MULTILAYER CERAMIC CHIP CAPACITORS
HCD-004-2005
1. Scope
This specification is applied to Multilayer Ceramic Chip Capacitor (MLCC) for use in electric equipment for the
voltage is ranging from 50V to 100V.
The MLCC support for Lead-Free wave and reflow soldering, and electrical characteristic and reliability are
same as before. (This product is compliant with the RoHS & HF.)
2. Parts Number Code
HCD
1206
X
335
K
101
T
E
F
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
(1)Product
(5)Capacitance Tolerance
Product Code
Tolerance
Nominal Capacitance
K
± 10.0 %
More Than 10 pF
HCD Series
HCD
(2)Chip Size
Code
1206
Length×Width
3.20× 1.60
unit : mm(inch)
(.126× .063)
(3)Temperature Characteristics
Code Temperature
Characteristic
X
Code
X7R
℃~+125℃
-55
Code
Temperature
Coefficient
Rated Voltage (Vdc)
100
101
Code
Type
T
Tape & Reel
± 15%
(8)Thickness
unit :pico farads(pF)
Nominal Capacitance (pF)
335
Code
(7)Tapping
Temperature
Range
(4)Capacitance
(6)Rated Voltage
Code
E
Thickness T (mm)
1.60± 0.30
3,300,000.0
※. If there is a decimal point, it shall be expressed by an
English capital letter R
(9)Special Code
Code
F
3. Nominal Capacitance and Tolerance
Type
Special Code
3.1 Standard Combination of Nominal Capacitance and Tolerance
Class
Ⅱ
Characteristic
X7R
Tolerance
K (± 10.0 %)
Nominal Capacitance
E-3, E-6 series
3.2 E series(standard Number)
Standard No.
E- 3
E- 6
E-12
E-24
1.0
1.0
1.0
1.0
1.1
1.5
1.2
1.2
1.3
1.5
1.5
1.6
1.8
1.8
2.0
Application Capacitance
2.2
2.2
3.3
2.2
2.7
3.3
3.9
2.2
2.7
3.3
3.9
2.4
3.0
3.6
4.3
4.7
4.7
4.7
4.7
5.1
6.8
5.6
5.6
6.2
6.8
6.8
7.5
8.2
8.2
9.1
4. Operation Temperature Range
Class
Ⅱ
Characteristic
X7R
5. Storage Condition
:
Temperature Range
-55 ~ +125
℃
℃
Reference Temp.
25
℃
℃
Storage Temperature 5 to 40
:
Relative Humidity 20 to 70 %
:
Storage Time 12 months max.
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Page : 1/14
MULTILAYER CERAMIC CHIP CAPACITORS
HCD-004-2005
6. Dimensions
6.1 Configuration and Dimension:
BW
B
T
W
L
TYPE
1206
L
3.20± 0.40
W
1.60± 0.30
T
1.60± 0.30
B (min)
1.50
Unit:mm
BW (min)
0.30
6.2 Termination Type:
Solder Metal
Barrier
Polymer Electrodes (If applicable)
External Electrodes
Inner Electrodes
Ceramic Body
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Page : 2/14
MULTILAYER CERAMIC CHIP CAPACITORS
HCD-004-2005
7. Performance
No.
Item
1
Visual
2
3
4
Specification
Test Condition
No abnormal exterior appearance
Visual inspection
Dimension
See Page 2
Visual inspection
Insulation
Resistance
500/C
V 500V, Rated Voltage
Charge Time 60sec.
Is applied less than 50mA current.
Capacitance
Class
Ⅱ
Ωmin.
≦
Within The Specified Tolerance
:
Class
Ⅱ:
Frequency
Voltage
X7R
1KHz±10% 1.0±0.2Vrms
Perform a heat temperature at 150±5 for
30min. then place room temp. for 24±2hr.
℃
5
6
D.F.
Class
Ⅱ
Withstanding
Voltage
Char.
Maximum
:
X7R 5.0% max.
No dielectric breakdown or
mechanical breakdown
<
V 500V : 200% Rated Voltage
Voltage ramp up rate 500v/sec
for 1~5 sec. charge/discharge Current is less
than 50mA.
