MB86064PB-GE1

Product Flyer Mixed Signal Division DK86064-2 Dual 14-bit 1GSa/s DAC Development Kit Features • Development kit for MB86064 • MB86064 Evaluation Board • PC USB Programming Cable • PC control software supplied on CD - Win2000/XP compatible • User Manual • SMA data adaptors (optional) • Provides easy access to on-chip waveform memories to perform initial performance tests, avoiding need for high performance data generating equipment January 2008 Version 2.1 FME/MS/DAC80/FL_2/5084 Description The DK86064-2 development kit provides a simple and effective means of evaluating the MB86064 dual 14-bit 1GSa/s Digital to Analog Converter (DAC). A user manual provides a step-by-step guide from configuring the board and connecting test equipment, through to evaluating the MB86064 performance. Schematics, PCB overlays and connector pin-outs are included. The evaluation platform requires two DC power supplies, 1.8V & 3.3V, each capable of providing 1 amp. The PC USB programming cable and control software is included to configure and control the device, as well as download test vectors to the waveform memory module. DK86064-2 Evaluation Platform Copyright © 2004-2008 Fujitsu Microelectronics Europe GmbH Production Page 1 of 4 Disclaimer: The contents of this document are subject to change without notice. Customers are advised to consult with FUJITSU sales representatives before ordering.The information and circuit diagrams in this document are presented “as is”, no license is granted by implication or otherwise. January 2008 Version 2.1 FME/MS/DAC80/FL_2/5084 DK86064-2 Dual 14-bit 1GSa/s DAC Development Kit Essential Equipment Apart from the power supplies, the minimum equipment vital to conducting an evaluation of the MB86064 is a high quality RF clock and spectrum analyser. The phase & spurious performance of the clock should be such as to not limit the DAC performance (e.g. HP8664A). However, performance of even the best spectrum analysers available is inferior to that of the converter. To overcome this, filtering techniques and careful attention to analyser settings, e.g. RF Attenuation, is essential during the course of the evaluation. programming cable supplied. Even if high speed digital pattern generating equipment is available, initial testing using the waveform memories serves as a useful setup check. Pattern generators can be connected to the evaluation board using either the onboard 2-row 0.1" data headers, or via ribbon cables to the optional SMA adaptors. When using the 0.1" data headers it is assumed that a custom wiring harness will be required. This would be made according to the connector type and pinout of the generator’s output. The optional SMA adaptors provide a convenient conversion from SMA to the evaluation board’s 0.1" headers. This alleviates the simultaneous removal of 28 SMAs (14-bit differential LVDS) when required to be disconnected. One advantage of this is the ability to easily swap the data generator between DAC data ports if insufficient channels are available to drive both ports simultaneously. Rather than using general purpose test equipment, customers may wish to use the evaluation board to construct a platform more representative of their end application. This might, for example, involve an FPGA to implement a variety of pre-processing and/or waveform generation functions. At the simplest level, a setup similar to that described for the digital pattern generator could be used, where a custom wiring harness interfaces a standard or existing FPGA platform to the DAC evaluation board. Control of the DAC from the PC software can be maintained to minimise effort to get up and running. Driving the DAC As with any DAC evaluation an appropriate test vector stimulus is required. Unfortunately at data rates above 300MSa/s this requires digital pattern generation capabilities beyond most standard test equipment. The DK86064-2 Development Kit has been designed to help overcome this difficulty in a number of ways. Initially, unmodulated or pseudo-modulated single and multi-tone/carrier tests can be conducted using waveforms downloaded to the on-chip memories. Test waveforms are easily loaded into the memories using the PC software and USB Page 2 of 4 Production Copyright © 2004-2008 Fujitsu Microelectronics Europe GmbH Disclaimer: The contents of this document are subject to change without notice. Customers are advised to consult with FUJITSU sales representatives before ordering.The information and circuit diagrams in this document are presented “as is”, no license is granted by implication or otherwise. January 2008 Version 2.1 