QUALIFICATION TEST REPORT
FOR
STAXTM LD
ELASTOMERIC CONNECTOR
Test Report #:
368
Issue Date:
November 12, 2001
Approved By:
Robert John
DOCUMENT
#:
3-1773443-3
155 Commerce Drive
)RUW:DVKLQJWRQ3$
7(/
-283-8866
)$;
-283-8925D
Page 1
This information is confidential and proprietary to Tyco Electronics Corporation and its worldwide subsidiaries and affiliates. It may not be disclosed
to anyone, other than Tyco Electronics personnel, without written authorization from Tyco Electronics Corporation, Harrisburg, PA USA.
General
1.0
Purpose
To subject Tyco Electronics STAX LD product to qualification testing in
accordance with connector industry standards and specifications. The data
presented here is the result of testing performed at a qualified outside facility.
2.0
Scope
This document applies to Tyco Electronics’ STAX LD elastomeric connectors in
the configuration listed in section 4.0 below. Other configurations of STAX LD
material may perform differently.
3.0
4.0
Applicable Documents
EIA-364
Electronic Industries Association Standard for Electrical
Connector/Socket Test Procedures Including Environmental
Classifications
2-1442001-0
STAX LD Engineering Test Coupon (See Appendix A)
Quantity and Part Numbers to be Tested
For each test group, five samples measuring 26.42mm (1.040”) L x 2.92mm
(.115”) H x 1.2mm (.047”) W from 3 separate lots of STAX LD material were
evaluated. The width of the test element consisted of 0.94mm (.037”) conductor
and 0.13mm (.005”) insulator on each side. The test holder controlled the
deflected height of the samples to 2.54mm (.100”), which is equivalent to a
nominal 12.3% deflection.
5.0
Conclusion
The STAX LD elastomeric connectors, as specified in section 4.0, meet the
electrical, mechanical, and environmental performance requirements as listed in
Sections I, II, and III of this qualification report.
Page 2
This information is confidential and proprietary to Tyco Electronics Corporation and its worldwide subsidiaries and affiliates. It may not be disclosed
to anyone, other than Tyco Electronics personnel, without written authorization from Tyco Electronics Corporation, Harrisburg, PA USA.
Summary of Test Methods and Specifications
I. Electrical Tests
EIA 364, Test Procedure 23
Low Level Contact Resistance
Four-wire resistance measurements were taken on elastomeric connectors mated
between two Tyco Electronics test boards (P/N 3-839) with gold plated contacts. There
were 26 test points per element with 0.5 mm (0.020”) contacts on a 1 mm (0.039”)
pitch.
The test voltage was limited to 20 mV, and the test current was 100 mA.
Requirement – Contact resistance shall not exceed 100m .
Dielectric Withstanding Voltage
EIA 364, Test Procedure 20
500 Vrms was applied across adjacent contacts for 60 seconds.
Requirement - No evidence of breakdown, arcing, etc.
Insulation Resistance
EIA 364, Test Procedure 21
Measurements were made across adjacent contacts using a test voltage of 500 Vdc
applied for 2 minutes.
Requirement - Initial resistance shall be 1000 M ; final resistance shall be 100 M .
Current Carrying Capacity
EIA 364, Test Procedure 70
Test boards of mated samples were wired such that an applied test current would flow
through 10 contacts. Temperature rise above ambient was measured at 0.1 Amp, 0.5
Amp and 0.5 Amp intervals thereafter until the temperature rise exceeded 100°C.
Requirement – Measurement only.
Page 3
This information is confidential and proprietary to Tyco Electronics Corporation and its worldwide subsidiaries and affiliates. It may not be disclosed
to anyone, other than Tyco Electronics personnel, without written authorization from Tyco Electronics Corporation, Harrisburg, PA USA.
II. Environmental Tests
Thermal Shock
EIA 364, Test Procedure 32
Mated samples were subjected to 30 cycles between -40°C and +85°C with 30 minutes
at each temperature extreme and a 3 second transition.
Requirement - Samples shall meet the requirements for contact resistance, dielectric
withstanding voltage and insulation resistance.