≦
※ Withstanding voltage testing requires immersion of
the element in a isolation fluid prevent arcing on the
chip surface, at voltage over 1000Vdc.
7
8
Temperature
Capacitance
Coefficient
Class
Ⅱ
Adhesive Strength
of Termination
Ⅱ
Char. Temp. Range Cap. Change(%) Class :
(C2-C1)/C1 × 100%
X7R -55 ~+125
± 15%
C1:Capacitance at standard temperature(25
C2: Capacitance at test temperature (T2)
No indication of peeling shall occur on Pull force shall be applied for 10± 1 second.
the terminal electrode.
0603----5N( 0.5 Kg·f)
0603----10N( 1.0 Kg·f)
℃
℃
≦
>
℃)
≒
≒
N·f
9
Resistance Appear- No mechanical damage shall be occur.
to
ance
Flexure
C-Meter Capacitance Change
of Substrate
Char.
Cap. Change
X7R
± 12.5%
≦
Bending shall be applied to the 1.0 mm with
1.0 mm/sec.
The duration of the applied forces shall be
5 ± 1sec
R230
Bending
Limit
C Meter
45±1mm
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45±1mm
Page : 3/14
MULTILAYER CERAMIC CHIP CAPACITORS
No.
Item
Specification
10
Solderability
More than 90% of the terminal surface
is to be soldered newly, so metal part
does not come out or dissolve .
11 Resistance
To
Soldering
Heat
Appearance
Capacitance
No mechanical damage shall occur.
Characteristic
Class
Ⅱ
X7R
Cap. Change
Within ± 10%
D.F.
To satisfy the specified initial value
Class
Insulation To satisfy the specified initial value
Resistance
Withstand To satisfy the specified initial value
Voltage
Ⅱ
12 Tempera-. Appearture
ance
Cycle
Capacitance
No mechanical damage shall occur
Characteristic
Class
X7R
Ⅱ
Cap. Change
Within ± 7.5%
D.F.
To satisfy the specified initial value
Class
Insulation To satisfy the specified initial value
Resistance
Ⅱ
HCD-004-2005
Test Condition
℃
Solder Temperature : 245± 5
Dip Time : 5 ± 0.5 sec.
Immersing Speed : 25±10% mm/s
Solder
: Lead Free Solder
Flux
:Rosin
Preheat : At 80~120
for 10~30sec.
℃
Ⅱ
Class capacitor shall be set for 48±4 hours at
room temperature after one hour heat
treatment at 150 +0/-10 before initial
measure.
Preheat : At 150± 10 For 60~120sec.
Dip : Solder Temperature of 260± 5
Dip Time : 10 ± 1sec.
Immersing Speed : 25±10% mm/s
Flux
:Rosin
℃
℃
℃
Measure at room temperature after cooling for
Class : 48 ± 4 Hours
Class capacitor shall be set for 48± 4 hours at
room temperature after one hour heat treatment
at 150 +0/-10
before initial measure.
Ⅱ
Ⅱ
℃
Capacitor shall be subjected to five cycles of
the temperature cycle as following:
℃
Step
Temp.( )
Time(min)
1 Min Rated Temp. +0/-3
30
2
25
3
3 Max Rated Temp. +3/-0
30
4
25
3
Measure at room temperature after cooling for
Class :48 ± 4 Hrs
Solder the capacitor on P.C. board shown in
Fig 2. before testing.
Class capacitor shall be set for 48± 4 hours
at room temperature after one hour heat
treatment at 150+0/-10
before initial
measure.
Temperature : 40± 2
Relative Humidity : 90 ~ 95%RH
Test Time : 500 Hrs Max.
Ⅱ
13
Humidity Appearance
Capacitance
D.F.
Class
Ⅱ
Insulation
Resistance
No mechanical damage shall occur
Characteristic
Class
X7R
Ⅱ
Char.
X7R 10.0% max.
50/C min.
:
Ω
Cap. Change
Within ± 15%
Maximum
Ⅱ
℃
℃
Measure at room temperature after cooling for
Class : 48 ± 4Hrs
Ⅱ
Solder the capacitor on P.C. board shown in
Fig 2. before testing.
