C0402Y474M010T

MULTILAYER CERAMIC CHIP CAPACITORS NCC-007-0609 1. Scope This specification is applies to Multilayer Ceramic Chip Capacitor(MLCC) for use in electric equipment for the voltage is ranging from 4V to 50V. The series suitable for general electrics circuit, telecommunications, personal computers and peripheral, power circuit and mobile application. (This product compliant with the RoHS.) 2. Parts Number Code C 1812 N 473 J 050 T (1) (2) (3) (4) (5) (6) (7) (4)Capacitance (1)Product Product Code C Multilayer Ceramic Chip Capacitor (2)Chip Size Code 0201 0402 0603 0805 1206 1210 1808 1812 1825 2208 2211 2220 2225 Length×Width unit : mm(inch) 0.60× 0.30 (.024× .011) 1.00× 0.50 (.039× .020) 1.60× 0.80 (.063× .031) 2.00× 1.25 (.079× .049) 3.20× 1.60 (.126× .063) 3.20× 2.50 (.126× .098) 4.60× 2.00 (.181× .079) 4.60× 3.20 (.181× .125) 4.60× 6.35 (.181× .250) 5.70× 2.00 (.220× .197) 5.70× 2.80 (.220× .110) 5.70× 5.00 (.220× .197) 5.70× 6.35 (.220× .250) (5)Capacitance Tolerance (3)Temperature Characteristics Code N X B R S Y Z E Temperature Characteristic NPO X7R X5R X7S X6S Y5V Z5U Y5U Temperature Range -55℃~+125℃ -55℃~+125℃ -55℃~+85℃ -55℃~+125℃ -55℃~+105℃ -30℃~+85℃ +10℃~+85℃ -30℃~+85℃ unit :pico farads(pF) Code Nominal Capacitance (pF) 5R0 5.0 120 12.0 151 150.0 222 2,200.0 473 47,000.0 224 220,000.0 105 1,000,000.0 106 10,000,000.0 ※. If there is a decimal point, it shall be expressed by an English capital letter R Temperature Coefficient 30 ppm/℃ ± 15% ± 15% ± 22% ± 22% +22/-82% +22/-56% +22/-56% Code B C D F F G J K M Z Tolerance ± 0.10 pF ± 0.25 pF ± 0.50 pF ± 1.00 pF ± 1.00 % ± 2.00 % ± 5.00 % ± 10.0 % ± 20.0 % +80/-20 % Nominal Capacitance Less Than 10 pF (Include 10 pF) More Than 10 pF (6)Rated Voltage Code 004 007 010 016 025 035 050 Rated Voltage (Vdc) 4 6.3 10 16 25 35 50 (7)Tapping Code T B Page : 1 /18 Type Tape & Reel Bulk MULTILAYER CERAMIC CHIP CAPACITORS NCC-007-0609 3. Nominal Capacitance and Tolerance 3.1 Standard Combination of Nominal Capacitance and Tolerance Class Ⅰ Ⅱ Characteristic NPO Tolerance Less Then 10 pF B (± 0.10 pF) C (± 0.25 pF) D (± 0.50 pF) F (± 1.00 pF) More Than 10 pF F (±1.00 %) G (±2.00 %) J (± 5.00 %) K (± 10.0 %) X7R/X7S/X5R/X6S K (± 10.0 %), M (± 20.0 %) Y5V M (± 20.0 %), Z(＋80/－20 %) Z5U Y5U Nominal Capacitance 0.5,1,1.5,2,2.5,3 0.5,1,1.5,2,2.5,3,3.5,4,4.5,5 5,6,7,8,9,10 6,7,8,9,10 E-12, E-24 series E-3, E-6 series E- 3 series 3.2 E series(standard Number) Standard No. E- 3 E- 6 E-12 E-24 1.0 1.0 1.0 1.0 1.1 1.5 1.2 1.2 1.3 1.5 1.5 1.6 1.8 1.8 2.0 Application Capacitance 2.2 2.2 3.3 2.2 2.7 3.3 3.9 2.2 2.7 3.3 3.9 2.4 3.0 3.6 4.3 4. Operation Temperature Range Class Ⅰ Ⅱ Characteristic NPO (N) X7R (X) X7S (R) X5R (B) X6S (S) Y5V (Y) Z5U (Z) Y5U (E) Other Temperature Range -55℃ ~ +125℃ -55℃ ~ +125℃ 55℃ ~ +125℃ -55℃ ~ +85℃ -55℃ ~ +105℃ -30℃ ~ +85℃ +10℃ ~ +85℃ -30℃ ~ +85℃ -25℃ ~ +85℃ 5. Storage Condition Storage Temperature：5 to 40℃ Relative Humidity：20 to 70 % Storage Time：6 months max. Page : 2 /18 Reference Temp. 