ICS8624I
LOW SKEW, 1-TO-5 DIFFERENTIAL-TO-HSTL ZERO DELAY BUFFER
GENERAL DESCRIPTION
The ICS8624I is a high performance, 1-to-5 Differential-to-HSTL zero delay buffer. The ICS8624I has two selectable clock input pairs. The CLK0, nCLK0 and CLK1, nCLK1 pair can accept most standard differential input levels. The VCO operates at a frequency range of 250MHz to 630MHz. Utilizing one of the outputs as feedback to the PLL, output frequencies up to 630MHz can be regenerated with zero delay with respect to the input. Dual reference clock inputs support reduntant clock or multiple reference applications..
FEATURES
• Fully integrated PLL • Five differential HSTL compatible outputs • Selectable differential CLKx, nCLKx input pairs • CLKx, nCLKx pairs can accept the following differential input levels: LVPECL, LVDS, HSTL, SSTL, HCSL • Output frequency range: 31.25MHz to 630MHz • Input frequency range: 31.25MHz to 630MHz • VCO range: 250MHz to 630MHz • External feedback for “zero delay” clock regeneration • Cycle-to-cycle jitter: 35ps (maximum) • Output skew: 50ps (maximum) • Static phase offset: 30ps ±125ps • 3.3V core, 1.8V output operating supply • -40°C to 85°C ambient operating temperature • Available in both standard and lead-free RoHS-compliant packages
BLOCK DIAGRAM
Q0 nQ0 PLL_SEL ÷4, ÷8 0 1 1 Q3 nQ3 Q1 nQ1 0 Q2 nQ2
PIN ASSIGNMENT
PLL_SEL GND GND VDDO VDDA nQ4
CLK0 nCLK0 CLK1 nCLK1 CLK_SEL FB_IN nFB_IN
32 31 30 29 28 27 26 25 SEL0 SEL1 CLK0 nCLK0 CLK1 nCLK1 CLK_SEL MR 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
VDD nFB_IN FB_IN GND GND nQ0 Q0 VDDO
VDD
Q4
24 23 22
VDDO Q3 nQ3 Q2 nQ2 Q1 nQ1 VDDO
PLL
Q4 nQ4
ICS8624I
21 20 19 18 17
SEL0 SEL1 MR
32-Lead LQFP 7mm x 7mm x 1.4mm body package Y Package Top View
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TABLE 1. PIN DESCRIPTIONS
Number 1 2 3 4 5 6 7 Name SEL0 SEL1 CLK0 nCLK0 CLK1 nCLK1 CLK_SEL Input Input Input Input Input Input Input Type Pulldown Pulldown Pulldown Pullup Pulldown Pullup Pulldown Description Determines the input and output frequency range noted in Table 3. LVCMOS / LVTTL interface levels. Determines the input and output frequency range noted in Table 3. LVCMOS / LVTTL interface levels. Non-inver ting differential clock input. Inver ting differential clock input. Non-inver ting differential clock input. Inver ting differential clock input. Clock select input. When LOW, selects CLK0, nCLK0. When HIGH, selects CLK1, nCLK1 inputs. LVCMOS / LVTTL interface levels. Active HIGH Master Reset. When logic HIGH, the internal dividers are reset causing the true outputs Qx to go low and the inver ted outputs nQx to go high. When logic LOW, the internal dividers and the outputs are enabled. LVCMOS / LVTTL interface levels. Core supply pins. Feedback input to phase detector for regenerating clocks with "zero delay". Feedback input to phase detector for regenerating clocks with "zero delay". Power supply ground. Differential clock outputs. 50Ω typical output impedance. HSTL interface levels. Output supply pins. Differential clock outputs. 50Ω typical output impedance. HSTL interface levels. Differential clock outputs. 50Ω typical output impedance. HSTL interface levels. Differential clock outputs. 50Ω typical output impedance. HSTL interface levels. Differential clock outputs. 50Ω typical output impedance. HSTL interface levels. Analog supply pin. Selects between the PLL and clock as the input to the dividers. Pullup When HIGH, selects PLL. When LOW, selects reference clock. LVCMOS / LVTTL interface levels. to internal input resistors. See Table 2, Pin Characteristics, for typical values.