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Page : 4/14
MULTILAYER CERAMIC CHIP CAPACITORS
No.
14
Item
High
Temperature
Load
(Life Test)
Specification
Vibration
Test Condition
Ⅱ
No mechanical damage shall occur Class capacitors applied DC voltage (following
table) is applied for one hour at maximum
Characteristic
Cap. Change operation temperature ±3 then shall be set for
48±4hours at room temperature and the initial
Class
X7R
Within ± 15%
measurement shall be conducted.
D.F.
Char.
maximum
Applied Voltage : 100%Rated Voltage
Class
X7R 10.0% max.
Test Time : 1000 Hrs Max.
Insulation 50/C min.
Current Applied : 50 mA Max.
Resistance
Measure at room temperature after cooling for
Class : 48 4 Hours
Appearance
Capacitance
Ⅱ
15
HCD-004-2005
Appearance
Capacitance
Ⅱ
:
Ω
Ⅱ
No mechanical damage shall occur
Characteristic
Class
X7R
Ⅱ
Cap. Change
Within ± 7.5%
D.F.
To satisfy the specified initial value
Class
Insulation To satisfy the specified initial value
Resistance
Ⅱ
℃
±
Solder the capacitor on P.C. Board shown in
Fig 2. before testing.
Vibrate the capacitor with amplitude of 1.5mm
P-P changing the frequencies from 10Hz to
55Hz and back to 10Hz in about 1 min.
Repeat this for 2 hours each in 3perpendicular
directions.
When operating at temperature range from 100℃ to 125℃, the operation shall be carried
out at a derating voltage or less as shown below
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Page : 5/14
MULTILAYER CERAMIC CHIP CAPACITORS
HCD-004-2005
Fig.1
P.C. Board for Bending Strength Test
Solder Resist
Copper
C
40mm
Material : Glass Epoxy Substrate
A
: Copper (Thickness : 0.035mm)
B
: Solder Resist
100mm
1.6mm
Fig.2
Test Substrate
Solder Resist
Copper
C
Material : Glass Epoxy Substrate
A
40mm
B
: Copper (Thickness : 0.035mm)
: Solder Resist
Thickness : 1.6 mm
100mm
Unit:mm
Type
0201
0402
0603
0805
1206
1210
1808
1812
1825
2208
2211
2220
2225
A
0.2
0.5
1.0
1.2
2.2
2.2
3.5
3.5
3.5
4.5
4.5
4.5
4.5
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B
0.9
1.5
3.0
4.0
5.0
5.0
7.0
7.0
7.0
8.0
8.0
8.0
8.0
C
0.4
0.6
1.0
1.6
2.0
2.9
2.5
3.7
6.9
2.5
3.0
5.6
7.0
Page : 6/14
MULTILAYER CERAMIC CHIP CAPACITORS
HCD-004-2005
8. Packing
8.1 Bulk Packing
According to customer request.
8.2 Chip Capacitors Tape Packing
Chip Section
Empty Section
40mm min.
Empty Section
20mm min.
Drawing Direction
400mm min.