20℃ 20℃ 20℃ 20℃ 20℃ 20℃ 25℃ 25℃ 20℃ 4.7 4.7 4.7 4.7 5.1 6.8 5.6 5.6 6.2 6.8 6.8 7.5 8.2 8.2 9.1 MULTILAYER CERAMIC CHIP CAPACITORS NCC-007-0609 6. Dimensions 6.1 Configuration and Dimension： BW B T W L TYPE 0201 0402 0603 0805 1206 1210 1808 1812 1825 2208 2211 2220 2225 L 0.60± 0.03 1.00± 0.05 1.60± 0.10 2.00± 0.20 3.20± 0.30 3.20± 0.30 4.60± 0.30 4.60± 0.30 4.60± 0.30 5.70± 0.40 5.70± 0.40 5.70± 0.40 5.70± 0.40 W 0.30± 0.03 0.50± 0.05 0.80± 0.10 1.25± 0.20 1.60± 0.20 2.50± 0.20 2.00± 0.20 3.20± 0.30 6.35± 0.40 2.00± 0.20 2.80± 0.40 5.00± 0.40 6.35± 0.40 T (max) 0.33 0.55 0.90 1.45 1.80 2.60 2.20 3.00 2.60 2.20 3.00 3.00 3.00 B (min) 0.20 0.30 0.40 0.70 1.50 1.60 2.50 2.50 2.50 3.50 3.50 3.50 3.50 6.2 Termination Type： Solder Metal Barrier External Electrodes Inner Electrodes Ceramic Body Page : 3 /18 Unit:mm BW (min) 0.10 0.15 0.15 0.20 0.30 0.30 0.30 0.30 0.30 0.30 0.30 0.30 0.30 MULTILAYER CERAMIC CHIP CAPACITORS NCC-007-0609 7. Performance No. Item Specification Test Condition 1 2 3 Visual Dimension Insulation Resistance No abnormal exterior appearance See Page 4 10,000MΩ or 500/C Ω whichever is smaller for rated voltage>10V and greater 100/C Ω for rated voltage≤10V. Capacitance Class Ⅰ Within The Specified Tolerance More Than 30pF : Q≧1000 30pF & Below: Q≧400+20C (C : Capacitance , pF) Visual Inspection Visual Inspection Applied Voltage: Rated Voltage Charge Time : 60±5 sec. Charge-Discharge current shall be less than 50mA current. ClassⅠ： Char Frequency Voltage 1.0±0.2Vrms C≦100pF 1MHz±10% C＞100pF 1KHz±10% ClassⅡ： Char Frequency Voltage C≦10uF 1KHz±10% 1.0±0.2Vrms C＞10uF 120Hz±20% 0.5±0.2Vrms Perform a heat temperature at 150±5℃ for 30min then place room temp. for 24±2hr. 250% of the rated voltage for 1~5 sec. Current is limited to less than 50mA 4 5 Q Tanδ 6 7 Class Ⅱ Withstanding Voltage Temperature ClassⅠ Capacitance Coefficient Class Ⅱ 8 Adhesive Strength Of Termination Shall meet the value in Table 1,Tble 2, Table 3 No dielectric breakdown or mechanical breakdown Char. Temp. Range Cap. Change(%) NPO -55℃~+125℃ ± 30 ppm/℃ Char. Temp. Range Cap. Change(%) X7R X7S X6S X5R Y5V -55℃~+125℃ -55℃~+125℃ -55℃~+105℃ -55℃~+85℃ -30℃~+85℃ ± 22% ± 22% ± 22% ± 15% +22% ~-82% Y5U Z5U -30℃~+85℃ +10℃~+85℃ +22% ~-56% +22% ~-56% No indication of peeling shall occur on the terminal electrode. ClassⅠ: C2－C1 C1(T2－T1) ×100% C2－C1 C1 ×100% ClassⅡ: T1: Standard Temperature(20℃) T2: Test Temperature C1:Capacitance At Standard Temperature(20℃) C2: Capacitance At Test Temperature (T2) A 5N·f(≈0.5Kg·f) pull force shall be applied for 10± 1 second. 5N·f 9 Resistance Appearance to Flexure of Substrate C-Meter No mechanical damage or capacitance The board shall be bend 1.0mm with a rate of 1.0 change more than the following table. mm/sec. Capacitance Change Char. Cap. Change ≦ ± 5.0% of initial value NPO(N) X7R (X) X7S (R) ≦ ± 12.5% of initial value X6S (S) X5R (B) Y5V (Y) ≦ ± 30.0% of initial value Y5U (E) Z5U (Z) Page : 4 /18 R230 C Meter 45±1mm 45±1mm Bending Limit MULTILAYER CERAMIC CHIP CAPACITORS No. Item Specification 10 Solderability More than 90% of the terminal surface is to be soldered newly, so metal part does not come out or dissolve. 