8 9, 32 10 11 12, 13 28, 29 14, 15 16, 17, 24, 25 18, 19 20, 21 22, 23 26, 27 30 31
MR VDD nFB_IN FB_IN GND nQ0, Q0 VDDO nQ1, Q1 nQ2, Q2 nQ3, Q3 nQ4, Q4 VDDA PLL_SEL
Input Power Input Input Power Output Power Output Output Output Output Power Input
Pulldown
Pullup Pulldown
NOTE 1: Pullup and Pulldown refer
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TABLE 2. PIN CHARACTERISTICS
Symbol CIN RPULLUP RPULLDOWN Parameter Input Capacitance Input Pullup Resistor Input Pulldown Resistor Test Conditions Minimum Typical 4 51 51 Maximum Units pF kΩ kΩ
TABLE 3A. CONTROL INPUT FUNCTION TABLE
Inputs SEL1 0 0 1 1 SEL0 0 1 0 1 Reference Frequency Range (MHz)* 250 - 630 125 - 315 62.5 - 157.5 31.25 - 78.75 Outputs PLL_SEL = 1 PLL Enable Mode Q0:Q4, nQ0:nQ4 ÷1 ÷1 ÷1 ÷1
*NOTE: VCO frequency range for all configurations above is 250MHz to 700MHz.
TABLE 3B. PLL BYPASS FUNCTION TABLE
Inputs SEL1 0 0 1 1 SEL0 0 1 0 1 Outputs PLL_SEL = 0 PLL Bypass Mode Q0:Q4, nQ0:nQ4 ÷4 ÷4 ÷4 ÷8
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ABSOLUTE MAXIMUM RATINGS
Supply Voltage, VDD Inputs, VI Outputs, IO Continuous Current Surge Current Package Thermal Impedance, θJA Storage Temperature, TSTG 4.6V -0.5V to VDD + 0.5V 50mA 100mA 47.9°C/W (0 lfpm) -65°C to 150°C NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for extended periods may affect product reliability.
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, VDD = VDDA = 3.3V±5%, VDDO = 1.8V±0.2V, TA = -40°C TO 85°C
Symbol VDD VDDA VDDO IDD IDDA IDDO Parameter Core Supply Voltage Analog Supply Voltage Output Supply Voltage Power Supply Current Analog Supply Current Output Supply Current No Load 0 Test Conditions Minimum 3.135 3.135 1.6 Typical 3.3 3.3 1.8 Maximum 3.465 3.465 2.0 120 15 Units V V V mA mA mA
TABLE 4B. LVCMOS / LVTTL DC CHARACTERISTICS, VDD = VDDA = 3.3V±5%, VDDO = 1.8V±0.2V, TA = -40°C TO 85°C
Symbol Parameter VIH VIL IIH Input High Voltage Input Low Voltage Input High Current SEL0, SEL1, CLK_SEL, MR PLL_SEL SEL0, SEL1, CLK_SEL, MR PLL_SEL VDD = VIN = 3.465V VDD = VIN = 3.465V VDD = 3.465V, VIN = 0V VDD = 3.465V, VIN = 0V -5 -150 Test Conditions Minimum 2 -0.3 Typical Maximum VDD + 0.3 0.8 150 5 Units V V µA µA µA µA
IIL
Input Low Current
TABLE 4C. DIFFERENTIAL DC CHARACTERISTICS, VDD = VDDA = 3.3V±5%, VDDO = 1.8V±0.2V, TA = -40°C TO 85°C
Symbol IIH IIL VPP Parameter Input High Current Input Low Current CLK0, CLK1, FB_IN nCLK0, nCLK1, nFB_IN CLK0, CLK1, FB_IN nCLK0, nCLK1, nFB_IN Test Conditions VDD = VIN = 3.465V VDD = VIN = 3.465V VDD = 3.465V, VIN = 0V VDD = 3.465V, VIN = 0V -5 -150 0.15 1.3 VDD - 0.85 Minimum Typical Maximum 150 5 Units µA µA µA µA V V
Peak-to-Peak Input Voltage
Common Mode Input Voltage; NOTE 1, 2 0.5 VCMR NOTE 1: For single ended applications, the maximum input voltage for CLKx, nCLKx is VDD + 0.3V. NOTE 2: Common mode voltage is defined as VIH.
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TABLE 4D. HSTL DC CHARACTERISTICS, VDD = VDDA = 3.3V±5%, VDDO = 1.8V±0.2V, TA = -40°C TO 85°C
Symbol VOH VOL VOX Parameter Output High Voltage; NOTE 1 Output Low Voltage; NOTE 1 Output Crossover Voltage; NOTE 2 Test Conditions Minimum 1.0 0 40 0.6 Typical Maximum 1.4 0.4 60 1.1 Units V V % V
VSWING Peak-to-Peak Output Voltage Swing NOTE 1: Outputs terminated with 50Ω to ground. NOTE 2: Defined with respect to output voltage swing at a given condition.
