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2SJ496

2SJ496

  • 厂商:

    HITACHI(日立)

  • 封装:

  • 描述:

    2SJ496 - Silicon P-Channel MOS FET High Speed Power Switching - Hitachi Semiconductor

  • 详情介绍
  • 数据手册
  • 价格&库存
2SJ496 数据手册
2SJ496 Silicon P-Channel MOS FET High Speed Power Switching ADE-208-482 1st. Edition Features • Low on-resistance R DS(on) = 0.12Ω typ. (at VGS = –10 V, I D = –2.5 A) • 4V gate drive devices. • Large current capacitance ID = –5 A Outline TO-92 Mod D G 32 1 1. Source 2. Drain 3. Gate S 2SJ496 Absolute Maximum Ratings (Ta = 25°C) Item Drain to source voltage Gate to source voltage Drain current Drain peak current Body to drain diode reverse drain current Avalanche current Avalanche energy Channel dissipation Channel temperature Storage temperature Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1 % 2. Value at Ta = 25°C 3. Value at Tch = 25°C, Rg ≥ 50 Ω Symbol VDSS VGSS ID I D(pulse)* I DR I AP * 3 3 2 1 Ratings –60 ±20 –5 –20 –5 –5 2.14 0.9 150 –55 to +150 Unit V V A A A A mJ W °C °C EAR* Pch* Tch Tstg 2 2SJ496 Electrical Characteristics (Ta = 25°C) Item Drain to source breakdown voltage Gate to source breakdown voltage Zero gate voltege drain current Gate to source leak current Symbol V(BR)DSS V(BR)GSS I DSS I GSS Min –60 ±20 — — –1.0 — — 3 — — — — — — — — — Typ — — — — — 0.12 0.17 5 600 290 80 10 25 95 55 –1.0 65 Max — — –10 ±10 –2.0 0.16 0.24 — — — — — — — — — — Unit V V µA µA V Ω Ω S pF pF pF ns ns ns ns V ns I D = –5A, VGS = 0 I F = –5A, VGS = 0 diF/ dt = 50A/µs Test Conditions I D = –10mA, VGS = 0 I G = ±100µA, VDS = 0 VDS = –60 V, VGS = 0 VGS = ±16V, VDS = 0 I D = –1mA, VDS = –10V I D = –2.5A VGS = –10V*1 I D = –2.5A VGS = –4V*1 I D = 2.5A, VDS = 10V*1 VDS = –10V VGS = 0 f = 1MHz VGS = –10V, ID = –2.5A RL = 12Ω Gate to source cutoff voltage VGS(off) Static drain to source on state RDS(on) resistance RDS(on) Forward transfer admittance Input capacitance Output capacitance |yfs| Ciss Coss Reverse transfer capacitance Crss Turn-on delay time Rise time Turn-off delay time Fall time Body to drain diode forward voltage Body to drain diode reverse recovery time Note: 1. Pulse test t d(on) tr t d(off) tf VDF t rr 3 2SJ496 Main Characteristics Power vs. Temperature Derating 1.6 Pch (W) Maximum Safe Operation Area –100 –30 I D (A) 1.2 –10 –3 Channel Dissipation Drain Current 0.8 –1 –0.3 –0.1 0.4 Op er at Operation in ion this area is limited by R DS(on) DC 10 10 µs PW 1 0 µ = ms s (1 10 m sh s ot) –0.03 0 50 100 150 Ta (°C) 200 Ta = 25 °C –0.01 –0.1 –0.3 –1 –3 –10 –30 –100 Drain to Source Voltage V DS (V) Ambient Temperature Typical Output Characteristics –10 –10 V –5 V –4 V –10 –3.5 V (A) Ta = 25°C Pulse Test –3 V –4 –8 Typical Transfer Characteristics V DS = –10 V Pulse Test I D (A) –8 ID Drain Current –6 –6 Drain Current –4 Tc = 75 °C 25 °C –25 °C –2 –2.5 V VGS = –2 V –2 0 –2 –4 –6 Drain to Source Voltage –8 –10 V DS (V) 0 –1 –2 –3 Gate to Source Voltage –4 –5 V GS (V) 4 2SJ496 Drain to Source Saturation Voltage vs. Gate to Source Voltage Drain to Source Saturation Voltage V DS(on) (V) Pulse Test Drain to Source On State Resistance R DS(on) ( Ω ) –1.0 Static Drain to Source on State Resistance vs. Drain Current 1 0.5 0.2 0.1 VGS = –4 V –10 V –0.8 I D = –5 A –0.6 –0.4 –2 A –0.2 –1 A 0.05 0.02 0.01 –0.1 –0.3 –1 –3 Pulse Test –10 –30 –100 0 –4 –8 –12 Gate to Source Voltage –16 –20 V GS (V) Drain Current I D (A) Static Drain to Source on State Resistance R DS(on) ( Ω) Forward Transfer Admittance |y fs | (S) Static Drain to Source on State Resistance vs. Temperature 0.5 Pulse Test 0.4 I D = –5 A –2 A V GS = –4 V –1 A –5 A –1, –2 A –10 V 0 40 80 120 160 Case Temperature Tc (°C) Forward Transfer Admittance vs. Drain Current 20 10 5 2 1 0.5 0.1 –0.1 –0.2 V DS = –10 V Pulse Test –0.5 –1 –2 –5 Drain Current I D (A) –10 Ta = –25 °C 25 °C 75 °C 0.3 0.2 0.1 0 –40 5 2SJ496 Body to Drain Diode Reverse Recovery Time 500 Reverse Recovery Time trr (ns) Typical Capacitance vs. Drain to Source Voltage VGS = 0 f = 1 MHz Ciss 500 200 100 50 Crss 10 di / dt = 50 A / µs VGS = 0, Ta = 25 °C 20 10 0 –10 –20 –30 –40 –50 Drain to Source Voltage V DS (V) Coss 2000 1000 Capacitance C (pF) 200 100 50 20 5 –0.1 –0.2 –0.5 –1 –2 –5 –10 Reverse Drain Current I DR (A) Dynamic Input Characteristics V DS (V) V DD = –10 V –25 V –50 V I D = –5 A V GS (V) 0 0 1000 300 100 30 10 3 Switching Characteristics V GS = –10 V, V DD = –30 V Pw = 5 µs, duty < 1 % t d(off) tf tr t d(on) Drain to Source Voltage –40 V DS V DD = –50 V –25 V –10 V V GS –8 –60 –12 –80 –100 0 –16 –20 40 Gate to Source Voltage Switching Time t (ns) –20 –4 32 8 16 24 Gate Charge Qg (nc) 1 –0.1 –0.2 –0.5 –1 –2 –5 Drain Current I D (A) –10 6 2SJ496 Reverse Drain Current vs. Source to Drain Voltage Repetive Avalanche Energy E AR (mJ) –10 Reverse Drain Current I DR (A) 2.5 I AP = –5 A V DD = –25 V duty < 0.1 % Rg > 50 Ω Maximum Avalanche Energy vs. Channel Temperature Derating –8 2.0 –6 –10 V –4 V GS = 0, 5 V –5 V 1.5 1.0 –2 Pulse Test 0 –0.4 –0.8 –1.2 –1.6 –2.0 Source to Drain Voltage V SD (V) 0.5 0 25 50 75 100 125 150 Channel Temperature Tch (°C) Avalanche Test Circuit EAR = Avalanche Waveform 1 2 • L • I AP • 2 VDSS VDSS – V DD V DS Monitor L I AP Monitor V (BR)DSS I AP VDD ID V DS Rg Vin 15 V D. U. T 50 Ω 0 VDD 7 2SJ496 Normalized Transient Thermal Impedance vs. Pulse