11 Resistance To Soldering Heat 12 Tempera-. ture Cycle Appearance Capacitance Q ClassⅠ Tanδ ClassⅡ Insulation Resistance Appearance Capacitance No mechanical damage shall occur. ClassⅠ (NPO) Within ± 2.5% or ± 0.25pF whichever is larger of initial value X7R/X7S/X6S/X5R ≤ ±7.5% of initial value ≤ ±20% of initial value Y5V/Y5U/Z5U To satisfy the specified initial value Shall meet the value in Table 1,Tble 2,Table 3 To satisfy the specified initial value Humidity Appearance Capacitance Q ClassⅠ Test Condition Solder Temperature : 245± 5℃ Dip Time : 5 ± 0.5sec Immersing Speed : 25±10% mm/s Solder : H63A Flux :Rosin Preheat : At 80~120 ℃ for 10~30sec. ClassⅡ capacitor shall be set for 48±4 hours at room temperature after one hour heat treatment at 150 +0/-10℃ before initial measure. Preheat : at 150± 10℃ for 60~120sec. Dip : solder temperature of 260± 5℃ Dip Time : 10 ± 1sec. Immersing Speed : 25±10% mm/s Solder : H63A Flux :Rosin Measure at room temperature after cooling for ClassⅠ: 24 ± 2 Hours ClassⅡ: 48 ± 4 Hours No mechanical damage shall occur. ClassⅡ capacitor shall be set for 48±4 hours at room temperature after one hour heat ClassⅠ Within ± 2.5% or ± 0.25pF treatment at 150 +0/-10℃ before initial (NPO) whichever is larger of initial measure. Capacitor shall be subjected to five cycles of value the temperature cycle as following: X7R/X7S/X6S/X5R ≤ ±7.5% of initial value ≤ ±20% of initial value Y5V/Y5U/Z5U Step Temp.(℃) Time(min) To satisfy the specified initial value 1 Min Rated Temp. +0/-3 30 Q ClassⅠ Tanδ Shall meet the value in Table 1,Tble 2,Table 3 ClassⅡ Insulation To satisfy the specified initial value Resistance 13 NCC-007-0609 No mechanical damage shall occur. Characteristic Cap. Change ClassⅠ (NPO) 2 25 3 3 Min Rated Temp. +3/-0 30 4 25 3 Measure at room temperature after cooling for ClassⅠ: 24 ± 2 Hours ClassⅡ: 48 ± 4 Hours ClassⅡ capacitor shall be set for 48± 4 hours at room temperature after one hour heat treatment at 150 +0/-10 ℃ before initial measure. Within ± 5.0% or ± 0.5pF whichever is larger of initial Temperature : 40± 2℃ value Relative Humidity : 90 ~ 95%RH X7R/X7S/X6S/X5R ≤ ±12.5% of initial value Test Time : 500 +12/-0Hr ≤ ±30% of initial value Y5V/Y5U/Z5U 30pF & Over : Q ≧350 Measure at room temperature after cooling for 10 to 30pF : Q≧275+2.5C ClassⅠ: 24 ± 2 Hours 30pF & Below: Q≧200+10C ClassⅡ: 48 ± 4 Hours Shall meet the value in Table 1,Tble 2, Table 3 Tanδ ClassⅡ Insulation 1000MΩ or 50/C Ω whichever is smaller for Resistance rated voltage>10V and greater 10/C Ω for rated voltage≦10V. (C in Farad) Page : 5 /18 MULTILAYER CERAMIC CHIP CAPACITORS No. 14 15 16 Item Humidity Load Appearance Capacitance Specification NCC-007-0609 Test Condition No mechanical damage shall occur. ClassⅡ capacitors applied DC voltage of the rated voltage is applied for one hour at