TABLE 5. INPUT FREQUENCY CHARACTERISTICS, VDD = VDDA = 3.3V±5%, VDDO = 1.8V±0.2V, TA = -40°C TO 85°C
Symbol fIN Parameter Input Frequency CLK0, nCLK0, CLK1, nCLK1 Test Conditions PLL_SEL = 1 PLL_SEL = 0 Minimum 31.25 Typical Maximum 630 630 Units MHz MHz
TABLE 6A. AC CHARACTERISTICS, VDD = VDDA = 3.3V±5%, VDDO = 1.8V±0.2V, TA = -40°C TO 85°C
Symbol fMAX tPD t(Ø) Parameter Output Frequency Propagation Delay; NOTE 1 Static Phase Offset; NOTE 2, 5 Output Skew; NOTE 3, 5 Cycle-to-Cycle Jitter; NOTE 5, 6 Phase Jitter; NOTE 4, 5, 6 PLL Lock Time Output Rise Time Output Fall Time 20% to 80% 20% to 80% 300 300 ƒ ≤ 630MHz PLL_SEL = 3.3V 3.4 -95 3.9 30 Test Conditions Minimum Typical Maximum 630 4.5 155 50 35 ±50 1 700 700 Units MHz ns ps ps ps ps ms ps ps ps
t sk(o) t jit(cc) t jit(Ø)
tL tR tF
tPW Output Pulse Width tPeriod/2 - 85 tPeriod/2 tPeriod/2+ 85 All parameters measured at fMAX unless noted otherwise. NOTE 1: Measured from the differential input crossing point to the differential output crossing point. NOTE 2: Defined as the time difference between the input reference clock and the averaged feedback input signal across all conditions, when the PLL is locked and the input reference frequency is stable. NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at output differential cross points. NOTE 4: Phase jitter is dependent on the input source used. NOTE 5: This parameter is defined in accordance with JEDEC Standard 65. NOTE 6: Characterized at VCO frequency of 622MHz.
TABLE 6B. AC CHARACTERISTICS, VDD = VDDA = 3.3V±10%, VDDO = 1.8V±0.2V, TA = -40°C TO 85°C
Symbol Parameter Cycle-to-Cycle Jitter; NOTE 1 Test Conditions Minimum Typical Maximum 40 Units ps
t jit(cc)
NOTE 1: This parameter is defined in accordance with JEDEC Standard 65.
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LOW SKEW, 1-TO-5 DIFFERENTIAL-TO-HSTL ZERO DELAY BUFFER PARAMETER MEASUREMENT INFORMATION
3.3V±5% or 10% 1.8V±0.2V VDD
VDD, VDDA
Qx
SCOPE
nCLK0, nCLK1
VDDO
HSTL
nQx
V
CLK0, CLK1
PP
Cross Points
V
CMR
G ND GND = 0V
3.3V CORE/1.8V OUTPUT LOAD AC TEST CIRCUIT
DIFFERENTIAL INPUT LEVEL
nQx nQ nQy Qy
nQx Qx
tcycle
n
➤
t sk(o)
t jit(cc) = tcycle n –tcycle n+1
1000 Cycles
OUTPUT SKEW
nCLK0, nCLK1 CLK0, CLK1 nFB_IN FB_IN
➤ t (Ø) VOH VOL VOH VOL
CYCLE-TO-CYCLE JITTER
80% Clock Outputs
20% tR tF
t jit(Ø) = t (Ø) — t (Ø) mean = Phase Jitter t (Ø) mean = Static Phase Offset (where t (Ø) is any random sample, and t (Ø) mean is the average of the sampled cycles measured on controlled edges)
PHASE JITTER
nQ0:nQ4 Q0:Q4
AND
STATIC PHASE OFFSET
VDDO 2 VDDO 2
OUTPUT RISE/FALL TIME
nCLK0, nCLK1 CLK0, CLK1 nQ0:nQ4 Q0:Q4
VDDO 2
Pulse Width t PERIOD
tPD
OUTPUT PULSE WIDTH/PERIOD
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➤
➤
➤
tcycle n+1
➤
80% VOD 20%
ICS8624I
LOW SKEW, 1-TO-5 DIFFERENTIAL-TO-HSTL ZERO DELAY BUFFER APPLICATION INFORMATION
POWER SUPPLY FILTERING TECHNIQUES
As in any high speed analog circuitry, the power supply pins are vulnerable to random noise. The ICS8624I provides separate power supplies to isolate any high switching noise from the outputs to the internal PLL. VDD, VDDA, and VDDO should be individually connected to the power supply plane through vias, and bypass capacitors should be used for each pin. To achieve optimum jitter performance, power supply isolation is required. Figure 1 illustrates how a 10 Ω r esistor along with a 10 μ F and a .01 μ F bypass capacitor should be connected to each VDDA pin.