Moisture
EIA 364, Test Procedure 31
Mated samples were subjected to 504 hours of 85°C, 95% RH.
Requirement - Samples shall meet the requirements for contact resistance, dielectric
withstanding voltage and insulation resistance.
Thermal Aging
EIA 364, Test Procedure 17
Mated samples were subjected to +85°C for 504 hours.
Requirement – Samples shall meet the requirements for contact resistance.
Low Temperature
EIA 364, Test Procedure 59
Mated samples were subjected to -40°C for 504 hours.
Requirement – Samples shall meet the requirements for contact resistance.
Mixed Flowing Gas Test
EIA 364 Test Procedure 65
Mated samples were subjected to 10 +/- 3 ppb Cl2, 200 +/- 50 ppb NO2, 10 +/- 5 ppb
H2S and 100 +/- 20 ppb SO2 at +30°C, 70% RH for 480 hours.
Requirement – Samples shall meet the requirements for contact resistance.
Salt Spray
EIA 364, Test Procedure 26
Mated samples were subjected to 96 hours of salt mist with a 5% salt solution at 95°C.
Requirement – Samples shall meet the requirements for contact resistance.
Page 4
This information is confidential and proprietary to Tyco Electronics Corporation and its worldwide subsidiaries and affiliates. It may not be disclosed
to anyone, other than Tyco Electronics personnel, without written authorization from Tyco Electronics Corporation, Harrisburg, PA USA.
III. Physical Tests
Shock
EIA 364, Test Procedure 27
Mated samples were subjected to 6 shock pulses in 3 axes (18 total), 50 G peak, halfsine, 11.3 feet per second.
Requirement - There shall be no electrical interruptions greater than 100 nanoseconds
and the samples shall meet the requirements for contact resistance.
Vibration
EIA 364, Test Procedure 28
Mated samples were subjected to 1.5 hours of random vibration in 3 axes (4.5 total),
with a 7.3 G min.
Requirement - There shall be no electrical interruptions greater than 100 nanoseconds
and the samples shall meet the requirements for contact resistance.
Durability
EIA 364, Test Procedure 09
Samples were manually mated/unmated 50 times.
Requirement - Samples shall meet the requirements for contact resistance, dielectric
withstanding voltage and insulation resistance.
Compression Set
Mated samples were exposed to +85°C for 504 hours and initial and final heights were
recorded. Compression set is calculated according to the following equation:
Compression Set = (Hi – Hf) / (Hi – Hd)
Requirement – Measurement only.
Force vs. Deflection
Samples were deflected in 0.05mm (.002”) increments to a free height of 1.77mm
(.070”) which represents 39.2% deflection. Force measurements were recorded after 5
seconds at each deflection.
Requirement – Measurement only.
Contact Resistance vs. Deflection
Samples were deflected in 0.05mm (.002”) increments to a free height of 1.77mm
(.070”) which represents 39.2% deflection. Contact resistance measurements were
recorded after 5 seconds at each deflection.
Requirement – Measurement only.
Page 5
This information is confidential and proprietary to Tyco Electronics Corporation and its worldwide subsidiaries and affiliates. It may not be disclosed
to anyone, other than Tyco Electronics personnel, without written authorization from Tyco Electronics Corporation, Harrisburg, PA USA.
Test Flow Chart
The following test sequences were established for this program:
Group 1
LLCR
Vibration
LLCR
Shock
LLCR
Group 2
LLCR
Durability
LLCR
Thermal Shock
LLCR
Moisture
LLCR
Group 3
IR & DWV
Durability
IR & DWV
Thermal Shock
IR & DWV
Moisture
IR & DWV
Group 4
LLCR
Thermal Aging
LLCR
Mixed Flowing Gas Test
LLCR
Group 5
LLCR
Salt Spray
LLCR
Group 6
LLCR
Low Temperature
LLCR
Group 7
Compression Set
Group 8
Current Carrying Capacity
Group 9
Force vs. Deflection
LLCR vs. Deflection
Page 6
This information is confidential and proprietary to Tyco Electronics Corporation and its worldwide subsidiaries and affiliates. It may not be disclosed
to anyone, other than Tyco Electronics personnel, without written authorization from Tyco Electronics Corporation, Harrisburg, PA USA.