Width 3 Normalized Transient Thermal Impedance γ s (t) 1 D=1 Ta = 25°C 0.3 0.1 0.5 0.2 0.1 0.05 0.03 0.01 0.02 0.01 1sho se t pul θ ch – a(t) = γ s (t) • θ ch – a θ ch – a = 139 °C/W, Ta = 25 °C PDM PW T D= PW T 0.003 0.001 0.00001 0.0001 0.001 0.01 0.1 Pulse Width 1 10 PW (S) 100 1000 10000 Switching Time Test Circuit Vin Monitor D.U.T. RL Vout Monitor Vin Switching Time Waveforms 10% 90% Vin 10 V 50 Ω V DD = –30 V Vout td(on) 90% 10% tr td(off) 90% 10% tf 8 2SJ496 Package Dimensions Unit: mm 5.2 max 4.2 max 0.70 max 0.75 max 0.60 max 0.55 max 10.1 min 2.3 max 0.7 8.5 max 0.5 max 1.27 2.54 Hitachi Code TO–92Mod. SC–51 EIAJ — JEDEC 9 Cautions 1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products. Hitachi, Ltd. Semiconductor & Integrated Circuits. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109 URL NorthAmerica : http:semiconductor.hitachi.com/ Europe : http://www.hitachi-eu.com/hel/ecg Asia (Singapore) : http://www.has.hitachi.com.sg/grp3/sicd/index.htm Asia (Taiwan) : http://www.hitachi.com.tw/E/Product/SICD_Frame.htm Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm Japan : http://www.hitachi.co.jp/Sicd/indx.htm For further information write to: Hitachi Semiconductor (America) Inc. 179 East Tasman Drive, San Jose,CA 95134 Tel: (408) 433-1990 Fax: (408) 433-0223 Hitachi Europe GmbH Electronic components Group Dornacher Stra§e 3 D-85622 Feldkirchen, Munich Germany Tel: (89) 9 9180-0 Fax: (89) 9 29 30 00 Hitachi Europe Ltd. Electronic Components Group. Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA, United Kingdom Tel: (1628) 585000 Fax: (1628) 778322 Hitachi Asia Pte. Ltd. 16 Collyer Quay #20-00 Hitachi Tower Singapore 049318 Tel: 535-2100 Fax: 535-1533 Hitachi Asia Ltd. Taipei Branch Office 3F, Hung Kuo Building. No.167, Tun-Hwa North Road, Taipei (105) Tel: (2) 2718-3666 Fax: (2) 2718-8180 Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower, World Finance Centre, Harbour City, Canton Road, Tsim Sha Tsui, Kowloon, Hong Kong Tel: (2) 735 9218 Fax: (2) 730 0281 Telex: 40815 HITEC HX Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
2SJ496
1. 物料型号: - 型号为2SJ496,这是一个由HITACHI生产的Silicon P-Channel MOS FET,用于高速功率开关。

2. 器件简介: - 2SJ496是一个P沟道MOSFET,具有低导通电阻(RDS(on) = 0.12Ω典型值,在VGS = -10V,ID = -2.5A时)和大电流承受能力(ID = -5A)。

3. 引脚分配: - 1. Source(源极) - 2. Drain(漏极) - 3. Gate(栅极)

4. 参数特性: - 绝对最大额定值包括:漏源电压VDSS为-60V,栅源电压VGSS为+20V,漏电流ID为-5A等。 - 电气特性包括:漏源击穿电压(BR)DSS为-60V,栅源击穿电压V(BR)GSS为±20V,零栅电压漏电流Ioss为-10A等。

5. 功能详解: - 2SJ496具有低导通电阻和高速开关特性,适用于需要快速功率切换的应用场合。

6. 应用信息: - 该器件适用于高速功率开关应用,如电源管理、电机控制和类似领域。

7. 封装信息: - 封装形式为TO-92 Mod,具体尺寸和封装代码在文档中有详细描述。
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