8.3 Material And Quantity
Tape
Material
Paper
Plastic
0201
T 0.39mm
15,000 pcs/Reel
NA
0402
T 0.70mm
10,000 pcs/Reel
NA
≦
Tape
Material
Paper
Plastic
≦
>
≦
≦
1206
1.00mm T 1.25mm
NA
3,000 pcs/Reel
≦1.25mm
1808/1210
1.25mm T 2.40mm
NA
1,000/2,000 pcs/Reel
T 1.00mm
4,000 pcs/Reel
NA
Tape
Material
Paper
Plastic
0603/0805
T 1.00mm
T 1.00mm
4,000 pcs/Reel
NA
NA
3,000 pcs/Reel
T
NA
3,000 pcs/Reel
<≦
<≦
T
>1.25mm
NA
2,000 pcs/Reel
T
>2.40mm
NA
500/1,000 pcs/Reel
Tape
1812/2211/2220
1825/2225
2208
Material
T 2.20mm
T 2.20mm
T 2.20mm
T 2.20mm
T 2.20mm
Paper
NA
NA
NA
NA
NA
Plastic 1,000 pcs/Reel 700 pcs/Reel 700 pcs/Reel 400 pcs/Reel 1,000 pcs/Reel
NA Not Available
≦
>
≦
>
≦
:
8.4 Cover Tape Reel Off Force
8.4.1 Peel-Off Force
5 g· f
≦Peel-Off Force ≦70 g·f
8.4.2 Measure Method
165 to 180°
Top Tape
Bottom Tape
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Page : 7/14
MULTILAYER CERAMIC CHIP CAPACITORS
8.5 Paper Tape
Pitch Hold
HCD-004-2005
Chip Inserting Hole
I
F
A
H
G
B
C
t
D
E
Unit:mm
TYPE
0201
0402
0603
0805
1206
1210
A
0.37± 0.1
0.61± 0.1
1.10± 0.2
1.50± 0.2
1.90± 0.2
2.90± 0.2
B
0.67± 0.1
1.20± 0.1
1.90± 0.2
2.30± 0.2
3.50± 0.2
3.60± 0.2
C
4.00± 0.1
TYPE
0201
0402
0603
0805
1206
1210
F
1.75± 0.10
G
3.50± 0.05
H
8.0± 0.30
D
2.00± 0.05
E
2.00± 0.1
4.00± 0.1
I
φ1.50 +0.10/-0
t
1.10 max.
8.6 Plastic Tape
Pitch Hold
Chip Inserting Hole
I
F
A
G
H
B
t
C
O
D
E
J
Type
0805
1206
1210
1808
1812
1825
2208
2211
2220
2225
Unit:mm
A
1.5±0.2
1.9±0.2
2.9±0.2
2.5±0.2
3.6±0.2
6.9 0.2
2.5±0.2
3.2±0.2
5.4±0.2
6.9 0.2
±
±
B
2.3±0.2
3.5±0.2
3.6±0.2
4.9±0.2
4.9±0.2
4.9 0.2
6.1±0.2
6.1±0.2
6.1±0.2
6.1 0.2
C
4.0± 0.1
±
D
2.0± 0.05
E
4.0± 0.1
F
1.75± 0.1
8.0± 0.1
±
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Page : 8/14
MULTILAYER CERAMIC CHIP CAPACITORS
Type
0805
1206
1210
1808
1812
1825
2208
2211
2220
2225
G
3.5± 0.05
H
8.0± 0.3
5.5± 0.05
12.0 ± 0.3
I
φ1.5+0.1/-0
J
3.0 max.
t
0.3 max.
4.0 max.
HCD-004-2005
O
1.0± 0.1
1.5± 0.1
8.7 Reel Dimensions
:Polystyrene
Reel Material
E
C
B
D
A
W
Unit:mm
Type
0201
0402
0603
0805
1206
1210
1808
1812
1825
2208
2211
2220
2225
φ382 max
A
φ50 min
B
φ178±2.0
φ60±2.0
C
φ13± 0.5
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D
φ21± 0.8
E
2.0±0.5
W
10± 0.15
±
13 0.3
Page : 9/14
MULTILAYER CERAMIC CHIP CAPACITORS
HCD-004-2005
Precautionary Notes:
1. Storage
Store the capacitors where the temperature and relative humidity don’t exceed 40°C and 70%RH. We
recommend that the capacitors be used within 12 months from the date of manufacturing. Store the products in
the original package and do not open the outer wrapped, polyethylene bag, till just before usage. If it is open, seal
it as soon as possible or keep it in a desiccant with a desiccation agent.
2. Construction of Board Pattern
Improper circuit layout and pad/land size may cause excessive or not enough solder amount on the PC board.