3.3V VDD .01μF VDDA .01μF 10μ F 10 Ω
FIGURE 1. POWER SUPPLY FILTERING
WIRING THE DIFFERENTIAL INPUT TO ACCEPT SINGLE ENDED LEVELS
Figure 2 shows how the differential input can be wired to accept single ended levels. The reference voltage V_REF = VDD/2 is generated by the bias resistors R1, R2 and C1. This bias circuit should be located as close as possible to the input pin. The ratio
of R1 and R2 might need to be adjusted to position the V_REF in the center of the input voltage swing. For example, if the input clock swing is only 2.5V and VDD = 3.3V, V_REF should be 1.25V and R2/R1 = 0.609.
VDD
R1 1K Single Ended Clock Input
CLKx
V_REF
nCLKx
C1 0.1u
R2 1K
FIGURE 2. SINGLE ENDED SIGNAL DRIVING DIFFERENTIAL INPUT
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RECOMMENDATIONS FOR UNUSED INPUT AND OUTPUT PINS INPUTS: OUTPUTS:
CLK/nCLK INPUT: For applications not requiring the use of the differential input, both CLK and nCLK can be left floating. Though not required, but for additional protection, a 1kΩ resistor can be tied from CLK to ground. LVCMOS CONTROL PINS: All control pins have internal pull-ups or pull-downs; additional resistance is not required but can be added for additional protection. A 1kΩ resistor can be used. HSTL OUTPUT All unused HSTL outputs can be left floating. We recommend that there is no trace attached. Both sides of the differential output pair should either be left floating or terminated.
LAYOUT GUIDELINE
The schematic of the ICS8624I layout example is shown in Figure 3A. The ICS8624I recommended PCB board layout for this example is shown in Figure 3B. This layout example is used as a general guideline. The layout in the actual system
VDD
will depend on the selected component types, the density of the components, the density of the traces, and the stack up of the P.C. board.
SP = Space (i.e. not intstalled)
VDDA RU2 SP RU3 1K RU4 1K RU5 SP
R7 10
VDD
VDD=3.3V
CLK_SEL PLL_SEL SEL0 SEL1
C11 0.01u
VDDO=1.8V DIV_SEL[1:0] = 01
PLL_SEL
C16 10u
155.5 MHz
Zo = 50 Ohm +
RD2 1K
RD3 SP
RD4 SP
RD5 1K VDD
VDDO
Zo = 50 Ohm
-
LVHSTL_input
U1 3.3V
32 31 30 29 28 27 26 25
(155.5 MHz)
Zo = 50 Ohm
SEL0 SEL1
Zo = 50 Ohm CLK_SEL 3.3V PECL Driver R8 50 R9 50
1 2 3 4 5 6 7 8
VDD PLL_SEL VDDA GND GND Q4 nQ4 VDDO
R4A 50 VDDO Q3 nQ3 Q2 nQ2 Q1 nQ1 VDDO 24 23 22 21 20 19 18 17
R4B 50
VDD nFB_IN FB_IN GND GND nQ0 Q0 VDDO
SEL0 SEL1 CLK0 nCLK0 CLK1 nCLK2 CLK_SEL MR
Bypass capacitor located near the power pins
(U1-9) VDD
C1 0.1uF
(U1-32)
C6 0.1uF
9 10 11 12 13 14 15 16
8624
R10 50 R2B 50 R2A 50
(U1-16)
C2 0.1uF
VDDO
(U1-17)
C4 0.1uF
(U1-24)
C5 0.1uF
(U1-25)
C7 0.1uF
FIGURE 3A. ICS8624I HSTL ZERO DELAY BUFFER SCHEMATIC EXAMPLE
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The following component footprints are used in this layout example: All the resistors and capacitors are size 0603. trace delay might be restricted by the available space on the board and the component location. While routing the traces, the clock signal traces should be routed first and should be locked prior to routing other signal traces. • The differential 50Ω output traces should have same length. • Avoid sharp angles on the clock trace. Sharp angle turns cause the characteristic impedance to change on the transmission lines. • Keep the clock traces on the same layer. Whenever possible, avoid placing vias on the clock traces. Placement of vias on the traces can affect the trace characteristic impedance and hence degrade signal integrity. • To prevent cross talk, avoid routing other signal traces in parallel with the clock traces. If running parallel traces is unavoidable, allow a separation of at least three trace widths between the differential clock trace and the other signal trace. • Make sure no other signal traces are routed between the clock trace pair. • The matching termination resistors should be located as close to the receiver input pins as possible.