Summary of Test Results
Test Group 1
/RZ/HYHO&RQWDFW5HVLVWDQFH P
Initial
After
Vibration
After
Shock
Lot #
Min
Max
Avg
St Dev
Min
Max
Avg
St Dev
Min
Max
Avg
St Dev
01/3/199-1
12.3
24.1
16.3
2.1
13.0
25.6
17.8
2.5
13.1
33.5
17.5
2.9
DIWHU9LEUDWLRQDQG6KRFNWHVWLQJ
01/5/51-5
17.5
29.2
22.9
2.8
17.0
34.2
24.3
3.4
17.6
33.1
23.5
2.9
01/5/52-5
17.1
35.3
23.2
3.9
16.6
32.3
23.5
3.3
16.2
30.2
22.6
3.0
Combined
12.3
35.3
20.8
13.0
34.2
21.9
13.1
33.5
21.2
RESULT – PASSED
Test Group 2
Low Level Contact Resistance (P
Moisture testing:
Initial
After
Durability
After
Thermal
Shock
After
Moisture
Lot #
Min
Max
Avg
St Dev
Min
Max
Avg
St Dev
Min
Max
Avg
St Dev
Min
Max
Avg
St Dev
01/3/199-1
20.5
22.1
21.3
0.3
20.1
21.8
21.1
0.4
13.0
35.3
17.3
2.9
11.3
25.1
15.2
1.9
DIWHU'XUDELOLW\7KHUPDO6KRFNDQG
01/5/51-5
24.4
25.9
25.2
0.4
24.4
25.6
24.9
0.2
19.8
34.8
25.9
3.5
18.3
30.9
23.7
2.9
01/5/52-5
19.3
21.3
20.1
0.5
18.9
21.6
19.9
0.5
20.3
42.3
29.6
4.6
17.3
45.0
24.9
4.4
Combined
19.3
25.9
22.2
18.9
25.6
22.0
13.0
42.3
24.3
11.3
45.0
21.3
RESULT – PASSED
Page 7
This information is confidential and proprietary to Tyco Electronics Corporation and its worldwide subsidiaries and affiliates. It may not be disclosed
to anyone, other than Tyco Electronics personnel, without written authorization from Tyco Electronics Corporation, Harrisburg, PA USA.
Test Group 3
Insulation Resistance and Dielectric Withstanding Voltage after Durability,
Thermal Shock and Moisture testing:
Lot #
01/3/199-1
01/5/51-5
01/5/52-5
Combined
DWV
PASS
PASS
PASS
PASS
IR
PASS
PASS
PASS
PASS
DWV
PASS
PASS
PASS
PASS
IR
PASS
PASS
PASS
PASS
DWV
PASS
PASS
PASS
PASS
IR
PASS
PASS
PASS
PASS
DWV
PASS
PASS
PASS
PASS
IR
PASS
PASS
PASS
PASS
Initial
After
Durability
After
Thermal
Shock
After
Moisture
All samplHVKDG,QVXODWLRQ5HVLVWDQFH!0
No evidence of breakdown, arcing, etc. when 500 VAC was applied.
RESULT – PASSED
Test Group 4
/RZ/HYHO&RQWDFW5HVLVWDQFH P
DIWHU7KHUPDO$JLQJDQG0L[HG)ORZLQJ*DV
testing:
Initial
After
Thermal
Aging
After
Mixed
Flowing
Gas
Lot #
Min
Max
Avg
St Dev
Min
Max
Avg
St Dev
Min
Max
Avg
St Dev
01/3/199-1
20.0
21.9
21.1
0.5
12.1
29.5
19.1
4.0
11.8
30.2
18.7
4.1
01/5/51-5
24.4
25.7
25.0
0.3
21.3
41.9
29.0
4.0
16.1
45.5
30.4
5.5
01/5/52-5
19.6
20.7
20.0
0.2
20.2
36.1
26.5
3.3
20.2
36.4
26.5
3.3
Combined
19.6
25.7
22.0
12.1
41.9
24.9
11.8
45.5
25.2
RESULT – PASSED
Page 8
This information is confidential and proprietary to Tyco Electronics Corporation and its worldwide subsidiaries and affiliates. It may not be disclosed
to anyone, other than Tyco Electronics personnel, without written authorization from Tyco Electronics Corporation, Harrisburg, PA USA.