maximum operation temperature ± 3℃then shall be set for Characteristic Cap. Change ClassⅠ Within ± 7.5% or ± 0.75pF 48± 4 hours at room temperature and the initial measurement shall be conducted. (NPO) whichever is larger of Applied Voltage :Rated Voltage initial value Temperature : 40± 2℃ X7R/X7S/X6S/X5R ≤ ±12.5% of initial value Relative Humidity : 90 ~ 95%RH ≤ ±30% of initial value Y5V/Y5U/Z5U Test Time : 500 +12/-0Hr 30pF & Over : Q ≧350 Q Current Applied : 50 mA Max. ClassⅠ 10 to 30pF : Q≧275+2.5C 30pF & Below: Q≧200+10C Tanδ Shall meet the value in Table 1,Tble 2,Table 3 Measure at room temperature after cooling for ClassⅠ: 24 ± 2 Hours ClassⅡ ClassⅡ: 48 ± 4 Hours 500MΩ or 25/C Ω whichever is smaller for Insulation rated voltage>10V and greater 5/C Ω for rated Resistance voltage≦10V. (C in Farad) ClassⅡ capacitors applied DC testing voltage is High AppearNo mechanical damage shall occur. applied for one hour at maximum operation Temperat. ance temperature ±3℃ then shell be set for 48± 4 Load CapacitCharacteristic Cap. Change Within 5.0% or ±0.5pF hours at room temperature and the initial (Life Test) ance ClassⅠ whichever is larger of measurement shall be conducted. (NPO) initial value Applied Voltage: X7R/X7S/X6S/X5R ≤ ±12.5% of initial value 200% Rated Voltage for C < 1.0uF and 150% Rated Voltage for C≥1.0uF. ≤ ±30% of initial value Y5V/Y5U/Z5U However: 30pF & Over : Q ≧350 Q The rated voltage is 4V/6.3V/10V,applied 10 to 30pF : Q≧275+2.5C ClassⅠ voltage of 100% rated voltage. 30pF & Below: Q≧200+10C Temperature: max. operation temperature Tanδ Shall meet the value in Table 1,Tble 2,Table 3 Test Time : 1000 +48/-0 Hr ClassⅡ Current Applied : 50mA Max 1,000MΩ or 50/C Ω whichever is smaller for Insulation Measure at room temperature after cooling for rated voltage>10V and greater 10/C Ω for rated Resistance voltage≦10V. (C in Farad) ClassⅠ: 24 ± 2 Hours ClassⅡ: 48 ± 4 Hours Solder the capacitor on P.C. board. Vibration AppearNo mechanical damage shall occur ance Vibrate the capacitor with amplitude of CapacitWithin the specified tolerance 1.5mm P-P changing the frequencies ance from 10Hz to 55Hz and back to 10Hz Q To satisfy the specified initial value in about 1 min. ClassⅠ Tanδ Shall meet the value in Table 1,Tble 2,Table 3 Repeat this for 2 hours each in 3 perpendicular directions. ClassⅡ Note: MEASURING INSTRUMENT MEASURING MODE RECOMMENDED MEASURING JIG STANDARD ENVIRONMENT OUR STANDARD MEASURING INSTRUMENT *C≦10uf 4278A 1KHZ/1MHZ CAPACITANCE METER (Agilent) *C>10uf 4268A 120HZ/1KHZ CAPACITANCE METER (Agilent) PARALLEL MODE HP 16334E TEST FIXTURE (Agilent) Temperature 20℃ Relate Humidity 50±2% Page : 6 /18 MULTILAYER CERAMIC CHIP CAPACITORS Temp char: X7R,X7S,X6S,X5R Rated voltage 0201 DC 6.3V DC 10V DC 16V DC 25V 0402 DC 50V DC 6.3V DC 10V 0603 DC 16V DC 25V DC 50V DC 4.0V DC 6.3V DC 10V DC 16V DC 25V 0805 DC 50V DC 4.0V DC 6.3V DC 10V DC 16V DC 25V 1206 DC 50V DC 6.3V DC 10V DC 16V DC 25V DC 50V Capacitance Range C≦0.01uF C=0.1uF C≦0.01uF C≦2.2nF 2.2nF