Product
Specification
108-9039
22Apr 2016 Rev M
Connector, Standard Edge
1.
SCOPE
1.1.
Content
This specification covers perform ance, tests and quality requirem ents for the TE Connectivity (TE)
Standard Edge connector. This connector is a m ulti-contact, edge board type assem bly having
contacts of various lengths for plug-on, wrap or solder applications.
1.2.
Qualification
W hen tests are perform ed on subject product line, procedures specified in 109 Series Test
Specifications shall be used. All inspections shall be perform ed using the applicable inspection plan
and product drawing.
2.
APPLICABLE DOCUM ENTS
The following docum ents form a part of this specification to the extent specified herein. Unless
otherwise specified, the latest edition of the docum ent applies. In the event of conflict between the
requirem ents of this specification and the product drawing, the product drawing shall take precedence.
In the event of conflict between the requirem ents of this specification the and referenced docum ents,
this specification shall take precedence.
2.1.
TE Docum ents
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2.2.
109-1: General Requirem ents for Test Specifications
109 Series: Test Specifications as indicated in Figure 1
501-227: Qualification Test Report
Military Standard
MIL-STD-275: Printed W iring for Electronic Equipm ent
3.
REQUIREM ENTS
3.1.
Design and Construction
Product shall be of the design, construction and physical dim ensions specified on the applicable product
drawing.
3.2.
Materials
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3.3.
Contact: Phosphor bronze, gold plating
Housing: Polyester
Ratings
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Voltage: 400 volts (rm s) at sea level
Current:
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Tem perature: -55 to 85°C
©2011 Tyco Electronics Corporation, | Indicates change
a TE Connectivity Ltd. Company
*Trademark
All Rights Reserved
TE logo is a trademark.
For latest revision, visit our website at www.te.com/documents.
For Regional Customer Service, visit our website at www.te.com
Other products, logos, and company names might be trademarks of their respective owners.
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LOC B
108-9039
3.4.
Perform ance and Test Description
Product is designed to m eet the electrical, m echanical and environm ental perform ance requirem ents
specified in Figure 1. All tests are perform ed at am bient tem perature unless otherwise specified.
3.5.
Test Requirem ents and Procedures Sum m ary
Test Description
Requirem ent
Procedure
Exam ination of product.
Meets requirem ents of product
drawing.
Visual, dim ensional and functional
per applicable quality inspection
plan.
Term ination resistance, dry circuit.
10 m illiohm s m axim um .
TE Spec 109-6-1.
Subject m ated contacts assem bled
in housing to 50 m v open circuit at
100 m a m axim um .
See Figure 3.
Dielectric withstanding voltage.
Test Voltage
Centerline
RMS
Spacing
1000
.100
1500
.125
5 m illiam peres m axim um leakage.
TE Spec 109-29-1.
Test between adjacent contacts of
unm ated connector assem blies.
Insulation resistance.
5000 m egohm s m inim um .
TE Spec 109-28-4.
Test between adjacent contacts of
unm ated connector assem blies.
MECHANICAL
Vibration, random .
No discontinuities greater than 1
m icrosecond.
TE Spec 109-21-5, Condition C.
Subject m ated connectors to 9 G's
rm s for 3 m inutes.
See Figure 4.
Physical shock.
No discontinuities greater than 1
m icrosecond.
TE Spec 109-26-1.
Subject m ated connectors to 50
G's half-sine shock pulses of 11
m illiseconds duration. 3 shocks in
each direction applied along 3
m utually perpendicular planes, 18
total shocks.
See Figure 4.
Mating force.
19 ounces m axim um per contact
pair.
TE Spec 109-42, Condition A.
Measure force necessary to m ate
connector with daughter card from
point of initial contact using free
floating fixtures at a rate of .5 inch
per m inute.
Calculate force per contact.
Unm ating force.
1.25 ounces m inim um per contact
pair.
TE Spec 109-42, Condition A.
Measure force necessary to
unm ate assem blies at a rate of .5
inch per m inute.
Calculate force per contact.
Figure 1 (continued)
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108-9039
Test Description
Requirem ent
Procedure
Contact retention.
Contact shall not dislodge from
norm al locking position.