Not enough solder may create weak joint, and excessive solder may increase the potential of mechanical or
thermal cracks on the ceramic capacitor. Therefore we recommend the land size to be as shown in the following
table:
2.1 Size and recommend land dimensions for reflow soldering .
Capacitor
C
Slit
0201
0402
0603
0805
1206
1210
1808
1812
1825
2208
2211
2220
2225
E
D
B
Chip (mm)
L
W
0.60 0.30
1.00 0.50
1.60 0.80
2.00 1.25
3.20 1.60
3.20 2.50
4.60 2.00
4.60 3.20
4.60 6.35
5.70 2.00
5.70 2.80
5.70 5.00
5.70 6.35
EIA Code
Land
Solder Resist
A
A
0.2~0.3
0.3~0.5
0.4~0.6
0.7~0.9
2.2~2.4
2.2~2.4
2.8~3.4
2.8~3.4
2.8~3.4
4.0~4.6
4.0~4.6
4.0~4.6
4.0~4.6
B
0.2~0.4
0.3~0.5
0.6~0.7
0.6~0.8
0.8~0.9
1.0~1.2
1.8~2.0
1.8~2.0
1.8~2.0
2.0~2.2
2.0~2.2
2.0~2.2
2.0~2.2
Land (mm)
C
0.2~0.4
0.4~0.6
0.6~0.8
0.8~1.1
1.0~1.4
1.8~2.3
1.5~1.8
2.3~3.0
5.1~5.8
1.5~1.8
2.0~2.6
3.5~4.8
5.1~5.8
D
----1.0~2.0
1.0~2.0
1.0~2.8
1.0~2.8
1.0~4.0
1.0~4.0
1.0~4.0
1.0~4.0
1.0~4.0
E
----3.2~3.7
4.1~4.6
3.6~4.1
4.8~5.3
7.1~8.3
3.6~4.1
4.4~4.9
6.6~7.1
7.1~8.3
2.2 Mechanical strength varies according to location of chip capacitors on the P.C. board.
Design layout of components on the PC board such a way to minimize the stress imposed on the
components, upon flexure of the boards in depanelization or other processes.
Component layout close to the edge of the board or the “depanelization line” is not recommended.
Susceptibility to stress is in the order of: a>b>c and d>e
e
b
perforation
c
slit
a
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d
Page : 10/14
MULTILAYER CERAMIC CHIP CAPACITORS
HCD-004-2005
2.3 Layout Recommendation
Example
Use of Common
Solder Land
Need to Avoid
Solder With Chassis
Lead Wire
Chip
Use of Common Solder
Land With Other SMD
Chassis
Solder
Excessive
Solder
Solder Land
Adhesive
Solder Land
PCB
Recommendation
Lead Wire
Chip
α
Solder Resist
Solder Resist
Adhesive
PCB
β
Solder Land
α>β
3. Mounting
3.1 Sometimes crack is caused by the impact load due to suction nozzle in pick and place operation.
In pick and place operation, if the low dead point is too low, excessive stress is applied to component. This may
cause cracks in the ceramic capacitor, therefore it is required to move low dead point of a suction nozzle to the
higher level to minimize the board warp age and stress on the components. Nozzle pressure is typically
adjusted to 1N to 3N (static load) during the pick and place operation.
Excessive Stress
Nozzle
Warping of Board
Warping of Board
PCB
Crack
Support pin
3.2 Amount of Adhesive
a
b
a
Example : 0805 & 1206
0.2mm min.
a
b
c
c
70 ~ 100 µm
Do not touch the solder land
c
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Page : 11/14
MULTILAYER CERAMIC CHIP CAPACITORS
HCD-004-2005
4. Soldering
4.1. Wave Soldering
Most of components are wave soldered with solder at Peak Temperature.. Adequate care must be taken to
prevent the potential of thermal cracks on the ceramic capacitors. Refer to the soldering methods below for
optimum soldering benefits.
Recommend flow soldering temperature Profile
Pre-heating
Soldering
300
Cooling
℃ Max.
Temperature (°C)
Peak 260
200
ΔT
Soldering Method
1206/0805/0603
Pb-Sn Solder
Lead Free Solder
℃
Peak Temp.( ) / Duration (sec)
T ≤ 100~150
max.
250 (max.) / 3sec(max.)
260 (max.) / 5sec(max.)