POWER
AND
GROUNDING
Place the decoupling capacitors C1, C6, C2, C4, and C5, as close as possible to the power pins. If space allows, placement of the decoupling capacitor on the component side is preferred. This can reduce unwanted inductance between the decoupling capacitor and the power pin caused by the via. Maximize the power and ground pad sizes and number of vias capacitors. This can reduce the inductance between the power and ground planes and the component power and ground pins. The RC filter consisting of R7, C11, and C16 should be placed as close to the VDDA pin as possible.
CLOCK TRACES
AND
TERMINATION
Poor signal integrity can degrade the system performance or cause system failure. In synchronous high-speed digital systems, the clock signal is less tolerant to poor signal integrity than other signals. Any ringing on the rising or falling edge or excessive ring back can cause system failure. The shape of the trace and the
GND
R7 C16 C11 C7 C6 C5
VDDO VDD VDDA
U1
Pin 1
VIA
50 Ohm Traces
C4 C1 C2
FIGURE 3B. PCB BOARD LAYOUT FOR ICS8624I
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ICS8624I
LOW SKEW, 1-TO-5 DIFFERENTIAL-TO-HSTL ZERO DELAY BUFFER POWER CONSIDERATIONS
This section provides information on power dissipation and junction temperature for the ICS8624I. Equations and example calculations are also provided.
1. Power Dissipation. The total power dissipation for the ICS8624I is the sum of the core power plus the power dissipated in the load(s). The following is the power dissipation for VDD = 3.3V + 5% = 3.465V, which gives worst case results. NOTE: Please refer to Section 3 for details on calculating power dissipated in the load.
• •
Power (core)MAX = VDD_MAX * IDD_MAX = 3.465V * 135mA = 467.8mW Power (outputs)MAX = 32.8mW/Loaded Output pair If all outputs are loaded, the total power is 5 * 32.8mW = 164mW
Total Power_MAX (3.465V, with all outputs switching) = 467.8mW + 164mW = 631.8mW
2. Junction Temperature. Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad and directly affects the reliability of the device. The maximum recommended junction temperature for the devices is 125°C.
The equation for Tj is as follows: Tj = θJA * Pd_total + TA Tj = Junction Temperature θJA = Junction-to-Ambient Thermal Resistance Pd_total = Total Device Power Dissipation (example calculation is in section 1 above) TA = Ambient Temperature In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance θJA must be used. Assuming a moderate air flow of 200 linear feet per minute and a multi-layer board, the appropriate value is 42.1°C/W per Table 7 below. Therefore, Tj for an ambient temperature of 85°C with all outputs switching is: 85°C + 0.632W * 42.1°C/W = 111.6°C. This is below the limit of 125°C. This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air flow, and the type of board (single layer or multi-layer).
TABLE 7. THERMAL RESISTANCE θJA
FOR
32-PIN LQFP, FORCED CONVECTION
θJA by Velocity (Linear Feet per Minute)
0
Single-Layer PCB, JEDEC Standard Test Boards Multi-Layer PCB, JEDEC Standard Test Boards 67.8°C/W 47.9°C/W
200
55.9°C/W 42.1°C/W
500
50.1°C/W 39.4°C/W
NOTE: Most modern PCB designs use multi-layered boards. The data in the second row pertains to most designs.
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3. Calculations and Equations.
The purpose of this section is to derive the power dissipated into the load. HSTL output driver circuit and termination are shown in Figure 4.
VDDO
Q1
VOUT RL 50Ω
FIGURE 4. HSTL DRIVER CIRCUIT
AND
TERMINATION
To calculate worst case power dissipation into the load, use the following equations which assume a 50Ω load.
Pd_H is power dissipation when the output drives high. Pd_L is the power dissipation when the output drives low.
