IC62LV12816L IC62LV12816LL
IC62LV12816L IC62LV12816LL
128K x 16 LOW VOLTAGE, ULTRA LOW POWER CMOS STATIC RAM
.EATURES
High-speed access times: 55, 70, 100 ns CMOS low power operation -- 60 mW (typical) operating -- 3 µW (typical) CMOS standby TTL compatible interface levels Single 2.7V-3.6V Vcc power supply .ully static operation: no clock or refresh required Three state outputs Data control for upper and lower bytes Industrial temperature available Available in the 44-pin TSOP-2 and 48-pin 6*8mm T.-BGA
DESCRIPTION The 1+51 IC62LV12816L and IC62LV12816LL are high-speed,
2.097,152-bit static RAMs organized as 131,072 words by 16 bits. They are fabricated using 1+51's high-performance CMOS technology. This highly reliable process coupled with innovative circuit design techniques, yields high-performance and low power consumption devices. When CE is HIGH (deselected) or when CE is low and both LB and UB are HIGH, the device assumes a standby mode at which the power dissipation can be reduced by using CMOS input levels. Easy memory expansion is provided by using Chip Enable Output and Enable inputs, CE and OE. The active LOW Write Enable (WE) controls both writing and reading of the memory. A data byte allows Upper Byte (UB) and Lower Byte (LB) access. The IC62LV12816L and IC62LV12816LL are packaged in the JEDEC standare 44-pin 400mil TSOP-2 and 48-pin 6*8mm T.-BGA.
.UNCTIONAL BLOCK DIAGRAM
A0-A16
DECODER
128K x 16 MEMORY ARRAY
VCC GND I/O0-I/O7 Lower Byte I/O8-I/O15 Upper Byte I/O DATA CIRCUIT
COLUMN I/O
CE OE WE UB LB CONTROL CIRCUIT
ICSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any errors which may appear in this publication. © Copyright 2000, Integrated Circuit Solution Inc.
Integrated Circuit Solution Inc.
LPSR011-0B 06/06/2001
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IC62LV12816L IC62LV12816LL
PIN CON.IGURATIONS
44-Pin TSOP-2
A4 A3 A2 A1 A0 CE I/O0 I/O1 I/O2 I/O3 Vcc GND I/O4 I/O5 I/O6 I/O7 WE A16 A15 A14 A13 A12 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22
48-Pin T.-BGA
44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 A5 A6 A7 OE UB LB I/O15 I/O14 I/O13 I/O12 GND Vcc I/O11 I/O10 I/O9 I/O8 NC A8 A9 A10 A11 NC
1 A B C D E F G H
LB I/O8 I/O9 GND Vcc I/O14 I/O15 NC
2
OE UB I/O10 I/O11 I/O12 I/O13 NC A8
3
A0 A3 A5 NC NC A14 A12 A9
4
A1 A4 A6 A7 A16 A15 A13 A10
5
A2 CE I/O1 I/O3 I/O4 I/O5 WE A11
6
N/C I/O0 I/O2 Vcc GND I/O6 I/O7 NC
PIN DESCRIPTIONS
A0-A16 I/O0-I/O15 CE OE WE Address Inputs Data Input/Output Chip Enable Input Output Enable Input Write Enable Input LB UB NC Vcc GND Lower-byte Control (l/O0-I/O7) Upper-byte Control (l/O8-I/O15) No Connection Power Ground
TRUTH TABLE
Mode Not Selected WE CE H L L L L L L L L L OE X X H X L L L X X X LB X H X H L H L L H L UB X H X H H L L H L L I/O0/-I/O7 High-Z High-Z High-Z High-Z DOUT High-Z DOUT DIN High-Z DIN I/O PIN I/O8-I/O15 High-Z High-Z High-Z High-Z High-Z DOUT DOUT High-Z DIN DIN Vcc Current ISB, ISB ISB, ISB ICC ISB ICC
X X Output Disabled H X Read H H H Write L L L
ICC
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Integrated Circuit Solution Inc.