Δ
℃
℃
℃
Recommended solder compositions
Sn-37Pb (Pb - Sn Solder)
Sn-3.0Ag-0.5Cu (Lead Free Solder)
120seconds or more
5sec.Max. 60seconds or more
To optimize the result of soldering, proper preheating is essential:
1) Preheat temperature is too low
a. Flux flows to easily
b. Possibility of thermal cracks
2) Preheat temperature is too high
a. Flux deteriorates even when oxide film is removed
b. Causes warping of circuit board
c. Loss of reliability in chip and other components
Cooling Condition:
Natural cooling using air is recommended. If the chips are dipped into a solvent for cleaning, the temperature
difference ( T) between the solvent and the chips must be less than 100°C.
Δ
4.2 Reflow Soldering
Preheat and gradual increase in temperature to the reflow temperature is recommended to decrease the
potential of thermal crack on the components. The recommended heating rate depends on the size of
component, however it should not exceed 3°C/Sec.
Recommend reflow profile for Lead-Free soldering temperature Profile (J-STD-020D)
Soldering Cooling
Pre-heating
260°C max./10sec.
Min.
260max.
Temperature (°C)
217
ΔT
※ The cycles of soldering : Twice (max.)
Soldering Method
1206 and Under
1210 and Over
Change in Temp.(
T
190
T
130
Δ ≦
Δ ≦
℃
℃
℃)
150
60sec. Min.
60 to 150 sec.
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Page : 12/14
MULTILAYER CERAMIC CHIP CAPACITORS
HCD-004-2005
4.3 Hand Soldering
Sudden temperature change in components, results in a temperature gradient recommended in the following
table, and therefore may cause internal thermal cracks in the components. In general a hand soldering method
is not recommended unless proper preheating and handling practices have been taken. Care must also be
taken not to touch the ceramic body of the capacitor with the tip of solder Iron.
350
Soldering Method
1206 and Under
1210 and Over
250
Temperature (°C)
200
Change in Temp.(
T
150
T
130
Δ ≦
Δ ≦
℃
℃
℃)
ΔT
Within 5 seconds.
How to Solder Repair by Solder Iron
1) Selection of the soldering iron tip
The required temperature of solder iron for any type of repair depends on the type of the tip, the substrate
material, and the solder land size.
2) recommended solder iron condition
a.) Preheating Condition Board and components should be preheated sufficiently at 150°C or over,
and soldering should be conducted with soldering iron as boards and components are maintained
at sufficient temperatures.
b.) Soldering iron power shall not exceed 30 W.
c.) Soldering iron tip diameter shall not exceed 3mm.
d.) Temperature of iron tip shall not exceed 350°C., and the process should be finished within 5 seconds.
( refer to MIL-STD-202G)
f.) Do not touch the ceramic body with the tip of solder iron. Direct contact of the soldering iron tip to ceramic
body may cause thermal cracks.
g.) After soldering operation, let the products cool down gradually in the room temperature.
:
5. Handling after chip mounted
5.1 Proper handling is recommended, since excessive bending and twist of the board, depends on the orientation
of the chip on the board, may induce mechanical stress and cause internal crack in the capacitor.
Higher potential of crack
Lower potential of crack
Bending
→
Twist
5.2 There is a potential of crack if board is warped due to excessive load by check pin
○
╳
Check pin
IHHEC is a trademark of Holy Stone Enterprise Co., Ltd
Support Pin
Check pin
Page : 13/14
MULTILAYER CERAMIC CHIP CAPACITORS
HCD-004-2005
5.3 Mechanical stress due to warping and torsion.
(a) Crack occurrence ratio will be increased by manual separation.
(b) Crack occurrence ratio will be increased by tensile force , rather than compressive
compressive force.
○ :Compressive Stress
╳ :Tensile Stresss
Crack
6.. Handling of Loose Chip Capacitor
6.1 If dropped the chip capacitor may crack.
Crack
Floor
6.2 In piling and stacking of the P.C. boards after mounting for storage or
or handling, the corner of the P.C. board
may hit the chip capacitor mounted on another board to cause crack.
PCB
Crack
7. Safekeeping condition and period
For safekeeping of the products, we recommend to keep the storage temperature between +5 to +40°C and
under humidity of 20 to 70% RH. The
he shelf life of capacitors is 12 months.
IHHEC is a trademark of Holy Sto
Stone Enterprise Co., Ltd
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