Pd_H = (V
OH_MIN
/R ) * (V
L DDO_MAX
-V -V
DDO_MAX
) )
OL_MAX
OH_MIN
Pd_L = (V
OL_MAX
/R ) * (V
L
Pd_H = (1V/50Ω) * (2V - 1V) = 20mW Pd_L = (0.4V/50Ω) * (2V - 0.4V) = 12.8mW Total Power Dissipation per output pair = Pd_H + Pd_L = 32.8mW
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LOW SKEW, 1-TO-5 DIFFERENTIAL-TO-HSTL ZERO DELAY BUFFER RELIABILITY INFORMATION
TABLE 8. θJAVS. AIR FLOW TABLE
FOR
32 LEAD LQFP
θJA by Velocity (Linear Feet per Minute)
0
Single-Layer PCB, JEDEC Standard Test Boards Multi-Layer PCB, JEDEC Standard Test Boards 67.8°C/W 47.9°C/W
200
55.9°C/W 42.1°C/W
500
50.1°C/W 39.4°C/W
NOTE: Most modern PCB designs use multi-layered boards. The data in the second row pertains to most designs.
TRANSISTOR COUNT
The transistor count for ICS8624I is: 1565
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PACKAGE OUTLINE - Y SUFFIX
FOR
32 LEAD LQFP
TABLE 9. PACKAGE DIMENISIONS
JEDEC VARIATION ALL DIMENSIONS IN MILLIMETERS BBA SYMBOL N A A1 A2 b c D D1 D2 E E1 E2 e L θ 0.45 0° 0.05 1.35 0.30 0.09 9.00 BASIC 7.00 BASIC 5.60 9.00 BASIC 7.00 BASIC 5.60 0.80 BASIC 0.60 0.75 7° 0.10
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MINIMUM
NOMINAL 32
MAXIMUM
1.60 0.15 1.40 0.37 1.45 0.45 0.20
ccc Reference Document: JEDEC Publication 95, MS-026
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TABLE 10. ORDERING INFORMATION
Part/Order Number 8624BYI 8624BYIT 8624BYILF 8624BYILFT Marking ICS8624BYI ICS8624BYI ICS8624BYILF ICS8624BYILF Package 32 Lead LQFP 32 Lead LQFP 32 Lead "Lead-Free" LQFP 32 Lead "Lead-Free" LQFP Shipping Packaging tray 1000 tape & reel tray 1000 tape & reel Temperature -40°C to 85°C -40°C to 85°C -40°C to 85°C -40°C to 85°C
NOTE: Par ts that are ordered with an "LF" suffix to the par t number are the Pb-Free configuration and are RoHS compliant.
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology, Inc. (IDT) assumes no responsibility for either its use or for infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and industrial applications. Any other applications such as those requiring high reliability, or other extraordinary environmental requirements are not recommended without additional processing by IDT. IDT reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support devices or critical medical instruments
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REVISION HISTORY SHEET Rev A T1 T3A A T4A 4 13 T2 B T4D T6B 3 4 5 5 1 8 10-11 14 14 16 Table Page 11 - 12 2 3 Description of Change Revised Figures 3A & 3B. Pin Description Table - revised VDD description to Core supply pins from Positive supply pins. Control Input Function Table - corrected note to read ...250MHz to 630MHz from ...250 to 700MHz. Power Supply Table - revised VDD Parameter description to read Core Supply Voltage from Positive Supply Voltage. Corrected power dissipation equation. Replaced VOH_MIN with VOH_MAX. Pin Characteristics Table - changed CIN 4pF max. to 4pF typical. Absolute Maximum Ratings - updated Output rating. HSTL DC Characteristics Table - changed VOX to 40% min. - 60% max. and added note. Added Table 6B AC Characteristics Table with VDD = VDDA = 3.3V±10%. Changed LVHSTL to HSTL throughout the data sheet. Added lead-free bullet. Added Recommendations for Unused Input and Output Pins. Corrected Power Considerations, Power Dissipation calculation. Ordering Information Table - added lead-free par t number and note. Updated datasheet's header/footer with IDT from ICS. Removed ICS prefix from Par t/Order Number column. Added Contact Page. Date 8/13/02
10/8/02
2/19/04
B T10 C T10
11/15/05
7/30/10
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© 2010 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. IDT, the IDT logo, ICS and HiPerClockS are trademarks of Integrated Device Technology, Inc. Accelerated Thinking is a service mark of Integrated Device Technology, Inc. All other brands, product names and marks are or may be trademarks or registered trademarks used to identify products or services of their respective owners. Printed in USA
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