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IC62LV12816L IC62LV12816LL
OPERATING RANGE
Range Commercial Industrial Ambient Temperature 0°C to +70°C 40°C to +85°C VCC 2.7V - 3.6V 2.7V - 3.6V
ABSOLUTE MAXIMUM RATINGS(1)
Symbol VTERM TBIAS VCC TSTG PT Parameter Terminal Voltage with Respect to GND Temperature Under Bias Vcc related to GND Storage Temperature Power Dissipation Value 0.5 to Vcc + 0.5 40 to +85 0.3 to +4.0 65 to +150 1.0 Unit V °C V °C W
Notes: 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
Symbol VOH VOL VIH VIL ILI ILO Parameter Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Input Leakage Output Leakage Test Conditions VCC = Min., IOH = 1 mA VCC = Min., IOL = 2.1 mA Min. 2.0 2.2 0.2 1 1 Max. 0.4 VCC + 0.2 0.4 1 1 Unit V V V V µA µA
GND £ VIN £ VCC GND £ VOUT £ VCC, OUTPUTS DISABLED
Notes: 1. VIL(min.) = 2.0V for pulse width less than 10 ns.
CAPACITANCE(1)
Symbol CIN COUT Parameter Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Max. 6 8 Unit p. p.
Notes: 1. Tested initially and after any design or process changes that may affect these parameters.
Integrated Circuit Solution Inc.
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IC62LV12816L IC62LV12816LL
AC TEST CONDITIONS
Parameter Input Pulse Level Input Rise and .all Times Input and Output Timing and Reference Level Output Load Unit 0.4V to 2.2V 5 ns 1.3V See .igures 1 and 2
AC TEST LOADS
1 TTL OUTPUT 100 pF Including jig and scope
OUTPUT 5 pF Including jig and scope 1 TTL
.igure 1
.igure 2
IC62LV12816L POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
Symbol Parameter ICC ISB Vcc Dynamic Operating Supply Current TTL Standby Current (TTL Inputs) OR ULB Control ISB CMOS Standby Current (CMOS Inputs) OR ULB Control Test Conditions VCC = Max., IOUT = 0 mA, f = fMAX VCC = Max., VIN = VIH or VIL, CE £ VIH, f = 0 Com. Ind. Com. Ind. -55 Min. Max. 40 45 0.5 1.0 -70 Min. Max. 30 35 0.5 1.0 -100 Min. Max. 20 25 0.5 1.0 Unit mA mA
VCC = Max., VIN = VIH or VIL CE = VIL, f = 0, UB = VIH, LB = VIH VCC = Max., CE ³ VCC 0.2V, VIN ³ VCC 0.2V, or VIN £ 0.2V, f = 0 Com. Ind. 35 50 35 50 35 50 µA
VCC = Max., CE = VIL VIN £ 0.2V, f = 0, UB / LB = VCC 0.2V
Note: 1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
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IC62LV12816L IC62LV12816LL
IC62LV12816LL POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
Symbol Parameter ICC ISB Vcc Dynamic Operating Supply Current TTL Standby Current (TTL Inputs) OR ULB Control ISB CMOS Standby Current (CMOS Inputs) OR ULB Control Test Conditions VCC = Max., IOUT = 0 mA, f = fMAX VCC = Max., VIN = VIH or VIL, CE ³ VIH, f = 0 Com. Ind. Com. Ind. -55 Min. Max. 40 45 0.5 1.0 -70 Min. Max. 30 35 0.5 1.0 -100 Min. Max. 20 25 0.5 1.0 Unit mA mA
VCC = Max., VIN = VIH or VIL CE = VIL, f = 0, UB = VIH, LB = VIH VCC = Max., f = 0 CE ³ VCC 0.2V, VIN ³ VCC 0.2V, or VIN £ 0.2V, f = 0 Com. Ind. 10 15 10 15 10 15 µA
VCC = Max., CE = VIL VIN £ 0.2V, f = 0, UB / LB = VCC 0.2V
Note: 1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range)
Symbol Parameter Read Cycle Time Address Access Time Output Hold Time CE Access Time OE Access Time
Min. 55 10 5 0 10 0 0
-55
Max. 55 55 30 20 20 55 25
Min. 70 10 5 0 10 0 0
-70
Max. 70 70 35 25 25 70 25
-100 Min. Max. 100 15 5 0 10 0 0 100 100 50 30 30 100 35
Unit ns ns ns ns ns ns ns ns ns ns ns ns
tRC tAA tOHA tACE tDOE tHZOE tLZOE
OE to High-Z Output OE to Low-Z Output
tHZCE CE to High-Z Output tLZCE CE to Low-Z Output tBA tHZB tLZB
LB, UB Access Time LB, UB o High-Z Output LB. UB to Low-Z Output
Notes: 1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.3V, input pulse levels of 0.4V to 2.2V and output loading specified in .igure 1. 2. Tested with the load in .igure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
Integrated Circuit Solution Inc.