Test Group 5
Low LevHO&RQWDFW5HVLVWDQFH P
Lot #
Min
Max
Avg
St Dev
Min
Max
Avg
St Dev
Initial
After
Salt
Spray
01/3/199-1
12.1
24.6
17.3
2.6
11.5
23.4
16.7
2.5
DIWHU6DOW6SUD\WHVWLQJ
01/5/51-5
15.4
40.0
23.1
4.0
9.1
20.5
13.6
2.3
01/5/52-5
16.8
33.1
23.5
3.6
11.1
30.4
19.1
3.7
Combined
12.1
40.0
21.3
9.1
30.4
16.5
RESULT – PASSED
Test Group 6
/RZ/HYHO&RQWDFW5HVLVWDQFH P
Lot #
Min
Max
Avg
St Dev
Min
Max
Avg
St Dev
Initial
After
Low
Temp
01/3/199-1
20.0
22.1
21.3
0.4
12.1
29.5
17.0
2.9
DIWHU/RZ7HPSHUDWXUHWHVWLQJ
01/5/51-5
24.4
27.0
25.0
0.4
18.4
34.6
25.9
3.6
01/5/52-5
19.0
20.9
20.1
0.3
17.6
31.8
23.6
2.5
Combined
19.0
27.0
22.1
01/5/51-5
47.8 %
61.5 %
54.8 %
01/5/52-5
36.8 %
57.5 %
46.5 %
Combined
36.8 %
62.5 %
50.8 %
12.1
34.6
22.2
RESULT - PASSED
Test Group 7
Compression Set:
Set as a
% of
Deflection
Lot #
Min
Max
Avg
01/3/199-1
43.6 %
62.5 %
51.0 %
RESULT – ACCEPTABLE
Page 9
This information is confidential and proprietary to Tyco Electronics Corporation and its worldwide subsidiaries and affiliates. It may not be disclosed
to anyone, other than Tyco Electronics personnel, without written authorization from Tyco Electronics Corporation, Harrisburg, PA USA.
Test Group 8
Current Carrying Capacity:
Lot #
0.1 A
0.5 A
1.0 A
1.5 A
Max
Temp
Rise
01/3/199-1
0.6 ºC
2.4 ºC
8.6 ºC
19.4 ºC
01/5/51-5
0.4 ºC
3.7 ºC
15.7 ºC
37.7 ºC
01/5/52-5
1.1 ºC
6.3 ºC
23.3 ºC
47.3 ºC
Combined
1.1 ºC
6.3 ºC
23.3 ºC
47.3 ºC
Due to the narrow trace width of the test boards, 0.38mm (.015”), readings at 2.0 A or beyond were not possible.
RESULT – ACCEPTABLE
Test Group 9
Force and Resistance vs. Deflection:
6.00
0.300
0.250
Force
Resistance
4.00
0.200
3.00
0.150
2.00
0.100
1.00
0.050
0.00
0.000
40%
0%
5%
10%
15%
20%
Deflection
25%
30%
35%
Resistance (ohms)
Force (Newtons / mm^2)
5.00
RESULT - ACCEPTABLE
Page 10
This information is confidential and proprietary to Tyco Electronics Corporation and its worldwide subsidiaries and affiliates. It may not be disclosed
to anyone, other than Tyco Electronics personnel, without written authorization from Tyco Electronics Corporation, Harrisburg, PA USA.
Appendix A
Page 11
This information is confidential and proprietary to Tyco Electronics Corporation and its worldwide subsidiaries and affiliates. It may not be disclosed
to anyone, other than Tyco Electronics personnel, without written authorization from Tyco Electronics Corporation, Harrisburg, PA USA.