TE Spec 109-30.
Apply axial load of 8 pounds to
contacts.
Durability.
See Note.
TE Spec 109-27.
Mate and unm ate connector
assem blies using daughter card for
250 cycles for 30 m in gold plating
and 100 cycles for 15 m in gold
plating at m axim um rate of 500
cycles per hour.
See Figure 5.
ENVIRONMENTAL
Therm al shock.
See Note.
TE Spec 109-22.
Subject unm ated connectors to 5
cycles between -55 and 85°C.
Hum idity, steady state.
See Note.
TE Spec 109-23-2.
Subject unm ated connectors to
steady state hum idity at 40°C and
90-95% RH for 4 days.
Mixed flowing gas.
See Note.
TE Spec 109-85-2.
Subject m ated connectors to
environm ental class II for 14 days.
Tem perature life.
See Note.
TE Spec 109-43.
Subject m ated connectors to
tem perature life at 85°C for 500
hours.
NOTE
Shall meet visual requirements, show no physical damage and shall meet requirements of
additional tests as specified in Test Sequence in Figure 2.
Figure 1 (end)
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108-9039
3.6.
Connector Qualification and Requalification Tests and Sequences
Test Group (a)
Test or Exam ination
1
2
3
4
Test Sequence (b)
Exam ination of product
1,9
1,5
1,5
Term ination resistance, dry circuit
3,7
2,4
2,4
Dielectric withstanding voltage
4,8
Insulation resistance
3,7
Vibration
5
Physical shock
6
Mating force
2
Unm ating force
8
Contact retention
2
Durability
4
Therm al shock
5
Hum idity, steady state
6
Mixed flowing gas
3(c)
Tem perature life
NOTE
(a)
(b)
(c)
1,9
3(c)
See paragraph 4.1.A.
Numbers indicate sequence in which tests are performed.
Precondition with 5 cycles durability.
Figure 2
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108-9039
4.
QUALITY ASSURANCE PROVISIONS
4.1.
Qualification Testing
A.
Sam ple Selection
Connector housings and contacts shall be prepared in accordance with applicable Instruction
Sheets and shall be selected at random from current production. All test groups shall consist of 10
connectors of greatest num ber of positions available. 5 connectors from each of 2 different plating
configurations. Test groups 1, 2 and 3 shall be soldered to printed circuit boards. W here individual
contact m easurem ents are required, a m inim um of 30 random ly selected contacts distributed
am ong the 5 connectors shall be m easured.
B.
Test Sequence
Qualification inspection shall be verified by testing sam ples as specified in Figure 2.
4.2.
Requalification Testing
If changes significantly affecting form , fit or function are m ade to the product or m anufacturing process,
product assurance shall coordinate requalification testing, consisting of all or part of the original testing
sequence as determ ined by developm ent/product, quality and reliability engineering.
4.3.
Acceptance
Acceptance is based on verification that the product m eets the requirem ents of Figure 1. Failures
attributed to equipm ent, test setup or operator deficiencies shall not disqualify the product. W hen
product failure occurs, corrective action shall be taken and sam ples resubm itted for qualification.
Testing to confirm corrective action is required before resubm ittal.
4.4.
Quality Conform ance Inspection
The applicable quality inspection plan will specify the sam pling acceptable quality level to be used.
Dim ensional and functional requirem ents shall be in accordance with the applicable product drawing
and this specification.
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108-9039
Figure 3
Term ination Resistance Measurem ent Points
Figure 4
Vibration & Physical Shock
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108-9039
NOTE
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
Connector Contact Spacing
A BSC Dim ension
B Dim ension
.100
.100
.052
.125
.125
.078
Dimensions are in inches.
Unless otherwise specified, tolerance is ±.005.
Test card shall extend 4.00 ±.02 from receptacle after insertion. See Figure 3.
Number of contacts shall be same as on corresponding printed wiring connector.
Printed circuit test board shall be 2 ounces copper and gold over nickel plating per
MIL-STD-275.
Dimension shall be minimum connector card slot length minus .008.
Conductor configuration optional beyond card slot depth.
Printed wiring shall be identical on both sides.
Figure 5
Printed Circuit Board
Rev M
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