50
-25
0
25
50 75 Tch [ °C]
100
125
150
Typical Gate Charge Characteristics VGS=f(Qg):ID=16A,Tch=25 °C
14
Typical Capacitance C=f(VDS):VGS=0V,f=1MHz
12
10
Vcc= 120V 300V 480V
10
4
10
VG S [ V]
3
Ciss
C [pF]
8
6
10
2
Coss
4
10
2
1
Crss
0 0 20 40 Qg [nC] 60 80 100
10
0
10
-2
10
-1
10
0
10
1
10
2
VDS [V]
100
Typical Forward Characteristics of Reverse Diode IF=f(VSD):80 µ s pulse test,Tch=25 °C
10
3
Typical Switching Characteristics vs. ID t=f(ID):Vcc=300V,VGS=10V,RG=18 Ω
td(off)
10
10
2
td(on)
I F [ A]
tf
t [ns]
tr 10
1
1
0.1 0.00
0.25
0.50
0.75 VSD [V]
1.00
1.25
1.50
10
0
10
-1
10
0
ID [A]
10
1
10
2
3
FMP16N60ES
Maximum Avalanche Energy vs. starting Tch E(AV)=f(starting Tch):Vcc=60V,I(AV)
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