LPSR011-0B 06/06/2001
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IC62LV12816L IC62LV12816LL
AC TEST LOADS READ CYCLE NO.1(1,2) (Address Controlled) (CE = OE = VIL, UB or LB = VIL)
tRC
ADDRESS
tAA tOHA tOHA
DATA VALID
DOUT
PREVIOUS DATA VALID
AC WAVE.ORMS READ CYCLE NO. 2(1,3) (CS, OE, AND UB/LB Controlled)
tRC
ADDRESS
tAA tOHA
OE
tDOE tHZOE
CE
tLZCE
tLZOE tACE tHZCE
LB, UB
tBA tHZB
DATA VALID
DOUT
HIGH-Z
tLZB
Notes: 1. WE is HIGH for a Read Cycle. 2. The device is continuously selected. OE, CE, UB, or LB = VIL. 3. Address is valid prior to or coincident with CE LOW transitions.
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IC62LV12816L IC62LV12816LL
WRITE CYCLE SWITCHING CHARACTERISTICS(1,2) (Over Operating Range)
Symbol Parameter Write Cycle Time CE to Write End Address Setup Time to Write End Address Hold from Write End Address Setup Time LB, UB Valid to End of Write WE Pulse Width Data Setup to Write End Data Hold from Write End
!
Min. 55 50 50 0 0 45 40 25 0 5
-55 Max. 30
Min. 70 65 65 0 0 60 40 30 0 5
-70 Max. 30
-100 Min. Max 100 80 80 0 0 80 80 40 0 5 40
Unit ns ns ns ns ns ns ns ns ns ns ns
tWC tSCE tAW tHA tSA tPWB tPWE" tSD tHD tHZWE
WE LOW to High-Z Output
tLZWE! WE HIGH to Low-Z Output
Notes: 1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.3V, input pulse levels of 0.4V to 2.2V and output loading specified in .igure 1. 2. The internal write time is defined by the overlap of CE LOW, and UB or LB, and WE LOW. All signals must be in valid states to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the Write. 3. Tested with the load in .igure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested. 4. Tested with OE HIGH
AC WAVE.ORMS WRITE CYCLE NO. 1(1,2) (CS, Controlled, OE =
HIGH or LOW)
t WC
ADDRESS
VALID ADDRESS
t SA
CS
t SCS
t HA
WE
t AW t PWE1 t PWE2 t PWB
UB, LB
t HZWE
DOUT
DATA UNDEFINED
HIGH-Z
t LZWE
t SD
DIN
t HD
DATAIN VALID
Notes: 1. WRITE is an internally generated signal asserted during an overlap of the LOW states on the CS and WE inputs and at least one of the LB and UB inputs being in the LOW state. 2. WRITE = (CS) [ (LB) = (UB) ] (WE).
Integrated Circuit Solution Inc.
LPSR011-0B 06/06/2001
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IC62LV12816L IC62LV12816LL
WRITE CYCLE NO. 2 (WE Controlled; OE is HIGH During Write Cycle)
t WC
ADDRESS
VALID ADDRESS
t HA
OE
CS
LOW
t AW t PWE1
WE
t SA
UB, LB
t PWB
t HZWE
DOUT
DATA UNDEFINED
HIGH-Z
t LZWE
t SD
DIN
t HD
DATAIN VALID
WRITE CYCLE NO. 3 (WE Controlled; OE is LOW During Write Cycle)
t WC
ADDRESS
VALID ADDRESS
OE CE
LOW
t HA
LOW
t AW t PWE2
WE
t SA
UB, LB
t PWB
t HZWE
DOUT
DATA UNDEFINED
HIGH-Z
t LZWE
t SD
DIN
t HD
DATAIN VALID
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Integrated Circuit Solution Inc.