FME/MS/DAC80/FL_2/5084 DK86064-2 Dual 14-bit 1GSa/s DAC Development Kit Clock Inputs & Analog Outputs Ordering Information The evaluation board is designed to accommodate up to six SMA connectors - two for the differential clock input and four for the two differential analog outputs. Boards are supplied with transformers on-board to perform single ended-to-differential and differential-to-single ended conversions. As such, only three SMAs are required. This facilitates easier connection to standard test equipment for evaluation. Part Order Reference Complete Development DK86064-2 Kit (includes Evaluation Board with device fitted, PC USB Programming Cable & Control Software and User Manual) SMA Adaptors (optional) DK86064-1-SMA PC USB Programming Cable & Control Software MB86064 Device (RoHS-6 compliant) DKUSB-1 PC Control Software To simplify control & configuration of the MB86064 during evaluation the development kit includes a PC USB programming cable and software utility. The programming cable interfaces between a host PC’s USB port and the 4-wire serial interface implemented on the device. Software is supplied on CD. MB86064PB-GE1 DK86064-2 User Manual Contact Fujitsu MB86064 Data sheet emea.fujitsu.com Copyright © 2004-2008 Fujitsu Microelectronics Europe GmbH Production Page 3 of 4 Disclaimer: The contents of this document are subject to change without notice. Customers are advised to consult with FUJITSU sales representatives before ordering.The information and circuit diagrams in this document are presented “as is”, no license is granted by implication or otherwise. January 2008 Version 2.1 FME/MS/DAC80/FL_2/5084 DK86064-2 Dual 14-bit 1GSa/s DAC Development Kit Worldwide Headquarters Japan Tel: +81 44 754 3753 Fax: +81 44 754 3329 Asia Fujitsu Limited Kamikodanaka 4-1-1 Nakahara-ku Kawasaki-shi Kanagawa-ken 211-8588 Japan Tel: +65 281 0770 Fax: +65 281 0220 Fujitsu Microelectronics Asia Pte Ltd 151 Lorong Chauan New Tech Park #05-08 Singapore 556741 http://www.fujitsu.com http://www.fujitsu.com/sg USA Tel: +1 408 737 5600 Fax: +1 408 737 5999 Europe Fujitsu Microelectronics America, Inc. 1250 E. Arques Avenue, M/S 333 Sunnyvale, CA 94088-3470 USA Tel: +49 6103 6900 Fax: +49 6103 690122 Fujitsu Microelectronics Europe GmbH Pittlerstrasse 47 D-63225 Langen Germany Tel: +1 800 866 8608 Customer Response Center Fax: +1 408 737 5984 Mon-Fri: 7am-5pm (PST) http://www.fujitsu.com/us http://emea.fujitsu.com/microelectronics 4 The contents of this document are subject to change without notice. Customers are advised to consult with FUJITSU sales representatives before ordering. The information and circuit diagrams in this document presented as examples of semiconductor device applications, and are not intended to be incorporated in devices for actual use. Also, FUJITSU is unable to assume responsibility for infringement of any patent rights or other rights of third parties arising from the use of this information or circuit diagrams. No license is granted by implication or otherwise under any patent or patent rights of Fujitsu Microelectronics Europe GmbH. FUJITSU semiconductor devices are intended for use in standard applications (computers, office automation and other office equipment, industrial, communications, and measurement equipment, personal or household devices, etc.). CAUTION: Customers considering the use of our products in special applications where failure or abnormal operation may directly affect human lives or cause physical injury or property damage, or where extremely high levels of reliability are demanded (such as aerospace systems, atomic energy controls, sea floor repeaters, vehicle operating controls, medical devices for life support, etc.) are requested to consult with FUJITSU sales representatives before such use. The company will not be responsible for damages arising from such use without prior approval. Any semiconductor devices have inherently a certain rate of failure. You must protect against injury, damage or loss from such failures by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign Exchange and Foreign Trade Control Law of Japan, the prior authorization by Japanese government should be required for export of those products from Japan. FME/MS/DAC80/FL_2/5084 2.1 Page 4 of 4 Production Copyright © 2004-2008 Fujitsu Microelectronics Europe GmbH Disclaimer: The contents of this document are subject to change without notice. Customers are advised to consult with FUJITSU sales representatives before ordering.The information and circuit diagrams in this document are presented “as is”, no license is granted by implication or otherwise.