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IC62LV12816L IC62LV12816LL
WRITE CYCLE NO. 4 (UB / LB Controlled)
t WC
ADDRESS
ADDRESS 1
t WC
ADDRESS 2
OE
t SA
CS
LOW
WE
t HA t SA t PWB t PWB
WORD 2
t HA
UB, LB
WORD 1
t HZWE
DOUT
HIGH-Z
t LZWE t HD
DATAIN VALID
DATA UNDEFINED
t SD
DIN
t SD
DATAIN VALID
t HD
DATA RETENTION SWITCHING CHARACTERISTICS (L/LL)
Symbol Parameter Vcc for Data Retention Data Retention Current Test Condition See Data Retention Waveform Vcc = 2.0V, CE ³ Vcc 0.2V Com. (-L) Com. (-LL) Ind. (-L) Ind. (-LL) Min. 1.5 0 Max. 3.6 20 5 25 7 Unit V µA µA µA µA ns ns
VDR
IDR
tSDR tRDR
Data Retention Setup Time Recovery Time
See Data Retention Waveform See Data Retention Waveform
(CE Controlled)
Data Retention Mode
tRC
DATA RETENTION WAVE.ORM
tSDR VCC 2.7V
tRDR
2.2V
VDR CE ≥ VCC - 0.2V
CE GND
Integrated Circuit Solution Inc.
LPSR011-0B 06/06/2001
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IC62LV12816L IC62LV12816LL
ORDERING IN.ORMATION Commercial Range: 0°C to +70°C
Speed (ns) Order Part No. 55 70 100 IC62LV12816L-55T IC62LV12816L-55B IC62LV12816L-70T IC62LV12816L-70B IC62LV12816L-100T IC62LV12816L-100B Package 400mil TSOP-2 6*8mm T.-BGA 400mil TSOP-2 6*8mm T.-BGA 400mil TSOP-2 6*8mm T.-BGA
Industrial Range: -40°C to +85°C
Speed (ns) Order Part No. 55 70 100 IC62LV12816L-55TI IC62LV12816L-55BI IC62LV12816L-70TI IC62LV12816L-70BI IC62LV12816L-100TI IC62LV12816L-100BI Package 400mil TSOP-2 6*8mm T.-BGA 400mil TSOP-2 6*8mm T.-BGA 400mil TSOP-2 6*8mm T.-BGA
ORDERING IN.ORMATION Commercial Range: 0°C to +70°C
Speed (ns) Order Part No. 55 70 100 IC62LV12816LL-55T IC62LV12816LL-55B IC62LV12816LL-70T IC62LV12816LL-70B IC62LV12816LL-100T IC62LV12816LL-100B Package 400mil TSOP-2 6*8mm T.-BGA 400mil TSOP-2 6*8mm T.-BGA 400mil TSOP-2 6*8mm T.-BGA
Industrial Range: -40°C to +85°C
Speed (ns) Order Part No. 55 70 100 IC62LV12816LL-55TI IC62LV12816LL-55BI IC62LV12816LL-70TI IC62LV12816LL-70BI IC62LV12816LL-100TI IC62LV12816LL-100BI Package 400mil TSOP-2 6*8mm T.-BGA 400mil TSOP-2 6*8mm T.-BGA 400mil TSOP-2 6*8mm T.-BGA
HEADQUARTER: NO.2, TECHNOLOGY RD. V, SCIENCE-BASED INDUSTRIAL PARK, HSIN-CHU, TAIWAN, R.O.C. TEL: 886-3-5780333 .ax: 886-3-5783000
Integrated Circuit Solution Inc.
BRANCH O..ICE: 7., NO. 106, SEC. 1, HSIN-TAI 5TH ROAD, HSICHIH TAIPEI COUNTY, TAIWAN, R.O.C. TEL: 886-2-26962140 .AX: 886-2-26962252 http://www.icsi.com.tw
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